WO2016175086A1 - 半導体装置及びその製造方法 - Google Patents
半導体装置及びその製造方法 Download PDFInfo
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- WO2016175086A1 WO2016175086A1 PCT/JP2016/062369 JP2016062369W WO2016175086A1 WO 2016175086 A1 WO2016175086 A1 WO 2016175086A1 JP 2016062369 W JP2016062369 W JP 2016062369W WO 2016175086 A1 WO2016175086 A1 WO 2016175086A1
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 250
- 238000000034 method Methods 0.000 title claims description 84
- 238000004519 manufacturing process Methods 0.000 title claims description 40
- 239000010410 layer Substances 0.000 claims abstract description 349
- 239000011229 interlayer Substances 0.000 claims abstract description 78
- 239000010409 thin film Substances 0.000 claims abstract description 53
- 239000012535 impurity Substances 0.000 claims description 252
- 238000002513 implantation Methods 0.000 claims description 72
- 238000000137 annealing Methods 0.000 claims description 51
- 239000000758 substrate Substances 0.000 claims description 49
- 230000004913 activation Effects 0.000 claims description 44
- 238000005468 ion implantation Methods 0.000 claims description 31
- 230000001133 acceleration Effects 0.000 claims description 13
- 238000005530 etching Methods 0.000 claims description 11
- 238000002347 injection Methods 0.000 claims 1
- 239000007924 injection Substances 0.000 claims 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical group [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 60
- 150000002500 ions Chemical class 0.000 description 36
- 239000010408 film Substances 0.000 description 27
- 230000015572 biosynthetic process Effects 0.000 description 7
- 238000000206 photolithography Methods 0.000 description 7
- -1 phosphorus ions Chemical class 0.000 description 6
- 229910021419 crystalline silicon Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000005401 electroluminescence Methods 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 239000001257 hydrogen Substances 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000005984 hydrogenation reaction Methods 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 238000004380 ashing Methods 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000007943 implant Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000005499 laser crystallization Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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- H—ELECTRICITY
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- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
- H01L29/78621—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile
- H01L29/78627—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile with a significant overlap between the lightly doped drain and the gate electrode, e.g. GOLDD
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/26506—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors
- H01L21/26513—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors of electrically active species
-
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/266—Bombardment with radiation with high-energy radiation producing ion implantation using masks
-
- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
-
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1251—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs comprising TFTs having a different architecture, e.g. top- and bottom gate TFTs
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
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- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66757—Lateral single gate single channel transistors with non-inverted structure, i.e. the channel layer is formed before the gate
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- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78606—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device
- H01L29/78618—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure
- H01L29/78621—Thin film transistors, i.e. transistors with a channel being at least partly a thin film with supplementary region or layer in the thin film or in the insulated bulk substrate supporting it for controlling or increasing the safety of the device characterised by the drain or the source properties, e.g. the doping structure, the composition, the sectional shape or the contact structure with LDD structure or an extension or an offset region or characterised by the doping profile
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78651—Silicon transistors
- H01L29/7866—Non-monocrystalline silicon transistors
- H01L29/78672—Polycrystalline or microcrystalline silicon transistor
- H01L29/78675—Polycrystalline or microcrystalline silicon transistor with normal-type structure, e.g. with top gate
Definitions
- the present invention relates to a semiconductor device and a manufacturing method thereof.
- An active matrix substrate used for a liquid crystal display device or the like includes a switching element such as a thin film transistor (hereinafter, “TFT”) for each pixel.
- TFT thin film transistor
- the crystalline silicon TFT can operate faster than the amorphous silicon TFT. Therefore, when a crystalline silicon film is used, not only a TFT provided for each pixel as a switching element (referred to as a “pixel TFT”) but also a drive circuit and various functions formed around the display area (frame area). TFTs constituting peripheral circuits such as circuits (referred to as “driving circuit TFTs”) can also be formed on the same substrate.
- the pixel TFT is required to have an extremely small off-leakage current. If the off-leakage current is large, flicker, crosstalk, etc. may occur and display quality may be reduced. Therefore, a TFT having an LDD structure (hereinafter abbreviated as “LDD structure TFT”) is used as the pixel TFT.
- LDD structure TFT LDD structure
- the “LDD structure TFT” has a low concentration impurity region (Lightly Doped Drain, hereinafter abbreviated as “LDD region”) in at least one of the channel region of the TFT and the source region / drain region.
- LDD region Lightly Doped Drain
- an LDD region having a higher resistance than the source / drain region is present between the edge of the gate electrode and the low-resistance source / drain region, so that the LDD region is not provided (“single drain structure”).
- off-leakage current can be greatly reduced as compared with TFT.
- an LDD structure TFT may be adopted as a drive circuit TFT.
- the driving circuit TFT is required to have a large current driving capability, that is, a large on-current.
- the LDD structure TFT has a resistance in the LDD region, so that the current driving capability is lower than that of the single drain structure TFT. Resulting in.
- LDD length the length of the LDD region in the channel length direction (LDD length)
- LDD length channel length
- higher reliability is required for a TFT for a drive circuit that operates at high speed.
- GOLD structure TFT Gate Overlapped LDD
- GOLD structure TFT When a voltage is applied to the gate electrode, electrons serving as carriers are accumulated in the LDD region where the gate electrode overlaps. Resistance can be reduced. For this reason, it is possible to suppress a decrease in the current driving capability of the TFT. Further, by forming the electric field relaxation region under the gate, higher reliability than that of the LDD structure TFT can be secured.
- LDD structure a structure in which the entire LDD region is not overlapped by the gate electrode
- GOLD structure a structure in which at least a part of the LDD region is overlapped by the gate electrode
- Patent Document 1 discloses a method of manufacturing a GOLD structure TFT by using a halftone mask without increasing the number of photomasks.
- resist patterns having partially different thicknesses are formed by a photolithography process using a halftone mask, and a semiconductor film is etched using the resist patterns as etching masks.
- impurity doping for forming the LDD region is performed. Accordingly, the semiconductor film can be etched and the LDD region can be formed in one photolithography process, and the number of photomasks can be reduced by one.
- One embodiment of the present invention has been made in view of the above circumstances, and a main object thereof is to provide a high-definition and high-definition semiconductor device including a TFT having an LDD region. is there.
- the semiconductor device is a semiconductor device including at least one thin film transistor on a substrate, and the at least one thin film transistor includes a channel region and a high-concentration impurity region including an impurity of a first conductivity type.
- a low-concentration impurity region that is located between the channel region and the high-concentration impurity region and includes the first conductivity type impurity at a lower concentration than the high-concentration impurity region and higher than the channel region
- a contact hole reaching the semiconductor layer is provided in the interlayer insulating layer and the gate insulating layer, and at least one of the source electrode and the drain electrode is formed on the interlayer insulating layer and in the contact hole,
- the side surface of the gate insulating layer and the interlayer insulating layer is in contact with the high concentration impurity region in the contact hole, and the side surface of the contact hole is aligned with the side wall of the contact hole.
- the edge of the high concentration impurity region
- the high-concentration impurity region is located inside the low-concentration impurity region when viewed from the normal direction of the substrate.
- the at least one thin film transistor includes a first thin film transistor, and in the first thin film transistor, a part of the low concentration impurity region is covered with the gate electrode via the gate insulating layer.
- the at least one thin film transistor includes a second thin film transistor, and in the second thin film transistor, an end portion of the low concentration impurity region on the channel region side is aligned with an end portion of the gate electrode.
- the low concentration impurity region in the first thin film transistor, includes a first low concentration impurity region that does not overlap the gate electrode through the gate insulating layer, and a second low concentration impurity region that overlaps the gate electrode.
- the first low-concentration impurity region contains the first conductivity type impurity at a higher concentration than the second low-concentration impurity region.
- the at least one thin film transistor further includes a second thin film transistor, and in the second thin film transistor, an end of the lightly doped impurity region on the channel region side is aligned with an end of the gate electrode.
- the low-concentration impurity region includes a third low-concentration impurity region in contact with the high-concentration impurity region and a fourth low-concentration region located closer to the channel region than the third low-concentration impurity region.
- the third low-concentration impurity region includes the first conductivity type impurity at a higher concentration than the fourth low-concentration impurity region.
- the first low concentration impurity region of the first thin film transistor and the third low concentration impurity region of the second thin film transistor include the same impurity element, and the first and third low concentration impurity regions are included.
- the concentration profiles of the first conductivity type impurities in the thickness direction are substantially equal.
- the thin film transistor further includes another thin film transistor having a conductivity type different from that of the at least one thin film transistor, and the other thin film transistor is positioned between a channel region, a contact region, and the channel region and the contact region.
- the other gate electrode provided on the gate electrode, the other gate electrode and the interlayer insulating layer extending on the gate insulating layer, and the other semiconductor layer are in contact with each other.
