ATE517435T1 - Feldeffekttransistor - Google Patents

Feldeffekttransistor

Info

Publication number
ATE517435T1
ATE517435T1 AT08869339T AT08869339T ATE517435T1 AT E517435 T1 ATE517435 T1 AT E517435T1 AT 08869339 T AT08869339 T AT 08869339T AT 08869339 T AT08869339 T AT 08869339T AT E517435 T1 ATE517435 T1 AT E517435T1
Authority
AT
Austria
Prior art keywords
field effect
effect transistor
atom
amorphous oxide
group
Prior art date
Application number
AT08869339T
Other languages
English (en)
Inventor
Naho Itagaki
Amita Goyal
Tatsuya Iwasaki
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of ATE517435T1 publication Critical patent/ATE517435T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/7869Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
AT08869339T 2008-01-08 2008-12-25 Feldeffekttransistor ATE517435T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008001336A JP5213458B2 (ja) 2008-01-08 2008-01-08 アモルファス酸化物及び電界効果型トランジスタ
PCT/JP2008/073924 WO2009087943A1 (en) 2008-01-08 2008-12-25 Amorphous oxide and field effect transistor

Publications (1)

Publication Number Publication Date
ATE517435T1 true ATE517435T1 (de) 2011-08-15

Family

ID=40503360

Family Applications (1)

Application Number Title Priority Date Filing Date
AT08869339T ATE517435T1 (de) 2008-01-08 2008-12-25 Feldeffekttransistor

Country Status (7)

Country Link
US (1) US8212248B2 (de)
EP (1) EP2240965B1 (de)
JP (1) JP5213458B2 (de)
CN (1) CN101911304B (de)
AT (1) ATE517435T1 (de)
TW (1) TWI433312B (de)
WO (1) WO2009087943A1 (de)

Families Citing this family (90)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI535037B (zh) * 2008-11-07 2016-05-21 半導體能源研究所股份有限公司 半導體裝置和其製造方法
JP2011066375A (ja) 2009-08-18 2011-03-31 Fujifilm Corp 非晶質酸化物半導体材料、電界効果型トランジスタ及び表示装置
US9805641B2 (en) 2009-09-04 2017-10-31 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device including the same
WO2011027467A1 (ja) 2009-09-04 2011-03-10 株式会社 東芝 薄膜トランジスタ及びその製造方法
KR102111468B1 (ko) 2009-09-24 2020-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
WO2011036999A1 (en) * 2009-09-24 2011-03-31 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor film and semiconductor device
KR20120084751A (ko) 2009-10-05 2012-07-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR101754701B1 (ko) 2009-10-09 2017-07-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 이를 제조하기 위한 방법
KR101915251B1 (ko) 2009-10-16 2018-11-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101903918B1 (ko) 2009-10-16 2018-10-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 논리 회로 및 반도체 장치
KR101426723B1 (ko) 2009-10-16 2014-08-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
WO2011048968A1 (en) * 2009-10-21 2011-04-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101996773B1 (ko) * 2009-10-21 2019-07-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR20120096463A (ko) * 2009-10-21 2012-08-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 표시 장치를 갖는 전자 기기
KR20220153647A (ko) * 2009-10-29 2022-11-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101930682B1 (ko) 2009-10-29 2018-12-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
EP2494597A4 (de) 2009-10-30 2015-03-18 Semiconductor Energy Lab Halbleiterbauelement
SG188112A1 (en) * 2009-10-30 2013-03-28 Semiconductor Energy Lab Logic circuit and semiconductor device
CN104867982B (zh) 2009-10-30 2018-08-03 株式会社半导体能源研究所 半导体装置及其制造方法
CN105070717B (zh) 2009-10-30 2019-01-01 株式会社半导体能源研究所 半导体装置
KR101837102B1 (ko) * 2009-10-30 2018-03-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
CN104485341A (zh) 2009-11-06 2015-04-01 株式会社半导体能源研究所 半导体装置
WO2011055669A1 (en) 2009-11-06 2011-05-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2011058882A1 (en) * 2009-11-13 2011-05-19 Semiconductor Energy Laboratory Co., Ltd. Sputtering target and manufacturing method thereof, and transistor
JP5596963B2 (ja) * 2009-11-19 2014-09-24 出光興産株式会社 スパッタリングターゲット及びそれを用いた薄膜トランジスタ
CN104332177B (zh) * 2009-11-20 2018-05-08 株式会社半导体能源研究所 非易失性锁存电路和逻辑电路,以及使用其的半导体器件
KR101790365B1 (ko) * 2009-11-20 2017-10-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011062067A1 (en) * 2009-11-20 2011-05-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102451852B1 (ko) * 2009-11-20 2022-10-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101329849B1 (ko) 2009-11-28 2013-11-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
WO2011068106A1 (en) * 2009-12-04 2011-06-09 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device including the same
KR101720072B1 (ko) 2009-12-11 2017-03-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 불휘발성 래치 회로와 논리 회로, 및 이를 사용한 반도체 장치
WO2011070929A1 (en) 2009-12-11 2011-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
KR101804589B1 (ko) * 2009-12-11 2018-01-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
KR101729933B1 (ko) 2009-12-18 2017-04-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 불휘발성 래치 회로와 논리 회로, 및 이를 사용한 반도체 장치
KR101813460B1 (ko) 2009-12-18 2017-12-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011077916A1 (en) 2009-12-24 2011-06-30 Semiconductor Energy Laboratory Co., Ltd. Display device
CN102804360B (zh) 2009-12-25 2014-12-17 株式会社半导体能源研究所 半导体装置
EP3550604A1 (de) 2009-12-25 2019-10-09 Semiconductor Energy Laboratory Co., Ltd. Halbleiterbauelement
US8780629B2 (en) * 2010-01-15 2014-07-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and driving method thereof
KR101805378B1 (ko) * 2010-01-24 2017-12-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치와 이의 제조 방법
CN102725842B (zh) * 2010-02-05 2014-12-03 株式会社半导体能源研究所 半导体器件
WO2011108346A1 (en) * 2010-03-05 2011-09-09 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of oxide semiconductor film and manufacturing method of transistor
WO2011114868A1 (en) * 2010-03-19 2011-09-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101840797B1 (ko) * 2010-03-19 2018-03-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 메모리 장치
JP5727832B2 (ja) * 2010-03-31 2015-06-03 株式会社半導体エネルギー研究所 トランジスタ
KR101872927B1 (ko) * 2010-05-21 2018-06-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2012002186A1 (en) 2010-07-02 2012-01-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8422272B2 (en) 2010-08-06 2013-04-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and driving method thereof
JP2012064201A (ja) * 2010-08-19 2012-03-29 Semiconductor Energy Lab Co Ltd 入出力装置及び入出力装置の駆動方法
JP2012256821A (ja) 2010-09-13 2012-12-27 Semiconductor Energy Lab Co Ltd 記憶装置
WO2012060253A1 (en) 2010-11-05 2012-05-10 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2012164963A (ja) 2010-11-26 2012-08-30 Kobe Steel Ltd 薄膜トランジスタの半導体層用酸化物およびスパッタリングターゲット、並びに薄膜トランジスタ
JP5723262B2 (ja) 2010-12-02 2015-05-27 株式会社神戸製鋼所 薄膜トランジスタおよびスパッタリングターゲット
JP2012151453A (ja) 2010-12-28 2012-08-09 Semiconductor Energy Lab Co Ltd 半導体装置および半導体装置の駆動方法
KR102026718B1 (ko) 2011-01-14 2019-09-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 기억장치, 반도체 장치, 검출 방법
JP2013153118A (ja) 2011-03-09 2013-08-08 Kobe Steel Ltd 薄膜トランジスタの半導体層用酸化物、上記酸化物を備えた薄膜トランジスタの半導体層および薄膜トランジスタ
US8859330B2 (en) * 2011-03-23 2014-10-14 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
TWI567735B (zh) 2011-03-31 2017-01-21 半導體能源研究所股份有限公司 記憶體電路,記憶體單元,及訊號處理電路
JP2012235104A (ja) 2011-04-22 2012-11-29 Kobe Steel Ltd 薄膜トランジスタ構造、ならびにその構造を備えた薄膜トランジスタおよび表示装置
KR20140036279A (ko) * 2011-06-01 2014-03-25 메르크 파텐트 게엠베하 하이브리드 양극성 tft들
JP5984354B2 (ja) * 2011-10-07 2016-09-06 住友電気工業株式会社 半導体素子
US9076505B2 (en) 2011-12-09 2015-07-07 Semiconductor Energy Laboratory Co., Ltd. Memory device
JP6204036B2 (ja) 2012-03-16 2017-09-27 株式会社神戸製鋼所 酸化物半導体薄膜の評価方法、及び酸化物半導体薄膜の品質管理方法
US9208849B2 (en) 2012-04-12 2015-12-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for driving semiconductor device, and electronic device
WO2013168748A1 (ja) 2012-05-09 2013-11-14 株式会社神戸製鋼所 薄膜トランジスタおよび表示装置
CN102751240B (zh) * 2012-05-18 2015-03-11 京东方科技集团股份有限公司 薄膜晶体管阵列基板及其制造方法、显示面板、显示装置
JP6068232B2 (ja) 2012-05-30 2017-01-25 株式会社神戸製鋼所 薄膜トランジスタの半導体層用酸化物、薄膜トランジスタ、表示装置およびスパッタリングターゲット
JP6043244B2 (ja) 2012-06-06 2016-12-14 株式会社神戸製鋼所 薄膜トランジスタ
JP6002088B2 (ja) 2012-06-06 2016-10-05 株式会社神戸製鋼所 薄膜トランジスタ
JP6059460B2 (ja) 2012-07-20 2017-01-11 株式会社コベルコ科研 ターゲット組立体
JP2014225626A (ja) 2012-08-31 2014-12-04 株式会社神戸製鋼所 薄膜トランジスタおよび表示装置
JP6134230B2 (ja) 2012-08-31 2017-05-24 株式会社神戸製鋼所 薄膜トランジスタおよび表示装置
JP5722293B2 (ja) 2012-10-19 2015-05-20 株式会社神戸製鋼所 薄膜トランジスタ
WO2014073374A1 (en) 2012-11-06 2014-05-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and driving method thereof
JP6152348B2 (ja) 2013-01-11 2017-06-21 株式会社神戸製鋼所 酸化物半導体薄膜の評価方法及び酸化物半導体薄膜の品質管理方法
KR102112367B1 (ko) 2013-02-12 2020-05-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US9012261B2 (en) * 2013-03-13 2015-04-21 Intermolecular, Inc. High productivity combinatorial screening for stable metal oxide TFTs
WO2014157019A1 (en) 2013-03-25 2014-10-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6516978B2 (ja) 2013-07-17 2019-05-22 株式会社半導体エネルギー研究所 半導体装置
JP5798669B2 (ja) 2013-12-03 2015-10-21 株式会社神戸製鋼所 酸化物半導体薄膜の評価方法、及び酸化物半導体薄膜の品質管理方法、並びに上記評価方法に用いられる評価装置
JP6442321B2 (ja) 2014-03-07 2018-12-19 株式会社半導体エネルギー研究所 半導体装置及びその駆動方法、並びに電子機器
WO2015170220A1 (en) 2014-05-09 2015-11-12 Semiconductor Energy Laboratory Co., Ltd. Memory device and electronic device
JP6283273B2 (ja) 2014-07-01 2018-02-21 株式会社神戸製鋼所 薄膜トランジスタ評価用の積層構造体の評価方法
JP5993496B2 (ja) 2014-07-16 2016-09-14 株式会社神戸製鋼所 酸化物半導体薄膜、及び前記酸化物半導体薄膜の表面に保護膜を有する積層体の品質評価方法、及び酸化物半導体薄膜の品質管理方法
CN104716196B (zh) * 2015-03-18 2017-08-08 京东方科技集团股份有限公司 薄膜晶体管及其制作方法、阵列基板及显示装置
US9773787B2 (en) 2015-11-03 2017-09-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, memory device, electronic device, or method for driving the semiconductor device
CN105977164A (zh) * 2016-06-28 2016-09-28 京东方科技集团股份有限公司 一种薄膜晶体管及其制作方法、阵列基板和显示面板
KR102458660B1 (ko) 2016-08-03 2022-10-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
JPWO2019102316A1 (ja) * 2017-11-24 2020-12-10 株式会社半導体エネルギー研究所 酸化物半導体を有するトランジスタ

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09153458A (ja) 1995-09-26 1997-06-10 Fujitsu Ltd 薄膜半導体装置およびその製造方法
WO2000012445A1 (fr) * 1998-08-31 2000-03-09 Idemitsu Kosan Co., Ltd. Cible pour film electroconducteur transparent, matiere electroconductrice transparente, verre electroconducteur transparent et film electroconducteur transparent
US6563559B2 (en) * 2000-02-02 2003-05-13 Sanyo Electric Co., Ltd. Reflective liquid crystal display having increase luminance for each display pixel
JP4089858B2 (ja) 2000-09-01 2008-05-28 国立大学法人東北大学 半導体デバイス
US6646285B1 (en) 2002-04-05 2003-11-11 International Business Machines Corporation Molecular electronic device using metal-metal bonded complexes
US7189992B2 (en) 2002-05-21 2007-03-13 State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University Transistor structures having a transparent channel
JP4108633B2 (ja) 2003-06-20 2008-06-25 シャープ株式会社 薄膜トランジスタおよびその製造方法ならびに電子デバイス
TWI221341B (en) 2003-09-18 2004-09-21 Ind Tech Res Inst Method and material for forming active layer of thin film transistor
US7297977B2 (en) 2004-03-12 2007-11-20 Hewlett-Packard Development Company, L.P. Semiconductor device
US7282782B2 (en) 2004-03-12 2007-10-16 Hewlett-Packard Development Company, L.P. Combined binary oxide semiconductor device
US7242039B2 (en) 2004-03-12 2007-07-10 Hewlett-Packard Development Company, L.P. Semiconductor device
CN102867855B (zh) 2004-03-12 2015-07-15 独立行政法人科学技术振兴机构 薄膜晶体管及其制造方法
US7145174B2 (en) 2004-03-12 2006-12-05 Hewlett-Packard Development Company, Lp. Semiconductor device
JP4544518B2 (ja) 2004-09-01 2010-09-15 キヤノン株式会社 電界励起型発光素子及び画像表示装置
RU2369940C2 (ru) 2004-11-10 2009-10-10 Кэнон Кабусики Кайся Аморфный оксид и полевой транзистор с его использованием
US20060118406A1 (en) 2004-12-08 2006-06-08 Energy Photovoltaics, Inc. Sputtered transparent conductive films
US7771858B2 (en) * 2005-07-12 2010-08-10 Gm Global Technology Operations, Inc. Coated steel bipolar plates
JP5006598B2 (ja) 2005-09-16 2012-08-22 キヤノン株式会社 電界効果型トランジスタ
US20070071985A1 (en) * 2005-09-29 2007-03-29 Prabhat Kumar Sputtering target, low resistivity, transparent conductive film, method for producing such film and composition for use therein
JP5177954B2 (ja) 2006-01-30 2013-04-10 キヤノン株式会社 電界効果型トランジスタ
JP5294565B2 (ja) 2006-03-17 2013-09-18 キヤノン株式会社 発光素子及び発光素子の製造方法
JP5110803B2 (ja) 2006-03-17 2012-12-26 キヤノン株式会社 酸化物膜をチャネルに用いた電界効果型トランジスタ及びその製造方法
JP5000937B2 (ja) * 2006-06-30 2012-08-15 三菱電機株式会社 半導体デバイスの製造方法
JP4332545B2 (ja) 2006-09-15 2009-09-16 キヤノン株式会社 電界効果型トランジスタ及びその製造方法
JP5116290B2 (ja) 2006-11-21 2013-01-09 キヤノン株式会社 薄膜トランジスタの製造方法
KR100858088B1 (ko) 2007-02-28 2008-09-10 삼성전자주식회사 박막 트랜지스터 및 그 제조 방법
CN101663762B (zh) 2007-04-25 2011-09-21 佳能株式会社 氧氮化物半导体
KR100987840B1 (ko) * 2007-04-25 2010-10-13 주식회사 엘지화학 박막 트랜지스터 및 이의 제조방법
JP2009123957A (ja) * 2007-11-15 2009-06-04 Sumitomo Chemical Co Ltd 酸化物半導体材料及びその製造方法、電子デバイス及び電界効果トランジスタ
CN101911303B (zh) * 2007-12-25 2013-03-27 出光兴产株式会社 氧化物半导体场效应晶体管及其制造方法
JP5451280B2 (ja) 2008-10-09 2014-03-26 キヤノン株式会社 ウルツ鉱型結晶成長用基板およびその製造方法ならびに半導体装置

Also Published As

Publication number Publication date
EP2240965B1 (de) 2011-07-20
US20100276685A1 (en) 2010-11-04
US8212248B2 (en) 2012-07-03
CN101911304A (zh) 2010-12-08
TWI433312B (zh) 2014-04-01
JP2009164393A (ja) 2009-07-23
CN101911304B (zh) 2012-09-26
JP5213458B2 (ja) 2013-06-19
EP2240965A1 (de) 2010-10-20
WO2009087943A1 (en) 2009-07-16
TW200945573A (en) 2009-11-01

Similar Documents

Publication Publication Date Title
ATE517435T1 (de) Feldeffekttransistor
MY158965A (en) Growth of al2o3 thin films for photovoltaic applications
WO2009145581A3 (ko) 산화물 반도체 및 이를 포함하는 박막 트랜지스터
TW200802864A (en) Field effect transistor
NZ595689A (en) Compositions for immunising against staphylococcus aureus
PH12016500146A1 (en) Plant disease control composition and its use
MX2012013895A (es) Composiciones pesticidas.
NZ704955A (en) Composition for controlling plant disease and application therefor
MX355921B (es) Composicion para el cuidado bucal antimanchas.
PH12016500148A1 (en) Plant disease control composition and its use
RS54548B1 (en) COMPOSITIONS CONTAINING ORGANIC ACID MONOGLICERIDES WITH C1 TO C7 AND GLYCEROL, THEIR PREPARATION AND USE AS ANTIBACTERIAL AND ANTIGLIVIC AGENAS
MX2011011763A (es) Composiciones plaguicidas.
ATE534146T1 (de) Amorpher oxid-halbleiter und diesen verwendender dünnschichttransistor
BR112013004920A2 (pt) "composições pesticidas".
MX2011012366A (es) Mezclas fungicidas sinergeticas.
TN2009000185A1 (en) Progesterone receptor antagonists
BR112013000673A2 (pt) formas sólidas de romidepsina e seus usos
DE502007006942D1 (de) Superabsorber mit verbesserter geruchsinhibierung
MX2012002155A (es) Aleaciones ricas en silicio.
MX2013012151A (es) Metodo para inhibir microorganismos dañinos y composicion de formacion de barreras para los mismos.
DOP2010000329A (es) Inhibidores de la renina
SG175205A1 (en) Methods of depositing antimony-comprising phase change material onto a substrate and methods of forming phase change memory circuitry
MX337380B (es) Composiciones pesticidas.
MX366380B (es) Composiciones prebioticas para el cuidado oral que contienen un alquilglucosido.
MY149084A (en) Zinc electro-plated steel sheet having excellent stain resistance

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties