JP2008177565A5 - - Google Patents
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- JP2008177565A5 JP2008177565A5 JP2008003657A JP2008003657A JP2008177565A5 JP 2008177565 A5 JP2008177565 A5 JP 2008177565A5 JP 2008003657 A JP2008003657 A JP 2008003657A JP 2008003657 A JP2008003657 A JP 2008003657A JP 2008177565 A5 JP2008177565 A5 JP 2008177565A5
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Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2007-0005477 | 2007-01-18 | ||
| KR20070005477 | 2007-01-18 | ||
| US11/954,135 US8058683B2 (en) | 2007-01-18 | 2007-12-11 | Access device having vertical channel and related semiconductor device and a method of fabricating the access device |
| US11/954,135 | 2007-12-11 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008177565A JP2008177565A (ja) | 2008-07-31 |
| JP2008177565A5 true JP2008177565A5 (enExample) | 2011-02-24 |
| JP5383049B2 JP5383049B2 (ja) | 2014-01-08 |
Family
ID=39640401
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008003657A Active JP5383049B2 (ja) | 2007-01-18 | 2008-01-10 | 垂直方向のチャンネルを有するアクセス素子、これを含む半導体装置、及びアクセス素子の形成方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8058683B2 (enExample) |
| JP (1) | JP5383049B2 (enExample) |
| KR (1) | KR101398494B1 (enExample) |
| CN (1) | CN101226960B (enExample) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8482041B2 (en) | 2007-10-29 | 2013-07-09 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor structure and method of fabricating the semiconductor structure |
| US8486785B2 (en) | 2010-06-09 | 2013-07-16 | Unisantis Electronics Singapore Pte Ltd. | Surround gate CMOS semiconductor device |
| US8487357B2 (en) | 2010-03-12 | 2013-07-16 | Unisantis Electronics Singapore Pte Ltd. | Solid state imaging device having high sensitivity and high pixel density |
| US8497548B2 (en) | 2009-04-28 | 2013-07-30 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device including a MOS transistor and production method therefor |
| US8564034B2 (en) | 2011-09-08 | 2013-10-22 | Unisantis Electronics Singapore Pte. Ltd. | Solid-state imaging device |
| US8575662B2 (en) | 2010-03-08 | 2013-11-05 | Unisantis Electronics Singapore Pte Ltd. | Solid state imaging device having high pixel density |
| US8598650B2 (en) | 2008-01-29 | 2013-12-03 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device and production method therefor |
| US8610202B2 (en) | 2009-10-01 | 2013-12-17 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device having a surrounding gate |
| US8669601B2 (en) | 2011-09-15 | 2014-03-11 | Unisantis Electronics Singapore Pte. Ltd. | Method for producing semiconductor device and semiconductor device having pillar-shaped semiconductor |
| US8748938B2 (en) | 2012-02-20 | 2014-06-10 | Unisantis Electronics Singapore Pte. Ltd. | Solid-state imaging device |
| US8772175B2 (en) | 2011-12-19 | 2014-07-08 | Unisantis Electronics Singapore Pte. Ltd. | Method for manufacturing semiconductor device and semiconductor device |
Families Citing this family (72)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101179193B1 (ko) * | 2007-12-07 | 2012-09-03 | 삼성전자주식회사 | 수직 채널 트랜지스터를 갖는 반도체 소자의 제조방법 |