- Other source electrodes and other drain electrodes, and the interlayer insulating layer and the gate insulating layer are provided with other contact holes reaching the other semiconductor layers, and the other source electrodes and At least one of the other drain electrodes is formed on the interlayer insulating layer and in the other contact hole, in contact with the contact region in the other contact hole, and on the side wall of the other contact hole, the gate insulation
- the side surfaces of the layer and the interlayer insulating layer are aligned, and the edge of the other contact hole and the edge of the contact region are aligned on the upper surface of the other semiconductor layer.
- a method for manufacturing a semiconductor device is a method for manufacturing a semiconductor device including at least one thin film transistor on a substrate, and (a) a channel region on the substrate is higher than the channel region.
- a first activation annealing is performed on the low-concentration impurity region before the step (d), and the high-concentration impurity region is performed after the step (d). Second activation annealing is performed.
- the second activation annealing is performed at a temperature lower than that of the first activation annealing.
- the step (a) includes a first ion implantation step of implanting the first conductivity type impurity into a part of the semiconductor layer, and the step (d) includes the first ion implantation step.
- the impurity of the first conductivity type is implanted at a dose or lower acceleration voltage than in the ion implantation process.
- step (a) in the step (a), at least a part of the low-concentration impurity region overlaps the gate electrode through the gate insulating layer.
- a method for manufacturing a semiconductor device is a method for manufacturing a semiconductor device including at least a first thin film transistor and a second thin film transistor on a substrate, and (a) the first thin film transistor is activated on the substrate.
- a first gate electrode is formed on a part of the region into which the impurity is implanted and a part to be the channel region, and a part of the second semiconductor layer in which the impurity is not implanted in the first implantation step.
- First gate on top Forming a pole; and (d) a second implantation step of implanting a first conductivity type impurity into the first and second semiconductor layers using the first and second gate electrodes as a mask.
- a region of the first semiconductor layer into which impurities are implanted in both the first and second implantation steps is a first low-concentration impurity region, an impurity is implanted in the first implantation step, and The region where the impurity is not implanted in the second implantation step because it is covered with the second gate electrode becomes the second low-concentration impurity region, and the first and second implantation steps of the second semiconductor layer are performed.
- a region into which impurities are implanted is a third low-concentration impurity region, an impurity is implanted in the second implantation step, and a region in which no impurity is implanted in the first implantation step is a fourth low-concentration impurity region.
- Second ion implanter (E) forming an interlayer insulating layer on the gate insulating layer, the first gate electrode, and the second gate electrode, and (f) forming a mask on the interlayer insulating layer, using the mask Etching the gate insulating layer and the interlayer insulating layer simultaneously to form a first contact hole exposing a part of the first low-concentration impurity region in the gate insulating layer and the interlayer insulating layer; Forming a second contact hole exposing a part of the concentration impurity region; and (g) forming a part of the first and third low concentration impurity regions through the first and second contact holes.
- first activation annealing is performed on the first, second, third, and fourth low-concentration impurity regions before the step (g). Thereafter, second activation annealing is performed on the first and second high-concentration impurity regions.
- the second activation annealing is performed at a temperature lower than that of the first activation annealing.
- the impurity of the first conductivity type is implanted with a dose amount or a lower acceleration voltage lower than those in the first and second ion implantation steps.
- the semiconductor device further comprises a third thin film transistor having a conductivity type different from that of the first and second thin film transistors
- the step (a) includes a step of forming a third semiconductor layer on the substrate, The layer extends also on the third semiconductor layer
- the step (c) includes a step of forming a third gate electrode on the third semiconductor layer
- the step (c) a step of forming a third high-concentration impurity region in the third semiconductor layer by injecting a second conductivity type impurity into the third semiconductor layer using the third gate electrode as a mask before e);
- the interlayer insulating layer is also extended on the third gate electrode
- the step (f) includes adding the third high-concentration impurity to the gate insulating layer and the interlayer insulating layer.
- step (g) Expose part of the area Forming a third contact hole, wherein the step (g) implants a first conductivity type impurity into the part of the third high-concentration impurity region through the third contact hole.
- the first implantation step of the step (b) is performed using first, second, and third masks disposed on the first, second, and third semiconductor layers, respectively.
- the third mask is a multi-tone mask, and after the first implantation step and before the step (c), the first and second masks are removed and a part of the third mask is removed.
- a semiconductor device having a high-definition and excellent productivity including a TFT having an LDD region.
- the number of photomasks used can be reduced.
- FIGS. 4A and 4B are schematic plan views illustrating semiconductor layers 3A and 3B in the LDD structure TFT 100 and the GOLD structure TFT 200, respectively.
- FIGS. 4A to 4D are schematic cross-sectional process diagrams illustrating an example of a method for manufacturing the LDD structure TFT 100.
- FIGS. FIGS. 4A to 4D are schematic cross-sectional process diagrams illustrating an example of a method for manufacturing a TFT 200 having a GOLD structure.
- FIGS. 9A to 9E are schematic process cross-sectional views illustrating a method for manufacturing the semiconductor device of the second embodiment.
- (A) is the process flow which manufactures the GOLD structure TFT2000 of a reference example
- (b) is the process flow which manufactures the GOLD structure TFT200,201.
- FIGS. 8A to 8F are schematic process cross-sectional views illustrating a method for manufacturing the semiconductor device of the third embodiment.
- (A) is sectional drawing which illustrates LDD structure TFT1000 and GOLD structure TFT2000 of a reference example
- (b) and (c) are the top views of semiconductor layers 3D and 3E of LDD structure TFT1000 and GOLD structure TFT2000, respectively. It is.
- the “semiconductor device” widely includes a substrate on which a functional circuit is formed, an active matrix substrate, and a display device such as a liquid crystal display device or an organic EL display device.
- the semiconductor device of this embodiment includes a substrate and a plurality of TFTs formed on the substrate.
- the plurality of TFTs include at least one TFT having an LDD region.
- the TFT having the LDD region may be an LDD structure TFT or a GOLD structure TFT.
- both a GOLD structure TFT and an LDD structure TFT formed using a common semiconductor film may be included.
- FIG. 1A and 1B are schematic cross-sectional views illustrating a TFT having an LDD region in the semiconductor device of this embodiment.
- FIG. 1A is an LDD structure TFT 100
- FIG. A GOLD structure TFT 200 is illustrated.
- 2A and 2B are schematic plan views illustrating semiconductor layers in the LDD structure TFT 100 and the GOLD structure TFT 200, respectively.
- similar constituent elements are given the same reference numerals or reference numerals using the same numerals.
- a part of the constituent elements of the LDD structure TFT 100 is denoted by a reference numeral with “A” after the number
- a part of the constituent elements of the GOLD structure TFT 200 is denoted by a reference numeral with “B” after the number. Used.
- the LDD structure TFT 100 includes a semiconductor layer 3A formed on the substrate 1, a gate insulating layer 5 covering the semiconductor layer 3A, and a gate electrode 7A formed on the gate insulating layer 5.
- An interlayer insulating layer 11 that covers the gate electrode 7A and the semiconductor layer 3A, and a source electrode 8A and a drain electrode 9A that are electrically connected to the semiconductor layer 3A.
- the semiconductor layer 3A has a channel region 31A, a source region 33sA, a drain region 33dA, and an LDD region 32A.
- the channel region 31A is located between the source region 33sA and the drain region 33dA.
- the LDD region 32A is sandwiched between the channel region 31A and at least one of the source region 33sA and the drain region 33dA.
- the source region 33sA and the drain region 33dA are first conductivity type regions (eg, n + -type regions) including a first conductivity type impurity (eg, n-type impurity).
- the LDD region 32A is a first conductivity type region (for example, an n ⁇ -type region) containing a first conductivity type impurity (for example, an n-type impurity) at a concentration higher than the channel region 31A and lower than the source region 33sA and the drain region 33dA. ).
- the source region 33sA and the drain region 33dA are collectively referred to as “high concentration impurity region” or “n + type region”, and the LDD region 32A is referred to as “low concentration impurity region” or “n ⁇ type region”. There is.
- the gate electrode 7A is disposed so as to overlap at least the channel region 31A of the semiconductor layer 3A with the gate insulating layer 5 interposed therebetween.
- the gate electrode 7A overlaps the channel region 31A and does not overlap the source region 33sA, the drain region 33dA, and the LDD region 32A.
- the end portion of the gate electrode 7A is aligned with the end portion of the LDD region 32A on the channel region 31A side.
- the gate insulating layer 5 and the interlayer insulating layer 11 are provided with a source contact hole 13A reaching the source region 33sA of the semiconductor layer 3A and a drain contact hole 14A reaching the drain region 33dA of the semiconductor layer 3A.
- These contact holes 13A and 14A are formed by etching the gate insulating layer 5 and the interlayer insulating layer 11 simultaneously. Therefore, the side surface of the gate insulating layer 5 and the side surface of the interlayer insulating layer 11 are aligned on the side walls of the source contact hole 13A and the drain contact hole 14A.
