DE102004039977B4
(de)
*
|
2003-08-13 |
2008-09-11 |
Samsung Electronics Co., Ltd., Suwon |
Programmierverfahren und Treiberschaltung für eine Phasenwechselspeicherzelle
|
KR100574975B1
(ko)
*
|
2004-03-05 |
2006-05-02 |
삼성전자주식회사 |
상 변화 메모리 어레이의 셋 프로그래밍 방법 및 기입드라이버 회로
|
KR100618836B1
(ko)
*
|
2004-06-19 |
2006-09-08 |
삼성전자주식회사 |
반도체 메모리 장치 및 반도체 메모리 장치의 프로그래밍방법
|
US7099180B1
(en)
*
|
2005-02-15 |
2006-08-29 |
Intel Corporation |
Phase change memory bits reset through a series of pulses of increasing amplitude
|
KR100855959B1
(ko)
*
|
2005-04-04 |
2008-09-02 |
삼성전자주식회사 |
펄스 폭이 제어되는 전류 펄스를 이용한 메모리 셀어레이의 프로그래밍 방법
|
US7289351B1
(en)
*
|
2005-06-24 |
2007-10-30 |
Spansion Llc |
Method of programming a resistive memory device
|
JP4669518B2
(ja)
|
2005-09-21 |
2011-04-13 |
ルネサスエレクトロニクス株式会社 |
半導体装置
|
KR100674997B1
(ko)
*
|
2005-10-15 |
2007-01-29 |
삼성전자주식회사 |
상 변화 메모리 장치 및 상 변화 메모리 장치의 독출 동작제어방법
|
US7635855B2
(en)
|
2005-11-15 |
2009-12-22 |
Macronix International Co., Ltd. |
I-shaped phase change memory cell
|
US7449710B2
(en)
|
2005-11-21 |
2008-11-11 |
Macronix International Co., Ltd. |
Vacuum jacket for phase change memory element
|
KR100773095B1
(ko)
*
|
2005-12-09 |
2007-11-02 |
삼성전자주식회사 |
상 변화 메모리 장치 및 그것의 프로그램 방법
|
US20070171705A1
(en)
*
|
2005-12-15 |
2007-07-26 |
Parkinson Ward D |
Writing phase change memories
|
US7599209B2
(en)
*
|
2005-12-23 |
2009-10-06 |
Infineon Technologies Ag |
Memory circuit including a resistive memory element and method for operating such a memory circuit
|
US7292466B2
(en)
*
|
2006-01-03 |
2007-11-06 |
Infineon Technologies Ag |
Integrated circuit having a resistive memory
|
US7626859B2
(en)
*
|
2006-02-16 |
2009-12-01 |
Samsung Electronics Co., Ltd. |
Phase-change random access memory and programming method
|
US20080043513A1
(en)
*
|
2006-08-21 |
2008-02-21 |
Heinz Hoenigschmid |
Intergrated circuit having memory with resistive memory cells
|
KR100809334B1
(ko)
*
|
2006-09-05 |
2008-03-05 |
삼성전자주식회사 |
상변화 메모리 장치
|
US8050084B2
(en)
*
|
2006-09-05 |
2011-11-01 |
Samsung Electronics Co., Ltd. |
Nonvolatile memory device, storage system having the same, and method of driving the nonvolatile memory device
|
KR100759441B1
(ko)
|
2006-09-08 |
2007-09-20 |
삼성전자주식회사 |
스텝 셋 전류를 발생하는 상 변화 메모리 장치
|
KR100763231B1
(ko)
|
2006-09-11 |
2007-10-04 |
삼성전자주식회사 |
상변화 메모리 장치
|
US20080101110A1
(en)
*
|
2006-10-25 |
2008-05-01 |
Thomas Happ |
Combined read/write circuit for memory
|
JP4524684B2
(ja)
*
|
2006-11-21 |
2010-08-18 |
エルピーダメモリ株式会社 |
メモリ読み出し回路及び方式
|
KR100809339B1
(ko)
*
|
2006-12-20 |
2008-03-05 |
삼성전자주식회사 |
저항체를 이용한 비휘발성 메모리 장치 및 그 구동 방법
|
US7718989B2
(en)
|
2006-12-28 |
2010-05-18 |
Macronix International Co., Ltd. |
Resistor random access memory cell device
|
JP5539610B2
(ja)
*
|
2007-03-02 |
2014-07-02 |
ピーエスフォー ルクスコ エスエイアールエル |
相変化メモリのプログラム方法と読み出し方法
|
TWI330846B
(en)
*
|
2007-03-08 |
2010-09-21 |
Ind Tech Res Inst |
A writing method and system for a phase change memory
|
US7518934B2
(en)
*
|
