FI82999C - Optisk anordning och foerfarande foer dess framstaellning. - Google Patents
Optisk anordning och foerfarande foer dess framstaellning. Download PDFInfo
- Publication number
- FI82999C FI82999C FI844473A FI844473A FI82999C FI 82999 C FI82999 C FI 82999C FI 844473 A FI844473 A FI 844473A FI 844473 A FI844473 A FI 844473A FI 82999 C FI82999 C FI 82999C
- Authority
- FI
- Finland
- Prior art keywords
- solder layer
- optical device
- piece
- electrode
- substrate
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title claims description 27
- 229910000679 solder Inorganic materials 0.000 claims description 44
- 239000000758 substrate Substances 0.000 claims description 20
- 238000000034 method Methods 0.000 claims description 12
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 10
- 239000011248 coating agent Substances 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 6
- 230000005496 eutectics Effects 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 6
- 239000000919 ceramic Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 229910052594 sapphire Inorganic materials 0.000 claims description 5
- 239000010980 sapphire Substances 0.000 claims description 5
- 238000001704 evaporation Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims description 2
- 229910000676 Si alloy Inorganic materials 0.000 claims 2
- OFLYIWITHZJFLS-UHFFFAOYSA-N [Si].[Au] Chemical compound [Si].[Au] OFLYIWITHZJFLS-UHFFFAOYSA-N 0.000 claims 2
- 238000003780 insertion Methods 0.000 claims 2
- 230000037431 insertion Effects 0.000 claims 2
- 229910001020 Au alloy Inorganic materials 0.000 claims 1
- 229910001128 Sn alloy Inorganic materials 0.000 claims 1
- 230000008020 evaporation Effects 0.000 claims 1
- 239000003353 gold alloy Substances 0.000 claims 1
- JVPLOXQKFGYFMN-UHFFFAOYSA-N gold tin Chemical compound [Sn].[Au] JVPLOXQKFGYFMN-UHFFFAOYSA-N 0.000 claims 1
- 239000000203 mixture Substances 0.000 claims 1
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 229910001295 No alloy Inorganic materials 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4202—Packages, e.g. shape, construction, internal or external details for coupling an active element with fibres without intermediate optical elements, e.g. fibres with plane ends, fibres with shaped ends, bundles
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
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- H01L31/02—Details
- H01L31/02002—Arrangements for conducting electric current to or from the device in operations
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- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
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Description
1 82999
Optinen laite ja menetelmä sen valmistamiseksi Tämä keksintö liittyy optisiin laitteisiin, kuten valodiodeihin ja fotodiodeihin, joilla on patenttivaati-5 muksen 1 johdanto-osassa annetut tunnusmerkit, ja menetelmään niiden valmistamiseksi.
Keksinnön lähtökohtana oleva ongelma on fotodiodin käyttö suurella nopeudella. Koska fotodiodia käytetään käänteisesti esijännitetyssä tilassa, estää pn-rajapinnan 10 sähköinen kapasitanssi käytön suurella nopeudella. Valoa vastaanottavan alueen (pn-rajapinnan) alan pienentäminen vähentää sähköistä kapasitanssia. Tätä tarkoitusta varten voidaan käyttää kuviossa 1 esitettyä mesarakennetta.
