DE60140330D1 - Mikrokontaktprüfnadel - Google Patents

Mikrokontaktprüfnadel

Info

Publication number
DE60140330D1
DE60140330D1 DE60140330T DE60140330T DE60140330D1 DE 60140330 D1 DE60140330 D1 DE 60140330D1 DE 60140330 T DE60140330 T DE 60140330T DE 60140330 T DE60140330 T DE 60140330T DE 60140330 D1 DE60140330 D1 DE 60140330D1
Authority
DE
Germany
Prior art keywords
mikrokontaktprüfnadel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60140330T
Other languages
English (en)
Inventor
Toshio Kazama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NHK Spring Co Ltd
Original Assignee
NHK Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26594126&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE60140330(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by NHK Spring Co Ltd filed Critical NHK Spring Co Ltd
Application granted granted Critical
Publication of DE60140330D1 publication Critical patent/DE60140330D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
DE60140330T 2000-06-16 2001-06-15 Mikrokontaktprüfnadel Expired - Lifetime DE60140330D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000181734 2000-06-16
JP2000312088 2000-10-12

Publications (1)

Publication Number Publication Date
DE60140330D1 true DE60140330D1 (de) 2009-12-10

Family

ID=26594126

Family Applications (3)

Application Number Title Priority Date Filing Date
DE60140330T Expired - Lifetime DE60140330D1 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel
DE60139584T Expired - Lifetime DE60139584D1 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer Messfühler
DE60126936T Expired - Lifetime DE60126936T2 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer messfühler

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE60139584T Expired - Lifetime DE60139584D1 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer Messfühler
DE60126936T Expired - Lifetime DE60126936T2 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer messfühler

Country Status (10)

Country Link
US (3) US7057403B2 (de)
EP (3) EP1795906B1 (de)
JP (1) JP4889183B2 (de)
KR (1) KR100745104B1 (de)
CN (1) CN1262842C (de)
AU (1) AU2001264297A1 (de)
DE (3) DE60140330D1 (de)
MY (1) MY134203A (de)
TW (1) TW515889B (de)
WO (1) WO2001096883A2 (de)

Families Citing this family (85)

* Cited by examiner, † Cited by third party
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EP1795906B1 (de) * 2000-06-16 2009-10-28 Nhk Spring Co.Ltd. Mikrokontaktprüfnadel
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Ｉｃソケット
JP4695337B2 (ja) * 2004-02-04 2011-06-08 日本発條株式会社 導電性接触子および導電性接触子ユニット
WO2005083773A1 (ja) * 2004-02-27 2005-09-09 Advantest Corporation プローブカード及びその製造方法
JP4438601B2 (ja) * 2004-10-28 2010-03-24 株式会社ヨコオ 検査ユニットの製法
US7626408B1 (en) * 2005-02-03 2009-12-01 KK Technologies, Inc. Electrical spring probe
EP1959260B1 (de) * 2005-12-05 2019-05-29 NHK Spring Company Limited Prüfkarte
US7393214B2 (en) * 2006-02-17 2008-07-01 Centipede Systems, Inc. High performance electrical connector
JP4522975B2 (ja) * 2006-06-19 2010-08-11 東京エレクトロン株式会社 プローブカード
JP4939879B2 (ja) * 2006-09-13 2012-05-30 株式会社エンプラス 電気接触子、及び、電気部品用ソケット
JPWO2008072699A1 (ja) * 2006-12-15 2010-04-02 日本発條株式会社 導電性接触子ホルダおよび導電性接触子ユニット
US20100123476A1 (en) * 2007-04-27 2010-05-20 Nhk Spring Co., Ltd. Conductive contact
US7521949B2 (en) * 2007-05-07 2009-04-21 Intel Corporation Test pin, method of manufacturing same, and system containing same
CN101315392A (zh) * 2007-05-31 2008-12-03 佛山普立华科技有限公司 探针定位装置
JP4176133B1 (ja) * 2007-06-06 2008-11-05 田中貴金属工業株式会社 プローブピン
JP4986726B2 (ja) * 2007-06-14 2012-07-25 日立オートモティブシステムズ株式会社 可変容量形ポンプ
US7442045B1 (en) * 2007-08-17 2008-10-28 Centipede Systems, Inc. Miniature electrical ball and tube socket with self-capturing multiple-contact-point coupling
TWI426273B (zh) * 2007-12-28 2014-02-11 Mitsubishi Cable Ind Ltd Probe and probe support construction
JP5607934B2 (ja) * 2008-02-01 2014-10-15 日本発條株式会社 プローブユニット
JPWO2009102029A1 (ja) * 2008-02-14 2011-06-16 日本発條株式会社 コンタクトプローブおよびプローブユニット
TWI388839B (zh) * 2008-02-14 2013-03-11 Nhk Spring Co Ltd 探針單元
JP2009250917A (ja) * 2008-04-10 2009-10-29 Nidec-Read Corp 基板検査用治具及び検査用接触子
JP2009281886A (ja) * 2008-05-22 2009-12-03 Toshiba Corp プローブカード
US8610447B2 (en) * 2008-07-18 2013-12-17 Isc Co., Ltd. Spring structure and test socket using thereof
JP2010060310A (ja) * 2008-09-01 2010-03-18 Nidec-Read Corp 基板検査治具及びその電極部
JP2010060527A (ja) * 2008-09-05 2010-03-18 Yokowo Co Ltd グランド用コンタクトプローブを有する検査ユニット
WO2010048971A1 (en) * 2008-10-30 2010-05-06 Verigy (Singapore) Pte., Ltd. Test arrangement, pogo-pin and method for testing a device under test
JP4900843B2 (ja) 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
DE102009004555A1 (de) * 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
JP5657220B2 (ja) * 2009-02-04 2015-01-21 株式会社笠作エレクトロニクス プローブピン用ソケット及びプローブユニット
US7874880B2 (en) * 2009-02-26 2011-01-25 Ironwood Electronics, Inc. Adapter apparatus with sleeve spring contacts
WO2011071082A1 (ja) * 2009-12-11 2011-06-16 日本発條株式会社 コンタクトプローブ
DE102011105036B4 (de) * 2010-06-21 2015-06-18 Caetec Gmbh Steckverbinder für mobiles Messtechnik-Modulsystem
CN101943710A (zh) * 2010-08-23 2011-01-12 安拓锐高新测试技术（苏州）有限公司 一种层叠半导体芯片的测试探针
JP5618729B2 (ja) * 2010-09-24 2014-11-05 シチズンセイミツ株式会社 コンタクトプローブ及びこれを用いた電子回路試験装置
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CN103620419A (zh) 2011-06-22 2014-03-05 名幸电子有限公司 螺旋探针及其制造方法
CN102353821B (zh) * 2011-09-05 2013-06-19 管晓翔 用于热敏电阻分拣的夹持测试机构
KR101582432B1 (ko) * 2011-10-07 2016-01-04 닛폰 하츠죠 가부시키가이샤 프로브 유닛
JP5861423B2 (ja) * 2011-12-06 2016-02-16 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
US9476518B2 (en) * 2012-01-18 2016-10-25 Marshall Excelsior Co. Valve assembly and method
CN102608428B (zh) * 2012-03-16 2014-05-07 国家电线电缆质量监督检验中心 电缆导体直流电阻测试装置
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers
JP6011103B2 (ja) 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
TWI490508B (zh) 2012-12-17 2015-07-01 Princo Corp 軟性測試裝置及其測試方法
CN103913642A (zh) * 2013-01-08 2014-07-09 鸿富锦精密工业（深圳）有限公司 信号测试装置
TWM461790U (zh) * 2013-04-26 2013-09-11 De-Xing Xiao 具弧狀接觸稜線之測試探針
KR102016427B1 (ko) 2013-09-10 2019-09-02 삼성전자주식회사 포고 핀 및 이를 포함하는 프로브 카드
TWI548879B (zh) * 2014-01-28 2016-09-11 Spring sleeve probe
CN104460061B (zh) * 2014-12-09 2018-06-05 京东方科技集团股份有限公司 测试探头及测试设备
US20160216294A1 (en) * 2015-01-27 2016-07-28 Kurt F. Kaashoek Electrical Spring Probe with Stabilization
US9500674B2 (en) * 2015-02-04 2016-11-22 C.C.P. Contact Probes Co., Ltd. Probe structure
US9887478B2 (en) * 2015-04-21 2018-02-06 Varian Semiconductor Equipment Associates, Inc. Thermally insulating electrical contact probe
KR101662951B1 (ko) * 2015-06-14 2016-10-14 김일 푸쉬 플레이트가 있는 프로브 카드
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JP6647075B2 (ja) * 2016-02-19 2020-02-14 日本発條株式会社 合金材料、コンタクトプローブおよび接続端子
KR20190013732A (ko) * 2016-05-31 2019-02-11 니혼덴산리드가부시키가이샤 접촉 도전 지그, 및 검사 장치
WO2017212814A1 (ja) 2016-06-09 2017-12-14 日本電産リード株式会社 検査治具、及び検査装置
CN106569088A (zh) * 2016-09-13 2017-04-19 北京映翰通网络技术股份有限公司 配电网线路故障指示及定位装置
CN106706974B (zh) * 2016-12-23 2019-07-23 深圳市瑞能实业股份有限公司 一种低阻抗接触导电测试电极
JP2018107011A (ja) * 2016-12-27 2018-07-05 株式会社エンプラス 電気接触子及び電気部品用ソケット
JP6961351B2 (ja) * 2017-02-07 2021-11-05 株式会社日本マイクロニクス 治具
JP6892277B2 (ja) * 2017-02-10 2021-06-23 株式会社日本マイクロニクス プローブ及び電気的接続装置
CN110462408B (zh) 2017-03-30 2022-04-12 日本发条株式会社 接触式探针及探针单元
JP6710808B2 (ja) * 2017-03-30 2020-06-17 日本発條株式会社 プローブホルダおよびプローブユニット
CN108241078B (zh) * 2017-05-18 2020-06-02 苏州韬盛电子科技有限公司 垂直探针卡
JP7021874B2 (ja) * 2017-06-28 2022-02-17 株式会社ヨコオ コンタクトプローブ及び検査治具
JP7098886B2 (ja) * 2017-07-04 2022-07-12 日本電産リード株式会社 接触端子、検査治具、及び検査装置
TWI640783B (zh) * 2017-09-15 2018-11-11 中華精測科技股份有限公司 探針卡裝置及其圓形探針
TWI671529B (zh) * 2017-12-22 2019-09-11 馬來西亞商宇騰精密探針集團 具有壓縮性彈簧組件的接觸探針
TWI627412B (zh) * 2017-12-27 2018-06-21 致茂電子股份有限公司 電流探針
KR101999320B1 (ko) * 2018-03-02 2019-10-01 이승용 포고 핀을 포함한 테스트 소켓 및 그 테스트 소켓을 포함한 테스트 장치
WO2019168286A1 (ko) * 2018-03-02 2019-09-06 이승용 테스트 소켓 및 그 테스트 소켓을 포함한 테스트 장치
KR102071479B1 (ko) * 2019-02-07 2020-03-02 이승용 이동 가능한 pcb 커넥터를 포함한 테스트 소켓 및 그 테스트 소켓을 포함한 테스트 장치
WO2019241530A1 (en) 2018-06-14 2019-12-19 Formfactor, Inc. Electrical test probes having decoupled electrical and mechanical design
KR102139946B1 (ko) * 2019-01-23 2020-08-12 주식회사 이노글로벌 테스트 소켓 및 이의 제조방법
US11940465B2 (en) 2019-03-13 2024-03-26 Nhk Spring Co., Ltd. Contact probe and signal transmission method
CN112129975A (zh) * 2019-06-25 2020-12-25 中国探针股份有限公司 电连接组件
US11121511B1 (en) * 2020-03-16 2021-09-14 TE Connectivity Services Gmbh Electrical connector with shielding gasket
JP2021188984A (ja) * 2020-05-28 2021-12-13 株式会社日本マイクロニクス 電気的接触子及び電気的接触子の製造方法
JP7453891B2 (ja) * 2020-10-06 2024-03-21 日本航空電子工業株式会社 電気部品検査器具
CN114487518A (zh) * 2021-12-13 2022-05-13 渭南高新区木王科技有限公司 一种可以独立调节弹簧阻力的双头双动探针
KR102393628B1 (ko) * 2022-01-11 2022-05-04 주식회사 아썸닉스 테스트 핀

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Also Published As

Publication number Publication date
WO2001096883A2 (en) 2001-12-20
DE60139584D1 (de) 2009-09-24
JP2004503783A (ja) 2004-02-05
MY134203A (en) 2007-11-30
TW515889B (en) 2003-01-01
US20030137316A1 (en) 2003-07-24
AU2001264297A1 (en) 2001-12-24
US20090009205A1 (en) 2009-01-08
KR20030014711A (ko) 2003-02-19
US7969170B2 (en) 2011-06-28
KR100745104B1 (ko) 2007-08-01
WO2001096883A3 (en) 2002-06-27
DE60126936D1 (de) 2007-04-12
US20060220666A1 (en) 2006-10-05
CN1436306A (zh) 2003-08-13
JP4889183B2 (ja) 2012-03-07
US7057403B2 (en) 2006-06-06
EP1795906A1 (de) 2007-06-13
EP1290454A2 (de) 2003-03-12
EP1795905B1 (de) 2009-08-12
EP1795905A1 (de) 2007-06-13
EP1795906B1 (de) 2009-10-28
CN1262842C (zh) 2006-07-05
DE60126936T2 (de) 2007-06-14
EP1290454B1 (de) 2007-02-28
US7459922B2 (en) 2008-12-02

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