| US8188537B2 (en) * | 2008-01-29 | 2012-05-29 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device and production method therefor |
| JP2010141259A (ja) * | 2008-12-15 | 2010-06-24 | Elpida Memory Inc | 半導体装置及びその製造方法 |
| JP4577592B2 (ja) | 2009-04-20 | 2010-11-10 | 日本ユニサンティスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| KR101567976B1 (ko) | 2009-07-23 | 2015-11-11 | 삼성전자주식회사 | 반도체 소자 |
| KR101609252B1 (ko) | 2009-09-24 | 2016-04-06 | 삼성전자주식회사 | 매몰 워드 라인을 구비한 반도체 소자 |
| KR101607265B1 (ko) * | 2009-11-12 | 2016-03-30 | 삼성전자주식회사 | 수직 채널 트랜지스터의 제조방법 |
| US8497541B2 (en) * | 2010-03-10 | 2013-07-30 | Micron Technology, Inc. | Memory having buried digit lines and methods of making the same |
| KR20110101876A (ko) * | 2010-03-10 | 2011-09-16 | 삼성전자주식회사 | 매립 비트 라인을 갖는 반도체 장치 및 반도체 장치의 제조 방법 |
| KR101645257B1 (ko) * | 2010-05-20 | 2016-08-16 | 삼성전자주식회사 | 수직 채널 트랜지스터를 구비한 반도체 소자 |
| WO2011149768A2 (en) * | 2010-05-25 | 2011-12-01 | Ss Sc Ip, Llc | Self-aligned semiconductor devices with reduced gate-source leakage under reverse bias and methods of making |
| JP5087655B2 (ja) | 2010-06-15 | 2012-12-05 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッド | 半導体装置及びその製造方法 |
| KR101140079B1 (ko) * | 2010-07-13 | 2012-04-30 | 에스케이하이닉스 주식회사 | 수직형 트랜지스터를 포함하는 반도체 소자 및 그 형성방법 |
| KR101159985B1 (ko) * | 2010-07-23 | 2012-06-25 | 에스케이하이닉스 주식회사 | 반도체 소자 및 그 제조 방법 |
| KR101660433B1 (ko) * | 2010-07-29 | 2016-09-27 | 삼성전자 주식회사 | 수직 채널 트랜지스터를 구비한 반도체 소자 |
| TWI415247B (zh) * | 2010-12-15 | 2013-11-11 | Powerchip Technology Corp | 具有垂直通道電晶體的動態隨機存取記憶胞及陣列 |
| KR101227339B1 (ko) * | 2011-05-12 | 2013-01-28 | 에스케이하이닉스 주식회사 | 반도체 소자 및 그 형성 방법 |
| CN102820300B (zh) * | 2011-06-10 | 2016-03-02 | 华邦电子股份有限公司 | 动态随机存取存储器及其制造方法 |
| KR101363272B1 (ko) * | 2011-09-01 | 2014-02-14 | 서울대학교산학협력단 | 수직채널을 갖는 모스펫 및 이를 이용한 논리 게이트 소자 |
| JP2013088862A (ja) | 2011-10-13 | 2013-05-13 | Elpida Memory Inc | レイアウトデータ作成装置及び半導体装置 |
| US8759178B2 (en) | 2011-11-09 | 2014-06-24 | Unisantis Electronics Singapore Pte. Ltd. | Method for manufacturing semiconductor device and semiconductor device |
| US10438836B2 (en) | 2011-11-09 | 2019-10-08 | Unisantis Electronics Singapore Pte. Ltd. | Method for manufacturing a semiconductor device |
| US8916478B2 (en) | 2011-12-19 | 2014-12-23 | Unisantis Electronics Singapore Pte. Ltd. | Method for manufacturing semiconductor device and semiconductor device |
| US8614117B2 (en) | 2012-02-08 | 2013-12-24 | International Business Machines Corporation | Self-aligned process to fabricate a memory cell array with a surrounding-gate access transistor |
| US9012981B2 (en) | 2012-05-17 | 2015-04-21 | Unisantis Electronics Singapore Pte. Ltd. | Semiconductor device |
| US8829601B2 (en) | 2012-05-17 | 2014-09-09 | Unisantis Electronics Singapore Pte. Ltd. | Semiconductor device |
| US9166043B2 (en) | 2012-05-17 | 2015-10-20 | Unisantis Electronics Singapore Pte. Ltd. | Semiconductor device |
| US8697511B2 (en) | 2012-05-18 | 2014-04-15 | Unisantis Electronics Singapore Pte. Ltd. | Method for producing semiconductor device and semiconductor device |
| KR20140009509A (ko) * | 2012-05-18 | 2014-01-22 | 유니산티스 일렉트로닉스 싱가포르 프라이빗 리미티드 | 반도체 장치의 제조 방법 및 반도체 장치 |
| US8877578B2 (en) | 2012-05-18 | 2014-11-04 | Unisantis Electronics Singapore Pte. Ltd. | Method for producing semiconductor device and semiconductor device |
| KR101881857B1 (ko) | 2012-08-27 | 2018-08-24 | 삼성전자주식회사 | 계단형 패턴 형성 방법 |
| KR101965602B1 (ko) | 2012-10-16 | 2019-04-04 | 삼성전자주식회사 | 3차원 반도체 장치의 제조 방법 및 이에 따라 제조된 3차원 반도체 장치 |
| KR101961322B1 (ko) | 2012-10-24 | 2019-03-22 | 삼성전자주식회사 | 매립 채널 어레이를 갖는 반도체 소자 |
| KR101974352B1 (ko) | 2012-12-07 | 2019-05-02 | 삼성전자주식회사 | 수직 셀을 갖는 반도체 소자의 제조 방법 및 그에 의해 제조된 반도체 소자 |
| US8835255B2 (en) * | 2013-01-23 | 2014-09-16 | Globalfoundries Inc. | Method of forming a semiconductor structure including a vertical nanowire |
| US8969949B2 (en) * | 2013-03-10 | 2015-03-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Structure and method for static random access memory device of vertical tunneling field effect transistor |
| KR102084954B1 (ko) | 2013-05-02 | 2020-03-05 | 삼성전자주식회사 | 반도체 장치 및 이의 제조 방법 |
| US10008566B2 (en) * | 2013-09-12 | 2018-06-26 | Taiwan Semiconductor Manufacturing Company Limited | Semiconductor device with reduced electrical resistance and capacitance |
| US9520494B2 (en) * | 2013-09-26 | 2016-12-13 | Intel Corporation | Vertical non-planar semiconductor device for system-on-chip (SoC) applications |
| WO2015195109A1 (en) * | 2014-06-18 | 2015-12-23 | Intel Corporation | Pillar resistor structures for integrated circuitry |
| JP5814437B2 (ja) * | 2014-08-06 | 2015-11-17 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. | 半導体装置の製造方法と半導体装置 |
| US9373620B2 (en) | 2014-09-12 | 2016-06-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Series connected transistor structure and method of manufacturing the same |
| US9691471B2 (en) | 2014-09-15 | 2017-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | SRAM cells with vertical gate-all-round MOSFETs |
| US9871111B2 (en) * | 2014-09-18 | 2018-01-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method |
| JP5986618B2 (ja) * | 2014-12-04 | 2016-09-06 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. | 半導体装置 |
| US9646973B2 (en) * | 2015-03-27 | 2017-05-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Dual-port SRAM cell structure with vertical devices |
| CN106486369B (zh) * | 2015-08-27 | 2020-04-07 | 中芯国际集成电路制造(上海)有限公司 | 晶体管及其形成方法 |
| KR102476143B1 (ko) * | 2016-02-26 | 2022-12-12 | 삼성전자주식회사 | 반도체 장치 |
| JP6143913B2 (ja) * | 2016-04-06 | 2017-06-07 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッドUnisantis Electronics Singapore Pte Ltd. | 半導体装置の製造方法及び半導体装置 |
| US10373878B2 (en) | 2017-04-26 | 2019-08-06 | Samsung Electronics Co., Ltd. | Semiconductor device and method of manufacturing the same |
| US10269805B2 (en) * | 2017-06-26 | 2019-04-23 | Micron Technology, Inc. | Apparatuses having body connection lines coupled with access devices |
| CN111344841B (zh) * | 2017-11-01 | 2023-07-04 | 新加坡优尼山帝斯电子私人有限公司 | 柱状半导体装置、及其制造方法 |
| CN109285836B (zh) | 2018-08-28 | 2023-10-10 | 中国科学院微电子研究所 | 半导体存储设备及其制造方法及包括存储设备的电子设备 |
| CN109285838B (zh) * | 2018-08-28 | 2023-05-02 | 中国科学院微电子研究所 | 半导体存储设备及其制造方法及包括存储设备的电子设备 |
| DE102019109846A1 (de) | 2018-09-27 | 2020-04-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Halbleiterstruktur mit gestaffeltem selektivem wachstum |
| US10840133B2 (en) | 2018-09-27 | 2020-11-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor structure with staggered selective growth |
| EP3718962B1 (en) * | 2019-04-01 | 2022-11-09 | IMEC vzw | A method for forming a vertical nanowire or nanosheet field-effect transistor |
| KR102773664B1 (ko) * | 2019-06-18 | 2025-02-25 | 삼성전자주식회사 | 돌출된 얕은 트렌치 분리 구조체를 갖는 수직 전계 효과 트랜지스터 장치 및 수직 전계 효과 트랜지스터 장치를 제조하는 방법 |
| TWI791871B (zh) * | 2019-07-19 | 2023-02-11 | 力晶積成電子製造股份有限公司 | 通道全環繞半導體裝置及其製造方法 |
| KR102741647B1 (ko) | 2019-12-24 | 2024-12-16 | 삼성전자주식회사 | 반도체 소자 |
| CN113113310B (zh) * | 2020-01-13 | 2024-07-16 | 中芯国际集成电路制造(北京)有限公司 | 半导体器件及其形成方法 |
| CN113113308B (zh) * | 2020-01-13 | 2022-09-20 | 中芯国际集成电路制造(天津)有限公司 | 半导体器件及其形成方法 |
| US11276781B2 (en) * | 2020-04-15 | 2022-03-15 | International Business Machines Corporation | Bottom source/drain for fin field effect transistors |
| US20220328413A1 (en) * | 2020-07-01 | 2022-10-13 | Sandisk Technologies Llc | Three-dimensional memory device including stairless word line contact structures and method of making the same (as amended) |
| JP7057032B1 (ja) * | 2020-12-25 | 2022-04-19 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッド | 半導体素子を用いたメモリ装置 |
| US11640987B2 (en) * | 2021-02-04 | 2023-05-02 | Applied Materials, Inc. | Implant to form vertical FETs with self-aligned drain spacer and junction |
| US11770923B2 (en) * | 2021-03-03 | 2023-09-26 | Micron Technology, Inc. | Thin film transistor random access memory |
| CN116391261A (zh) | 2021-10-31 | 2023-07-04 | 长江存储科技有限责任公司 | 具有垂直晶体管的存储器器件及其形成方法 |
| CN116584162A (zh) | 2021-10-31 | 2023-08-11 | 长江存储科技有限责任公司 | 具有垂直晶体管的存储器器件及其形成方法 |
| WO2023070640A1 (en) | 2021-10-31 | 2023-05-04 | Yangtze Memory Technologies Co., Ltd. | Memory devices having vertical transistors in staggered layouts |
| CN116391452A (zh) | 2021-10-31 | 2023-07-04 | 长江存储科技有限责任公司 | 具有垂直晶体管和堆叠存储单元的存储器器件及其形成方法 |
| WO2023070638A1 (en) | 2021-10-31 | 2023-05-04 | Yangtze Memory Technologies Co., Ltd. | Memory devices having vertical transistors and methods for forming the same |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR940000513B1 (ko) | 1991-08-21 | 1994-01-21 | 현대전자산업 주식회사 | Dram셀 및 그 제조방법 |
| KR940006679B1 (ko) | 1991-09-26 | 1994-07-25 | 현대전자산업 주식회사 | 수직형 트랜지스터를 갖는 dram셀 및 그 제조방법 |
| US5208172A (en) | 1992-03-02 | 1993-05-04 | Motorola, Inc. | Method for forming a raised vertical transistor |
| KR0147584B1 (ko) | 1994-03-17 | 1998-08-01 | 윤종용 | 매몰 비트라인 셀의 제조방법 |
| KR960016773B1 (en) | 1994-03-28 | 1996-12-20 | Samsung Electronics Co Ltd | Buried bit line and cylindrical gate cell and forming method thereof |
| JP3745392B2 (ja) * | 1994-05-26 | 2006-02-15 | 株式会社ルネサステクノロジ | 半導体装置 |
| US5497017A (en) | 1995-01-26 | 1996-03-05 | Micron Technology, Inc. | Dynamic random access memory array having a cross-point layout, tungsten digit lines buried in the substrate, and vertical access transistors |
| US5885864A (en) | 1996-10-24 | 1999-03-23 | Micron Technology, Inc. | Method for forming compact memory cell using vertical devices |
| EP0899790A3 (de) | 1997-08-27 | 2006-02-08 | Infineon Technologies AG | DRAM-Zellanordnung und Verfahren zu deren Herstellung |
| JP2004096065A (ja) * | 2002-07-08 | 2004-03-25 | Renesas Technology Corp | 半導体記憶装置およびその製造方法 |
| US7276754B2 (en) | 2003-08-29 | 2007-10-02 | Micron Technology, Inc. | Annular gate and technique for fabricating an annular gate |
| US7262089B2 (en) * | 2004-03-11 | 2007-08-28 | Micron Technology, Inc. | Methods of forming semiconductor structures |
| US20060046392A1 (en) * | 2004-08-26 | 2006-03-02 | Manning H M | Methods of forming vertical transistor structures |
| US7285812B2 (en) * | 2004-09-02 | 2007-10-23 | Micron Technology, Inc. | Vertical transistors |
| KR100618875B1 (ko) | 2004-11-08 | 2006-09-04 | 삼성전자주식회사 | 수직 채널 mos 트랜지스터를 구비한 반도체 메모리소자 및 그 제조방법 |
| US7199419B2 (en) * | 2004-12-13 | 2007-04-03 | Micron Technology, Inc. | Memory structure for reduced floating body effect |
| KR100723527B1 (ko) * | 2006-02-13 | 2007-05-30 | 삼성전자주식회사 | 수직 채널 트랜지스터를 구비한 반도체 소자의 제조방법 및그에 의해 제조된 반도체 소자 |
-
2007
- 2007-12-11 US US11/954,135 patent/US8058683B2/en active Active
- 2007-12-28 KR KR1020070139691A patent/KR101398494B1/ko active Active
-
2008
- 2008-01-10 JP JP2008003657A patent/JP5383049B2/ja active Active
- 2008-01-18 CN CN2008100035503A patent/CN101226960B/zh active Active
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8482041B2 (en) | 2007-10-29 | 2013-07-09 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor structure and method of fabricating the semiconductor structure |
| US8598650B2 (en) | 2008-01-29 | 2013-12-03 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device and production method therefor |
| US8497548B2 (en) | 2009-04-28 | 2013-07-30 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device including a MOS transistor and production method therefor |
| US8647947B2 (en) | 2009-04-28 | 2014-02-11 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device including a MOS transistor and production method therefor |
| US8610202B2 (en) | 2009-10-01 | 2013-12-17 | Unisantis Electronics Singapore Pte Ltd. | Semiconductor device having a surrounding gate |
| US8575662B2 (en) | 2010-03-08 | 2013-11-05 | Unisantis Electronics Singapore Pte Ltd. | Solid state imaging device having high pixel density |
| US8487357B2 (en) | 2010-03-12 | 2013-07-16 | Unisantis Electronics Singapore Pte Ltd. | Solid state imaging device having high sensitivity and high pixel density |
| US8486785B2 (en) | 2010-06-09 | 2013-07-16 | Unisantis Electronics Singapore Pte Ltd. | Surround gate CMOS semiconductor device |
| US8609494B2 (en) | 2010-06-09 | 2013-12-17 | Unisantis Electronics Singapore Pte Ltd. | Surround gate CMOS semiconductor device |
| US8564034B2 (en) | 2011-09-08 | 2013-10-22 | Unisantis Electronics Singapore Pte. Ltd. | Solid-state imaging device |
| US8669601B2 (en) | 2011-09-15 | 2014-03-11 | Unisantis Electronics Singapore Pte. Ltd. | Method for producing semiconductor device and semiconductor device having pillar-shaped semiconductor |
| US8772175B2 (en) | 2011-12-19 | 2014-07-08 | Unisantis Electronics Singapore Pte. Ltd. | Method for manufacturing semiconductor device and semiconductor device |
| US8748938B2 (en) | 2012-02-20 | 2014-06-10 | Unisantis Electronics Singapore Pte. Ltd. | Solid-state imaging device |
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