CN100412894C - 存储卡及其初始化设置方法 - Google Patents
存储卡及其初始化设置方法 Download PDFInfo
- Publication number
- CN100412894C CN100412894C CNB02817898XA CN02817898A CN100412894C CN 100412894 C CN100412894 C CN 100412894C CN B02817898X A CNB02817898X A CN B02817898XA CN 02817898 A CN02817898 A CN 02817898A CN 100412894 C CN100412894 C CN 100412894C
- Authority
- CN
- China
- Prior art keywords
- data
- described permanent
- check
- semiconductors storer
- storage unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/20—Initialising; Data preset; Chip identification
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Read Only Memory (AREA)
- Storage Device Security (AREA)
- Power Sources (AREA)
Abstract
Description
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001278138A JP4173297B2 (ja) | 2001-09-13 | 2001-09-13 | メモリカード |
JP278138/2001 | 2001-09-13 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101487895A Division CN101197191B (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1554069A CN1554069A (zh) | 2004-12-08 |
CN100412894C true CN100412894C (zh) | 2008-08-20 |
Family
ID=19102549
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB02817898XA Expired - Fee Related CN100412894C (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
CN2007101487895A Expired - Fee Related CN101197191B (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101487895A Expired - Fee Related CN101197191B (zh) | 2001-09-13 | 2002-05-08 | 存储卡及其初始化设置方法 |
Country Status (5)
Country | Link |
---|---|
US (3) | US7305589B2 (zh) |
JP (1) | JP4173297B2 (zh) |
KR (1) | KR20040044913A (zh) |
CN (2) | CN100412894C (zh) |
WO (1) | WO2003025848A1 (zh) |
Families Citing this family (31)
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EP2506486A1 (en) | 2004-02-23 | 2012-10-03 | Lexar Media, Inc. | Secure compact flash |
DE102005022610A1 (de) * | 2004-05-12 | 2005-12-08 | Samsung Electronics Co., Ltd. | Speichersystem, Schaltkreis sowie Verfahren zum Laden von Daten |
US7258100B2 (en) * | 2004-08-03 | 2007-08-21 | Bruce Pinkston | Internal combustion engine control |
US20060036803A1 (en) * | 2004-08-16 | 2006-02-16 | Mori Edan | Non-volatile memory device controlled by a micro-controller |
JP2006276967A (ja) * | 2005-03-28 | 2006-10-12 | Renesas Technology Corp | 半導体装置 |
CN100373404C (zh) * | 2005-09-13 | 2008-03-05 | 北京中星微电子有限公司 | 一种初始化存储卡的方法 |
CN100465910C (zh) * | 2006-06-02 | 2009-03-04 | 上海思必得通讯技术有限公司 | 对产品中闪存数据的防错、纠错方法 |
CN100465909C (zh) * | 2006-06-02 | 2009-03-04 | 上海思必得通讯技术有限公司 | 产品中闪存初始化过程遍历数据进行查错的方法 |
JP2007334813A (ja) * | 2006-06-19 | 2007-12-27 | Nec Electronics Corp | メモリ制御回路及びデータ書き換え方法 |
KR100884239B1 (ko) | 2007-01-02 | 2009-02-17 | 삼성전자주식회사 | 메모리 카드 시스템 및 그것의 백그라운드 정보 전송 방법 |
KR100855994B1 (ko) * | 2007-04-04 | 2008-09-02 | 삼성전자주식회사 | 플래시 메모리 장치 및 그 구동방법 |
CN101425336B (zh) * | 2007-11-01 | 2011-05-25 | 英华达(上海)科技有限公司 | 烧录与比对方法 |
US7711869B1 (en) * | 2007-12-20 | 2010-05-04 | Emc Corporation | Method for communicating plural signals generated at a source to a remote destination through a single wire |
US7969803B2 (en) | 2008-12-16 | 2011-06-28 | Macronix International Co., Ltd. | Method and apparatus for protection of non-volatile memory in presence of out-of-specification operating voltage |
US8495423B2 (en) * | 2009-08-11 | 2013-07-23 | International Business Machines Corporation | Flash-based memory system with robust backup and restart features and removable modules |
US8578086B2 (en) * | 2009-09-25 | 2013-11-05 | Intel Corporation | Memory link initialization |
US20120092044A1 (en) * | 2010-10-13 | 2012-04-19 | Ability Enterprise Co., Ltd. | Circuit for swapping a memory card in an electronic device |
CN102520222A (zh) * | 2011-10-28 | 2012-06-27 | 宁波三星电气股份有限公司 | 电能表系统抗干扰控制方法 |
KR102031661B1 (ko) * | 2012-10-23 | 2019-10-14 | 삼성전자주식회사 | 데이터 저장 장치 및 컨트롤러, 그리고 데이터 저장 장치의 동작 방법 |
CN103927131B (zh) * | 2014-03-25 | 2017-02-15 | 四川和芯微电子股份有限公司 | 同步闪存u盘的启动方法及其控制系统 |
KR101445105B1 (ko) * | 2014-05-16 | 2014-10-06 | 주식회사 피앤티세미 | 비휘발성 메모리를 내장한 마이크로 컨트롤러의 초기시동장치 |
CN106683703B (zh) * | 2017-03-15 | 2023-09-15 | 珠海零边界集成电路有限公司 | 一种数据读取方法、集成电路及芯片 |
BE1025127B1 (de) * | 2017-04-10 | 2018-11-16 | Phoenix Contact Gmbh & Co | Kommunikationssystem zur seriellen Kommunikation zwischen Kommunikationsgeräten |
KR102501695B1 (ko) * | 2018-01-15 | 2023-02-21 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 그것의 동작 방법 |
US10305470B1 (en) * | 2018-07-09 | 2019-05-28 | Winbond Electronics Corp. | Circuit for recovering from power loss and electronic device using the same circuit and method thereof |
CN109036494A (zh) * | 2018-07-20 | 2018-12-18 | 江苏华存电子科技有限公司 | 一种快速检测闪存瑕疵的方法 |
CN110838312B (zh) * | 2018-08-17 | 2023-03-24 | 华邦电子股份有限公司 | 用于电力损耗恢复的电路及使用此电路的装置与其方法 |
CN110162438B (zh) * | 2019-05-30 | 2024-03-26 | 上海市信息网络有限公司 | 仿真调试装置和仿真调试方法 |
US10825542B1 (en) * | 2019-09-12 | 2020-11-03 | Silicon Motion, Inc. | Method for efficiently checking storage units of flash memory of flash memory device and corresponding electronic device executing the method |
CN110704263A (zh) * | 2019-09-19 | 2020-01-17 | 京微齐力(北京)科技有限公司 | 一种Flash读操作上电完成检测方法 |
CN112347524B (zh) * | 2020-10-13 | 2024-07-02 | 深圳市宏旺微电子有限公司 | 闪存编程方法、装置及电子设备 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61278992A (ja) * | 1985-06-04 | 1986-12-09 | Toppan Moore Co Ltd | 故障検査機能を備えたicカ−ド |
JPH08129629A (ja) * | 1994-11-02 | 1996-05-21 | Dainippon Printing Co Ltd | メモリチェック機能をもった情報記録媒体 |
CN1181823A (zh) * | 1996-03-07 | 1998-05-13 | Cp8川萨克公司 | 改进的集成电路及这种集成电路的使用方法 |
WO2000023866A1 (fr) * | 1998-10-16 | 2000-04-27 | Gemplus | Composant electronique et procede pour masquer l'execution d'instructions ou la manipulation de donnees |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4414665A (en) * | 1979-11-21 | 1983-11-08 | Nippon Telegraph & Telephone Public Corp. | Semiconductor memory device test apparatus |
JPS60247942A (ja) * | 1984-05-23 | 1985-12-07 | Advantest Corp | 半導体メモリ試験装置 |
JPH06214897A (ja) * | 1992-12-14 | 1994-08-05 | E Syst Inc | 誤り状態検出時に周辺装置に記憶したデータの損失を最少にする方法 |
US5301161A (en) * | 1993-01-12 | 1994-04-05 | Intel Corporation | Circuitry for power supply voltage detection and system lockout for a nonvolatile memory |
US5710741A (en) * | 1994-03-11 | 1998-01-20 | Micron Technology, Inc. | Power up intialization circuit responding to an input signal |
JPH08129631A (ja) | 1994-11-01 | 1996-05-21 | Dainippon Printing Co Ltd | Icカード及びicカード発行装置 |
US5831460A (en) * | 1997-02-26 | 1998-11-03 | Xilinx, Inc. | Power-on reset circuit with separate power-up and brown-out trigger levels |
US5883532A (en) * | 1997-03-25 | 1999-03-16 | Analog Devices, Inc. | Power-on reset circuit based upon FET threshold level |
US5898634A (en) * | 1997-06-17 | 1999-04-27 | Micron Technology, Inc. | Integrated circuit with supply voltage detector |
JP2000021193A (ja) * | 1998-07-01 | 2000-01-21 | Fujitsu Ltd | メモリ試験方法及び装置並びに記憶媒体 |
US6157579A (en) * | 1998-07-31 | 2000-12-05 | Stmicroelectronics S.R.L. | Circuit for providing a reading phase after power-on-reset |
KR100308479B1 (ko) * | 1998-08-11 | 2001-11-01 | 윤종용 | 컴퓨터 시스템 내에서 부트-업 메모리로 사용되는 플래시 메모리 장치 및 그것의 데이터 읽기 방법 |
JP3895925B2 (ja) * | 1998-11-05 | 2007-03-22 | エルピーダメモリ株式会社 | 半導体記憶装置とテストシステム |
JP2000215112A (ja) * | 1998-11-20 | 2000-08-04 | Sony Computer Entertainment Inc | 電子機器及び低電圧検出方法 |
JP2001222690A (ja) | 2000-02-08 | 2001-08-17 | Nec Infrontia Corp | Pos装置におけるicカードの情報処理方法 |
US6629047B1 (en) * | 2000-03-30 | 2003-09-30 | Intel Corporation | Method and apparatus for flash voltage detection and lockout |
JP4601119B2 (ja) * | 2000-05-02 | 2010-12-22 | 株式会社アドバンテスト | メモリ試験方法・メモリ試験装置 |
US7310760B1 (en) * | 2002-12-11 | 2007-12-18 | Chung Sun | Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltage |
-
2001
- 2001-09-13 JP JP2001278138A patent/JP4173297B2/ja not_active Expired - Fee Related
-
2002
- 2002-05-08 CN CNB02817898XA patent/CN100412894C/zh not_active Expired - Fee Related
- 2002-05-08 US US10/484,043 patent/US7305589B2/en not_active Expired - Fee Related
- 2002-05-08 CN CN2007101487895A patent/CN101197191B/zh not_active Expired - Fee Related
- 2002-05-08 KR KR10-2004-7003714A patent/KR20040044913A/ko not_active Application Discontinuation
- 2002-05-08 WO PCT/JP2002/004460 patent/WO2003025848A1/ja active Application Filing
-
2007
- 2007-10-23 US US11/877,500 patent/US7549086B2/en not_active Expired - Fee Related
-
2009
- 2009-03-26 US US12/412,117 patent/US8051331B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61278992A (ja) * | 1985-06-04 | 1986-12-09 | Toppan Moore Co Ltd | 故障検査機能を備えたicカ−ド |
US4760575A (en) * | 1985-06-04 | 1988-07-26 | Toppan Moore Company, Ltd | IC card having fault checking function |
JPH08129629A (ja) * | 1994-11-02 | 1996-05-21 | Dainippon Printing Co Ltd | メモリチェック機能をもった情報記録媒体 |
CN1181823A (zh) * | 1996-03-07 | 1998-05-13 | Cp8川萨克公司 | 改进的集成电路及这种集成电路的使用方法 |
WO2000023866A1 (fr) * | 1998-10-16 | 2000-04-27 | Gemplus | Composant electronique et procede pour masquer l'execution d'instructions ou la manipulation de donnees |
Also Published As
Publication number | Publication date |
---|---|
JP4173297B2 (ja) | 2008-10-29 |
US20040255205A1 (en) | 2004-12-16 |
US20080059852A1 (en) | 2008-03-06 |
JP2003085508A (ja) | 2003-03-20 |
CN1554069A (zh) | 2004-12-08 |
US8051331B2 (en) | 2011-11-01 |
WO2003025848A1 (fr) | 2003-03-27 |
US20090187703A1 (en) | 2009-07-23 |
KR20040044913A (ko) | 2004-05-31 |
CN101197191A (zh) | 2008-06-11 |
CN101197191B (zh) | 2010-09-15 |
US7549086B2 (en) | 2009-06-16 |
US7305589B2 (en) | 2007-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: RENESAS TECH CORP. Free format text: FORMER OWNER: RENESAS TECH CORP.; APPLICANT Effective date: 20080222 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20080222 Address after: Tokyo, Japan Applicant after: Renesas Technology Corp. Address before: Tokyo Applicant before: Renesas Technology Corp. Co-applicant before: HITACHI ULSI SYSTEMS Co.,Ltd. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: RENESAS ELECTRONICS CO., LTD. Free format text: FORMER OWNER: NEC CORP. Effective date: 20100715 Owner name: NEC CORP. Free format text: FORMER OWNER: RENESAS TECHNOLOGY CORP. Effective date: 20100715 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: TOKYO, JAPAN TO: KANAGAWA, JAPAN COUNTY |
|
TR01 | Transfer of patent right |
Effective date of registration: 20100715 Address after: Kanagawa, Japan Patentee after: Renesas Electronics Corp. Address before: Kanagawa, Japan Patentee before: NEC ELECTRONICS Corp. Effective date of registration: 20100715 Address after: Kanagawa, Japan Patentee after: NEC ELECTRONICS Corp. Address before: Tokyo, Japan Patentee before: Renesas Technology Corp. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080820 Termination date: 20160508 |
|
CF01 | Termination of patent right due to non-payment of annual fee |