DE60140330D1 - Mikrokontaktprüfnadel - Google Patents

Mikrokontaktprüfnadel

Info

Publication number
DE60140330D1
DE60140330D1 DE60140330T DE60140330T DE60140330D1 DE 60140330 D1 DE60140330 D1 DE 60140330D1 DE 60140330 T DE60140330 T DE 60140330T DE 60140330 T DE60140330 T DE 60140330T DE 60140330 D1 DE60140330 D1 DE 60140330D1
Authority
DE
Germany
Prior art keywords
mikrokontaktprüfnadel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE60140330T
Other languages
English (en)
Inventor
Toshio Kazama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NHK Spring Co Ltd
Original Assignee
NHK Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
Priority to JP2000181734 priority Critical
Priority to JP2000312088 priority
Application filed by NHK Spring Co Ltd filed Critical NHK Spring Co Ltd
Application granted granted Critical
Publication of DE60140330D1 publication Critical patent/DE60140330D1/de
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26594126&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE60140330(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06772High frequency probes
DE60140330T 2000-06-16 2001-06-15 Mikrokontaktprüfnadel Active DE60140330D1 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000181734 2000-06-16
JP2000312088 2000-10-12

Publications (1)

Publication Number Publication Date
DE60140330D1 true DE60140330D1 (de) 2009-12-10

Family

ID=26594126

Family Applications (3)

Application Number Title Priority Date Filing Date
DE60139584T Active DE60139584D1 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer Messfühler
DE2001626936 Active DE60126936T2 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer messfühler
DE60140330T Active DE60140330D1 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel

Family Applications Before (2)

Application Number Title Priority Date Filing Date
DE60139584T Active DE60139584D1 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer Messfühler
DE2001626936 Active DE60126936T2 (de) 2000-06-16 2001-06-15 Mikrokontaktprüfnadel und elektrischer messfühler

Country Status (9)

Country Link
US (3) US7057403B2 (de)
EP (3) EP1290454B1 (de)
JP (1) JP4889183B2 (de)
KR (1) KR100745104B1 (de)
CN (1) CN1262842C (de)
AU (1) AU6429701A (de)
DE (3) DE60139584D1 (de)
TW (1) TW515889B (de)
WO (1) WO2001096883A2 (de)

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4889183B2 (ja) 2000-06-16 2012-03-07 日本発條株式会社 マイクロコンタクタプローブと電気プローブユニット
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Icソケット
JP4695337B2 (ja) * 2004-02-04 2011-06-08 日本発條株式会社 導電性接触子および導電性接触子ユニット
WO2005083773A1 (ja) * 2004-02-27 2005-09-09 Advantest Corporation プローブカード及びその製造方法
JP4438601B2 (ja) * 2004-10-28 2010-03-24 株式会社ヨコオ 検査ユニットの製法
US7626408B1 (en) * 2005-02-03 2009-12-01 KK Technologies, Inc. Electrical spring probe
JP5289771B2 (ja) * 2005-12-05 2013-09-11 日本発條株式会社 プローブカード
US7393214B2 (en) * 2006-02-17 2008-07-01 Centipede Systems, Inc. High performance electrical connector
JP4522975B2 (ja) * 2006-06-19 2010-08-11 東京エレクトロン株式会社 プローブカード
JP4939879B2 (ja) * 2006-09-13 2012-05-30 株式会社エンプラス 電気接触子、及び、電気部品用ソケット
KR101077239B1 (ko) * 2006-12-15 2011-10-27 니혼 하츠쵸 가부시키가이샤 도전성 접촉자 홀더 및 도전성 접촉자 유닛
JP5713559B2 (ja) * 2007-04-27 2015-05-07 日本発條株式会社 導電性接触子
US7521949B2 (en) * 2007-05-07 2009-04-21 Intel Corporation Test pin, method of manufacturing same, and system containing same
CN101315392A (zh) * 2007-05-31 2008-12-03 佛山普立华科技有限公司 探针定位装置
JP4176133B1 (ja) * 2007-06-06 2008-11-05 田中貴金属工業株式会社 プローブピン
JP4986726B2 (ja) * 2007-06-14 2012-07-25 日立オートモティブシステムズ株式会社 可変容量形ポンプ
US7442045B1 (en) * 2007-08-17 2008-10-28 Centipede Systems, Inc. Miniature electrical ball and tube socket with self-capturing multiple-contact-point coupling
KR20100109889A (ko) * 2007-12-28 2010-10-11 미츠비시 덴센 고교 가부시키가이샤 프로브 핀
JP5607934B2 (ja) * 2008-02-01 2014-10-15 日本発條株式会社 プローブユニット
WO2009102029A1 (ja) * 2008-02-14 2009-08-20 Nhk Spring Co., Ltd. コンタクトプローブおよびプローブユニット
JP5394264B2 (ja) * 2008-02-14 2014-01-22 日本発條株式会社 プローブユニット
JP2009250917A (ja) * 2008-04-10 2009-10-29 Nidec-Read Corp 基板検査用治具及び検査用接触子
JP2009281886A (ja) * 2008-05-22 2009-12-03 Toshiba Corp プローブカード
WO2010008257A2 (ko) * 2008-07-18 2010-01-21 Lee Jae Hak 스프링 조립체 및 그를 이용한 테스트 소켓
JP2010060310A (ja) * 2008-09-01 2010-03-18 Nidec-Read Corp 基板検査治具及びその電極部
JP2010060527A (ja) * 2008-09-05 2010-03-18 Yokowo Co Ltd グランド用コンタクトプローブを有する検査ユニット
WO2010048971A1 (en) * 2008-10-30 2010-05-06 Verigy (Singapore) Pte., Ltd. Test arrangement, pogo-pin and method for testing a device under test
JP4900843B2 (ja) 2008-12-26 2012-03-21 山一電機株式会社 半導体装置用電気接続装置及びそれに使用されるコンタクト
DE102009004555A1 (de) * 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
JP5657220B2 (ja) * 2009-02-04 2015-01-21 株式会社笠作エレクトロニクス プローブピン用ソケット及びプローブユニット
US7874880B2 (en) * 2009-02-26 2011-01-25 Ironwood Electronics, Inc. Adapter apparatus with sleeve spring contacts
WO2011071082A1 (ja) * 2009-12-11 2011-06-16 日本発條株式会社 コンタクトプローブ
DE102011105036B4 (de) * 2010-06-21 2015-06-18 Caetec Gmbh Steckverbinder für mobiles Messtechnik-Modulsystem
CN101943710A (zh) * 2010-08-23 2011-01-12 安拓锐高新测试技术(苏州)有限公司 一种层叠半导体芯片的测试探针
JP5618729B2 (ja) * 2010-09-24 2014-11-05 シチズンセイミツ株式会社 コンタクトプローブ及びこれを用いた電子回路試験装置
DE102011004106A1 (de) * 2010-12-28 2012-06-28 Robert Bosch Gmbh Leiterplatte, Verfahren zum Herstellen einer Leiterplatte und Prüfvorrichtung zum Prüfen einer Leiterplatte
TW201231977A (en) * 2011-01-20 2012-08-01 Pleader Yamaichi Co Ltd Structure of high-frequency vertical spring plate probe card
US20120274338A1 (en) * 2011-04-29 2012-11-01 International Business Machines Corporation High performance time domain reflectometry
EP2725364A1 (de) 2011-06-22 2014-04-30 Meiko Electronics Co., Ltd. Spiralsonde und herstellungsverfahren dafür
CN102353821B (zh) * 2011-09-05 2013-06-19 管晓翔 用于热敏电阻分拣的夹持测试机构
WO2013051675A1 (ja) * 2011-10-07 2013-04-11 日本発條株式会社 プローブユニット
JP5861423B2 (ja) * 2011-12-06 2016-02-16 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
US9476518B2 (en) * 2012-01-18 2016-10-25 Marshall Excelsior Co. Valve assembly and method
CN102608428B (zh) * 2012-03-16 2014-05-07 国家电线电缆质量监督检验中心 电缆导体直流电阻测试装置
US8373430B1 (en) * 2012-05-06 2013-02-12 Jerzy Roman Sochor Low inductance contact probe with conductively coupled plungers
JP6011103B2 (ja) 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
TWI490508B (zh) 2012-12-17 2015-07-01 Princo Corp 軟性測試裝置及其測試方法
CN103913642A (zh) * 2013-01-08 2014-07-09 鸿富锦精密工业(深圳)有限公司 信号测试装置
TWM461790U (zh) * 2013-04-26 2013-09-11 De-Xing Xiao 具弧狀接觸稜線之測試探針
KR102016427B1 (ko) 2013-09-10 2019-09-02 삼성전자주식회사 포고 핀 및 이를 포함하는 프로브 카드
TWI548879B (zh) * 2014-01-28 2016-09-11 Spring sleeve probe
CN104460061B (zh) * 2014-12-09 2018-06-05 京东方科技集团股份有限公司 测试探头及测试设备
US20160216294A1 (en) * 2015-01-27 2016-07-28 Kurt F. Kaashoek Electrical Spring Probe with Stabilization
US9500674B2 (en) * 2015-02-04 2016-11-22 C.C.P. Contact Probes Co., Ltd. Probe structure
US9887478B2 (en) 2015-04-21 2018-02-06 Varian Semiconductor Equipment Associates, Inc. Thermally insulating electrical contact probe
KR101662951B1 (ko) * 2015-06-14 2016-10-14 김일 푸쉬 플레이트가 있는 프로브 카드
JP2017142080A (ja) * 2016-02-08 2017-08-17 日本電産リード株式会社 接触端子、検査治具、及び検査装置
JPWO2017208690A1 (ja) * 2016-05-31 2019-03-28 日本電産リード株式会社 接触導電治具、及び検査装置
KR20190017736A (ko) 2016-06-09 2019-02-20 니혼덴산리드가부시키가이샤 검사 지그, 및 검사 장치
CN106569088A (zh) * 2016-09-13 2017-04-19 北京映翰通网络技术股份有限公司 配电网线路故障指示及定位装置
CN106706974B (zh) * 2016-12-23 2019-07-23 深圳市瑞能实业股份有限公司 一种低阻抗接触导电测试电极
JP2018107011A (ja) * 2016-12-27 2018-07-05 株式会社エンプラス 電気接触子及び電気部品用ソケット
JP2018128301A (ja) * 2017-02-07 2018-08-16 株式会社日本マイクロニクス 治具
JP2018128404A (ja) * 2017-02-10 2018-08-16 株式会社日本マイクロニクス プローブ及び電気的接続装置
CN108241078B (zh) * 2017-05-18 2020-06-02 苏州韬盛电子科技有限公司 垂直探针卡
TWI640783B (zh) * 2017-09-15 2018-11-11 中華精測科技股份有限公司 探針卡裝置及其圓形探針
TWI671529B (zh) * 2017-12-22 2019-09-11 馬來西亞商宇騰精密探針集團 具有壓縮性彈簧組件的接觸探針
TWI627412B (zh) * 2017-12-27 2018-06-21 致茂電子股份有限公司 電流探針
KR101999320B1 (ko) * 2018-03-02 2019-10-01 이승용 포고 핀을 포함한 테스트 소켓 및 그 테스트 소켓을 포함한 테스트 장치
WO2019168286A1 (ko) * 2018-03-02 2019-09-06 이승용 테스트 소켓 및 그 테스트 소켓을 포함한 테스트 장치
KR102139946B1 (ko) * 2019-01-23 2020-08-12 주식회사 이노글로벌 테스트 소켓 및 이의 제조방법
KR102071479B1 (ko) * 2019-02-07 2020-03-02 이승용 이동 가능한 pcb 커넥터를 포함한 테스트 소켓 및 그 테스트 소켓을 포함한 테스트 장치

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5493766U (de) 1977-12-16 1979-07-03
US4528500A (en) * 1980-11-25 1985-07-09 Lightbody James D Apparatus and method for testing circuit boards
US4724383A (en) * 1985-05-03 1988-02-09 Testsystems, Inc. PC board test fixture
DE8812068U1 (de) * 1987-10-09 1989-02-16 Feinmetall Gmbh, 7033 Herrenberg, De
DE3820795C2 (de) * 1988-06-20 1991-04-25 Ingun Pruefmittelbau Gmbh, 7750 Konstanz, De
EP0462706A1 (de) * 1990-06-11 1991-12-27 ITT INDUSTRIES, INC. (a Delaware corporation) Kontaktanordnung
US5157325A (en) * 1991-02-15 1992-10-20 Compaq Computer Corporation Compact, wireless apparatus for electrically testing printed circuit boards
US5576631A (en) * 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US5420519A (en) * 1992-03-10 1995-05-30 Virginia Panel Corporation Double-headed spring contact probe assembly
US6150616A (en) * 1996-04-12 2000-11-21 Nhk Spring Co., Ltd. Electroconductive contact unit system
JP3634074B2 (ja) * 1996-06-28 2005-03-30 日本発条株式会社 導電性接触子
JP3414593B2 (ja) * 1996-06-28 2003-06-09 日本発条株式会社 導電性接触子
JP3326095B2 (ja) * 1996-12-27 2002-09-17 日本発条株式会社 導電性接触子
JPH10214649A (ja) * 1997-01-30 1998-08-11 Yokowo Co Ltd スプリングコネクタおよび該スプリングコネクタを用いた装置
US6396293B1 (en) * 1999-02-18 2002-05-28 Delaware Capital Formation, Inc. Self-closing spring probe
US6462567B1 (en) 1999-02-18 2002-10-08 Delaware Capital Formation, Inc. Self-retained spring probe
JP3527724B2 (ja) * 1999-11-17 2004-05-17 株式会社アドバンテスト Icソケット及びic試験装置
JP2001255340A (ja) * 2000-03-13 2001-09-21 Yokowo Co Ltd コンタクトプローブ及び該コンタクトプローブを設けたicパッケージ検査用ソケット
JP4889183B2 (ja) 2000-06-16 2012-03-07 日本発條株式会社 マイクロコンタクタプローブと電気プローブユニット

Also Published As

Publication number Publication date
EP1290454A2 (de) 2003-03-12
DE60126936T2 (de) 2007-06-14
EP1795905B1 (de) 2009-08-12
JP4889183B2 (ja) 2012-03-07
US7969170B2 (en) 2011-06-28
US7459922B2 (en) 2008-12-02
KR100745104B1 (ko) 2007-08-01
TW515889B (en) 2003-01-01
EP1795905A1 (de) 2007-06-13
CN1262842C (zh) 2006-07-05
WO2001096883A2 (en) 2001-12-20
US20090009205A1 (en) 2009-01-08
WO2001096883A3 (en) 2002-06-27
US20060220666A1 (en) 2006-10-05
AU6429701A (en) 2001-12-24
EP1290454B1 (de) 2007-02-28
DE60139584D1 (de) 2009-09-24
DE60126936D1 (de) 2007-04-12
JP2004503783A (ja) 2004-02-05
KR20030014711A (ko) 2003-02-19
US7057403B2 (en) 2006-06-06
CN1436306A (zh) 2003-08-13
EP1795906A1 (de) 2007-06-13
US20030137316A1 (en) 2003-07-24
EP1795906B1 (de) 2009-10-28

Similar Documents

Publication Publication Date Title
DK1226127T3 (da) Substituerede phenylsulfamoylcarboxamider
DE50103222D1 (de) Kieselsäureester-mischungen
DE60123789D1 (de) Verformbarer gegenstand
DE60230148D1 (de) Verbesserte applanationslinse
DE60139338D1 (de) Bioprothetisches herzklappensystem
DE60136478D1 (de) Chstaben.
DE60235961D1 (de) Aktion
DE60135144D1 (de) Verbinder
DE60144434D1 (de) Mehrfach-induzierbares genregulierungssystem
DE60104475D1 (de) Verbinder
DE60144474D1 (de) Variabler modenmittler
DE60143422D1 (de) Verbinder
DE50100900D1 (de) Fixierelement
AT274321T (de) Perkolationsvorrichtung
AT298528T (de) Mikroklingeanordungsaufprallapplikator
AT302569T (de) Schädelkalottenfixiereinrichtung
AT294053T (de) Strukturverbaupanele
AT252099T (de) Biarylcarboxamide
AT303787T (de) Schergelzusammensetzungen
AT303664T (de) Lichtleitfaserverbindungsgehäuse
AT314248T (de) Fahrradantriebsnabe
AT315441T (de) Flüssigkeitssprühgeräte
AT311218T (de) Tracheostomiedilatator
AT315115T (de) Teilorientiertes polytrimethylenterephthalatgarn
DE60116267D1 (de) Positionierung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition