WO2012128356A1 - 鉛フリーはんだ合金 - Google Patents
鉛フリーはんだ合金 Download PDFInfo
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- WO2012128356A1 WO2012128356A1 PCT/JP2012/057540 JP2012057540W WO2012128356A1 WO 2012128356 A1 WO2012128356 A1 WO 2012128356A1 JP 2012057540 W JP2012057540 W JP 2012057540W WO 2012128356 A1 WO2012128356 A1 WO 2012128356A1
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- Prior art keywords
- solder
- mass
- lead
- solder alloy
- amount
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0227—Rods, wires
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
- B23K35/025—Pastes, creams, slurries
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/36—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest
- B23K35/3612—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest with organic compounds as principal constituents
- B23K35/3618—Carboxylic acids or salts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/36—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest
- B23K35/362—Selection of compositions of fluxes
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
- C22C13/02—Alloys based on tin with antimony or bismuth as the next major constituent
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00013—Fully indexed content
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12222—Shaped configuration for melting [e.g., package, etc.]
Definitions
- the present invention relates to a lead-free solder alloy suitable for a solder alloy containing no lead, particularly a solder paste used for a surface mounting board or a grease-containing solder for correction.
- solder paste consisting of solder powder and flux is applied only to the necessary parts of the printed circuit board by the printing method or the discharge method, and electronic components are mounted on the application part, and then the solder paste is heated by a heating device such as a reflow furnace.
- a heating device such as a reflow furnace.
- the electronic component is soldered to the printed circuit board.
- This reflow method is not only capable of soldering a large number of locations in a single operation, but also does not generate bridges even when soldering electronic components with a narrow pitch, and the solder does not adhere to unnecessary locations. It can perform soldering with excellent reliability.
- Pb—Sn alloy has been used for the solder.
- This Pb-Sn alloy has an eutectic composition (Pb-63Sn) with a melting point of 183 ° C, has little thermal effect on heat-sensitive electronic components, and has excellent solderability. It has the feature that there are few occurrences of soldering defects such as dewetting.
- lead-free solder not containing Pb has been strongly demanded by the electronic equipment industry due to the problem of toxicity of Pb.
- the lead-free solder that is widely used at present is an Sn-Ag-Cu composition containing 3 to 5% by mass of Ag and 0.5 to 3% by mass of Cu as disclosed in JP-A-5-050286.
- Lead-free solder This lead-free solder is popular because it is superior in temperature cycle characteristics and creep characteristics as compared to conventional Sn-Pb solder. In particular, the temperature cycle characteristic is an important factor in evaluating the lifetime of electronic equipment and guaranteeing products.
- solder paste, solder balls, solder preforms, and the like are used for the substrate to be soldered by reflow soldering.
- fat-containing solder is used for correcting the soldering portion. The problem of interfacial delamination is particularly likely to occur on printed circuit boards using these solder materials.
- solder alloy resistant to drop impact used for soldering Cu land has a solder Ag content of 0.8 to 2.0 mass% and a Cu content of 0.05 to 0.3 mass.
- solder alloy (WO2006 / 129713A1) to which In, Ni, Pt, Sb, Bi, Fe, Al, and P are added.
- an alloy structure comprising a Sn—Ag—Cu based solder alloy containing a solid solution element and a supersaturated solid solution or a solid solution in which a solid solution element is precipitated at room temperature.
- Sn-Ag-Cu-Bi based lead-free solder consisting of an alloy with an alloy structure consisting of a solid solution in which a solid solution element precipitated at low temperature is re-dissolved in the Sn matrix at high temperatures in a heat cycle environment WO2009 / 011341A1) is disclosed.
- Bi or Sb is added to the Sn-Ag-Cu solder composition to form a solid solution with Bi, Sb and Sn, and Ag or Cu forms an intermetallic compound with Sn, and the solid solution or metal
- a solder alloy Japanese Patent Laid-Open No. 9-327790
- Lead-free solder does not have strong drop impact resistance, especially drop impact resistance of soldered parts with a small soldering area.
- Recent electronic devices have become more sophisticated and smaller in size, and electronic components incorporated in them have become smaller and more functional.
- the number of electrodes in electronic devices has increased. On the contrary, the size of is smaller.
- the soldering parts formed on the electrodes of electronic parts that have become smaller in this way are also small, but if the solder of the small lead-free soldering parts is weak in drop impact resistance, the electronic device will cause an impact like dropping. When it is received, the soldering part is easily peeled off, and the function as an electronic device cannot be performed.
- the temperature cycle characteristics of electronic devices are important factors related to the lifespan of electronic devices, and mobile phones and mobile PCs are not always used in air-conditioned rooms. It is not uncommon to use it in a high-temperature environment or a low-temperature environment such as outdoors in snowy weather. Therefore, it is an essential condition that the temperature cycle characteristics are excellent, and the solder used for the portable device must also have excellent temperature cycle characteristics.
- soldering portion that joins the electronic device repeatedly expands and contracts, cracks in the solder portion, and finally the solder portion is destroyed. This is generally called thermal fatigue.
- a solder alloy used for a mobile phone or a mobile personal computer a solder alloy that does not generate thermal fatigue and has good temperature cycle characteristics is required.
- solder having excellent drop impact resistance is excellent in temperature cycle characteristics at the same time.
- a conventional solder alloy considering drop impact resistance such as Patent Document 1 reduces the Ag and Cu contents of Sn-Ag-Cu solder and is generated at the interface between the electrode and the soldered portion. By suppressing the increase in the thickness of intermetallic compounds such as Cu6Sn5 and Ag3Sn, it is possible to prevent delamination from the interface between the electrode and the soldered part and to ensure the drop impact resistance.
- the amount of Ag or Cu in the conventional Sn-Ag-Cu solder alloy is reduced, the drop impact resistance is improved, but the temperature cycle characteristics that are the superiority of the Sn-Ag-Cu solder alloy are deteriorated. The problem of end up occurs. Thus, until now, no solder alloy having both temperature cycle characteristics and drop impact resistance characteristics has been developed.
- the problem to be solved by the present invention is to provide a solder alloy having excellent drop impact resistance while maintaining the temperature cycle characteristics that are characteristic of the Sn—Ag—Cu based solder alloy.
- the present inventors show that the temperature cycle characteristics deteriorate when Cu is away from the vicinity of the eutectic, and that Ag is also away from the vicinity of the eutectic.
- the present inventors have found that the temperature cycle characteristics are less deteriorated than Cu and that the temperature cycle characteristics are improved by adding In to Bi and Sb instead of reducing the amount of Ag, and the present invention has been completed.
- the present invention contains 0.2 to 1.2% by mass of Ag, 0.6 to 0.9% by mass of Cu, 1.2 to 3.0% by mass of Bi, 0.02 to 1.0% of Sb, 0.01 to 2.0% by mass of In, and the balance is Sn.
- This is a lead-free solder alloy.
- the temperature cycle characteristic is excellent when the solder structure is fine.
- the amount of Ag of the solder alloy used in the examples is 3.0 mass% or 3.4 mass%
- the amount of Ag is a technique of a solder alloy near the eutectic
- the amount of Ag is set to 0.2 to 1.2% by mass in order to give the drop impact resistance, and the temperature cycle characteristic cannot be said to be good in the solder alloy composition composed of Sn, Ag, Cu, Bi, and Sb. It was.
- the conventional Sn—Ag—Cu can be obtained even if the amount of Ag is reduced to 0.2 to 1.2 mass%. Similar to the -Bi-Sb composition, it not only has low thermal fatigue, but it is unexpectedly a solder alloy with good temperature cycle characteristics.
- the In added to the solder alloy of the present invention is a metal that forms a solid solution with Sn in the same manner as Bi and Sb. Since the In added to the solder alloy of the present invention has a smaller atomic weight than Bi and Sb, which form a solid solution with the same Sn, it penetrates between Bi and Sb and is a solid solution strengthened type with better temperature cycle characteristics. It is possible to form a solder alloy. In particular, if the content of Bi, which has the largest atomic weight among Bi, Sb, and In, is more than twice as much as In% of In, that is, more than about 4 times more than in% by mass, the gap between Bi atoms When In enters, the temperature cycle resistance becomes better. More preferably, the Bi content is at least three times as atomic percent as In.
- solder paste is very reactive like Zn and so on, and when used in solder paste, the solder paste is likely to cause a change in viscosity over time and is difficult to handle.
- solder alloy of the present invention it is possible to obtain a portable device having excellent drop impact resistance that does not break the soldered portion even if a portable device having a fine soldering pattern falls.
- thermal fatigue does not occur even in a high temperature environment such as in a car under hot weather, or in a low temperature environment such as outdoors in snowy weather, and it has excellent temperature cycle characteristics.
- Portable device can be obtained.
- solder alloy of the present invention contains In, even if the solder alloy of the present invention is made into a powder and solder paste, there is little change in viscosity with time, and an excellent solder paste can be obtained.
- the addition amount of Ag is set to 1.2% by mass or less.
- the addition amount of Ag in the solder alloy of the present invention is 0.2 to 1.2% by mass, and the more preferable addition amount of Ag in the solder alloy of the present invention is 0.5 to 1.0% by mass.
- the amount of Sn-Cu intermetallic compound in the solder alloy is small, and the effect of miniaturizing the solder structure does not appear and the temperature cycle resistance is improved. The effect of does not appear.
- the added amount of Cu is more than 0.9 mass%, the intermetallic compound layer of Cu6Sn5 becomes the primary crystal at the time of solder solidification and the meltability is hindered. Therefore, the amount of Cu added in the solder alloy of the present invention is 0.6 to 09% by mass, more preferably 0.7 to 0.8% by mass.
- the Bi content of the present invention is less than 1.2% by mass, the amount of Bi dissolved in Sn in the solder alloy is small, so there is no effect in improving the temperature cycle characteristics.
- the amount of Bi added is 3.0% by mass or less.
- the addition amount of Bi in the solder alloy of the present invention is 1.2 to 3.0% by mass, and the addition amount of Bi in the solder alloy of the present invention is more preferably 1.5 to 2.0% by mass. More preferably, the lower limit of Bi is 1.6% by mass.
- the Sb content of the present invention is less than 0.02% by mass, the solid solution amount of Sb in Sn in the solder alloy is small, so there is no effect in improving temperature cycle characteristics, and the Sb content is 1.0.
- the amount is more than mass%, an AgSb intermetallic compound is formed in the solder, and the drop impact resistance is deteriorated.
- the Sb content is more than 1.0% by mass, the wettability of the solder deteriorates and the voids increase. Therefore, the amount of Sb added is 1.0% by mass or less.
- the amount of Sb added in the solder alloy of the present invention is 0.02 to 1.0 mass%, and the amount of Sb added in the preferred solder alloy of the present invention is 0.15 to 0.5 mass%.
- Addition of In in solder alloy is effective for improving temperature cycle characteristics.
- In is a metal that is easily oxidized, its solder alloy is easily oxidized. Since the oxidation of In causes yellowing of the solder alloy or voids in the soldered joint, the amount of In added needs to be limited.
- solder solder containing In is powdered and mixed with flux to form a solder paste, In and the flux react, so the viscosity of the solder paste tends to change over time.
- the In content of the present invention is less than 0.01% by mass, the amount of solid solution of Sn and In in the solder alloy is small, so there is no effect in improving temperature cycle characteristics, and if the In content is more than 2.0% by mass This is not preferable because a yellow change occurs on the surface of the solder bump after reflow and the void generation rate increases.
- the amount of In added in the solder alloy of the present invention is 0.1 to 2.0% by mass, and more preferably the amount of In added in the solder alloy of the present invention is 0.2 to 0.5% by mass.
- solder alloy solder paste containing In is prone to change in viscosity over time because In is a highly reactive metal.
- the solder alloy of the present invention prevents the solder paste from changing over time by limiting the amount of In. However, by using a flux dedicated to In, the reaction between the flux and the In-containing solder powder can be prevented.
