TWI497089B - Semiconductor device inspection apparatus - Google Patents

Semiconductor device inspection apparatus Download PDF

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Publication number
TWI497089B
TWI497089B TW102107310A TW102107310A TWI497089B TW I497089 B TWI497089 B TW I497089B TW 102107310 A TW102107310 A TW 102107310A TW 102107310 A TW102107310 A TW 102107310A TW I497089 B TWI497089 B TW I497089B
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test
component
loading
unit
pick
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TW102107310A
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Chinese (zh)
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TW201341823A (en
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Hong-Jun Yoo
Yong-Jin Seo
Min Seong Kim
Tae Sik Yoo
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Jt Corp
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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F01MACHINES OR ENGINES IN GENERAL; ENGINE PLANTS IN GENERAL; STEAM ENGINES
    • F01DNON-POSITIVE DISPLACEMENT MACHINES OR ENGINES, e.g. STEAM TURBINES
    • F01D17/00Regulating or controlling by varying flow
    • F01D17/10Final actuators
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F01MACHINES OR ENGINES IN GENERAL; ENGINE PLANTS IN GENERAL; STEAM ENGINES
    • F01DNON-POSITIVE DISPLACEMENT MACHINES OR ENGINES, e.g. STEAM TURBINES
    • F01D25/00Component parts, details, or accessories, not provided for in, or of interest apart from, other groups
    • F01D25/24Casings; Casing parts, e.g. diaphragms, casing fastenings
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F02COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
    • F02CGAS-TURBINE PLANTS; AIR INTAKES FOR JET-PROPULSION PLANTS; CONTROLLING FUEL SUPPLY IN AIR-BREATHING JET-PROPULSION PLANTS
    • F02C7/00Features, components parts, details or accessories, not provided for in, or of interest apart form groups F02C1/00 - F02C6/00; Air intakes for jet-propulsion plants
    • F02C7/20Mounting or supporting of plant; Accommodating heat expansion or creep
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F05INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF CLASSES F01-F04
    • F05DINDEXING SCHEME FOR ASPECTS RELATING TO NON-POSITIVE-DISPLACEMENT MACHINES OR ENGINES, GAS-TURBINES OR JET-PROPULSION PLANTS
    • F05D2220/00Application
    • F05D2220/30Application in turbines
    • F05D2220/31Application in turbines in steam turbines

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

元件檢測裝置Component detecting device

本發明涉及元件檢測裝置,更詳細地說是涉及檢測對元件的電氣特性的元件檢測裝置。The present invention relates to a component detecting device, and more particularly to a component detecting device that detects electrical characteristics of an element.

半導體元件(以下,稱之為“元件”)在完成封裝工序後,會通過半導體元件檢測裝置來進行電氣特性、對於熱或壓力的可靠性等多種檢測。After completing the packaging process, the semiconductor element (hereinafter referred to as "element") performs various kinds of detections such as electrical characteristics, reliability against heat or pressure, and the like by the semiconductor element detecting device.

對於元件的檢測,會根據記憶元件;以及如CPU(Central Processing Unit)、GPU(Graphic Processing Unit)等非記憶元件;LED元件:光電元件等種類的元件來進行在室溫環境下的檢測、在高溫環境下進行加熱檢測等多種檢測。For the detection of components, the detection is performed at room temperature according to the memory component and the non-memory components such as CPU (Central Processing Unit) and GPU (Graphic Processing Unit); LED components: photoelectric components. Various tests such as heating detection in a high temperature environment.

另一方面,隨著智慧手機、智慧平板電腦、智慧TV等IT元件的種類變得多種多樣且大眾化,如CPU等的非記憶元件,即,LSI(Large Scale Integration,大型積體電路)的需求正在劇增。On the other hand, the types of IT components such as smart phones, smart tablets, and smart TVs are becoming more diverse and popular, such as non-memory components such as CPUs, that is, LSI (Large Scale Integration). Is increasing dramatically.

但是,LSI因為其小量多品種的特性,相比於標準化的記憶元件的檢測裝置,因為檢測數量小而存在著很難使用昂貴的檢測裝置的問題。However, LSI has a problem that it is difficult to use an expensive detecting device because the number of detections is small because of its small amount and variety of characteristics compared to a standardized detecting device for a memory element.

本發明是為了解決如上所述的以往技術問題而提出的,其目的在於提供元件檢測裝置,可以快速地對小量多品種的LSI元件執行檢測,並且可以檢測多種種類的LSI元件。The present invention has been made to solve the above-described problems of the prior art, and an object of the invention is to provide a component detecting device capable of quickly detecting a small number of LSI devices and detecting a plurality of types of LSI devices.

此外,本發明的另一目的在於提供元件檢測裝置,可以準確地執行用於選取元件來向測試插口加壓的元件加壓工具的水平方向及垂直方向移動。Further, another object of the present invention is to provide a component detecting device which can accurately perform horizontal and vertical movement of a component pressing tool for selecting an element to pressurize a test socket.

此外,本發明的又另一目的在於提供元件檢測裝置,其容易進行部件的維護,從而縮減維護費用來顯著地降低元件的生產成本。Further, still another object of the present invention is to provide a component detecting device which is easy to perform maintenance of components, thereby reducing maintenance costs to significantly reduce the production cost of components.

