DE60126383D1 - Nichtflüchtige Halbleiterspeicheranordnung - Google Patents

Nichtflüchtige Halbleiterspeicheranordnung

Info

Publication number
DE60126383D1
DE60126383D1 DE60126383T DE60126383T DE60126383D1 DE 60126383 D1 DE60126383 D1 DE 60126383D1 DE 60126383 T DE60126383 T DE 60126383T DE 60126383 T DE60126383 T DE 60126383T DE 60126383 D1 DE60126383 D1 DE 60126383D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
volatile semiconductor
volatile
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60126383T
Other languages
English (en)
Other versions
DE60126383T2 (de
Inventor
Takahiro Saeki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Application granted granted Critical
Publication of DE60126383D1 publication Critical patent/DE60126383D1/de
Publication of DE60126383T2 publication Critical patent/DE60126383T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3431—Circuits or methods to detect disturbed nonvolatile memory cells, e.g. which still read as programmed but with threshold less than the program verify threshold or read as erased but with threshold greater than the erase verify threshold, and to reverse the disturbance via a refreshing programming or erasing step
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents
DE60126383T 2000-08-23 2001-08-23 Nichtflüchtige Halbleiterspeicheranordnung Expired - Lifetime DE60126383T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000253194A JP2002074999A (ja) 2000-08-23 2000-08-23 不揮発性半導体記憶装置
JP2000253194 2000-08-23

Publications (2)

Publication Number Publication Date
DE60126383D1 true DE60126383D1 (de) 2007-03-22
DE60126383T2 DE60126383T2 (de) 2007-10-31

Family

ID=18742325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60126383T Expired - Lifetime DE60126383T2 (de) 2000-08-23 2001-08-23 Nichtflüchtige Halbleiterspeicheranordnung

Country Status (6)

Country Link
US (1) US6483745B2 (de)
EP (1) EP1182669B1 (de)
JP (1) JP2002074999A (de)
KR (1) KR100465122B1 (de)
DE (1) DE60126383T2 (de)
TW (1) TW522400B (de)