- the source electrode 8A is provided on the interlayer insulating layer 11 and in the source contact hole 13A, and is in contact with the source region 33sA in the source contact hole 13A.
- the drain electrode 9A is provided on the interlayer insulating layer 11 and in the drain contact hole 14A, and is in contact with the drain region 33dA in the drain contact hole 14A.
- the source region 33sA and the drain region 33dA are formed by injecting a first conductivity type impurity into the semiconductor layer 3A through the contact holes 13A and 14A.
- the implantation process through the contact hole is referred to as a “contact doping process”.
- the edge of the source contact hole 13A and the source region 33sA of the semiconductor layer 3A are aligned.
- the edge of the drain contact hole 14A is aligned with the drain region 33dA of the semiconductor layer 3A.
- the term “matching” here may be formed by implantation through the contact hole as described above.
- the first conductivity type impurity implanted into the semiconductor layer 3A is surrounded by activation annealing. Including the case of diffusion.
- the surface (contact surface) in contact with the semiconductor layer 3A in the source electrode 8A and the source region 33sA are aligned, and the surface in contact with the semiconductor layer 3A in the drain electrode 9A and the drain region 33dA are aligned. become.
- a GOLD structure TFT 200 shown in FIG. 1B includes a semiconductor layer 3B formed on the substrate 1, a gate insulating layer 5 covering the semiconductor layer 3B, and a gate electrode 7B formed on the gate insulating layer 5. And an interlayer insulating layer 11 covering the gate electrode 7B and the semiconductor layer 3B, and a source electrode 8B and a drain electrode 9B electrically connected to the semiconductor layer 3B.
- the semiconductor layer 3B has a channel region 31B, a source region 33sB, a drain region 33dB, and an LDD region 32B.
- the LDD region 32B is located between the channel region 31B and at least one of the source region 33sB and the drain region 33dB.
- the LDD region 32B contains the first conductivity type impurity at a concentration higher than that of the channel region 31B and lower than that of the source region 33sB and drain region 33dB (hereinafter referred to as “high concentration impurity region”).
- the GOLD structure TFT 200 is different from the LDD structure TFT 100 in that the gate electrode 7B is disposed so as to overlap not only the channel region 31B of the semiconductor layer 3B but also a part of the LDD region 32B with the gate insulating layer 5 interposed therebetween. Is different.
- the LDD region 32B is a portion that does not overlap the gate electrode 7B, that is, a portion located between the source region 33sB and the drain region 33dB and the gate electrode 7B when viewed from the normal direction of the substrate 1 (“LDD portion”). 32 (1) and a portion overlapping with the gate electrode 7B (hereinafter, “GOLD portion”) 32 (2).
- the GOLD portion 32 (2) may be referred to as a GOLD region or an NM region.
- the LDD portion 32 (1) and the GOLD portion 32 (2) may contain the impurity element at the same concentration or different concentrations. As will be described later, the LDD portion 32 (1) may contain the first conductivity type impurity at a higher concentration than the GOLD portion 32 (2).
- the source region 33sB and the drain region 33dB are formed by injecting a first conductivity type impurity into the semiconductor layer 3B through the source contact hole 13B and the drain contact hole 14B, respectively. (Contact doping process). Therefore, on the upper surface of the semiconductor layer 3B, the edges of the contact holes 13B and 14B are aligned with the edges of the source region 33sB and the drain region 33dB of the semiconductor layer 3B, respectively.
- the semiconductor device of this embodiment may include both the LDD structure TFT 100 and the GOLD structure TFT 200.
- a plurality of LDD structure TFTs 100 as pixel TFTs and a plurality of GOLD structure TFTs 200 as drive circuit TFTs may be provided on the same substrate 1.
- the semiconductor layers 3A and 3B can be formed from the same semiconductor film, and the gate electrodes 7A and 7B can be formed from the same conductive film.
- the gate insulating layer 5 and the interlayer insulating layer 11 may be common to the TFTs 100 and 200.
- the source regions 33sA and 33sB and the drain regions 33dA and 33dB of the TFTs 100 and 200 may be formed by a common contact doping process. Thereby, the number of photomasks used in the semiconductor device manufacturing process can be reduced.
- At least one high concentration impurity region of the TFT having the LDD region is formed by a contact doping process, and an electrode (source or drain) is in contact with the high concentration impurity region in the contact hole. Electrode) may be disposed. Therefore, only one of the source and drain regions may be formed by the contact doping process.
- the “LDD region” refers to a region having an impurity concentration of, for example, 1 ⁇ 10 18 atoms / cm 3 or more and lower than the impurity concentration of the source / drain regions. Therefore, the semiconductor layer does not include a region containing impurities at an extremely low concentration (less than 1 ⁇ 10 18 atoms / cm 3 ). For example, a part of the impurity implanted into the LDD region may diffuse to the channel region under the gate electrode. However, since the impurity concentration of the portion where the impurity is diffused is considered to be extremely low, such a portion is It is not included in the “LDD region”.
- FIG. 3A to 3D are schematic cross-sectional process diagrams showing an example of a method for manufacturing the LDD structure TFT 100.
- FIG. 3A to 3D are schematic cross-sectional process diagrams showing an example of a method for manufacturing the LDD structure TFT 100.
- a semiconductor layer (for example, a polysilicon layer) 3A, a gate insulating layer 5 and a gate electrode 7A are formed in this order on a substrate 1 by a known method.
- impurity ions of the first conductivity type (here, n-type) are implanted into the semiconductor layer 3A at a low concentration, and then implanted into the semiconductor layer 3A at a low concentration.
- Region 30A is formed.
- a region where impurity ions are not implanted becomes a channel region 31A.
- activation annealing is performed at the first temperature to activate the impurity ions implanted into the low concentration implantation region 30A and restore the crystallinity of the low concentration implantation region 30A.
- a resist mask 41 having an opening is formed on the interlayer insulating layer 11.
- source contact holes 13 ⁇ / b> A and drain contact holes 14 ⁇ / b> A are formed in the gate insulating layer 5 and the interlayer insulating layer 11.
- the first conductivity type impurity ions are implanted at a high concentration into a part of the low concentration implantation region 30A via the source contact hole 13A and the drain contact hole 14A.
- the source region 33sA and the drain region 33dA are formed in the semiconductor layer 3A.
- the resist mask 41 is peeled off. Note that the resist mask 41 may be removed before the implantation of impurity ions.
- activation annealing is performed at the second temperature to activate the impurity ions implanted into the source region 33sA and the drain region 33dA.
- the second temperature is set to a temperature lower than the first temperature, for example. In this way, the LDD structure TFT 100 is obtained.
- 4A to 4D are schematic cross-sectional process diagrams showing an example of a method for manufacturing a TFT 200 having a GOLD structure.
- a semiconductor layer 3B and a gate insulating layer 5 are formed on a substrate 1 by a known method.
- a resist mask 42 is formed on the gate insulating layer 5, and using this, impurity ions of the first conductivity type (here, n-type) are implanted into the semiconductor layer 3B at a low concentration, and the semiconductor layer 3B is doped at a low concentration.
- An implantation region 30B is formed. A region where impurity ions are not implanted becomes a channel region 31B.
- a gate electrode 7B is formed on the gate insulating layer 5 so as to overlap a part of the low concentration implantation region 30B and the channel region 31B. Thereafter, activation annealing is performed at the first temperature to activate the impurity ions implanted into the low concentration implantation region 30B. Note that activation annealing may be performed before the formation of the gate electrode 7B.
- the interlayer insulating layer 11 is formed by the same method as described above with reference to FIG. 3C, and the gate insulating layer 5 and the interlayer insulating layer 11 are patterned. To obtain the source contact hole 13B and the drain contact hole 14B.
- high concentration impurity ions of the first conductivity type are formed in a part of the low concentration implantation region 30B by the same method as described above with reference to FIG.
- the source region 33sB and the drain region 33dB are obtained.
- a region where the impurity ions are not implanted at a high concentration in the low concentration implantation region 30B becomes an LDD region 32B.
- activation annealing is performed at a second temperature lower than the first temperature, and the GOLD structure TFT 200 is obtained.
- the gate electrode 7A is used as a mask to form the low concentration implantation region (N ⁇ region) that becomes the LDD region 32A, and the insulating layer in which the contact holes 13A and 14A are formed.
- a high concentration implantation region (N + region) to be a source region or a drain region is formed.
- a high concentration implantation region (N + region) is formed using the insulating layer in which the contact holes 13B and 14B are formed as a mask. For this reason, it is possible to reduce the number of photomasks used by one as compared with the prior art.
- activation annealing is performed on the low concentration implantation region before contact doping, and activation annealing is performed on the high concentration implantation region after contact doping.
- the activation annealing may be performed only once after contact doping. However, activation annealing is preferably performed before contact doping as in the above method. The reason for this is as follows.
