CN105378918B - 使用单片三维(3d)集成电路(ic)(3dic)技术完成片上系统(soc) - Google Patents
使用单片三维(3d)集成电路(ic)(3dic)技术完成片上系统(soc) Download PDFInfo
- Publication number
- CN105378918B CN105378918B CN201480039458.6A CN201480039458A CN105378918B CN 105378918 B CN105378918 B CN 105378918B CN 201480039458 A CN201480039458 A CN 201480039458A CN 105378918 B CN105378918 B CN 105378918B
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- 3dic
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
- H10D88/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/20—Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/297—Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361846648P | 2013-07-16 | 2013-07-16 | |
| US61/846,648 | 2013-07-16 | ||
| US14/013,399 | 2013-08-29 | ||
| US14/013,399 US9418985B2 (en) | 2013-07-16 | 2013-08-29 | Complete system-on-chip (SOC) using monolithic three dimensional (3D) integrated circuit (IC) (3DIC) technology |
| PCT/US2014/046503 WO2015009614A1 (en) | 2013-07-16 | 2014-07-14 | Complete system-on-chip (soc) using monolithic three dimensional (3d) integrated circuit (ic) (3dic) technology |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105378918A CN105378918A (zh) | 2016-03-02 |
| CN105378918B true CN105378918B (zh) | 2018-05-04 |
Family
ID=52343114
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480039458.6A Active CN105378918B (zh) | 2013-07-16 | 2014-07-14 | 使用单片三维(3d)集成电路(ic)(3dic)技术完成片上系统(soc) |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US9418985B2 (https=) |
| EP (1) | EP3022766A1 (https=) |
| JP (1) | JP2016529702A (https=) |
| KR (1) | KR101832330B1 (https=) |
| CN (1) | CN105378918B (https=) |
| BR (1) | BR112016000868B1 (https=) |
| CA (1) | CA2917586C (https=) |
| TW (1) | TWI618222B (https=) |
| WO (1) | WO2015009614A1 (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9418985B2 (en) | 2013-07-16 | 2016-08-16 | Qualcomm Incorporated | Complete system-on-chip (SOC) using monolithic three dimensional (3D) integrated circuit (IC) (3DIC) technology |
| ES2798115T3 (es) * | 2014-06-20 | 2020-12-09 | Nagravision Sa | Módulo de interfaz física |
| US9256246B1 (en) * | 2015-01-29 | 2016-02-09 | Qualcomm Incorporated | Clock skew compensation with adaptive body biasing in three-dimensional (3D) integrated circuits (ICs) (3DICs) |
| US9628077B2 (en) | 2015-03-04 | 2017-04-18 | Qualcomm Incorporated | Dual power swing pipeline design with separation of combinational and sequential logics |
| CN105391823B (zh) * | 2015-11-25 | 2019-02-12 | 上海新储集成电路有限公司 | 一种降低移动设备尺寸和功耗的方法 |
| CN105742277B (zh) * | 2016-04-13 | 2018-06-22 | 中国航天科技集团公司第九研究院第七七一研究所 | 一种大容量立体集成sram存储器三维扩展方法 |
| US9523760B1 (en) * | 2016-04-15 | 2016-12-20 | Cognitive Systems Corp. | Detecting motion based on repeated wireless transmissions |
| US9754923B1 (en) | 2016-05-09 | 2017-09-05 | Qualcomm Incorporated | Power gate placement techniques in three-dimensional (3D) integrated circuits (ICs) (3DICs) |
| US9929149B2 (en) | 2016-06-21 | 2018-03-27 | Arm Limited | Using inter-tier vias in integrated circuits |
| US9871020B1 (en) * | 2016-07-14 | 2018-01-16 | Globalfoundries Inc. | Through silicon via sharing in a 3D integrated circuit |
| US10678985B2 (en) * | 2016-08-31 | 2020-06-09 | Arm Limited | Method for generating three-dimensional integrated circuit design |
| US9712168B1 (en) * | 2016-09-14 | 2017-07-18 | Qualcomm Incorporated | Process variation power control in three-dimensional (3D) integrated circuits (ICs) (3DICs) |
| US10176147B2 (en) * | 2017-03-07 | 2019-01-08 | Qualcomm Incorporated | Multi-processor core three-dimensional (3D) integrated circuits (ICs) (3DICs), and related methods |
| US10727965B2 (en) * | 2017-11-21 | 2020-07-28 | Western Digital Technologies, Inc. | System and method for time stamp synchronization |