此外,本發明的又另一目的在於提供元件檢測裝置,可以準確地設定及確認用於選取元件以向測試插口加壓的元件加壓工具的加壓位置。Further, it is still another object of the present invention to provide a component detecting device which can accurately set and confirm a pressurizing position of a component pressurizing tool for picking up an element to pressurize the test socket.

為了達成如上所述目的,根據本發明實施例的元件檢測裝置,可以包括:載入部,載入裝載多個元件的一個以上的托盤;載入緩衝部,通過載入移送工具接收從所述載入部的托盤傳達的元件並進行臨時裝載;測試部,接收從所述載入緩衝部傳達的元件來執行測試;卸載緩衝部,以所述測試部為中心,設置於與所述載入緩衝部對向的位置,來接收通過所述測試部完成測試的元件;卸載部,根據所述測試部的測試結果,通過卸載移送工具對裝載於所述卸載緩衝部的元件進行分類裝載;一個以上的元件加壓工具,在所述載入部、所述測試部及所述卸載部之間用於移送元件。In order to achieve the above object, a component detecting apparatus according to an embodiment of the present invention may include: a loading unit that loads one or more trays that load a plurality of components; and a loading buffer that is received by the loading and transferring tool from the The component conveyed by the tray of the loading unit is temporarily loaded; the testing unit receives the component transmitted from the loading buffer to perform the test; the unloading buffer is centered on the testing section, and is loaded with the loading a position at which the buffer portion opposes to receive an element that is tested by the test portion; and an unloading portion that sorts and loads the components loaded in the unloading buffer portion by an unloading transfer tool according to a test result of the test portion; The above component press tool is used to transfer an element between the loading portion, the test portion, and the unloading portion.

此外,根據本發明實施例的元件檢測裝置,可以包括:載入部,載入裝載多個元件的一個以上的托盤;測試部,包括多個測試插口,用於接收從所述載入部傳達的元件來對各個元件進行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,所述移送工具包括多個選取器,分別在末端結合有吸附板,所述移送工具中至少有一個的移送工具包括吸附板替換部,自動替換分別結合在所述選取器上的所述吸附板。Furthermore, the component detecting apparatus according to an embodiment of the present invention may include: a loading section that loads one or more trays that load a plurality of components; and a testing section that includes a plurality of test sockets for receiving from the loading section The component is tested for each component; the unloading section performs the sorting loading of the component that completes the test according to the test result of the testing section; one or more transfer tools, the loading section, the testing section, and the Transferring components between the unloading portions, the transfer tool includes a plurality of pickers, respectively, respectively, an adsorption plate is coupled at the end, and at least one of the transfer tools includes a suction plate replacement portion, and automatic replacement is respectively combined in the selection The adsorption plate on the device.

此外,根據本發明實施例的元件檢測裝置,可以包括:載入部,載入裝載多個元件的一個以上的托盤;測試部,包括多個測試插口,用於接收從所述載入部傳達的元件來對各個元件進行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,還可以包括清潔部,設置於所述測試部的一側,用於通過移動在覆蓋所述測試插口的狀態下噴射空氣來去除所述測試插口中的異物。Furthermore, the component detecting apparatus according to an embodiment of the present invention may include: a loading section that loads one or more trays that load a plurality of components; and a testing section that includes a plurality of test sockets for receiving from the loading section The component is tested for each component; the unloading section performs the sorting loading of the component that completes the test according to the test result of the testing section; one or more transfer tools, the loading section, the testing section, and the The transfer member between the unloading portions may further include a cleaning portion disposed on one side of the test portion for removing foreign matter in the test socket by moving air in a state of covering the test socket.

此外,根據本發明的元件檢測裝置,可以包括:載入部,載入多個元件;測試部,具備用於對從所述載入部移送過來的元件執行測試 的多個測試插口;卸載部,根據測試結果來對在所述測試部完成測試的元件進行分類;一個以上的接送部,將從所述載入部傳達的元件移送至所述測試部側,並將從所述測試部傳達的元件移送至所述卸載部側,所述接送部,可以包括:接送板,用於搭載所述元件;板固定部,所述接送板可拆裝卸地結合於此;板裝卸部,設置於所述板固定部,以將所述接送板固定於所述板固定部。Furthermore, the component detecting device according to the present invention may include: a loading portion that loads a plurality of components; and a testing portion that is configured to perform a test on components transferred from the loading portion a plurality of test sockets; an unloading unit that classifies components that have been tested in the test portion according to test results; and one or more pick-up portions that transfer components transmitted from the loading portion to the test portion side, Transferring the component transmitted from the testing unit to the unloading portion side, the pick-up portion may include: a pick-up plate for carrying the component; a board fixing portion, the pick-up plate being detachably coupled Here, a board loading and unloading portion is provided at the board fixing portion to fix the shuttle board to the board fixing portion.

此外,根據本發明實施例的元件檢測裝置,可以包括:載入 部,載入裝載多個元件的一個以上的托盤;測試部,包括多個測試插口,用於接收從所述載入部傳達的元件來對各個元件進行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,所述移送工具包括一對元件加壓工具,將元件從所述載入部傳達到所述測試部或將元件從所述測試部傳達到所述卸載部,所述元件加壓工具可以包括:支持部,可移動地進行設置;一個以上的選取模組,可裝卸地結合於所述支持部,並結合有一個以上的選取器。Furthermore, the component detecting apparatus according to an embodiment of the present invention may include: loading Loading one or more trays loaded with a plurality of components; the test portion includes a plurality of test sockets for receiving components transmitted from the loading portion to test the respective components; and an unloading portion according to the testing portion As a result of the test, the components of the test are sorted and loaded; one or more transfer tools transfer the components between the loading portion, the test portion and the unloading portion, and the transfer tool includes a pair of components a tool for communicating an element from the loading portion to the test portion or communicating an element from the test portion to the unloading portion, the component pressing tool may include: a support portion movably disposed; The above selection module is detachably coupled to the support portion and combined with more than one selector.

