DE60019191D1 - Nichtflüchtige ferroelektrische Speicheranordnung - Google Patents

Nichtflüchtige ferroelektrische Speicheranordnung

Info

Publication number
DE60019191D1
DE60019191D1 DE60019191T DE60019191T DE60019191D1 DE 60019191 D1 DE60019191 D1 DE 60019191D1 DE 60019191 T DE60019191 T DE 60019191T DE 60019191 T DE60019191 T DE 60019191T DE 60019191 D1 DE60019191 D1 DE 60019191D1
Authority
DE
Germany
Prior art keywords
memory device
ferroelectric memory
volatile ferroelectric
volatile
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
DE60019191T
Other languages
English (en)
Other versions
DE60019191T2 (de
Inventor
Hiroshi Ishiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Technology Academic Research Center
Original Assignee
Semiconductor Technology Academic Research Center
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Technology Academic Research Center filed Critical Semiconductor Technology Academic Research Center
Publication of DE60019191D1 publication Critical patent/DE60019191D1/de
Application granted granted Critical
Publication of DE60019191T2 publication Critical patent/DE60019191T2/de
Anticipated expiration legal-status Critical
Withdrawn - After Issue legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/223—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using MOS with ferroelectric gate insulating film
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/221—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using ferroelectric capacitors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225—Auxiliary circuits
    • G11C11/2273—Reading or sensing circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
    • G11C11/225—Auxiliary circuits
    • G11C11/2275—Writing or programming circuits or methods
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
DE60019191T 1999-05-19 2000-05-03 Nichtflüchtige ferroelektrische Speicheranordnung Withdrawn - After Issue DE60019191T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP13851599A JP3377762B2 (ja) 1999-05-19 1999-05-19 強誘電体不揮発性メモリ
JP13851599 1999-05-19

Publications (2)

Publication Number Publication Date
DE60019191D1 true DE60019191D1 (de) 2005-05-12
DE60019191T2 DE60019191T2 (de) 2006-03-09

Family

ID=15223961

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60019191T Withdrawn - After Issue DE60019191T2 (de) 1999-05-19 2000-05-03 Nichtflüchtige ferroelektrische Speicheranordnung

Country Status (6)

Country Link
US (2) US6327172B1 (de)
EP (2) EP1473736A3 (de)
JP (1) JP3377762B2 (de)
KR (1) KR100355779B1 (de)
DE (1) DE60019191T2 (de)
TW (1) TW454338B (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10031947B4 (de) * 2000-06-30 2006-06-14 Infineon Technologies Ag Schaltungsanordnung zum Ausgleich unterschiedlicher Spannungen auf Leitungszügen in integrierten Halbleiterschaltungen
US6720596B2 (en) 2000-10-17 2004-04-13 Matsushita Electric Industrial Co., Ltd. Semiconductor device and method for driving the same
JP2002203913A (ja) * 2000-12-28 2002-07-19 Hitachi Ltd 半導体記憶装置の製造方法および半導体記憶装置
JP3522248B2 (ja) * 2001-10-15 2004-04-26 ローム株式会社 半導体集積回路装置
JP3740577B2 (ja) * 2001-12-20 2006-02-01 松下電器産業株式会社 負電位発生回路、負電位発生装置及びこれを用いた半導体装置
JP2003209179A (ja) * 2002-01-15 2003-07-25 Fujitsu Ltd 容量素子及びその製造方法
JP2003263886A (ja) * 2002-03-08 2003-09-19 Fujitsu Ltd ビット線容量を最適化できる強誘電体メモリ
DE102004011432A1 (de) * 2004-03-09 2005-09-29 Infineon Technologies Ag Halbleiterspeicherzelle, Verfahren zu deren Herstellung und Halbleiterspeichereinrichtung
KR100660901B1 (ko) * 2005-12-22 2006-12-26 삼성전자주식회사 단일 게이트 구조를 갖는 이이피롬, 상기 이이피롬의동작방법 및 상기 이이피롬의 제조방법
FR2904464A1 (fr) 2006-07-27 2008-02-01 St Microelectronics Sa Circuit eeprom de retention de charges pour mesure temporelle
FR2904463A1 (fr) * 2006-07-27 2008-02-01 St Microelectronics Sa Programmation d'un circuit de retention de charges pour mesure temporelle
JP5371752B2 (ja) 2006-07-27 2013-12-18 エス テ マイクロエレクトロニクス エス アー 時間測定のための電荷保持要素を読み取る回路
WO2008012459A2 (fr) * 2006-07-27 2008-01-31 Stmicroelectronics Sa Circuit de retention de charges pour mesure temporelle
US7991041B2 (en) * 2006-11-15 2011-08-02 Qualcomm, Incorporated Iterative detection and cancellation for wireless communication
US8781043B2 (en) * 2006-11-15 2014-07-15 Qualcomm Incorporated Successive equalization and cancellation and successive mini multi-user detection for wireless communication
US7700985B2 (en) * 2008-06-24 2010-04-20 Seagate Technology Llc Ferroelectric memory using multiferroics
WO2011063567A1 (en) 2009-11-27 2011-06-03 Qualcomm Incorporated Interference cancellation for non-orthogonal channel sets
US8867256B2 (en) * 2012-09-25 2014-10-21 Palo Alto Research Center Incorporated Systems and methods for writing and non-destructively reading ferroelectric memories
US20160005749A1 (en) * 2014-07-01 2016-01-07 Qualcomm Incorporated Series ferroelectric negative capacitor for multiple time programmable (mtp) devices
US11088170B2 (en) 2019-11-25 2021-08-10 Sandisk Technologies Llc Three-dimensional ferroelectric memory array including integrated gate selectors and methods of forming the same
US11335391B1 (en) 2020-10-30 2022-05-17 Ferroelectric Memory Gmbh Memory cell arrangement and method thereof
US11527551B2 (en) * 2020-10-30 2022-12-13 Ferroelectric Memory Gmbh Memory cell arrangements and methods thereof
US11380695B2 (en) 2020-10-30 2022-07-05 Ferroelectric Memory Gmbh Memory cell arrangement and method thereof
WO2022094814A1 (zh) * 2020-11-04 2022-05-12 华为技术有限公司 一种铁电存储器及存储设备
US20230326923A1 (en) * 2021-11-01 2023-10-12 KYOCERA AVX Components Corporation Combined MOS/MIS Capacitor Assembly

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2788265B2 (ja) 1988-07-08 1998-08-20 オリンパス光学工業株式会社 強誘電体メモリ及びその駆動方法，製造方法
JP3021614B2 (ja) 1990-11-06 2000-03-15 オリンパス光学工業株式会社 メモリ素子
US5523964A (en) * 1994-04-07 1996-06-04 Symetrix Corporation Ferroelectric non-volatile memory unit
JPH07122661A (ja) 1993-10-27 1995-05-12 Olympus Optical Co Ltd 強誘電体メモリ装置
WO1995026570A1 (fr) 1994-03-29 1995-10-05 Olympus Optical Co., Ltd. Dispositif a memoire ferro-electrique
JPH08180673A (ja) 1994-12-27 1996-07-12 Nec Corp 強誘電体メモリセル及びそのアクセス装置
KR100218275B1 (ko) * 1997-05-09 1999-09-01 윤종용 벌크형 1트랜지스터 구조의 강유전체 메모리소자
JPH1117123A (ja) 1997-06-23 1999-01-22 Rohm Co Ltd 不揮発性記憶素子
JPH1117112A (ja) 1997-06-24 1999-01-22 Oki Electric Ind Co Ltd 半導体集積回路のチップレイアウト方法
JP3495905B2 (ja) * 1998-02-19 2004-02-09 シャープ株式会社 半導体記憶装置
US6046929A (en) * 1998-04-06 2000-04-04 Fujitsu Limited Memory device with two ferroelectric capacitors per one cell
US6198652B1 (en) * 1998-04-13 2001-03-06 Kabushiki Kaisha Toshiba Non-volatile semiconductor integrated memory device

Also Published As

Publication number Publication date
EP1054406B1 (de) 2005-04-06
DE60019191T2 (de) 2006-03-09
TW454338B (en) 2001-09-11
EP1054406A3 (de) 2001-01-17
EP1473736A2 (de) 2004-11-03
KR100355779B1 (ko) 2002-10-19
KR20000077182A (ko) 2000-12-26
US20020012264A1 (en) 2002-01-31
US6327172B1 (en) 2001-12-04
JP3377762B2 (ja) 2003-02-17
EP1054406A2 (de) 2000-11-22
US6584008B2 (en) 2003-06-24
EP1473736A3 (de) 2006-10-04
JP2000331484A (ja) 2000-11-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8330 Complete renunciation