JP2007525769A - 両面dimm配置用の交換可能接続アレイ - Google Patents
両面dimm配置用の交換可能接続アレイ Download PDFInfo
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- JP2007525769A JP2007525769A JP2007500868A JP2007500868A JP2007525769A JP 2007525769 A JP2007525769 A JP 2007525769A JP 2007500868 A JP2007500868 A JP 2007500868A JP 2007500868 A JP2007500868 A JP 2007500868A JP 2007525769 A JP2007525769 A JP 2007525769A
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- 239000000758 substrate Substances 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 claims description 13
- 230000009977 dual effect Effects 0.000 claims description 9
- 238000003491 array Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000116 mitigating effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
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- H—ELECTRICITY
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10159—Memory
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10734—Ball grid array [BGA]; Bump grid array
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/15—Position of the PCB during processing
- H05K2203/1572—Processing both sides of a PCB by the same process; Providing a similar arrangement of components on both sides; Making interlayer connections from two sides
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Abstract
Description
Claims (16)
- メモリ・モジュールであって、
外側の第1列及び第2列が存在し、前記外側の第1列における接続と前記外側の第2列における接続とを相互交換することが可能であるように行及び列に配置された接続アレイを備えることを特徴とするメモリ・モジュール。 - 請求項1記載のメモリ・モジュールであって、前記外側の第1列が近端列であり、前記外側の第2列が遠端列であることを特徴とするメモリ・モジュール。
- 請求項1記載のメモリ・モジュールであって、相互交換可能な接続を有する外側の第3列及び第4列が存在していることを特徴とするメモリ・モジュール。
- 請求項1記載のメモリ・モジュールであって、X16及びX4/X8から成る群から選択されるパッケージを更に備えることを特徴とするメモリ・モジュール。
- メモリ・システムであって、
基板の第1の面上に実装された第1のメモリ・モジュールであって、
外側の第1列及び第2列が存在し、前記外側の第1列における接続と前記外側の第2列における接続とを相互交換することが可能であるように行及び列に配置された接続アレイを備える第1のメモリ・モジュールと、
基板の第2の面上に実装された第2のメモリ・モジュールであって、
外側の第1列及び第2列が存在し、前記外側の第1列における接続と前記外側の第2列における接続とを相互交換することが可能であるように行及び列に配置された接続アレイを備える第2のメモリ・モジュールと、
前記メモリ・モジュールの外側の第1列と外側の第2列との間での信号の相互交換を制御するためのメモリ・コントローラと、
前記基板内のトレースであって、該トレース上でルーティングされる信号が、一様なルーティング長を有するように前記第1のメモリ・モジュール及び前記第2のメモリ・モジュールの前記外側の第1列における接続及び前記外側の第2列における接続が配置されるトレースとを備えることを特徴とするメモリ・システム。 - 請求項5記載のメモリ・システムであって、前記基板が複数層印刷回路基板を更に備えることを特徴とするメモリ・システム。
- 請求項6記載のメモリ・システムであって、前記印刷回路基板の複数層内に複数の信号トレースを更に備えることを特徴とするメモリ・システム。
- 請求項5記載のメモリ・システムであって、X16及びX4/X8から成る群から選択されるパッケージ内に前記メモリ・モジュールがパッケージ化されていることを特徴とするメモリ・システム。
- メモリ素子であって、
行及び列に配置されたメモリ接続アレイを有するメモリ・アレイと、
該メモリ・アレイを受けるためのモジュールと、
行及び列に配置されたコネクタ接続アレイを、前記メモリ接続と前記コネクタ接続とを相互交換することが可能であるように有する、前記モジュール上のコネクタとを備えることを特徴とするメモリ素子。 - 請求項9記載のメモリ素子であって、前記モジュールがデュアル・インライン・メモリ・モジュールを更に備えることを特徴とするメモリ素子。
- 請求項10記載のメモリ・アレイであって、前記モジュールは、X16パッケージ及びX4/X8パッケージから成る群から選択されることを特徴とするメモリ・アレイ。
- メモリ素子を設計する方法であって、
相互交換可能なメモリ信号群及び固定のメモリ信号群を決定する工程と、
接続アレイの外側の列に、前記相互交換可能なメモリ信号群を配置する工程と、
接続アレイの内側の列に前記固定のメモリ信号群を配置する工程とを備えることを特徴とする方法。 - 請求項12記載の方法であって、相互交換可能なメモリ信号群を決定する工程が、相互交換可能であるとして行内のアドレス接続を識別する工程を更に備えることを特徴とする方法。
- 請求項12記載の方法であって、相互交換可能なメモリ信号群を決定する工程が、相互交換可能であるとしてバンクアドレス接続を識別する工程を更に備えることを特徴とする方法。
- 請求項12記載の方法であって、前記相互交換可能なメモリ信号群を外側の列に配置する工程が、前記相互交換可能なメモリ信号群を、前記接続アレイの各面上の外側の2列に配置する工程を更に備えることを特徴とする方法。
- 請求項12記載の方法であって、前記相互交換可能なメモリ信号群を外側の列に配置する工程が、前記相互交換可能なメモリ信号群を、前記接続アレイの各面上の外側の1列に配置する工程を更に備えることを特徴とする方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/792,350 US20050195629A1 (en) | 2004-03-02 | 2004-03-02 | Interchangeable connection arrays for double-sided memory module placement |
PCT/US2005/004595 WO2005093757A1 (en) | 2004-03-02 | 2005-02-14 | Interchangeable connection arrays for double-sided dimm placement |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2007525769A true JP2007525769A (ja) | 2007-09-06 |
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ID=34911834
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007500868A Pending JP2007525769A (ja) | 2004-03-02 | 2005-02-14 | 両面dimm配置用の交換可能接続アレイ |
Country Status (8)
Country | Link |
---|---|
US (4) | US20050195629A1 (ja) |
EP (1) | EP1723654B1 (ja) |
JP (1) | JP2007525769A (ja) |
CN (1) | CN1926632B (ja) |
AT (1) | ATE472801T1 (ja) |
DE (1) | DE602005022053D1 (ja) |
TW (1) | TWI295063B (ja) |
WO (1) | WO2005093757A1 (ja) |
Cited By (3)
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JP2019057349A (ja) * | 2017-09-21 | 2019-04-11 | 東芝メモリ株式会社 | 半導体記憶装置 |
JP2020096194A (ja) * | 2020-02-26 | 2020-06-18 | キオクシア株式会社 | システム |
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Also Published As
Publication number | Publication date |
---|---|
EP1723654B1 (en) | 2010-06-30 |
US20120199973A1 (en) | 2012-08-09 |
TWI295063B (en) | 2008-03-21 |
CN1926632A (zh) | 2007-03-07 |
EP1723654A1 (en) | 2006-11-22 |
US8438515B2 (en) | 2013-05-07 |
US8099687B2 (en) | 2012-01-17 |
US20050195629A1 (en) | 2005-09-08 |
US20080062734A1 (en) | 2008-03-13 |
CN1926632B (zh) | 2011-08-03 |
ATE472801T1 (de) | 2010-07-15 |
DE602005022053D1 (de) | 2010-08-12 |
TW200540876A (en) | 2005-12-16 |
US8775991B2 (en) | 2014-07-08 |
WO2005093757A1 (en) | 2005-10-06 |
US20130341790A1 (en) | 2013-12-26 |
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