2007-03-23 |
2009-04-14 |
Intel Corporation |
Phase change memory with program/verify function
|
US7577023B2
(en)
*
|
2007-05-04 |
2009-08-18 |
Qimonda North America Corp. |
Memory including write circuit for providing multiple reset pulses
|
US20090027943A1
(en)
*
|
2007-07-24 |
2009-01-29 |
Thomas Nirschl |
Resistive memory including bidirectional write operation
|
KR100882119B1
(ko)
*
|
2007-07-24 |
2009-02-05 |
주식회사 하이닉스반도체 |
상 변화 메모리 장치의 구동 방법
|
US7729161B2
(en)
|
2007-08-02 |
2010-06-01 |
Macronix International Co., Ltd. |
Phase change memory with dual word lines and source lines and method of operating same
|
JP5012312B2
(ja)
*
|
2007-08-15 |
2012-08-29 |
ソニー株式会社 |
記憶装置の駆動方法
|
US8027186B2
(en)
*
|
2007-09-26 |
2011-09-27 |
Intel Corporation |
Programming a phase change memory
|
KR101408876B1
(ko)
|
2007-11-13 |
2014-06-18 |
삼성전자주식회사 |
상 변화 메모리 장치의 기입 드라이버 회로
|
US7646632B2
(en)
*
|
2007-12-21 |
2010-01-12 |
Qimonda Ag |
Integrated circuit for setting a memory cell based on a reset current distribution
|
JP5063337B2
(ja)
*
|
2007-12-27 |
2012-10-31 |
株式会社日立製作所 |
半導体装置
|
US7916544B2
(en)
|
2008-01-25 |
2011-03-29 |
Micron Technology, Inc. |
Random telegraph signal noise reduction scheme for semiconductor memories
|
US8158965B2
(en)
*
|
2008-02-05 |
2012-04-17 |
Macronix International Co., Ltd. |
Heating center PCRAM structure and methods for making
|
JP4719233B2
(ja)
|
2008-03-11 |
2011-07-06 |
株式会社東芝 |
不揮発性半導体記憶装置
|
US7729163B2
(en)
*
|
2008-03-26 |
2010-06-01 |
Micron Technology, Inc. |
Phase change memory
|
JP5085405B2
(ja)
*
|
2008-04-25 |
2012-11-28 |
株式会社東芝 |
不揮発性半導体記憶装置
|
US8077505B2
(en)
|
2008-05-07 |
2011-12-13 |
Macronix International Co., Ltd. |
Bipolar switching of phase change device
|
US8134857B2
(en)
|
2008-06-27 |
2012-03-13 |
Macronix International Co., Ltd. |
Methods for high speed reading operation of phase change memory and device employing same
|
KR20100041470A
(ko)
*
|
2008-10-14 |
2010-04-22 |
삼성전자주식회사 |
저항체를 이용한 비휘발성 메모리 장치
|
JP2010123209A
(ja)
*
|
2008-11-20 |
2010-06-03 |
Elpida Memory Inc |
メモリ装置及びその書き込み方法
|
KR101001147B1
(ko)
*
|
2008-12-12 |
2010-12-17 |
주식회사 하이닉스반도체 |
상변화 메모리 장치
|
US8301977B2
(en)
*
|
2008-12-30 |
2012-10-30 |
Stmicroelectronics S.R.L. |
Accelerating phase change memory writes
|
US8107283B2
(en)
|
2009-01-12 |
2012-01-31 |
Macronix International Co., Ltd. |
Method for setting PCRAM devices
|
US8030635B2
(en)
|
2009-01-13 |
2011-10-04 |
Macronix International Co., Ltd. |
Polysilicon plug bipolar transistor for phase change memory
|
US8064247B2
(en)
|
2009-01-14 |
2011-11-22 |
Macronix International Co., Ltd. |
Rewritable memory device based on segregation/re-absorption
|
US8933536B2
(en)
*
|
2009-01-22 |
2015-01-13 |
Macronix International Co., Ltd. |
Polysilicon pillar bipolar transistor with self-aligned memory element
|
JP4846813B2
(ja)
*
|
2009-03-12 |
2011-12-28 |
株式会社東芝 |
不揮発性半導体記憶装置
|
KR101086858B1
(ko)
*
|
2009-04-15 |
2011-11-25 |
주식회사 하이닉스반도체 |
라이트 전압을 생성하는 비휘발성 반도체 메모리 회로
|
US8084760B2
(en)
*
|
2009-04-20 |
2011-12-27 |
Macronix International Co., Ltd. |
Ring-shaped electrode and manufacturing method for same
|
US8173987B2
(en)
|
2009-04-27 |
2012-05-08 |
Macronix International Co., Ltd. |
Integrated circuit 3D phase change memory array and manufacturing method
|
US8097871B2
(en)
|
2009-04-30 |
2012-01-17 |
Macronix International Co., Ltd. |
Low operational current phase change memory structures
|
US7933139B2
(en)
|
2009-05-15 |
2011-04-26 |
Macronix International Co., Ltd. |
One-transistor, one-resistor, one-capacitor phase change memory
|
US8447714B2
(en)
*
|
2009-05-21 |
2013-05-21 |
International Business Machines Corporation |
System for electronic learning synapse with spike-timing dependent plasticity using phase change memory
|
US8250010B2
(en)
*
|
2009-05-21 |
2012-08-21 |
International Business Machines Corporation |
Electronic learning synapse with spike-timing dependent plasticity using unipolar memory-switching elements
|
US7968876B2
(en)
|
2009-05-22 |
2011-06-28 |
Macronix International Co., Ltd. |
Phase change memory cell having vertical channel access transistor
|
US8350316B2
(en)
*
|
2009-05-22 |
2013-01-08 |
Macronix International Co., Ltd. |
Phase change memory cells having vertical channel access transistor and memory plane
|
US8809829B2
(en)
|
2009-06-15 |
2014-08-19 |
Macronix International Co., Ltd. |
Phase change memory having stabilized microstructure and manufacturing method
|
US8406033B2
(en)
|
2009-06-22 |
2013-03-26 |
Macronix International Co., Ltd. |
Memory device and method for sensing and fixing margin cells
|
KR20100137884A
(ko)
|
2009-06-23 |
2010-12-31 |
삼성전자주식회사 |
워드 라인 저항을 보상하는 가변 저항 메모리 장치
|
US8363463B2
(en)
|
2009-06-25 |
2013-01-29 |
Macronix International Co., Ltd. |
Phase change memory having one or more non-constant doping profiles
|
US8238149B2
(en)
|
2009-06-25 |
2012-08-07 |
Macronix International Co., Ltd. |
Methods and apparatus for reducing defect bits in phase change memory
|
US8110822B2
(en)
|
2009-07-15 |
2012-02-07 |
Macronix International Co., Ltd. |
Thermal protect PCRAM structure and methods for making
|
US7894254B2
(en)
|
2009-07-15 |
2011-02-22 |
Macronix International Co., Ltd. |
Refresh circuitry for phase change memory
|
US8198619B2
(en)
|
2009-07-15 |
2012-06-12 |
Macronix International Co., Ltd. |
Phase change memory cell structure
|
KR101176503B1
(ko)
*
|
2009-09-04 |
2012-08-24 |
에스케이하이닉스 주식회사 |
라이트 드라이버를 구비한 상변화 메모리 장치
|
US8064248B2
(en)
|
2009-09-17 |
2011-11-22 |
Macronix International Co., Ltd. |
2T2R-1T1R mix mode phase change memory array
|
US20110069540A1
(en)
*
|
2009-09-23 |
2011-03-24 |
Savransky Semyon D |
Method of a phase-change memory programming
|
US8178387B2
(en)
|
2009-10-23 |
2012-05-15 |
Macronix International Co., Ltd. |
Methods for reducing recrystallization time for a phase change material
|
US8817521B2
(en)
|
2009-11-24 |
2014-08-26 |
Industrial Technology Research Institute |
