JPS5891644A - 半導体装置 - Google Patents
半導体装置Info
- Publication number
- JPS5891644A JPS5891644A JP56188439A JP18843981A JPS5891644A JP S5891644 A JPS5891644 A JP S5891644A JP 56188439 A JP56188439 A JP 56188439A JP 18843981 A JP18843981 A JP 18843981A JP S5891644 A JPS5891644 A JP S5891644A
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- layer
- metal
- sapphire
- gold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 15
- 229910052594 sapphire Inorganic materials 0.000 claims abstract description 17
- 239000010980 sapphire Substances 0.000 claims abstract description 17
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 16
- 239000010703 silicon Substances 0.000 claims abstract description 16
- 239000000758 substrate Substances 0.000 claims abstract description 16
- 229910052751 metal Inorganic materials 0.000 claims abstract description 15
- 239000002184 metal Substances 0.000 claims abstract description 15
- 230000005496 eutectics Effects 0.000 claims abstract description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 15
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 abstract description 8
- 239000010931 gold Substances 0.000 abstract description 5
- 229910052737 gold Inorganic materials 0.000 abstract description 5
- OFLYIWITHZJFLS-UHFFFAOYSA-N [Si].[Au] Chemical compound [Si].[Au] OFLYIWITHZJFLS-UHFFFAOYSA-N 0.000 abstract description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract description 4
- 229920005591 polysilicon Polymers 0.000 abstract description 4
- 238000011109 contamination Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 abstract description 3
- 238000010438 heat treatment Methods 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 31
- 229910000679 solder Inorganic materials 0.000 description 5
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- JVPLOXQKFGYFMN-UHFFFAOYSA-N gold tin Chemical compound [Sn].[Au] JVPLOXQKFGYFMN-UHFFFAOYSA-N 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 241000272201 Columbiformes Species 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910001120 nichrome Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
Classifications
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Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
め要約のデータは記録されません。
Description
【発明の詳細な説明】
発明の技術分野
シリコンオンサファイア(808と略称する)構造の半
導体素子のマウント構造の改良に関する。
導体素子のマウント構造の改良に関する。
発明の技術的背景
SOS構造の半導体装置の一例を第1図および第2図(