- the flux of the present invention is rosin, a solvent, a thixotropic agent, a flux containing an organic acid as an activator and an auxiliary activator, and the organic acid used as the auxiliary activator is reactive with In of succinic acid, adipic acid and azelaic acid.
- a small amount of organic acid is selected and used, and the flux does not react with the solder powder to cause a change in viscosity over time.
- Auxiliary activator is added to enhance wettability when the amount of halide of the main activator is limited to enhance corrosion reliability. It is added as an activator that does not contain halogen components. Has been.
- succinic acid, adipic acid and azelaic acid used in the flux of the present invention are less than 0.5% by mass in total, the effect as an auxiliary activator does not appear, the wettability is poor, and there are many problems such as solder ball generation. Further, when added in an amount of 5% by mass or more, even an organic acid having low reactivity with In of the succinic acid, adipic acid, and azelaic acid of the present invention reacts with In and changes with time. Therefore, the total amount of succinic acid, adipic acid and azelaic acid added to the present invention is 0.5% by mass or more and less than 5.0% by mass.
- solder alloy according to the present invention can be used not only as a solder paste as described above, but also as a solder ball, a solder containing fat, or in the form of a preform solder.
- Example 1 and Comparative Example of Table 1 Solder powders of the solder composition (mass%) and fluxes of Example 13 of Table 2 are mixed to produce a solder paste, and the resistance of a 3216 size Sn plating electrode is printed. A temperature cycle test was conducted when the substrate was mounted. Furthermore, a CSP mounted with a 0.3 mm diameter ball was similarly mounted, and a drop impact test was conducted.
- Table 1 shows the results of the temperature cycle test and the drop impact test.
- Comparative Example 2 is the solder alloy composition of Patent Document 1
- Comparative Examples 3 and 4 are the solder alloy composition of Patent Document 2
- Comparative Example 5 is the solder alloy composition of Patent Document 3.
- Drop impact test A shock is applied between the CSP on which the solder bump is formed and the printed circuit board, and the number of drops until the crack occurs in the soldered part is measured.
- the substrate used was left at room temperature for 5 days after soldering.
- Judgment on crack growth is recorded as the number of drops at the point where the electrical resistance value increased by 50% from the initial value.
- the drop impact test process is performed as follows. 1.) A flux is printed on a CSP of electrolytic Ni / Au plating having a 12 ⁇ 12 (mm) outer shape and 196 electrode bumps, and a 0.3 mm diameter solder ball having the composition shown in Table 1 is placed thereon.
- Temperature cycle test This is a test method stipulated in JIS C0025, in which the soldered portion is examined for the influence exerted by repeated temperature changes at high and low temperatures, and is used as an index for the lifetime of electronic equipment.
- the temperature cycle test process is performed as follows. 1.) Mount an Sn plating resistance of outline 3.2 x 1.6 (mm) on a glass epoxy printed circuit board coated with solder paste, and heat and solder in a reflow oven.
- soldered printed circuit board into a two-tank automatic test equipment at -40 ° C for the low temperature condition and + 85 ° C for the high temperature condition for 30 minutes each, initial, 800th cycle, 1200th cycle, The printed circuit board was taken out at the 1600th cycle and 2000th cycle, and 150 points of the shear strength test of the soldered portion were performed to confirm the transition of the strength.
- the lead-free solder alloy of the present invention is superior to the lead-free solder of the comparative example in the drop impact test at each stage, and the temperature cycle characteristics are also in a long temperature cycle. No significant strength deterioration occurs.
- solder powder was prepared with the solder composition of Example 4 in Table 1, and mixed with the flux having the flux composition (mass%) shown in Table 2, to prepare a solder paste, and a solder ball test and solder Changes in the viscosity of the paste over time were confirmed.
- the solder ball test was in accordance with JIS Z3284 Annex 11.
- categories 1 and 2 were marked with ⁇ , category 3 with ⁇ , and category 4 with x.
