JP2004531879A - 基板を均一にコーティングする方法 - Google Patents
基板を均一にコーティングする方法 Download PDFInfo
- Publication number
- JP2004531879A JP2004531879A JP2002570011A JP2002570011A JP2004531879A JP 2004531879 A JP2004531879 A JP 2004531879A JP 2002570011 A JP2002570011 A JP 2002570011A JP 2002570011 A JP2002570011 A JP 2002570011A JP 2004531879 A JP2004531879 A JP 2004531879A
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- JP
- Japan
- Prior art keywords
- wafer
- delivery
- photoresist
- solvent
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 128
- 239000007789 gas Substances 0.000 claims abstract description 181
- 239000002904 solvent Substances 0.000 claims abstract description 176
- 238000000034 method Methods 0.000 claims abstract description 163
- 238000000576 coating method Methods 0.000 claims abstract description 61
- 229920000642 polymer Polymers 0.000 claims abstract description 61
- 239000011248 coating agent Substances 0.000 claims abstract description 51
- 239000000356 contaminant Substances 0.000 claims abstract description 10
- 238000002156 mixing Methods 0.000 claims abstract description 3
- 229920002120 photoresistant polymer Polymers 0.000 claims description 134
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 19
- 238000001704 evaporation Methods 0.000 claims description 18
- 230000008020 evaporation Effects 0.000 claims description 18
- 230000003287 optical effect Effects 0.000 claims description 16
- 229920006395 saturated elastomer Polymers 0.000 claims description 12
- 229910052757 nitrogen Inorganic materials 0.000 claims description 11
- 239000007788 liquid Substances 0.000 claims description 9
- 238000007599 discharging Methods 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 6
- 230000004886 head movement Effects 0.000 claims 4
- 229910052756 noble gas Inorganic materials 0.000 claims 4
- 150000002835 noble gases Chemical class 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 142
- 238000004528 spin coating Methods 0.000 description 32
- 239000010408 film Substances 0.000 description 29
- 230000008569 process Effects 0.000 description 22
- 239000012530 fluid Substances 0.000 description 9
- 239000010410 layer Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 9
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- 238000010586 diagram Methods 0.000 description 5
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- 230000005587 bubbling Effects 0.000 description 3
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- 239000011261 inert gas Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
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- 229910001220 stainless steel Inorganic materials 0.000 description 3
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- 238000012546 transfer Methods 0.000 description 3
- 230000001960 triggered effect Effects 0.000 description 3
- 238000011144 upstream manufacturing Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
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- 229920001721 polyimide Polymers 0.000 description 2
- 239000005373 porous glass Substances 0.000 description 2
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- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 235000014676 Phragmites communis Nutrition 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
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- 238000002716 delivery method Methods 0.000 description 1
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- 238000010894 electron beam technology Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000000935 solvent evaporation Methods 0.000 description 1
- 230000005328 spin glass Effects 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/02—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
- B05C5/0208—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work for applying liquid or other fluent material to separate articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/02—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
- B05C5/0254—Coating heads with slot-shaped outlet
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/002—Processes for applying liquids or other fluent materials the substrate being rotated
- B05D1/005—Spin coating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/04—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to gases
- B05D3/0486—Operating the coating or treatment in a controlled atmosphere
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/02—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
- B05C5/0245—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work for applying liquid or other fluent material to a moving work of indefinite length, e.g. to a moving web
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/26—Processes for applying liquids or other fluent materials performed by applying the liquid or other fluent material from an outlet device in contact with, or almost in contact with, the surface
- B05D1/265—Extrusion coatings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Coating Apparatus (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/795,924 US6977098B2 (en) | 1994-10-27 | 2001-02-28 | Method of uniformly coating a substrate |
| US09/895,786 US7018943B2 (en) | 1994-10-27 | 2001-06-30 | Method of uniformly coating a substrate |
| PCT/US2002/005187 WO2002071154A2 (en) | 2001-02-28 | 2002-02-21 | Method of uniformly coating a substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004531879A true JP2004531879A (ja) | 2004-10-14 |
| JP2004531879A5 JP2004531879A5 (enExample) | 2005-12-22 |
Family
ID=27121668
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002570011A Pending JP2004531879A (ja) | 2001-02-28 | 2002-02-21 | 基板を均一にコーティングする方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7018943B2 (enExample) |
| EP (1) | EP1364256A2 (enExample) |
| JP (1) | JP2004531879A (enExample) |
| KR (1) | KR20040030517A (enExample) |
| CN (1) | CN1265245C (enExample) |
| AU (1) | AU2002252049A1 (enExample) |
| WO (1) | WO2002071154A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9759669B2 (en) | 2012-07-24 | 2017-09-12 | Hitachi High-Technologies Corporation | Inspection device |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7030039B2 (en) * | 1994-10-27 | 2006-04-18 | Asml Holding N.V. | Method of uniformly coating a substrate |
| US7018943B2 (en) | 1994-10-27 | 2006-03-28 | Asml Holding N.V. | Method of uniformly coating a substrate |
| US6977098B2 (en) * | 1994-10-27 | 2005-12-20 | Asml Holding N.V. | Method of uniformly coating a substrate |
| US6680263B2 (en) * | 2002-02-12 | 2004-01-20 | Sandia National Laboratories | Method for applying a photoresist layer to a substrate having a preexisting topology |
| US7326437B2 (en) | 2003-12-29 | 2008-02-05 | Asml Holding N.V. | Method and system for coating polymer solution on a substrate in a solvent saturated chamber |
| DE102004019731A1 (de) * | 2004-04-20 | 2005-11-10 | Sse Sister Semiconductor Equipment Gmbh | Vorrichtung zum Drehbelacken von Substraten |
| US20060073276A1 (en) * | 2004-10-04 | 2006-04-06 | Eric Antonissen | Multi-zone atomic layer deposition apparatus and method |
| US7228645B2 (en) * | 2005-01-11 | 2007-06-12 | Xuyen Ngoc Pham | Multi-zone shower head for drying single semiconductor substrate |
| JP4760516B2 (ja) * | 2005-12-15 | 2011-08-31 | 東京エレクトロン株式会社 | 塗布装置及び塗布方法 |
| US8092599B2 (en) * | 2007-07-10 | 2012-01-10 | Veeco Instruments Inc. | Movable injectors in rotating disc gas reactors |
| CN101526760B (zh) * | 2009-04-10 | 2011-09-07 | 友达光电股份有限公司 | 基板处理系统及显影方法 |
| US8906452B1 (en) * | 2011-06-03 | 2014-12-09 | Gary Hillman | Rapid coating of wafers |
| JP2013004614A (ja) * | 2011-06-14 | 2013-01-07 | Toshiba Corp | 塗布膜形成方法及び塗布膜形成装置 |
| CN104810252B (zh) * | 2014-01-24 | 2018-07-06 | 中芯国际集成电路制造(上海)有限公司 | 底部抗反射涂层的涂布方法 |
| EP3100298B1 (en) | 2014-01-27 | 2020-07-15 | Veeco Instruments Inc. | Wafer carrier having retention pockets with compound radii for chemical vapor deposition systems |
| US10000049B2 (en) | 2014-06-23 | 2018-06-19 | Exel Industries | Methods and apparatus for applying protective films |
| US10315405B2 (en) | 2014-06-23 | 2019-06-11 | Exel Industries | Methods and apparatus for applying protective films |
| US9548199B2 (en) * | 2014-09-09 | 2017-01-17 | Texas Instruments Incorporated | Method of forming a thin film that eliminates air bubbles |
| WO2016041151A1 (en) * | 2014-09-16 | 2016-03-24 | Acm Research (Shanghai) Inc. | Coater with automatic cleaning function and coater automatic cleaning method |
| KR101990704B1 (ko) | 2017-11-24 | 2019-06-18 | 고려대학교 산학협력단 | 코팅 비드 영역이 개선된 슬롯 코팅 장치 |
| CN110673444B (zh) * | 2019-09-12 | 2020-06-09 | 中国科学院上海光学精密机械研究所 | 超大超重衬底表面光刻胶均匀涂覆的旋涂设备 |
| CN110867529A (zh) * | 2019-10-22 | 2020-03-06 | 深圳市华星光电半导体显示技术有限公司 | 真空冷却干燥设备以及显示功能层干燥方法 |
| CN113318941B (zh) * | 2020-07-27 | 2022-10-14 | 上海先进半导体制造有限公司 | 在晶圆表面的聚酰亚胺前驱体的旋涂方法和系统 |
| JP7597459B2 (ja) * | 2020-09-14 | 2024-12-10 | 東京エレクトロン株式会社 | 原料供給装置及び原料供給方法 |
| US20230229085A1 (en) * | 2022-01-19 | 2023-07-20 | Taiwan Semiconductor Manufacturing Company | Device and method to promote thickness uniformity in spin-coating |
Family Cites Families (86)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE279033C (enExample) | ||||
| US3198657A (en) | 1964-09-17 | 1965-08-03 | Ibm | Process for spin coating objects |
| JPS4610790Y1 (enExample) | 1965-11-15 | 1971-04-15 | ||
| JPS5819350B2 (ja) | 1976-04-08 | 1983-04-18 | 富士写真フイルム株式会社 | スピンコ−テイング方法 |
| US4132357A (en) | 1976-06-23 | 1979-01-02 | Inmont Corporation | Apparatus and method for spray application of solvent-thinned coating compositions |
| US4068019A (en) | 1976-11-08 | 1978-01-10 | International Business Machines Corporation | Spin coating process for prevention of edge buildup |
| JPS6053675B2 (ja) | 1978-09-20 | 1985-11-27 | 富士写真フイルム株式会社 | スピンコ−テイング方法 |
| JPS5927229B2 (ja) | 1979-09-19 | 1984-07-04 | 富士通株式会社 | スピンナ− |
| US4347302A (en) | 1980-06-06 | 1982-08-31 | Alexander Gotman | Process for applying a thin coating in liquid form and subsequently drying it |
| JPS591385B2 (ja) | 1980-09-01 | 1984-01-11 | 富士通株式会社 | 回転塗布方法及びその装置 |
| JPS57130432A (en) | 1981-02-04 | 1982-08-12 | Nec Corp | Manufacture of semiconductor device |
| US4438159A (en) | 1982-03-08 | 1984-03-20 | Techsight Corporation | Coating process |
| US4451507A (en) | 1982-10-29 | 1984-05-29 | Rca Corporation | Automatic liquid dispensing apparatus for spinning surface of uniform thickness |
| US4514440A (en) | 1983-12-12 | 1985-04-30 | Allied Corporation | Spin-on dopant method |
| US4551355A (en) | 1983-06-15 | 1985-11-05 | Magnegic Peripherals | High speed coating process for magnetic disks |
| JPS6010248A (ja) | 1983-06-30 | 1985-01-19 | Fujitsu Ltd | レジスト塗布方法 |
| US4510176A (en) | 1983-09-26 | 1985-04-09 | At&T Bell Laboratories | Removal of coating from periphery of a semiconductor wafer |
| US4518678A (en) | 1983-12-16 | 1985-05-21 | Advanced Micro Devices, Inc. | Selective removal of coating material on a coated substrate |
| JPS60226125A (ja) | 1984-04-25 | 1985-11-11 | Matsushita Electronics Corp | レジスト膜の形成方法 |
| JPS6129125A (ja) | 1984-07-20 | 1986-02-10 | Hitachi Ltd | 塗布装置 |
| US4600597A (en) | 1984-10-29 | 1986-07-15 | Rca Corporation | Method and device for determining the contour of spin-coated thin films of material on substrate topography |
| JPS61176119A (ja) | 1985-01-31 | 1986-08-07 | Toshiba Corp | レジスト塗布装置 |
| JPS61206224A (ja) | 1985-03-08 | 1986-09-12 | Mitsubishi Electric Corp | レジスト塗布装置 |
| JPS6292316A (ja) | 1985-10-18 | 1987-04-27 | Hitachi Ltd | ホトレジスト塗布装置 |
| US4741926A (en) | 1985-10-29 | 1988-05-03 | Rca Corporation | Spin-coating procedure |
| JPS62225269A (ja) | 1986-03-26 | 1987-10-03 | Hitachi Ltd | 塗布装置 |
| JPS6354725A (ja) | 1986-08-25 | 1988-03-09 | Fuji Photo Film Co Ltd | スピンコ−テイング方法及びその装置 |
| US4732785A (en) | 1986-09-26 | 1988-03-22 | Motorola, Inc. | Edge bead removal process for spin on films |
| JPS6395626A (ja) | 1986-10-13 | 1988-04-26 | Toshiba Corp | レジストの塗布装置 |
| JPS63119531A (ja) | 1986-11-07 | 1988-05-24 | Mitsubishi Electric Corp | 半導体製造におけるフオトレジスト塗布装置 |
| US4800836A (en) | 1987-03-27 | 1989-01-31 | Kabushiki Kaisha Toshiba | Resist coating apparatus |
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| JPS63301520A (ja) | 1987-05-30 | 1988-12-08 | Nec Corp | フォトレジスト塗布装置 |
| US4946710A (en) | 1987-06-02 | 1990-08-07 | National Semiconductor Corporation | Method for preparing PLZT, PZT and PLT sol-gels and fabricating ferroelectric thin films |
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| JPH01238017A (ja) | 1988-03-18 | 1989-09-22 | Fujitsu Ltd | レジスト層の形成方法 |
| FR2636546B1 (fr) | 1988-09-15 | 1991-03-15 | Sulzer Electro Tech | Procede et dispositif pour l'application uniformement reguliere d'une couche de resine sur un substrat |
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| JPH0298126A (ja) | 1988-10-05 | 1990-04-10 | Oki Electric Ind Co Ltd | ホトレジスト塗布装置 |
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| US5264246A (en) | 1989-05-02 | 1993-11-23 | Mitsubishi Denki Kabushiki Kaisha | Spin coating method |
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-
2001
- 2001-06-30 US US09/895,786 patent/US7018943B2/en not_active Expired - Lifetime
-
2002
- 2002-02-21 AU AU2002252049A patent/AU2002252049A1/en not_active Abandoned
- 2002-02-21 WO PCT/US2002/005187 patent/WO2002071154A2/en not_active Ceased
- 2002-02-21 EP EP02721101A patent/EP1364256A2/en not_active Withdrawn
- 2002-02-21 CN CNB028083024A patent/CN1265245C/zh not_active Expired - Lifetime
- 2002-02-21 KR KR10-2003-7011353A patent/KR20040030517A/ko not_active Ceased
- 2002-02-21 JP JP2002570011A patent/JP2004531879A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9759669B2 (en) | 2012-07-24 | 2017-09-12 | Hitachi High-Technologies Corporation | Inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1364256A2 (en) | 2003-11-26 |
| US20020127334A1 (en) | 2002-09-12 |
| AU2002252049A1 (en) | 2002-09-19 |
| KR20040030517A (ko) | 2004-04-09 |
| CN1503928A (zh) | 2004-06-09 |
| WO2002071154A2 (en) | 2002-09-12 |
| CN1265245C (zh) | 2006-07-19 |
| WO2002071154A3 (en) | 2003-02-20 |
| US7018943B2 (en) | 2006-03-28 |
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