DE69530881D1 - Halbleiteranordnung mit einem lateralen Bipolartransistor - Google Patents
Halbleiteranordnung mit einem lateralen BipolartransistorInfo
- Publication number
- DE69530881D1 DE69530881D1 DE69530881T DE69530881T DE69530881D1 DE 69530881 D1 DE69530881 D1 DE 69530881D1 DE 69530881 T DE69530881 T DE 69530881T DE 69530881 T DE69530881 T DE 69530881T DE 69530881 D1 DE69530881 D1 DE 69530881D1
- Authority
- DE
- Germany
- Prior art keywords
- bipolar transistor
- semiconductor arrangement
- lateral bipolar
- lateral
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/7317—Bipolar thin film transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/735—Lateral transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
- H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
- H01L29/7436—Lateral thyristors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Bipolar Transistors (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4826294A JPH07263455A (ja) | 1994-03-18 | 1994-03-18 | 半導体装置 |
JP7378094A JPH07263456A (ja) | 1994-03-22 | 1994-03-22 | 半導体装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69530881D1 true DE69530881D1 (de) | 2003-07-03 |
Family
ID=26388498
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69530881T Expired - Lifetime DE69530881D1 (de) | 1994-03-18 | 1995-03-13 | Halbleiteranordnung mit einem lateralen Bipolartransistor |
Country Status (4)
Country | Link |
---|---|
US (1) | US5608236A (de) |
EP (1) | EP0673072B1 (de) |
KR (1) | KR950034825A (de) |
DE (1) | DE69530881D1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5945726A (en) * | 1996-12-16 | 1999-08-31 | Micron Technology, Inc. | Lateral bipolar transistor |
DE19844531B4 (de) * | 1998-09-29 | 2017-12-14 | Prema Semiconductor Gmbh | Verfahren zur Herstellung von Transistoren |
US6563193B1 (en) * | 1999-09-28 | 2003-05-13 | Kabushiki Kaisha Toshiba | Semiconductor device |
JP5052091B2 (ja) * | 2006-10-20 | 2012-10-17 | 三菱電機株式会社 | 半導体装置 |
CN100529773C (zh) * | 2006-11-10 | 2009-08-19 | 群康科技(深圳)有限公司 | 集成电路系统压合阻抗检测方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3631311A (en) * | 1968-03-26 | 1971-12-28 | Telefunken Patent | Semiconductor circuit arrangement with integrated base leakage resistance |
GB1428742A (en) * | 1973-06-02 | 1976-03-17 | Ferranti Ltd | Semiconductor devices |
US4231056A (en) * | 1978-10-20 | 1980-10-28 | Harris Corporation | Moat resistor ram cell |
JPS5948951A (ja) * | 1982-09-14 | 1984-03-21 | Toshiba Corp | 半導体保護装置 |
JPS59127865A (ja) * | 1983-01-12 | 1984-07-23 | Hitachi Ltd | 半導体装置 |
JPH0654795B2 (ja) * | 1986-04-07 | 1994-07-20 | 三菱電機株式会社 | 半導体集積回路装置及びその製造方法 |
JPH01112764A (ja) * | 1987-10-27 | 1989-05-01 | Nec Corp | 半導体装置 |
IT1230895B (it) * | 1989-06-22 | 1991-11-08 | Sgs Thomson Microelectronics | Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta. |
JP2507632B2 (ja) * | 1989-10-18 | 1996-06-12 | 株式会社日立製作所 | 半導体装置 |
US5293051A (en) * | 1992-02-14 | 1994-03-08 | Sharp Kabushiki Kaisha | Photoswitching device including a MOSFET for detecting zero voltage crossing |
-
1995
- 1995-03-13 EP EP95301625A patent/EP0673072B1/de not_active Expired - Lifetime
- 1995-03-13 DE DE69530881T patent/DE69530881D1/de not_active Expired - Lifetime
- 1995-03-15 US US08/404,465 patent/US5608236A/en not_active Expired - Fee Related
- 1995-03-17 KR KR1019950005533A patent/KR950034825A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP0673072B1 (de) | 2003-05-28 |
EP0673072A2 (de) | 1995-09-20 |
EP0673072A3 (de) | 1995-11-08 |
US5608236A (en) | 1997-03-04 |
KR950034825A (ko) | 1995-12-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |