DE68917504T2 - Verfahren zur Herstellung von abwechselnden Schichten aus monokristallinen Halbleitermaterial und Schichten aus isolierendem Material. - Google Patents
Verfahren zur Herstellung von abwechselnden Schichten aus monokristallinen Halbleitermaterial und Schichten aus isolierendem Material.Info
- Publication number
- DE68917504T2 DE68917504T2 DE68917504T DE68917504T DE68917504T2 DE 68917504 T2 DE68917504 T2 DE 68917504T2 DE 68917504 T DE68917504 T DE 68917504T DE 68917504 T DE68917504 T DE 68917504T DE 68917504 T2 DE68917504 T2 DE 68917504T2
- Authority
- DE
- Germany
- Prior art keywords
- layers
- production
- monocrystalline semiconductor
- insulating material
- semiconductor material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76248—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using lateral overgrowth techniques, i.e. ELO techniques
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02543—Phosphides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02549—Antimonides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02636—Selective deposition, e.g. simultaneous growth of mono- and non-monocrystalline semiconductor materials
- H01L21/02639—Preparation of substrate for selective deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8221—Three dimensional integrated circuits stacked in different levels
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/026—Deposition thru hole in mask
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/05—Etch and refill
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/933—Germanium or silicon or Ge-Si on III-V
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8804438A FR2629637B1 (fr) | 1988-04-05 | 1988-04-05 | Procede de realisation d'une alternance de couches de materiau semiconducteur monocristallin et de couches de materiau isolant |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68917504D1 DE68917504D1 (de) | 1994-09-22 |
DE68917504T2 true DE68917504T2 (de) | 1994-12-15 |
Family
ID=9364939
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68917504T Expired - Lifetime DE68917504T2 (de) | 1988-04-05 | 1989-04-04 | Verfahren zur Herstellung von abwechselnden Schichten aus monokristallinen Halbleitermaterial und Schichten aus isolierendem Material. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4999314A (de) |
EP (1) | EP0336831B1 (de) |
JP (1) | JP2889589B2 (de) |
DE (1) | DE68917504T2 (de) |
FR (1) | FR2629637B1 (de) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2527015B2 (ja) * | 1988-11-11 | 1996-08-21 | 日本電気株式会社 | 半導体膜の製造方法 |
JP2527016B2 (ja) * | 1988-11-11 | 1996-08-21 | 日本電気株式会社 | 半導体膜の製造方法 |
US4975385A (en) * | 1990-04-06 | 1990-12-04 | Applied Materials, Inc. | Method of constructing lightly doped drain (LDD) integrated circuit structure |
FR2666172B1 (fr) * | 1990-08-24 | 1997-05-16 | Thomson Csf | Transistor de puissance et procede de realisation. |
FR2667617B1 (fr) * | 1990-10-09 | 1992-11-27 | Thomson Csf | Procede de croissance de couches heteroepitaxiales. |
JPH04299569A (ja) * | 1991-03-27 | 1992-10-22 | Nec Corp | Soisの製造方法及びトランジスタとその製造方法 |
US5525550A (en) * | 1991-05-21 | 1996-06-11 | Fujitsu Limited | Process for forming thin films by plasma CVD for use in the production of semiconductor devices |
EP0809279B1 (de) * | 1991-09-23 | 2003-02-19 | Infineon Technologies AG | Verfahren zur Herstellung eines MOS-Transistors |
