IT1230895B - Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta. - Google Patents
Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta.Info
- Publication number
- IT1230895B IT1230895B IT8920950A IT2095089A IT1230895B IT 1230895 B IT1230895 B IT 1230895B IT 8920950 A IT8920950 A IT 8920950A IT 2095089 A IT2095089 A IT 2095089A IT 1230895 B IT1230895 B IT 1230895B
- Authority
- IT
- Italy
- Prior art keywords
- optimization
- power transistor
- direct secondary
- secondary breaking
- breaking phenomena
- Prior art date
Links
- 238000005457 optimization Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/101—Integrated devices comprising main components and built-in components, e.g. IGBT having built-in freewheel diode
- H10D84/121—BJTs having built-in components
- H10D84/125—BJTs having built-in components the built-in components being resistive elements, e.g. BJT having a built-in ballasting resistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/124—Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
- H10D62/126—Top-view geometrical layouts of the regions or the junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/177—Base regions of bipolar transistors, e.g. BJTs or IGBTs
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT8920950A IT1230895B (it) | 1989-06-22 | 1989-06-22 | Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta. |
| EP19900111636 EP0404095A3 (en) | 1989-06-22 | 1990-06-20 | Integratable power transistor with optimization of direct secondary breakdown phenomena |
| US07/540,553 US5073811A (en) | 1989-06-22 | 1990-06-20 | Integratable power transistor with optimization of direct secondary breakdown phenomena |
| JP2163937A JPH03148833A (ja) | 1989-06-22 | 1990-06-21 | 集積可能なパワートランジスタ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT8920950A IT1230895B (it) | 1989-06-22 | 1989-06-22 | Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IT8920950A0 IT8920950A0 (it) | 1989-06-22 |
| IT1230895B true IT1230895B (it) | 1991-11-08 |
Family
ID=11174507
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT8920950A IT1230895B (it) | 1989-06-22 | 1989-06-22 | Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta. |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5073811A (it) |
| EP (1) | EP0404095A3 (it) |
| JP (1) | JPH03148833A (it) |
| IT (1) | IT1230895B (it) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5321279A (en) * | 1992-11-09 | 1994-06-14 | Texas Instruments Incorporated | Base ballasting |
| US5373201A (en) * | 1993-02-02 | 1994-12-13 | Motorola, Inc. | Power transistor |
| EP0673072B1 (en) * | 1994-03-18 | 2003-05-28 | Hitachi, Ltd. | Semiconductor device comprising a lateral bipolar transistor |
| US7226835B2 (en) * | 2001-12-28 | 2007-06-05 | Texas Instruments Incorporated | Versatile system for optimizing current gain in bipolar transistor structures |
| JP5464159B2 (ja) * | 2011-03-08 | 2014-04-09 | 三菱電機株式会社 | パワーモジュール |
| US10477883B2 (en) | 2015-08-25 | 2019-11-19 | Cornelius, Inc. | Gas injection assemblies for batch beverages having spargers |
| US10785996B2 (en) | 2015-08-25 | 2020-09-29 | Cornelius, Inc. | Apparatuses, systems, and methods for inline injection of gases into liquids |
| US11040314B2 (en) | 2019-01-08 | 2021-06-22 | Marmon Foodservice Technologies, Inc. | Apparatuses, systems, and methods for injecting gasses into beverages |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3990092A (en) * | 1974-01-11 | 1976-11-02 | Hitachi, Ltd. | Resistance element for semiconductor integrated circuit |
| DE2408540C2 (de) * | 1974-02-22 | 1982-04-08 | Robert Bosch Gmbh, 7000 Stuttgart | Halbleiterbauelement aus einer Vielzahl mindestens annähernd gleicher Schaltungselemente und Verfahren zum Erkennen und Abtrennen defekter Schaltungselemente |
| JPS5654064A (en) * | 1979-10-08 | 1981-05-13 | Mitsubishi Electric Corp | Semiconductor device |
| US4486770A (en) * | 1981-04-27 | 1984-12-04 | General Motors Corporation | Isolated integrated circuit transistor with transient protection |
| US4441116A (en) * | 1981-07-13 | 1984-04-03 | National Semiconductor Corporation | Controlling secondary breakdown in bipolar power transistors |
| IT1221867B (it) * | 1983-05-16 | 1990-07-12 | Ates Componenti Elettron | Struttura di transistore bipolare di potenza con resistenza di bilanciamento di base incroporata by-passable |
| DE3329241A1 (de) * | 1983-08-12 | 1985-02-21 | Siemens AG, 1000 Berlin und 8000 München | Leistungstransistor |
| IT1215230B (it) * | 1985-01-08 | 1990-01-31 | Ates Componenti Elettron | Diretta. dispositivo a semiconduttore integrato con drastica riduzione dei fenomeni di rottura secondaria |
| US4656496A (en) * | 1985-02-04 | 1987-04-07 | National Semiconductor Corporation | Power transistor emitter ballasting |
| JPH0654795B2 (ja) * | 1986-04-07 | 1994-07-20 | 三菱電機株式会社 | 半導体集積回路装置及びその製造方法 |
| JPH069208B2 (ja) * | 1987-02-27 | 1994-02-02 | ロ−ム株式会社 | 半導体装置 |
| JPS63260076A (ja) * | 1987-04-16 | 1988-10-27 | Nec Corp | 半導体装置 |
| JPS63275175A (ja) * | 1987-05-07 | 1988-11-11 | Fuji Electric Co Ltd | パワ−トランジスタ |
| IT1232930B (it) * | 1987-10-30 | 1992-03-10 | Sgs Microelettronica Spa | Struttura integrata a componenti attivi e passivi inclusi in sacche di isolamento operante a tensione maggiore della tensione di rottura tra ciascun componente e la sacca che lo contiene |
| DE3802794A1 (de) * | 1988-01-30 | 1989-08-10 | Bosch Gmbh Robert | Leistungstransistor |
| JP2623635B2 (ja) * | 1988-02-16 | 1997-06-25 | ソニー株式会社 | バイポーラトランジスタ及びその製造方法 |
| US4949139A (en) * | 1988-09-09 | 1990-08-14 | Atmel Corporation | Transistor construction for low noise output driver |
-
1989
- 1989-06-22 IT IT8920950A patent/IT1230895B/it active
-
1990
- 1990-06-20 EP EP19900111636 patent/EP0404095A3/en not_active Withdrawn
- 1990-06-20 US US07/540,553 patent/US5073811A/en not_active Expired - Lifetime
- 1990-06-21 JP JP2163937A patent/JPH03148833A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| IT8920950A0 (it) | 1989-06-22 |
| US5073811A (en) | 1991-12-17 |
| JPH03148833A (ja) | 1991-06-25 |
| EP0404095A2 (en) | 1990-12-27 |
| EP0404095A3 (en) | 1991-03-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19970628 |