根據本發明實施例的元件檢測裝置,可以包括:載入部,載 入多個元件;測試部,具備多個測試插口,用於對從所述載入部移送過來的元件執行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;元件加壓部,選取所述元件以向所述測試插口加壓,所述元件加壓部可以包括:一個以上的元件加壓工具,選取所述元件並通過線性移動將所述元件移動到加壓位置以向所述測試插口加壓;水平移動裝置,與所述元件加壓工具連接以將所述元件加壓工具移動至所述測試插口;第一垂直移動裝置,根據凸輪部件,將所述元件加壓工具垂直移動至加壓位置。A component detecting apparatus according to an embodiment of the present invention may include: a loading section, a plurality of components; a test portion having a plurality of test sockets for performing tests on components transferred from the loading portion; and an unloading portion for classifying loading of components for testing according to test results of the testing portion a component pressurizing portion that is selected to pressurize the test socket, the component pressurizing portion may include: one or more component pressurizing tools, the component is selected and moved to a linear movement to the component Pressurizing a position to pressurize the test socket; a horizontal moving device coupled to the component press tool to move the component press tool to the test socket; the first vertical moving device, according to the cam member, The component press tool is moved vertically to the pressurized position.

此外,根據本發明實施例的元件檢測裝置,可以包括:載入 部,載入多個元件;測試部,具備多個測試插口,用於對從所述載入部移送過來的元件執行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的接送部,將從所述載入部傳達的元件移送至所述測試部側,並將從所述測試部傳達的元件移送至所述卸載部側;一個以上的載入移送工具,在所述載入部中選取元件以傳達至所述接送部;一個以上的卸載移送工具,在所述接送部中選取元件以傳達至所述 卸載部;一個以上的元件加壓工具,在所述接送部中選取元件以向所述測試插口加壓,並將通過向所述測試插口加壓而完成測試的元件傳達至所述接送部,所述元件加壓工具包括:支持部,可移動地進行設置;一個以上的選取模組,可裝卸地結合於所述支持部,並結合有一個以上的選取器,所述支持部及所述選取模組的一側可以具備有緊固所述支持部及所述選取模組的緊固單元,所述支持部及所述選取模組的另一側,在所述支持部上可以具備有支持所述選取模組的支持單元。Furthermore, the component detecting apparatus according to an embodiment of the present invention may include: loading Loading a plurality of components; a test portion having a plurality of test sockets for performing tests on components transferred from the loading portion; and an unloading portion for performing components to be tested according to test results of the test portion Performing sorting loading; one or more pick-up units transferring the elements transmitted from the loading unit to the test unit side, and transferring the elements transmitted from the test unit to the unloading unit side; one or more loads Into the transfer tool, selecting components in the loading portion to communicate to the pick-up portion; one or more unloading transfer tools, selecting components in the pick-up portion to communicate to the An unloading portion; one or more component pressing tools, wherein an element is selected in the pick-up portion to pressurize the test socket, and an element that is tested by pressurizing the test socket is transmitted to the pick-up portion, The component pressurizing tool includes: a support portion movably disposed; one or more selection modules detachably coupled to the support portion, combined with more than one picker, the support portion and the One side of the selection module may be provided with a fastening unit for fastening the support portion and the selection module, and the support portion and the other side of the selection module may be provided on the support portion. Supporting the support unit of the selection module.

此外,根據本發明實施例的元件檢測裝置,可以包括:載入 部,載入多個元件;測試部,具備多個測試插口,用於對從所述載入部移送過來的元件執行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的元件加壓工具,具備選取所述元件的選取器,選取所述元件以向所述測試插口加壓,所述元件加壓工具可以具備加熱部,根據所述選取器對選取的所述元件進行加熱。Furthermore, the component detecting apparatus according to an embodiment of the present invention may include: loading Loading a plurality of components; a test portion having a plurality of test sockets for performing tests on components transferred from the loading portion; and an unloading portion for performing components to be tested according to test results of the test portion Performing sorting loading; one or more component pressing tools having a picker for selecting the components, and selecting the components to pressurize the test socket, the component pressing tool may be provided with a heating portion according to the picker The selected elements are heated.