n-InP-alustalle 31 muodostetaan epitaksiaalisen kas-15 vatuksen avulla p-InP-kerros 32. Alustan 31 ja kerroksen 32 välillä oleva kapea pn-rajapinta 33 toimii valoa vastaanottavana alueena. Lisäksi on p-InP-kerros 32 ja pn-rajapinta 33 syövytetty kaistaleiksi kohti n-InP alustaa 31 molemmilla puolilla valoa vastaanottavan alueen pienen-20 tämiseksi. Koska p-InP-kerros 32 on kaventunut kaistaleiksi, ei sen päälle enää voida kiinnittää renkaanmuotoista elektrodia. Sen mukaisesti kiinnitetään kaistaleenmuotoi-nen p-tyyppinen Au-Zn-elektrodi 34. Sitten tehdään valon kulku p-pinnasta mahdottomaksi. Sen sijaan kiinnitetään 25 p-InP-alustan 31 pohjaan renkaanmuotoinen, n-tyyppinen AuGeNi-elektrodi 35. Tällöin toimii n-InP-alustan 31 pohjan keskiosa valoa vastaanottavana pintana 36, jonka kautta valo saatetaan kulkemaan. Edellä selitetty fotodiodin pala 37 valmistetaan kiekkomenetelmällä, jossa sen jälkeen kun 30 joukko laitteita on valmistettu, puolijohdekiekko piirroi-tetaan ja jaetaan paloihin 37. Pala 37 on koteloitava. Toinen ongelma on fotodiodipalan 37 kiinnitys laipalle.
Tämän keksinnön päämääränä on tarjota fotodiodi, jossa fotodiodin pala voidaan liittää liitoslaippaan va-35 kaaseen tilaan.
2 82999 Tämän keksinnön eräänä muuna päämääränä on vielä tarjota fotodiodin valmistusta varten menetelmä, jossa fotodiodin pala voidaan liittää liitoslaippaan vakaaseen tilaan.
5 Tämän keksinnön mukaiselle optiselle laitteelle on tunnusomaista, että optisen laitteen palassa on elektrodi ja juotekerros, jotka on peräkkäisessä järjestyksessä asennettu sen liitetylle sivulle, jolloin kummassakin kerroksessa on reikä valon läpipäästämistä varten, ja että op-10 tisen laitteen pala on liitetty liitoslaippaan juoteker-roksen avulla.
Tämän keksinnön mukaisen optisen laitteen valmistusmenetelmälle on puolestaan tunnusomaista, että se käsittää vaiheet: 15 elektrodin, jossa on valoa läpipäästävä reikä, asen tamisen optisen laitteen palan sille pinnalle, johon valo osuu, ja juotekerroksen asentamisen tämän jälkeen mainitulle elektrodille, puolijohdepalan liitoslaipan asentamisen valoa läpi-20 päästävälle alustalle, ja mainitulla optisen laitteen palalla olevan elektrodin liittämisen liitoslaippaan käyttämällä mainittua juote-kerrosta, jolloin tuotetaan yhtenäinen optinen laite, johon puolijohdepala on liitetty stabiiliin tilaan.
25 Keksintöä kuvataan seuraavassa lähemmin viitaten oheiseen piirustukseen, jossa kuvio 1 on leikkauskuva tavanomaisen mesatyyppisen fotodiodipalan esimerkistä, kuvio 2 on leikkauskuva tämän keksinnön mukaisen 30 mesatyyppisen fotodiodin esimerkistä, kuvio 3 on leikkauskuva, joka esittää tilaa, jossa kuvion 2 mesatyyppinen fotodiodin pala sijoitetaan optisen laitteen kotelon safiirialustalle, ja kuvio 4 on leikkauskuva, joka esittää tilaa, jossa 35 kuvion 2 mesatyyppinen fotodiodin pala sijoitetaan optisen 3 82999 laitteen kotelon keramiikka-alustalle.
Seuraavassa selitetään yksityiskohtaisesti keksinnön suoritusmuotoa, jonka avulla voidaan ratkaista optisen laitteen palan liitoslaippaan kiinnittämiseen liittyvät 5 ongelmat, kuten juotteen valuminen valoa vastaanottavaan pintaan ja vaihtelut liitoksen lujuudessa. Tässä keksinnössä ei juotetta sijoiteta alustan puolelle, vaan juote-kerros sijoitetaan palan puolelle.
Kuvio 2 on leikkauskuva, joka esittää esimerkkiä, 10 jossa tätä keksintöä sovelletaan fotodiodin mesatyyppiseen palaan. Seostamaton epitakainen InGaAs-kerros kasvatetaan epitaksisen nestefaasiprosessin avulla Sn-seostetulle InP-alustalle 61, niin että sen hilarakenne sopii XnP-alustaan 61. Sitten muodostetaan Zn-diffuusion avulla p-tyyppinen 15 alue 63, jolloin syntyy pn-rajapinta. Sen jälkeen muodostetaan AuZnrn avulla p-puolen elektrodi 64, ja n-puolen elektrodi 65 muodostetaan AuGeNi:n avulla.
Lisäksi syövytetään pala kummaltakin puolelta pn-rajapinnan lähellä mesamuotoon sähköisen kapasitanssin pie-20 nentämiseksi. Sitten muodostetaan n-puolen elektrodin 65 alasivulle Sn-pinnoituskuvio käyttämällä pinnoitusliuoksena alkanolisulfonihappoa. Sn-pinnoitettua osaa kutsutaan tämän jälkeen juotekerrokseksi 66, koska se toimii juotteena. Sekä juotekerros 66 että n-puolen elektrodi 65 ovat renkaan 25 muotoisia ja palan alasivu keskiosa, joka on paljas, toimii valoa vastaanottavana pintana 67. Juotekerroksen 66 paksuus on 1-5,pm. Sen jälkeen puolijohdekiekko piirroite-taan ja jaetaan yksittäisiksi paloiksi. Juotekerros 66 muodostetaan tehokkaasti pinnoittamalla tai höyrystämällä. 30 Tinan lisäksi voidaan juotekerroksen 66 materiaalina käyttää eutektista AuSn-seosta tai eutektista AuSi-seosta.
Tällä tavoin valmistetun fotodiodipalan liittämiseksi, käyttämällä tinaa juotteena, lämmitetään liitettävä kotelo lämpötilaan 250° ja pala juotekerroksineen 66 kiin-35 nitetään koteloon ja kohdistetaan laippaan ja liitetään 4 82999 siihen. Tässä vaiheessa ei tarvita muuta juotetta, koska palan alasivulla oleva juotekerros sulaa hetkellisesti ja jähmettyy sitten kiinnittääkseen palan lujasti.
Kokeissa liitettiin fotodiodin pala koteloon erit-5 täin tyydyttävästi, kun tinapinnoitteen paksuus oli 5-10 pm. Kun tinapinnoitteen paksuus oli 5 pm tai alle, vaih-teli liitoksen lujuus ja oli epävakaa. Kun tinapinnoitteen paksuus oli 10 pm tai yli, tinajuote valui ja oli vaihte-leva.
10 Tässä keksinnössä on juotekerros palan puolella.
Juotekerros liittää palan kotelon alustaan. Alustan ja kotelon materiaali ja muoto ovat mielivaltaiset.
Kuvio 3 on leikkauskuva rakenteesta, jossa mainittu fotodiodin pala on kiinnitetty litteätyyppiseen kote-15 loon, jossa käytetään safiirialustaa 21. Kuvion 2 optisen laitteen pala asetetaan suoraan (käyttämättä uutta juotetta) liitoslaipalle 23 ja liitetään siihen n-puolen elektrodin 65 ja laipan 23 kiinnittämiseksi lujasti siihen. P-puolen elektrodi 64 lankaliitetään laippaan 28 langalla 30. 20 Valo kulkee safiirialustan 21 ja laipan 23 aukon 24 kautta ja saapuu valoa vastaanottavaan pintaan 67. Tässä rakenteessa ei juotekerros 66 valu eikä siirry.
Kuvio 4 on leikkauskuva, joka esittää rakennetta, jossa mainittu fotodiodin pala on kiinnitetty koteloon, 25 jossa on keramiikka-alusta. Lankaliitäntää, johdinta ja kotelon ulkomuotoa ei esitetä, koska ne voidaan valita mielivaltaisesti. Kuviossa 4 ei keramiikka-alustaa ole varustettu juotteella, vaan palan puolella oleva juotekerros 66 toimii juotteena palan kiinnittämiseksi lujasti 30 laippaan 42.
Vaikka tätä keksintöä on edellä selitetty viitaten erityisiin sovellutuksiin, on selvää, että tätä keksintöä voidaan soveltaa kaikkiin optisiin laitteisiin, kuten ta-sotyyppiseen fotodiodiin ja vyöryfotodiodiin (ADP).
35 Optinen laite, jonka rakenne on tämän keksinnön mu- i.
5 82999 kainen, kuten edellä on selitetty, tarjoaa seuraavat teknisesti ansiokkaat ominaisuudet.
a) Koska juotekerroksen valuminen ja siirtyminen liittämisen yhteydessä estetään, ei juote pienennä läpi-5 näkyvän valonläpäisyosan pintaa tai tilaa. Tämä nostaa saantoa optisten laitteiden kokoonpanossa. Sovellettuna fotodiodiin ei tämä keksintö vähennä fotodiodin herkkyyttä, koska fotodiodi on varustettu metalloidulla kerroksella, esimerkiksi tinakerroksella liitosalueella eikä valoa vas-10 taanottavan ikkunan alueella. Koska metalloidun kerroksen, kuten tinakerroksen, paksuutta voidaan valvoa mielivaltaisesti 0,2 pm:n tarkkuudella, ei juote valu. b) Liitoksessa ei tarvita erityistä liitosainetta, kuten juotetta tai epoksihartsia. Tämä yksinkertaistaa tuotantoprosessia ja 15 parantaa tuottavuutta.
Vaikka yllä on esitetty ja selitetty keksinnön erityisiä suoritusmuotoja, on selvää, että nämä suoritusmuodot ovat pelkästään kuvausta ja selitystä varten ja että voidaan keksiä erilaisia muita muotoja poikkeamatta oheisten 20 patenttivaatimusten määrittelemästä suojapiiristä.
Claims (16)
1. Optinen laite, joka käsittää: alustan (21, 41), joka on läpinäkyvä tai jossa on 5 reikä (24, 43) valon päästämiseksi sen läpi, puolijohdepalan liitoslaipan (23, 42), joka on muodostettu alustalle (21, 41), ja optisen laitteen palan (61), joka on liitetty lii-toslaipalle (23, 42) ja järjestetty vastaanottamaan tai 10 lähettämään valoa sen liitetyltä sivulta, tunnettu siitä, että optisen laitteen palassa (61) on elektrodi (65) ja juotekerros (66), jotka on peräkkäisessä järjestyksessä asennettu sen liitetylle sivulle, jolloin kummassakin kerroksessa (65, 66) on reikä valon läpipäästämistä varten, 15 ja että optisen laitteen pala (61) on liitetty liitoslaip-paan (23, 42) juotekerroksen (66) avulla.
2. Patenttivaatimuksen 1 mukainen optinen laite, tunnettu siitä, että alusta on safiiria (21) tai keraaminen (41).
3. Patenttivaatimuksen 1 tai 2 mukainen optinen lai te, tunnettu siitä, että juotekerros (66) on tinaa, eutektista kulta-tinaseosta tai eutektista kulta-piiseosta.
4. Jonkin edellisen patenttivaatimuksen 1-3 mukainen optinen laite, tunnettu siitä, että juoteker- 25 roksen (66) paksuus on 5-10 pm.
5. Jonkin edellisen patenttivaatimuksen 1-4 mukainen optinen laite, tunnettu siitä, että juotekerros (66) on muodostettu pinnoittamalla tai höyrystämällä.
6. Jonkin edellisen patenttivaatimuksen 1-5 mukai-30 nen optinen laite, tunnettu siitä, että elektrodi (65) ja juotekerros (66) ovat kumpikin renkaanmuotoisia.
6 82999
7. Menetelmä optisen laitteen valmistamiseksi, tunnettu siitä, että se käsittää vaiheet: elektrodin (65), jossa on valoa läpipäästävä reikä, 35 asentamisen optisen laitteen palan (61) sille pinnalle, 7 82999 johon valo osuu, ja juotekerroksen (66) asentamisen tämän jälkeen mainitulle elektrodille, puolljohdepalan llltoslaipan (23, 42) asentamisen valoa läplpäästävälle alustalle (21, 41), ja 5 mainitulla optisen laitteen palalla (61) olevan elektrodin (65) liittämisen llltoslalppaan (23, 42) käyttämällä mainittua juotekerrosta (66), jolloin tuotetaan yhtenäinen optinen laite, johon puolijohdepala on liitetty stabiiliin tilaan.
8. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että juotekerros (66) on tinaa.
9. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että juotekerros (66) on eutektis-ta kulta-tinaseosta.
10. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että juotekerros (66) on eutektis-ta kulta-piiseosta.
11. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että juotekerroksen (66) paksuus 20 on 5-10 pm.
12. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että alusta (21, 41) on safiiria.
13. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että alusta (21, 41) on keraaminen.
14. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että juotekerros (66) muodostetaan päällystämällä.
15. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että juotekerros (66) muodostetaan 30 höyrystämällä.
16. Patenttivaatimuksen 7 mukainen menetelmä, tunnettu siitä, että sekä elektrodi (65) että juotekerros (66) ovat renkaanmuotoisia. 8 82999
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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FI880867A FI91574C (fi) | 1983-11-21 | 1988-02-24 | Kotelo optista laitetta varten sekä menetelmä optisen laitteen valmistamiseksi |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
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JP58218964A JPS60110180A (ja) | 1983-11-21 | 1983-11-21 | 光素子用パツケ−ジ |
JP21896483 | 1983-11-21 | ||
JP58223020A JPS60113978A (ja) | 1983-11-25 | 1983-11-25 | 光素子 |
JP22302083 | 1983-11-25 | ||
JP58232341A JPS60124885A (ja) | 1983-12-08 | 1983-12-08 | 受光ダイオードの製造方法 |
JP23234183 | 1983-12-08 |
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FI844473A0 FI844473A0 (fi) | 1984-11-14 |
FI844473L FI844473L (fi) | 1985-05-22 |
FI82999B FI82999B (fi) | 1991-01-31 |
FI82999C true FI82999C (fi) | 1991-05-10 |
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FI844473A FI82999C (fi) | 1983-11-21 | 1984-11-14 | Optisk anordning och foerfarande foer dess framstaellning. |
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US (2) | US4663652A (fi) |
EP (2) | EP0313174B1 (fi) |
AU (1) | AU592256B2 (fi) |
CA (1) | CA1267468A (fi) |
DE (2) | DE3481571D1 (fi) |
DK (2) | DK163761C (fi) |
FI (1) | FI82999C (fi) |
NO (1) | NO169684C (fi) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0219359B1 (en) * | 1985-10-16 | 1990-03-07 | BRITISH TELECOMMUNICATIONS public limited company | Fabry-perot interferometer |
US4845052A (en) * | 1986-02-07 | 1989-07-04 | Harris Corporation | Method of packaging a non-contact I/O signal transmission integrated circuit |
US4796975A (en) * | 1987-05-14 | 1989-01-10 | Amphenol Corporation | Method of aligning and attaching optical fibers to substrate optical waveguides and substrate optical waveguide having fibers attached thereto |
JPH01296676A (ja) * | 1988-05-24 | 1989-11-30 | Nec Corp | 半導体受光装置 |
US5179430A (en) * | 1988-05-24 | 1993-01-12 | Nec Corporation | Planar type heterojunction avalanche photodiode |
JPH0258008A (ja) * | 1988-08-24 | 1990-02-27 | Sumitomo Electric Ind Ltd | 光モジュール |
JPH0266504A (ja) * | 1988-08-31 | 1990-03-06 | Sumitomo Electric Ind Ltd | 光送信モジュールの製造装置 |
GB2228618B (en) * | 1989-02-27 | 1993-04-14 | Philips Electronic Associated | Radiation detector |
JP3067151B2 (ja) * | 1990-03-13 | 2000-07-17 | 日本電気株式会社 | 光電気変換素子サブキャリア |
FR2685561B1 (fr) * | 1991-12-20 | 1994-02-04 | Thomson Hybrides | Procede de cablage d'une barrette de lasers et barrette cablee par ce procede. |
DE4210331A1 (de) * | 1992-03-30 | 1993-10-07 | Bodenseewerk Geraetetech | Verbindung einer Fotodiode mit einem Lichtwellenleiter |
JP3484543B2 (ja) * | 1993-03-24 | 2004-01-06 | 富士通株式会社 | 光結合部材の製造方法及び光装置 |
US5499312A (en) * | 1993-11-09 | 1996-03-12 | Hewlett-Packard Company | Passive alignment and packaging of optoelectronic components to optical waveguides using flip-chip bonding technology |
US5460318A (en) * | 1994-06-01 | 1995-10-24 | Gte Laboratories Incorporated | Diebonding geometry for packaging optoelectronics |
DE19600306C1 (de) * | 1996-01-05 | 1997-04-10 | Siemens Ag | Halbleiter-Bauelement, insb. mit einer optoelektronischen Schaltung bzw. Anordnung |
DE19621124A1 (de) * | 1996-05-24 | 1997-11-27 | Siemens Ag | Optoelektronischer Wandler und dessen Herstellungsverfahren |
US5822856A (en) * | 1996-06-28 | 1998-10-20 | International Business Machines Corporation | Manufacturing circuit board assemblies having filled vias |
US5867368A (en) * | 1997-09-09 | 1999-02-02 | Amkor Technology, Inc. | Mounting for a semiconductor integrated circuit device |
US5949655A (en) * | 1997-09-09 | 1999-09-07 | Amkor Technology, Inc. | Mounting having an aperture cover with adhesive locking feature for flip chip optical integrated circuit device |
JP2000081524A (ja) * | 1998-09-07 | 2000-03-21 | Sony Corp | 光送受信システム |
US6216939B1 (en) * | 1998-12-31 | 2001-04-17 | Jds Uniphase Photonics C.V. | Method for making a hermetically sealed package comprising at least one optical fiber feedthrough |
US6448635B1 (en) | 1999-08-30 | 2002-09-10 | Amkor Technology, Inc. | Surface acoustical wave flip chip |
US6536958B2 (en) | 2000-12-20 | 2003-03-25 | Triquint Technology Holding Co. | Optical device package with hermetically bonded fibers |
US6564454B1 (en) * | 2000-12-28 | 2003-05-20 | Amkor Technology, Inc. | Method of making and stacking a semiconductor package |
GB2372633A (en) * | 2001-02-24 | 2002-08-28 | Mitel Semiconductor Ab | Flip-chip mounted optical device |
JP2002250846A (ja) * | 2001-02-26 | 2002-09-06 | Seiko Epson Corp | 光モジュール及びその製造方法並びに光伝達装置 |
KR100424611B1 (ko) * | 2001-04-20 | 2004-03-27 | 울트라테라 코포레이션 | 저형상 감광성 반도체 패키지 |
