DE60122045D1 - Nichtflüchtige Halbleiterspeicheranordnung - Google Patents

Nichtflüchtige Halbleiterspeicheranordnung

Info

Publication number
DE60122045D1
DE60122045D1 DE60122045T DE60122045T DE60122045D1 DE 60122045 D1 DE60122045 D1 DE 60122045D1 DE 60122045 T DE60122045 T DE 60122045T DE 60122045 T DE60122045 T DE 60122045T DE 60122045 D1 DE60122045 D1 DE 60122045D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
volatile semiconductor
volatile
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60122045T
Other languages
English (en)
Other versions
DE60122045T2 (de
Inventor
Hidekazu Takata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Application granted granted Critical
Publication of DE60122045D1 publication Critical patent/DE60122045D1/de
Publication of DE60122045T2 publication Critical patent/DE60122045T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/22—Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Read Only Memory (AREA)
  • Storage Device Security (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
DE60122045T 2000-03-29 2001-03-28 Nichtflüchtige Halbleiterspeicheranordnung Expired - Lifetime DE60122045T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000092522 2000-03-29
JP2000092522A JP2001283594A (ja) 2000-03-29 2000-03-29 不揮発性半導体記憶装置

Publications (2)

Publication Number Publication Date
DE60122045D1 true DE60122045D1 (de) 2006-09-21
DE60122045T2 DE60122045T2 (de) 2007-02-15

Family

ID=18607846

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60122045T Expired - Lifetime DE60122045T2 (de) 2000-03-29 2001-03-28 Nichtflüchtige Halbleiterspeicheranordnung

Country Status (6)

Country Link
US (1) US6469928B2 (de)
EP (1) EP1143455B1 (de)
JP (1) JP2001283594A (de)
KR (1) KR100392301B1 (de)
DE (1) DE60122045T2 (de)
TW (1) TW497103B (de)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030056396A (ko) * 2001-12-28 2003-07-04 주식회사 하이닉스반도체 읽기/쓰기 방지 기능이 있는 비휘발성 메모리 장치
ITUD20020175A1 (it) * 2002-08-06 2004-02-07 Misa Srl Dispositivo elettronico di supporto per la memorizzazione di dati
JP4101583B2 (ja) * 2002-08-08 2008-06-18 富士通株式会社 消去動作時間を短縮したフラッシュメモリ
ITRM20030039A1 (it) * 2003-01-30 2004-07-31 Micron Technology Inc Sblocco di registro di protezione per chip.
JP2004265162A (ja) * 2003-03-03 2004-09-24 Renesas Technology Corp 記憶装置およびアドレス管理方法
KR100558486B1 (ko) * 2003-07-14 2006-03-07 삼성전자주식회사 비휘발성 반도체 메모리 장치 및 이 장치의 원 타임프로그래밍 제어방법
FR2859041A1 (fr) * 2003-08-18 2005-02-25 St Microelectronics Sa Circuit memoire a memoire non volatile d'identification et procede associe
JP4860160B2 (ja) 2004-02-10 2012-01-25 株式会社半導体エネルギー研究所 半導体装置
KR100719378B1 (ko) * 2006-02-16 2007-05-17 삼성전자주식회사 빠른 랜덤 액세스 기능을 갖는 플래시 메모리 장치 및그것을 포함한 컴퓨팅 시스템
US7746686B2 (en) * 2006-04-21 2010-06-29 Honeywell International Inc. Partitioned random access and read only memory
US7723601B2 (en) * 2007-03-22 2010-05-25 Qualcomm Incorporated Shared buffer management for processing audio files
US8429352B2 (en) 2007-06-08 2013-04-23 Sandisk Technologies Inc. Method and system for memory block flushing
US8473669B2 (en) * 2009-12-07 2013-06-25 Sandisk Technologies Inc. Method and system for concurrent background and foreground operations in a non-volatile memory array
US8452911B2 (en) 2010-09-30 2013-05-28 Sandisk Technologies Inc. Synchronized maintenance operations in a multi-bank storage system
US8762627B2 (en) 2011-12-21 2014-06-24 Sandisk Technologies Inc. Memory logical defragmentation during garbage collection
US9471812B2 (en) * 2012-03-06 2016-10-18 Freescale Semiconductor, Inc. Method for implementing security of non-volatile memory
US8873284B2 (en) 2012-12-31 2014-10-28 Sandisk Technologies Inc. Method and system for program scheduling in a multi-layer memory
US9465731B2 (en) 2012-12-31 2016-10-11 Sandisk Technologies Llc Multi-layer non-volatile memory system having multiple partitions in a layer
US9336133B2 (en) 2012-12-31 2016-05-10 Sandisk Technologies Inc. Method and system for managing program cycles including maintenance programming operations in a multi-layer memory
US9734050B2 (en) 2012-12-31 2017-08-15 Sandisk Technologies Llc Method and system for managing background operations in a multi-layer memory
US9734911B2 (en) 2012-12-31 2017-08-15 Sandisk Technologies Llc Method and system for asynchronous die operations in a non-volatile memory
US9223693B2 (en) 2012-12-31 2015-12-29 Sandisk Technologies Inc. Memory system having an unequal number of memory die on different control channels
US9348746B2 (en) 2012-12-31 2016-05-24 Sandisk Technologies Method and system for managing block reclaim operations in a multi-layer memory
KR102034626B1 (ko) 2013-06-26 2019-10-21 삼성전자 주식회사 메모리 동작을 제어하는 방법 및 장치
JP6548636B2 (ja) 2014-05-16 2019-07-24 ソニーセミコンダクタソリューションズ株式会社 情報処理装置、情報処理方法、および電子機器
US9620216B2 (en) * 2015-02-17 2017-04-11 Silicon Storage Technology, Inc. Flash memory device configurable to provide read only memory functionality
US9778855B2 (en) 2015-10-30 2017-10-03 Sandisk Technologies Llc System and method for precision interleaving of data writes in a non-volatile memory
US10042553B2 (en) 2015-10-30 2018-08-07 Sandisk Technologies Llc Method and system for programming a multi-layer non-volatile memory having a single fold data path
US10120613B2 (en) 2015-10-30 2018-11-06 Sandisk Technologies Llc System and method for rescheduling host and maintenance operations in a non-volatile memory
US10133490B2 (en) 2015-10-30 2018-11-20 Sandisk Technologies Llc System and method for managing extended maintenance scheduling in a non-volatile memory
US10254967B2 (en) 2016-01-13 2019-04-09 Sandisk Technologies Llc Data path control for non-volatile memory
US10528255B2 (en) 2016-11-11 2020-01-07 Sandisk Technologies Llc Interface for non-volatile memory
US10528267B2 (en) 2016-11-11 2020-01-07 Sandisk Technologies Llc Command queue for storage operations
US10528286B2 (en) 2016-11-11 2020-01-07 Sandisk Technologies Llc Interface for non-volatile memory
US10114589B2 (en) * 2016-11-16 2018-10-30 Sandisk Technologies Llc Command control for multi-core non-volatile memory

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5239505A (en) * 1990-12-28 1993-08-24 Intel Corporation Floating gate non-volatile memory with blocks and memory refresh
US5245572A (en) 1991-07-30 1993-09-14 Intel Corporation Floating gate nonvolatile memory with reading while writing capability
JP3143161B2 (ja) 1991-08-29 2001-03-07 三菱電機株式会社 不揮発性半導体メモリ
US5513136A (en) * 1993-09-27 1996-04-30 Intel Corporation Nonvolatile memory with blocks and circuitry for selectively protecting the blocks for memory operations
US5442704A (en) * 1994-01-14 1995-08-15 Bull Nh Information Systems Inc. Secure memory card with programmed controlled security access control
JP3464271B2 (ja) 1994-04-12 2003-11-05 三菱電機株式会社 不揮発性半導体記憶装置
EP0745995B1 (de) * 1995-05-05 2001-04-11 STMicroelectronics S.r.l. Anordnung von nichtflüchtigen EEPROM,insbesondere Flash-EEPROM
KR100225758B1 (ko) * 1996-09-13 1999-10-15 윤종용 라커블 셀들을 가지는 불휘발성 반도체 메모리 장치
JP3489708B2 (ja) * 1996-10-23 2004-01-26 シャープ株式会社 不揮発性半導体記憶装置
JPH10144086A (ja) 1996-11-14 1998-05-29 Sharp Corp 不揮発性半導体記憶装置
US5867430A (en) * 1996-12-20 1999-02-02 Advanced Micro Devices Inc Bank architecture for a non-volatile memory enabling simultaneous reading and writing
US5954818A (en) * 1997-02-03 1999-09-21 Intel Corporation Method of programming, erasing, and reading block lock-bits and a master lock-bit in a flash memory device
US5847994A (en) * 1997-09-08 1998-12-08 Mitsubishi Denki Kabushiki Kaisha Non-volatile semiconductor memory device having a back ground operation mode
JP3884839B2 (ja) * 1997-10-17 2007-02-21 株式会社ルネサステクノロジ 半導体記憶装置

Also Published As

Publication number Publication date
JP2001283594A (ja) 2001-10-12
US20010036105A1 (en) 2001-11-01
US6469928B2 (en) 2002-10-22
EP1143455B1 (de) 2006-08-09
KR100392301B1 (ko) 2003-07-22
EP1143455A2 (de) 2001-10-10
DE60122045T2 (de) 2007-02-15
TW497103B (en) 2002-08-01
EP1143455A3 (de) 2004-02-25
KR20010100859A (ko) 2001-11-14

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