此外,根據本發明實施例的元件檢測裝置,可以包括:載入 部,載入多個元件;測試部,具備多個測試插口,用於對從所述載入部移送過來的元件執行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;元件加壓部,包括一個以上的元件加壓工具及第一垂直移動裝置,所述元件加壓工具選取所述元件並通過線性移動將所述元件移動到加壓位置以向所述測試插口加壓,所述第一垂直移動裝置通過凸輪部件將所述元件加壓工具線性移動到加壓位置;第二垂直移動裝置,使所述元件加壓部對於所述測試部進行線性移動;控制部,通過所述第二垂直移動裝置以使所述元件加壓工具與所述測試部接觸時,檢測通過所述第二垂直移動裝置向所述測試部施加的負載,並將檢測到的負載達到已設定的基準負載時的所述元件加壓工具的位置決定為加壓位置。Furthermore, the component detecting apparatus according to an embodiment of the present invention may include: loading Loading a plurality of components; a test portion having a plurality of test sockets for performing tests on components transferred from the loading portion; and an unloading portion for performing components to be tested according to test results of the test portion Performing sorting loading; the component pressing portion includes one or more component pressing tools and a first vertical moving device, the component pressing tool picking the components and moving the components to a pressing position by linear movement to Pressurizing the test socket, the first vertical moving device linearly moves the component pressing tool to a pressing position by a cam member; and the second vertical moving device causes the component pressing portion to linearize the testing portion Moving the control unit to detect a load applied to the test portion by the second vertical moving device by the second vertical moving device to bring the component pressing tool into contact with the test portion, and to detect The position of the component pressing tool when the load reached reaches the set reference load is determined as the pressing position.

根據本發明實施例的元件檢測裝置,具有可以快速對少量多品種的LSI元件執行檢測,並可以對多種種類的LSI元件進行檢測的優點。The component detecting device according to the embodiment of the present invention has an advantage that the detection of a small number of LSI components can be performed quickly, and various types of LSI components can be detected.

此外,根據本發明實施例的元件檢測裝置,用於沿垂直方向移動,選取元件以向測試插口加壓的元件加壓工具的第一垂直移動裝置包括了凸輪部件,通過凸輪部件的旋轉以使元件加壓工具沿垂直方向移動,從而具有可以準確地設定元件加壓工具的垂直方向上的移動位置的優點。Further, the component detecting device according to the embodiment of the present invention, for moving in the vertical direction, the first vertical moving means for picking up the component to press the component pressurizing the test socket includes a cam member through rotation of the cam member The component pressing tool is moved in the vertical direction, thereby having an advantage that the moving position of the component pressing tool in the vertical direction can be accurately set.

此外,根據本發明實施例的元件檢測裝置,其容易進行裝置的維護,從而具有通過縮減裝置的維護費用來顯著地降低元件的生產成本的優點。Further, the component detecting device according to the embodiment of the present invention is easy to perform maintenance of the device, thereby having an advantage of significantly reducing the production cost of the component by reducing the maintenance cost of the device.

此外,根據本發明實施例的元件檢測裝置,選取元件以向測試插口加壓的元件加壓工具,通常具備可移動地進行設置的支持部與可裝卸地結合於所述支持部並結合有一個以上的選取器的一個以上的選取模組,從而具有元件加壓工具容易維護的優點。Further, according to the component detecting apparatus of the embodiment of the present invention, the component is selected to pressurize the component to press the test socket, and the support portion which is movably provided is detachably coupled to the support portion and combined with More than one selection module of the above selectors has the advantage that the component pressing tool is easy to maintain.

此外,根據本發明實施例的元件檢測裝置,通過設置加熱器及用於對所述溫度感測器進行電源供給及信號傳達的一個以上的第一連接器,從而在構成元件加壓工具的支持部及選取模組結合時,自動與設置於支持部的第二連接器連接,由此具有無需用於電源供給及信號傳達的另外連接工序,以使裝置的製造機維護變得容易的優點。Further, the component detecting device according to the embodiment of the present invention supports the component pressing tool by providing a heater and one or more first connectors for supplying power and signal to the temperature sensor. When the unit and the selection module are combined, they are automatically connected to the second connector provided in the support portion, thereby having an advantage that an additional connection process for power supply and signal transmission is not required, so that maintenance of the manufacturing machine of the device is facilitated.

此外,根據本發明實施例的元件檢測裝置,用於測試部與載入緩衝部之間的元件替換,或用於測試部與卸載部之間的元件替換的接送板,係構成為,可以通過板裝卸部的簡單的動作以在板固定部進行裝卸,從而具有在作為檢測物件的元件種類,特別是元件的大小變化時,可以容易替換安置元件的接送板的優點。Further, the component detecting device according to the embodiment of the present invention, the component replacement for the test portion and the loading buffer portion, or the transfer plate for the component replacement between the test portion and the unloading portion is configured to pass The simple action of the plate attaching and detaching portion is detachable at the plate fixing portion, so that it has an advantage that the transfer plate for arranging the component can be easily replaced when the type of the component as the detecting article, particularly the size of the component, changes.

此外,根據本發明實施例的元件檢測裝置,通過選取元件在向測試插口加壓的元件加壓工具的選取器上設置加熱部以對選取的元件進行加熱,不僅可以對元件進行迅速地加熱,而且可以使得元件的溫度下降最小化,從而具有可以準確地執行元件檢測的優點。Further, according to the component detecting apparatus of the embodiment of the present invention, the heating element is heated by the selecting element on the picker of the component pressing tool pressed to the test socket to heat the selected component, not only the component can be rapidly heated, Moreover, the temperature drop of the element can be minimized, thereby having the advantage that component detection can be performed accurately.

此外,根據本發明實施例的元件檢測裝置,相比於為了替換吸附板而停止裝置的運行而進行手工作業,以及替換後再重新啟動裝置的以往技術,因為附加具備了可以從選取器自動替換吸附板的吸附板替換部,從而具有可以大幅提升裝備生產性的優點。Further, the component detecting device according to the embodiment of the present invention performs manual work as compared with the operation of stopping the device for replacing the adsorption plate, and the prior art of restarting the device after replacement, since the additional device can be automatically replaced from the picker The adsorption plate replacement portion of the adsorption plate has the advantage that the productivity of the equipment can be greatly improved.

此外,根據本發明實施例的元件檢測裝置,通過追加包括清潔部,設置於測試部的一側,用於通過移動在覆蓋所述測試插口的狀態下噴射空氣以在所述測試插口中去除異物,從而防止測試插口中存在異物導致發生測試錯誤或無法進行測試工作,從而具有大大提升裝置性能的優點。Further, the component detecting device according to the embodiment of the present invention is provided on one side of the test portion by additionally including a cleaning portion for ejecting air in a state of covering the test socket by movement to remove foreign matter in the test socket. Therefore, the presence of foreign matter in the test socket is prevented from causing a test error or the test work cannot be performed, thereby having the advantage of greatly improving the performance of the device.

1‧‧‧元件1‧‧‧ components

100‧‧‧載入部100‧‧‧Loading Department

2‧‧‧托盤2‧‧‧Tray

2a‧‧‧收容槽2a‧‧‧storage trough

200‧‧‧載入緩衝部200‧‧‧Load buffer

210、410‧‧‧板部件210, 410‧‧‧ board parts

211、411‧‧‧裝載槽211, 411‧‧‧ loading slots

300‧‧‧測試部300‧‧‧Test Department

310‧‧‧測試插口310‧‧‧ test socket

311‧‧‧端子311‧‧‧ terminals

312‧‧‧支持框架312‧‧‧Support framework

400‧‧‧卸載緩衝部400‧‧‧Unloading buffer

500‧‧‧卸載部500‧‧‧Unloading Department

610、620‧‧‧接送部610, 620‧‧‧ pick-up department

611、621‧‧‧導軌611, 621‧‧ ‧ rail

612、622‧‧‧接送板612, 622‧‧‧ pick-up board

613、623‧‧‧板固定部613, 623‧‧ ‧ plate fixing department

614、624‧‧‧板裝卸部614, 624‧‧‧ board loading and unloading department

614a、624a‧‧‧支持體614a, 624a‧‧‧Support

614b、624b‧‧‧固定體614b, 624b‧‧‧ fixed body

614c、624c‧‧‧第一鉸鍊軸614c, 624c‧‧‧ first hinge shaft

614d、624d‧‧‧彈性體614d, 624d‧‧‧ Elastomers

614i、624i‧‧‧加壓體614i, 624i‧‧‧ Pressurized body

614e、624e‧‧‧移動體614e, 624e‧‧‧ mobile body

614g、624g‧‧‧手柄614g, 624g‧‧‧ handle

614f、624f‧‧‧第二鉸鍊軸614f, 624f‧‧‧ second hinge shaft

614h、624h‧‧‧固定掛鈎614h, 624h‧‧‧ fixed hook

700‧‧‧清潔部700‧‧‧Clean Department

710‧‧‧本體710‧‧‧ Ontology

720‧‧‧驅動部720‧‧‧ Drive Department

711‧‧‧空氣流路711‧‧‧Air flow path

712‧‧‧噴嘴712‧‧‧ nozzle

713‧‧‧排出管713‧‧‧Draining tube

801‧‧‧水平移動裝置801‧‧‧ horizontal mobile device

802‧‧‧垂直移動裝置802‧‧‧Vertical mobile device

803‧‧‧水平驅動部803‧‧‧ horizontal drive department

803a‧‧‧帶803a‧‧‧带

803b‧‧‧皮帶輪803b‧‧‧ Pulley

804‧‧‧固定物804‧‧‧ fixtures

805‧‧‧第二垂直移動裝置805‧‧‧Second vertical mobile device

807‧‧‧控制部807‧‧‧Control Department

810、814‧‧‧載入移送工具810, 814‧‧‧Loading transfer tool

820、824‧‧‧卸載移送工具820, 824‧‧‧ Unloading Transfer Tool

830、840‧‧‧元件加壓工具830, 840‧‧‧ component press tools

830a、840a‧‧‧支持軸830a, 840a‧‧‧ support shaft

830b、840b‧‧‧連接部件830b, 840b‧‧‧ connecting parts

830c、840c‧‧‧貫通孔830c, 840c‧‧‧through holes

830d、840d‧‧‧移動塊830d, 840d‧‧‧ moving blocks

830e、840e‧‧‧凸輪從動節830e, 840e‧‧‧Cam follower

830g、840g‧‧‧凸輪部件830g, 840g‧‧‧ cam parts

830f、840f‧‧‧凸輪槽830f, 840f‧‧‧ cam slot

830h、840h‧‧‧升降導軌830h, 840h‧‧‧ lifting rail

830i、840i‧‧‧引導導軌830i, 840i‧‧‧ guide rail

830j、840j‧‧‧驅動電動機830j, 840j‧‧‧ drive motor

831、841‧‧‧選取器831, 841‧‧‧ picker

833、843‧‧‧支持部833, 843‧‧‧ Support Department

833a、843a‧‧‧第一支持板833a, 843a‧‧‧ first support board

833b、843b、835b、845b‧‧‧氣壓通路833b, 843b, 835b, 845b‧‧‧ pneumatic access

833c、843c、835c、845c‧‧‧真空壓連接通路833c, 843c, 835c, 845c‧‧‧ vacuum connection path

834、844‧‧‧選取模組834, 844‧‧‧Selection module

835、845‧‧‧第二支持板835, 845‧‧‧ second support board

836、846‧‧‧支持模組836, 846‧‧‧ support modules

838、848‧‧‧加熱模組838, 848‧‧‧ heating module

838a、848a‧‧‧加熱器838a, 848a‧‧‧ heater

838b、848b‧‧‧溫度感測器838b, 848b‧‧‧temperature sensor

839、849‧‧‧阻尼器839, 849‧‧ ‧ damper

839a、849a‧‧‧彈性膜839a, 849a‧‧‧elastic film

839b、849b‧‧‧加壓部件839b, 849b‧‧‧ Pressurized parts

839d、849d‧‧‧室Room 839d, 849d‧‧

839c、849c‧‧‧氣壓通路839c, 849c‧‧‧ pneumatic path

850‧‧‧緊固單元850‧‧‧ fastening unit

851‧‧‧環851‧‧‧ Ring

852‧‧‧環移動部件852‧‧‧ Ring moving parts

853‧‧‧環掛鈎部件853‧‧‧ring hook parts

860‧‧‧第一支持單元860‧‧‧ first support unit

861‧‧‧凸出片861‧‧‧ protruding film

