JP2009076658A - 半導体装置及びその製造方法 - Google Patents
半導体装置及びその製造方法 Download PDFInfo
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- JP2009076658A JP2009076658A JP2007243944A JP2007243944A JP2009076658A JP 2009076658 A JP2009076658 A JP 2009076658A JP 2007243944 A JP2007243944 A JP 2007243944A JP 2007243944 A JP2007243944 A JP 2007243944A JP 2009076658 A JP2009076658 A JP 2009076658A
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Abstract
【解決手段】タブ1bと、タブ1bの周囲に配置された複数のリード1aと、タブ1bのチップ支持面1c上に配置された銀ペースト6と、タブ1b上に銀ペースト6を介して搭載された半導体チップ2とを有している。さらに、半導体チップ2のパッド2aとリード1aとを電気的に接続する複数のワイヤ4と、半導体チップ2と複数のワイヤ4を樹脂封止する封止体3とを有しており、タブ1bのチップ支持面1cの周縁部にチップ支持面1cより高さの低い段差部1eが形成されていることにより、タブ1bからはみ出した銀ペースト6をこの段差部1eに留めることができ、その結果、銀ペースト6の封止体3の裏面3aへの流出を防ぐことができる。
【選択図】図5
Description
図1は本発明の実施の形態1の半導体装置の構造の一例を封止体を透過して示す斜視図、図2は図1に示す半導体装置の構造を示す平面図、図3は図1に示す半導体装置の構造を示す側面図、図4は図1に示す半導体装置の構造を示す裏面図、図5は図1に示すA−A線に沿って切断した構造の一例を示す断面図、図6は図1に示すB−B線に沿って切断した構造の一例を示す断面図、図7は図1に示す半導体装置におけるタブ、吊りリード、及びリードの構造を封止体を透過して示す部分平面図、図8は図7に示すC−C線に沿って切断した断面図、図9は図8の変形例図である。
図10は本発明の実施の形態2の半導体装置の構造の一例を封止体を透過して示す斜視図、図11は図10に示す半導体装置の構造を示す平面図、図12は図10に示す半導体装置の構造を示す側面図、図13は図10に示す半導体装置の構造を示す裏面図、図14は図10に示すA−A線に沿って切断した構造の一例を示す断面図、図15は図10に示すB−B線に沿って切断した構造の一例を示す断面図である。また、図16は図10に示す半導体装置におけるタブと突起部の構造を封止体を透過して示す部分平面図、図17は本発明の実施の形態2の変形例の半導体装置におけるタブと突起部の構造を封止体を透過して示す部分平面図、図18は本発明の実施の形態2の半導体装置の組み立て順の一例を示す製造フロー図である。さらに、図19は本発明の実施の形態2の半導体装置の組み立てに用いられるテープ付きリードフレームの構造の一例を示す平面図、図20は図19に示すテープ付きリードフレームの構造の一例を示す断面図、図21は図19に示すテープ付きリードフレームに貼り付けられたテープの構造の一例を示す断面図である。
1a リード
1b タブ(チップ搭載部)
1c チップ支持面
1d 裏面
1e 段差部
1f 第1肉薄部
1g 実装面
1h ワイヤ接続面
1i 吊りリード
1j 第2肉薄部
1k 突起部
1m 抉れ部
1n デバイス領域(半導体装置形成領域)
1p 枠部
1q スリット
1r ガイド孔
1s 裏面
1t フレーム本体
2 半導体チップ
2a パッド(電極)
2b 主面
2c 裏面
3 封止体
3a 裏面
3b 側面
4 ワイヤ
5 QFN(半導体装置)
6 銀ペースト(ペースト材)
7 外装めっき
8 封止用樹脂
9 樹脂成形金型
9a 上型
9b 下型
9c キャビティ
9d 金型面
10 一括封止体
11 テープ
11a 基材
11b 接着層
12 QFN(半導体装置)
Claims (17)
- チップ支持面を備えたチップ搭載部と、
前記チップ搭載部の周囲に配置された複数のリードと、
前記チップ搭載部の前記チップ支持面上に配置されたペースト材と、
前記チップ搭載部の前記チップ支持面上に前記ペースト材を介して搭載された半導体チップと、
前記半導体チップの複数の電極と前記複数のリードとをそれぞれ電気的に接続する複数のワイヤと、
前記半導体チップと前記複数のワイヤと前記複数のリードそれぞれの一部と前記チップ搭載部の一部を樹脂封止する封止体とを有し、
前記チップ搭載部の前記チップ支持面の外形サイズは、前記半導体チップの裏面より小さく、
前記チップ搭載部の前記チップ支持面と反対側の裏面は前記封止体から露出し、
前記チップ搭載部の前記チップ支持面の周縁部に前記チップ支持面より高さの低い段差部が形成されていることを特徴とする半導体装置。 - 請求項1記載の半導体装置において、前記複数のリードそれぞれのチップ側の端部は、前記半導体チップの裏面と対向していることを特徴とする半導体装置。
- 請求項2記載の半導体装置において、前記複数のリードそれぞれのチップ側の端部に第1肉薄部が形成され、前記第1肉薄部が前記半導体チップの裏面と対向していることを特徴とする半導体装置。
- 請求項1記載の半導体装置において、前記チップ搭載部の前記チップ支持面と、前記複数のリードそれぞれのワイヤ接続面は同じ高さであることを特徴とする半導体装置。
- 請求項1記載の半導体装置において、前記チップ搭載部と連結する吊りリードを有し、前記吊りリードはエッチングによって形成された第2肉薄部を備え、前記第2肉薄部は前記封止体内に埋め込まれていることを特徴とする半導体装置。
- 請求項1記載の半導体装置において、前記チップ搭載部の前記チップ支持面の全面に前記ペースト材が配置されていることを特徴とする半導体装置。
- 請求項1記載の半導体装置において、前記チップ搭載部の前記段差部に前記半導体チップに向かって突出した突起部が形成されていることを特徴とする半導体装置。
- 請求項7記載の半導体装置において、前記チップ搭載部の前記チップ支持面が四角形を成し、前記四角形の前記チップ支持面の各辺にこの各辺に設けられた前記突起部から遠ざかる方向に抉れた抉れ部が形成されていることを特徴とする半導体装置。
- 請求項7記載の半導体装置において、前記突起部は、四角形の前記チップ搭載部の1つの辺に対応した前記段差部の中央部に形成されていることを特徴とする半導体装置。
- 請求項7記載の半導体装置において、前記突起部は、四角形の前記チップ搭載部の1つの辺に対応した前記段差部に1つずつ形成されていることを特徴とする半導体装置。
- (a)チップ支持面の周縁部に前記チップ支持面より高さの低い段差部が形成されたチップ搭載部と、前記チップ搭載部の周囲に配置された複数のリードとを有するリードフレームを準備する工程と、
(b)前記チップ搭載部の前記チップ支持面上にペースト材を塗布する工程と、
(c)半導体チップの裏面より外形サイズが小さな前記チップ搭載部の前記チップ支持面上に前記ペースト材を介して半導体チップを接合する工程と、
(d)前記半導体チップの複数の電極と前記複数のリードとをそれぞれ電気的に接続する工程と、
(e)複数の半導体装置形成領域を樹脂成形金型の1つのキャビティで覆った状態で封止用樹脂を前記キャビティ内に注入し、前記半導体チップと前記チップ搭載部の前記段差部との間に封止用樹脂を周り込ませ、かつ前記チップ搭載部の前記チップ支持面と反対側の裏面及び前記複数のリードそれぞれの一部が露出するように前記半導体チップと複数のワイヤを樹脂封止して一括封止体を形成する工程と、
(f)前記一括封止体及び前記リードフレームを切断して各半導体装置に個片化する工程とを有することを特徴とする半導体装置の製造方法。 - 請求項11記載の半導体装置の製造方法において、前記(e)工程で、接着層を有するテープを前記リードフレームの裏面に貼り付けた状態で前記樹脂成形金型をクランプし、この状態で前記封止用樹脂を前記キャビティ内に注入して前記一括封止体を形成することを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記(e)工程の後、前記リードフレームの裏面から前記テープを剥離する剥離工程を有することを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記(e)工程の後、前記リードフレームの裏面から前記テープを剥離する剥離工程を有し、さらに前記剥離工程の後に、前記リードフレームの裏面を洗浄する洗浄工程を有することを特徴とする半導体装置の製造方法。
- 請求項14記載の半導体装置の製造方法において、前記洗浄工程で、有機系溶剤によって前記リードフレームの裏面を洗浄することを特徴とする半導体装置の製造方法。
- 請求項14記載の半導体装置の製造方法において、前記洗浄工程の後に、前記一括封止体から露出する前記チップ搭載部の裏面及び前記複数のリードそれぞれの一部に外装めっきを形成するめっき処理工程を有することを特徴とする半導体装置の製造方法。
- 請求項11記載の半導体装置の製造方法において、前記チップ搭載部の前記段差部に前記半導体チップに向かって突出した突起部がエッチングにより形成されていることを特徴とする半導体装置の製造方法。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007243944A JP2009076658A (ja) | 2007-09-20 | 2007-09-20 | 半導体装置及びその製造方法 |
TW097123763A TW200924145A (en) | 2007-09-20 | 2008-06-25 | Semiconductor device and manufacturing method of the same |
US12/147,676 US8558362B2 (en) | 2007-09-20 | 2008-06-27 | Semiconductor device and manufacturing method of the same |
CN201310224828.0A CN103295995B (zh) | 2007-09-20 | 2008-08-12 | 半导体器件及其制造方法 |
CNA200810210915XA CN101393900A (zh) | 2007-09-20 | 2008-08-12 | 半导体器件及其制造方法 |
KR1020080092006A KR20090031279A (ko) | 2007-09-20 | 2008-09-19 | 반도체 장치 및 그 제조 방법 |
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Also Published As
Publication number | Publication date |
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CN103295995B (zh) | 2016-03-02 |
TW200924145A (en) | 2009-06-01 |
US8558362B2 (en) | 2013-10-15 |
CN101393900A (zh) | 2009-03-25 |
KR20090031279A (ko) | 2009-03-25 |
US20090079051A1 (en) | 2009-03-26 |
CN103295995A (zh) | 2013-09-11 |
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