WO2014080841A1 - シリカ質膜の形成方法及び同方法で形成されたシリカ質膜 - Google Patents
シリカ質膜の形成方法及び同方法で形成されたシリカ質膜 Download PDFInfo
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- WO2014080841A1 WO2014080841A1 PCT/JP2013/080886 JP2013080886W WO2014080841A1 WO 2014080841 A1 WO2014080841 A1 WO 2014080841A1 JP 2013080886 W JP2013080886 W JP 2013080886W WO 2014080841 A1 WO2014080841 A1 WO 2014080841A1
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- Prior art keywords
- siliceous film
- forming
- film
- atmosphere
- siliceous
- Prior art date
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- 238000000034 method Methods 0.000 title claims description 80
- 239000012298 atmosphere Substances 0.000 claims abstract description 73
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 70
- 229920001709 polysilazane Polymers 0.000 claims abstract description 64
- 239000000758 substrate Substances 0.000 claims abstract description 44
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 35
- 150000001875 compounds Chemical class 0.000 claims abstract description 25
- -1 nitrogen-containing compound Chemical class 0.000 claims abstract description 22
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 19
- 150000002367 halogens Chemical class 0.000 claims abstract description 16
- 238000003980 solgel method Methods 0.000 claims abstract description 16
- 238000010438 heat treatment Methods 0.000 claims abstract description 13
- 239000011261 inert gas Substances 0.000 claims abstract description 13
- 125000005843 halogen group Chemical group 0.000 claims abstract description 7
- 230000001590 oxidative effect Effects 0.000 claims abstract description 5
- 238000000137 annealing Methods 0.000 claims description 32
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 19
- 238000002955 isolation Methods 0.000 claims description 16
- 150000001412 amines Chemical class 0.000 claims description 15
- 238000010494 dissociation reaction Methods 0.000 claims description 14
- 230000005593 dissociations Effects 0.000 claims description 14
- SSUJUUNLZQVZMO-UHFFFAOYSA-N 1,2,3,4,8,9,10,10a-octahydropyrimido[1,2-a]azepine Chemical compound C1CCC=CN2CCCNC21 SSUJUUNLZQVZMO-UHFFFAOYSA-N 0.000 claims description 11
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 10
- 125000000217 alkyl group Chemical group 0.000 claims description 8
- SGUVLZREKBPKCE-UHFFFAOYSA-N 1,5-diazabicyclo[4.3.0]-non-5-ene Chemical compound C1CCN=C2CCCN21 SGUVLZREKBPKCE-UHFFFAOYSA-N 0.000 claims description 7
- 125000003342 alkenyl group Chemical group 0.000 claims description 7
- 125000003118 aryl group Chemical group 0.000 claims description 7
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 7
- 239000012528 membrane Substances 0.000 claims description 5
- 238000005530 etching Methods 0.000 abstract description 51
- 238000000576 coating method Methods 0.000 abstract description 38
- 239000011248 coating agent Substances 0.000 abstract description 33
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 40
- 230000000052 comparative effect Effects 0.000 description 34
- 239000000243 solution Substances 0.000 description 29
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 18
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 18
- 229910052710 silicon Inorganic materials 0.000 description 18
- 239000010703 silicon Substances 0.000 description 18
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 17
- 239000000203 mixture Substances 0.000 description 16
- 239000002585 base Substances 0.000 description 13
- 239000012299 nitrogen atmosphere Substances 0.000 description 13
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 12
- 239000007789 gas Substances 0.000 description 12
- 239000004065 semiconductor Substances 0.000 description 11
- BAVYZALUXZFZLV-UHFFFAOYSA-N Methylamine Chemical compound NC BAVYZALUXZFZLV-UHFFFAOYSA-N 0.000 description 10
- 229910021529 ammonia Inorganic materials 0.000 description 10
- 230000000694 effects Effects 0.000 description 10
- 235000019441 ethanol Nutrition 0.000 description 9
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 8
- 229910052760 oxygen Inorganic materials 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 7
- 229910018557 Si O Inorganic materials 0.000 description 7
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 7
- 125000004122 cyclic group Chemical group 0.000 description 7
- 238000010790 dilution Methods 0.000 description 7
- 239000012895 dilution Substances 0.000 description 7
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Inorganic materials [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 7
- 239000002904 solvent Substances 0.000 description 7
- ROSDSFDQCJNGOL-UHFFFAOYSA-N Dimethylamine Chemical compound CNC ROSDSFDQCJNGOL-UHFFFAOYSA-N 0.000 description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 6
- 229910052757 nitrogen Inorganic materials 0.000 description 6
- 150000003973 alkyl amines Chemical class 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 239000003054 catalyst Substances 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 239000003960 organic solvent Substances 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 5
- 238000007254 oxidation reaction Methods 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 235000012239 silicon dioxide Nutrition 0.000 description 5
- 238000004528 spin coating Methods 0.000 description 5
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 4
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 4
- 239000012776 electronic material Substances 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- XMGQYMWWDOXHJM-UHFFFAOYSA-N limonene Chemical compound CC(=C)C1CCC(C)=CC1 XMGQYMWWDOXHJM-UHFFFAOYSA-N 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000002161 passivation Methods 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000010304 firing Methods 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000011229 interlayer Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Polymers [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 3
- 125000000962 organic group Chemical group 0.000 description 3
- FYGHSUNMUKGBRK-UHFFFAOYSA-N 1,2,3-trimethylbenzene Chemical compound CC1=CC=CC(C)=C1C FYGHSUNMUKGBRK-UHFFFAOYSA-N 0.000 description 2
- KVNYFPKFSJIPBJ-UHFFFAOYSA-N 1,2-diethylbenzene Chemical compound CCC1=CC=CC=C1CC KVNYFPKFSJIPBJ-UHFFFAOYSA-N 0.000 description 2
- AFABGHUZZDYHJO-UHFFFAOYSA-N 2-Methylpentane Chemical compound CCCC(C)C AFABGHUZZDYHJO-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- YNQLUTRBYVCPMQ-UHFFFAOYSA-N Ethylbenzene Chemical compound CCC1=CC=CC=C1 YNQLUTRBYVCPMQ-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 235000019270 ammonium chloride Nutrition 0.000 description 2
- RDOXTESZEPMUJZ-UHFFFAOYSA-N anisole Chemical compound COC1=CC=CC=C1 RDOXTESZEPMUJZ-UHFFFAOYSA-N 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- HQABUPZFAYXKJW-UHFFFAOYSA-N butan-1-amine Chemical compound CCCCN HQABUPZFAYXKJW-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- HGCIXCUEYOPUTN-UHFFFAOYSA-N cyclohexene Chemical compound C1CCC=CC1 HGCIXCUEYOPUTN-UHFFFAOYSA-N 0.000 description 2
- NNBZCPXTIHJBJL-UHFFFAOYSA-N decalin Chemical compound C1CCCC2CCCCC21 NNBZCPXTIHJBJL-UHFFFAOYSA-N 0.000 description 2
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- JQVDAXLFBXTEQA-UHFFFAOYSA-N dibutylamine Chemical compound CCCCNCCCC JQVDAXLFBXTEQA-UHFFFAOYSA-N 0.000 description 2
- DMBHHRLKUKUOEG-UHFFFAOYSA-N diphenylamine Chemical compound C=1C=CC=CC=1NC1=CC=CC=C1 DMBHHRLKUKUOEG-UHFFFAOYSA-N 0.000 description 2
- 238000004821 distillation Methods 0.000 description 2
- IIEWJVIFRVWJOD-UHFFFAOYSA-N ethylcyclohexane Chemical compound CCC1CCCCC1 IIEWJVIFRVWJOD-UHFFFAOYSA-N 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 150000002366 halogen compounds Chemical class 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- UAEPNZWRGJTJPN-UHFFFAOYSA-N methylcyclohexane Chemical compound CC1CCCCC1 UAEPNZWRGJTJPN-UHFFFAOYSA-N 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 2
- BKIMMITUMNQMOS-UHFFFAOYSA-N nonane Chemical compound CCCCCCCCC BKIMMITUMNQMOS-UHFFFAOYSA-N 0.000 description 2
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 2
- CFJYNSNXFXLKNS-UHFFFAOYSA-N p-menthane Chemical compound CC(C)C1CCC(C)CC1 CFJYNSNXFXLKNS-UHFFFAOYSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- DPBLXKKOBLCELK-UHFFFAOYSA-N pentan-1-amine Chemical compound CCCCCN DPBLXKKOBLCELK-UHFFFAOYSA-N 0.000 description 2
- PGMYKACGEOXYJE-UHFFFAOYSA-N pentyl acetate Chemical compound CCCCCOC(C)=O PGMYKACGEOXYJE-UHFFFAOYSA-N 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 230000001737 promoting effect Effects 0.000 description 2
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 2
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical compound CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 2
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 2
- 229930195734 saturated hydrocarbon Natural products 0.000 description 2
- FZHAPNGMFPVSLP-UHFFFAOYSA-N silanamine Chemical compound [SiH3]N FZHAPNGMFPVSLP-UHFFFAOYSA-N 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000002194 synthesizing effect Effects 0.000 description 2
- 238000001947 vapour-phase growth Methods 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- VIDOPANCAUPXNH-UHFFFAOYSA-N 1,2,3-triethylbenzene Chemical compound CCC1=CC=CC(CC)=C1CC VIDOPANCAUPXNH-UHFFFAOYSA-N 0.000 description 1
- BMVXCPBXGZKUPN-UHFFFAOYSA-N 1-hexanamine Chemical compound CCCCCCN BMVXCPBXGZKUPN-UHFFFAOYSA-N 0.000 description 1
- GQHTUMJGOHRCHB-UHFFFAOYSA-N 2,3,4,6,7,8,9,10-octahydropyrimido[1,2-a]azepine Chemical compound C1CCCCN2CCCN=C21 GQHTUMJGOHRCHB-UHFFFAOYSA-N 0.000 description 1
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 description 1
- QNJNUBGIOTWACD-UHFFFAOYSA-N C(C)(=O)OCC(C)C.C(C)(=O)OCCCC.C(C)(=O)O Chemical compound C(C)(=O)OCC(C)C.C(C)(=O)OCCCC.C(C)(=O)O QNJNUBGIOTWACD-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 1
- WJYIASZWHGOTOU-UHFFFAOYSA-N Heptylamine Chemical compound CCCCCCCN WJYIASZWHGOTOU-UHFFFAOYSA-N 0.000 description 1
- NHTMVDHEPJAVLT-UHFFFAOYSA-N Isooctane Chemical compound CC(C)CC(C)(C)C NHTMVDHEPJAVLT-UHFFFAOYSA-N 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- 229910003902 SiCl 4 Inorganic materials 0.000 description 1
- 229910008284 Si—F Inorganic materials 0.000 description 1
- 239000003377 acid catalyst Substances 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 1
- 125000003545 alkoxy group Chemical group 0.000 description 1
- 125000003282 alkyl amino group Chemical group 0.000 description 1
- 125000005103 alkyl silyl group Chemical group 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 150000001491 aromatic compounds Chemical class 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000011362 coarse particle Substances 0.000 description 1
- 239000008199 coating composition Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 229920005565 cyclic polymer Polymers 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006356 dehydrogenation reaction Methods 0.000 description 1
- MROCJMGDEKINLD-UHFFFAOYSA-N dichlorosilane Chemical compound Cl[SiH2]Cl MROCJMGDEKINLD-UHFFFAOYSA-N 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- LAWOZCWGWDVVSG-UHFFFAOYSA-N dioctylamine Chemical compound CCCCCCCCNCCCCCCCC LAWOZCWGWDVVSG-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- POLCUAVZOMRGSN-UHFFFAOYSA-N dipropyl ether Chemical compound CCCOCCC POLCUAVZOMRGSN-UHFFFAOYSA-N 0.000 description 1
- WEHWNAOGRSTTBQ-UHFFFAOYSA-N dipropylamine Chemical compound CCCNCCC WEHWNAOGRSTTBQ-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 239000000706 filtrate Substances 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 125000003709 fluoroalkyl group Chemical group 0.000 description 1
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 1
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- QWTDNUCVQCZILF-UHFFFAOYSA-N iso-pentane Natural products CCC(C)C QWTDNUCVQCZILF-UHFFFAOYSA-N 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 229940087305 limonene Drugs 0.000 description 1
- 235000001510 limonene Nutrition 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- UZKWTJUDCOPSNM-UHFFFAOYSA-N methoxybenzene Substances CCCCOC=C UZKWTJUDCOPSNM-UHFFFAOYSA-N 0.000 description 1
- GYNNXHKOJHMOHS-UHFFFAOYSA-N methyl-cycloheptane Natural products CC1CCCCCC1 GYNNXHKOJHMOHS-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- DIAIBWNEUYXDNL-UHFFFAOYSA-N n,n-dihexylhexan-1-amine Chemical compound CCCCCCN(CCCCCC)CCCCCC DIAIBWNEUYXDNL-UHFFFAOYSA-N 0.000 description 1
- XTAZYLNFDRKIHJ-UHFFFAOYSA-N n,n-dioctyloctan-1-amine Chemical compound CCCCCCCCN(CCCCCCCC)CCCCCCCC XTAZYLNFDRKIHJ-UHFFFAOYSA-N 0.000 description 1
- OOHAUGDGCWURIT-UHFFFAOYSA-N n,n-dipentylpentan-1-amine Chemical compound CCCCCN(CCCCC)CCCCC OOHAUGDGCWURIT-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- NJWMENBYMFZACG-UHFFFAOYSA-N n-heptylheptan-1-amine Chemical compound CCCCCCCNCCCCCCC NJWMENBYMFZACG-UHFFFAOYSA-N 0.000 description 1
- PXSXRABJBXYMFT-UHFFFAOYSA-N n-hexylhexan-1-amine Chemical compound CCCCCCNCCCCCC PXSXRABJBXYMFT-UHFFFAOYSA-N 0.000 description 1
- JACMPVXHEARCBO-UHFFFAOYSA-N n-pentylpentan-1-amine Chemical compound CCCCCNCCCCC JACMPVXHEARCBO-UHFFFAOYSA-N 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- IOQPZZOEVPZRBK-UHFFFAOYSA-N octan-1-amine Chemical compound CCCCCCCCN IOQPZZOEVPZRBK-UHFFFAOYSA-N 0.000 description 1
- 229930004008 p-menthane Natural products 0.000 description 1
- 229940100684 pentylamine Drugs 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 150000003222 pyridines Chemical class 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000008961 swelling Effects 0.000 description 1
- UQMOLLPKNHFRAC-UHFFFAOYSA-N tetrabutyl silicate Chemical compound CCCCO[Si](OCCCC)(OCCCC)OCCCC UQMOLLPKNHFRAC-UHFFFAOYSA-N 0.000 description 1
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 1
- ZQZCOBSUOFHDEE-UHFFFAOYSA-N tetrapropyl silicate Chemical compound CCCO[Si](OCCC)(OCCC)OCCC ZQZCOBSUOFHDEE-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- IMFACGCPASFAPR-UHFFFAOYSA-N tributylamine Chemical compound CCCCN(CCCC)CCCC IMFACGCPASFAPR-UHFFFAOYSA-N 0.000 description 1
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 1
- ODHXBMXNKOYIBV-UHFFFAOYSA-N triphenylamine Chemical compound C1=CC=CC=C1N(C=1C=CC=CC=1)C1=CC=CC=C1 ODHXBMXNKOYIBV-UHFFFAOYSA-N 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- 229930195735 unsaturated hydrocarbon Natural products 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/007—After-treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02214—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H01L21/02216—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02205—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition
- H01L21/02208—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si
- H01L21/02219—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and nitrogen
- H01L21/02222—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being characterised by the precursor material for deposition the precursor containing a compound comprising Si the compound comprising silicon and nitrogen the compound being a silazane
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02321—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer
- H01L21/02323—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of oxygen
- H01L21/02326—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of oxygen into a nitride layer, e.g. changing SiN to SiON
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02337—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment treatment by exposure to a gas or vapour
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
Definitions
- the present invention relates to a method for forming a siliceous film and a siliceous film having an improved etching rate without impurities formed by the same method. More specifically, the present invention is a silica that can be preferably used in forming a semiconductor device, for example, an element isolation film (STI: Shallow Trench Isolation), an insulating film (eg, PMD), etc. of a large scale integrated circuit.
- STI Shallow Trench Isolation
- PMD insulating film
- siliceous film Since siliceous film has excellent heat resistance, wear resistance, corrosion resistance, etc., it has been conventionally used between a semiconductor substrate and a metal wiring layer in a semiconductor device, between metal wiring layers, or on various elements on a semiconductor substrate. Insulating films provided, element isolation films between elements provided on a semiconductor substrate, passivation films, protective films, planarization films, stress adjustment films, sacrificial films, etc., and glass substrates and ITO films in liquid crystal display devices It is widely used as an insulating film provided between a transparent electrode and an alignment film, or as a protective film provided on a pixel electrode or a color filter.
- a siliceous film used in such a field is generally formed on a substrate by a vapor phase growth method such as a CVD method or a sputtering method or a coating method using a coating solution for forming a siliceous film.
- a vapor phase growth method such as a CVD method or a sputtering method or a coating method using a coating solution for forming a siliceous film.
- the vapor phase growth method is troublesome and requires a large facility, and in addition, there is a problem that the uneven surface cannot be flattened when a film is formed on the uneven surface. The law is widely adopted.
- a trench isolation structure is employed in which the trench is filled with an insulator to electrically isolate elements formed on both sides of the trench.
- a void may be formed in a fine groove.
- a method of applying a sol-gel method as an alkoxysiloxane solution and then heat-treating the formed coating film to convert it into silicon dioxide has been studied (for example, patents).
- this method when the alkoxysiloxane is converted into silicon dioxide, volume shrinkage may occur and cracks may occur.
- polysilazane As a method for suppressing such cracks, it has been proposed to use polysilazane as a precursor of silica (silicon dioxide; SiO 2 ) instead of the sol-gel method (for example, Patent Documents 1 and 2), which are currently widely used. ing. Since the composition containing polysilazane is excellent in embedding in a trench isolation structure, there is an advantage that voids are hardly generated. For example, it is known that when a polysilazane such as perhydropolysilazane is embedded in a trench and treated in an oxidizing atmosphere, a highly pure and dense siliceous film is formed. However, when forming a siliceous film, a high-temperature baking process called annealing is generally added.
- annealing a high-temperature baking process
- annealing is performed in a nitrogen or oxygen atmosphere, but there is a problem that the density of the film is not sufficiently high and the etching rate of the formed film is increased.
- the embedded silica film needs to be processed by etching, but if the etching rate is high at that time, the error with respect to the target film thickness tends to increase, so the annealed silica film has a slow etching rate. It is desirable to have Although the etching rate can be slowed by performing high-temperature annealing in a water vapor atmosphere, in this case, there is a problem that materials other than the siliceous film that are not desired to be oxidized are also oxidized.
- the formation of the siliceous film in the trench by the coating method is not limited to the method using the polysilazane, and is performed by an appropriate method such as using a silica solution formed by a sol-gel method.
- the etching rate is increased after annealing in an inert gas atmosphere.
- the element isolation film (STI) has been specifically described above, but the necessity for improving the etching rate of the siliceous film is that an insulating film such as an interlayer insulating film (PMD), a passivation film, and a protective film. The same applies to the formation of a planarizing film or the like.
- the present invention has been made based on the above circumstances, and after converting polysilazane into a siliceous film, or by annealing a coating film formed from a silica solution by a sol-gel method, High-purity siliceous film with various properties such as good insulation, film flatness, acid / alkali, solvent resistance, and high barrier properties can be formed. It is an object of the present invention to provide a method for forming a film having a slow etching rate.
- Another object of the present invention is to provide a method of forming an element isolation film having a trench isolation structure formed by the above method. Furthermore, another object of the present invention is to provide a siliceous film having a high purity and a low etching rate formed by the above method.
- the present inventors applied a polysilazane solution to a substrate and baked it in an oxidizing atmosphere to convert the polysilazane to silica, or after applying a silica solution formed by a sol-gel method to the substrate.
- the problem can be solved by annealing (baking) in an inert gas atmosphere such as a nitrogen gas atmosphere in the presence of a specific nitrogen-containing compound or a specific halogen-containing compound, that is, the nitrogen-containing compound or the halogen-containing compound. It has been found that a siliceous film having a slower etching rate can be formed as compared with the case where annealing is performed in an inert gas in the absence of the above, and the present invention has been made based on this finding.
- the present invention relates to the following method for forming a siliceous film using a polysilazane resin and the siliceous film formed by this method.
- a polysilazane solution is applied to a substrate and then cured (cured) in an oxidizing atmosphere, or a silica solution formed by a sol-gel method is applied to a substrate to form a siliceous film on the substrate.
- the siliceous film in an inert gas atmosphere containing a nitrogen-containing compound having a base dissociation constant (pKb) of 4.5 or less or a halogen-containing compound having a halogen atom binding energy of 60 kcal / mol or less.
- pKb base dissociation constant
- a method for forming a siliceous film comprising heating and annealing.
- the nitrogen-containing compound having a base dissociation constant (pKb) of 4.5 or less of the nitrogen atom is represented by the general formula (II): R 4 R 5 R 6 N (II) (Wherein R 4 represents an optionally branched alkyl group, alkenyl group, cycloalkyl group, or aryl group, and R 5 and R 6 may each independently be a hydrogen atom or branched.
- a silica characterized by being an amine represented by the formula: DBU (1,8-diazabicyclo [5,4,0] undecene) or DBN (1,5-diazabicyclo [4,3,0] 5-nonene) Method for forming a membrane.
- the polysilazane is perhydropolysilazane, and curing is performed in a water vapor atmosphere at 200 to 500 ° C.
- a method for forming a siliceous film is
- a high-purity siliceous film having a low etching rate can be formed without changing the process and conditions of the conventional coating method. Thereby, it is possible to accurately and satisfactorily etch an insulating film such as a high-purity siliceous film or a high-purity interlayer insulating film in the trench, a passivation film, a protective film, and a planarizing film.
- a siliceous film is formed by (i) coating and baking polysilazane on a substrate or (ii) applying a silica solution by a sol-gel method on the substrate.
- the polysilazane used in the present invention may be a polysilazane having at least a Si—H bond and an N—H bond in the molecule, and may be a polysilazane modified product.
- Polysilazanes include those having a chain, cyclic or cross-linked structure, or those having a plurality of these structures in the molecule, and these can be used alone or as a mixture. Typical examples include those having a repeating unit represented by the following general formula (I).
- R 1 , R 2 and R 3 are each independently a hydrogen atom, an alkyl group, an alkenyl group, a cycloalkyl group, an aryl group, or a group directly connected to silicon such as a fluoroalkyl group other than these groups.
- Polysilazane having a number average molecular weight of about 100 to 50,000 or a modified product thereof.
- a method for producing a polysilazane having a hydrogen atom in R 1 and R 2 and a methyl group in R 3 in the general formula (I) is described in D.C. Seyferth et al., Polym. Prepr. Am. Chem. Soc. , Div. Polym. Chem. 25, 10 (1984).
- the polysilazane obtained by this method is a chain polymer having a repeating unit of — (SiH 2 NCH 3 ) — and a cyclic polymer, and neither has a crosslinked structure.
- a method for producing a polyorgano (hydro) silazane having a hydrogen atom in R 1 and R 3 and an organic group in R 2 in the general formula (I) is described in D.C. Seyferth et al., Polym. Prepr. Am. Chem. Soc. , Div. Polym. Chem. 25, 10 (1984), and JP-A-61-89230.
- Polysilazanes obtained by these methods include those having a cyclic structure having a polymerization degree of 3 to 5 with-(R 2 SiHNH)-as a repeating unit, and (R 3 SiHNH) x [(R 2 SiH) 1.5 N] 1-X (0.4 ⁇ X ⁇ 1) Some molecules have a chain structure and a cyclic structure in the molecule.
- Examples other than the above formula (I) include those having a crosslinked structure in the molecule, for example, those having the following structures (D. Seyferth et al., Communication of Am. Cer. Soc. C-132, July 1984). .).
- polysilazane R 1 Si (NH) x having a crosslinked structure obtained by ammonia decomposition of R 1 SiX 3 (X: halogen) as reported in JP-A-49-69717, or R 1 SiX Polysilazane having the following structure obtained by co-ammonia decomposition of 3 and R 2 2 SiX 2 may also be used.
- Japanese Patent Publication No. 63-16325 discloses a method in which an adduct of dihalosilane and a base is reacted with ammonia.
- (a) SiCl 4 , SiH 2 Cl A method in which an amine is reacted with a silicon halide such as 2
- a method of synthesizing silazane by dehydrogenation reaction between a silane compound and an amine compound (d) a method of exchanging amine with ammonia using an acid catalyst such as CF 4 SO 3 H for aminosilane, and (e) a large amount of aminosilane.
- F A method in which an amine is exchanged with ammonia or an amine of (f) a polyvalent aminosilane compound and a polyhydrogenated nitrogen-containing compound
- Various methods have been proposed, including the method to amine exchange reaction in the presence of a catalyst (e.g., see WO97 / 24391).
- An example of a method for preparing the polysilazane composition is as follows. That is, dichlorosilane having a purity of 99% or more is poured into dehydrated pyridine adjusted to a temperature in the range of ⁇ 20 to 20 ° C. with stirring. Subsequently, the temperature is adjusted to ⁇ 20 to 20 ° C., and ammonia with a purity of 99% or more is injected with stirring. Here, crude polysilazane and by-product ammonium chloride are produced in the reaction solution. The ammonium chloride produced by the reaction is removed by filtration.
- the filtrate is heated to 30 to 150 ° C., and while adjusting the molecular weight of polysilazane to be in the range of 1,500 to 15,000, the residual ammonia is removed.
- An organic solvent is added and heated to 30 to 50 ° C., and the remaining pyridine is removed by distillation under reduced pressure of 50 mmHg or less. Pyridine is removed by distillation under reduced pressure, but at the same time, the organic solvent is also removed to adjust the polysilazane concentration to a range of 5 to 30% by weight, for example.
- the obtained polysilazane composition is circulated and filtered using a filter having a filtration accuracy of 0.1 ⁇ m or less to reduce coarse particles having a particle size of 0.2 ⁇ m or more to 50 particles / cc or less.
- the polysilazane solution thus obtained may be used as it is as a coating solution, or may be further diluted or concentrated and used as a coating solution.
- organic solvents examples include (a) aromatic compounds such as benzene, toluene, xylene, ethylbenzene, diethylbenzene, trimethylbenzene, triethylbenzene, and decahydronaphthalene, (b) chain saturated hydrocarbons such as n -Pentane, i-pentane, n-hexane, i-hexane, n-heptane, i-heptane, n-octane, i-octane, n-nonane, i-nonane, n-decane, and i-decane, ) Cyclic saturated hydrocarbons such as cyclohexane, ethylcyclohexane, methylcyclohexane, and p-menthane, (d) Cyclic unsaturated hydrocarbons such as cyclohexene, and dip
- the preparation method of the polysilazane composition described above is only an example, and the preparation method of the polysilazane composition is not limited to this method.
- Solid polysilazane can be obtained and used by dissolving or dispersing in an appropriate solvent as described above, or a commercially available polysilazane composition such as Spinfil 200, 400, 600 manufactured by AZ Electronic Materials Manufacturing Co., Ltd. , 65001 (“Spinfil” is a registered trademark) can also be used.
- the concentration of the solution may be appropriately adjusted depending on the thickness of the polysilazane coating film to be finally formed.
- the content of polysilazane is preferably 0.1 to 40% by weight, more preferably 0.2 to 30% by weight, based on the total weight of the polysilazane coating composition, and 0.3 to 25% by weight. More preferably.
- an additive In order to form a high-purity siliceous film, it is preferable not to use an additive. However, if necessary, a silica conversion reaction promoting compound may be further used.
- the silica conversion reaction promoting compound refers to a compound that promotes a reaction in which polysilazane is converted into a siliceous substance by an interaction with the polysilazane compound.
- the polysilazane composition can be applied on the substrate by any method. Specific examples include spin coating, dipping, spraying, roll coating, transfer, slit coating, and curtain coating. Of these, spin coating is particularly preferable from the viewpoint of uniformity of the coating surface.
- a coating film can be made into a desired film thickness by applying it once or twice or more as necessary.
- the thickness of the coating film varies depending on the purpose of use of the film, but is generally 10 to 2,000 nm, preferably 20 to 1,000 nm in terms of dry film thickness.
- the thickness of the applied polysilazane coating is generally 10 to 1 in order to achieve both trench trench embedding after coating and flatness of the surface of the polysilazane coating. Is preferably 1,000 nm, and more preferably 50 to 800 nm.
- the application conditions vary depending on various conditions such as the size of the substrate, the application method, the concentration of the polysilazane composition, and the type of solvent. For example, an example of spin coating is shown below, but this does not limit the coating method.
- a polysilazane composition per silicon substrate is dropped at a central portion of the silicon substrate or at several places including the central portion so that a coating film is formed on the entire surface of the substrate on average.
- the polysilazane solution is rotated at a relatively low speed for a short time, for example, at a rotation speed of 50 to 500 rpm for 0.5 to 10 seconds (press pin).
- the coating film is rotated at a relatively high speed, for example, a rotation speed of 500 to 4,000 rpm for 0.5 to 800 seconds (main spin). Furthermore, in order to reduce the swelling of the polysilazane coating film in the periphery of the silicon substrate and dry the solvent in the polysilazane coating film as much as possible, at a rotational speed higher than the main spin rotational speed by 500 rpm or more, for example, Rotate at a rotational speed of 1,000 to 5,000 rpm for 5 to 300 seconds (final spin).
- pre-bake heat treatment
- This process is intended to completely remove the solvent contained in the coating film and to pre-cure the coating film in the final coating process.
- a method of heating at a substantially constant temperature in the atmosphere is used, but the coating film shrinks during curing, and the concave portion of the substrate becomes a dent or a void is generated inside the groove.
- the temperature can be controlled and pre-baking can be performed while increasing over time.
- the pre-baking temperature is usually 50 ° C. to 400 ° C., preferably 100 to 300 ° C.
- the prebake time is usually 10 seconds to 30 minutes, preferably 30 seconds to 10 minutes.
- the pre-baking temperature is increased with time.
- the maximum prebaking temperature is generally set to a temperature higher than the boiling point of the solvent used in the polysilazane composition from the viewpoint of removing the solvent from the coating.
- a treatment liquid containing an oxidation (curing) accelerator may be applied to the polysilazane coating film.
- the polysilazane coating thus formed is then cured (cured) in order to convert the polysilazane into a siliceous film.
- Curing may be performed by using a curing furnace or a hot plate, a method of performing heat treatment in an inert gas or oxygen atmosphere containing water vapor, or a method of performing heat treatment in a water vapor atmosphere containing hydrogen peroxide vapor. Done in the way.
- Water vapor is an important factor for sufficiently converting polysilazane into a siliceous film (ie, silicon dioxide), and its concentration is preferably 30% or more, more preferably 50% or more, and most preferably 70% or more. To do.
- a water vapor concentration of 80% or more is preferable because conversion of polysilazane to a siliceous film easily proceeds, generation of defects such as voids is reduced, and characteristics of the siliceous film are improved.
- nitrogen, argon, helium, or the like is usually used as the inert gas.
- the curing temperature varies depending on the type of polysilazane compound used, the water vapor concentration, etc., but in general, the higher the temperature, the faster the rate of conversion to a siliceous film, while the lower the temperature, the oxidation of the silicon substrate or There is a tendency that an adverse effect on device characteristics due to a change in crystal structure is reduced.
- high temperature heating in the annealing process is performed as a post process, and therefore, it is generally performed at a temperature of about 200 to 500 ° C., for example, 350 ° C.
- the rate of temperature increase to the target temperature is generally 0.1 to 100 ° C./minute
- the curing time after reaching the target temperature is generally 1 minute to 10 hours, preferably 15 minutes to 3 hours.
- the processing temperature or the composition of the processing atmosphere can be changed stepwise.
- the coating film When the coating film is exposed to hydrogen peroxide vapor, the coating film may be kept at 50 to 200 ° C. and placed in a hydrogen peroxide vapor atmosphere for 1 minute to 2 hours. At this time, other steam such as water vapor or dilution gas may be included. The oxidation rate of the coating film is generally faster when the hydrogen peroxide vapor concentration is higher.
- the siliceous film may be formed by applying a silica solution formed by a sol-gel method.
- a tetraalkoxysilane represented by the general formula: Si (ORa) 4 (wherein Ra represents a lower alkyl group) is converted to an acid such as hydrochloric acid in an organic solvent such as alcohol.
- an organic solvent such as alcohol.
- Ra methyl group, ethyl group, n-propyl group, n-butyl group and the like are used.
- tetraalkoxysilane examples include tetramethoxysilane: Si (OCH 3 ) 4 , tetraethoxysilane: Si (OC 2 H 5 ) 4 , tetrapropoxysilane: Si (0C 3 H 7 ) 4 , tetrabutoxy Silane: Si (OC 4 H 9 ) 4 and the like can be mentioned.
- organic solvent examples include alcohols such as methyl alcohol, ethyl alcohol, n-propyl alcohol, isopropyl alcohol and n-butanol are preferably used.
- a specific example of the sol-gel method is a method of forming a silica solution by mixing TEOS (tetraethyl orthosilicate; tetraethoxysilane), ethyl alcohol, water, and hydrochloric acid.
- TEOS tetraethyl orthosilicate; tetraethoxysilane
- ethyl alcohol ethyl alcohol
- water ethyl alcohol
- the substrate to which the polysilazane solution or the silica solution by the sol-gel method is applied include a semiconductor substrate such as a silicon substrate, a glass substrate, and the like, and a trench groove may be formed in the silicon substrate or the like by etching.
- the substrate when forming an insulating film such as an interlayer insulating film, a planarizing film, a passivation film, a stress adjusting film, a sacrificial film, or the like, the substrate may be a semiconductor film or a circuit in the process of forming a semiconductor element.
- a silicon substrate provided with is used.
- annealing is performed to heat the entire substrate.
- the entire substrate is generally put into a curing furnace or the like and heated.
- a nitrogen-containing compound having a base dissociation constant (pKb) of 4.5 or less or a halogen-containing compound having a halogen atom bond energy of 60 kcal / mol or less is contained in the heating atmosphere.
- the nitrogen-containing compound or the halogen-containing compound is liquid or solid, the compound is vaporized in a preheating furnace to be gaseous, and this is supplied to the heating furnace together with an inert gas. preferable.
- the base dissociation constant (pKb) refers to the dissociation constant for water.
- the base dissociation constant (pKb) and the binding energy of halogen atoms are already widely known for a wide range of compounds.
- nitrogen-containing compounds having a base dissociation constant (pKb) of 4.5 or less include amines represented by the following general formula (II), DBU (1,8-diazabicyclo [5,4,0] 7-undecene), DBN (1,5-diazabicyclo [4,3,0] 5-nonene) and the like can be mentioned.
- R 4 R 5 R 6 N (II) (Wherein R 4 represents an optionally branched alkyl group, alkenyl group, cycloalkyl group, or aryl group, and R 5 and R 6 may each independently be a hydrogen atom or branched. Represents an alkyl group, an alkenyl group, a cycloalkyl group, or an aryl group.)
- Preferred examples of the amine represented by the general formula (II) are methylamine, dimethylamine, trimethylamine, ethylamine, diethylamine, triethylamine, propylamine, dipropylamine, tripropylamine, butylamine, dibutylamine, tributylamine.
- examples of the halogen-containing compound having a halogen atom binding energy of 60 kcal / mol or less include Br 2 , F 2 , and NF 3 .
- Annealing is performed in an inert gas atmosphere containing the amine or halogen-containing gas.
- the inert gas nitrogen, helium, argon gas or the like is usually used.
- the annealing temperature is usually 400 to 1,200 ° C., preferably 450 to 1,000 ° C. when a nitrogen-containing compound such as amine, DBU or DBN is contained.
- a nitrogen-containing compound such as amine, DBU or DBN is contained.
- the temperature raising time to the target treatment temperature is preferably 1 to 100 ° C./min.
- the treatment time at the treatment target temperature is 1 minute to 10 hours, preferably 15 minutes to 3 hours.
- the content of a nitrogen-containing compound having a base dissociation constant (pKb) of 4.5 or less or a halogen-containing compound having a halogen atom binding energy of 60 kcal / mol or less is usually 0.01% by volume or more in an atmosphere. It is preferably 0.5 to 20% by volume, more preferably 1 to 10% by volume. When the content of these compounds is too small, the effect of the present invention may not be achieved. On the other hand, when the content of the compound is high, the etching rate generally tends to be high, and when the content is too high, the effect of the present invention is reduced.
- pKb base dissociation constant
- the etching rate is improved with high purity by heating in an inert gas atmosphere containing a nitrogen-containing compound having a base dissociation constant (pKb) of 4.5 or less or a halogen-containing compound having a binding energy of 60 kcal / mol or less (etching)
- a dense siliceous film having a low rate can be formed. The reason for this is considered to be as follows, but the present invention is not limited thereby.
- alkylamine is electron donating and has loan-pair electrons.
- the loan pair electrons of the alkylamine react with the Si—H bond or Si—O bond remaining in the siliceous film during annealing, and Si is negatively ionized and the alkylamine N is positively ionized.
- Negatively ionized Si binds to other Si—O molecules and enlarges the Si—O ring. For example, when the ring made of (Si—O) 3 becomes larger and becomes (Si—O) 5 , the etching rate becomes slower.
- the NF bond or the FF bond is cut by heating at 200 to 500 ° C., and the broken F anion is temporarily bonded to silica. After the Si—F bond thus generated is broken by heating at 500 to 1,200 ° C., the Si—O ring can be enlarged by a crosslinking reaction.
- Example 1 About 1 mL of a 20 wt% solution of perhydropolysilazane in dibutyl ether (AZ Electronic Materials Manufacturing Co., Ltd., Spinfil 65001, “Spinfil” is a registered trademark) was dropped on a 4-inch silicon wafer, and 1,000 rpm, After spin coating for 20 seconds, soft baking was performed at 150 ° C. for 3 minutes in the air on a hot plate. The film thickness was 600 nm. Next, a treatment was performed for 60 minutes at 350 ° C. and 80% water vapor (80% H 2 O / 20% O 2 ) (firing) to change the perhydropolysilazane into a siliceous film (curing).
- the relative etching rate of the obtained siliceous film was calculated by the following method.
- the relative etching rate was 4.1.
- ⁇ Calculation of relative etching rate> The formed siliceous film was immersed in a 0.5% aqueous hydrogen fluoride solution, and the change in film thickness per unit immersion time was observed. Specifically, the film thickness is measured every 5 minutes, and the rate at which the film thickness decreases as the etching proceeds is calculated in the form of nm / min. Further, the same operation is performed for the thermal oxide film, and the etching rate is calculated. From the obtained etching rate, [etching rate of silica film: unit is nm / min] / [etching rate of thermal oxide film: unit is nm / min] ratio was determined and used as the relative etching rate. Since this value represents a ratio, it is a dimensionless number. For the measurement of the film thickness, a reflection spectral film thickness meter: FE-3000 manufactured by Otsuka Electronics Co., Ltd. was used.
- the thermal oxide film serving as the reference is formed by placing an uncoated silicon wafer under steam at 1,050 ° C. for 1 hour to oxidize the silicon surface and form a thermal oxide film having a thickness of about 500 nm. What was done was used. This thermal oxide film was also used as a reference film in all of the following examples and comparative examples.
- Examples 2 and 3 Instead of treating in a 2% trimethylamine (N 2 diluted) atmosphere, treated in a 4% trimethylamine (N 2 diluted) atmosphere (Example 2) or 10% trimethylamine (N 2 diluted) atmosphere (Example 3) A siliceous film was formed by the same method as in Example 1 except that. The relative etching rates of the obtained siliceous film were 4.6 and 4.8, respectively.
- Examples 4-7 Instead of processing in a 2% trimethylamine (N 2 diluted) atmosphere, a 2% methylamine (N 2 diluted) atmosphere (Example 4), a 2% monomethylamine (N 2 diluted) atmosphere (Example 5), Treating in a 2% triethylamine (N 2 diluted) atmosphere (Example 6) and 2% DBU (1,8-diazabicyclo [5,4,0] undecene) (N 2 diluted) atmosphere (Example 7). Except for the above, a siliceous film was formed in the same manner as in Example 1. The relative etching rates of the obtained siliceous films were 4.1, 4.2, 4.5, and 4.8, respectively. Incidentally, triethylamine and DBU are the gas vaporized in preheating furnace was carried out by introducing into the furnace with N 2 carrier gas.
- Comparative Examples 1 and 2 Implemented except for treatment in an N 2 gas atmosphere (Comparative Example 1) or 2% ammonia (N 2 dilution) atmosphere (Comparative Example 2) instead of treatment in a 2% trimethylamine (N 2 dilution) atmosphere
- a siliceous film was formed in the same manner as in Example 1.
- the relative etching rates of the obtained siliceous films were 5.6 and 6.1, respectively.
- the base dissociation constant pKb of ammonia which is the nitrogen-containing compound used in Comparative Example 2, was 4.75. From this, it can be seen that the effect of the present invention is exhibited when the base dissociation constant pKb is 4.5 or less.
- Example 1 From Table 1, the withstand voltage (Vbd: Break Down Voltage) of Example 1 is higher than that of Comparative Example 1, and the relative dielectric constant approaches that of pure silicon dioxide (about 3.9). This indicates that a denser silica film could be formed by annealing in an amine atmosphere.
- Comparative Examples 3 and 4 From instead be treated with 2% trimethylamine (N 2 dilution) atmosphere, an atmosphere consisting of 40% steam and 60% N 2 gas (Comparative Example 3) or 2% trimethylamine, 40% steam, 58% N 2 gas A siliceous film was formed by the same method as in Example 1 except that the treatment was performed in an atmosphere (Comparative Example 4). The rate of film thickness reduction was measured, and the relative etching rates of the siliceous film obtained were 2.3 and 2.4, respectively.
- Example 8 TEOS (tetraethyl orthosilicate) 8.36 g (0.04 mol), ethanol 11.5 g (0.25 mol), water 4.32 g (0.24 mol) and 1 mol / L HCl aqueous solution 1 g in a plastic container, The mixture was stirred at room temperature for 1 day, and then this mixed solution was diluted 4-fold with ethanol to prepare a silica solution by a sol-gel method.
- TEOS tetraethyl orthosilicate
- Comparative Example 5 A siliceous film was formed by the same method as in Example 8 except that the treatment was performed in an N 2 gas atmosphere instead of the treatment in a 2% trimethylamine (N 2 diluted) atmosphere. The relative etching rate of the obtained siliceous film was 11.5.
- Example 8 From Example 8 and Comparative Example 5, it can be seen that also in the formation of a siliceous film using a silica solution by the sol-gel method, the etching rate is slow as in the case of using polysilazane.
- Example 9 Instead of raising the temperature to 700 ° C., the temperature is raised to 500 ° C., and the siliceous material is obtained by the same method as in Example 1 except that the treatment in a 2% trimethylamine (N 2 diluted) atmosphere is performed at this temperature. A film was formed. The relative etching rate of the obtained siliceous film was 6.4.
- Comparative Example 6 A siliceous film was formed in the same manner as in Example 9 except that the treatment was performed in an N 2 gas atmosphere instead of the treatment in a 2% trimethylamine (N 2 diluted) atmosphere. The relative etching rate of the obtained siliceous film was 6.9.
- Example 10 3.30 g (0.02 mol) of triethoxysilane, 4.318 g (0.02 mol) of TEOS, 9.2 g (0.2 mol) of ethanol, 3.6 g (0.2 mol) of water and 1 mol / L HCl 0.1 g of the aqueous solution was stirred at room temperature for 1 day in a plastic container, and then this mixed solution was diluted 4 times with ethanol to prepare a silica solution by a sol-gel method.
- silica solution thus obtained was dropped on a 4-inch silicon wafer, spin-coated at 1500 rpm for 20 seconds with a spin coater, and soft baked at 150 ° C. for 3 minutes on a hot plate.
- the film thickness was 100 nm.
- the temperature was raised to 700 ° C. in an N 2 atmosphere, and the treatment was performed at this temperature in a 2% trimethylamine (N 2 diluted) atmosphere for 60 minutes.
- the relative etching rate of the obtained siliceous film was calculated in the same manner as in Example 1. The relative etching rate was 9.3.
- Comparative Example 7 A siliceous film was formed by the same method as in Example 10 except that the treatment was performed in an N 2 gas atmosphere instead of the treatment in a 2% trimethylamine (N 2 diluted) atmosphere. The relative etching rate of the obtained siliceous film was 10.8.
- Example 10 and Comparative Example 7 From Example 10 and Comparative Example 7, it can be seen that the effect of the present invention is exhibited at an annealing temperature of 700 ° C. even in the sol-gel method.
- Comparative Example 8 About 1 mL of a 20% dibutyl ether solution of perhydropolysilazane (Spinfil 65001 manufactured by AZ Electronic Materials Manufacturing Co., Ltd., “Spinfil” is a registered trademark) was dropped on a 4-inch silicon wafer, and 1000 rpm for 20 seconds by a spin coater. And then soft baking was performed at 150 ° C. for 3 minutes in the air on a hot plate. The film thickness was 600 nm. Next, a treatment was performed for 60 minutes at 350 ° C. and 80% water vapor (80% H 2 O / 20% O 2 ) (firing) to change the perhydropolysilazane into a siliceous film. Thereafter, the temperature was lowered while the N 2 atmosphere until 0.99 ° C., and 60 min treatment (annealing) in N 2 atmosphere at this temperature. The relative etching rate of the obtained siliceous film was 8.5.
- Comparative Example 9 A siliceous film was formed in the same manner as in Comparative Example 8 except that the annealing treatment was performed at 150 ° C. in place of N 2 atmosphere and 150 ° C., except that the annealing treatment was performed at 2% trimethylamine (N 2 diluted) atmosphere and 150 ° C. The relative etching rate of the obtained siliceous film was 8.6.
- Example 11 About 1 mL of a 20 wt% solution of perhydropolysilazane in dibutyl ether (AZ Electronic Materials Manufacturing Co., Ltd., Spinfil 65001, “Spinfil” is a registered trademark) was dropped on a 4-inch silicon wafer, and 1,000 rpm, The spin coating was performed for 20 seconds, and soft baking was performed at 150 ° C. for 3 minutes in the air on a hot plate. The film thickness was 600 nm. Next, a treatment was performed for 60 minutes at 350 ° C. and 80% water vapor (80% H 2 O / 20% O 2 ) (firing) to change the perhydropolysilazane into a siliceous film.
- Examples 12-13 Instead of processing in a 2% trimethylamine (N 2 diluted) atmosphere, a 2% Br 2 (N 2 diluted) atmosphere (Example 12) or a 2% F 2 (N 2 diluted) atmosphere (Example 13) A siliceous film was formed in the same manner as in Example 11 except that the treatment was performed in the same manner. The relative etching rates of the obtained siliceous films were 1.7 and 1.4, respectively.
- Comparative Example 10 A siliceous film was formed by the same method as in Example 11 except that the treatment was performed in an N 2 atmosphere instead of the treatment in an atmosphere of 350 ° C. and 2% NF 3 (N 2 dilution). The relative etching rate of the obtained siliceous film was 2.6.
- Comparative Examples 11 and 12 Instead of processing in a 2% NF 3 (N 2 diluted) atmosphere, a 2% CF 4 (N 2 diluted) atmosphere (Comparative Example 11) or a 2% HF (N 2 diluted) atmosphere (Comparative Example 12) A siliceous film was formed in the same manner as in Example 11 except that the treatment was performed in the same manner. The relative etching rates of the obtained siliceous films were both 2.7.
- the halogen bond energies of the halogen compounds used in Examples 11 to 13 were 57 kcal / mol for NF, 46 kcal / mol for Br—Br, and 38 kcal / mol for FF.
- the halogen bond energies of the halogen compounds used in Nos. 11 to 12 were 135 kcal / mol for HF and 117 kcal / mol for CF. From this, it can be seen that the effect of the present invention is exhibited when the halogen bond energy is 60 kcal / mol or less.
- Example 14 A siliceous film was formed by the same method as in Example 1 except that the treatment was performed for 60 minutes in an N 2 atmosphere at 850 ° C. instead of the treatment for 60 minutes in an N 2 atmosphere at 700 ° C. .
- the relative etching rate of the obtained siliceous film was 1.6.
- Comparative Example 13 A siliceous film was formed in the same manner as in Comparative Example 1 except that the treatment was performed for 60 minutes in an N 2 atmosphere at 850 ° C. instead of the treatment for 60 minutes in an N 2 atmosphere at 700 ° C. .
- the relative etching rate of the obtained siliceous film was 2.6.
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Abstract
Description
R4R5R6N (II)
(式中、R4は、分岐していてもよいアルキル基、アルケニル基、シクロアルキル基、またはアリール基を表し、R5およびR6は、各々独立して水素原子、分岐していてもよいアルキル基、アルケニル基、シクロアルキル基、またはアリール基を表す。)
で表されるアミン、DBU(1,8-ジアザビシクロ[5,4,0]ウンデセン)、またはDBN(1,5-ジアザビシクロ〔4,3,0〕5-ノネン)であることを特徴とするシリカ質膜の形成方法。
(式中、R4は、分岐していてもよいアルキル基、アルケニル基、シクロアルキル基、またはアリール基を表し、R5およびR6は、各々独立して水素原子、分岐していてもよいアルキル基、アルケニル基、シクロアルキル基、またはアリール基を表す。)
ペルヒドロポリシラザンのジブチルエーテル20wt%溶液(AZエレクトロニックマテリアルズマニュファクチャリング(株)製Spinfil 65001、「Spinfil」は登録商標)約1mLを4インチシリコンウェハー上に滴下し、スピンコーターにより1,000rpm、20秒の回転塗布を行った後、ホットプレート上にて大気中、150℃、3分のソフトベークを行った。膜厚は600nmであった。次いで、350℃、80%水蒸気(80%H2O/20%O2)にて60分処理を行い(焼成)、ペルヒドロポリシラザンをシリカ質膜に変化させた(硬化)。その後、700℃までN2雰囲気のまま昇温し、この温度において2%トリメチルアミン(N2希釈)雰囲気中で60分処理した後、さらにこの温度、N2雰囲気で60分処理した。得られたシリカ質膜の相対エッチングレートを下記の方法により算出した。相対エッチングレートは4.1であった。
形成されたシリカ質膜を、0.5%フッ化水素水溶液に浸漬し、単位浸漬時間当たりの膜厚変化を観察した。具体的には浸漬5分おきに膜厚を測り、エッチングが進むにつれて膜厚が薄くなっていく速度をnm/minのかたちで算出する。また、熱酸化膜でも同様の操作を行い、エッチングレートを算出し、求めたエッチングレートから、[シリカ膜のエッチングレート:単位はnm/min]/[熱酸化膜のエッチングレート:単位はnm/min]の比を求め、これを相対エッチングレートとした。この値は比率を表すので無次元数である。膜厚の測定には大塚電子(株)製、反射分光膜厚計:FE-3000を使用した。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、4%トリメチルアミン(N2希釈)雰囲気(実施例2)又は10%トリメチルアミン(N2希釈)雰囲気(実施例3)中で処理することを除き実施例1と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、各々4.6及び4.8であった。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、2%メチルアミン(N2希釈)雰囲気(実施例4)、2%モノメチルアミン(N2希釈)雰囲気(実施例5)、2%トリエチルアミン(N2希釈)雰囲気(実施例6)及び2%DBU(1,8-ジアザビシクロ[5,4,0]ウンデセン)(N2希釈)雰囲気(実施例7)中で処理することを除き実施例1と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、各々4.1、4.2、4.5及び4.8であった。なお、トリエチルアミン及びDBUは、予備加熱炉で気化させたガスを、N2キャリアガスを用いて炉に導入することにより行った。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、N2ガス雰囲気(比較例1)又は2%アンモニア(N2希釈)雰囲気(比較例2)中で処理することを除き実施例1と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、各々5.6及び6.1であった。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、40%水蒸気と60%N2ガスからなる雰囲気(比較例3)又は2%トリメチルアミン、40%水蒸気、58%N2ガスからなる雰囲気(比較例4)中で処理することを除き実施例1と同様の方法により、シリカ質膜を形成した。膜厚減少速度を測定し、得られたシリカ質膜の相対エッチングレートは、各々2.3及び2.4であった。
TEOS(オルトケイ酸テトラエチル)8.36g(0.04モル)、エタノール11.5g(0.25モル)、水4.32g(0.24モル)及び1モル/L HCl水溶液1gをプラスチック容器中、室温で1日攪拌し、その後この混合溶液をエタノールで4倍に希釈して、ゾルゲル法によるシリカ溶液を調製した。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、N2ガス雰囲気中で処理することを除き実施例8と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、11.5であった。
700℃まで昇温することに替えて、500℃まで昇温し、2%トリメチルアミン(N2希釈)雰囲気中での処理をこの温度で行うことを除き実施例1と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、6.4であった。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、N2ガス雰囲気中で処理することを除き実施例9と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、6.9であった。
トリエトキシシラン3.30g(0.02モル)、TEOS4.318g(0.02モル)、エタノール9.2g(0.2モル)、水3.6g(0.2モル)及び1モル/L HCl水溶液0.1gをプラスチック容器中、室温で1日攪拌し、その後この混合溶液をエタノールで4倍に希釈して、ゾルゲル法によるシリカ溶液を調製した。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、N2ガス雰囲気中で処理することを除き実施例10と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、10.8であった。
ペルヒドロポリシラザンのジブチルエーテル20%溶液(AZエレクトロニックマテリアルズマニュファクチャリング(株)製Spinfil 65001、「Spinfil」は登録商標)約1mLを4インチシリコンウェハー上に滴下し、スピンコーターにより1000rpm、20秒の回転塗布を行い、ホットプレート上にて大気中、150℃、3分のソフトベークを行った。膜厚は600nmであった。次いで、350℃、80%水蒸気(80%H2O/20%O2)にて60分処理を行い(焼成)、ペルヒドロポリシラザンをシリカ質膜に変化させた。その後、150℃までN2雰囲気のまま降温し、この温度にてN2雰囲気中で60分処理(アニール)した。得られたシリカ質膜の相対エッチングレートは8.5であった。
N2雰囲気、150℃でのアニール処理に替え、2%トリメチルアミン(N2希釈)雰囲気、150℃のアニール処理とすることを除き、比較例8と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、8.6であった。
ペルヒドロポリシラザンのジブチルエーテル20wt%溶液(AZエレクトロニックマテリアルズマニュファクチャリング(株)製Spinfil 65001、「Spinfil」は登録商標)約1mLを4インチシリコンウェハー上に滴下し、スピンコーターにより1,000rpm、20秒の回転塗布を行い、ホットプレート上にて大気中、150℃、3分のソフトベークを行った。膜厚は600nmであった。次いで、350℃、80%水蒸気(80%H2O/20%O2)にて60分処理を行い(焼成)、ペルヒドロポリシラザンをシリカ質膜に変化させた。その後、350℃、2%NF3(N2希釈)雰囲気中で60分処理した。この膜に対して引き続き、850℃、N2雰囲気でアニールを行ったところ、得られたシリカ質膜の相対エッチングレートは1.5であった。
2%トリメチルアミン(N2希釈)雰囲気中で処理することに替えて、2%Br2(N2希釈)雰囲気(実施例12)、又は2%F2(N2希釈)雰囲気(実施例13)中で処理することを除き実施例11と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、各々1.7及び1.4であった。
350℃、2%NF3(N2希釈)雰囲気中で処理することに替えて、N2雰囲気中で処理することを除き実施例11と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、2.6であった。
2%NF3(N2希釈)雰囲気中で処理することに替えて、2%CF4(N2希釈)雰囲気(比較例11)、又は2%HF(N2希釈)雰囲気(比較例12)中で処理することを除き実施例11と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、どちらも2.7であった。
700℃でのN2雰囲気中、60分の処理に替えて、850℃でのN2雰囲気中、60分の処理とすることを除き実施例1と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、1.6であった。
700℃でのN2雰囲気中、60分の処理に替えて、850℃でのN2雰囲気中、60分の処理とすることを除き比較例1と同様の方法により、シリカ質膜を形成した。得られたシリカ質膜の相対エッチングレートは、2.6であった。
Claims (8)
- (a)ポリシラザン溶液を基板に塗布した後酸化雰囲気で硬化(キュア)することにより、またはゾルゲル法によって形成されたシリカ溶液を基板に塗布することにより、基板上にシリカ質膜を形成する工程、および(b)該シリカ質膜を、塩基解離定数(pKb)が4.5以下の窒素含有化合物またはハロゲン原子の結合エネルギーが60kcal/mol以下のハロゲン含有化合物を含む不活性ガス雰囲気で加熱、アニールする工程、からなるシリカ質膜の形成方法。
- 請求項1に記載のシリカ質膜の形成方法において、前記塩基解離定数(pKb)が4.5以下の窒素含有化合物が、一般式(II):
R4R5R6N (II)
(式中、R4は、分岐していてもよいアルキル基、アルケニル基、シクロアルキル基、またはアリール基を表し、R5およびR6は、各々独立して水素原子、分岐していてもよいアルキル基、アルケニル基、シクロアルキル基、またはアリール基を表す。)
で表されるアミン、DBU(1,8-ジアザビシクロ[5,4,0]ウンデセン)、またはDBN(1,5-ジアザビシクロ〔4,3,0〕5-ノネン)であることを特徴とするシリカ質膜の形成方法。 - 請求項2に記載のシリカ質膜の形成方法において、アニールが乾燥雰囲気において400~1,200℃で行われることを特徴とするシリカ質膜の形成方法。
- 請求項1に記載のシリカ質膜の形成方法において、前記ハロゲン原子の結合エネルギーが60kcal/mol以下のハロゲン含有化合物が、Br2、F2、またはNF3であることを特徴とするシリカ質膜の形成方法。
- 請求項4に記載のシリカ質膜の形成方法において、アニールが乾燥雰囲気において200~500℃で行われることを特徴とするシリカ質膜の形成方法。
- 請求項1~5のいずれか1項に記載のシリカ質膜の形成方法において、前記ポリシラザンがペルヒドロポリシラザンであり、硬化が水蒸気雰囲気、200~500℃で行われることを特徴とするシリカ質膜の形成方法。
- 基板がトレンチ・アイソレーション構造形成用の溝付き基板であり、請求項1~6のいずれか1項記載のシリカ質膜の形成方法により前記溝を埋封する、トレンチ・アイソレーション構造の形成法。
- 請求項1~6のいずれか1項に記載の方法により形成されたシリカ質膜。
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KR1020187038158A KR102119371B1 (ko) | 2012-11-22 | 2013-11-15 | 실리카질막의 형성 방법 및 동 방법으로 형성된 실리카질막 |
SG11201503113VA SG11201503113VA (en) | 2012-11-22 | 2013-11-15 | Method for forming of siliceous film and siliceous film formed using same |
EP13856697.1A EP2924717A4 (en) | 2012-11-22 | 2013-11-15 | METHOD FOR FORMING A SILICONE FILM AND FILM MOLDED IN THIS METHOD |
CN201380060803.XA CN104885204B (zh) | 2012-11-22 | 2013-11-15 | 二氧化硅质膜的形成方法以及通过该方法形成的二氧化硅质膜 |
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US20150298980A1 (en) | 2015-10-22 |
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KR20150088815A (ko) | 2015-08-03 |
TWI600614B (zh) | 2017-10-01 |
CN104885204A (zh) | 2015-09-02 |
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