FR2682128B1 (fr) * | 1991-10-08 | 1993-12-03 | Thomson Csf | Procede de croissance de couches heteroepitaxiales. |
US5273921A (en) * | 1991-12-27 | 1993-12-28 | Purdue Research Foundation | Methods for fabricating a dual-gated semiconductor-on-insulator field effect transistor |
US5328868A (en) * | 1992-01-14 | 1994-07-12 | International Business Machines Corporation | Method of forming metal connections |
FR2689680B1 (fr) * | 1992-04-02 | 2001-08-10 | Thomson Csf | Procédé de réalisation de couches minces hétéroépitaxiales et de dispositifs électroniques. |
US5302544A (en) * | 1992-12-17 | 1994-04-12 | Eastman Kodak Company | Method of making CCD having a single level electrode of single crystalline silicon |
US5610441A (en) * | 1995-05-19 | 1997-03-11 | International Business Machines Corporation | Angle defined trench conductor for a semiconductor device |
US6294440B1 (en) * | 1998-04-10 | 2001-09-25 | Sharp Kabushiki Kaisha | Semiconductor substrate, light-emitting device, and method for producing the same |
FR2780808B1 (fr) | 1998-07-03 | 2001-08-10 | Thomson Csf | Dispositif a emission de champ et procedes de fabrication |
US5981363A (en) * | 1998-11-17 | 1999-11-09 | Gardner; Mark I. | Method and apparatus for high performance transistor devices |
JP3470623B2 (ja) * | 1998-11-26 | 2003-11-25 | ソニー株式会社 | 窒化物系iii−v族化合物半導体の成長方法、半導体装置の製造方法および半導体装置 |
JP2002110662A (ja) * | 2000-09-29 | 2002-04-12 | Toshiba Corp | 半導体装置の製造方法および半導体装置 |
JP2002270516A (ja) * | 2001-03-07 | 2002-09-20 | Nec Corp | Iii族窒化物半導体の成長方法、iii族窒化物半導体膜およびそれを用いた半導体素子 |
FR2832995B1 (fr) * | 2001-12-04 | 2004-02-27 | Thales Sa | Procede de croissance catalytique de nanotubes ou nanofibres comprenant une barriere de diffusion de type alliage nisi |
US6972228B2 (en) * | 2003-03-12 | 2005-12-06 | Intel Corporation | Method of forming an element of a microelectronic circuit |
US7514285B2 (en) * | 2006-01-17 | 2009-04-07 | Honeywell International Inc. | Isolation scheme for reducing film stress in a MEMS device |
TWI309439B (en) * | 2006-09-05 | 2009-05-01 | Ind Tech Res Inst | Nitride semiconductor and method for forming the same |
US20110233689A1 (en) * | 2008-12-08 | 2011-09-29 | Sumitomo Chemical Company, Limited | Semiconductor device, process for producing semiconductor device, semiconductor substrate, and process for producing semiconductor substrate |
US8313967B1 (en) | 2009-01-21 | 2012-11-20 | Stc.Unm | Cubic phase, nitrogen-based compound semiconductor films epitaxially grown on a grooved Si <001> substrate |
US20120025195A1 (en) * | 2010-07-28 | 2012-02-02 | Massachusetts Institute Of Technology | Confined Lateral Growth of Crystalline Material |
CN103764881A (zh) * | 2011-05-17 | 2014-04-30 | 麦克马斯特大学 | 通过横向扩散液相外延的半导体形成 |
US20150001588A1 (en) * | 2012-02-13 | 2015-01-01 | Tokyo Electron Limited | Semiconductor device and method for manufacturing same |
WO2013165620A1 (en) | 2012-05-04 | 2013-11-07 | Stc.Unm | Growth of cubic crystalline phase structure on silicon substrates and devices comprising the cubic crystalline phase structure |
US10164082B2 (en) | 2012-05-04 | 2018-12-25 | Stc.Unm | Growth of cubic crystalline phase structure on silicon substrates and devices comprising the cubic crystalline phase structure |
US10453996B2 (en) | 2012-05-04 | 2019-10-22 | Stc.Unm | Growth of cubic crystalline phase structure on silicon substrates and devices comprising the cubic crystalline phase structure |