| US10719100B2 (en) | 2017-11-21 | 2020-07-21 | Western Digital Technologies, Inc. | System and method for time stamp synchronization |
| CN110069795A (zh) * | 2018-01-23 | 2019-07-30 | 长芯半导体有限公司 | 快速定制芯片方法 |
| GB2586049B (en) * | 2019-07-31 | 2022-03-09 | Murata Manufacturing Co | Power supply output device |
| GB2586050B (en) * | 2019-07-31 | 2021-11-10 | Murata Manufacturing Co | Power supply output device |
| US11270917B2 (en) * | 2020-06-01 | 2022-03-08 | Alibaba Group Holding Limited | Scalable and flexible architectures for integrated circuit (IC) design and fabrication |
| CN112769402B (zh) * | 2020-12-21 | 2024-05-17 | 中国航天科工集团八五一一研究所 | 基于TSV技术的X/Ku波段宽带变频组件 |
| EP4024222A1 (en) | 2021-01-04 | 2022-07-06 | Imec VZW | An integrated circuit with 3d partitioning |
| KR102443742B1 (ko) * | 2021-02-08 | 2022-09-15 | 고려대학교 산학협력단 | 모놀리식 3d 집적 기술 기반 스크래치패드 메모리 |
| US12308072B2 (en) * | 2021-03-10 | 2025-05-20 | Invention And Collaboration Laboratory Pte. Ltd. | Integrated scaling and stretching platform for optimizing monolithic integration and/or heterogeneous integration in a single semiconductor die |
| US12230607B2 (en) * | 2021-03-31 | 2025-02-18 | Taiwan Semiconductor Manufacturing Company Limited | Semiconductor device including power management die in a stack and methods of forming the same |
| KR102896801B1 (ko) * | 2022-02-23 | 2025-12-05 | 한국과학기술원 | 3차원 집적형 고주파 혼성 회로 구조체 및 그의 제조 방법 |
| KR20240033841A (ko) | 2022-09-06 | 2024-03-13 | 삼성전자주식회사 | 반도체 장치 |
| WO2025117577A1 (en) * | 2023-12-01 | 2025-06-05 | The Penn State Research Foundation | Monolithic three-dimensional (3d) integration of two dimensional (2d) field effect transistors (fets) |
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| JPS61131474A (ja) * | 1984-11-30 | 1986-06-19 | Agency Of Ind Science & Technol | 積層型半導体装置 |
| US6046078A (en) * | 1997-04-28 | 2000-04-04 | Megamos Corp. | Semiconductor device fabrication with reduced masking steps |
| US20030015768A1 (en) | 2001-07-23 | 2003-01-23 | Motorola, Inc. | Structure and method for microelectromechanical system (MEMS) devices integrated with other semiconductor structures |
| WO2003030252A2 (en) | 2001-09-28 | 2003-04-10 | Hrl Laboratories, Llc | Process for producing interconnects |
| US7126214B2 (en) * | 2001-12-05 | 2006-10-24 | Arbor Company Llp | Reconfigurable processor module comprising hybrid stacked integrated circuit die elements |
| JP2004165269A (ja) * | 2002-11-11 | 2004-06-10 | Canon Inc | 積層形半導体装置 |
| KR100569590B1 (ko) | 2003-12-30 | 2006-04-10 | 매그나칩 반도체 유한회사 | 고주파 반도체 장치 및 그 제조방법 |
| DE102006030267B4 (de) * | 2006-06-30 | 2009-04-16 | Advanced Micro Devices, Inc., Sunnyvale | Nano-Einprägetechnik mit erhöhter Flexibilität in Bezug auf die Justierung und die Formung von Strukturelementen |
| US7692448B2 (en) | 2007-09-12 | 2010-04-06 | Neal Solomon | Reprogrammable three dimensional field programmable gate arrays |
| US8136071B2 (en) | 2007-09-12 | 2012-03-13 | Neal Solomon | Three dimensional integrated circuits and methods of fabrication |
| ATE512114T1 (de) * | 2008-09-03 | 2011-06-15 | St Microelectronics Tours Sas | Dreidimensionale struktur mit sehr hoher dichte |
| US20110199116A1 (en) | 2010-02-16 | 2011-08-18 | NuPGA Corporation | Method for fabrication of a semiconductor device and structure |
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| US8466610B2 (en) * | 2009-05-14 | 2013-06-18 | Sri International | Low cost high efficiency transparent organic electrodes for organic optoelectronic devices |
| TWI501380B (zh) * | 2010-01-29 | 2015-09-21 | 財團法人國家實驗研究院國家晶片系統設計中心 | 多基板晶片模組堆疊之三維系統晶片結構 |
| US8450779B2 (en) | 2010-03-08 | 2013-05-28 | International Business Machines Corporation | Graphene based three-dimensional integrated circuit device |
| JP2012019018A (ja) * | 2010-07-07 | 2012-01-26 | Toshiba Corp | 半導体装置及びその製造方法 |
| CN102024782B (zh) * | 2010-10-12 | 2012-07-25 | 北京大学 | 三维垂直互联结构及其制作方法 |
| EP2469597A3 (en) | 2010-12-23 | 2016-06-29 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Multi-level integrated circuit, device and method for modeling multi-level integrated circuits |
| US8384215B2 (en) * | 2010-12-30 | 2013-02-26 | Industrial Technology Research Institute | Wafer level molding structure |
| DE102011004581A1 (de) * | 2011-02-23 | 2012-08-23 | Globalfoundries Dresden Module One Limited Liability Company & Co. Kg | Technik zur Reduzierung der plasmahervorgerufenen Ätzschäden während der Herstellung von Kontaktdurchführungen in Zwischenschichtdielektrika durch modifizierten HF-Leistungshochlauf |
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| WO2013052679A1 (en) | 2011-10-04 | 2013-04-11 | Qualcomm Incorporated | Monolithic 3-d integration using graphene |
| US9496255B2 (en) * | 2011-11-16 | 2016-11-15 | Qualcomm Incorporated | Stacked CMOS chipset having an insulating layer and a secondary layer and method of forming same |
| JP5981711B2 (ja) * | 2011-12-16 | 2016-08-31 | ルネサスエレクトロニクス株式会社 | 半導体装置および半導体装置の製造方法 |
| JP2013215917A (ja) | 2012-04-05 | 2013-10-24 | Seiko Epson Corp | 印刷装置、及び、印刷方法 |
| CN103545275B (zh) * | 2012-07-12 | 2016-02-17 | 中芯国际集成电路制造(上海)有限公司 | 硅通孔封装结构及形成方法 |
| US8889491B2 (en) * | 2013-01-28 | 2014-11-18 | International Business Machines Corporation | Method of forming electronic fuse line with modified cap |
| KR20140113024A (ko) * | 2013-03-15 | 2014-09-24 | 에스케이하이닉스 주식회사 | 저항 변화 메모리 장치 및 그 구동방법 |
| US9171608B2 (en) * | 2013-03-15 | 2015-10-27 | Qualcomm Incorporated | Three-dimensional (3D) memory cell separation among 3D integrated circuit (IC) tiers, and related 3D integrated circuits (3DICS), 3DIC processor cores, and methods |
| US9418985B2 (en) | 2013-07-16 | 2016-08-16 | Qualcomm Incorporated | Complete system-on-chip (SOC) using monolithic three dimensional (3D) integrated circuit (IC) (3DIC) technology |
| US9070711B2 (en) * | 2013-08-02 | 2015-06-30 | Globalfoundries Inc. | Methods of forming cap layers for semiconductor devices with self-aligned contact elements and the resulting devices |
-
2013
- 2013-08-29 US US14/013,399 patent/US9418985B2/en not_active Expired - Fee Related
-
2014
- 2014-06-30 TW TW103122569A patent/TWI618222B/zh not_active IP Right Cessation
- 2014-07-14 JP JP2016527009A patent/JP2016529702A/ja active Pending
- 2014-07-14 EP EP14747230.2A patent/EP3022766A1/en not_active Ceased
- 2014-07-14 CA CA2917586A patent/CA2917586C/en active Active
- 2014-07-14 WO PCT/US2014/046503 patent/WO2015009614A1/en not_active Ceased
- 2014-07-14 KR KR1020167003723A patent/KR101832330B1/ko not_active Expired - Fee Related
- 2014-07-14 CN CN201480039458.6A patent/CN105378918B/zh active Active
- 2014-07-14 BR BR112016000868-5A patent/BR112016000868B1/pt active IP Right Grant
-
2016
- 2016-08-09 US US15/231,836 patent/US9583473B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP3022766A1 (en) | 2016-05-25 |
| CN105378918A (zh) | 2016-03-02 |
| CA2917586C (en) | 2019-02-12 |
| US20150022262A1 (en) | 2015-01-22 |
| TWI618222B (zh) | 2018-03-11 |
| KR101832330B1 (ko) | 2018-02-26 |
| JP2016529702A (ja) | 2016-09-23 |
| WO2015009614A1 (en) | 2015-01-22 |
| US9418985B2 (en) | 2016-08-16 |
| TW201513299A (zh) | 2015-04-01 |
| BR112016000868A2 (https=) | 2017-07-25 |
| CA2917586A1 (en) | 2015-01-22 |
| BR112016000868B1 (pt) | 2022-08-16 |
| KR20160032182A (ko) | 2016-03-23 |
| US20160351553A1 (en) | 2016-12-01 |
| US9583473B2 (en) | 2017-02-28 |
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