JP7044764B6 - Ｘ線撮像のための線源格子 - Google Patents

Ｘ線撮像のための線源格子 Download PDF

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Publication number
JP7044764B6
JP7044764B6 JP2019512893A JP2019512893A JP7044764B6 JP 7044764 B6 JP7044764 B6 JP 7044764B6 JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019512893 A JP2019512893 A JP 2019512893A JP 7044764 B6 JP7044764 B6 JP 7044764B6
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ray
source
grid
grid structure
source grid
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Japanese (ja)
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JP7044764B2 (ja
JP2019531120A5 (enExample
JP2019531120A (ja
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トーマス コエラー
ローランド プロクサ
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Koninklijke Philips NV
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871—Transmissive phase gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4064—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam
    • A61B6/4092—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam for producing synchrotron radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Medical Informatics (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • General Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2019512893A 2016-09-08 2017-08-30 Ｘ線撮像のための線源格子 Expired - Fee Related JP7044764B6 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16187753.5 2016-09-08
EP16187753 2016-09-08
PCT/EP2017/071806 WO2018046377A1 (en) 2016-09-08 2017-08-30 Source grating for x-ray imaging

Publications (4)

Publication Number Publication Date
JP2019531120A JP2019531120A (ja) 2019-10-31
JP2019531120A5 JP2019531120A5 (enExample) 2020-10-08
JP7044764B2 JP7044764B2 (ja) 2022-03-30
JP7044764B6 true JP7044764B6 (ja) 2022-05-31

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JP2019512893A Expired - Fee Related JP7044764B6 (ja) 2016-09-08 2017-08-30 Ｘ線撮像のための線源格子

Country Status (5)

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US (1) US10835193B2 (enExample)
EP (1) EP3509492B1 (enExample)
JP (1) JP7044764B6 (enExample)
CN (1) CN109688930A (enExample)
WO (1) WO2018046377A1 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
DE112019002822T5 (de) 2018-06-04 2021-02-18 Sigray, Inc. Wellenlängendispersives röntgenspektrometer
CN112470245B (zh) 2018-07-26 2025-03-18 斯格瑞公司 高亮度x射线反射源
EP3603515A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
CN114729907B (zh) 2019-09-03 2023-05-23 斯格瑞公司 用于计算机层析x射线荧光成像的系统和方法
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
CN111839579B (zh) * 2020-09-02 2025-06-27 上海联影医疗科技股份有限公司 一种x射线成像设备的限束器及x射线成像设备
DE112021004828T5 (de) 2020-09-17 2023-08-03 Sigray, Inc. System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse
JP7626856B2 (ja) 2020-12-07 2025-02-04 シグレイ、インコーポレイテッド 透過ｘ線源を用いた高スループット３ｄ ｘ線撮像システム
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
US12209977B2 (en) 2023-02-16 2025-01-28 Sigray, Inc. X-ray detector system with at least two stacked flat Bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
US12431256B2 (en) 2024-02-15 2025-09-30 Sigray, Inc. System and method for generating a focused x-ray beam

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011110223A (ja) 2009-11-27 2011-06-09 Ge Medical Systems Global Technology Co Llc ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
JP2012024339A (ja) 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
US20130032734A1 (en) 2010-04-26 2013-02-07 Santori Charles M Non-uniform grating
JP2014510263A (ja) 2011-02-07 2014-04-24 コーニンクレッカ フィリップス エヌ ヴェ ダイナミックレンジを増大する微分位相コントラスト撮像
US20140314374A1 (en) 2011-10-21 2014-10-23 David A. Fattal Grating couplers with deep-groove non-uniform gratings
JP2015078976A (ja) 2013-09-11 2015-04-23 キヤノン株式会社 Ｘ線撮像システム
JP2015518765A (ja) 2012-06-05 2015-07-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線ｃｔイメージの動き層分解較正
WO2016075140A1 (en) 2014-11-11 2016-05-19 Koninklijke Philips N.V. Source-detector arrangement
US20160211045A1 (en) 2015-01-20 2016-07-21 Samsung Electronics Co., Ltd. X-ray imaging apparatus and method of controlling the same

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE347859B (enExample) * 1970-11-30 1972-08-14 Medinova Ab
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
US7965444B2 (en) 2006-08-31 2011-06-21 Micron Technology, Inc. Method and apparatus to improve filter characteristics of optical filters
EP2102871B1 (en) * 2006-12-04 2011-01-12 Koninklijke Philips Electronics N.V. Beam filter, particularly for x-rays, that does not change the beam's spectral composition
JP4911373B2 (ja) * 2009-11-26 2012-04-04 横河電機株式会社 Ｘ線測定装置
RU2584247C2 (ru) 2011-02-01 2016-05-20 Конинклейке Филипс Электроникс Н.В. Формирование дифференциальных фазово-контрастных изображений с пластинами фокусирующих структур преломления
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
JP6088503B2 (ja) * 2011-06-30 2017-03-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線ビーム透過プロファイル整形器
US20130164457A1 (en) 2011-12-27 2013-06-27 Rigaku Innovative Technologies, Inc. Method of manufacturing patterned x-ray optical elements
WO2013171657A1 (en) 2012-05-14 2013-11-21 Koninklijke Philips N.V. Dark field computed tomography imaging
RU2015126546A (ru) * 2012-12-03 2017-01-13 Конинклейке Филипс Н.В. Перемещение формирователя профиля пропускания рентгеновского пучка
CN105393331B (zh) * 2013-07-23 2017-03-22 皇家飞利浦有限公司 用于差分相衬成像装置的x射线管的阳极
EP3094254B1 (en) * 2014-01-14 2017-11-15 Koninklijke Philips N.V. X-ray emitting device with an attenuating element for an x-ray imaging apparatus
US9726794B2 (en) 2014-06-13 2017-08-08 The Regents Of The University Of California High index contrast grating structure for light manipulation and related method
US11051772B2 (en) * 2016-04-08 2021-07-06 Rensselaer Polytechnic Institute Filtration methods for dual-energy X-ray CT

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011110223A (ja) 2009-11-27 2011-06-09 Ge Medical Systems Global Technology Co Llc ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
US20130032734A1 (en) 2010-04-26 2013-02-07 Santori Charles M Non-uniform grating
JP2012024339A (ja) 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
JP2014510263A (ja) 2011-02-07 2014-04-24 コーニンクレッカ フィリップス エヌ ヴェ ダイナミックレンジを増大する微分位相コントラスト撮像
US20140314374A1 (en) 2011-10-21 2014-10-23 David A. Fattal Grating couplers with deep-groove non-uniform gratings
JP2015518765A (ja) 2012-06-05 2015-07-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線ｃｔイメージの動き層分解較正
JP2015078976A (ja) 2013-09-11 2015-04-23 キヤノン株式会社 Ｘ線撮像システム
WO2016075140A1 (en) 2014-11-11 2016-05-19 Koninklijke Philips N.V. Source-detector arrangement
US20160211045A1 (en) 2015-01-20 2016-07-21 Samsung Electronics Co., Ltd. X-ray imaging apparatus and method of controlling the same

Also Published As

Publication number Publication date
JP7044764B2 (ja) 2022-03-30
US20190216416A1 (en) 2019-07-18
US10835193B2 (en) 2020-11-17
EP3509492A1 (en) 2019-07-17
CN109688930A (zh) 2019-04-26
WO2018046377A1 (en) 2018-03-15
EP3509492B1 (en) 2021-12-15
JP2019531120A (ja) 2019-10-31

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