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JP4260434B2 (ja) 2002-07-16 2009-04-30 富士通マイクロエレクトロニクス株式会社 不揮発性半導体メモリ及びその動作方法
JP2004103089A (ja) * 2002-09-06 2004-04-02 Sharp Corp 不揮発性半導体記憶装置およびその再書き込み方法
JP3820230B2 (ja) * 2003-03-07 2006-09-13 インターナショナル・ビジネス・マシーンズ・コーポレーション 情報処理装置並びに省電力方法及びプログラム
EP1473739A1 (de) * 2003-04-29 2004-11-03 Dialog Semiconductor GmbH Flash-Speicher mit Datenverlust-Früherkennung
US7699232B2 (en) 2004-02-06 2010-04-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US7663473B2 (en) * 2004-02-12 2010-02-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, IC card, IC tag, RFID, transponder, bills, securities, passport, electronic apparatus, bag, and clothes
JP2005321658A (ja) * 2004-05-10 2005-11-17 International Display Technology Kk 回路検査方法、液晶表示装置の製造方法および回路検査装置
JP2005353110A (ja) * 2004-06-08 2005-12-22 Nec Electronics Corp 不揮発性メモリ装置
KR100697776B1 (ko) 2005-06-07 2007-03-20 주식회사 유니테스트 반도체 테스트 장치
JP4796360B2 (ja) * 2005-09-07 2011-10-19 富士通セミコンダクター株式会社 冗長置換方法、半導体記憶装置及び情報処理装置
JP2007317170A (ja) * 2006-04-28 2007-12-06 Renesas Technology Corp Ｉｃモジュールおよび携帯電話
US7286409B1 (en) 2006-05-09 2007-10-23 Macronix International Co., Ltd. Method and apparatus to improve nonvolatile memory data retention
US8000134B2 (en) 2006-05-15 2011-08-16 Apple Inc. Off-die charge pump that supplies multiple flash devices
US7511646B2 (en) 2006-05-15 2009-03-31 Apple Inc. Use of 8-bit or higher A/D for NAND cell value
US7568135B2 (en) 2006-05-15 2009-07-28 Apple Inc. Use of alternative value in cell detection
US7701797B2 (en) 2006-05-15 2010-04-20 Apple Inc. Two levels of voltage regulation supplied for logic and data programming voltage of a memory device
US7551486B2 (en) 2006-05-15 2009-06-23 Apple Inc. Iterative memory cell charging based on reference cell value
US7852690B2 (en) 2006-05-15 2010-12-14 Apple Inc. Multi-chip package for a flash memory
US7639542B2 (en) 2006-05-15 2009-12-29 Apple Inc. Maintenance operations for multi-level data storage cells
US7639531B2 (en) 2006-05-15 2009-12-29 Apple Inc. Dynamic cell bit resolution
US7613043B2 (en) 2006-05-15 2009-11-03 Apple Inc. Shifting reference values to account for voltage sag
US7911834B2 (en) 2006-05-15 2011-03-22 Apple Inc. Analog interface for a flash memory die
KR100830580B1 (ko) 2006-10-20 2008-05-21 삼성전자주식회사 플래시 메모리 장치를 포함한 메모리 시스템의 데이터 복원방법
US7580302B2 (en) * 2006-10-23 2009-08-25 Macronix International Co., Ltd. Parallel threshold voltage margin search for MLC memory application
JP5145720B2 (ja) 2007-01-31 2013-02-20 富士通セミコンダクター株式会社 チャージロス修復方法及び半導体記憶装置
US7663926B2 (en) * 2007-07-27 2010-02-16 Micron Technology, Inc. Cell deterioration warning apparatus and method
US7646643B1 (en) * 2008-01-07 2010-01-12 Lattice Semiconductor Corporation Process charging monitor for nonvolatile memory
US8102713B2 (en) * 2008-08-04 2012-01-24 Triune Ip Llc Non-volatile memory monitor
KR101588293B1 (ko) * 2009-02-17 2016-01-26 삼성전자주식회사 비휘발성 메모리 장치의 읽기 방법
CN101615145B (zh) * 2009-07-24 2011-12-07 中兴通讯股份有限公司 一种提高存储器数据缓存可靠性的方法和装置
US8228753B2 (en) 2009-07-29 2012-07-24 Stec, Inc. System and method of maintaining data integrity in a flash storage device
JP5039193B2 (ja) * 2010-09-22 2012-10-03 株式会社東芝 半導体記憶装置および制御方法
US8649215B2 (en) * 2010-12-22 2014-02-11 HGST Netherlands B.V. Data management in flash memory using probability of charge disturbances
FR2977047B1 (fr) * 2011-06-22 2013-08-16 Starchip Procede de gestion de l'endurance de memoires non volatiles.
US10885583B2 (en) * 2013-12-19 2021-01-05 Chicago Mercantile Exchange Inc. Deterministic and efficient message packet management
US9720769B2 (en) 2014-12-03 2017-08-01 Sandisk Technologies Llc Storage parameters for a data storage device
US9983820B2 (en) 2016-03-29 2018-05-29 Nxp B.V. Method for performing data updates
US10832793B2 (en) * 2018-08-21 2020-11-10 Micron Technology, Inc. Defective memory cell detection circuitry including use in automotive control systems
DE102019203351A1 (de) * 2019-03-12 2020-09-17 Robert Bosch Gmbh Verfahren und Vorrichtung zum Betreiben einer nichtflüchtigen Speichereinrichtung
US11204883B1 (en) * 2020-06-22 2021-12-21 Seagate Technology Llc Data storage system with access completion uniformity
US11640252B2 (en) 2021-03-18 2023-05-02 Western Digital Technologies, Inc. Idle-power mitigation circuit
FR3138536A1 (fr) * 2022-07-28 2024-02-02 Idemia Identity & Security France Procédé de gestion d’une mémoire d’un élément sécurisé

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JP2509297B2 (ja) * 1987-08-31 1996-06-19 沖電気工業株式会社 自己訂正機能付半導体記憶装置及びマイクロコンピュ―タ
US5657332A (en) * 1992-05-20 1997-08-12 Sandisk Corporation Soft errors handling in EEPROM devices
JP3450456B2 (ja) * 1994-08-31 2003-09-22 株式会社東芝 半導体記憶装置
FR2728380A1 (fr) * 1994-12-20 1996-06-21 Sgs Thomson Microelectronics Procede d'ecriture de donnees dans une memoire et memoire electriquement programmable correspondante
JPH08190796A (ja) 1995-01-09 1996-07-23 Mitsubishi Denki Semiconductor Software Kk データリフレッシュ機能を有するフラッシュメモリ及びフラッシュメモリのデータリフレッシュ方法
US5835413A (en) * 1996-12-20 1998-11-10 Intel Corporation Method for improved data retention in a nonvolatile writeable memory by sensing and reprogramming cell voltage levels
US6108241A (en) * 1999-07-01 2000-08-22 Micron Technology, Inc. Leakage detection in flash memory cell

Also Published As

Publication number Publication date
KR100465122B1 (ko) 2005-01-05
US20020024844A1 (en) 2002-02-28
DE60126383T2 (de) 2007-10-31
US6483745B2 (en) 2002-11-19
TW522400B (en) 2003-03-01
JP2002074999A (ja) 2002-03-15
EP1182669A3 (de) 2003-04-02
EP1182669A2 (de) 2002-02-27
EP1182669B1 (de) 2007-01-31
KR20020015981A (ko) 2002-03-02

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Legal Events

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