Control method for memory cell
|
TWI428929B
(zh)
*
|
2009-11-24 |
2014-03-01 |
Ind Tech Res Inst |
控制方法
|
US8385100B2
(en)
*
|
2009-12-08 |
2013-02-26 |
Intel Corporation |
Energy-efficient set write of phase change memory with switch
|
KR101131552B1
(ko)
*
|
2010-02-24 |
2012-04-04 |
주식회사 하이닉스반도체 |
상 변화 메모리 장치
|
US8422269B2
(en)
*
|
2010-02-25 |
2013-04-16 |
Kabushiki Kaisha Toshiba |
Semiconductor memory device
|
US8729521B2
(en)
|
2010-05-12 |
2014-05-20 |
Macronix International Co., Ltd. |
Self aligned fin-type programmable memory cell
|
US8310864B2
(en)
|
2010-06-15 |
2012-11-13 |
Macronix International Co., Ltd. |
Self-aligned bit line under word line memory array
|
US8526227B2
(en)
|
2010-06-23 |
2013-09-03 |
Mosaid Technologies Incorporated |
Phase change memory word line driver
|
KR101218605B1
(ko)
*
|
2010-09-30 |
2013-01-04 |
에스케이하이닉스 주식회사 |
반도체 메모리 장치
|
US8395935B2
(en)
|
2010-10-06 |
2013-03-12 |
Macronix International Co., Ltd. |
Cross-point self-aligned reduced cell size phase change memory
|
US8497705B2
(en)
|
2010-11-09 |
2013-07-30 |
Macronix International Co., Ltd. |
Phase change device for interconnection of programmable logic device
|
US8467238B2
(en)
|
2010-11-15 |
2013-06-18 |
Macronix International Co., Ltd. |
Dynamic pulse operation for phase change memory
|
US8467239B2
(en)
|
2010-12-02 |
2013-06-18 |
Intel Corporation |
Reversible low-energy data storage in phase change memory
|
EP2684192B1
(en)
|
2011-03-11 |
2019-05-08 |
Ovonyx Memory Technology, LLC |
Programming a phase change memory cell in voltage mode and current mode
|
JP5736988B2
(ja)
*
|
2011-06-14 |
2015-06-17 |
ソニー株式会社 |
抵抗変化型メモリデバイスおよびその動作方法
|
TWI506627B
(zh)
|
2011-08-30 |
2015-11-01 |
Ind Tech Res Inst |
電阻式記憶體及其寫入驗證方法
|
KR101699713B1
(ko)
|
2011-09-14 |
2017-01-26 |
인텔 코포레이션 |
저항 변화 메모리 소자용 전극
|
KR20130072842A
(ko)
*
|
2011-12-22 |
2013-07-02 |
에스케이하이닉스 주식회사 |
프로그램 펄스 발생 회로 및 이를 구비하는 비휘발성 메모리 장치
|
US8971089B2
(en)
|
2012-06-27 |
2015-03-03 |
Intel Corporation |
Low power phase change memory cell
|
US8957700B2
(en)
*
|
2012-09-28 |
2015-02-17 |
Analog Devices, Inc. |
Apparatus and methods for digital configuration of integrated circuits
|
KR20140080945A
(ko)
*
|
2012-12-21 |
2014-07-01 |
에스케이하이닉스 주식회사 |
비휘발성 메모리 장치
|
CN103714852B
(zh)
*
|
2013-12-18 |
2017-03-01 |
华中科技大学 |
一种精确控制微纳尺寸相变材料非晶化率连续变化的方法
|
CN104882161B
(zh)
*
|
2014-02-28 |
2017-07-11 |
复旦大学 |
一种电阻型随机读取存储器及其写操作方法
|
US9559113B2
(en)
|
2014-05-01 |
2017-01-31 |
Macronix International Co., Ltd. |
SSL/GSL gate oxide in 3D vertical channel NAND
|
US10332085B2
(en)
*
|
2015-01-30 |
2019-06-25 |
Loturas Llc |
Communication system and server facilitating message exchange and related methods
|
US10841260B2
(en)
*
|
2015-01-30 |
2020-11-17 |
Loturas Incorporated |
Communication system and server facilitating job opportunity message exchange and related methods
|
US9672906B2
(en)
|
2015-06-19 |
2017-06-06 |
Macronix International Co., Ltd. |
Phase change memory with inter-granular switching
|