- annealing is performed in a region into which impurity ions are implanted in order to recover crystal damage caused during the ion implantation and activate the implanted ions.
- activation annealing is performed at a high temperature after contact doping, hydrogen terminated at the interface between the gate insulating layer and the semiconductor layer may be detached from the contact hole, which may deteriorate TFT characteristics.
- activation annealing is performed at the first temperature, and the low concentration regions are formed.
- the crystals in the implantation regions 30A and 30B are once recovered.
- the first temperature may be, for example, 500 ° C. or more and 700 ° C. or less.
- activation annealing of the high concentration implantation region (N + region) is performed at the second temperature.
- the second temperature can be set lower than the first temperature.
- the second temperature may be 200 ° C. or higher and lower than 300 ° C.
- Acceleration energy at the time of contact doping may be lower than acceleration energy at the time of forming the low concentration implantation regions 30A and 30B, and may be, for example, 5 keV or more and 30 keV or less. Thereby, in activation annealing after contact doping, the detachment of terminal hydrogen can be more effectively suppressed.
- the conductivity type of the TFTs 100 and 200 is not limited to n-type, and may be p-type.
- a p-type impurity such as boron is used as the first conductivity type impurity implanted into the semiconductor layers 3A and 3B.
- Japanese Unexamined Patent Application Publication No. 2007-141992 describes a method of forming source / drain regions by implanting impurity ions into a semiconductor layer through a contact hole provided in a gate insulating layer.
- the interlayer insulating layer is formed and patterned. According to this method, it is necessary to pattern the gate insulating layer and the interlayer insulating layer separately, and the number of photomasks cannot be reduced.
- the gate insulating layer may not be used as a doping mask.
- the gate insulating layer 5 and the interlayer insulating layer 11 which are gate insulating layers are etched together, so that the number of photomasks can be reduced. Further, since the gate insulating layer 5 and the interlayer insulating layer 11 are used as an etching mask, the present invention can be applied regardless of the thickness of the gate insulating layer 5. As described above, it is more advantageous to perform activation annealing in two steps before and after contact doping.
- the semiconductor device of this embodiment includes an LDD structure TFT and a GOLD structure TFT on the same substrate. These TFTs are formed in a common process using the same semiconductor film.
- the LDD structure TFT can be formed in the display area as a pixel TFT, and the GOLD structure TFT can be formed in the frame area as a drive circuit TFT.
- FIG. 5A is a cross-sectional view illustrating the LDD structure TFT 101 and the GOLD structure TFT 201 in the semiconductor device of this embodiment.
- FIGS. 5B and 5C are views of the LDD structure TFT 101 and the GOLD structure TFT 201, respectively. It is a top view which illustrates semiconductor layers 3A and 3B.
- the LDD region 32A is positioned between a third LDD region (also referred to as a “high concentration LDD region”) 36 that is in contact with the source region 33sA and the drain region 33dA, and between the third LDD region 36 and the channel region 31A.
- a fourth LDD region (also referred to as a “low concentration LDD region”) 37 is included in the LDD region 32A.
- the third LDD region 36 includes a first conductivity type impurity at a higher concentration than the fourth LDD region 37.
- the fourth LDD region 37 is in contact with the channel region 31A.
- the source region 33 sA and the drain region 33 dA are respectively disposed inside the third LDD region 36.
- Other configurations are the same as those of the LDD structure TFT 100 shown in FIG.
- the LDD region 32B includes a first LDD region (also referred to as a “high concentration LDD region”) 34 in contact with the source region 33sB and the drain region 33dB, and a space between the first LDD region 34 and the channel region 31B. And a second LDD region (also referred to as a “low concentration LDD region”) 35 located therein.
- the second LDD region 35 is overlapped by the gate electrode 7B.
- the source region 33 sB and the drain region 33 dB are each disposed inside the first LDD region 34.
- Other configurations are the same as those of the GOLD structure TFT 200 shown in FIG.
- 6A to 6E are schematic process cross-sectional views showing a method for manufacturing the semiconductor device of this embodiment. For simplicity, a method of forming one LDD structure TFT 101 and one GOLD structure TFT 201 is shown here, but a plurality of TFTs are typically formed.
- the island-shaped semiconductor layer 3A is formed in the region where the LDD structure TFT of the substrate 1 is to be formed, and the island-shaped semiconductor layer 3B is formed in the region where the GOLD structure TFT is to be formed. To do. Subsequently, a gate insulating layer 5 covering these semiconductor layers 3A and 3B is formed.
- the substrate 1 may be a substrate having an insulating surface, and may be a quartz substrate or a glass substrate, or a Si substrate or a metal substrate whose surface is covered with an insulating layer.
- the semiconductor layers 3A and 3B are formed using a crystalline silicon film. Specifically, first, a known semiconductor film (here, an amorphous silicon film) is deposited using a known method such as a plasma CVD method or a sputtering method. The thickness of the amorphous semiconductor film is 20 nm to 70 nm, preferably 40 nm to 60 nm. Thereafter, the amorphous semiconductor film is crystallized to form a crystalline semiconductor film (here, a polysilicon film) and patterned to obtain semiconductor layers 3A and 3B. Crystallization of the amorphous semiconductor film can be performed by laser crystallization. Alternatively, crystallization may be performed by adding a catalytic element to the amorphous semiconductor film and then performing an annealing treatment.
- a known semiconductor film here, an amorphous silicon film
- the thickness of the amorphous semiconductor film is 20 nm to 70 nm, preferably 40 nm to 60 nm.
- the gate insulating layer 5 is formed using, for example, a CVD method.
- a silicon oxide (SiO 2 ) layer having a thickness of, for example, 50 nm to 200 nm is formed.
- a resist mask 45 covering a part of the semiconductor layer 3A and a resist mask 47 covering a part to be a channel region of the semiconductor layer 3B are formed by known photolithography.
- the resist mask 45 is disposed so as to expose a region where the high concentration impurity region is formed in the semiconductor layer 3A and to cover a region where the channel region and the LDD region are formed.
- n-type impurity ions are implanted into the semiconductor layers 3A and 3B at a low concentration to obtain low-concentration implanted regions 50A and 50B (first ion implantation step).
- phosphorus ions are implanted as impurity ions.
- the acceleration voltage at the time of implantation is 60 kV, for example, and the dose is 1 ⁇ 10 13 / cm 2 .
- a region of the semiconductor layer 3B where no impurity ions are implanted becomes a channel region 31B.
- gate electrodes 7A and 7B are formed on the semiconductor layers 3A and 3B, respectively, as shown in FIG. 6B.
- the gate electrode 7A is disposed on the portion that becomes the channel region in the low concentration implantation region 50A.
- the gate electrode 7B is arranged so as to cover a part of the low concentration implantation region 50B of the semiconductor layer 3B and the channel region 31B.
- the gate electrodes 7A and 7B can be formed by, for example, forming a tungsten (W) film (thickness: 400 nm, for example) on the gate insulating layer 5 by sputtering, and then etching the W film.
- the material of the gate electrodes 7A and 7B is not particularly limited. For example, a laminated film made of a TaN film and a W film may be used.
- n-type impurity ions are implanted into the semiconductor layers 3A and 3B at a low concentration using the gate electrodes 7A and 7B as a mask (second ion implantation step).
- phosphorus ions are implanted as impurity ions.
- the acceleration voltage at the time of implantation is, for example, 50 kV, and the dose is 1 ⁇ 10 13 / cm 2 .
- the portion of the semiconductor layer 3A that is covered with the gate electrode 7A and is not implanted with impurities becomes the channel region 31A.
- the portion 36 into which impurity ions are implanted in both the first and second ion implantation steps becomes a third LDD region.
- the portion 37 in which impurity ions are not implanted in the first ion implantation step and impurity ions are implanted in the second ion implantation step becomes the fourth LDD region.
- the third LDD region 36 includes the first conductivity type impurity at a higher concentration than the fourth LDD region 37.
- annealing temperature is not specifically limited, For example, 500 degreeC or more and 700 degrees C or less may be sufficient.
- an interlayer insulating layer 11 is formed so as to cover the semiconductor layers 3A and 3B, the gate electrodes 7A and 7B, and the gate insulating layer 5.
- the interlayer insulating layer 11 may be, for example, a SiO 2 film having a thickness of 300 nm or more and 900 nm or less, or may be a laminated film made of, for example, a SiN film and a SiO 2 film.
- heat treatment hydrogenation annealing
- annealing for hydrogenating the semiconductor layers 3A and 3B, for example, annealing at 350 to 550 ° C. in a nitrogen atmosphere or a hydrogen mixed atmosphere at 1 atm may be performed.
- a resist mask 49 having an opening is formed on the interlayer insulating layer 11, and the interlayer insulating layer 11 is patterned using the resist mask 49.
- the source contact hole 13A and the drain contact hole 14A reaching the part of the third LDD region 36 of the semiconductor layer 3A and the source contact hole 13B reaching the part of the first LDD region 34 of the semiconductor layer 3B are formed in the interlayer insulating layer 11.
