HUP0002566A2 - Eljárás integrált áramkör elektromos csatlakozásainak tokozására fröccsöntéssel és az eljárással készült integrált áramkör - Google Patents
Eljárás integrált áramkör elektromos csatlakozásainak tokozására fröccsöntéssel és az eljárással készült integrált áramkörInfo
- Publication number
- HUP0002566A2 HUP0002566A2 HU0002566A HUP0002566A HUP0002566A2 HU P0002566 A2 HUP0002566 A2 HU P0002566A2 HU 0002566 A HU0002566 A HU 0002566A HU P0002566 A HUP0002566 A HU P0002566A HU P0002566 A2 HUP0002566 A2 HU P0002566A2
- Authority
- HU
- Hungary
- Prior art keywords
- integrated circuit
- electrical connections
- injection molded
- flip chip
- chip encapsulation
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 4
- 238000005538 encapsulation Methods 0.000 title 1
- 238000002347 injection Methods 0.000 title 1
- 239000007924 injection Substances 0.000 title 1
- 239000000463 material Substances 0.000 abstract 2
- 238000000465 moulding Methods 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 238000001746 injection moulding Methods 0.000 abstract 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/26—Moulds
- B29C45/34—Moulds having venting means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- H—ELECTRICITY
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
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- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
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- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/831—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus
- H01L2224/83102—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus using surface energy, e.g. capillary forces
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/91—Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
- H01L2224/92—Specific sequence of method steps
- H01L2224/921—Connecting a surface with connectors of different types
- H01L2224/9212—Sequential connecting processes
- H01L2224/92122—Sequential connecting processes the first connecting process involving a bump connector
- H01L2224/92125—Sequential connecting processes the first connecting process involving a bump connector the second connecting process involving a layer connector
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01006—Carbon [C]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
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- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/15786—Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
- H01L2924/15787—Ceramics, e.g. crystalline carbides, nitrides or oxides
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49146—Assembling to base an electrical component, e.g., capacitor, etc. with encapsulating, e.g., potting, etc.
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Abstract
Eljárás integrált áramkör elektromos csatlakozásainak tokozásárafröccsöntéssel. Az eljárás során egyetlen lépésben, az integrált áramkör elektromoscsatlakozásai körül, azok megerősítésére nagy viszkozitássalrendelkező tokozóanyagból tokot képeznek úgy, hogy az integráltáramköri lapka fölé egy öntősablont helyeznek, amelyet külső nyomóerőalkalmazásával a hordozóhoz zárnak, és az öntősablon nyílásánkeresztül betöltik a tokozóanyagot, amely kitölti az öntőformán belülitérközöket. ═gy az integrált áramkör elektromos csatlakozásaimegerősödnek, és ellenállnak az integrált áramköri lapka és a hordozókülönböző hőtágulási együtthatójából eredő feszültségnek. A találmánytárgya még az eljárással készült integrált áramkör. Ó
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/884,228 US6407461B1 (en) | 1997-06-27 | 1997-06-27 | Injection molded integrated circuit chip assembly |
Publications (2)
Publication Number | Publication Date |
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HUP0002566A2 true HUP0002566A2 (hu) | 2000-11-28 |
HUP0002566A3 HUP0002566A3 (en) | 2002-11-28 |
Family
ID=25384219
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HU0002566A HUP0002566A3 (en) | 1997-06-27 | 1998-06-12 | Method and apparatus for injection molded flip chip encapsulation |
Country Status (6)
Country | Link |
---|---|
US (2) | US6407461B1 (hu) |
HU (1) | HUP0002566A3 (hu) |
ID (1) | ID20490A (hu) |
MY (1) | MY132903A (hu) |
PL (1) | PL337511A1 (hu) |
WO (1) | WO1999000835A1 (hu) |
Families Citing this family (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8211167B2 (en) | 1999-12-06 | 2012-07-03 | Boston Scientific Scimed, Inc. | Method of using a catheter with attached flexible side sheath |
US6692483B2 (en) | 1996-11-04 | 2004-02-17 | Advanced Stent Technologies, Inc. | Catheter with attached flexible side sheath |
JP3219043B2 (ja) * | 1998-01-07 | 2001-10-15 | 日本電気株式会社 | 半導体装置のパッケージ方法および半導体装置 |
JP3702788B2 (ja) * | 1998-07-01 | 2005-10-05 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
US7387639B2 (en) | 1999-06-04 | 2008-06-17 | Advanced Stent Technologies, Inc. | Short sleeve stent delivery catheter and methods |
SE517086C2 (sv) * | 2000-08-08 | 2002-04-09 | Ericsson Telefon Ab L M | Förfarande för säkring av lodkulor och eventuella komponenter, vilka är fästa på en och samma sida av ett substrat |
US6888259B2 (en) * | 2001-06-07 | 2005-05-03 | Denso Corporation | Potted hybrid integrated circuit |
US6555924B2 (en) * | 2001-08-18 | 2003-04-29 | Siliconware Precision Industries Co., Ltd. | Semiconductor package with flash preventing mechanism and fabrication method thereof |
KR100446290B1 (ko) * | 2001-11-03 | 2004-09-01 | 삼성전자주식회사 | 댐을 포함하는 반도체 패키지 및 그 제조방법 |
US6849806B2 (en) * | 2001-11-16 | 2005-02-01 | Texas Instruments Incorporated | Electrical apparatus having resistance to atmospheric effects and method of manufacture therefor |
US6882041B1 (en) * | 2002-02-05 | 2005-04-19 | Altera Corporation | Thermally enhanced metal capped BGA package |
US20050121829A1 (en) * | 2003-12-03 | 2005-06-09 | Honeywell International, Inc. | Circuit insulation methods and systems for vehicle door latches |
US7190706B2 (en) * | 2003-12-10 | 2007-03-13 | Avago Technologies Fiber Ip (Singapore) Ptd. Ltd. | Soft metal heat transfer for transceivers |
US7087465B2 (en) * | 2003-12-15 | 2006-08-08 | Philips Lumileds Lighting Company, Llc | Method of packaging a semiconductor light emitting device |
JP2006041239A (ja) * | 2004-07-28 | 2006-02-09 | Toshiba Corp | 配線基板及び磁気ディスク装置 |
JP2006119983A (ja) * | 2004-10-22 | 2006-05-11 | Renesas Technology Corp | Icカードおよびその製造方法 |
JP4477062B2 (ja) * | 2005-05-17 | 2010-06-09 | パナソニック株式会社 | フリップチップ実装方法 |
DE102005023949B4 (de) * | 2005-05-20 | 2019-07-18 | Infineon Technologies Ag | Verfahren zur Herstellung eines Nutzens aus einer Verbundplatte mit Halbleiterchips und einer Kunststoffgehäusemasse und ein Verfahren zur Herstellung von Halbleiterbauteilen mittels eines Nutzens |
US20060270106A1 (en) * | 2005-05-31 | 2006-11-30 | Tz-Cheng Chiu | System and method for polymer encapsulated solder lid attach |
KR100761387B1 (ko) | 2005-07-13 | 2007-09-27 | 서울반도체 주식회사 | 몰딩부재를 형성하기 위한 몰드 및 그것을 사용한 몰딩부재형성방법 |
US20070090654A1 (en) * | 2005-10-20 | 2007-04-26 | Honeywell International Inc. | System and method for registering the drive mechanism position of a latch apparatus after power loss |
JP4013077B2 (ja) * | 2005-11-21 | 2007-11-28 | 松下電工株式会社 | 発光装置およびその製造方法 |
US7808004B2 (en) * | 2006-03-17 | 2010-10-05 | Edison Opto Corporation | Light emitting diode package structure and method of manufacturing the same |
TW200739756A (en) * | 2006-04-03 | 2007-10-16 | qin-dong Liu | Method of packaging flash memory cards |
DE102006022748B4 (de) * | 2006-05-12 | 2019-01-17 | Infineon Technologies Ag | Halbleiterbauteil mit oberflächenmontierbaren Bauelementen und Verfahren zu seiner Herstellung |
FR2902277B1 (fr) * | 2006-06-13 | 2008-09-05 | Valeo Electronique Sys Liaison | Support pour composant electrique et dispositif electrique comprenant le support et le composant |
DE102007019096B4 (de) * | 2007-04-23 | 2015-03-12 | Continental Automotive Gmbh | Elektronikgehäuse |
JP2009049218A (ja) * | 2007-08-21 | 2009-03-05 | Nec Electronics Corp | 半導体装置及び半導体装置の製造方法 |
JP2009064916A (ja) * | 2007-09-05 | 2009-03-26 | Kokusan Denki Co Ltd | 電子ユニット及びその製造方法 |
US7646105B2 (en) * | 2007-11-16 | 2010-01-12 | Stats Chippac Ltd. | Integrated circuit package system with package substrate having corner contacts |
US8325047B2 (en) | 2009-04-08 | 2012-12-04 | Sabic Innovative Plastics Ip B.V. | Encapsulated RFID tags and methods of making same |
ES2679272T3 (es) * | 2009-11-19 | 2018-08-23 | Parker-Hannifin Corporation | Sobremoldeo de plástico conductor en ventana de plástico blindada |
TWI401773B (zh) * | 2010-05-14 | 2013-07-11 | Chipmos Technologies Inc | 晶片封裝裝置及其製造方法 |
TWI413195B (zh) * | 2011-01-20 | 2013-10-21 | Walton Advanced Eng Inc | 減少模封膠體內氣泡之壓縮模封方法與裝置 |
KR101906408B1 (ko) | 2011-10-04 | 2018-10-11 | 삼성전자주식회사 | 반도체 패키지 및 그 제조 방법 |
US8946566B2 (en) * | 2012-10-05 | 2015-02-03 | Apple Inc. | Heterogeneous encapsulation |
TWI555236B (zh) * | 2015-06-24 | 2016-10-21 | 友達光電股份有限公司 | 注膠裝置及發光裝置之製造方法 |
DE102015113913A1 (de) * | 2015-08-21 | 2017-02-23 | Endress + Hauser Gmbh + Co. Kg | Feldgerät mit einem Bauteil zum Einfüllen von Vergussmasse |
Family Cites Families (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60210643A (ja) * | 1983-11-30 | 1985-10-23 | Denki Kagaku Kogyo Kk | 充填剤及びその組成物 |
JPS63174327A (ja) | 1987-01-14 | 1988-07-18 | Matsushita Electric Works Ltd | チツプオンボ−ドの封止方法 |
US4942140A (en) | 1987-03-25 | 1990-07-17 | Mitsubishi Denki Kabushiki Kaisha | Method of packaging semiconductor device |
US4915607A (en) | 1987-09-30 | 1990-04-10 | Texas Instruments Incorporated | Lead frame assembly for an integrated circuit molding system |
US5200362A (en) | 1989-09-06 | 1993-04-06 | Motorola, Inc. | Method of attaching conductive traces to an encapsulated semiconductor die using a removable transfer film |
US5121190A (en) * | 1990-03-14 | 1992-06-09 | International Business Machines Corp. | Solder interconnection structure on organic substrates |
US5019673A (en) | 1990-08-22 | 1991-05-28 | Motorola, Inc. | Flip-chip package for integrated circuits |
US5120678A (en) | 1990-11-05 | 1992-06-09 | Motorola Inc. | Electrical component package comprising polymer-reinforced solder bump interconnection |
DE4103602A1 (de) | 1991-02-07 | 1992-08-13 | Wacker Chemie Gmbh | Verfahren zur kontinuierlichen herstellung von htv-siliconmassen |
RU2025191C1 (ru) | 1991-05-05 | 1994-12-30 | Анатолий Петрович Огиенко | Оснастка для вакуумной формовки |
JP2570002B2 (ja) | 1991-05-29 | 1997-01-08 | 信越化学工業株式会社 | フリップチップ用封止材及び半導体装置 |
JP2523250B2 (ja) | 1991-08-16 | 1996-08-07 | インターナショナル・ビジネス・マシーンズ・コーポレイション | ジシアネ―トの混合物を含む組成物 |
US5203076A (en) | 1991-12-23 | 1993-04-20 | Motorola, Inc. | Vacuum infiltration of underfill material for flip-chip devices |
US5169056A (en) | 1992-02-21 | 1992-12-08 | Eastman Kodak Company | Connecting of semiconductor chips to circuit substrates |
RU2035485C1 (ru) | 1992-04-21 | 1995-05-20 | Санкт-Петербургский технологический институт | Эпоксидная заливочная композиция |
RU2041532C1 (ru) | 1992-07-08 | 1995-08-09 | Особое конструкторско-технологическое бюро "Орион" | Устройство для заливки герметичных химических источников тока |
RU2046425C1 (ru) | 1992-08-14 | 1995-10-20 | Запорожский завод высоковольтной аппаратуры | Трансформатор тока с литой изоляцией |
KR100280762B1 (ko) | 1992-11-03 | 2001-03-02 | 비센트 비.인그라시아 | 노출 후부를 갖는 열적 강화된 반도체 장치 및 그 제조방법 |
RU2043384C1 (ru) | 1992-11-15 | 1995-09-10 | Украинский научно-исследовательский институт пластических масс | Пресс-композиция |
US5371404A (en) | 1993-02-04 | 1994-12-06 | Motorola, Inc. | Thermally conductive integrated circuit package with radio frequency shielding |
JP3057130B2 (ja) * | 1993-02-18 | 2000-06-26 | 三菱電機株式会社 | 樹脂封止型半導体パッケージおよびその製造方法 |
JPH06252190A (ja) | 1993-03-01 | 1994-09-09 | Sumitomo Jukikai Plast Mach Kk | 半導体封止装置 |
JPH06268101A (ja) * | 1993-03-17 | 1994-09-22 | Hitachi Ltd | 半導体装置及びその製造方法、電子装置、リ−ドフレ−ム並びに実装基板 |
RU2064956C1 (ru) | 1993-07-01 | 1996-08-10 | Научно-Исследовательский Институт Приборостроения | Состав для компаунда |
US5385869A (en) | 1993-07-22 | 1995-01-31 | Motorola, Inc. | Semiconductor chip bonded to a substrate and method of making |
JPH07335790A (ja) | 1994-06-06 | 1995-12-22 | Toray Dow Corning Silicone Co Ltd | 半導体素子保護用組成物および半導体装置 |
EP0690499A3 (en) | 1994-06-30 | 1997-05-28 | Digital Equipment Corp | Molded plastic packaging for semiconductor chip without support |
JP3233535B2 (ja) * | 1994-08-15 | 2001-11-26 | 株式会社東芝 | 半導体装置及びその製造方法 |
JP3138159B2 (ja) * | 1994-11-22 | 2001-02-26 | シャープ株式会社 | 半導体装置、半導体装置実装体、及び半導体装置の交換方法 |
EP0775716B1 (en) | 1995-01-11 | 1999-07-28 | Kanegafuchi Kagaku Kogyo Kabushiki Kaisha | Novel heat-fusible copolymer, and powder, film, laminated heat insulator, electronic module, and capacitor produced from said copolymer, and process for producing the same |
US5864178A (en) * | 1995-01-12 | 1999-01-26 | Kabushiki Kaisha Toshiba | Semiconductor device with improved encapsulating resin |
US5672913A (en) * | 1995-02-23 | 1997-09-30 | Lucent Technologies Inc. | Semiconductor device having a layer of gallium amalgam on bump leads |
JPH08298269A (ja) * | 1995-04-25 | 1996-11-12 | Toshiba Microelectron Corp | 半導体装置及びその製造方法 |
US5659203A (en) * | 1995-06-07 | 1997-08-19 | International Business Machines Corporation | Reworkable polymer chip encapsulant |
ID19376A (id) | 1995-06-12 | 1998-07-09 | Matsushita Electric Ind Co Ltd | Paket unit semikonduktor, metode pemaketan unit semikonduktor, dan bahan pengkapsul untuk penggunaan dalam pemaketan unit semikonduktor (pecahan dari p-961658) |
US5697148A (en) | 1995-08-22 | 1997-12-16 | Motorola, Inc. | Flip underfill injection technique |
US5825623A (en) * | 1995-12-08 | 1998-10-20 | Vlsi Technology, Inc. | Packaging assemblies for encapsulated integrated circuit devices |
KR100438256B1 (ko) * | 1995-12-18 | 2004-08-25 | 마츠시타 덴끼 산교 가부시키가이샤 | 반도체장치 및 그 제조방법 |
US5817545A (en) | 1996-01-24 | 1998-10-06 | Cornell Research Foundation, Inc. | Pressurized underfill encapsulation of integrated circuits |
JPH09260436A (ja) * | 1996-03-27 | 1997-10-03 | Mitsubishi Electric Corp | 半導体装置 |
JP3863213B2 (ja) * | 1996-03-27 | 2006-12-27 | 株式会社ルネサステクノロジ | 半導体装置 |
US5726502A (en) * | 1996-04-26 | 1998-03-10 | Motorola, Inc. | Bumped semiconductor device with alignment features and method for making the same |
US5821456A (en) * | 1996-05-01 | 1998-10-13 | Motorola, Inc. | Microelectronic assembly including a decomposable encapsulant, and method for forming and reworking same |
US5894167A (en) * | 1996-05-08 | 1999-04-13 | Micron Technology, Inc. | Encapsulant dam standoff for shell-enclosed die assemblies |
US5700723A (en) | 1996-05-15 | 1997-12-23 | Lsi Logic Corporation | Method of packaging an integrated circuit |
US5682066A (en) * | 1996-08-12 | 1997-10-28 | Motorola, Inc. | Microelectronic assembly including a transparent encapsulant |
US5729896A (en) * | 1996-10-31 | 1998-03-24 | International Business Machines Corporation | Method for attaching a flip chip on flexible circuit carrier using chip with metallic cap on solder |
-
1997
- 1997-06-27 US US08/884,228 patent/US6407461B1/en not_active Expired - Lifetime
-
1998
- 1998-04-20 ID IDP980590A patent/ID20490A/id unknown
- 1998-05-25 MY MYPI98002315A patent/MY132903A/en unknown
- 1998-06-12 HU HU0002566A patent/HUP0002566A3/hu unknown
- 1998-06-12 PL PL98337511A patent/PL337511A1/xx unknown
- 1998-06-12 WO PCT/GB1998/001730 patent/WO1999000835A1/en not_active Application Discontinuation
-
2002
- 2002-05-16 US US10/150,125 patent/US6552263B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ID20490A (id) | 1998-12-31 |
WO1999000835A1 (en) | 1999-01-07 |
HUP0002566A3 (en) | 2002-11-28 |
US20020134569A1 (en) | 2002-09-26 |
US6407461B1 (en) | 2002-06-18 |
MY132903A (en) | 2007-10-31 |
PL337511A1 (en) | 2000-08-28 |
US6552263B2 (en) | 2003-04-22 |
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