US9879357B2 (en) | 2013-03-11 | 2018-01-30 | Tivra Corporation | Methods and systems for thin film deposition processes |
US9487885B2 (en) | 2012-06-14 | 2016-11-08 | Tivra Corporation | Substrate structures and methods |
WO2013188574A2 (en) * | 2012-06-14 | 2013-12-19 | Tivra Corporation | Multilayer substrate structure and method and system of manufacturing the same |
US20150059640A1 (en) * | 2013-08-27 | 2015-03-05 | Raytheon Company | Method for reducing growth of non-uniformities and autodoping during column iii-v growth into dielectric windows |
GB201321949D0 (en) | 2013-12-12 | 2014-01-29 | Ibm | Semiconductor nanowire fabrication |
DE102014205364A1 (de) * | 2014-03-21 | 2015-09-24 | Ihp Gmbh - Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik | Herstellung von Halbleiter-auf-Isolator-Schichtstrukturen |
KR102430501B1 (ko) * | 2015-12-29 | 2022-08-09 | 삼성전자주식회사 | 반도체 단결정구조, 반도체 디바이스 및 그 제조방법 |
US10249492B2 (en) | 2016-05-27 | 2019-04-02 | International Business Machines Corporation | Fabrication of compound semiconductor structures |
US9735010B1 (en) | 2016-05-27 | 2017-08-15 | International Business Machines Corporation | Fabrication of semiconductor fin structures |
WO2021192075A1 (ja) * | 2020-03-25 | 2021-09-30 | 日本電信電話株式会社 | 半導体層の形成方法 |
JPWO2023276107A1 (de) * | 2021-07-01 | 2023-01-05 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1589705A1 (de) * | 1967-11-15 | 1970-04-30 | Itt Ind Gmbh Deutsche | Mehrere elektrische Funktionsstufen enthaltende integrierte Schaltung |
US4110122A (en) * | 1976-05-26 | 1978-08-29 | Massachusetts Institute Of Technology | High-intensity, solid-state-solar cell device |
NL7810549A (nl) * | 1978-10-23 | 1980-04-25 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleider- inrichting. |
JPS6028146B2 (ja) * | 1979-12-12 | 1985-07-03 | 株式会社日立製作所 | 半導体装置の製造方法 |
EP0193830A3 (de) * | 1980-04-10 | 1986-10-01 | Massachusetts Institute Of Technology | Sonnenzellenvorrichtung mit mehreren einzelnen Sonnenzellen |
JPS5961031A (ja) * | 1982-09-30 | 1984-04-07 | Agency Of Ind Science & Technol | 半導体薄膜の製造方法 |
JPS6252963A (ja) * | 1985-09-02 | 1987-03-07 | Fujitsu Ltd | バイポ−ラトランジスタの製造方法 |
JPS6381855A (ja) * | 1986-09-25 | 1988-04-12 | Mitsubishi Electric Corp | ヘテロ接合バイポ−ラトランジスタの製造方法 |
JPS63174366A (ja) * | 1987-01-14 | 1988-07-18 | Fujitsu Ltd | 半導体装置の製造方法 |
-
1988
- 1988-04-05 FR FR8804438A patent/FR2629637B1/fr not_active Expired - Lifetime
-
1989
- 1989-04-04 US US07/333,016 patent/US4999314A/en not_active Expired - Lifetime
- 1989-04-04 DE DE68917504T patent/DE68917504T2/de not_active Expired - Lifetime
- 1989-04-04 EP EP89400917A patent/EP0336831B1/de not_active Expired - Lifetime
- 1989-04-05 JP JP1086704A patent/JP2889589B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0336831A1 (de) | 1989-10-11 |
DE68917504D1 (de) | 1994-09-22 |
US4999314A (en) | 1991-03-12 |
JP2889589B2 (ja) | 1999-05-10 |
FR2629637A1 (fr) | 1989-10-06 |
JPH0210825A (ja) | 1990-01-16 |
FR2629637B1 (fr) | 1990-11-16 |
EP0336831B1 (de) | 1994-08-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: THALES, PARIS, FR |
|
8328 | Change in the person/name/address of the agent |
Representative=s name: BOEHMERT & BOEHMERT, 28209 BREMEN |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: REMOTE ACCESS,LLC, LOS ALTOS, CALIF., US |