|
US3922703A
(en)
*
|
1974-04-03 |
1975-11-25 |
Rca Corp |
Electroluminescent semiconductor device
|
|
FR2514566A1
(fr)
*
|
1982-02-02 |
1983-04-15 |
Bagratishvili Givi |
Dispositif emetteur de lumiere semi-conducteur a base de nitrure de gallium et procede de fabrication dudit dispositif
|
|
JPS6065798A
(ja)
|
1983-09-19 |
1985-04-15 |
Toyota Central Res & Dev Lab Inc |
窒化ガリウム単結晶の成長方法
|
|
CN1014535B
(zh)
|
1988-12-30 |
1991-10-30 |
中国科学院物理研究所 |
利用改进的矿化剂生长磷酸钛氧钾单晶的方法
|
|
US5096860A
(en)
|
1990-05-25 |
1992-03-17 |
Alcan International Limited |
Process for producing unagglomerated single crystals of aluminum nitride
|
|
KR920004181B1
(ko)
|
1990-09-13 |
1992-05-30 |
한국과학기술연구원 |
입방정질화붕소의 제조방법
|
|
US5190738A
(en)
|
1991-06-17 |
1993-03-02 |
Alcan International Limited |
Process for producing unagglomerated single crystals of aluminum nitride
|
|
US5306662A
(en)
|
1991-11-08 |
1994-04-26 |
Nichia Chemical Industries, Ltd. |
Method of manufacturing P-type compound semiconductor
|
|
US5456204A
(en)
|
1993-05-28 |
1995-10-10 |
Alfa Quartz, C.A. |
Filtering flow guide for hydrothermal crystal growth
|
|
GB9412849D0
(en)
*
|
1993-08-02 |
1994-08-17 |
Marketing Store Ltd |
Package
|
|
PL173917B1
(pl)
|
1993-08-10 |
1998-05-29 |
Ct Badan Wysokocisnieniowych P |
Sposób wytwarzania krystalicznej struktury wielowarstwowej
|
|
EP0717788B1
(en)
|
1993-09-17 |
1997-07-30 |
Brent International Plc. |
Pre-rinse for phosphating metal surfaces
|
|
US5679152A
(en)
|
1994-01-27 |
1997-10-21 |
Advanced Technology Materials, Inc. |
Method of making a single crystals Ga*N article
|
|
US5599520A
(en)
|
1994-11-03 |
1997-02-04 |
Garces; Juan M. |
Synthesis of crystalline porous solids in ammonia
|
|
US5777350A
(en)
|
1994-12-02 |
1998-07-07 |
Nichia Chemical Industries, Ltd. |
Nitride semiconductor light-emitting device
|
|
US5670798A
(en)
|
1995-03-29 |
1997-09-23 |
North Carolina State University |
Integrated heterostructures of Group III-V nitride semiconductor materials including epitaxial ohmic contact non-nitride buffer layer and methods of fabricating same
|
|
US5679965A
(en)
|
1995-03-29 |
1997-10-21 |
North Carolina State University |
Integrated heterostructures of Group III-V nitride semiconductor materials including epitaxial ohmic contact, non-nitride buffer layer and methods of fabricating same
|
|
JP3728332B2
(ja)
|
1995-04-24 |
2005-12-21 |
シャープ株式会社 |
化合物半導体発光素子
|
|
GB2310083B
(en)
|
1995-08-31 |
1999-07-28 |
Toshiba Kk |
Blue light emitting element and method of manufacturing same
|
|
DE69633203T2
(de)
|
1995-09-18 |
2005-09-01 |
Hitachi, Ltd. |
Halbleiterlaservorrichtungen
|
|
AU7346396A
(en)
*
|
1995-10-13 |
1997-04-30 |
Centrum Badan Wysokocisnieniowych |
Method of manufacturing epitaxial layers of gan or ga(a1,in)n on single crystal gan and mixed ga(a1,in)n substrates
|
|
JP3563869B2
(ja)
*
|
1996-03-25 |
2004-09-08 |
トヨタ自動車株式会社 |
エンジン出力制御装置
|
|
CN1065289C
(zh)
|
1996-07-22 |
2001-05-02 |
中国科学院物理研究所 |
一种制备掺杂钒酸盐单晶的水热生长方法
|
|
JP3179346B2
(ja)
|
1996-08-27 |
2001-06-25 |
松下電子工業株式会社 |
窒化ガリウム結晶の製造方法
|
|
JPH1084161A
(ja)
|
1996-09-06 |
1998-03-31 |
Sumitomo Electric Ind Ltd |
半導体レーザ及びその製造方法
|
|
US6031858A
(en)
|
1996-09-09 |
2000-02-29 |
Kabushiki Kaisha Toshiba |
Semiconductor laser and method of fabricating same
|
|
WO1998019375A1
(en)
|
1996-10-30 |
1998-05-07 |
Hitachi, Ltd. |
Optical information processor and semiconductor light emitting device suitable for the same
|
|
US6177292B1
(en)
|
1996-12-05 |
2001-01-23 |
Lg Electronics Inc. |
Method for forming GaN semiconductor single crystal substrate and GaN diode with the substrate
|
|
KR100660152B1
(ko)
|
1997-01-09 |
2006-12-21 |
니치아 카가쿠 고교 가부시키가이샤 |
질화물반도체소자
|
|
US6677619B1
(en)
|
1997-01-09 |
2004-01-13 |
Nichia Chemical Industries, Ltd. |
Nitride semiconductor device
|
|
US5868837A
(en)
|
1997-01-17 |
1999-02-09 |
Cornell Research Foundation, Inc. |
Low temperature method of preparing GaN single crystals
|
|
PL184902B1
(pl)
|
1997-04-04 |
2003-01-31 |
Centrum Badan Wysokocisnieniowych Pan |
Sposób usuwania nierówności i obszarów silnie zdefektowanych z powierzchni kryształów i warstw epitaksjalnych GaN i Ga AL In N
|
|
JP3491492B2
(ja)
|
1997-04-09 |
2004-01-26 |
松下電器産業株式会社 |
窒化ガリウム結晶の製造方法
|
|
CN1159750C
(zh)
|
1997-04-11 |
2004-07-28 |
日亚化学工业株式会社 |
氮化物半导体的生长方法
|
|
US5888389A
(en)
|
1997-04-24 |
1999-03-30 |
Hydroprocessing, L.L.C. |
Apparatus for oxidizing undigested wastewater sludges
|
|
PL183687B1
(pl)
|
1997-06-06 |
2002-06-28 |
Ct Badan |
Sposób wytwarzania półprzewodnikowych związków grupy A-B o przewodnictwie elektrycznym typu p i typu n
|
|
US6270569B1
(en)
|
1997-06-11 |
2001-08-07 |
Hitachi Cable Ltd. |
Method of fabricating nitride crystal, mixture, liquid phase growth method, nitride crystal, nitride crystal powders, and vapor phase growth method
|
|
TW519551B
(en)
|
1997-06-11 |
2003-02-01 |
Hitachi Cable |
Methods of fabricating nitride crystals and nitride crystals obtained therefrom
|
|
GB2333521B
(en)
|
1997-06-11 |
2000-04-26 |
Hitachi Cable |
Nitride crystal growth method
|
|
US6593589B1
(en)
|
1998-01-30 |
2003-07-15 |
The University Of New Mexico |
Semiconductor nitride structures
|
|
US6249534B1
(en)
|
1998-04-06 |
2001-06-19 |
Matsushita Electronics Corporation |
Nitride semiconductor laser device
|
|
JPH11340576A
(ja)
|
1998-05-28 |
1999-12-10 |
Sumitomo Electric Ind Ltd |
窒化ガリウム系半導体デバイス
|
|
TW428331B
(en)
|
1998-05-28 |
2001-04-01 |
Sumitomo Electric Industries |
Gallium nitride single crystal substrate and method of producing the same
|
|
JP4005701B2
(ja)
*
|
1998-06-24 |
2007-11-14 |
シャープ株式会社 |
窒素化合物半導体膜の形成方法および窒素化合物半導体素子
|
|
TW413956B
(en)
|
1998-07-28 |
2000-12-01 |
Sumitomo Electric Industries |
Fluorescent substrate LED
|
|
US6335546B1
(en)
*
|
1998-07-31 |
2002-01-01 |
Sharp Kabushiki Kaisha |
Nitride semiconductor structure, method for producing a nitride semiconductor structure, and light emitting device
|
|
JP2000091637A
(ja)
|
1998-09-07 |
2000-03-31 |
Rohm Co Ltd |
半導体発光素子の製法
|
|
US6423984B1
(en)
|
1998-09-10 |
2002-07-23 |
Toyoda Gosei Co., Ltd. |
Light-emitting semiconductor device using gallium nitride compound semiconductor
|
|
US6252261B1
(en)
|
1998-09-30 |
2001-06-26 |
Nec Corporation |
GaN crystal film, a group III element nitride semiconductor wafer and a manufacturing process therefor
|
|
JP3592553B2
(ja)
*
|
1998-10-15 |
2004-11-24 |
株式会社東芝 |
窒化ガリウム系半導体装置
|
|
DE69941921D1
(de)
*
|
1998-11-06 |
2010-03-04 |
Panasonic Corp |
Halbleitervorrichtung
|
|
TW498102B
(en)
|
1998-12-28 |
2002-08-11 |
Futaba Denshi Kogyo Kk |
A process for preparing GaN fluorescent substance
|
|
US6372041B1
(en)
*
|
1999-01-08 |
2002-04-16 |
Gan Semiconductor Inc. |
Method and apparatus for single crystal gallium nitride (GaN) bulk synthesis
|
|
US20020096674A1
(en)
*
|
1999-01-08 |
2002-07-25 |
Cho Hak Dong |
Nucleation layer growth and lift-up of process for GaN wafer
|
|
JP2000216494A
(ja)
|
1999-01-20 |
2000-08-04 |
Sanyo Electric Co Ltd |
半導体発光素子およびその製造方法
|
|
EP1024524A2
(en)
|
1999-01-27 |
2000-08-02 |
Matsushita Electric Industrial Co., Ltd. |
Deposition of dielectric layers using supercritical CO2
|
|
US6177057B1
(en)
|
1999-02-09 |
2001-01-23 |
The United States Of America As Represented By The Secretary Of The Navy |
Process for preparing bulk cubic gallium nitride
|
|
JP3399392B2
(ja)
*
|
1999-02-19 |
2003-04-21 |
株式会社村田製作所 |
半導体発光素子、およびその製造方法
|
|
WO2000052796A1
(en)
|
1999-03-04 |
2000-09-08 |
Nichia Corporation |
Nitride semiconductor laser element
|
|
JP3957918B2
(ja)
|
1999-05-17 |
2007-08-15 |
独立行政法人科学技術振興機構 |
窒化ガリウム単結晶の育成方法
|
|
US6592663B1
(en)
|
1999-06-09 |
2003-07-15 |
Ricoh Company Ltd. |
Production of a GaN bulk crystal substrate and a semiconductor device formed on a GaN bulk crystal substrate
|
|
US6475277B1
(en)
|
1999-06-30 |
2002-11-05 |
Sumitomo Electric Industries, Ltd. |
Group III-V nitride semiconductor growth method and vapor phase growth apparatus
|
|
JP4329229B2
(ja)
|
1999-06-30 |
2009-09-09 |
住友電気工業株式会社 |
Iii−v族窒化物半導体の成長方法および気相成長装置
|
|
FR2796657B1
(fr)
*
|
1999-07-20 |
2001-10-26 |
Thomson Csf |
Procede de synthese de materiaux massifs monocristallins en nitrures d'elements de la colonne iii du tableau de la classification periodique
|
|
JP3968920B2
(ja)
|
1999-08-10 |
2007-08-29 |
双葉電子工業株式会社 |
蛍光体
|
|
JP4646359B2
(ja)
|
1999-09-09 |
2011-03-09 |
シャープ株式会社 |
窒化物半導体発光素子の製造方法
|
|
JP2001085737A
(ja)
|
1999-09-10 |
2001-03-30 |
Sharp Corp |
窒化物半導体発光素子
|
|
US6265322B1
(en)
|
1999-09-21 |
2001-07-24 |
Agere Systems Guardian Corp. |