- the drain contact hole 14B is formed.
- impurity ions are implanted into the semiconductor layers 3A and 3B through these contact holes 13A, 14A, 13B, and 14B (contact doping process).
- source and drain regions 33sA and 33dA are formed in the third LDD region 36 of the semiconductor layer 3A.
- source and drain regions 33sB and 33dB are formed in the first LDD region 34 of the semiconductor layer 3B.
- the resist mask 49 is removed. Note that contact doping may be performed after the resist mask 49 is removed.
- the ion implantation conditions in the contact doping process will be described.
- phosphorus ions are implanted as impurity ions.
- the acceleration voltage at the time of implantation is preferably set lower than the acceleration voltage in the first and second ion implantation steps, and is set to, for example, less than 20 kV.
- the dose amount in this step is set to a value lower than the dose amount at the time of forming the conventional high concentration implantation region. obtain. Further, it may be set to be lower than the dose amount in the first and second ion implantation steps.
- the dose is set to 10 13 / cm 2 or more and 10 14 / cm 2 or less.
- second activation annealing is performed to recover the crystallinity of the source and drain regions 33sA, 33dA, 33sB, and 33dB and activate the implanted ions.
- a source electrode and a drain electrode are formed in the contact holes 13A, 13B, 14A, and 14B, respectively. In this way, the LDD structure TFT 101 and the GOLD structure TFT 201 are manufactured.
- the second activation annealing may be performed at a temperature lower than that of the first activation annealing, and may be set to, for example, less than 300 ° C.
- the high concentration implantation region of the TFTs 101 and 201 is formed using contact doping, it is not necessary to form a doping mask for forming the high concentration implantation region by a photo process. Therefore, the number of photomasks used can be reduced as compared with the conventional case.
- the impurity concentration and implantation profile of the fourth LDD region 37 of the LDD structure TFT 101 are determined by the implantation conditions of the second ion implantation step.
- the impurity concentration and implantation profile of the second LDD region 35 of the GOLD structure TFT 201 are determined by the implantation conditions of the first ion implantation step.
- the first and third LDD regions 34 and 36 are regions into which impurity ions have been implanted in both the first and second ion implantation steps. For this reason, the impurity concentration and the implantation profile of the first and third LDD regions 34 and 36 are substantially the same. Further, the impurity concentration and implantation profile of the source and drain regions 33sA, 33dA, 33sB, and 33dB, which are high concentration impurity regions, are substantially the same.
- the LDD structure TFT 101 and the GOLD structure TFT 201 having two LDD regions having different impurity concentrations will be described, but instead, the LDD structure TFT 100 and the GOLD structure 200 shown in FIG. 1 may be manufactured.
- the semiconductor device of the reference example has an LDD structure TFT 1000 and a GOLD structure TFT 2000 on the same substrate.
- FIG. 10A is a cross-sectional view illustrating an LDD structure TFT 1000 and a GOLD structure TFT 2000.
- FIGS. 10B and 10C are top views of the semiconductor layers 3D and 3E of the LDD structure TFT 1000 and the GOLD structure TFT 2000, respectively.
- FIG. 10 for the sake of simplicity, the same components as those in FIGS. 1 to 5 are denoted by the same reference numerals.
- FIG. 7A is a process flow of the semiconductor device of the reference example provided with the LDD structure TFT 1000 and the GOLD structure TFT 2000
- FIG. 7B is a semiconductor flow of this embodiment including the LDD structure TFT 101 and the GOLD structure TFT 201. It is the process flow of an apparatus. 7A and 7B are the same as the process flow in the case of manufacturing only the GOLD structure TFT 2000 and the GOLD structure TFT 201, respectively.
- a high concentration implantation region (source region 33sA, 33sB and drain region 33dA, 33dB) of each TFT 1000, 2000 and an LDD region 32A of the LDD structure TFT 1000, a high concentration implantation region is formed.
- a mask (N + photo) for forming is used. After the high concentration implantation region is formed, contact holes 13A, 13B, 14A, and 14B exposing part of these are provided, and source and drain electrodes 8A, 8B, 9A, and 9B are formed therein.
- the edges of the source regions 33 sA and 33 sB and the drain regions 33 dA and 33 dB are not aligned with the edges of the contact holes 13 A, 13 B, 14 A, and 14 B on the upper surface of the semiconductor layer.
- the source regions 33sA and 33sB and the drain regions 33dA and 33dB are formed by contact doping, so that an N + region forming mask is unnecessary. Therefore, the number of photomasks can be reduced as compared with the semiconductor device of the reference example.
- the LDD structure TFT and the GOLD structure TFT can be formed on the same substrate without increasing the number of photomasks used.
- the photo process which is essential in the process flow of the reference example, can be reduced by one time, that is, one photomask can be reduced. If the number of photomasks can be reduced, the formation of resist patterns by photolithography (including resist coating, pre-baking, exposure, development, post-baking, etc.), resist pattern peeling, cleaning, and drying steps can be omitted. The number and manufacturing costs can be greatly reduced.
- the semiconductor device of this embodiment includes a first conductivity type TFT having an LDD structure, a first conductivity type TFT having a GOLD structure, and a second conductivity type TFT on the same substrate.
- doping (channel doping) for adjusting the threshold voltage is performed on the channel regions of the LDD structure and the GOLD structure TFT.
- the first conductivity type is n-type and the second conductivity type is p-type.
- the first conductivity type may be p-type and the second conductivity type may be n-type.
- the LDD structure TFT can be formed as a pixel TFT in the display area, and the GOLD structure TFT and the p-type TFT can be formed as a drive circuit TFT in the frame area.
- the p-type TFT has a single drain structure, for example.
- the semiconductor device of this embodiment includes an n-type LDD structure TFT 102, an n-type GOLD structure TFT 202, and a p-type TFT 302 on the same substrate.
- the structures of the LDD structure TFT 102 and the GOLD structure TFT 202 are the same as those of the LDD structure TFT 101 and the GOLD structure TFT 201 described above with reference to FIG. Further, the arrangement of the LDD region and the high concentration impurity region, the impurity concentration, the implantation profile, and the like of these TFTs 102 and 202 are the same as those in the above-described embodiment, and thus description thereof is omitted here.
- FIG. 8A is a cross-sectional view of the p-type TFT 302, and FIG. 8B is a plan view of the semiconductor layer 3C of the p-type TFT 302.
- the p-type TFT 302 has a single drain structure, for example.
- the p-type TFT 302 includes a semiconductor layer 3C formed on the substrate 1, a gate insulating layer 5 covering the semiconductor layer 3C, a gate electrode 7C formed on the gate insulating layer 5, the gate electrode 7C and the semiconductor layer 3C.
- the interlayer insulating layer 11 is covered, and the source electrode 8C and the drain electrode 9C are provided.
- the semiconductor layer 3C has a channel region 31C, a source region 38s, a drain region 38d, a source contact region 39s, and a drain contact region 39d.
- the source region 38s is sandwiched between the source contact region 39s and the channel region 31C.
- the drain region 38d is sandwiched between the drain contact region 39d and the channel region 31C.
- each of the source region 38s, the drain region 38d, the source contact region 39s, and the drain contact region 39d has a second conductivity type region (for example, p-type) containing a second conductivity type impurity (for example, p-type impurity) at a high concentration. + Type region).
- the source electrode 8C is in contact with the source contact region 39s of the semiconductor layer 3C in the source contact hole formed in the gate insulating layer 5 and the interlayer insulating layer 11.
- the drain electrode 9C is in contact with the drain contact region 39d of the semiconductor layer 3C within the drain contact hole formed in the gate insulating layer 5 and the interlayer insulating layer 11.
- the edge of the source contact hole and the edge of the source contact region 39s are aligned.
- the edge of the drain contact hole is aligned with the edge of the drain contact region 39d.
- the source contact region 39s and the drain contact region 39d are formed by contact doping.
- the impurity concentration of the second conductivity type in the source contact region 39s and the drain contact region 39d is the same as the impurity concentration of the second conductivity type (for example, p-type) in the source region 38s and the drain region 38d.
- the impurity concentration of the first conductivity type (for example, n-type) of the source contact region 39s and the drain contact region 39d is implanted by contact doping more than the impurity concentration of the first conductivity type of the source region 38s and the drain region 38d. It ’s expensive.
- FIGS. 9A to 9F are schematic process cross-sectional views showing a method for manufacturing the semiconductor device of this embodiment. For simplicity, a method of forming one LDD structure TFT 102, one GOLD structure TFT 202, and one p-type TFT 302 is shown here, but a plurality of TFTs are typically formed.
- an island-shaped semiconductor layer 3A is formed in a region of the substrate 1 where an LDD structure TFT is to be formed, and an island-shaped semiconductor layer 3B is formed in a region where a GOLD structure TFT is to be formed.