FR2832252B1 (fr) * | 2001-11-14 | 2004-03-12 | St Microelectronics Sa | Boitier semi-conducteur a capteur, muni d'un insert de fixation |
JP2004179258A (ja) * | 2002-11-25 | 2004-06-24 | Hamamatsu Photonics Kk | 紫外線センサ |
US7564125B2 (en) * | 2002-12-06 | 2009-07-21 | General Electric Company | Electronic array and methods for fabricating same |
DE10308890A1 (de) * | 2003-02-28 | 2004-09-09 | Opto Tech Corporation | Gehäusestruktur für eine Lichtemissionsdiode und Verfahren zu dessen Herstellung |
US6883978B2 (en) * | 2003-06-26 | 2005-04-26 | Matsushita Electric Industrial Co., Ltd. | Low cost package design for fiber coupled optical component |
US7284913B2 (en) | 2003-07-14 | 2007-10-23 | Matsushita Electric Industrial Co., Ltd. | Integrated fiber attach pad for optical package |
US7410088B2 (en) * | 2003-09-05 | 2008-08-12 | Matsushita Electric Industrial, Co., Ltd. | Solder preform for low heat stress laser solder attachment |
US7021838B2 (en) | 2003-12-16 | 2006-04-04 | Matsushita Electric Industrial Co., Ltd. | Optimizing alignment of an optical fiber to an optical output port |
US7140783B2 (en) * | 2004-02-06 | 2006-11-28 | Matsushita Electric Industrial Co., Ltd. | Diamond 2D scan for aligning an optical fiber to an optical output port |
US20050202826A1 (en) * | 2004-03-12 | 2005-09-15 | Coretek Opto Corp. | Optical subassembly |
DE102004039883B3 (de) * | 2004-08-17 | 2006-06-14 | Schott Ag | Transparentes Element, insbesondere Verbundglaselement, und Verfahren zum Tausch eines Verbrauchers darin |
US7263260B2 (en) * | 2005-03-14 | 2007-08-28 | Matsushita Electric Industrial Co., Ltd. | Low cost, high precision multi-point optical component attachment |
JP2007165811A (ja) | 2005-12-16 | 2007-06-28 | Nichia Chem Ind Ltd | 発光装置 |
JP2007201361A (ja) * | 2006-01-30 | 2007-08-09 | Shinko Electric Ind Co Ltd | 半導体装置及び半導体装置の製造方法 |
US20080012087A1 (en) * | 2006-04-19 | 2008-01-17 | Henri Dautet | Bonded wafer avalanche photodiode and method for manufacturing same |
CN101563794B (zh) * | 2006-12-18 | 2012-05-30 | 皇家飞利浦电子股份有限公司 | 包括透明衬底上的led的照明设备 |
US7514724B2 (en) * | 2007-03-23 | 2009-04-07 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Solid state light source having a variable number of dies |
CN102024717B (zh) * | 2010-08-21 | 2012-03-07 | 比亚迪股份有限公司 | 一种半导体芯片的共晶方法及共晶结构 |
DE102017126109A1 (de) * | 2017-11-08 | 2019-05-09 | Osram Opto Semiconductors Gmbh | Licht emittierendes Bauelement und Verfahren zur Herstellung eines Licht emittierenden Bauelements |
FR3094141A1 (fr) * | 2019-03-18 | 2020-09-25 | Commissariat à l'Energie Atomique et aux Energies Alternatives | procede de fabrication d’un composant optoelectronique a transmission optique en face arriere |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3757127A (en) * | 1970-08-10 | 1973-09-04 | Cogar Corp | Photodetector packing assembly |
US3959522A (en) * | 1975-04-30 | 1976-05-25 | Rca Corporation | Method for forming an ohmic contact |
GB2026235B (en) * | 1978-06-06 | 1982-07-21 | Nippon Electric Co | Light emitting diode mounting structure for optical fibre communications |
JPS5513963A (en) * | 1978-07-17 | 1980-01-31 | Nec Corp | Photo semiconductor device |
US4268113A (en) * | 1979-04-16 | 1981-05-19 | International Business Machines Corporation | Signal coupling element for substrate-mounted optical transducers |
FR2466866A1 (fr) * | 1979-10-05 | 1981-04-10 | Thomson Csf | Procede de couplage entre une fibre optique et une diode opto-electronique, et tete d'emission ou de reception realisee par ce procede |
JPS5660037A (en) * | 1979-10-22 | 1981-05-23 | Mitsubishi Electric Corp | Semiconductor device |
FR2494044A1 (fr) * | 1980-11-12 | 1982-05-14 | Thomson Csf | Phototransistor a heterojonction en technologie planar et procede de fabrication d'un tel phototransistor |
US4355321A (en) * | 1981-02-02 | 1982-10-19 | Varian Associates, Inc. | Optoelectronic assembly including light transmissive single crystal semiconductor window |
JPS5891644A (ja) * | 1981-11-26 | 1983-05-31 | Toshiba Corp | 半導体装置 |
JPS58128762A (ja) * | 1982-01-27 | 1983-08-01 | Fujitsu Ltd | 半導体装置 |
JPS58158950A (ja) * | 1982-03-16 | 1983-09-21 | Nec Corp | 半導体装置 |
JPS59220982A (ja) * | 1983-05-31 | 1984-12-12 | Sumitomo Electric Ind Ltd | 光素子用パッケ−ジ |
-
1984
- 1984-11-06 CA CA000467175A patent/CA1267468A/en not_active Expired - Lifetime
- 1984-11-14 EP EP88202641A patent/EP0313174B1/en not_active Expired - Lifetime
- 1984-11-14 DE DE8484307870T patent/DE3481571D1/de not_active Expired - Fee Related
- 1984-11-14 EP EP84307870A patent/EP0145316B1/en not_active Expired - Lifetime
- 1984-11-14 DE DE88202641T patent/DE3486214T2/de not_active Expired - Fee Related
- 1984-11-14 FI FI844473A patent/FI82999C/fi not_active IP Right Cessation
- 1984-11-15 US US06/671,783 patent/US4663652A/en not_active Expired - Fee Related
- 1984-11-16 DK DK547384A patent/DK163761C/da not_active IP Right Cessation
- 1984-11-19 NO NO844596A patent/NO169684C/no unknown
-
1986
- 1986-09-09 US US06/905,231 patent/US4727649A/en not_active Expired - Fee Related
-
1988
- 1988-03-16 AU AU13197/88A patent/AU592256B2/en not_active Ceased
-
1991
- 1991-02-26 DK DK033291A patent/DK33291D0/da not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
DK163761B (da) | 1992-03-30 |
EP0313174A2 (en) | 1989-04-26 |
CA1267468C (en) | 1990-04-03 |
FI844473L (fi) | 1985-05-22 |
DK163761C (da) | 1992-08-24 |
DE3486214T2 (de) | 1994-01-13 |
EP0313174B1 (en) | 1993-09-22 |
EP0145316B1 (en) | 1990-03-07 |
DK33291A (da) | 1991-02-26 |
DE3481571D1 (de) | 1990-04-12 |
NO844596L (no) | 1985-05-22 |
DK547384D0 (da) | 1984-11-16 |
NO169684B (no) | 1992-04-13 |
EP0313174A3 (en) | 1989-11-15 |
AU1319788A (en) | 1988-06-09 |
US4663652A (en) | 1987-05-05 |
CA1267468A (en) | 1990-04-03 |
DE3486214D1 (de) | 1993-10-28 |
EP0145316A3 (en) | 1986-07-30 |
AU592256B2 (en) | 1990-01-04 |
FI82999B (fi) | 1991-01-31 |
US4727649A (en) | 1988-03-01 |
FI844473A0 (fi) | 1984-11-14 |
NO169684C (no) | 1992-07-22 |
DK547384A (da) | 1985-05-22 |
DK33291D0 (da) | 1991-02-26 |
EP0145316A2 (en) | 1985-06-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM | Patent lapsed | ||
MM | Patent lapsed |
Owner name: SUMITOMO ELECTRIC INDUSTRIES, LTD. |