第2図は第1図のリード端子−,(10’)・・・を省
略して示す)に示す。この構造は基板が絶縁物のため、
寄生効果が極めて少く、素子の高速化および高集積化に
適するので多く用いられるようKなっている。図におい
て、(1)はサファイア基板で一方の主面にシリコンの
活性領域が形成されて半導体素子(2)が構成されてい
る。そして、この素子はセラ建ツクスの外囲器(31)
に合成樹脂の接着剤層(4)を介して加熱接着されたの
ち、素子の電極がワイヤメンディング((5)、(5’
)・・・はボンディングワイヤ)によって導出され、外
囲器のふた体(3b)で封止されていた。前記!ラン)
Kあた夛、基板がサファイアであるため、例えばエポキ
シ、樹脂系接着剤によっていた。このような接着剤は一
般に加熱を施して接着が達成されるが、その接着強度が
低調であるためサファイアの接着面を粗面化させた)、
さらに接着強度の高い接着剤を選択していた。
第2図は第1図のリード端子−,(10’)・・・を省
略して示す)に示す。この構造は基板が絶縁物のため、
寄生効果が極めて少く、素子の高速化および高集積化に
適するので多く用いられるようKなっている。図におい
て、(1)はサファイア基板で一方の主面にシリコンの
活性領域が形成されて半導体素子(2)が構成されてい
る。そして、この素子はセラ建ツクスの外囲器(31)
に合成樹脂の接着剤層(4)を介して加熱接着されたの
ち、素子の電極がワイヤメンディング((5)、(5’
)・・・はボンディングワイヤ)によって導出され、外
囲器のふた体(3b)で封止されていた。前記!ラン)
Kあた夛、基板がサファイアであるため、例えばエポキ
シ、樹脂系接着剤によっていた。このような接着剤は一
般に加熱を施して接着が達成されるが、その接着強度が
低調であるためサファイアの接着面を粗面化させた)、
さらに接着強度の高い接着剤を選択していた。
背景技術の問題点
エポキシ樹脂のような熱硬化性の合成樹脂を用いる場合
のキエアによって発生するガスが素子の表面に耐着し、
あるいはパッケージ内に残存し信頼性を低下させる丸め
、マウント後に洗浄を施す必要があった。を九、取着強
度が低いのでキュアO温度管理が難かしく、表面を粗面
化する必要があって製造ニーが繁雑になったシ種々の問
題があつた。
のキエアによって発生するガスが素子の表面に耐着し、
あるいはパッケージ内に残存し信頼性を低下させる丸め
、マウント後に洗浄を施す必要があった。を九、取着強
度が低いのでキュアO温度管理が難かしく、表面を粗面
化する必要があって製造ニーが繁雑になったシ種々の問
題があつた。
発明の目的
SOS構造の半導体装置における半導体素子のマウント
強度を改善する構造を提供する。
強度を改善する構造を提供する。
発明の概要(構成と作用)
サファイア基板の亀山側主面を金属層または金属とシリ
コンの共晶層を介して外囲器に固着させることにより、
マウント強度を向上させる構造である。
コンの共晶層を介して外囲器に固着させることにより、
マウント強度を向上させる構造である。
発明の実施例
発明の第1の実施例
構造の1例は第3図に示されるように、サファイア基板
(1)の接着側主面に気相成長によってシリコン層、ま
たはポリシリコン層Ql)を形成し、これらがサファイ
ア基板との反応性も高く、高純度のシリコンであるため
素子形成プロセスでの金属原子による汚染もない。叙上
のシリコン層は外囲器(内面のメタライズ層に設けられ
た金層、“まえは金シリコン共晶層に金シリコン共晶を
形成させて加熱と機械的応力を印加して固着させ、ある
いは前記メタライズ層との間に金箔または金シリコン箔
を挿んで加熱と機械的応力を印加して固着させる。
(1)の接着側主面に気相成長によってシリコン層、ま
たはポリシリコン層Ql)を形成し、これらがサファイ
ア基板との反応性も高く、高純度のシリコンであるため
素子形成プロセスでの金属原子による汚染もない。叙上
のシリコン層は外囲器(内面のメタライズ層に設けられ
た金層、“まえは金シリコン共晶層に金シリコン共晶を
形成させて加熱と機械的応力を印加して固着させ、ある
いは前記メタライズ層との間に金箔または金シリコン箔
を挿んで加熱と機械的応力を印加して固着させる。
いずれにしても、サファイア基板側からシリコン(tた
はポリシリコン)層aυ、金シリコン層a2、(金層(
上記金属または金箔でシリコンと共晶生成しなかった部
分))、メタライズ層0の順に相互に強固な結合をもっ
てサファイア基板(1)が外囲器(3m)の内面に固着
されるものである。
はポリシリコン)層aυ、金シリコン層a2、(金層(
上記金属または金箔でシリコンと共晶生成しなかった部
分))、メタライズ層0の順に相互に強固な結合をもっ
てサファイア基板(1)が外囲器(3m)の内面に固着
されるものである。
叙上の構造によ6、sos構造の紫子チレプがきわめて
高い信頼性でマウントされるので、シリコン基板で形成
された素子チップと同様の容易さと信頼性が得られ、か
つ、マウント時における加熱によるガス放出も極微で素
子を汚染しない利点がある。
高い信頼性でマウントされるので、シリコン基板で形成
された素子チップと同様の容易さと信頼性が得られ、か
つ、マウント時における加熱によるガス放出も極微で素
子を汚染しない利点がある。
発明の第2の実施例
構造の一例が第3図に示されるように、サファイア基板
(1)の接着側主面が粗面化され、これにタングステン
、チタン、モlJ7’テン、ニクロム、バナジウム等か
ら選ばれた金゛属(合金)を蒸着し加熱を施して第1の
メタライズ層間を200〜300Xの層厚に形成し、さ
らに、はんだと接合のよいニッケル郷の第2のメタライ
ズ層(2)を3oooXの層厚に積層して形成し、この
層と外囲器のメタ2イズ層Iとの間を鉛すず−はんだ、
金すず−はんだ等のけんだ接合層(至)で接続して、外
囲器K 11m1t着させる。
(1)の接着側主面が粗面化され、これにタングステン
、チタン、モlJ7’テン、ニクロム、バナジウム等か
ら選ばれた金゛属(合金)を蒸着し加熱を施して第1の
メタライズ層間を200〜300Xの層厚に形成し、さ
らに、はんだと接合のよいニッケル郷の第2のメタライ
ズ層(2)を3oooXの層厚に積層して形成し、この
層と外囲器のメタ2イズ層Iとの間を鉛すず−はんだ、
金すず−はんだ等のけんだ接合層(至)で接続して、外
囲器K 11m1t着させる。
なお、前記第2のメタ2イズ鳩4?lF着後に表面の酸
化防止の友め薄く金を蒸着しておいてはんだ接合を容易
かつ鎗実にした。また、第1のメタライズ層は素子に形
成される前のす7了イア基板に蒸着形成し、加熱シンタ
ーを施しておいて4よい。
化防止の友め薄く金を蒸着しておいてはんだ接合を容易
かつ鎗実にした。また、第1のメタライズ層は素子に形
成される前のす7了イア基板に蒸着形成し、加熱シンタ
ーを施しておいて4よい。
@明の効果
半導体チップと外囲器との接合が金属層(−例の金すず
)または金層とシリコンとの共晶層によって達成される
ので、きわめて伽固な接着が達成されるとともに1接着
時に従来の合成棚側のようなガス放出がないため素子が
汚染される仁とがないなどの顕著な利点がある。
)または金層とシリコンとの共晶層によって達成される
ので、きわめて伽固な接着が達成されるとともに1接着
時に従来の合成棚側のようなガス放出がないため素子が
汚染される仁とがないなどの顕著な利点がある。
第1図社従来の半導体装置の腑視図、第2図は第1図の
半導体装置のリード端子を除いて示す断面図、第3図は
1実施例の半導体装置のリード端子を除いて示す断面図
、第4図は別の実施例の半導体装置のリード端子を除い
て示す断面図である。 1 サファイア基板 2 半導体素子 3a セラミックスの外囲器3b
外囲器のふた体 5.5′ ボンディングワイヤ10.10’・
・・ リード端子 11 シリコン(ま九はポリシリコン)層
12 金シリコン共晶層 13 外囲器のメタライズ層21
第1のメタライズ層 22 第2のメタライズ層 23 はんだ接合層 代理人 弁理士 井 上 −男 第 1 図 Sa 第 4 図
半導体装置のリード端子を除いて示す断面図、第3図は
1実施例の半導体装置のリード端子を除いて示す断面図
、第4図は別の実施例の半導体装置のリード端子を除い
て示す断面図である。 1 サファイア基板 2 半導体素子 3a セラミックスの外囲器3b
外囲器のふた体 5.5′ ボンディングワイヤ10.10’・
・・ リード端子 11 シリコン(ま九はポリシリコン)層
12 金シリコン共晶層 13 外囲器のメタライズ層21
第1のメタライズ層 22 第2のメタライズ層 23 はんだ接合層 代理人 弁理士 井 上 −男 第 1 図 Sa 第 4 図
Claims (1)
- シリコンオンサファイア構造の半導体装置において、サ
ファイア基板の露出側主面を金属層または金属とシリコ
ンの共晶層を介して外囲器内に固着させたことを特徴と
する半導体装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56188439A JPS5891644A (ja) | 1981-11-26 | 1981-11-26 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56188439A JPS5891644A (ja) | 1981-11-26 | 1981-11-26 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5891644A true JPS5891644A (ja) | 1983-05-31 |
Family
ID=16223693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56188439A Pending JPS5891644A (ja) | 1981-11-26 | 1981-11-26 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5891644A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4663652A (en) * | 1983-11-21 | 1987-05-05 | Sumotomo Electric Industries, Ltd. | Package for optical device |
-
1981
- 1981-11-26 JP JP56188439A patent/JPS5891644A/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4663652A (en) * | 1983-11-21 | 1987-05-05 | Sumotomo Electric Industries, Ltd. | Package for optical device |
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