- An island-shaped semiconductor layer 3C is formed in a region where a type TFT is to be formed.
- a gate insulating layer 5 covering these semiconductor layers 3A, 3B, 3C is formed.
- the resist mask 45 is disposed so as to expose a region where the high concentration impurity region is formed in the semiconductor layer 3A and to cover a region where the channel region and the LDD region are formed.
- a multi-tone mask such as a halftone mask is used as the resist mask 48.
- n-type impurity ions are implanted into the semiconductor layers 3A, 3B, and 3C at a low concentration using the resist masks 45, 47, and 48 to obtain low-concentration implanted regions 50A, 50B, and 50C.
- Ion implantation step phosphorus ions are implanted as impurity ions.
- the acceleration voltage at the time of implantation is 60 kV, for example, and the dose is 1 ⁇ 10 13 / cm 2 .
- the resist masks 45 and 47 are removed, and an ashing process (half ashing) is performed on the resist mask 48 to reduce the height of the resist mask 48.
- a p-type impurity is implanted into the semiconductor layers 3A, 3B, and 3C using the resist mask 48 having a reduced height as a mask.
- the p-type impurity is implanted into a portion to be a channel region in the semiconductor layers 3A and 3B (channel doping).
- boron ions are implanted at an acceleration voltage of 30 kV and a dose of 1 ⁇ 10 12 / cm 2 .
- gate electrodes 7A, 7B, and 7C are formed on the semiconductor layers 3A, 3B, and 3C, respectively.
- the gate electrode 7C is disposed on the portion that becomes the channel region in the low concentration implantation region 50C of the semiconductor layer 3C.
- the formation method of the gate electrodes 7A, 7B, and 7C and the arrangement of the gate electrodes 7A and 7B may be the same as those described above with reference to FIG.
- n-type impurity ions are implanted into the semiconductor layers 3A, 3B, and 3C at a low concentration using the gate electrodes 7A, 7B, and 7C as a mask (second ion implantation step).
- the implantation conditions may be the same as the conditions for the second ion implantation step shown in FIG.
- the third and fourth LDD regions 36 and 37 are formed in the semiconductor layer 3A, and the first and second LDD regions 34 and 35 are formed in the semiconductor layer 3B.
- a resist mask 44 that covers the LDD structure formation region and the GOLD structure formation region and exposes the p-type TFT formation region is provided, and is covered with the gate electrode 7C of the semiconductor layer 3C.
- a p-type impurity ion is implanted at a high concentration through the gate insulating layer 5 into a portion not present.
- the source region 38s and the drain region 38d are formed in the semiconductor layer 3C.
- the implantation conditions are not particularly limited. For example, boron ions are implanted at an acceleration voltage of 50 kV to 90 kV and a dose amount of 5 ⁇ 10 14 / cm 2 to 5 ⁇ 10 15 / cm 2 .
- activation annealing (first activation annealing) is performed. Thereby, the ions implanted into the semiconductor layers 3A, 3B, and 3C are activated by the first ion implantation step, channel doping, and p-type impurity doping, and the crystallinity of the semiconductor layers 3A, 3B, and 3C is recovered. .
- annealing temperature is not specifically limited, For example, 500 degreeC or more and 700 degrees C or less may be sufficient.
- an interlayer insulating layer 11 is formed so as to cover the semiconductor layers 3A, 3B, 3C, the gate electrodes 7A, 7B, 7C, and the gate insulating layer 5. Thereafter, hydrogenation may be performed as necessary.
- the method of forming the interlayer insulating layer 11 and the hydrogenation annealing may be the same as the method described above with reference to FIG.
- a resist mask 49 having an opening is formed on the interlayer insulating layer 11, and the interlayer insulating layer 11 is patterned using the resist mask 49.
- the source contact hole 13A and the drain contact hole 14A reaching the part of the third LDD region 36 of the semiconductor layer 3A and the source contact hole 13B reaching the part of the first LDD region 34 of the semiconductor layer 3B are formed in the interlayer insulating layer 11.
- impurity ions are implanted into the semiconductor layers 3A, 3B, and 3C through these contact holes 13A, 13B, 13C, 14A, 14B, and 14C (contact doping step).
- the ion implantation conditions may be the same as the contact doping process conditions shown in FIG. Thereby, source regions 33sA and 33sB and drain regions 33dA and 33dB are formed in the semiconductor layers 3A and 3B.
- n-type impurity ions are also implanted into the semiconductor layer 3C to be a p-type TFT, and a source contact region 39s and a drain contact region 39d are obtained. Thereafter, the resist mask 49 is removed.
- n-type impurities are implanted at a low dose into the source and drain regions 38s and 38d into which p-type impurities have been implanted at a high concentration in the step shown in FIG. 9D. For this reason, the region into which the n-type impurity is implanted (source contact region 39s and drain contact region 39d) will not be n-type. Note that contact doping may be performed after the resist mask 49 is removed.
- second activation annealing is performed to recover the crystallinity of the source / drain regions of the semiconductor layers 3A and 3B and the contact regions 39s and 39d of the semiconductor layer 3C, and the implanted ions are activated.
- a source electrode and a drain electrode are formed on each TFT.
- a semiconductor device including the TFTs 102, 202, and 302 is manufactured.
- the temperature of the second activation annealing may be performed at a temperature lower than that of the first activation annealing described above, and may be set to, for example, less than 300 ° C.
- the high concentration implantation regions of the TFTs 102 and 202 are formed using contact doping. Further, channel doping is performed using a halftone mask. Therefore, it is not necessary to form a doping mask for forming a high concentration implantation region and a channel doping mask by a photo process. Accordingly, the number of photomasks used can be reduced by two compared to the conventional case.
- Japanese Patent Application Laid-Open No. 2001-85695 and the like disclose a method for reducing the number of photomasks using a halftone mask.
- a halftone mask is applied for doping, and there is no need to control the line width. Therefore, the number of photomasks can be reduced without degrading the precision controllability.
- the method of the present embodiment is not limited to the above method. It is not necessary to use a halftone mask for channel doping. Alternatively, channel doping may not be performed.
- the present invention can be widely applied to various semiconductor devices having an oxide semiconductor TFT and an oxide semiconductor TFT.
- circuit boards such as active matrix substrates, liquid crystal display devices, organic electroluminescence (EL) display devices and inorganic electroluminescence display devices, display devices such as MEMS display devices, imaging devices such as image sensor devices, image input devices,
- the present invention is also applied to various electronic devices such as fingerprint readers and semiconductor memories.
Abstract
Description
以下、図面を参照しながら、本発明による半導体装置の実施形態を説明する。本明細書では、「半導体装置」は、機能回路が形成された基板やアクティブマトリクス基板、および、液晶表示装置や有機EL表示装置などの表示装置を広く含むものとする。
以下、図面を参照しながら、本発明による第2の実施形態の半導体装置を説明する。
c2<c1<c5 (1)
c4<c3<c5 (2)
c1=c3 (3)
以下、図面を参照しながら、本発明による第3の実施形態の半導体装置を説明する。本実施形態の半導体装置は、同一基板上に、LDD構造を有する第1導電型のTFT、GOLD構造を有する第1導電型のTFT、および第2導電型のTFTを備えている。また、本実施形態では、LDD構造およびGOLD構造TFTのチャネル領域に閾値電圧を調整するためのドーピング(チャネルドーピング)が施されている。
3A、3B,3C 半導体層
5 ゲート絶縁層
7A、7B、7C ゲート電極
8A、8B、8C ソース電極
9A、9B、9C ドレイン電極
11 層間絶縁層
13A、13B、13C ソースコンタクトホール
14A、14B、14C ドレインコンタクトホール
30A、30B 低濃度注入領域
31A、31B、31C チャネル領域
32A、32B LDD領域(低濃度不純物領域)
33sA、33sB、38s ソース領域(高濃度不純物領域)
33dA、33dB、38d ドレイン領域(高濃度不純物領域)
34 第1LDD領域(高濃度LDD領域)
35 第2LDD領域(低濃度LDD領域、NM領域)
36 第3LDD領域(高濃度LDD領域)
37 第4LDD領域(低濃度LDD領域)
39s ソースコンタクト領域
39d ドレインコンタクト領域
41、42、44、45、47、49 レジストマスク
50A、50B、50C 低濃度注入領域
200、201、202 GOLD構造TFT
100、101、102 LDD構造TFT
Claims (19)
- 基板上に少なくとも1つの薄膜トランジスタを備えた半導体装置であって、前記少なくとも1つの薄膜トランジスタは、
チャネル領域と、第1導電型の不純物を含む高濃度不純物領域と、前記チャネル領域と前記高濃度不純物領域との間に位置し、前記高濃度不純物領域よりも低く、かつ、前記チャネル領域よりも高い濃度で前記第1導電型の不純物を含む低濃度不純物領域とを有する半導体層と、
前記半導体層の上に形成されたゲート絶縁層と、
前記ゲート絶縁層の上に設けられ、少なくとも前記チャネル領域と重なるように配置されたゲート電極と
前記ゲート電極および前記ゲート絶縁層上に形成された層間絶縁層と、
前記半導体層に接続されたソース電極およびドレイン電極と
を備え、
前記層間絶縁層および前記ゲート絶縁層には、前記半導体層に達するコンタクトホールが設けられており、前記ソース電極およびドレイン電極の少なくとも一方は、前記層間絶縁層上および前記コンタクトホール内に形成され、前記コンタクトホール内で前記高濃度不純物領域と接し、
前記コンタクトホールの側壁において、前記ゲート絶縁層および前記層間絶縁層の側面は整合しており、
前記半導体層の上面において、前記コンタクトホールの縁部と、前記高濃度不純物領域の縁部とは整合している、半導体装置。 - 前記基板の法線方向から見たとき、前記高濃度不純物領域は、前記低濃度不純物領域の内部に位置している、請求項1に記載の半導体装置。
- 前記少なくとも1つの薄膜トランジスタは、第1薄膜トランジスタを含み、
前記第1薄膜トランジスタでは、前記低濃度不純物領域の一部は、前記ゲート絶縁層を介して前記ゲート電極で覆われている、請求項1または2に記載の半導体装置。 - 前記少なくとも1つの薄膜トランジスタは、第2薄膜トランジスタを含み、
前記第2薄膜トランジスタでは、前記低濃度不純物領域の前記チャネル領域側の端部は、前記ゲート電極の端部と整合している、請求項1から3のいずれかに記載の半導体装置。 - 前記第1薄膜トランジスタにおいて、前記低濃度不純物領域は、前記ゲート絶縁層を介して前記ゲート電極と重ならない第1低濃度不純物領域と、前記ゲート電極と重なる第2低濃度不純物領域とを含み、前記第1低濃度不純物領域は、前記第2低濃度不純物領域よりも高い濃度で前記第1導電型の不純物を含む、請求項3に記載の半導体装置。
- 前記少なくとも1つの薄膜トランジスタは、第2薄膜トランジスタをさらに含み、前記第2薄膜トランジスタでは、前記低濃度不純物領域の前記チャネル領域側の端部は、前記ゲート電極の端部と整合しており、
前記第2薄膜トランジスタにおいて、前記低濃度不純物領域は、前記高濃度不純物領域と接する第3低濃度不純物領域と、前記第3低濃度不純物領域よりも前記チャネル領域側に位置する第4低濃度不純物領域とを含み、前記第3低濃度不純物領域は、前記第4低濃度不純物領域よりも高い濃度で前記第1導電型の不純物を含む、請求項5に記載の半導体装置。 - 前記第1薄膜トランジスタの前記第1低濃度不純物領域と、前記第2薄膜トランジスタの前記第3低濃度不純物領域とは同一の不純物元素を含み、前記第1および第3低濃度不純物領域の厚さ方向における前記第1導電型の不純物の濃度プロファイルは略等しい、請求項6に記載の半導体装置。
- 前記少なくとも1つの薄膜トランジスタとは異なる導電型を有する他の薄膜トランジスタをさらに含み、
前記他の薄膜トランジスタは、
チャネル領域と、コンタクト領域と、前記チャネル領域と前記コンタクト領域との間に位置し、第2導電型の不純物を含む他の高濃度不純物領域とを有する半導体層であって、前記コンタクト領域は、前記他の高濃度不純物と同じ濃度で前記第2導電型の不純物を含み、かつ、前記他の高濃度不純物よりも高い濃度で前記第1導電型の不純物を含む、他の半導体層と、
前記他の半導体層上に延設された前記ゲート絶縁層と、
前記ゲート絶縁層の上に設けられた他のゲート電極と
前記他のゲート電極および前記ゲート絶縁層上に延設された前記層間絶縁層と、
前記他の半導体層に接続された他のソース電極および他のドレイン電極と
を備え、
前記層間絶縁層および前記ゲート絶縁層には、前記他の半導体層に達する他のコンタクトホールが設けられており、前記他のソース電極および他のドレイン電極の少なくとも一方は、前記層間絶縁層上および前記他のコンタクトホール内に形成され、前記他のコンタクトホール内で前記コンタクト領域と接し、
前記他のコンタクトホールの側壁において、前記ゲート絶縁層および前記層間絶縁層の側面は整合しており、
前記他の半導体層の上面において、前記他のコンタクトホールの縁部と、前記コンタクト領域の縁部とは整合している、請求項1から7のいずれかに記載の半導体装置。 - 少なくとも1つ薄膜トランジスタを基板上に備えた半導体装置の製造方法であって、
(a)基板上に、チャネル領域と、前記チャネル領域よりも高い濃度で第1導電型の不純物を含む低濃度不純物領域とを含む島状の半導体層、前記半導体層を覆うゲート絶縁層、および前記ゲート絶縁層上に配置されたゲート電極を形成する工程と、
(b)前記ゲート絶縁層および前記ゲート電極上に層間絶縁層を形成する工程と、
(c)前記層間絶縁層上にマスクを形成し、前記マスクを用いて前記ゲート絶縁層および前記層間絶縁層を同時にエッチングすることによって、前記ゲート絶縁層および前記層間絶縁層に、前記低濃度不純物領域の一部を露出するコンタクトホールを形成する工程と、
(d)前記コンタクトホールを介して、前記半導体層における前記低濃度不純物領域の前記一部に第1導電型の不純物を注入することによって、高濃度不純物領域を形成する工程と、
(e)前記層間絶縁層上および前記コンタクトホール内に、前記高濃度不純物領域と接するように電極を形成する工程と
を包含する半導体装置の製造方法。 - 前記工程(d)よりも前に、前記低濃度不純物領域に対して、第1の活性化アニールを行い、
前記工程(d)よりも後に、前記高濃度不純物領域に対して、第2の活性化アニールを行う、請求項9に記載の半導体装置の製造方法。 - 前記第2の活性化アニールは、前記第1の活性化アニールよりも低い温度で行う、請求項10に記載の半導体装置の製造方法。
- 前記工程(a)は、前記半導体層の一部に、前記第1導電型の不純物を注入する第1のイオン注入工程を含み、
前記工程(d)では、前記第1のイオン注入工程よりも低いドーズ量または低い加速電圧で、前記第1導電型の不純物の注入を行う、請求項9から11のいずれかに記載の半導体装置の製造方法。 - 前記工程(a)において、前記低濃度不純物領域の少なくとも一部は、前記ゲート絶縁層を介して前記ゲート電極と重なっている、請求項9から12のいずれかに記載の半導体装置の製造方法。
- 少なくとも第1薄膜トランジスタおよび第2薄膜トランジスタを基板上に備えた半導体装置の製造方法であって、
(a)基板上に、第1薄膜トランジスタの活性層となる第1半導体層と、第2薄膜トランジスタの活性層となる第2半導体層とを形成し、前記第1および第2半導体層を覆うゲート絶縁層を形成する工程と、
(b)前記第1半導体層の一部および前記第2半導体層の一部に、第1導電型の不純物を注入する第1の注入工程と、
(c)前記第1半導体層のうち前記第1の注入工程で不純物が注入された領域の一部およびチャネル領域となる部分の上に第1ゲート電極を形成し、前記第2半導体層のうち前記第1の注入工程で不純物が注入されなかった領域の一部上に第1ゲート電極を形成する工程と、
(d)前記第1および第2ゲート電極をマスクとして、前記第1および第2半導体層に第1導電型の不純物を注入する第2の注入工程であって、これにより、前記第1半導体層のうち前記第1および第2の注入工程の両方で不純物が注入された領域が第1低濃度不純物領域、前記第1の注入工程で不純物が注入され、かつ、前記第2ゲート電極で覆われていたために前記第2の注入工程で不純物が注入されなかった領域が第2低濃度不純物領域となり、前記第2半導体層のうち前記第1および第2の注入工程の両方で不純物が注入された領域が第3低濃度不純物領域、前記第2の注入工程で不純物が注入され、前記第1の注入工程で不純物が注入されなかった領域が第4低濃度不純物領域となる、第2のイオン注入工程と、
(e)前記ゲート絶縁層、前記第1ゲート電極および第2ゲート電極上に層間絶縁層を形成する工程と、
(f)前記層間絶縁層上にマスクを形成し、前記マスクを用いて前記ゲート絶縁層および前記層間絶縁層を同時にエッチングすることによって、前記ゲート絶縁層および前記層間絶縁層に、前記第1低濃度不純物領域の一部を露出する第1コンタクトホールと、前記第3低濃度不純物領域の一部を露出する第2コンタクトホールとを形成する工程と、
(g)前記第1および第2コンタクトホールを介して、前記第1および第3低濃度不純物領域の前記一部に第1導電型の不純物を注入することによって、前記第1半導体層に第1高濃度不純物領域を形成し、前記第2半導体層に第2高濃度不純物領域を形成する工程と、
(h)前記層間絶縁層上および前記第1コンタクトホール内に、前記第1高濃度不純物領域と接する第1の電極を形成し、前記層間絶縁層上および前記第2コンタクトホール内に、前記第2高濃度不純物領域と接する第2の電極を形成する工程と
を包含する半導体装置の製造方法。 - 前記工程(g)よりも前に、前第1、第2、第3および第4低濃度不純物領域に対して、第1の活性化アニールを行い、
前記工程(g)よりも後に、前記第1および第2高濃度不純物領域に対して、第2の活性化アニールを行う、請求項14に記載の半導体装置の製造方法。
- 前記第2の活性化アニールは、前記第1の活性化アニールよりも低い温度で行う、請求項14または15に記載の半導体装置の製造方法。
- 前記工程(g)では、前記第1および第2のイオン注入工程よりも低いドーズ量または低い加速電圧で、前記第1導電型の不純物の注入を行う、請求項14から16のいずれかに記載の半導体装置の製造方法。
- 前記第1および第2薄膜トランジスタとは導電型の異なる第3薄膜トランジスタをさらに備え、
前記工程(a)は、前記基板上に第3半導体層を形成する工程を含み、前記ゲート絶縁層は前記第3半導体層上にも延設され、
前記工程(c)は、前記第3半導体層上に第3ゲート電極を形成する工程を含み、
前記工程(c)の後、前記工程(e)の前に、前記第3ゲート電極をマスクとして第2導電型の不純物を前記第3半導体層に注入することによって、前記第3半導体層に第3高濃度不純物領域を形成する工程をさらに含み、
前記工程(e)において前記層間絶縁層は、前記第3ゲート電極上にも延設され、
前記工程(f)は、前記ゲート絶縁層および前記層間絶縁層に、前記第3高濃度不純物領域の一部を露出する第3コンタクトホールを形成する工程を含み、
前記工程(g)は、前記第3コンタクトホールを介して、前記第3高濃度不純物領域の前記一部に第1導電型の不純物を注入することによって、前記第3半導体層にコンタクト領域を形成する工程を含み、
前記工程(h)は、前記層間絶縁層上および前記第3コンタクトホール内に、前記コンタクト領域と接する第3の電極を形成する工程を含む、請求項14から17のいずれかに記載の半導体装置の製造方法。 - 前記工程(b)の前記第1の注入工程は、前記第1、第2および第3半導体層上にそれぞれ配置された第1、第2および第3マスクを用いて行い、前記第3マスクは多階調マスクであり、
前記第1の注入工程の後、前記工程(c)の前に、
前記第1および第2マスクを除去するとともに、前記第3マスクの一部を除去する工程と、
前記第3マスクの一部を用いて、前記第1および第2半導体層のチャネル領域となる部分を含む領域に不純物を注入する工程と
をさらに包含する、請求項18に記載の半導体装置の製造方法。
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019109441A1 (zh) * | 2017-12-04 | 2019-06-13 | 武汉华星光电半导体显示技术有限公司 | 一种多晶硅tft基板的制作方法及多晶硅tft基板 |
JP2019153613A (ja) * | 2018-02-28 | 2019-09-12 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の作製方法 |
WO2023243073A1 (ja) * | 2022-06-17 | 2023-12-21 | シャープディスプレイテクノロジー株式会社 | 半導体装置、半導体装置の製造方法 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105428243B (zh) * | 2016-01-11 | 2017-10-24 | 京东方科技集团股份有限公司 | 一种薄膜晶体管及制作方法、阵列基板和显示装置 |
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CN112103245B (zh) * | 2020-09-22 | 2023-08-11 | 成都京东方显示科技有限公司 | 阵列基板的制造方法、阵列基板及显示面板 |
JP2022083170A (ja) * | 2020-11-24 | 2022-06-03 | 株式会社ジャパンディスプレイ | 表示装置及びその製造方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03184372A (ja) * | 1989-12-13 | 1991-08-12 | Olympus Optical Co Ltd | 半導体装置の製造方法 |
JPH0756189A (ja) * | 1993-08-12 | 1995-03-03 | Seiko Epson Corp | 薄膜半導体装置およびその製造方法 |
JPH07122649A (ja) * | 1993-10-26 | 1995-05-12 | Matsushita Electric Ind Co Ltd | Cmosトランジスタの製造方法 |
JPH07335891A (ja) * | 1994-06-03 | 1995-12-22 | Seiko Epson Corp | 不純物の活性化方法ならびに薄膜トランジスタおよびその製造方法ならびに液晶表示装置 |
JPH09232583A (ja) * | 1996-02-27 | 1997-09-05 | Fujitsu Ltd | 薄膜トランジスタ及びその製造方法、並びに薄膜トランジスタマトリクス装置 |
JP2002175028A (ja) * | 2000-07-31 | 2002-06-21 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4536187B2 (ja) * | 1998-11-17 | 2010-09-01 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
EP2284605A3 (en) * | 1999-02-23 | 2017-10-18 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device and fabrication method thereof |
JP4038309B2 (ja) | 1999-09-10 | 2008-01-23 | セイコーエプソン株式会社 | 半導体装置の製造方法、アクティブマトリクス基板の製造方法 |
US6613620B2 (en) | 2000-07-31 | 2003-09-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
JP2002134756A (ja) | 2000-10-26 | 2002-05-10 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
US6773944B2 (en) * | 2001-11-07 | 2004-08-10 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
CN1549230A (zh) * | 2003-05-07 | 2004-11-24 | Pt普拉斯有限公司 | 用于lcd或oeld的具有多栅极结构的结晶硅tft板 |
US6963083B2 (en) * | 2003-06-30 | 2005-11-08 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device having polycrystalline TFT and fabricating method thereof |
JP2005333107A (ja) | 2004-04-21 | 2005-12-02 | Mitsubishi Electric Corp | 半導体装置、画像表示装置および半導体装置の製造方法 |
KR101108369B1 (ko) * | 2004-12-31 | 2012-01-30 | 엘지디스플레이 주식회사 | 폴리 실리콘형 액정 표시 장치용 어레이 기판 및 그 제조방법 |
JP2007103418A (ja) * | 2005-09-30 | 2007-04-19 | Seiko Epson Corp | 半導体装置、半導体装置の製造方法、並びに電気光学装置 |
JP2007109868A (ja) * | 2005-10-13 | 2007-04-26 | Sanyo Electric Co Ltd | 薄膜トランジスタ及び有機エレクトロルミネッセンス表示装置 |
JP2007141992A (ja) | 2005-11-16 | 2007-06-07 | Hitachi Displays Ltd | 表示装置とその製造方法 |
US20100327353A1 (en) * | 2008-01-29 | 2010-12-30 | Atsushi Shoji | Semiconductor device and method for manufacturing the same |
JP2011187500A (ja) * | 2010-03-04 | 2011-09-22 | Sharp Corp | 半導体装置およびその製造方法 |
-
2016
- 2016-04-19 US US15/569,283 patent/US10468533B2/en active Active
- 2016-04-19 JP JP2017515494A patent/JP6503459B2/ja active Active
- 2016-04-19 WO PCT/JP2016/062369 patent/WO2016175086A1/ja active Application Filing
- 2016-04-19 CN CN201680024473.2A patent/CN107533981B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03184372A (ja) * | 1989-12-13 | 1991-08-12 | Olympus Optical Co Ltd | 半導体装置の製造方法 |
JPH0756189A (ja) * | 1993-08-12 | 1995-03-03 | Seiko Epson Corp | 薄膜半導体装置およびその製造方法 |
JPH07122649A (ja) * | 1993-10-26 | 1995-05-12 | Matsushita Electric Ind Co Ltd | Cmosトランジスタの製造方法 |
JPH07335891A (ja) * | 1994-06-03 | 1995-12-22 | Seiko Epson Corp | 不純物の活性化方法ならびに薄膜トランジスタおよびその製造方法ならびに液晶表示装置 |
JPH09232583A (ja) * | 1996-02-27 | 1997-09-05 | Fujitsu Ltd | 薄膜トランジスタ及びその製造方法、並びに薄膜トランジスタマトリクス装置 |
JP2002175028A (ja) * | 2000-07-31 | 2002-06-21 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019109441A1 (zh) * | 2017-12-04 | 2019-06-13 | 武汉华星光电半导体显示技术有限公司 | 一种多晶硅tft基板的制作方法及多晶硅tft基板 |
JP2019153613A (ja) * | 2018-02-28 | 2019-09-12 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の作製方法 |
JP7071841B2 (ja) | 2018-02-28 | 2022-05-19 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の作製方法 |
WO2023243073A1 (ja) * | 2022-06-17 | 2023-12-21 | シャープディスプレイテクノロジー株式会社 | 半導体装置、半導体装置の製造方法 |
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