WO2015008719A1 - 膜形成用組成物およびその膜、並びにそれを用いる有機半導体素子の製造方法 - Google Patents
膜形成用組成物およびその膜、並びにそれを用いる有機半導体素子の製造方法 Download PDFInfo
- Publication number
- WO2015008719A1 WO2015008719A1 PCT/JP2014/068662 JP2014068662W WO2015008719A1 WO 2015008719 A1 WO2015008719 A1 WO 2015008719A1 JP 2014068662 W JP2014068662 W JP 2014068662W WO 2015008719 A1 WO2015008719 A1 WO 2015008719A1
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- WIPO (PCT)
- Prior art keywords
- film
- fluorine
- solvent
- fluororesin
- carbon atoms
- Prior art date
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- 239000003607 modifier Substances 0.000 description 1
- YKYONYBAUNKHLG-UHFFFAOYSA-N n-Propyl acetate Natural products CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical group CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- DIOQZVSQGTUSAI-UHFFFAOYSA-N n-butylhexane Natural products CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 1
- UUIQMZJEGPQKFD-UHFFFAOYSA-N n-butyric acid methyl ester Natural products CCCC(=O)OC UUIQMZJEGPQKFD-UHFFFAOYSA-N 0.000 description 1
- 150000002825 nitriles Chemical class 0.000 description 1
- ZCYXXKJEDCHMGH-UHFFFAOYSA-N nonane Chemical compound CCCC[CH]CCCC ZCYXXKJEDCHMGH-UHFFFAOYSA-N 0.000 description 1
- BKIMMITUMNQMOS-UHFFFAOYSA-N normal nonane Natural products CCCCCCCCC BKIMMITUMNQMOS-UHFFFAOYSA-N 0.000 description 1
- 238000000655 nuclear magnetic resonance spectrum Methods 0.000 description 1
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 150000007519 polyprotic acids Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 229940090181 propyl acetate Drugs 0.000 description 1
- HUAZGNHGCJGYNP-UHFFFAOYSA-N propyl butyrate Chemical compound CCCOC(=O)CCC HUAZGNHGCJGYNP-UHFFFAOYSA-N 0.000 description 1
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 238000010526 radical polymerization reaction Methods 0.000 description 1
- 238000007348 radical reaction Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000001226 reprecipitation Methods 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 150000003462 sulfoxides Chemical class 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- DVKJHBMWWAPEIU-UHFFFAOYSA-N toluene 2,4-diisocyanate Chemical compound CC1=CC=C(N=C=O)C=C1N=C=O DVKJHBMWWAPEIU-UHFFFAOYSA-N 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 125000005270 trialkylamine group Chemical group 0.000 description 1
- YFNKIDBQEZZDLK-UHFFFAOYSA-N triglyme Chemical compound COCCOCCOCCOC YFNKIDBQEZZDLK-UHFFFAOYSA-N 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 1
- KOZCZZVUFDCZGG-UHFFFAOYSA-N vinyl benzoate Chemical compound C=COC(=O)C1=CC=CC=C1 KOZCZZVUFDCZGG-UHFFFAOYSA-N 0.000 description 1
- 229920001567 vinyl ester resin Polymers 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- INRGAWUQFOBNKL-UHFFFAOYSA-N {4-[(Vinyloxy)methyl]cyclohexyl}methanol Chemical group OCC1CCC(COC=C)CC1 INRGAWUQFOBNKL-UHFFFAOYSA-N 0.000 description 1
- 239000004711 α-olefin Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F232/00—Copolymers of cyclic compounds containing no unsaturated aliphatic radicals in a side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic ring system
- C08F232/02—Copolymers of cyclic compounds containing no unsaturated aliphatic radicals in a side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic ring system having no condensed rings
- C08F232/04—Copolymers of cyclic compounds containing no unsaturated aliphatic radicals in a side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic ring system having no condensed rings having one carbon-to-carbon double bond
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D127/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Coating compositions based on derivatives of such polymers
- C09D127/02—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Coating compositions based on derivatives of such polymers not modified by chemical after-treatment
- C09D127/12—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Coating compositions based on derivatives of such polymers not modified by chemical after-treatment containing fluorine atoms
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- C09D129/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Coating compositions based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Coating compositions based on derivatives of such polymers
- C09D129/10—Homopolymers or copolymers of unsaturated ethers
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- C09D145/00—Coating compositions based on homopolymers or copolymers of compounds having no unsaturated aliphatic radicals in a side chain, and having one or more carbon-to-carbon double bonds in a carbocyclic or in a heterocyclic system; Coating compositions based on derivatives of such polymers
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
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- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/20—Diluents or solvents
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
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- H—ELECTRICITY
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
- H10K71/231—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
- H10K71/231—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers
- H10K71/233—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers by photolithographic etching
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
- H10K71/231—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers
- H10K71/236—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers using printing techniques, e.g. applying the etch liquid using an ink jet printer
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/02—Halogenated hydrocarbons
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/06—Ethers; Acetals; Ketals; Ortho-esters
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
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- H—ELECTRICITY
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/615—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
Definitions
- the present invention relates to a film-forming composition for coating and forming on an organic semiconductor film, the film, and a method for producing an organic semiconductor element using the composition.
- Organic semiconductors are organic substances that exhibit semiconductor properties, such as organic low molecules such as pentacene, anthracene, tetracene, and phthalocyanine, polyacetylene conductive polymers, polyparaphenylene and derivatives thereof, polyphenylene vinylene and derivatives thereof, and the like. Polymers, polypyrrole and derivatives thereof, polythiophene and derivatives thereof, heterocyclic conductive polymers such as polyfuran and derivatives thereof, organic semiconductors such as ionic conductive polymers such as polyaniline and derivatives thereof, organic charge transfer complexes, etc. It has been known.
- organic semiconductors that can be applied wet such as organic low-molecular semiconductors and polythiophenes
- organic substrates such as organic polymer substrates
- circuits can be formed on organic semiconductor films formed on organic materials.
- an organic electrochromic display having flexibility can be manufactured.
- a semiconductor film is microfabricated into a desired semiconductor circuit (hereinafter sometimes referred to as pattern processing), and the semiconductor film is protected during microfabrication.
- pattern processing a semiconductor circuit for protecting a later circuit pattern is provided.
- a semiconductor circuit is a technique for exposing a substrate surface coated with a photosensitive material (resist) to a pattern through a photomask or a reticle, and forming a pattern including an exposed portion and an unexposed portion.
- the resist film applied on the semiconductor film is patterned by exposure and development using lithography, and then the semiconductor film is patterned by dry etching or wet etching.
- a film for protecting the organic semiconductor film from an etchant that is a peeling solvent is formed on the organic semiconductor film.
- the first requirement is that the organic semiconductor film can be dissolved in a solvent that does not dissolve and swell and can be wet-formed on the organic semiconductor film.
- the second requirement is that the wet deposited film protects the organic semiconductor film so that the coated organic semiconductor film is not etched when patterning the organic semiconductor film.
- Etching includes dry etching by plasma irradiation or the like in a vacuum apparatus and wet etching using a solvent, but wet etching is simple because the organic semiconductor film is soluble in an etchant.
- an organic semiconductor contains an aromatic ring group or a heterocyclic group in the structure, it is easily dissolved in an aromatic solvent such as benzene, toluene or xylene.
- Patent Document 1 and Patent Document 2 disclose a film-forming composition excellent in etchant resistance that is not affected by an etchant when an organic semiconductor film is etched to form a semiconductor circuit pattern, and the film thereof.
- Patent Document 1 discloses an organic semiconductor element manufacturing method and an organic semiconductor element excellent in stability of electric characteristics.
- a material for forming a film on the organic semiconductor film at the time of manufacturing the organic semiconductor element propylene carbonate, acetonitrile, A film forming solution containing at least one organic solvent selected from dimethyl sulfoxide and an organic compound soluble in the organic solvent is used.
- Patent Document 2 discloses a photosensitive resin composition capable of forming a film having high photoreactivity and capable of patterning, and having high hydrophobicity and excellent dielectric properties, a thin film thereof, and a pattern forming method.
- the solvent for the product include alcohols, hydrocarbons, halogenated hydrocarbons, ethers, esters, ketones, cellosolves, carbitols, glycol ether esters, amides, sulfoxides or nitriles. Etc.
- the organic solvent used in the material for forming the film on the organic semiconductor film described in Patent Document 1 and the solvent used in the photosensitive resin composition described in Patent Document 2 do not necessarily affect the organic semiconductor film. It's hard to say that you don't give it. There is a need for a film-forming composition and film that can be applied by coating without immersing the organic semiconductor film, and that can be patterned by photolithography or imprinting.
- Patent Document 3 octafluorocyclopentene as a fluorine-containing copolymer composed of a perfluoro group having a saturated main chain ring structure, which can be dissolved in many general-purpose solvents and obtain a transparent coating film, A fluorine-containing copolymer obtained by polymerizing a compound having a polymerizable double bond is disclosed.
- An object of the present invention is to provide a film which is not affected by an etchant during pattern processing, a film forming composition used therefor, and a method for producing an organic semiconductor element using the film.
- fluorine-based solvents such as fluorine-containing hydrocarbons or fluorine-containing ethers can be applied to wet-applicable organic semiconductor films as compared with the solvents described in Patent Document 1 or Patent Document 2. It was found that there was little effect of dissolution and swelling. Based on this knowledge, the present inventors are soluble in fluorine-based solvents such as fluorine-containing hydrocarbons or fluorine-containing ethers, and are immersed in an etchant when the organic semiconductor film is etched and patterned. We searched for a fluororesin without any.
- the present invention uses a fluorine-based solvent that has extremely little influence on dissolution or swelling in an organic semiconductor film, dissolves a specific fluorine resin that is soluble in the fluorine-based solvent and has excellent etchant resistance.
- the present invention is a film forming composition for forming a fluororesin film on an organic semiconductor film, the film, and a method for manufacturing an organic semiconductor element using the film.
- the fluororesin film can be patterned by lithography, printing, for example, imprinting, and is used for etching a lower organic semiconductor film, a hydrocarbon solvent or an aromatic solvent, for example, benzene, toluene.
- a hydrocarbon solvent or an aromatic solvent for example, benzene, toluene.
- it is difficult to dissolve in an etchant such as xylene the organic semiconductor film can be patterned, and can be applied to a method for manufacturing an organic semiconductor element.
- the present invention includes the following inventions 1 to 23.
- a film-forming composition for forming a film on an organic semiconductor film the fluororesin comprising a repeating unit represented by formula (1) and a repeating unit represented by formula (2), a fluorine-based solvent
- a film-forming composition comprising: (In the formula, R 1, C 1 -C 15 straight, .R 1 is a cyclic hydrocarbon group branched or a C 3-15 having 3 to 15 carbon atoms are in the hydrocarbon radical (At least one hydrogen atom may be substituted with a fluorine atom or a chlorine atom. R 1 may have a hydroxyl group.)
- Invention 2 The film-forming composition of Invention 1, wherein the fluorine-based solvent is a fluorine-based solvent containing a fluorine-containing hydrocarbon or a fluorine-containing ether.
- the fluorine-based solvent is a linear, branched or cyclic hydrocarbon having 4 to 8 carbon atoms as the fluorine-containing hydrocarbon, and at least one hydrogen atom in the hydrocarbon is substituted with a fluorine atom.
- the film forming composition of Invention 2 which is a fluorinated solvent containing a fluorinated hydrocarbon.
- [Invention 4] The film-forming composition of Invention 2, wherein the fluorinated solvent is a fluorinated solvent containing a fluorinated ether represented by the general formula (3) as the fluorinated ether.
- R 2 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms. At least one of them may be substituted with a fluorine atom
- R 3 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms.
- At least one of the hydrogen atoms in the group is substituted with a fluorine atom.
- invention 5 The film-forming composition of inventions 1 to 4, wherein the fluorine-based solvent is a fluorine-based solvent further containing a fluorine-containing alcohol represented by the general formula (4).
- R 4 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms. At least one is substituted with a fluorine atom.
- invention 6 The film-forming composition according to any one of Inventions 1 to 5, comprising a fluororesin having a fluorine content of 30% by mass to 65% by mass as the fluororesin.
- invention 7 The film-forming composition according to any one of Inventions 1 to 6, comprising a fluorine-based solvent having a fluorine content of 50% by mass or more and 70% by mass or less as the fluorine-based solvent.
- invention 8 A fluororesin film formed by applying the film-forming composition of Inventions 1 to 7 on an organic semiconductor film.
- invention 9 A step of applying the film-forming composition of the invention 1-7 onto an organic semiconductor film to form a fluororesin film, a patterning process of the fluororesin film, and a patterning process of the organic semiconductor film by etching A method for producing an organic semiconductor element.
- invention 13 The manufacturing method of inventions 9 to 12, wherein the step of patterning the organic semiconductor film by etching is a step of patterning the organic semiconductor film by wet etching using a hydrocarbon solvent or an aromatic solvent.
- invention 15 The manufacturing method of invention 9-14 including the process of removing a fluororesin film
- invention 16 The manufacturing method of the invention 15 whose process of removing a fluororesin film
- the fluorine-based solvent is a linear, branched or cyclic hydrocarbon having 4 to 8 carbon atoms as a fluorine-containing hydrocarbon, and at least one hydrogen atom in the hydrocarbon is substituted with a fluorine atom.
- the manufacturing method of the invention 17 which is a fluorine-type solvent containing a fluorine hydrocarbon.
- [Invention 19] The manufacturing method of the invention 17 whose fluorine-type solvent is a fluorine-type solvent containing the fluorine-containing ether represented by General formula (3) as fluorine-containing ether.
- R 2 is a linear or branched or cyclic hydrocarbon group having 1 to 15 carbon atoms, and at least one of the hydrogen atoms in the hydrocarbon group is a fluorine atom.
- R 3 is a linear, branched or cyclic hydrocarbon group having 1 to 15 carbon atoms and a branched or cyclic hydrocarbon group having 3 to 15 carbon atoms, and at least one hydrogen atom in the group is fluorine. Substituted with atoms.
- invention 20 The production method of Inventions 16 to 19, wherein the fluorinated solvent is a fluorinated solvent further comprising a fluorinated alcohol represented by the general formula (4).
- R 4 is a linear, branched or cyclic hydrocarbon group having 1 to 15 carbon atoms, a branched or cyclic group having 3 to 15 carbon atoms, and at least one of the hydrogen atoms in the hydrocarbon group is a fluorine atom. Is replaced by.
- invention 21 An organic semiconductor device manufactured by the manufacturing method of inventions 9-20.
- a liquid crystal display comprising the organic semiconductor element of the invention 21.
- the composition for film formation of the present invention does not dissolve or swell and immerse the organic semiconductor film when applied on the organic semiconductor film, it can be wet-formed on the organic semiconductor film to form a coating film.
- the film is patterned by photolithography, printing, or imprinting, and then wet etched with the organic semiconductor film without being immersed in an etchant such as a hydrocarbon solvent or an aromatic solvent. Can be patterned.
- an etchant such as a hydrocarbon solvent or an aromatic solvent.
- FIG. 5B is a diagram in which a fluororesin film is formed on the organic semiconductor film.
- C It is the figure which formed the pattern formation in the fluororesin film
- D It is the figure which wet-etched the organic-semiconductor film.
- E It is the figure which peeled the fluororesin film
- the film-forming composition of the present invention contains a fluorine-based solvent for application as a solution in addition to the film-forming fluororesin.
- Fluororesin The fluororesin contained in the film forming composition of the present invention includes a repeating unit represented by the formula (1) and a repeating unit represented by the general formula (2).
- R 1 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms. At least one of hydrogen atoms in the group) May be substituted with a fluorine atom or a chlorine atom, and may have a hydroxyl group.
- R 1 is a linear hydrocarbon group having 1 to 6 carbon atoms, a branched chain structure having 3 to 8 carbon atoms, or a cyclic hydrocarbon group having 6 to 8 carbon atoms (provided that at least one hydrogen atom in the group is A fluororesin which may be substituted with a fluorine atom or a chlorine atom and may have a hydroxyl group is excellent in etchant resistance and is preferable for use in the film-forming composition of the present invention.
- a cyclic hydrocarbon group having 6 to 8 carbon atoms means a group having an alicyclic ring or aromatic ring in the structure.
- R 1 is methyl group, ethyl group, normal propyl group, isopropyl group, normal butyl group, isobutyl group, secondary butyl group, tertiary butyl group, pentyl group, isopentyl group, hexyl group, cyclohexyl group, 2 -Ethylhexyl group, hydroxyethyl group, hydroxybutyl group, 4-hydroxycyclohexyl group, (4-hydroxymethyl) cyclohexylmethyl group, benzyl group, 2,2,2-trifluoroethyl group, 1,1,1,3 A 3,3-hexafluoro-2-propyl group or a 2,2,3,3,4,4,5,5-octafluoropentyl group can be exemplified.
- the fluororesin By using such a fluororesin, it becomes soluble in a specific fluorine-based solvent.
- the fluororesin is obtained by copolymerizing octafluorocyclopentene and vinyl ether as a raw material compound, and includes a repeating unit (1) based on octafluorocyclopentene and a repeating unit (2) based on vinyl ether.
- the repeating unit (1) based on octafluorocyclopentene the fluororesin is soluble in a specific fluorosolvent system, but is difficult to dissolve or swell in the etching solvent for the organic semiconductor film, and has a low dielectric constant and insulation.
- the required performance of the insulating film such as property, water repellency and chemical stability can be obtained.
- the repeating unit (2) by vinyl ether the fluororesin can easily form a flat coating film.
- the vinyl ether used for the polymerization of the fluororesin may be copolymerized with octafluorocyclopentene, but is preferably one having one vinyloxy group from the viewpoint of ease of polymerization.
- a single vinyl ether or a mixture of a plurality of vinyl ethers may be used.
- Commercially available vinyl ethers may be added with a stabilizer such as potassium hydroxide, but usually it is not necessary to remove the stabilizer unless it interferes with the polymerization reaction.
- a monomer other than octafluorocyclopentene and vinyl ether is added to the raw material as long as the solubility of the fluororesin in the fluorine-based solvent is not impaired, and the repeating represented by the formula (1) derived from octafluorocyclopentene is added to the fluororesin.
- a repeating unit other than the unit and the repeating unit represented by the formula (2) derived from vinyl ether may be introduced.
- an ⁇ -substituted or unsubstituted acrylate, ⁇ -olefin, fluorine-containing olefin, carboxylic acid vinyl ester and the like can be mentioned.
- at least one hydrogen atom may be fluorinated.
- Acrylic acid esters include acrylic acid, methacrylic acid, ⁇ -fluoroacrylic acid or ⁇ -trifluoromethyl acrylic acid, methyl ester, ethyl ester, propyl ester, isopropyl ester, butyl ester, isobutyl ester, tertiary butyl ester, Pentyl ester, isopentyl ester, hexyl ester, cyclohexyl ester, cyclohexyl methyl ester, 2-hydroxyethyl ester, 2-hydroxypropyl ester, 3-hydroxypropyl ester, 4-hydroxycyclohexyl ester, 4- (hydroxymethyl) cyclohexyl methyl ester Bornyl ester, isobornyl ester, norbornyl ester, methoxymethyl ester, methoxyethyl ester, Toxic ethyl ester, ethoxy ethoxy ethyl ester or methoxy e
- vinyl carboxylates examples include vinyl acetate, vinyl propionate, vinyl butyrate, vinyl caproate, vinyl laurate, vinyl palmitate, vinyl stearate, vinyl pivalate, vinyl chloroacetate, vinyl methacrylate, or vinyl benzoate. can do.
- the composition of the fluororesin is a repeating unit represented by the formula (1) derived from octafluorocyclopentene, which accounts for the total mass of the fluororesin, because of its solubility in a fluorine-based solvent and the physical properties required when the fluororesin film is formed.
- the content of is 33 mass% or more and 90 mass% or less, preferably 50 mass% or more and 80 mass% or less. If it is less than 33% by mass, the solubility in a fluorine-based solvent becomes insufficient, the dielectric constant increases, or the insulating property decreases. If the amount exceeds 90% by mass, the polymerization when the fluororesin is used is difficult to proceed, and there is no need to exceed 90% by mass.
- the content of the repeating unit that may be added in addition to the repeating unit represented by the formula (1) derived from octafluorocyclopentene and the repeating unit represented by the formula (2) derived from vinyl ether contained in the fluororesin Preferably it is 25 mass% or less with respect to the total mass.
- the weight average molecular weight of the fluororesin is preferably 2,000 to 200,000, more preferably 3,000 to 15,000.
- the molecular weight is less than 2,000, the resistance to the etching solvent is insufficient, and when the molecular weight is greater than 200,000, the solubility in the fluorine-based solvent is insufficient, and it becomes difficult to form a fluororesin film by coating.
- the preferred fluororesin contained in the film-forming composition of the present invention is specifically a fluororesin comprising the repeating unit represented by the formula (1) and at least one of the following repeating units. .
- radical polymerization In order to polymerize the monomer to obtain the fluororesin contained in the film forming composition of the present invention, for example, generally known radical polymerization can be used. Specifically, an azo compound, a peroxide can be used. The polymerization can be performed using a radical initiator such as a persulfuric acid compound or a redox compound as an initiator for the radical reaction.
- a radical initiator such as a persulfuric acid compound or a redox compound as an initiator for the radical reaction.
- a solvent may be used in addition to the monomer and the initiator.
- Various organic substances can be used as the polymerization solvent, such as esters such as ethyl acetate, butyl acetate or propylene glycol monomethyl ether acetate, ketones such as acetone, 2-butanone or cyclohexanone, ethers such as diisopropyl ether, dibutyl ether or tetrahydrofuran.
- Aromatic hydrocarbons such as benzene or toluene, hydrocarbons such as hexane, heptane or cyclohexane, or those in which at least one hydrogen atom of the organic solvent is substituted with a halogen atom.
- the fluorinated solvent which is a solvent for the film forming composition can be used as a polymerization solvent.
- the monomer concentration during polymerization with respect to the total mass of the reaction system is preferably 1% by mass or more and 95% by mass or less, and more preferably 10% by mass or more and 80% by mass or less.
- concentration of the monomer of 1% by mass or less is low, the reaction rate of the polymerization reaction is lowered.
- additives such as organic amines, inorganic bases, basic inorganic salts or solid bases may be added to the polymerization solvent to remove acidic impurities contained in the monomer octafluorocyclopentene.
- organic amines include ammonia, monoalkylamines, dialkylamines, trialkylamines, pyridine, aniline, or substituted products thereof.
- the inorganic base include alkali metal or alkaline earth metal hydroxides.
- basic inorganic salts include alkali metal carbonates or carboxylates.
- the solid base include basic ion exchange resins and alumina powder.
- the amount of inorganic base used is preferably 0.05% by mass or more and 10% by mass or less based on the total mass of the reaction system.
- the purification method include distillation of residual monomers by depressurization or heating, reprecipitation using a poor solvent, liquid-liquid washing operation for a polymer solution, or washing by stirring a polymer solid in a solvent. Etc. can be used. You may use combining these methods.
- Fluorinated solvent contained in the film-forming composition of the present invention is a fluorinated solvent containing a fluorinated hydrocarbon or a fluorinated ether.
- the fluorine-based solvent is a linear, branched or cyclic hydrocarbon having 4 to 8 carbon atoms as a fluorine-containing hydrocarbon, and at least one hydrogen atom in the hydrocarbon is substituted with a fluorine atom.
- a fluorinated solvent containing a fluorinated hydrocarbon is preferred.
- a fluorine-type solvent is a fluorine-type solvent containing the fluorine-containing ether represented by General formula (3) as fluorine-containing ether.
- R 2 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms. At least one of them may be substituted with a fluorine atom
- R 3 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms.
- At least one of the hydrogen atoms in the group is substituted with a fluorine atom.
- the fluorinated solvent may further contain a fluorinated alcohol represented by the general formula (4).
- R 4 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms. At least one is substituted with a fluorine atom.
- the fluorine-based solvent contained in the film-forming composition of the present invention may be any one that dissolves the aforementioned fluororesin.
- a fluorine-type solvent In order to make it melt
- the fluorinated solvent in the film-forming composition of the present invention the following fluorinated hydrocarbon or fluorinated ether can be preferably used.
- the fluorine-containing hydrocarbon has a low ozone depletion coefficient and is preferable as the fluorine-based solvent contained in the film-forming composition of the present invention.
- straight-chain, branched-chain or cyclic hydrocarbons having 4 to 8 carbon atoms in which at least one hydrogen atom is substituted with a fluorine atom are preferable because they are easy to apply.
- fluorine-containing hydrocarbons include those in which at least one hydrogen atom of butane, pentane, hexane, heptane, octane, cyclopentane or cyclohexane is substituted with a fluorine atom.
- fluorine-containing hydrocarbons include those in which at least one hydrogen atom of butane, pentane, hexane, heptane, octane, cyclopentane or cyclohexane is substituted with a fluorine atom.
- CH 3 CF 2 CH 2 CF 3 , CF 3 CHFCHFCF 2 CF 3 , CF 3 CF 2 CF 2 CF 2 CF 2 CH 2 CH 2 CH 3 and the following fluorine-containing hydrocarbons are exemplified can do.
- the boiling point of the fluorinated hydrocarbon needs to be higher than the substrate temperature when the film-forming composition is applied, preferably 20 ° C. or more, more preferably 50 ° C. or more than the application temperature. If the boiling point of the fluorinated hydrocarbon is lower than the substrate temperature when the film-forming composition is applied, the fluorinated hydrocarbon volatilizes rapidly during the coating operation, and the flatness of the formed fluororesin film is sufficient. It is hard to get.
- the fluorine-containing hydrocarbon used preferably has a boiling point of 200 ° C. or lower, more preferably 180 ° C. or lower. When the fluorine-containing hydrocarbon has a boiling point of 200 ° C. or less, the fluorine-containing hydrocarbon is easily evaporated and removed by heating from the fluorine resin film formed by applying the film-forming composition.
- a fluorine-containing ether can be used as a fluorine-type solvent from the low ozone depletion coefficient and a global warming coefficient.
- a solvent containing a fluorine-containing ether represented by the following general formula (3).
- R 2 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms.
- R 3 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms.
- At least one of the hydrogen atoms in the group is substituted with a fluorine atom).
- R 2 is preferably a methyl group, an ethyl group, a propyl group, an isopropyl group, a vinyl group, an allyl group or a methylvinyl group. At least one hydrogen atom in these hydrocarbon groups may be substituted with a fluorine atom.
- R 3 is specifically methyl group, ethyl group, propyl group, isopropyl group, butyl group, isobutyl group, secondary butyl group, tertiary butyl group, 1-pentyl group, 2-pentyl group.
- 3-pentyl group 1-hexyl group, 2-hexyl group, 3-hexyl group, 1-heptyl group, 2-heptyl group, 3-heptyl group, 1-octyl group, 2-octyl group, 3-octyl group
- Examples thereof include a group, 1-nonyl group, 2-nonyl group, 1-decyl group, 2-decyl group, undecyl group, dodecyl group, cyclopentyl group, cyclohexyl group, cyclopentylmethyl group or cyclohexylmethyl group.
- At least one hydrogen atom in these hydrocarbon groups is substituted with a fluorine atom.
- These hydrocarbon groups may have an unsaturated bond.
- the boiling point of the fluorine-containing ether needs to be higher than the substrate temperature when the film-forming composition is applied, preferably 20 ° C. or more, more preferably 50 ° C. or more than the application temperature.
- the fluorinated aliphatic alcohol rapidly volatilizes during the coating operation, and the flatness of the formed fluororesin film is sufficient. It is hard to get.
- the fluorine-containing ether preferably has a boiling point of 200 ° C. or lower, more preferably 180 ° C. or lower. When the boiling point of the fluorinated ether is 200 ° C. or less, the fluorinated ether is easily removed by evaporation from the fluororesin film formed by applying the film-forming composition.
- Examples of preferred fluorine-containing ethers include 1,1,2,3,3,3-hexafluoro-1- (2,2,2-trifluoroethoxy) propane, 1,1,2,3,3,3- Hexafluoro-1- (2,2,3,3,3-pentafluoropropoxy) propane, 1,1,2,3,3,3-hexafluoro-1- (2,2,3,3-tetrafluoro Propoxy) propane or 2,2,3,3,3-pentafluoro-1- (1,1,2,2-tetrafluoroethoxy) propane can be exemplified.
- a method for producing these fluorine-containing ethers is described in JP-A-2002-201152.
- fluorine-containing ether having a preferable boiling point examples include the following compounds.
- C 3 F 7 OCH 3 , C 4 F 9 OCH 3 , C 4 F 9 OC 2 H 5 These are commercially available from Sumitomo 3M as trade names, Novec 7000, Novec 7100, Novec 7200, Novec 7300, Novec 7500, Novec 7600, and can be used for the film-forming composition of the present invention. Is possible.
- Novec is a trademark.
- fluorine-containing ethers having a preferred boiling point examples include Mitsui DuPont Fluoro Chemical Co., Ltd., trade name Vertrel Souplion or Vertrel Cinella, which are available.
- the fluorine-containing solvent contained in the film-forming composition of the present invention is represented by the following general formula (4) in addition to the above-mentioned fluorine-containing hydrocarbon solvent or fluorine-containing ether in order to further improve the solubility in a fluorine resin.
- the fluorinated alcohol may be contained. Preferably it is 45 mass% or less with respect to the total mass of a fluorine-type solvent, More preferably, it is 30 mass% or less.
- R 4 is a linear hydrocarbon group having 1 to 15 carbon atoms, a branched chain group having 3 to 15 carbon atoms, or a cyclic hydrocarbon group having 3 to 15 carbon atoms. At least one is substituted with a fluorine atom.
- the fluorine-containing alcohol is excellent in chemical stability, among the general formula (4), those in which a fluorine atom is not substituted on the carbon adjacent to the hydroxyl group are preferable.
- R 3 is a linear hydrocarbon group having 1 to 8 carbon atoms, a branched chain structure having 3 to 10 carbon atoms, or a cyclic hydrocarbon group having 3 to 10 carbon atoms.
- the number of fluorine atoms contained in the hydrocarbon group is equal to or greater than the number of hydrogen atoms, coating is easy.
- R 4 is specifically methyl, ethyl, propyl, isopropyl, butyl, isobutyl, secondary butyl, tertiary butyl, 1-pentyl, 2-pentyl, 3-pentyl, 1-hexyl group, 2-hexyl group, 3-hexyl group, 1-heptyl group, 2-heptyl group, 3-heptyl group, 1-octyl group, 2-octyl group, 3-octyl group, cyclopentyl group, cyclohexyl A group, a cyclopentylmethyl group, or a cyclohexylmethyl group can be exemplified. At least one hydrogen atom in these hydrocarbon groups is substituted with a fluorine atom.
- the number of fluorine atoms in the general formula (4) is preferably equal to or greater than the number of hydrogen atoms.
- the fluorinated alcohols represented by the general formula (4) are chemically stable, and more preferably the present invention. It can be used for the film forming composition.
- R 5 is a linear fluorinated hydrocarbon group having 1 to 7 carbon atoms, a branched chain having 3 to 9 carbon atoms, or a cyclic group having 3 to 9 carbon atoms.
- R 6 and R 7 are each independently a linear hydrocarbon group having 1 to 4 carbon atoms, a branched chain group having 3 to 6 carbon atoms, or a cyclic hydrocarbon group having 3 to 6 carbon atoms, (The number of fluorine atoms contained in the group is equal to or greater than the number of hydrogen atoms.)
- R 5 is specifically methyl group, ethyl group, propyl group, isopropyl group, butyl group, isobutyl group, secondary butyl group, tertiary butyl group, 1-pentyl group, 2-pentyl group.
- R 6 and R 7 are straight chain having 1 to 3 carbon atoms because they are easy to synthesize.
- R 6 and R 7 are specifically methyl, ethyl, propyl, isopropyl, butyl, isobutyl, secondary butyl, tertiary butyl, 2-pentyl, 3-pentyl, 2- Examples include those in which at least one hydrogen atom of a hexyl group, 3-hexyl group, cyclopentyl group, cyclohexyl group or cyclopentylmethyl group is substituted with a fluorine atom, and the fluorine atoms contained in these hydrocarbon groups can be exemplified. The number is equal to or greater than the number of hydrogen atoms.
- the fluorine-containing alcohol has a boiling point higher than the substrate temperature when the film-forming composition is applied, preferably 20 ° C. or more, more preferably 50 ° C. or more than the application temperature.
- the fluorinated aliphatic alcohol rapidly volatilizes during the coating operation, and the formed fluororesin film has sufficient flatness. I can't get it.
- the fluorine-containing alcohol used preferably has a boiling point of 200 ° C. or lower, more preferably 180 ° C. or lower. When the boiling point of the fluorinated alcohol is higher than 200 ° C., it is difficult to evaporate and remove the solvent by heating from the fluororesin film formed by applying the film-forming composition.
- examples of the fluorinated alcohol having the boiling range as described above include 1,1,1,3,3,3-hexafluoro-2-propanol, 2,2,2-trifluoroethanol, 2,2,3,3-tetrafluoropropanol, 2,2,3,3,3-pentafluoropropanol, 2,2,3,4,4,4-hexafluoro Butanol, 2,2,3,3,4,4,4-heptafluorobutanol, 2,2,3,3,4,4,5,5-octafluoropentanol, 2,2,3,3,4 , 4,5,5,5-nonafluoropentanol, 3,3,4,4,5,5,6,6,6-nonafluorohexanol, 2,2,3,3,4,4,5, 5,6,6,7,7-dodecafluoroheptanol, 2,2 3,3,4,4,5,5,6,6,7,7,7,7-tridecafluoroheptanol, 2,2 3,3,4,4,5,5,6,6,7,7,7
- 2,2,2-trifluoroethanol, 2,2,3,3 are used as those that sufficiently dissolve the fluororesin used in the film-forming composition of the present invention without immersing the organic material.
- -Tetrafluoropropanol, 2,2,3,4,4,4-hexafluorobutanol or 2,2,3,3,4,4,5,5-octafluoropentanol is the film forming composition of the present invention Is a particularly preferred fluorine-containing alcohol.
- the solvent contained in the film-forming composition of the present invention has viscosity adjustment and boiling point adjustment in addition to the above-mentioned fluorine-containing hydrocarbon, fluorine-containing ether and fluorine-containing alcohol as long as there is no influence of dissolution or wetting of organic materials.
- the solubility of the fluororesin alkanes, ethers, alcohols, esters, ketones or aromatic hydrocarbons that do not contain fluorine may be added.
- it is 20 mass% or less with respect to the total mass of the solvent containing a fluorine-type solvent.
- the alkane is preferably a linear, branched or cyclic group having 5 to 12 carbon atoms, specifically, pentane, hexane, heptane, octane, nonane, decane, undecane, dodecane, cyclopentane, cyclohexane, cycloheptane. And methylcyclopentane or methylcyclohexane.
- ketone those having 5 to 12 carbon atoms are preferable, and specifically, cyclopentanone, cyclohexanone, acetone, 2-butanone, 2-pentanone, 3-pentanone, 3-methyl-2-butanone, 2-hexanone. 2-methyl-4-pentanone, 2-heptanone or 2-octanone.
- the ether is preferably a linear, branched or cyclic one having 4 to 16 carbon atoms, for example, diethyl ether, dipropyl ether, diisopropyl ether, dibutyl ether, diisobutyl ether, ditertiary butyl ether, dipentyl ether, dipentyl ether, dipentyl ether, Examples include isopentyl ether, dihexyl ether, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, diethylene glycol dimethyl ether, diethylene glycol diethyl ether, triethylene glycol dimethyl ether, or triethylene glycol diethyl ether.
- the alcohol is preferably one having 1 to 3 hydroxyl groups substituted on a linear alkyl group having 1 to 10 carbon atoms, a branched chain having 3 to 10 carbon atoms, or a cyclic alkyl group having 3 to 10 carbon atoms.
- Esters are preferably those having 1 to 12 carbon atoms, specifically, methyl acetate, ethyl acetate, propyl acetate, isopropyl acetate, butyl acetate, isobutyl acetate, pentyl acetate, hexyl acetate, methyl lactate, ethyl lactate, methyl butyrate.
- Examples include ethyl butyrate, propyl butyrate or propylene glycol monomethyl ether acetate.
- Aromatic hydrocarbons having 6 to 12 carbon atoms are preferred, and specific examples include benzene, toluene, xylene, ethylbenzene, trimethylbenzene, cumene, and diethylbenzene.
- fluorine-based solvent used in the film-forming composition of the present invention for example, as a single solvent, C 4 F 9 OCH 3 , C 4 F 9 OC 2 H 5 , Novec 7300, or Vertrel Souplion is exemplified.
- composition ratio of the fluororesin and the fluorine-containing solvent contained in the film-forming composition of the present invention is such that the fluororesin is 0.1 to 25 parts by mass, preferably 0. 5 parts by mass or more and 20 parts by mass or less.
- the amount of the fluororesin is less than 0.1 parts by mass, the fluororesin film formed becomes thin and the organic semiconductor cannot be sufficiently protected.
- the amount of the fluororesin is more than 25 parts by mass, it becomes difficult to form a uniform coating.
- the fluorine content of the fluororesin contained in the film-forming composition of the present invention is 30% by mass to 65% by mass, and the fluorine content of the fluorinated solvent is 50% by mass to 70% by mass. Preferably there is. If the fluorine content is in the above range, it is easily dissolved in a fluorine-based solvent.
- the fluorine content of the fluorinated solvent contained in the film forming composition of the present invention is 50% by mass or more and 70% by mass or less, more preferably 55% by mass or more and 70% by mass or less. If it exceeds 70% by mass, the aforementioned fluororesin will not be sufficiently dissolved. On the other hand, if it is less than 50% by mass, the surface of the organic semiconductor film may be dissolved or swollen when a fluororesin film is applied or printed on the organic semiconductor film.
- the film-forming composition of the present invention can contain components other than the above-described fluororesin and solvent as additives, to the extent that the organic material to be coated is not immersed.
- an additive such as a surfactant can be blended for the purpose of improving coating properties, leveling properties, film-forming properties, storage stability, defoaming properties, and the like.
- a surfactant can be blended for the purpose of improving coating properties, leveling properties, film-forming properties, storage stability, defoaming properties, and the like.
- commercially available surfactants product names MegaFac, product number F142D, F172, F173 or F183 manufactured by DIC Corporation, product names FLORARD, product number FC-135 manufactured by Sumitomo 3M Co., Ltd.
- FC-170C, FC-430 or FC-431 trade name Surflon, part numbers S-112, S-113, S-131, S-141 or S-145 manufactured by AGC Seimi Chemical Co., Ltd., or Toray Dow Corning Silicone Product name, SH-28PA, SH-190, SH-193, SZ-6032 or SF-8428, manufactured by Corporation.
- the compounding quantity of these surfactant is normally 5 mass parts or less with respect to 100 mass parts of resin in a resin composition.
- MegaFac is the product name of DIC's fluorine-based additive (surfactant / surface modifier)
- Florard is the product name of Sumitomo 3M's fluorine-based surfactant
- Surflon is AGC Seimi Chemical Co., Ltd. Trade names of fluorine surfactants of the company, each of which is registered as a trademark.
- a curing agent can be blended.
- the curing agent to be used is not particularly limited, and examples thereof include melamine curing agents, urea resin curing agents, polybasic acid curing agents, isocyanate curing agents, and epoxy curing agents.
- isocyanates such as isophorone diisocyanate, hexamethylene diisocyanate, tolylene diisocyanate or diphenylmethane diisocyanate, and isocyanurates, blocked isocyanates or buret compounds thereof, alkylated melamine, methylol melamine, iminomelamine and other melamine resins or urea
- An epoxy curing agent having two or more epoxy groups obtained by reaction of an amino compound such as a resin or a polyhydric phenol such as bisphenol A and epichlorohydrin can be exemplified.
- curing agents is 35 mass parts or less normally with respect to 100 mass parts of resin in a resin composition.
- Organic Semiconductor Film An organic semiconductor film processed using the film forming composition of the present invention will be described.
- a known material can be used as the material of the organic semiconductor film.
- Organic semiconductors include low molecular organic molecules such as pentacene, anthracene, tetracene, phthalocyanine, polyacetylene conductive polymers, polyparaphenylene and derivatives thereof, polyphenylene conductive polymers such as polyphenylene vinylene and derivatives, polypyrrole and derivatives thereof.
- Organic semiconductors such as heterocyclic conductive polymers such as polythiophene and derivatives thereof, polyfuran and derivatives thereof, or ionic conductive polymers such as polyaniline and derivatives thereof, and organic charge transfer complexes.
- an organic semiconductor material that can be removed by wet etching using a hydrocarbon solvent or an aromatic solvent as an etching solvent is preferable.
- organic semiconductor materials include polycyclic condensed aromatic hydrocarbons such as anthracene, tetracene and pentacene, organic low molecules such as phthalocyanine, polyacetylene conductive polymers, polyparaphenylene and derivatives thereof, polyphenylene vinylene and derivatives thereof, etc.
- heterocyclic conductive polymers such as polyphenylene-based conductive polymers, polypyrrole and derivatives thereof, polythiophene and derivatives thereof, and polyfuran and derivatives thereof.
- the organic semiconductor production method of the present invention can be preferably applied particularly to polycyclic fused aromatic hydrocarbons.
- a fluororesin film is provided on the organic semiconductor film in order to protect the semiconductor film when the organic semiconductor film is microfabricated into a desired semiconductor circuit.
- the formation of the organic semiconductor circuit in the production of the organic semiconductor element is not only the photolithography method, but also after transferring the pattern to the fluororesin film by a printing method using a relief plate, an intaglio plate, a planographic plate, a screen printing, an imprint method, etc.
- An organic semiconductor film is etched and patterned.
- the film-forming composition of the present invention can form a fluororesin film by wet coating on an organic semiconductor film formed on a substrate.
- the fluororesin can be formed by photolithography, imprinting, or printing. Patterns can be formed on the film. If the organic semiconductor film is coated and coated with a fluororesin film and patterned, the pattern can be transferred to the organic semiconductor film by subsequent wet etching using a hydrocarbon solvent or an aromatic solvent. As described above, by using the present invention, it is possible to perform fine processing on the organic semiconductor film.
- the film forming composition of the present invention can form a pattern directly on an organic material by a printing method or an ink jet method, followed by wet etching using a hydrocarbon solvent or an aromatic solvent. It is possible to transfer the pattern to the organic material.
- the pattern of the protective film is directly formed by the printing method or the ink jet method, the film forming composition is used as the ink.
- printing methods include letterpress printing, intaglio printing, gravure printing, lithographic printing, screen printing, thermal transfer printing, and reverse offset printing.
- the fluororesin film When an aromatic solvent is used as an etchant, the fluororesin film needs to be insoluble or hardly soluble in the etchant during etching. Further, the fluororesin film is peeled off or left from the organic semiconductor circuit after the etching. At the time of peeling, the fluororesin film preferably does not deteriorate the organic semiconductor circuit. When leaving the fluororesin film in the organic semiconductor film circuit, it preferably functions as an insulating film so as not to short-circuit the circuit pattern of the organic semiconductor.
- the film-forming composition for forming a fluororesin film for protecting an organic semiconductor circuit when patterning the organic semiconductor film and the film include (1) film formation on the organic semiconductor film is easy. (2) The organic semiconductor circuit can be removed from the organic semiconductor pattern without deteriorating and short-circuiting, (3) Insulating that does not interfere with the electrical characteristics of the organic semiconductor circuit, or (4) An fragrance that is an etchant It is required that it is not easily soaked in a group solvent.
- the fluororesin film formed using the film forming composition of the present invention can be dissolved and removed with a specific fluorine-based solvent as necessary in the production of an organic semiconductor.
- a specific fluorine-based solvent as necessary in the production of an organic semiconductor.
- the same fluorine-based solvent as that contained in the film-forming composition may be used.
- Another fluorinated solvent may be used.
- a substrate having a fluororesin film formed using the film-forming composition of the present invention is immersed in a fluorine-based solvent, and the substrate is vertically or inclined, and a fluorine-based solvent is poured over the substrate.
- a method of pouring the peeling solvent while rotating the substrate with a spin coater or placing the substrate in a chamber in a saturated vapor atmosphere of the peeling solvent can be exemplified.
- the mass of the fluorinated solvent used for dissolution and removal is preferably at least 5 times, more preferably at least 10 times the total mass of the fluororesin film. If the amount of the fluorinated solvent used is small, the removal of the fluororesin film becomes insufficient. Further, since the fluororesin film formed using the film forming composition of the present invention has an insulating property, it does not impair the characteristics of the semiconductor circuit even if it is left in the semiconductor element without being dissolved and removed.
- an organic semiconductor film 2 made of an organic semiconductor film is formed on a substrate 1 by coating or vapor-depositing an organic semiconductor solution.
- a fluororesin film 3 is formed on the organic semiconductor film 2 using the film forming composition of the present invention.
- the film-forming composition can be applied by dip coating, spray coating, spin coating, bar coating, applicator or roll coater, etc., and is applied onto the organic semiconductor film 2 to form a coating film containing a solvent.
- the fluorine resin film 3 is formed by drying.
- the heating temperature in baking is 250 degrees C or less. It is not necessary to heat at 250 ° C. or higher, and a more preferable temperature is 10 ° C. or higher and 150 ° C. or lower, although it depends on the boiling point of the solvent. If it is lower than 10 ° C., it takes a long time to dry, and if it is higher than 150 ° C., the uniformity of the formed film surface may be impaired.
- the heating time is 30 seconds or more and 15 minutes or less. If it is shorter than 30 seconds, there is a concern that the solvent remains in the fluororesin film, and it is not necessary to make it longer than 15 minutes.
- lithography, imprint, letterpress printing, intaglio printing, gravure printing, lithographic printing, screen printing, thermal transfer printing, reversal offset printing, or the like, or inkjet method is used.
- the fluororesin film 3 is patterned.
- a photoresist film (not shown) is formed on the fluororesin film 3.
- a photoresist film it is possible to form a photoresist film by a method of applying a photoresist using a solvent that does not attack the fluororesin film 3 or attaching a dry film resist.
- a photoresist film it is preferable to use a hydrocarbon solvent and an aromatic solvent that do not attack the fluororesin film 3.
- the photoresist film is exposed and patterned through a photomask, and the fluororesin film 3 and the organic semiconductor film 2 are patterned by wet etching using a solvent, reactive ion etching, or gas etching.
- the pattern is transferred to the fluororesin film 3 from the printing original plate.
- the transfer method include a method in which the unevenness of the printing original plate is pressed against the fluororesin film 3, and a method in which only the convex portion of the printing original plate is pressed against the fluororesin film 3 and the fluororesin film 3 is removed.
- the pattern is transferred from the printing original plate to the fluororesin film 3, it is preferable to soften the fluororesin film 3 by heating or swelling of the solvent to easily change the shape.
- a material having etching resistance is applied by ink jetting to a portion where the fluororesin film 3 is to be left, and the fluororesin film 3 in a portion not applied is patterned by etching.
- the pattern processing method include wet etching using a solvent, reactive ion etching, or gas etching.
- the substrate 1 can be heated, and the patterned fluororesin film 3 can be baked.
- the heating temperature in baking is 250 degrees C or less. It is not necessary to heat at 250 ° C. or higher, and a more preferable temperature is 10 ° C. or higher and 150 ° C. or lower, although it depends on the boiling point of the solvent. If it is lower than 10 ° C., it takes a long time to dry, and if it is higher than 150 ° C., the uniformity of the surface of the fluororesin film 3 formed may be impaired.
- the heating time is 30 seconds or more and 15 minutes or less. If it is shorter than 30 seconds, there is a concern that the solvent remains in the fluororesin film, and it is not necessary to make it longer than 15 minutes.
- the patterned fluororesin film 3 protects the organic semiconductor film 2 at the site where the pattern processing is performed in the wet etching process for the organic semiconductor film layer 2.
- a pattern 2b is formed on the organic semiconductor film layer 2 by wet etching. Specifically, the substrate 1, the organic semiconductor film 2, and the patterned fluororesin film 3 are immersed in a hydrocarbon solvent or an aromatic solvent, or a hydrocarbon solvent or an aromatic solvent is poured over. By this method, the organic semiconductor film 2 in a portion not covered with the patterned fluororesin film 3 is dissolved and removed. By doing so, the pattern formed on the fluororesin film 3 is transferred to the organic semiconductor film 2 to obtain a pattern 2b.
- the fluororesin film 3 can be dissolved and removed using a fluorine-based solvent.
- the solvent to be used for example, the same solvent as the fluorinated solvent contained in the film forming composition can be used.
- a dissolution and removal method a method of immersing the substrate 1 in a fluorinated solvent, a method of pouring the fluorinated solvent with the substrate vertical or inclined, and a method of pouring the fluorinated solvent while rotating the substrate 1 with a spin coater
- a method of placing the substrate 1 in a chamber having a saturated vapor atmosphere of a fluorinated solvent can be exemplified.
- the fluororesin film 3 can also function as an interlayer insulating film.
- the fluororesin contained in the film-forming composition for forming the fluororesin film dissolves in ketones, ethers and carboxylic acid esters. Therefore, these organic solvents are used to form the coating.
- the apparatus can be cleaned.
- the cleaning method depends on the shape of the device and the environment in which the device is placed, but after the device is immersed in the cleaning organic solvent, the cleaning organic solvent is sprayed on the device, or the cleaning organic solvent is sprayed on the device. A method such as wiping can be exemplified.
- the film-forming composition of the present invention uses a specific fluorine-based solvent that does not dissolve or swell the organic material, and contains a fluorine resin that dissolves in the specific fluorine-based solvent.
- the composition for film formation of the present invention does not dissolve or swell and immerse the organic semiconductor film when applied on the organic semiconductor film, it can be wet-formed on the organic semiconductor film to form a coating film.
- the film is patterned by photolithography, printing, or imprinting, and then wet etched with the organic semiconductor film without being immersed in an etchant such as a hydrocarbon solvent or an aromatic solvent. Can be patterned.
- an etchant such as a hydrocarbon solvent or an aromatic solvent.
- the fluororesin contained in the film forming composition of the present invention has an appropriate glass transition temperature, is easy to process, forms easily, and has high heat resistance. Preferably employed.
- reaction vessel a pressure resistant vessel made of stainless steel (SUS-316) having a capacity of 200 mL was used.
- Predetermined amount of vinyl ether, additive and initiator (71% by weight solution of tertiary butyl perpivalate, NOF Corporation, trade name perbutyl PV, hydrocarbon solvent as a solvent (made by Shell Chemicals Japan, trade name) (Including shell sol) was weighed into a reaction vessel, and the whole reaction vessel was cooled with dry ice / acetone while stirring. After the temperature reached ⁇ 45 ° C. or lower, the inside of the reaction vessel was depressurized with an oil pump, and then a predetermined amount of vaporized octafluorocyclopentene was introduced.
- the internal pressure was returned to atmospheric pressure with nitrogen gas, the cooling was stopped, and the reaction solution was agitated while being stirred until it reached 0 ° C. or higher.
- the mixture was cooled again with stirring, and the temperature was lowered to ⁇ 45 ° C. or lower.
- the pressure was reduced with an oil pump, and the inside of the reactor was replaced twice with nitrogen.
- the temperature of the reaction solution was raised to 0 ° C., it was heated in an oil bath for 20 hours. During the heating, the temperature of the oil bath was adjusted so that the reaction solution had a predetermined temperature. After completion of heating, the reaction solution was taken out from the reaction vessel and filtered using filter paper.
- the gel permeation chromatography was measured and the weight average molecular weight Mw and molecular weight dispersion
- distribution Mw / Mn (what divided the weight average molecular weight Mw by the number average molecular weight Mn) were computed.
- GPC model name HLC-8320 manufactured by Tosoh Corporation is used.
- three columns (product name: TSKgel GMH XL ) manufactured by Tosoh Corporation are connected in series, tetrahydrofuran is used as a developing solvent, and the refractive index is used as a detector. Measurements were made using a difference detector.
- the content of repeating units derived from octafluorocyclopentene in the obtained fluororesin and the fluorine content in the fluororesin were measured with a nuclear magnetic resonance apparatus (model JNM-ECA400, manufactured by JEOL Ltd.). Calculated from the magnetic resonance spectrum. Specifically, fluorine was measured by weighing 25 to 35 mg of fluororesin and 5 to 10 mg of 1,4- (trifluoromethyl) benzene as an internal standard and dissolving them in 0.9 g of deuterated chloroform.
- the ratio of the peak intensity derived from octafluorocyclopentene and the peak intensity derived from the internal standard in the 19-nuclear nuclear magnetic resonance spectrum was converted to the content of repeating units derived from octafluorocyclopentene.
- the glass transition temperature of the fluororesin was measured under a nitrogen stream using a differential scanning calorimeter (model X-DSC7000, manufactured by SII Nanotechnology Co., Ltd.).
- the thermal decomposition temperature is 5 based on the mass of the powder before heating by measuring the thermal mass curve of 10 mg of the dry powder under a nitrogen stream using a differential type differential thermal balance (manufactured by Rigaku Corporation, model TG8120). % Was the temperature at which mass loss occurred.
- the weight average molecular weight Mw was 10,000, and the molecular weight dispersion Mw / Mn was 1.84.
- the yield based on the total mass of the monomers used was 81% by mass.
- the content of repeating units derived from octafluorocyclopentene was 76% by mass, and the fluorine content in the resin was 55% by mass.
- the glass transition temperature was 88 ° C.
- the thermal decomposition temperature was 281 ° C.
- the yield based on the total mass of the monomers used was 79% by mass.
- the weight average molecular weight Mw was 12,000, and the molecular weight dispersion Mw / Mn was 1.55.
- the content of repeating units derived from octafluorocyclopentene was 68% by mass, and the fluorine content in the resin was 49% by mass.
- the glass transition temperature was 64 ° C.
- the thermal decomposition temperature was 311 ° C.
- the yield based on the total mass of the monomers used was 49% by mass.
- the weight average molecular weight Mw was 5,600, and the molecular weight dispersion Mw / Mn was 1.73.
- the content of repeating units derived from octafluorocyclopentene was 64% by mass, and the fluorine content in the resin was 46% by mass.
- the glass transition temperature was 82 ° C.
- the thermal decomposition temperature was 256 ° C.
- the fluororesins 1 to 4 obtained in Synthesis Examples 1 to 4 all have a glass transition point higher than room temperature (about 20 ° C.), a thermal decomposition temperature of 250 ° C. or higher, and a high chemical stability. Is a molecule.
- Tables 1-5 The evaluation results are shown in Tables 1-5.
- Table 1 shows the solubility evaluation of the fluororesin 1 (Examples 1 to 7)
- Table 2 shows the solubility evaluation of the fluororesin 2 (Examples 8 to 14)
- Table 3 shows the solubility evaluation of the fluororesin 3 (Example 15).
- Table 4 shows the solubility evaluation of the fluororesin 4 (Examples 18 and 19)
- Table 5 shows the solubility evaluation of PMMA (Comparative Examples 1 to 3).
- fluororesins 1 to 4 were dissolved in various fluorine-based solvents described in Tables 1 to 4.
- PMMA did not dissolve in the fluorinated solvents listed in Table 5.
- Novec is a trade name of hydrofluoroether (HFE) manufactured by Sumitomo 3M Limited
- Bartrel Superion is a trade name of Mitsui DuPont Fluorochemical Co., Ltd.
- Novec and Vertrel are registered trademarks. .
- the film forming composition of the present invention containing fluororesins 1 to 4 was applied to a silicon substrate, then immersed in a cleaning solvent, taken up after 30 seconds, dried by air blow, and a residual film was present. None was evaluated by an optical interference film thickness meter (manufactured by Sentech, Germany, model name, FTP500).
- the fluororesin film is formed on the silicon substrate by spin-coating the film-forming composition of the present invention (concentration 3% by mass) prepared by a combination of fluororesins 1 to 4 and a fluorine-based solvent on the silicon substrate.
- the coating was performed by heating and drying on a hot plate at 130 ° C. for 3 minutes.
- solvent of fluororesin C 4 F 9 OCH 2 CH 3 and Vertell Souplion and 2,2,3,3,4,4,5,5-octafluoropentanol are mixed at a mass ratio of 4: 3: 3. What was done was used.
- the thickness of the film was measured with an optical interference film thickness meter (manufactured by Sentech, Germany, model name, FTP500).
- the solution concentration and spin coating conditions were adjusted so that the thickness of the film was 150 nm or more and 300 nm or less.
- As the wet etching solvent three kinds of benzene, toluene, and xylene were used.
- the film-forming composition of the present invention (concentration 3% by mass) prepared by a combination of fluororesins 1 to 4 and a fluorine-based solvent is applied onto the metal substrate by spin coating. Then, it was performed by heating and drying on a hot plate at 130 ° C. for 3 minutes.
- solvent of fluororesin C 4 F 9 OCH 2 CH 3 and Vertell Souplion and 2,2,3,3,4,4,5,5-octafluoropentanol are mixed at a mass ratio of 4: 3: 3. What was done was used.
- the concentration of the film-forming composition and the spin coating conditions were adjusted so that the thickness of the fluororesin film was 150 nm or more and 300 nm or less.
- the test voltage was set based on the thickness of the fluororesin film so as to be 1.5 kV / mm.
- the organic semiconductor film 2 is formed by preparing a toluene solution of anthracene having a concentration of 0.10% by mass, casting it on a silicon substrate, and drying it at room temperature. An anthracene membrane as membrane 2 was obtained.
- the fluororesin film 3 is formed by using fluororesins 1 to 4, and a mass ratio of Novec 7300 and 2,2,3,3,4,4,5,5-octafluoropentanol as the fluorine-based solvent is 7: The concentration was adjusted to 3% by mass with the mixed solvent No. 3, applied onto the silicon substrate on which the anthracene film had been formed by spin coating, and dried at room temperature for 10 minutes.
- an anthracene film 2 was formed on the silicon substrate, and a fluororesin film 3 was formed thereon using the film forming composition of the present invention.
- the silicon substrate on which the anthracene film 2 and the fluororesin film 3 made of the film forming composition of the present invention were laminated was immersed in toluene for 30 seconds.
- this silicon substrate was immersed in a fluorine-based solvent for dissolving and removing the fluororesin film 3 for 60 seconds.
- the anthracene film 2 is present on the silicon substrate after the fluororesin film 3 is dissolved and removed with a fluorine-based solvent and the thickness does not change by 10% or more, the anthracene film 2 is protected from the toluene by the fluororesin film 3, In addition, it was determined that the fluororesin film 3 could be removed without the fluorine-based solvent affecting the organic semiconductor film 2.
- the fluororesin film 3 is formed by using fluororesins 1 to 4, and a mass ratio of Novec 7300 and 2,2,3,3,4,4,5,5-octafluoropentanol as the fluorine-based solvent is 7: The concentration was adjusted to 3% by mass with the mixed solvent No. 3, applied onto the silicon substrate on which the anthracene film had been formed by spin coating, and dried at room temperature for 10 minutes.
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Abstract
Description
有機半導体膜上に膜を形成するための膜形成用組成物であって、式(1)で表わされる繰り返し単位と一般式(2)で表わされる繰り返し単位を含むフッ素樹脂と、フッ素系溶剤と、を含む、膜形成用組成物。
フッ素系溶剤が含フッ素炭化水素または含フッ素エーテルを含むフッ素系溶剤である、発明1の膜形成用組成物。
フッ素系溶剤が、含フッ素炭化水素として、炭素数4~8の、直鎖状、分岐鎖状または環状の炭化水素であり、炭化水素中の水素原子の少なくとも1個がフッ素原子で置換された含フッ素炭化水素を含むフッ素系溶剤である、発明2の膜形成用組成物。
フッ素系溶剤が、含フッ素エーテルとして、一般式(3)で表わされる含フッ素エーテルを含むフッ素系溶剤である、発明2の膜形成用組成物。
フッ素系溶剤が、一般式(4)で表される含フッ素アルコールをさらに含むフッ素系溶剤である、発明1~4の膜形成用組成物。
フッ素樹脂として、フッ素含有率が30質量%以上、65質量%以下のフッ素樹脂を含む、発明1~5の膜形成用組成物。
フッ素系溶剤として、フッ素含有率が50質量%以上、70質量%以下のフッ素系溶剤を含む、発明1~6の膜形成用組成物。
発明1~7の膜形成用組成物を有機半導体膜上に塗布し形成されてなるフッ素樹脂膜。
発明1~7の膜形成用組成物を有機半導体膜上に塗布しフッ素樹脂膜を形成する工程と、当該フッ素樹脂膜をパターン加工する工程と、有機半導体膜をエッチングによってパターン加工する工程を含む有機半導体素子の製造方法。
フッ素樹脂膜をパターン加工する工程にフォトリソグラフィー法を用いる、発明9の製造方法。
フッ素樹脂膜をパターン加工する工程に印刷法を用いる、発明9の製造方法。
膜をパターン加工する工程にインプリント法を用いる、発明9の製造方法。
エッチングによって有機半導体膜をパターン加工する工程が、炭化水素系溶剤または芳香族系溶剤を用いたウェットエッチングにより有機半導体膜をパターン加工する工程である、発明9~12の製造方法。
芳香族系溶剤が、ベンゼン、トルエンまたはキシレンである、発明13の製造方法。
フッ素樹脂膜を除去する工程を含む、発明9~14の製造方法。
フッ素樹脂膜を除去する工程が、フッ素系溶剤へフッ素樹脂膜を溶解させる工程である、発明15の製造方法。
フッ素系溶剤が含フッ素炭化水素または含フッ素エーテルを含む、発明16の製造方法。
フッ素系溶剤が、含フッ素炭化水素として、炭素数4~8の直鎖状、分岐鎖状または環状の炭化水素であり、炭化水素中の水素原子の少なくとも1個がフッ素原子で置換された含フッ素炭化水素を含むフッ素系溶剤である、発明17の製造方法。
フッ素系溶剤が、含フッ素エーテルとして、一般式(3)で表わされる含フッ素エーテルを含むフッ素系溶剤である、発明17の製造方法。
フッ素系溶剤が、一般式(4)で表される含フッ素アルコールをさらに含むフッ素系溶剤である、発明16~19の製造方法。
発明9~20の製造方法で製造された有機半導体素子。
発明21の有機半導体素子を用いてなる、有機エレクトロルミネッセンスディスプレイ。
発明21の有機半導体素子を用いてなる、液晶ディスプレイ。
本発明の膜形成用組成物が含むフッ素樹脂は、式(1)で表わされる繰り返し単位と、一般式(2)で表わされる繰り返し単位を含む。
単量体を重合させて、本発明の膜形成用組成物が含むフッ素樹脂を得るには、例えば一般的に知られるラジカル重合を用いることができ、具体的には、アゾ化合物、過酸化物、過硫酸化合物またはレドックス系化合物等のラジカル開始剤をラジカル反応の開始剤として用い重合させることができる。
本発明の膜形成用組成物が含むフッ素系溶剤は、含フッ素炭化水素または含フッ素エーテルを含むフッ素系溶剤である。
含フッ素炭化水素はオゾン破壊係数が低く、本発明の膜形成用組成物が含むフッ素系溶剤として好ましい。特に、炭素数4~8の、直鎖状、分岐鎖状または環状の炭化水素で、水素原子の少なくとも1個がフッ素原子で置換されているようなものは塗布しやすく好ましい。
CF3CHFCHFCF2CF3(三井デュポンフロロケミカル株式会社製、商品名、バートレルXF、沸点55℃)
下式の含フッ素炭化水素(日本ゼオン株式会社製、ゼオローラH、沸点83℃)
なお、バートレルは三井・デュポンフロロケミカル株式会社のフッ素系溶剤の商品名、ゼオローラは日本ゼオン株式会社のフッ素系溶剤(HFC類)およびアサヒクリンは旭硝子株式会社のフッ素系溶剤の商品名で市販されており、入手可能である。上記商品名は、各々商標登録されている。
また、オゾン破壊係数および地球温暖化係数の低さから、フッ素系溶剤として含フッ素エーテルを使用することができる。特に、下記一般式(3)で表される含フッ素エーテルを含む溶剤を用いることが好ましい。
C3F7OCH3、C4F9OCH3、C4F9OC2H5
本発明の膜形成用組成物が含むフッ素系溶剤は、フッ素樹脂に対する溶解性をさらに向上させるために、上記、含フッ素炭化水素系溶剤または含フッ素エーテル以外に、下記一般式(4)で表される含フッ素アルコールを含んでいてもよい。フッ素系溶剤の全質量に対して、好ましくは45質量%以下、より好ましくは30質量%以下である。
また、本発明の膜形成用組成物が含む溶剤には、有機材料の溶解または湿潤等の影響がなければ、上記含フッ素炭化水素、含フッ素エーテル並びに含フッ素アルコール以外に、粘度調整、沸点調整およびフッ素樹脂の溶解度調整の目的で、フッ素を含有しないアルカン、エーテル、アルコール、エステル、ケトンまたは芳香族炭化水素等を加えてもよい。フッ素系溶剤を含む溶剤の全質量に対して好ましくは20質量%以下である。
本発明の膜形成用組成物に用いる好ましいフッ素系溶剤として、例えば、単独溶剤としては、C4F9OCH3、C4F9OC2H5、ノベック7300、またはバートレルスープリオンを例示することができ、混合溶剤としては、C4F9OCH3と2,2,2-トリフルオロエタノールを質量比、100:0.01~70:30で混合した溶剤C4F9OCH3と2,2,3,4,4,4-ヘキサフルオロブタノールを質量比100:0.01~70:30で混合した溶剤、C4F9OCH2CH3と2,2,3,3,4,4,5,5-オクタフルオロペンタノールを質量比100:0.01~70:30で混合した溶剤、C4F9OCH3と(1,2,2,3,3,4,4,5-オクタフルオロシクロペンチル)エタノールを質量比100:0.01~70:30で混合した溶剤、CF3CF2CF2CF2CF2CH2CH2CH3と2,2,2-トリフルオロエタノールを質量比、100:0.01~70:30で混合した溶剤、ノベック7300と2,2,3,3,4,4,5,5-オクタフルオロペンタノールを質量比100:0.01~70:30で混合した溶剤、または、バートレルスープリオンと2,2,3,3,4,4,5,5-オクタフルオロペンタノールを質量比100:0.01~70:30で混合した溶剤を例示することができる。
[組成]
本発明の膜形成用組成物に含まれるフッ素樹脂とフッ素系溶剤の組成比は、フッ素系溶剤100質量部に対してフッ素樹脂が0.1質量部以上、25質量部以下、好ましくは0.5質量部以上、20質量部以下である。フッ素樹脂が0.1質量部より少ないと形成されるフッ素樹脂膜が薄くなり有機半導体を十分に保護できない。フッ素樹脂が25質量部より多いと均一に塗布成膜することが困難になる。
本発明の膜形成用組成物は、塗布対象である有機物を浸かさない程度において上記のフッ素樹脂および溶剤以外の成分を添加剤として含有させることができる。
本発明の膜形成用組成物を用いて加工する有機半導体膜について説明する。有機半導体膜の材料としては、公知のものを用いることができる。有機半導体としては、ペンタセン、アントラセン、テトラセン、フタロシアニン等の有機低分子、ポリアセチレン系導電性高分子、ポリパラフェニレンおよびその誘導体、ポリフェニレンビニレンおよびその誘導体等のポリフェニレン系導電性高分子、ポリピロールおよびその誘導体、ポリチオフェンおよびその誘導体、ポリフランおよびその誘導体等の複素環系導電性高分子、またはポリアニリンおよびその誘導体等のイオン性導電性高分子等の有機半導体、有機電荷移動錯体を例示することができる。
本発明の有機半導体素子の製造において、有機半導体膜を所望の半導体回路に微細加工する際に半導体膜を保護するため、有機半導体膜上にフッ素樹脂膜を設けることを行う。
図1を用い、膜形成用組成物を使用した有機半導体の製造方法を具体的に説明するが、本発明の膜形成用組成物を用いる、有機半導体の製造方法はこれに限定されるものではない。
フッ素樹脂膜を形成するために膜形成用組成物に含まれるフッ素樹脂は、ケトン、エーテル並びにカルボン酸エステルへ溶解するため、これらの有機溶剤を用いることで膜形成に用いた塗布装置の洗浄を行うことができる。洗浄方法は装置の形状や装置が置かれた環境等によって決まるが、装置を洗浄用有機溶剤に浸漬する、装置に洗浄有機溶剤をスプレーして流す、または装置に洗浄用有機溶剤をスプレーした後にふき取る等の方法を例示することができる。
上述の通り、本発明の膜形成用組成物は、有機材料を溶解、膨潤すること等のない特定のフッ素系溶剤を用い、且つこれに溶解するフッ素樹脂を含有させたことを特徴とする。
本発明の実施例においては、特に記載のない限り、以下の方法で本発明の膜形成用組成物に使用するフッ素樹脂の合成を行った。
エチルビニルエーテル5.3g(73mmol)、酢酸ブチル10.0g、開始剤としての過ピバル酸ターシャリーブチル0.72g(2.9mmol)、その他添加剤として炭酸カリウム0.30g、およびオクタフルオロシクロペンテン14.7g(73mmol)を反応容器内に採取し、上記[フッ素樹脂の合成]に記載の方法によりラジカル重合した。反応液の温度は55℃とした。その結果、以下の式(7)に表される繰り返し単位を含むフッ素樹脂1を16.2g得た。重量平均分子量Mwは10,000、分子量分散Mw/Mnは1.84であった。使用した単量体全質量を基準とした収率は81質量%であった。オクタフルオロシクロペンテン由来の繰り返し単位の含量は76質量%、樹脂中のフッ素含有量は55質量%であった。ガラス転移温度は88℃であった。熱分解温度は281℃であった。
イソブチルビニルエーテル5.0g(50mmol)、酢酸ブチル15.0g、開始剤過としてのピバル酸ターシャリーブチル0.73g(3.0mmol)、その他添加剤として炭酸ナトリウム0.03g、およびオクタフルオロシクロペンテン10.0g(50mmol)を反応容器内に採取し、上記[フッ素樹脂の合成]に記載の方法によりラジカル重合した。反応液の温度は62℃とした。その結果、以下の式(8)で表される繰り返し単位を含むフッ素樹脂2を11.8g得た。使用した単量体全質量を基準とした収率は79質量%であった。重量平均分子量Mwは12,000、分子量分散Mw/Mnは1.55であった。オクタフルオロシクロペンテン由来の繰り返し単位の含量は68質量%、樹脂中のフッ素含有量は49質量%であった。ガラス転移温度は64℃であった。熱分解温度は311℃であった。
シクロヘキシルビニルエーテル5.8g(46mmol)、酢酸ブチル15.0g、開始剤としての過ピバル酸ターシャリーブチル0.22g(0.92mmol)、その他添加剤として炭酸カリウム0.14g、およびオクタフルオロシクロペンテン9.2g(46mmol)を反応容器内に採取し、上記[フッ素樹脂の合成]に記載の方法によりラジカル重合した。反応液の温度は62℃とした。その結果、以下の式(9)で表される繰り返し単位を含むフッ素樹脂3を7.4g得た。使用した単量体全質量を基準とした収率は49質量%であった。重量平均分子量Mwは5,600、分子量分散Mw/Mnは1.73であった。オクタフルオロシクロペンテン由来の繰り返し単位の含量は64質量%、樹脂中のフッ素含有量は46質量%であった。ガラス転移温度は82℃であった。熱分解温度は256℃であった。
エチルビニルエーテル4.6g(64mmol)、2-ヒドロキシエチルビニルエーテル3.8g(43mmol)、酢酸ブチル16.0g、開始剤としての過ピバル酸ターシャリーブチル1.05g(4.3mmol)、その他添加剤として炭酸カリウム0.32g、およびオクタフルオロシクロペンテン21.6g(107mmol)を反応容器内に採取し、上記[フッ素樹脂の合成]に記載の方法によりラジカル重合した。反応液の温度は55℃とした。本組成においては、反応液から固体を得る作業において、メタノールに替えてヘプタンを用いた。その結果、以下の式(10)で表される繰り返し単位を含むフッ素樹脂4を21.6g得た。使用した単量体全質量を基準とした収率は86質量%であった。重量平均分子量Mwは22,000、分子量分散Mw/Mnは2.33であった。オクタフルオロシクロペンテン由来の繰り返し単位の含量は74質量%、樹脂中のフッ素含有量は53質量%であった。ガラス転移温度は82℃であった。熱分解温度は287℃であった。
<評価方法>
前記フッ素樹脂1~4と、ポリメチルメタクリレート(以下、PMMAと呼ぶことがある。重量平均分子量15,000)について、種々のフッ素系溶剤への溶解性を評価した。各溶剤へ溶質としてフッ素樹脂を10質量%となるように加えて室温で混合し、目視にて確認し、固形物析出および懸濁なく溶解しているか、固形物析出、懸濁があり不溶解分があるかを確認した。
評価結果を表1~5に示す。表1がフッ素樹脂1の溶解性評価(実施例1~7)、表2がフッ素樹脂2の溶解性評価(実施例8~14)、表3がフッ素樹脂3の溶解性評価(実施例15~17)、表4がフッ素樹脂4の溶解性評価(実施例18、19)および表5がPMMAの溶解性評価(比較例1~3)である。
<評価方法>
合成例1~4で得られたフッ素樹脂1~4を含むフッ素樹脂膜について、フッ素を含有しない洗浄用溶剤として2-ブタノン、プロピレングリコールモノメチルエーテルアセテートおよび酢酸エチルの3種を用いて、洗浄性評価を行った(実施例20~23)。膜形成用組成物の溶剤としては前記ノベック7300とバートレルスープリオンと2,2,3,3,4,4,5,5-オクタフルオロペンタノールを質量比3:3:4で混合したものを用いた。膜形成用組成物の樹脂濃度は10質量%とした。
<評価方法>
フッ素樹脂1~4を含むフッ素樹脂膜のウェットエッチング溶剤への耐性を評価した。具体的には、シリコン基板(直径10cm、自然酸化膜が表面に形成されたもの)上にフッ素樹脂1~4を含む本発明の膜形成用組成物を塗布し形成したフッ素樹脂1~4を含むフッ素樹脂膜と、シリコン基板上にPMMAのメチルイソブチルケトン溶液(濃度3質量%)を塗布して形成したPMMAの膜をウェットエッチング溶剤に5分間基板ごと浸漬し、浸漬後の膜厚が浸漬前の膜厚の30%以上であれば耐性を有していると判断した。
評価の結果、フッ素樹脂1~4を含むフッ素樹脂膜は全て前記3種のウェットエッチング溶剤に対して耐性を有していた。一方で、PMMA膜は耐性を有していなかった。
<評価方法>
フッ素樹脂1~4の電気絶縁性を評価した。具体的には、金属基板(直径7.5cm、SUS316製)上に、本発明の膜形成用組成物を塗布し形成したフッ素樹脂1~4を含むフッ素樹脂膜の表面に金電極(直径4cmの円形)をスパッタリングにより作製し、基板と電極間に電圧をかけて絶縁破壊が起こるかどうかを評価した。
評価の結果、全てのフッ素樹脂について試験電圧での絶縁破壊は観測されず、絶縁性を有していることが示された。
<評価方法>
フッ素樹脂1~4を各々溶解させてなる膜形成用組成物の有機半導体膜の塗れ性を評価した。図1に示すように、直径10cmのシリコン基板上に有機半導体膜2を形成し、有機半導体膜2の上に本発明の膜形成用組成物を用いてフッ素樹脂膜3を形成した。ついで基板、断面を光学顕微鏡で観察した。有機半導体膜2とフッ素樹脂膜3が層をなしていることが確認できれば、塗れ性よく塗布可能である。有機半導体膜を形成する材料には、芳香族炭化水素溶剤に可溶な有機半導体材料の例として、有機低分子の多環芳香族炭化水素であるアントラセンを用いた。
評価の結果、形成したフッ素樹脂1~4の膜全てについてアントラセン膜2と膜3が層をなしていることが確認され、塗布可能であった。
<評価方法>
フッ素樹脂1~4のフッ素樹脂膜3が有機半導体膜2としてのアントラセン膜上からの除去可能かを評価した。有機半導体膜を形成する材料には、芳香族炭化水素溶剤に可溶な有機半導体材料の例として、有機低分子の多環芳香族炭化水素であるアントラセンを用いた。図1に従い説明する。
トルエン30秒浸漬後のフッ素樹脂膜3の溶解除去にフッ素系溶剤であるノベック7200を用いたところ、全てのアントラセン膜2の厚さに10%以上の変化がなく、アントラセン膜3の保護と、フッ素樹脂膜3の剥離が可能であった。
2 有機半導体膜またはアントラセン膜
3 フッ素樹脂膜
2b パターン
Claims (23)
- フッ素系溶剤が含フッ素炭化水素または含フッ素エーテルを含むフッ素系溶剤である、請求項1に記載の膜形成用組成物。
- フッ素系溶剤が、含フッ素炭化水素として、炭素数4~8の、直鎖状、分岐鎖状または環状の炭化水素であり、炭化水素中の水素原子の少なくとも1個がフッ素原子で置換された含フッ素炭化水素を含むフッ素系溶剤である、請求項2に記載の膜形成用組成物。
- フッ素樹脂として、フッ素含有率が30質量%以上、65質量%以下のフッ素樹脂を含む、請求項1乃至請求項5のいずれか1項に記載の膜形成用組成物。
- フッ素系溶剤として、フッ素含有率が50質量%以上、70質量%以下のフッ素系溶剤を含む、請求項1乃至請求項6のいずれか1項に記載の膜形成用組成物。
- 請求項1乃至請求項7のいずれか1項に記載の膜形成用組成物を有機半導体膜上に塗布し形成されてなるフッ素樹脂膜。
- 請求項1乃至請求項7のいずれか1項に記載の膜形成用組成物を有機半導体膜上に塗布しフッ素樹脂膜を形成する工程と、当該フッ素樹脂膜をパターン加工する工程と、有機半導体膜をエッチングによってパターン加工する工程を含む有機半導体素子の製造方法。
- フッ素樹脂膜をパターン加工する工程にフォトリソグラフィー法を用いる、請求項9に記載の製造方法。
- フッ素樹脂膜をパターン加工する工程に印刷法を用いる、請求項9に記載の製造方法。
- フッ素樹脂膜をパターン加工する工程にインプリント法を用いる、請求項9に記載の製造方法。
- エッチングによって有機半導体膜をパターン加工する工程が、炭化水素系溶剤または芳香族系溶剤を用いたウェットエッチングにより有機半導体膜をパターン加工する工程である、請求項9乃至請求項12のいずれか1項に記載の製造方法。
- 芳香族系溶剤が、ベンゼン、トルエンまたはキシレンである、請求項13に記載の製造方法。
- フッ素樹脂膜を除去する工程を含む、請求項9乃至請求項14に記載の製造方法。
- フッ素樹脂膜を除去する工程が、フッ素系溶剤へフッ素樹脂膜を溶解させる工程である、請求項15に記載の製造方法。
- フッ素系溶剤が含フッ素炭化水素または含フッ素エーテルを含む、請求項16に記載の製造方法。
- フッ素系溶剤が、含フッ素炭化水素として、炭素数4~8の直鎖状、分岐鎖状または環状の炭化水素であり、炭化水素中の水素原子の少なくとも1個がフッ素原子で置換された含フッ素炭化水素を含むフッ素系溶剤である、請求項17に記載の製造方法。
- 請求項9乃至請求項20のいずれか1項に記載の製造方法で製造された有機半導体素子。
- 請求項21に記載の有機半導体素子を用いてなる、有機エレクトロルミネッセンスディスプレイ。
- 請求項21に記載の有機半導体素子を用いてなる、液晶ディスプレイ。
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Also Published As
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US20160164047A1 (en) | 2016-06-09 |
JP2015038198A (ja) | 2015-02-26 |
JP6459263B2 (ja) | 2019-01-30 |
TW201512283A (zh) | 2015-04-01 |
KR101831384B1 (ko) | 2018-02-22 |
KR20160034361A (ko) | 2016-03-29 |
US9966575B2 (en) | 2018-05-08 |
CN105393342A (zh) | 2016-03-09 |
TWI510543B (zh) | 2015-12-01 |
CN105393342B (zh) | 2018-03-20 |
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