DE19842153C2 - Fluoreszenzmikroskop - Google Patents

Fluoreszenzmikroskop

Info

Publication number
DE19842153C2
DE19842153C2 DE19842153A DE19842153A DE19842153C2 DE 19842153 C2 DE19842153 C2 DE 19842153C2 DE 19842153 A DE19842153 A DE 19842153A DE 19842153 A DE19842153 A DE 19842153A DE 19842153 C2 DE19842153 C2 DE 19842153C2
Authority
DE
Germany
Prior art keywords
light
mirror
fluorescence microscope
microscope according
fluorescent light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Revoked
Application number
DE19842153A
Other languages
German (de)
English (en)
Other versions
DE19842153A1 (de
Inventor
Heinrich Ulrich
Johann Engelhardt
William C Hay
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Microsystems CMS GmbH
Original Assignee
Leica Microsystems Heidelberg GmbH
Leica Microsystems CMS GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=7880995&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE19842153(C2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Leica Microsystems Heidelberg GmbH, Leica Microsystems CMS GmbH filed Critical Leica Microsystems Heidelberg GmbH
Priority to DE19842153A priority Critical patent/DE19842153C2/de
Priority to PCT/DE1999/002910 priority patent/WO2000016149A1/de
Priority to JP2000570627A priority patent/JP4197395B2/ja
Priority to DE59913082T priority patent/DE59913082D1/de
Priority to EP99955690A priority patent/EP1031055B1/de
Priority to US09/554,083 priority patent/US6785302B1/en
Publication of DE19842153A1 publication Critical patent/DE19842153A1/de
Publication of DE19842153C2 publication Critical patent/DE19842153C2/de
Application granted granted Critical
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE19842153A 1998-09-15 1998-09-15 Fluoreszenzmikroskop Revoked DE19842153C2 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE19842153A DE19842153C2 (de) 1998-09-15 1998-09-15 Fluoreszenzmikroskop
EP99955690A EP1031055B1 (de) 1998-09-15 1999-09-13 Optische anordnung im strahlengang eines konfokalen fluoreszenzmikroskops
JP2000570627A JP4197395B2 (ja) 1998-09-15 1999-09-13 共焦点蛍光顕微鏡のビーム路における光学装置
DE59913082T DE59913082D1 (de) 1998-09-15 1999-09-13 Optische anordnung im strahlengang eines konfokalen fluoreszenzmikroskops
PCT/DE1999/002910 WO2000016149A1 (de) 1998-09-15 1999-09-13 Optische anordnung im strahlengang eines konfokalen fluoreszenzmikroskops
US09/554,083 US6785302B1 (en) 1998-09-15 1999-09-13 Optical system in the ray path of a confocal fluorescence microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19842153A DE19842153C2 (de) 1998-09-15 1998-09-15 Fluoreszenzmikroskop

Publications (2)

Publication Number Publication Date
DE19842153A1 DE19842153A1 (de) 2000-03-16
DE19842153C2 true DE19842153C2 (de) 2003-07-31

Family

ID=7880995

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19842153A Revoked DE19842153C2 (de) 1998-09-15 1998-09-15 Fluoreszenzmikroskop
DE59913082T Expired - Lifetime DE59913082D1 (de) 1998-09-15 1999-09-13 Optische anordnung im strahlengang eines konfokalen fluoreszenzmikroskops

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE59913082T Expired - Lifetime DE59913082D1 (de) 1998-09-15 1999-09-13 Optische anordnung im strahlengang eines konfokalen fluoreszenzmikroskops

Country Status (5)

Country Link
US (1) US6785302B1 (enExample)
EP (1) EP1031055B1 (enExample)
JP (1) JP4197395B2 (enExample)
DE (2) DE19842153C2 (enExample)
WO (1) WO2000016149A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006056429B3 (de) * 2006-11-28 2008-02-14 Leica Microsystems Cms Gmbh Lasermikroskop mit räumlich trennendem Strahlteiler
DE102007024074A1 (de) 2007-05-22 2008-11-27 Leica Microsystems Cms Gmbh Vorrichtung zur Lichtdetektion in einem Scanmikroskop
DE102004038321B4 (de) 2003-11-21 2022-05-25 Leica Microsystems Cms Gmbh Lichtfalle

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6355934B1 (en) 1999-02-26 2002-03-12 Packard Biochip Technologies Imaging system for an optical scanner
WO2000050878A1 (en) * 1999-02-26 2000-08-31 Gsi Lumonics, Inc. Imaging system for an optical scanner
DE19923822A1 (de) † 1999-05-19 2000-11-23 Zeiss Carl Jena Gmbh Scannende Anordnung, vorzugsweise zur Erfassung von Fluoreszenzlicht
US6795189B2 (en) * 2000-06-15 2004-09-21 Packard Instrument Company Universal microplate analyzer
EP1164402B1 (de) * 2000-06-17 2010-04-28 Leica Microsystems CMS GmbH Scanmikroskop mit mehrbandiger Beleuchtung und optisches Bauelement für ein Scanmikroskop mit mehrbandiger Beleuchtung
FR2813121A1 (fr) * 2000-08-21 2002-02-22 Claude Weisbuch Dispositif perfectionne de support d'elements chromophores
US6826424B1 (en) 2000-12-19 2004-11-30 Haishan Zeng Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices
US6750457B2 (en) * 2001-08-29 2004-06-15 Becton Dickinson And Company System for high throughput analysis
DE10143481A1 (de) 2001-09-05 2003-03-20 Europ Lab Molekularbiolog Mikroskop
DE10144062B4 (de) * 2001-09-07 2010-05-27 Leica Microsystems Ag Mikroskop mit einer Beleuchtungseinspiegelung
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
DE10327987A1 (de) * 2003-06-21 2005-01-20 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Konfokales optisches System
DE10332073A1 (de) * 2003-07-11 2005-02-10 Carl Zeiss Jena Gmbh Anordnung zur optischen Erfassung von in einer Probe angeregter und / oder rückgestreuter Lichtstrahlung mit Doppelobjektivanordnung
FR2860606B1 (fr) * 2003-10-07 2006-01-21 Thales Sa Convertisseur multimode-monomode, en particulier pour source laser a fibre amplificatrice multimode
FR2869686B1 (fr) * 2003-12-11 2009-06-05 Flowgene Sa Detecteur de lumiere a chambre elliptique
JP6058977B2 (ja) * 2012-11-15 2017-01-11 シャープ株式会社 蛍光検出装置
JP6176327B2 (ja) * 2013-07-11 2017-08-09 株式会社島津製作所 ラマン分光分析装置
EP3542710A1 (de) * 2018-03-23 2019-09-25 JenLab GmbH Multimodales bildgebungssystem und verfahren zur nicht-invasiven untersuchung eines untersuchungsobjekts

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3742806A1 (de) * 1987-12-17 1989-07-13 Zeiss Carl Fa Verfahren und vorrichtung zur erzeugung von fluoreszenzbildern
DE4243144A1 (de) * 1992-12-19 1994-06-23 Bruker Analytische Messtechnik Objektiv für ein FT-Raman-Mikroskop
DE4343076C2 (de) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes
JPH1096862A (ja) * 1996-09-20 1998-04-14 Bunshi Bio Photonics Kenkyusho:Kk 落射蛍光顕微鏡装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4744663A (en) 1984-12-14 1988-05-17 Nippon Kogaku K.K. Pattern position detection apparatus using laser beam
JPH03269405A (ja) 1990-03-19 1991-12-02 Fujitsu Ltd 蛍光顕微鏡
GB9014263D0 (en) * 1990-06-27 1990-08-15 Dixon Arthur E Apparatus and method for spatially- and spectrally- resolvedmeasurements
US5127730A (en) * 1990-08-10 1992-07-07 Regents Of The University Of Minnesota Multi-color laser scanning confocal imaging system
USH1344H (en) * 1990-10-09 1994-08-02 The United States Of America As Represented By The Secretary Of The Army Portable automatic sensor for toxic gases
GB2254444B (en) 1991-03-25 1994-06-15 Birkbeck College Laser microscopy
CH685650A5 (de) * 1991-07-20 1995-08-31 Tencor Instruments Einrichtung für Oberflächeninspektionen.
JP3102938B2 (ja) * 1991-12-30 2000-10-23 シスメックス株式会社 粒子画像分析装置
JP3144513B2 (ja) * 1993-06-17 2001-03-12 富士写真フイルム株式会社 蛍光顕微鏡
US5734498A (en) * 1994-05-09 1998-03-31 The Regents Of The University Of California Illuminator elements for conventional light microscopes
JP3537205B2 (ja) * 1995-02-02 2004-06-14 オリンパス株式会社 顕微鏡装置
JPH09281045A (ja) 1996-04-10 1997-10-31 Kdk Corp メバロン酸の光学的測定方法
JP3269405B2 (ja) 1996-10-08 2002-03-25 株式会社東京精密 数値制御工作機械の自動測定装置
JPH10142507A (ja) * 1996-11-11 1998-05-29 Olympus Optical Co Ltd レーザ走査顕微鏡
JPH1198372A (ja) * 1997-09-18 1999-04-09 Olympus Optical Co Ltd 色調整方法
US6445491B2 (en) * 1999-01-29 2002-09-03 Irma America, Inc. Method and apparatus for optical sectioning and imaging using time-gated parametric image amplification

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3742806A1 (de) * 1987-12-17 1989-07-13 Zeiss Carl Fa Verfahren und vorrichtung zur erzeugung von fluoreszenzbildern
DE4243144A1 (de) * 1992-12-19 1994-06-23 Bruker Analytische Messtechnik Objektiv für ein FT-Raman-Mikroskop
DE4343076C2 (de) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes
JPH1096862A (ja) * 1996-09-20 1998-04-14 Bunshi Bio Photonics Kenkyusho:Kk 落射蛍光顕微鏡装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ENGELHARDT, KNEBEL: "Konfokale Laserscanning- Mikroskopie", Physik in unserer Zeit, 24. Jg., 1993, Nr. 2 *
HAMILTON, D.K., WILSON, T.W.: Three-Dimensional Surface Measurement Using the Confocal Scanning Microscope, Appl.Phys. B 27, 1982, 211-213 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004038321B4 (de) 2003-11-21 2022-05-25 Leica Microsystems Cms Gmbh Lichtfalle
DE102006056429B3 (de) * 2006-11-28 2008-02-14 Leica Microsystems Cms Gmbh Lasermikroskop mit räumlich trennendem Strahlteiler
DE102007024074A1 (de) 2007-05-22 2008-11-27 Leica Microsystems Cms Gmbh Vorrichtung zur Lichtdetektion in einem Scanmikroskop
DE102007024074B4 (de) 2007-05-22 2022-09-15 Leica Microsystems Cms Gmbh Mikroskop

Also Published As

Publication number Publication date
JP4197395B2 (ja) 2008-12-17
DE19842153A1 (de) 2000-03-16
JP2002525651A (ja) 2002-08-13
DE59913082D1 (de) 2006-04-13
EP1031055A1 (de) 2000-08-30
US6785302B1 (en) 2004-08-31
WO2000016149A1 (de) 2000-03-23
EP1031055B1 (de) 2006-01-25

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: LEICA MICROSYSTEMS HEIDELBERG GMBH, 68165 MANNHEIM

8304 Grant after examination procedure
8363 Opposition against the patent
8327 Change in the person/name/address of the patent owner

Owner name: LEICA MICROSYSTEMS CMS GMBH, 35578 WETZLAR, DE

8331 Complete revocation