CN102193059B - 探针卡的输送机构、探针卡的输送方法和探针装置 - Google Patents

探针卡的输送机构、探针卡的输送方法和探针装置 Download PDF

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Publication number
CN102193059B
CN102193059B CN201110038311.3A CN201110038311A CN102193059B CN 102193059 B CN102193059 B CN 102193059B CN 201110038311 A CN201110038311 A CN 201110038311A CN 102193059 B CN102193059 B CN 102193059B
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China
Prior art keywords
card
probe card
conveying mechanism
probe
mounting table
Prior art date
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Active
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CN201110038311.3A
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English (en)
Chinese (zh)
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CN102193059A (zh
Inventor
井上大辅
秋山收司
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Publication of CN102193059A publication Critical patent/CN102193059A/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
CN201110038311.3A 2010-02-12 2011-02-12 探针卡的输送机构、探针卡的输送方法和探针装置 Active CN102193059B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010028521A JP5517344B2 (ja) 2010-02-12 2010-02-12 プローブカードの搬送機構、プローブカードの搬送方法及びプローブ装置
JP2010-028521 2010-02-12

Publications (2)

Publication Number Publication Date
CN102193059A CN102193059A (zh) 2011-09-21
CN102193059B true CN102193059B (zh) 2015-03-25

Family

ID=44596307

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110038311.3A Active CN102193059B (zh) 2010-02-12 2011-02-12 探针卡的输送机构、探针卡的输送方法和探针装置

Country Status (4)

Country Link
JP (1) JP5517344B2 (ko)
KR (1) KR101272449B1 (ko)
CN (1) CN102193059B (ko)
TW (1) TWI506287B (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507996B (zh) * 2011-09-27 2014-02-26 沈玉良 探针卡升降机构
JP5970218B2 (ja) * 2012-03-26 2016-08-17 東京エレクトロン株式会社 プローブ装置
JP6054150B2 (ja) 2012-11-22 2016-12-27 日本電子材料株式会社 プローブカードケース及びプローブカードの搬送方法
KR101503143B1 (ko) * 2013-01-31 2015-03-18 세메스 주식회사 프로브 카드의 반송 방법
JP6220596B2 (ja) * 2013-08-01 2017-10-25 東京エレクトロン株式会社 プローバ
JP6271257B2 (ja) * 2014-01-08 2018-01-31 東京エレクトロン株式会社 基板検査装置及びプローブカード搬送方法
KR102335827B1 (ko) 2014-12-24 2021-12-08 삼성전자주식회사 프로브 카드 로딩 장치, 그를 포함하는 프로브 카드 관리 시스템
JP6523838B2 (ja) * 2015-07-15 2019-06-05 東京エレクトロン株式会社 プローブカード搬送装置、プローブカード搬送方法及びプローブ装置
CN106873195B (zh) * 2015-12-11 2020-10-30 De&T株式会社 探针单元更换装置
JP6861580B2 (ja) * 2017-06-05 2021-04-21 東京エレクトロン株式会社 検査装置および検査システム
JP7186647B2 (ja) * 2019-03-22 2022-12-09 東京エレクトロン株式会社 搬送装置
KR102480726B1 (ko) * 2020-12-31 2022-12-26 주식회사 쎄믹스 프로브 카드 체인저가 구비된 프로버 시스템

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161173A (ja) * 1987-12-16 1989-06-23 Tokyo Electron Ltd プローブ装置のプローブカード自動交換方法
JP2575074B2 (ja) * 1991-08-13 1997-01-22 東京エレクトロン株式会社 ウエハプローバ
JP2606554Y2 (ja) * 1992-01-17 2000-11-27 株式会社東京精密 プロービング装置
JPH10308424A (ja) * 1997-05-08 1998-11-17 Tokyo Electron Ltd プローブカードクランプ機構及びプローブ装置
JP4104099B2 (ja) * 1999-07-09 2008-06-18 東京エレクトロン株式会社 プローブカード搬送機構
JP4798595B2 (ja) * 2001-08-07 2011-10-19 東京エレクトロン株式会社 プローブカード搬送装置及びプローブカード搬送方法
JP4123408B2 (ja) * 2001-12-13 2008-07-23 東京エレクトロン株式会社 プローブカード交換装置
JP4875332B2 (ja) * 2005-09-21 2012-02-15 東京エレクトロン株式会社 プローブカード移載補助装置及び検査設備
CN101346635A (zh) * 2005-12-27 2009-01-14 株式会社爱德万测试 Tcp处理装置以及tcp处理装置中的连接端子的对位方法
US20080016676A1 (en) * 2006-07-18 2008-01-24 Jones Robert M Automatic winder for an inside brushless stator
KR100847577B1 (ko) * 2006-12-27 2008-07-21 세크론 주식회사 프로빙 검사장치
JP5049419B2 (ja) * 2007-07-25 2012-10-17 東京エレクトロン株式会社 プローブカード用台車及びこの台車を用いるプローブカードの取り扱い方法

Also Published As

Publication number Publication date
KR101272449B1 (ko) 2013-06-07
JP2011165995A (ja) 2011-08-25
JP5517344B2 (ja) 2014-06-11
TWI506287B (zh) 2015-11-01
KR20110093712A (ko) 2011-08-18
TW201144835A (en) 2011-12-16
CN102193059A (zh) 2011-09-21

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