Selective growth process for group III-nitride-based semiconductors
|
|
CN1113988C
(zh)
|
1999-09-29 |
2003-07-09 |
中国科学院物理研究所 |
一种氮化镓单晶的热液生长方法
|
|
US6398867B1
(en)
|
1999-10-06 |
2002-06-04 |
General Electric Company |
Crystalline gallium nitride and method for forming crystalline gallium nitride
|
|
EP1104031B1
(en)
|
1999-11-15 |
2012-04-11 |
Panasonic Corporation |
Nitride semiconductor laser diode and method of fabricating the same
|
|
JP2001168385A
(ja)
|
1999-12-06 |
2001-06-22 |
Toyoda Gosei Co Ltd |
Iii族窒化物系化合物半導体素子及びiii族窒化物系化合物半導体発光素子
|
|
US6653663B2
(en)
|
1999-12-06 |
2003-11-25 |
Matsushita Electric Industrial Co., Ltd. |
Nitride semiconductor device
|
|
JP2001185718A
(ja)
*
|
1999-12-24 |
2001-07-06 |
Hitachi Cable Ltd |
窒化ガリウム系化合物半導体を用いた高電子移動度トランジスタ用エピタキシャルウェハの製造方法
|
|
US7315599B1
(en)
|
1999-12-29 |
2008-01-01 |
Intel Corporation |
Skew correction circuit
|
|
US6355497B1
(en)
*
|
2000-01-18 |
2002-03-12 |
Xerox Corporation |
Removable large area, low defect density films for led and laser diode growth
|
|
JP3335974B2
(ja)
|
2000-01-24 |
2002-10-21 |
星和電機株式会社 |
窒化ガリウム系半導体発光素子及びその製造方法
|
|
US20010015437A1
(en)
|
2000-01-25 |
2001-08-23 |
Hirotatsu Ishii |
GaN field-effect transistor, inverter device, and production processes therefor
|
|
JP4429459B2
(ja)
|
2000-03-03 |
2010-03-10 |
古河電気工業株式会社 |
高抵抗GaN結晶層の製造方法
|
|
US6596079B1
(en)
|
2000-03-13 |
2003-07-22 |
Advanced Technology Materials, Inc. |
III-V nitride substrate boule and method of making and using the same
|
|
US6447604B1
(en)
|
2000-03-13 |
2002-09-10 |
Advanced Technology Materials, Inc. |
Method for achieving improved epitaxy quality (surface texture and defect density) on free-standing (aluminum, indium, gallium) nitride ((al,in,ga)n) substrates for opto-electronic and electronic devices
|
|
JP3946427B2
(ja)
|
2000-03-29 |
2007-07-18 |
株式会社東芝 |
エピタキシャル成長用基板の製造方法及びこのエピタキシャル成長用基板を用いた半導体装置の製造方法
|
|
AU2001274810A1
(en)
*
|
2000-04-17 |
2001-10-30 |
Virginia Commonwealth University |
Defect reduction in gan and related materials
|
|
JP2001339121A
(ja)
|
2000-05-29 |
2001-12-07 |
Sharp Corp |
窒化物半導体発光素子とそれを含む光学装置
|
|
GB2363518A
(en)
*
|
2000-06-17 |
2001-12-19 |
Sharp Kk |
A method of growing a nitride layer on a GaN substrate
|
|
US6693935B2
(en)
|
2000-06-20 |
2004-02-17 |
Sony Corporation |
Semiconductor laser
|
|
JP2002016285A
(ja)
|
2000-06-27 |
2002-01-18 |
National Institute Of Advanced Industrial & Technology |
半導体発光素子
|
|
US6586762B2
(en)
|
2000-07-07 |
2003-07-01 |
Nichia Corporation |
Nitride semiconductor device with improved lifetime and high output power
|
|
JP3968968B2
(ja)
*
|
2000-07-10 |
2007-08-29 |
住友電気工業株式会社 |
単結晶GaN基板の製造方法
|
|
US6749819B2
(en)
|
2000-07-28 |
2004-06-15 |
Japan Pionics Co., Ltd. |
Process for purifying ammonia
|
|
JP4190711B2
(ja)
*
|
2000-08-31 |
2008-12-03 |
株式会社リコー |
Iii族窒化物結晶の結晶製造方法および結晶製造装置
|
|
JP4154558B2
(ja)
|
2000-09-01 |
2008-09-24 |
日本電気株式会社 |
半導体装置
|
|
JP4416297B2
(ja)
|
2000-09-08 |
2010-02-17 |
シャープ株式会社 |
窒化物半導体発光素子、ならびにそれを使用した発光装置および光ピックアップ装置
|
|
US6858882B2
(en)
|
2000-09-08 |
2005-02-22 |
Sharp Kabushiki Kaisha |
Nitride semiconductor light-emitting device and optical device including the same
|
|
JP2002094189A
(ja)
|
2000-09-14 |
2002-03-29 |
Sharp Corp |
窒化物半導体レーザ素子およびそれを用いた光学装置
|
|
JP2002134416A
(ja)
|
2000-10-19 |
2002-05-10 |
Ricoh Co Ltd |
p型3族窒化物の結晶成長方法および製造方法、並びに半導体素子
|
|
US7053413B2
(en)
|
2000-10-23 |
2006-05-30 |
General Electric Company |
Homoepitaxial gallium-nitride-based light emitting device and method for producing
|
|
US6936488B2
(en)
|
2000-10-23 |
2005-08-30 |
General Electric Company |
Homoepitaxial gallium-nitride-based light emitting device and method for producing
|
|
JP4063520B2
(ja)
|
2000-11-30 |
2008-03-19 |
日本碍子株式会社 |
半導体発光素子
|
|
AU2002219966A1
(en)
|
2000-11-30 |
2002-06-11 |
North Carolina State University |
Methods and apparatus for producing m'n based materials
|
|
JP4003413B2
(ja)
|
2000-12-11 |
2007-11-07 |
日亜化学工業株式会社 |
13族窒化物結晶の製造方法
|
|
JP3785566B2
(ja)
|
2001-03-19 |
2006-06-14 |
株式会社日鉱マテリアルズ |
GaN系化合物半導体結晶の製造方法
|
|
US6806508B2
(en)
|
2001-04-20 |
2004-10-19 |
General Electic Company |
Homoepitaxial gallium nitride based photodetector and method of producing
|
|
JP4633962B2
(ja)
|
2001-05-18 |
2011-02-16 |
日亜化学工業株式会社 |
窒化物半導体基板の製造方法
|
|
PL207400B1
(pl)
|
2001-06-06 |
2010-12-31 |
Ammono Społka Z Ograniczoną Odpowiedzialnością |
Sposób i urządzenie do otrzymywania objętościowego monokryształu azotku zawierającego gal
|
|
US6734530B2
(en)
|
2001-06-06 |
2004-05-11 |
Matsushita Electric Industries Co., Ltd. |
GaN-based compound semiconductor EPI-wafer and semiconductor element using the same
|
|
PL219109B1
(pl)
|
2001-06-06 |
2015-03-31 |
Ammono Spółka Z Ograniczoną Odpowiedzialnością |
Sposób otrzymywania objętościowego monokrystalicznego azotku zawierającego gal oraz urządzenie do otrzymywania objętościowego monokrystalicznego azotku zawierającego gal
|
|
US6488767B1
(en)
*
|
2001-06-08 |
2002-12-03 |
Advanced Technology Materials, Inc. |
High surface quality GaN wafer and method of fabricating same
|
|
JP2002009392A
(ja)
|
2001-06-22 |
2002-01-11 |
Matsushita Electric Ind Co Ltd |
半導体発光素子およびその製造方法
|
|
US6562466B2
(en)
|
2001-07-02 |
2003-05-13 |
Essilor International Compagnie Generale D'optique |
Process for transferring a coating onto a surface of a lens blank
|
|
WO2003036771A1
(en)
*
|
2001-10-26 |
2003-05-01 |
Ammono Sp.Zo.O. |
Nitride semiconductor laser element, and production method therefor
|
|
US7132730B2
(en)
|
2001-10-26 |
2006-11-07 |
Ammono Sp. Z.O.O. |
Bulk nitride mono-crystal including substrate for epitaxy
|
|
US6949140B2
(en)
|
2001-12-05 |
2005-09-27 |
Ricoh Company, Ltd. |
Crystal growth method, crystal growth apparatus, group-III nitride crystal and group-III nitride semiconductor device
|
|
US7097707B2
(en)
|
2001-12-31 |
2006-08-29 |
Cree, Inc. |
GaN boule grown from liquid melt using GaN seed wafers
|
|
US20030209191A1
(en)
|
2002-05-13 |
2003-11-13 |
Purdy Andrew P. |
Ammonothermal process for bulk synthesis and growth of cubic GaN
|
|
US20060138431A1
(en)
|
2002-05-17 |
2006-06-29 |
Robert Dwilinski |
Light emitting device structure having nitride bulk single crystal layer
|
|
AU2002354463A1
(en)
|
2002-05-17 |
2003-12-02 |
Ammono Sp.Zo.O. |
Bulk single crystal production facility employing supercritical ammonia
|
|
JP4416648B2
(ja)
|
2002-05-17 |
2010-02-17 |
アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン |
発光素子の製造方法
|
|
JP2005531154A
(ja)
|
2002-06-26 |
2005-10-13 |
アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン |
窒化物半導体レーザ素子及びその性能を向上させる方法
|
|
WO2004003261A1
(en)
|
2002-06-26 |
2004-01-08 |
Ammono Sp. Z O.O. |
Process for obtaining of bulk monocrystallline gallium-containing nitride
|
|
US7099073B2
(en)
*
|
2002-09-27 |
2006-08-29 |
Lucent Technologies Inc. |
Optical frequency-converters based on group III-nitrides
|
|
JP2006509707A
(ja)
|
2002-12-11 |
2006-03-23 |
アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン |
ガリウム含有窒化物のバルク単結晶を得るための改良されたプロセス
|
|
TWI334890B
(en)
|
2002-12-11 |
2010-12-21 |
Ammono Sp Zoo |
Process for obtaining bulk mono-crystalline gallium-containing nitride, eliminating impurities from the obtained crystal and manufacturing substrates made of bulk mono-crystalline gallium-containing nitride
|
|
KR101060073B1
(ko)
|
2002-12-11 |
2011-08-29 |
니치아 카가쿠 고교 가부시키가이샤 |
템플레이트 타입의 기판 및 그 제조 방법
|
|
EP1616981A4
(en)
|
2003-04-03 |
2009-06-03 |
Tokyo Denpa Kk |
ZINC OXIDE-MONOCRYSTAL
|
|
EP1759408A1
(en)
|
2004-06-11 |
2007-03-07 |
AMMONO Sp.z o.o. |
High electron mobility transistor (hemt) made of layers of group xiii element nitrides and manufacturing method thereof.
|
|
PL1769105T3
(pl)
|
2004-06-11 |
2014-11-28 |
Ammono S A |
Objętościowy monokrystaliczny azotek galu oraz sposób jego wytwarzania
|
|
PL371405A1
(pl)
|
2004-11-26 |
2006-05-29 |
Ammono Sp.Z O.O. |
Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku
|
|
US7704324B2
(en)
|
2005-01-25 |
2010-04-27 |
General Electric Company |
Apparatus for processing materials in supercritical fluids and methods thereof
|
|
US8253221B2
(en)
|
2007-09-19 |
2012-08-28 |
The Regents Of The University Of California |
Gallium nitride bulk crystals and their growth method
|
|
CN101437987A
(zh)
|
2006-04-07 |
2009-05-20 |
加利福尼亚大学董事会 |
生长大表面积氮化镓晶体
|
|
EP2092093A4
(en)
|
2006-10-25 |
2017-06-14 |
The Regents of The University of California |
Method for growing group iii-nitride crystals in a mixture of supercritical ammonia and nitrogen, and group iii-nitride crystals grown thereby
|