ATE534146T1 - Amorpher oxid-halbleiter und diesen verwendender dünnschichttransistor - Google Patents
Amorpher oxid-halbleiter und diesen verwendender dünnschichttransistorInfo
- Publication number
- ATE534146T1 ATE534146T1 AT09010057T AT09010057T ATE534146T1 AT E534146 T1 ATE534146 T1 AT E534146T1 AT 09010057 T AT09010057 T AT 09010057T AT 09010057 T AT09010057 T AT 09010057T AT E534146 T1 ATE534146 T1 AT E534146T1
- Authority
- AT
- Austria
- Prior art keywords
- oxide semiconductor
- amorphic
- thin film
- same
- film transistor
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 239000010409 thin film Substances 0.000 title 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 abstract 3
- 229910052739 hydrogen Inorganic materials 0.000 abstract 3
- 239000001257 hydrogen Substances 0.000 abstract 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract 2
- 239000001301 oxygen Substances 0.000 abstract 2
- 229910052760 oxygen Inorganic materials 0.000 abstract 2
- 125000004431 deuterium atom Chemical group 0.000 abstract 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 abstract 1
- 229910052738 indium Inorganic materials 0.000 abstract 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 abstract 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6746—Amorphous silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
- H10D30/6756—Amorphous oxide semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
Landscapes
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008219888 | 2008-08-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE534146T1 true ATE534146T1 (de) | 2011-12-15 |
Family
ID=41426348
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT09010057T ATE534146T1 (de) | 2008-08-28 | 2009-08-04 | Amorpher oxid-halbleiter und diesen verwendender dünnschichttransistor |
Country Status (6)
| Country | Link |
|---|---|
| US (3) | US8129718B2 (OSRAM) |
| EP (1) | EP2159844B1 (OSRAM) |
| JP (1) | JP5725698B2 (OSRAM) |
| KR (1) | KR101194255B1 (OSRAM) |
| CN (2) | CN103077961B (OSRAM) |
| AT (1) | ATE534146T1 (OSRAM) |
Families Citing this family (101)
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| US8129718B2 (en) * | 2008-08-28 | 2012-03-06 | Canon Kabushiki Kaisha | Amorphous oxide semiconductor and thin film transistor using the same |
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| CN111628017A (zh) * | 2020-06-16 | 2020-09-04 | 深圳先进技术研究院 | 掺杂氢的铟镓锌氧化物膜层、其制备方法及其应用、晶体管及其制备方法 |
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| JP3352118B2 (ja) * | 1992-08-25 | 2002-12-03 | キヤノン株式会社 | 半導体装置及びその製造方法 |
| US6058945A (en) * | 1996-05-28 | 2000-05-09 | Canon Kabushiki Kaisha | Cleaning methods of porous surface and semiconductor surface |
| JP3276930B2 (ja) * | 1998-11-17 | 2002-04-22 | 科学技術振興事業団 | トランジスタ及び半導体装置 |
| JP3445187B2 (ja) * | 1999-08-03 | 2003-09-08 | キヤノン株式会社 | 半導体素子の欠陥補償方法 |
| JP2002206168A (ja) * | 2000-10-24 | 2002-07-26 | Canon Inc | シリコン系薄膜の形成方法、シリコン系半導体層の形成方法及び光起電力素子 |
| US6858308B2 (en) * | 2001-03-12 | 2005-02-22 | Canon Kabushiki Kaisha | Semiconductor element, and method of forming silicon-based film |
| JP2003007629A (ja) * | 2001-04-03 | 2003-01-10 | Canon Inc | シリコン系膜の形成方法、シリコン系膜および半導体素子 |
| JP2004289034A (ja) * | 2003-03-25 | 2004-10-14 | Canon Inc | 酸化亜鉛膜の処理方法、それを用いた光起電力素子の製造方法 |
| CN1806322A (zh) * | 2003-06-20 | 2006-07-19 | 夏普株式会社 | 半导体装置及其制造方法以及电子设备 |
| US20070194379A1 (en) * | 2004-03-12 | 2007-08-23 | Japan Science And Technology Agency | Amorphous Oxide And Thin Film Transistor |
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| JP5126730B2 (ja) * | 2004-11-10 | 2013-01-23 | キヤノン株式会社 | 電界効果型トランジスタの製造方法 |
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| JP5110803B2 (ja) * | 2006-03-17 | 2012-12-26 | キヤノン株式会社 | 酸化物膜をチャネルに用いた電界効果型トランジスタ及びその製造方法 |
| US20070215945A1 (en) * | 2006-03-20 | 2007-09-20 | Canon Kabushiki Kaisha | Light control device and display |
| US20080023703A1 (en) * | 2006-07-31 | 2008-01-31 | Randy Hoffman | System and method for manufacturing a thin-film device |
| JP5127183B2 (ja) | 2006-08-23 | 2013-01-23 | キヤノン株式会社 | アモルファス酸化物半導体膜を用いた薄膜トランジスタの製造方法 |
| JP4332545B2 (ja) * | 2006-09-15 | 2009-09-16 | キヤノン株式会社 | 電界効果型トランジスタ及びその製造方法 |
| US8143115B2 (en) | 2006-12-05 | 2012-03-27 | Canon Kabushiki Kaisha | Method for manufacturing thin film transistor using oxide semiconductor and display apparatus |
| JP5105842B2 (ja) | 2006-12-05 | 2012-12-26 | キヤノン株式会社 | 酸化物半導体を用いた表示装置及びその製造方法 |
| JP5305630B2 (ja) | 2006-12-05 | 2013-10-02 | キヤノン株式会社 | ボトムゲート型薄膜トランジスタの製造方法及び表示装置の製造方法 |
| TWI478347B (zh) * | 2007-02-09 | 2015-03-21 | Idemitsu Kosan Co | A thin film transistor, a thin film transistor substrate, and an image display device, and an image display device, and a semiconductor device |
| JP5354862B2 (ja) | 2007-02-19 | 2013-11-27 | キヤノン株式会社 | アモルファス絶縁体膜及び薄膜トランジスタ |
| US8129718B2 (en) * | 2008-08-28 | 2012-03-06 | Canon Kabushiki Kaisha | Amorphous oxide semiconductor and thin film transistor using the same |
| US9082857B2 (en) * | 2008-09-01 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising an oxide semiconductor layer |
| CN102257621B (zh) * | 2008-12-19 | 2013-08-21 | 株式会社半导体能源研究所 | 晶体管的制造方法 |
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- 2009-08-04 EP EP09010057A patent/EP2159844B1/en not_active Not-in-force
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| US8129718B2 (en) | 2012-03-06 |
| CN101661952A (zh) | 2010-03-03 |
| US20130207106A1 (en) | 2013-08-15 |
| CN103077961B (zh) | 2016-04-13 |
| CN103077961A (zh) | 2013-05-01 |
| US20100051938A1 (en) | 2010-03-04 |
| CN101661952B (zh) | 2013-02-06 |
| EP2159844A3 (en) | 2010-05-19 |
| KR20100026990A (ko) | 2010-03-10 |
| KR101194255B1 (ko) | 2012-10-29 |
| US8426243B2 (en) | 2013-04-23 |
| EP2159844B1 (en) | 2011-11-16 |
| US20120115276A1 (en) | 2012-05-10 |
| EP2159844A2 (en) | 2010-03-03 |
| JP5725698B2 (ja) | 2015-05-27 |
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