DE69119382D1 - Halbleiteranordnung mit einem bipolaren Hochgeschwindigkeits-Schalttransistor - Google Patents
Halbleiteranordnung mit einem bipolaren Hochgeschwindigkeits-SchalttransistorInfo
- Publication number
- DE69119382D1 DE69119382D1 DE69119382T DE69119382T DE69119382D1 DE 69119382 D1 DE69119382 D1 DE 69119382D1 DE 69119382 T DE69119382 T DE 69119382T DE 69119382 T DE69119382 T DE 69119382T DE 69119382 D1 DE69119382 D1 DE 69119382D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor device
- switching transistor
- speed switching
- bipolar high
- bipolar
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0744—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common without components of the field effect type
- H01L27/075—Bipolar transistors in combination with diodes, or capacitors, or resistors, e.g. lateral bipolar transistor, and vertical bipolar transistor and resistor
- H01L27/0755—Vertical bipolar transistor in combination with diodes, or capacitors, or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49113—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting different bonding areas on the semiconductor or solid-state body to a common bonding area outside the body, e.g. converging wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
- H01L2924/12032—Schottky diode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Bipolar Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP02408533A JP3074736B2 (ja) | 1990-12-28 | 1990-12-28 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69119382D1 true DE69119382D1 (de) | 1996-06-13 |
DE69119382T2 DE69119382T2 (de) | 1996-09-12 |
Family
ID=18517975
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69119382T Expired - Fee Related DE69119382T2 (de) | 1990-12-28 | 1991-12-20 | Halbleiteranordnung mit einem bipolaren Hochgeschwindigkeits-Schalttransistor |
Country Status (4)
Country | Link |
---|---|
US (2) | US5349230A (de) |
EP (1) | EP0492558B1 (de) |
JP (1) | JP3074736B2 (de) |
DE (1) | DE69119382T2 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3258200B2 (ja) * | 1995-05-31 | 2002-02-18 | 株式会社東芝 | 圧接型半導体装置 |
JP3074736B2 (ja) * | 1990-12-28 | 2000-08-07 | 富士電機株式会社 | 半導体装置 |
JPH05152574A (ja) * | 1991-11-29 | 1993-06-18 | Fuji Electric Co Ltd | 半導体装置 |
DE4236557C2 (de) * | 1992-10-29 | 2002-08-01 | Semikron Elektronik Gmbh | Leistungs- Halbleiterbauelement |
DE4244272A1 (de) * | 1992-12-28 | 1994-06-30 | Daimler Benz Ag | Feldeffektgesteuertes Halbleiterbauelement |
US5838057A (en) * | 1994-08-03 | 1998-11-17 | Texas Instruments Incorporated | Transistor switches |
JP3588503B2 (ja) * | 1995-06-20 | 2004-11-10 | 株式会社東芝 | 圧接型半導体装置 |
KR970054363A (ko) * | 1995-12-30 | 1997-07-31 | 김광호 | 다이오드를 내장한 절연게이트 바이폴라 트랜지스터 및 그 제조방법 |
US5825079A (en) * | 1997-01-23 | 1998-10-20 | Luminous Intent, Inc. | Semiconductor diodes having low forward conduction voltage drop and low reverse current leakage |
JP3494023B2 (ja) * | 1998-07-28 | 2004-02-03 | 株式会社日立製作所 | 半導体装置および半導体装置の駆動方法並びに電力変換装置 |
US6420757B1 (en) | 1999-09-14 | 2002-07-16 | Vram Technologies, Llc | Semiconductor diodes having low forward conduction voltage drop, low reverse current leakage, and high avalanche energy capability |
US6433370B1 (en) | 2000-02-10 | 2002-08-13 | Vram Technologies, Llc | Method and apparatus for cylindrical semiconductor diodes |
DE10022268B4 (de) * | 2000-05-08 | 2005-03-31 | Infineon Technologies Ag | Halbleiterbauelement mit zwei Halbleiterkörpern in einem gemeinsamen Gehäuse |
JP2001345388A (ja) * | 2000-05-31 | 2001-12-14 | Hitachi Electronics Eng Co Ltd | ダイオード素子回路およびこれを利用したスイッチ回路 |
US6580150B1 (en) | 2000-11-13 | 2003-06-17 | Vram Technologies, Llc | Vertical junction field effect semiconductor diodes |
US6537921B2 (en) | 2001-05-23 | 2003-03-25 | Vram Technologies, Llc | Vertical metal oxide silicon field effect semiconductor diodes |
JP2003023769A (ja) * | 2001-07-06 | 2003-01-24 | Sansha Electric Mfg Co Ltd | 電力用半導体モジュール |
US6958275B2 (en) * | 2003-03-11 | 2005-10-25 | Integrated Discrete Devices, Llc | MOSFET power transistors and methods |
US6919603B2 (en) * | 2003-04-30 | 2005-07-19 | Texas Instruments Incorporated | Efficient protection structure for reverse pin-to-pin electrostatic discharge |
JP2005026392A (ja) * | 2003-07-01 | 2005-01-27 | Renesas Technology Corp | 半導体装置および半導体装置の製造方法 |
US7280769B2 (en) * | 2003-07-28 | 2007-10-09 | Emerson Electric Co. | Method and apparatus for operating an optical receiver for low intensity optical communication in a high speed mode |
DE102004007991B4 (de) * | 2004-02-18 | 2015-07-30 | Infineon Technologies Ag | Halbleiter-Schaltelement |
JP4899301B2 (ja) * | 2004-09-17 | 2012-03-21 | 富士電機株式会社 | 半導体装置 |
KR101194040B1 (ko) * | 2005-11-22 | 2012-10-24 | 페어차일드코리아반도체 주식회사 | 트랜지스터에 프리휠링 다이오드가 구현된 고집적회로 |
JP5444758B2 (ja) * | 2009-02-27 | 2014-03-19 | 日産自動車株式会社 | 半導体装置 |
JP2014158356A (ja) * | 2013-02-15 | 2014-08-28 | Toshiba Lighting & Technology Corp | 整流回路 |
JP6276560B2 (ja) * | 2013-11-01 | 2018-02-07 | 一般財団法人電力中央研究所 | バイポーラ半導体装置およびその製造方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2508703A1 (fr) * | 1981-06-30 | 1982-12-31 | Commissariat Energie Atomique | Diode zener compensee en temperature et stable sous irradiation et procede de fabrication d'une telle diode |
JPS5974728A (ja) * | 1982-10-22 | 1984-04-27 | Fuji Electric Co Ltd | トランジスタの過電圧保護回路 |
JPS59189679A (ja) * | 1983-04-13 | 1984-10-27 | Hitachi Ltd | ダイオ−ド |
JPS6197862A (ja) * | 1984-10-18 | 1986-05-16 | Nec Kansai Ltd | 半導体装置 |
JPS61180472A (ja) * | 1985-02-05 | 1986-08-13 | Mitsubishi Electric Corp | 半導体装置 |
US4694313A (en) * | 1985-02-19 | 1987-09-15 | Harris Corporation | Conductivity modulated semiconductor structure |
US4811065A (en) * | 1987-06-11 | 1989-03-07 | Siliconix Incorporated | Power DMOS transistor with high speed body diode |
JPH02184054A (ja) * | 1989-01-11 | 1990-07-18 | Toshiba Corp | ハイブリッド型樹脂封止半導体装置 |
JP2658427B2 (ja) * | 1989-01-17 | 1997-09-30 | 富士電機株式会社 | 電力変換用半導体素子のスナバ回路とそのモジュール装置 |
JPH0671061B2 (ja) * | 1989-05-22 | 1994-09-07 | 株式会社東芝 | 樹脂封止型半導体装置 |
JPH0750791B2 (ja) * | 1989-09-20 | 1995-05-31 | 株式会社日立製作所 | 半導体整流ダイオード及びそれを使つた電源装置並びに電子計算機 |
JP2590284B2 (ja) * | 1990-02-28 | 1997-03-12 | 株式会社日立製作所 | 半導体装置及びその製造方法 |
JP3074736B2 (ja) * | 1990-12-28 | 2000-08-07 | 富士電機株式会社 | 半導体装置 |
-
1990
- 1990-12-28 JP JP02408533A patent/JP3074736B2/ja not_active Expired - Lifetime
-
1991
- 1991-10-28 US US07/783,333 patent/US5349230A/en not_active Expired - Fee Related
- 1991-12-20 EP EP91122035A patent/EP0492558B1/de not_active Expired - Lifetime
- 1991-12-20 DE DE69119382T patent/DE69119382T2/de not_active Expired - Fee Related
-
1994
- 1994-03-22 US US08/215,616 patent/US5469103A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP3074736B2 (ja) | 2000-08-07 |
EP0492558A3 (en) | 1993-04-21 |
US5469103A (en) | 1995-11-21 |
EP0492558A2 (de) | 1992-07-01 |
JPH04233232A (ja) | 1992-08-21 |
EP0492558B1 (de) | 1996-05-08 |
US5349230A (en) | 1994-09-20 |
DE69119382T2 (de) | 1996-09-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |