CN1554069A - 存储卡及其初始化设置方法 - Google Patents
存储卡及其初始化设置方法 Download PDFInfo
- Publication number
- CN1554069A CN1554069A CNA02817898XA CN02817898A CN1554069A CN 1554069 A CN1554069 A CN 1554069A CN A02817898X A CNA02817898X A CN A02817898XA CN 02817898 A CN02817898 A CN 02817898A CN 1554069 A CN1554069 A CN 1554069A
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- China
- Prior art keywords
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- described permanent
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- semiconductors storer
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/20—Initialising; Data preset; Chip identification
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
Abstract
Description
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001278138A JP4173297B2 (ja) | 2001-09-13 | 2001-09-13 | メモリカード |
JP278138/2001 | 2001-09-13 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101487895A Division CN101197191B (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1554069A true CN1554069A (zh) | 2004-12-08 |
CN100412894C CN100412894C (zh) | 2008-08-20 |
Family
ID=19102549
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101487895A Expired - Fee Related CN101197191B (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
CNB02817898XA Expired - Fee Related CN100412894C (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101487895A Expired - Fee Related CN101197191B (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
Country Status (5)
Country | Link |
---|---|
US (3) | US7305589B2 (zh) |
JP (1) | JP4173297B2 (zh) |
KR (1) | KR20040044913A (zh) |
CN (2) | CN101197191B (zh) |
WO (1) | WO2003025848A1 (zh) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100373404C (zh) * | 2005-09-13 | 2008-03-05 | 北京中星微电子有限公司 | 一种初始化存储卡的方法 |
CN100465909C (zh) * | 2006-06-02 | 2009-03-04 | 上海思必得通讯技术有限公司 | 产品中闪存初始化过程遍历数据进行查错的方法 |
CN100465910C (zh) * | 2006-06-02 | 2009-03-04 | 上海思必得通讯技术有限公司 | 对产品中闪存数据的防错、纠错方法 |
CN102034546A (zh) * | 2009-09-25 | 2011-04-27 | 英特尔公司 | 存储器链路初始化 |
US8208323B2 (en) | 2008-12-16 | 2012-06-26 | Macronix International Co., Ltd. | Method and apparatus for protection of non-volatile memory in presence of out-of-specification operating voltage |
CN103927131A (zh) * | 2014-03-25 | 2014-07-16 | 四川和芯微电子股份有限公司 | 同步闪存u盘的启动方法及其控制系统 |
WO2018166201A1 (zh) * | 2017-03-15 | 2018-09-20 | 珠海格力电器股份有限公司 | 数据读取方法、低电压检测逻辑电路、集成电路和芯片 |
CN109036494A (zh) * | 2018-07-20 | 2018-12-18 | 江苏华存电子科技有限公司 | 一种快速检测闪存瑕疵的方法 |
CN110704263A (zh) * | 2019-09-19 | 2020-01-17 | 京微齐力(北京)科技有限公司 | 一种Flash读操作上电完成检测方法 |
CN110838312A (zh) * | 2018-08-17 | 2020-02-25 | 华邦电子股份有限公司 | 用于电力损耗恢复的电路及使用此电路的装置与其方法 |
CN112347524A (zh) * | 2020-10-13 | 2021-02-09 | 深圳市宏旺微电子有限公司 | 闪存编程方法、装置及电子设备 |
CN112486849A (zh) * | 2019-09-12 | 2021-03-12 | 慧荣科技股份有限公司 | 闪存开卡程序的方法、闪存装置的闪存控制器及电子装置 |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2005081891A2 (en) * | 2004-02-23 | 2005-09-09 | Lexar Media, Inc. | Secure compact flash |
JP2005327286A (ja) * | 2004-05-12 | 2005-11-24 | Samsung Electronics Co Ltd | メインデータを安全にローディングするためのメモリシステムおよびメインデータローディング方法 |
US7258100B2 (en) * | 2004-08-03 | 2007-08-21 | Bruce Pinkston | Internal combustion engine control |
US20060036803A1 (en) * | 2004-08-16 | 2006-02-16 | Mori Edan | Non-volatile memory device controlled by a micro-controller |
JP2006276967A (ja) * | 2005-03-28 | 2006-10-12 | Renesas Technology Corp | 半導体装置 |
JP2007334813A (ja) * | 2006-06-19 | 2007-12-27 | Nec Electronics Corp | メモリ制御回路及びデータ書き換え方法 |
KR100884239B1 (ko) | 2007-01-02 | 2009-02-17 | 삼성전자주식회사 | 메모리 카드 시스템 및 그것의 백그라운드 정보 전송 방법 |
KR100855994B1 (ko) * | 2007-04-04 | 2008-09-02 | 삼성전자주식회사 | 플래시 메모리 장치 및 그 구동방법 |
CN101425336B (zh) * | 2007-11-01 | 2011-05-25 | 英华达(上海)科技有限公司 | 烧录与比对方法 |
US7711869B1 (en) * | 2007-12-20 | 2010-05-04 | Emc Corporation | Method for communicating plural signals generated at a source to a remote destination through a single wire |
US8495423B2 (en) * | 2009-08-11 | 2013-07-23 | International Business Machines Corporation | Flash-based memory system with robust backup and restart features and removable modules |
US20120092044A1 (en) * | 2010-10-13 | 2012-04-19 | Ability Enterprise Co., Ltd. | Circuit for swapping a memory card in an electronic device |
CN102520222A (zh) * | 2011-10-28 | 2012-06-27 | 宁波三星电气股份有限公司 | 电能表系统抗干扰控制方法 |
KR102031661B1 (ko) * | 2012-10-23 | 2019-10-14 | 삼성전자주식회사 | 데이터 저장 장치 및 컨트롤러, 그리고 데이터 저장 장치의 동작 방법 |
KR101445105B1 (ko) * | 2014-05-16 | 2014-10-06 | 주식회사 피앤티세미 | 비휘발성 메모리를 내장한 마이크로 컨트롤러의 초기시동장치 |
BE1025127B1 (de) * | 2017-04-10 | 2018-11-16 | Phoenix Contact Gmbh & Co | Kommunikationssystem zur seriellen Kommunikation zwischen Kommunikationsgeräten |
KR102501695B1 (ko) * | 2018-01-15 | 2023-02-21 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 그것의 동작 방법 |
US10305470B1 (en) * | 2018-07-09 | 2019-05-28 | Winbond Electronics Corp. | Circuit for recovering from power loss and electronic device using the same circuit and method thereof |
CN110162438B (zh) * | 2019-05-30 | 2024-03-26 | 上海市信息网络有限公司 | 仿真调试装置和仿真调试方法 |
Family Cites Families (22)
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US4414665A (en) * | 1979-11-21 | 1983-11-08 | Nippon Telegraph & Telephone Public Corp. | Semiconductor memory device test apparatus |
JPS60247942A (ja) * | 1984-05-23 | 1985-12-07 | Advantest Corp | 半導体メモリ試験装置 |
JPS61278992A (ja) * | 1985-06-04 | 1986-12-09 | Toppan Moore Co Ltd | 故障検査機能を備えたicカ−ド |
JPH06214897A (ja) * | 1992-12-14 | 1994-08-05 | E Syst Inc | 誤り状態検出時に周辺装置に記憶したデータの損失を最少にする方法 |
US5301161A (en) * | 1993-01-12 | 1994-04-05 | Intel Corporation | Circuitry for power supply voltage detection and system lockout for a nonvolatile memory |
US5710741A (en) * | 1994-03-11 | 1998-01-20 | Micron Technology, Inc. | Power up intialization circuit responding to an input signal |
JPH08129631A (ja) | 1994-11-01 | 1996-05-21 | Dainippon Printing Co Ltd | Icカード及びicカード発行装置 |
JP3625879B2 (ja) * | 1994-11-02 | 2005-03-02 | 大日本印刷株式会社 | メモリチェック機能をもった情報記録媒体 |
FR2745924B1 (fr) * | 1996-03-07 | 1998-12-11 | Bull Cp8 | Circuit integre perfectionne et procede d'utilisation d'un tel circuit integre |
US5831460A (en) * | 1997-02-26 | 1998-11-03 | Xilinx, Inc. | Power-on reset circuit with separate power-up and brown-out trigger levels |
US5883532A (en) * | 1997-03-25 | 1999-03-16 | Analog Devices, Inc. | Power-on reset circuit based upon FET threshold level |
US5898634A (en) * | 1997-06-17 | 1999-04-27 | Micron Technology, Inc. | Integrated circuit with supply voltage detector |
JP2000021193A (ja) * | 1998-07-01 | 2000-01-21 | Fujitsu Ltd | メモリ試験方法及び装置並びに記憶媒体 |
US6157579A (en) * | 1998-07-31 | 2000-12-05 | Stmicroelectronics S.R.L. | Circuit for providing a reading phase after power-on-reset |
KR100308479B1 (ko) * | 1998-08-11 | 2001-11-01 | 윤종용 | 컴퓨터 시스템 내에서 부트-업 메모리로 사용되는 플래시 메모리 장치 및 그것의 데이터 읽기 방법 |
FR2784763B1 (fr) * | 1998-10-16 | 2001-10-19 | Gemplus Card Int | Composant electronique et procede pour masquer l'execution d'instructions ou la manipulation de donnees |
US6823485B1 (en) * | 1998-11-05 | 2004-11-23 | Hitachi, Ltd. | Semiconductor storage device and test system |
JP2000215112A (ja) * | 1998-11-20 | 2000-08-04 | Sony Computer Entertainment Inc | 電子機器及び低電圧検出方法 |
JP2001222690A (ja) | 2000-02-08 | 2001-08-17 | Nec Infrontia Corp | Pos装置におけるicカードの情報処理方法 |
US6629047B1 (en) * | 2000-03-30 | 2003-09-30 | Intel Corporation | Method and apparatus for flash voltage detection and lockout |
JP4601119B2 (ja) * | 2000-05-02 | 2010-12-22 | 株式会社アドバンテスト | メモリ試験方法・メモリ試験装置 |
US7310760B1 (en) * | 2002-12-11 | 2007-12-18 | Chung Sun | Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltage |
-
2001
- 2001-09-13 JP JP2001278138A patent/JP4173297B2/ja not_active Expired - Fee Related
-
2002
- 2002-05-08 CN CN2007101487895A patent/CN101197191B/zh not_active Expired - Fee Related
- 2002-05-08 KR KR10-2004-7003714A patent/KR20040044913A/ko not_active Application Discontinuation
- 2002-05-08 WO PCT/JP2002/004460 patent/WO2003025848A1/ja active Application Filing
- 2002-05-08 US US10/484,043 patent/US7305589B2/en not_active Expired - Fee Related
- 2002-05-08 CN CNB02817898XA patent/CN100412894C/zh not_active Expired - Fee Related
-
2007
- 2007-10-23 US US11/877,500 patent/US7549086B2/en not_active Expired - Fee Related
-
2009
- 2009-03-26 US US12/412,117 patent/US8051331B2/en not_active Expired - Fee Related
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100373404C (zh) * | 2005-09-13 | 2008-03-05 | 北京中星微电子有限公司 | 一种初始化存储卡的方法 |
CN100465909C (zh) * | 2006-06-02 | 2009-03-04 | 上海思必得通讯技术有限公司 | 产品中闪存初始化过程遍历数据进行查错的方法 |
CN100465910C (zh) * | 2006-06-02 | 2009-03-04 | 上海思必得通讯技术有限公司 | 对产品中闪存数据的防错、纠错方法 |
US8208323B2 (en) | 2008-12-16 | 2012-06-26 | Macronix International Co., Ltd. | Method and apparatus for protection of non-volatile memory in presence of out-of-specification operating voltage |
CN101763897B (zh) * | 2008-12-16 | 2013-11-06 | 旺宏电子股份有限公司 | 操作非易失性存储器的方法与装置 |
CN102034546B (zh) * | 2009-09-25 | 2014-07-23 | 英特尔公司 | 存储器链路初始化 |
CN102034546A (zh) * | 2009-09-25 | 2011-04-27 | 英特尔公司 | 存储器链路初始化 |
CN103927131B (zh) * | 2014-03-25 | 2017-02-15 | 四川和芯微电子股份有限公司 | 同步闪存u盘的启动方法及其控制系统 |
CN103927131A (zh) * | 2014-03-25 | 2014-07-16 | 四川和芯微电子股份有限公司 | 同步闪存u盘的启动方法及其控制系统 |
WO2018166201A1 (zh) * | 2017-03-15 | 2018-09-20 | 珠海格力电器股份有限公司 | 数据读取方法、低电压检测逻辑电路、集成电路和芯片 |
US10811106B2 (en) | 2017-03-15 | 2020-10-20 | Gree Electric Appliances, Inc. Of Zhuhai | Data reading method, low voltage detection logic circuit, integrated circuit and chip |
CN109036494A (zh) * | 2018-07-20 | 2018-12-18 | 江苏华存电子科技有限公司 | 一种快速检测闪存瑕疵的方法 |
WO2020015130A1 (zh) * | 2018-07-20 | 2020-01-23 | 江苏华存电子科技有限公司 | 一种快速检测闪存瑕疵的方法 |
CN110838312A (zh) * | 2018-08-17 | 2020-02-25 | 华邦电子股份有限公司 | 用于电力损耗恢复的电路及使用此电路的装置与其方法 |
CN110838312B (zh) * | 2018-08-17 | 2023-03-24 | 华邦电子股份有限公司 | 用于电力损耗恢复的电路及使用此电路的装置与其方法 |
CN112486849A (zh) * | 2019-09-12 | 2021-03-12 | 慧荣科技股份有限公司 | 闪存开卡程序的方法、闪存装置的闪存控制器及电子装置 |
CN112486849B (zh) * | 2019-09-12 | 2024-03-29 | 慧荣科技股份有限公司 | 闪存开卡程序的方法、闪存装置的闪存控制器及电子装置 |
CN110704263A (zh) * | 2019-09-19 | 2020-01-17 | 京微齐力(北京)科技有限公司 | 一种Flash读操作上电完成检测方法 |
CN112347524A (zh) * | 2020-10-13 | 2021-02-09 | 深圳市宏旺微电子有限公司 | 闪存编程方法、装置及电子设备 |
Also Published As
Publication number | Publication date |
---|---|
US20040255205A1 (en) | 2004-12-16 |
US20090187703A1 (en) | 2009-07-23 |
US20080059852A1 (en) | 2008-03-06 |
CN101197191A (zh) | 2008-06-11 |
CN101197191B (zh) | 2010-09-15 |
US7305589B2 (en) | 2007-12-04 |
KR20040044913A (ko) | 2004-05-31 |
CN100412894C (zh) | 2008-08-20 |
US7549086B2 (en) | 2009-06-16 |
US8051331B2 (en) | 2011-11-01 |
WO2003025848A1 (fr) | 2003-03-27 |
JP4173297B2 (ja) | 2008-10-29 |
JP2003085508A (ja) | 2003-03-20 |
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