- the change with time in the viscosity of the solder paste was measured according to JIS Z3284 Annex 6 using a Malcolm viscometer PCU-205 at a measurement temperature of 25 ° C. and a rotation speed of 10 RPM for 10 hours.
- the viscosity was evaluated as x, the viscosity increase was 10% or more and less than 20%, and the viscosity increase was less than 10%.
- Table 2 shows the results of the solder ball test and the solder paste viscosity change test.
- the present invention can obtain a solder paste having a stable viscosity despite containing In, which tends to change with time.
- the purpose of the present invention is to improve the impact resistance at the minute soldering part, and as a suitable application for this purpose, even if it is used for general soldering including solder bumps, the drop impact resistance To be effective.
- solder bump formation it is often used as solder balls or solder paste, but these micro soldered parts are also used with greased solder for correction. Appears to appear.
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Abstract
Description
リフロー法は、はんだ粉とフラックスからなるソルダペーストをプリント基板の必要箇所だけに印刷法や吐出法で塗布し、該塗布部に電子部品を搭載してからリフロー炉のような加熱装置でソルダペーストを溶融させて電子部品をプリント基板にはんだ付けする方法である。このリフロー法は、一度の作業で多数箇所のはんだ付けができるばかりでなく、狭いピッチの電子部品をはんだ付けしてもブリッジの発生がなく、しかも不要箇所にははんだが付着しないという生産性と信頼性に優れたはんだ付けが行えるものである。
現在多く使用されている鉛フリーはんだは、特開平5-050286号公報に開示されているようなAgを3~5質量%、Cuを0.5~3質量%含有したSn-Ag-Cu組成の鉛フリーはんだである。この鉛フリーはんだは、従来のSn-Pbはんだよりも温度サイクル特性に優れ、またクリープ特性に優れているので普及している。特に温度サイクル特性は、電子機器の寿命を評価したり、製品保証をする上で、重要な要素である。
より好ましくは、Biの含有量がInより原子%で3倍以上のときである。
また、Sbの含有量が1.0質量%より多いとはんだのぬれ性が悪くなり、ボイドが増加する。そのために、Sbの添加量は1.0質量%以下とする。本発明のはんだ合金におけるSbの添加量は0.02~1.0質量%であり、好ましい本発明のはんだ合金におけるSbの添加量は0.15~0.5質量%である。
ここで、比較例2は特許文献1のはんだ合金組成であり、比較例3、4は特許文献2のはんだ合金組成、比較例5は特許文献3のはんだ合金組成である。
1.はんだバンプを形成したCSPとプリント基板間に、落下による衝撃を加え、はんだ付け部に亀裂が発生するまでの落下回数を測定する。基板は、はんだ付け後に室温で5日間放置したものを用いた。亀裂進展についての判断は、電気抵抗値が、初期値から50%上昇した点を落下回数として記録する。
1.)外形12×12(mm)、電極196個のバンプを有する電解Ni/AuめっきのCSPに、フラックスを印刷し、表1の組成をもった直径0.3mmのはんだボールを載置する。
3.)はんだバンプが形成されたCSPを30×120(mm)のソルダペーストが塗布されたガラスエポキシプリント基板中央に搭載し、リフロー炉で加熱してCSPをプリント基板にはんだ付けする。
5.)落下治具に加速度1500Gが負荷する高さから落下させてプリント基板に衝撃を与える。このとき両端を治具に固定されたプリント基板は、中央部が振動し、プリント基板とCSPのはんだ付け部は、この振動による衝撃を受ける。この落下試験でCSPのはんだ付け部にき裂が生じるまでの落下回数を測定する。試験記録は、6点試験を行い、最低値を記録する。
1.JIS C0025に規定された試験方法であり、はんだ付け部が高温、低温の温度変化の繰り返しによって、与えられる影響について調べるもので、電子機器の寿命の指数として、用いられている。
1.)外形3.2×1.6(mm)のSnめっき抵抗をソルダペーストが塗布されたガラスエポキシプリント基板に搭載し、リフロー炉で加熱してはんだ付けする。
次に、表1の実施例4のはんだ組成ではんだ粉末を作製し、表2のフラックス組成(質量%)のフラックスと混和して、ソルダペーストを作製し、はんだボール試験とソルダペーストの粘度経時変化を確認した。
Claims (6)
- Agが0.2~1.2質量%、Cuが0.6~0.9質量%、Biが1.2~3.0質量%、Sbが0.02~1.0質量%、Inを0.01~2.0質量%含有し、残部Snで構成されることを特徴とする鉛フリーはんだ合金。
- Agが0.2~1.0質量%、Cuが0.6~0.9質量%、Biが1.2~2.0質量%、Sbが0.1~0.5質量%、Inを0.01~0.3質量%含有し、残部Snで構成されることを特徴とする請求項1に記載の鉛フリーはんだ合金。
- 請求項1に記載の鉛フリーはんだ合金のはんだ粉末とフラックスを混和した鉛フリーソルダペーストにおいて、該フラックスに用いられる有機酸としてコハク酸、アジピン酸、アゼライン酸から選択された1種以上の有機酸を合計で0.5質量%以上、5質量%未満を用いた鉛フリーソルダペースト。
- 請求項1に記載の鉛フリーはんだ合金からなるはんだ線の中心部にフラックスを充填した脂入りはんだにおいて、該フラックスに用いられる有機酸としてコハク酸、アジピン酸、アゼライン酸から選択された1種以上の有機酸を用いた鉛フリー脂入りはんだ。
- 請求項1に記載の鉛フリーはんだ合金からなるはんだボール。
- 請求項1に記載の鉛フリーはんだ合金からなるソルダプリフォーム。
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ES12761518.5T ES2624621T3 (es) | 2011-03-23 | 2012-03-23 | Aleación de soldadura libre de plomo |
DK12761518.5T DK2689885T3 (en) | 2011-03-23 | 2012-03-23 | STAINLESS STEEL METAL ALLOY |
JP2013506040A JP5660199B2 (ja) | 2011-03-23 | 2012-03-23 | 鉛フリーはんだ合金 |
BR112013024398-8A BR112013024398B1 (pt) | 2011-03-23 | 2012-03-23 | liga de solda, pasta de solda, solda com núcleo de fluxo, esfera de solda e pré-forma sem chumbo |
CN201280024986.5A CN103561903B (zh) | 2011-03-23 | 2012-03-23 | 无铅焊料合金 |
US14/006,538 US9844837B2 (en) | 2011-03-23 | 2012-03-23 | Lead-free solder alloy |
EP12761518.5A EP2689885B1 (en) | 2011-03-23 | 2012-03-23 | Lead-free solder alloy |
TW102109284A TWI603803B (zh) | 2012-03-23 | 2013-03-15 | Lead-free solder alloy |
TW105133059A TW201706068A (zh) | 2011-03-23 | 2013-03-15 | 無鉛銲錫合金 |
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EP (1) | EP2689885B1 (ja) |
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BR (1) | BR112013024398B1 (ja) |
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ES (1) | ES2624621T3 (ja) |
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Also Published As
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ES2624621T3 (es) | 2017-07-17 |
CN103561903A (zh) | 2014-02-05 |
JPWO2012128356A1 (ja) | 2014-07-24 |
US20140141273A1 (en) | 2014-05-22 |
MY162706A (en) | 2017-07-14 |
WO2012127642A1 (ja) | 2012-09-27 |
JP5660199B2 (ja) | 2015-01-28 |
EP2689885A1 (en) | 2014-01-29 |
US9844837B2 (en) | 2017-12-19 |
BR112013024398B1 (pt) | 2018-11-06 |
KR20140044801A (ko) | 2014-04-15 |
EP2689885B1 (en) | 2017-02-22 |
HUE033232T2 (hu) | 2017-11-28 |
EP2689885A4 (en) | 2015-04-01 |
TW201706068A (zh) | 2017-02-16 |
BR112013024398A2 (pt) | 2016-12-13 |
CN103561903B (zh) | 2017-03-22 |
KR101551050B1 (ko) | 2015-09-07 |
DK2689885T3 (en) | 2017-05-01 |
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