862‧‧‧凸出片固定部862‧‧‧Protruding piece fixing part

863‧‧‧第一支持部件863‧‧‧First Supporting Parts

864‧‧‧第二支持部件864‧‧‧Second support unit

865‧‧‧彈性部件865‧‧‧Flexible parts

866‧‧‧固定部件866‧‧‧Fixed parts

870‧‧‧第二支持單元870‧‧‧second support unit

871‧‧‧凸出條871‧‧‧ protruding strip

872‧‧‧頭部收容部872‧‧‧ Head Steering Department

873‧‧‧掛板873‧‧‧hanging board

874‧‧‧頭部插入孔874‧‧‧ head insertion hole

875‧‧‧頭部875‧‧‧ head

880‧‧‧位置決定單元880‧‧‧Location Determination Unit

881‧‧‧凸出棒881‧‧‧ protruding stick

882‧‧‧凸出棒插入槽882‧‧‧ protruding rod insertion slot

889‧‧‧感應感測器889‧‧‧Induction sensor

891‧‧‧結合部件891‧‧‧Combined parts

892‧‧‧吸附板892‧‧‧Adsorption plate

892a‧‧‧凸出部892a‧‧‧protrusion

893‧‧‧引導部件893‧‧‧Guide parts

899‧‧‧吸入流路899‧‧‧Inhalation flow path

894‧‧‧噴射口894‧‧‧jet

895‧‧‧加熱氣體流路895‧‧‧heating gas flow path

896‧‧‧加熱氣體供給器896‧‧‧heating gas feeder

900‧‧‧吸附板替換部900‧‧‧Adsorption plate replacement unit

910‧‧‧吸附板收容部910‧‧‧Adsorption plate accommodating department

920‧‧‧吸附板選取部920‧‧‧Adsorption board selection department

91‧‧‧第一連接器91‧‧‧First connector

911‧‧‧收容空間911‧‧‧ accommodating space

912‧‧‧收容部本體912‧‧‧The body of the housing department

92‧‧‧第二連接器92‧‧‧Second connector

921‧‧‧移動部件921‧‧‧moving parts

922‧‧‧貫通部分922‧‧‧through section

923‧‧‧掛鈎部分923‧‧‧ hook part

第1圖是示意性地顯示根據本發明的元件檢測裝置的平面圖;第2圖是示意性地顯示第1圖元件檢查裝置中載入緩衝部及卸載緩衝部的板部件的一例的平面圖;第3圖是示意性地顯示第1圖元件檢查裝置中第一接送部及第二接送部的剖視圖;第4圖是示意性地顯示第3圖第一接送部及第二接送部中,將接送板固定於板固定部的板裝卸部的立體圖;第5圖及第6圖是為了說明板裝卸部的動作的概略圖;第7圖是示意性地顯示第1圖元件檢測裝置的清潔部的剖視圖;第8圖是示意性地顯示第1圖元件檢測裝置的清潔部的平面圖;第9圖是示意性地顯示設置於第1圖元件檢測裝置的元件加壓工具的剖視圖;第10圖是表示設置於第9圖元件加壓工具的選取器的分解立體圖;第11圖是顯示第9圖元件加壓工具的支持部的立體圖;第12圖是顯示第9圖元件加壓工具的選取模組的立體圖;第13圖是為了說明第1圖元件加壓工具中,在支持部上結合選取模組的動作的剖視圖;第14圖是顯示設置於第1圖元件檢測裝置的元件加壓工具的另一例的剖視圖;第15圖是表示擴大第14圖元件加壓工具的局部剖視圖;第16圖及第17圖是顯示用於沿水平方向及垂直方向移動設置於第1圖元件檢測裝置的元件加壓工具的水平移動裝置及第一垂直移動裝置的概略圖;第18圖是示意性地顯示用於沿水平方向移動設置於第1圖元件檢測裝置的元件加壓工具的水平移動裝置的橫截面圖;第19圖是示意性地顯示用於沿垂直方向移動設置於第1圖元件檢測裝置的元件加壓工具的第一垂直移動裝置的縱截面圖;第20圖是顯示第1圖元件檢測裝置中,用於設定元件加壓工具的加壓位置的結構的概略圖;第21圖是表示擴大第20圖結構中的局部剖視圖; 第22圖是顯示用於自動替換選取器的吸附板的吸附板替換部的立體圖,所述選取器的吸附板設置於第1圖元件檢測裝置所具備的載入移送工具、卸載移送工具或元件加壓工具上;第23圖至第25圖是顯示自動替換選取器的吸附板的過程的吸附板替換部的局部剖視圖,所述選取器的吸附板設置於第1圖元件檢測裝置所具備的載入移送工具、卸載移送工具或元件加壓工具上;以及第26圖及第27圖是顯示自動替換選取器的吸附板的過程的吸附板替換部的局部平面圖,所述選取器的吸附板設置於第1圖元件檢測裝置所具備的載入移送工具、卸載移送工具或元件加壓工具上。1 is a plan view schematically showing a component detecting device according to the present invention; and FIG. 2 is a plan view schematically showing an example of a plate member in which a buffer portion and an unloading buffer portion are loaded in the component inspection device of FIG. 1; 3 is a cross-sectional view schematically showing the first pick-up unit and the second pick-up unit in the component inspection device of FIG. 1; FIG. 4 is a view schematically showing the first pick-up unit and the second pick-up unit in FIG. FIG. 5 is a schematic view for explaining the operation of the plate attaching and detaching portion, and FIG. 7 is a schematic view showing the cleaning portion of the component detecting device of FIG. Fig. 8 is a plan view schematically showing a cleaning portion of the component detecting device of Fig. 1; and Fig. 9 is a cross-sectional view schematically showing a component pressing tool provided in the component detecting device of Fig. 1; Fig. 11 is an exploded perspective view showing the selector of the component pressurizing tool of Fig. 9; Fig. 11 is a perspective view showing the support portion of the component pressurizing tool of Fig. 9; and Fig. 12 is a view showing the selection mode of the component pressurizing tool of Fig. 9. Stereogram of group; first 3 is a cross-sectional view for explaining an operation of joining a selection module to a support portion in the component press tool of FIG. 1, and FIG. 14 is a cross-sectional view showing another example of the component pressurizing tool provided in the element detecting device of the first embodiment. Fig. 15 is a partial cross-sectional view showing the expansion of the component pressurizing tool of Fig. 14; Fig. 16 and Fig. 17 are diagrams showing the component pressing tool for moving the component detecting device of Fig. 1 in the horizontal direction and the vertical direction. FIG. 18 is a cross-sectional view schematically showing a horizontal moving device for moving a component pressurizing tool provided in the element detecting device of FIG. 1 in a horizontal direction; FIG. 18 is a schematic view showing a horizontal moving device and a first vertical moving device; 19 is a longitudinal cross-sectional view schematically showing a first vertical moving device for moving a component pressing tool provided in the element detecting device of the first drawing in the vertical direction; and FIG. 20 is a view showing the component detecting device of the first drawing, FIG. 21 is a schematic cross-sectional view showing a structure for setting a pressurizing position of the component pressurizing tool; FIG. 21 is a partial cross-sectional view showing the structure of the enlarged drawing 20; Figure 22 is a perspective view showing an adsorption plate replacement portion of the adsorption plate for automatically replacing the selector, the adsorption plate of the selector being disposed in the loading transfer tool, the unloading transfer tool or the component provided in the component detecting device of Figure 1. On the pressurizing tool; FIG. 23 to FIG. 25 are partial cross-sectional views showing the suction plate replacing portion of the process of automatically replacing the suction plate of the picker, the adsorbing plate of the picker being disposed in the component detecting device of FIG. Loading a transfer tool, an unloading transfer tool, or a component pressurizing tool; and Figs. 26 and 27 are partial plan views showing a suction plate replacing portion of a process of automatically replacing the adsorbing plate of the picker, the adsorbing plate of the picker It is provided in the loading transfer tool, the unloading transfer tool, or the component pressing tool provided in the component detecting device of Fig. 1.

下面參照附圖對根據本發明一實施例的元件檢測裝置進行說明。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a component detecting device according to an embodiment of the present invention will be described with reference to the accompanying drawings.

如第1圖所示,根據本發明實施例的元件檢測裝置,可以包括:載入部100,載入多個元件1;測試部300,對從載入部100傳達的元件1進行測試;卸載部500,根據測試部300的測試結果,對元件1進行分類裝載。As shown in FIG. 1, a component detecting apparatus according to an embodiment of the present invention may include: a loading unit 100 that loads a plurality of components 1; a testing section 300 that tests components 1 transmitted from the loading section 100; The unit 500 classifies and loads the component 1 based on the test result of the test unit 300.

測試的物件元件1可以為,記憶半導體或如CPU(Central Processing Unit)、GPU(Graphic Processing Unit)、系統LIS(Large Scale Integration)等的非記憶元件。元件1可以為非記憶元件,特別是,底面形成有球形狀的接觸端子的元件。The object element 1 to be tested may be a memory semiconductor or a non-memory element such as a CPU (Central Processing Unit), a GPU (Graphic Processing Unit), or a system LIS (Large Scale Integration). The element 1 may be a non-memory element, in particular, an element in which a spherical contact terminal is formed on the bottom surface.

在載入部100、測試部300及卸載部500之間移送元件1的方法,可以通過多種方法來執行。The method of transferring the component 1 between the loading unit 100, the testing unit 300, and the unloading unit 500 can be performed by various methods.

載入部100及卸載部500,作為載入裝載多個元件1的一個以上的托盤2的結構,根據設計可以為多種結構。載入部100及卸載部500上可以設置托盤裝載部(未圖示),來裝載多個托盤2。The loading unit 100 and the unloading unit 500 have a configuration in which one or more trays 2 on which the plurality of elements 1 are loaded are loaded, and may have various configurations depending on the design. A tray loading unit (not shown) may be provided in the loading unit 100 and the unloading unit 500 to load a plurality of trays 2.

例如,載入部100上會適當地安置多個托盤2,以將元件1連續性地選取而進行移送。此外,未裝載元件1的托盤2可與裝載元件1的托盤2進行交替。例如,可以將一定批量的托盤2自動或手動載入到托盤裝載部。For example, a plurality of trays 2 are appropriately placed on the loading unit 100 to continuously select the components 1 for transfer. Furthermore, the tray 2 of the unloaded component 1 can be alternated with the tray 2 of the loading element 1. For example, a certain batch of trays 2 can be automatically or manually loaded into the tray loading section.

載入部100內,引出元件1後的空托盤2,可以通過托盤傳 達部(未圖示)移送到卸載部500。此外,空托盤2在移送到卸載部500之前,托盤2可以在托盤反轉部(未圖示)進行旋轉(反轉),以去除尚未從托盤2引出的元件1。In the loading unit 100, the empty tray 2 after the element 1 is taken out can be passed through the tray The portion (not shown) is transferred to the unloading unit 500. Further, before the empty tray 2 is transferred to the unloading unit 500, the tray 2 can be rotated (reversed) in the tray inverting portion (not shown) to remove the element 1 that has not been taken out from the tray 2.

另一方面,卸載部500的結構可以與載入部100類似。例如,卸載部500中,可以將多個空托盤2根據分類等級來進行適當地安置,從而使元件1根據測試結果進行連續性地分類裝載。卸載部500中,裝載測試完畢的元件1的托盤2可以與空托盤2交替。On the other hand, the structure of the unloading portion 500 can be similar to that of the loading portion 100. For example, in the unloading section 500, a plurality of empty trays 2 can be appropriately placed according to the classification level, so that the component 1 is continuously sorted and loaded according to the test result. In the unloading unit 500, the tray 2 on which the tested component 1 is loaded can be alternated with the empty tray 2.

此外,載入部100與卸載部500之間,可以追加設置臨時裝載空托盤2的托盤緩衝部(未圖示),以臨時裝載空托盤2。Further, a tray buffer portion (not shown) for temporarily loading the empty tray 2 may be additionally provided between the loading unit 100 and the unloading unit 500 to temporarily load the empty tray 2.

托盤2上形成有多個收容槽2a,來裝載多個元件1。例如,多個收容槽2a可以在托盤2中形成為8×16的行列。A plurality of accommodation grooves 2a are formed in the tray 2 to load the plurality of elements 1. For example, the plurality of accommodation grooves 2a may be formed in the tray 2 in an array of 8 × 16.

如第1圖及第2圖所示,載入部100與測試部300之間可以設置用於臨時裝載從載入部100的托盤2傳達的元件1的載入緩衝部200,以增加元件1的移送速度或對多個元件1進行充分地加熱。此外,測試部300與卸載部500之間可以設置用於臨時裝載通過測試部300測試完成的元件1的卸載緩衝部400,以增加元件1的移送速度。由此,作為測試物件的元件1,可以從載入部100移送到載入緩衝部200進行臨時裝載後移送到測試部300,測試完畢的元件1,可以從測試部300移送到卸載緩衝部400進行臨時裝載後移送到卸載部500。As shown in FIGS. 1 and 2, a load buffer unit 200 for temporarily loading the component 1 conveyed from the tray 2 of the loading unit 100 may be provided between the loading unit 100 and the test unit 300 to increase the component 1 The transfer speed or the plurality of elements 1 is sufficiently heated. Further, an unloading buffer portion 400 for temporarily loading the component 1 that has been tested by the testing portion 300 may be provided between the test portion 300 and the unloading portion 500 to increase the transfer speed of the component 1. Thereby, the component 1 as the test object can be transferred from the loading unit 100 to the loading buffer unit 200 for temporary loading and then transferred to the testing unit 300, and the tested component 1 can be transferred from the testing unit 300 to the unloading buffer unit 400. The temporary loading is performed and then transferred to the unloading unit 500.

特別是,載入緩衝部200及卸載緩衝部500相比於裝載相對較小數量的元件1的托盤2,可以裝載相對較多數量的元件1。In particular, the loading buffer 200 and the unloading buffer 500 can carry a relatively large number of components 1 compared to the tray 2 loaded with a relatively small number of components 1.

如第2圖所示,載入部200及卸載部400可以包括:板形狀的板部件210、410,上面形成有多個裝載槽211、411,以裝載多個元件1。As shown in FIG. 2, the loading unit 200 and the unloading unit 400 may include plate-shaped plate members 210 and 410 on which a plurality of loading grooves 211 and 411 are formed to load a plurality of elements 1.

載入緩衝部200及卸載緩衝部400的板部件210、410具有幾乎相同的結構。只是,測試元件1需要進行加熱(預熱)時,載入緩衝部200的板部件210上會附加有如加熱器的加熱裝置。The plate members 210 and 410 of the loading buffer unit 200 and the unloading buffer unit 400 have almost the same structure. However, when the test element 1 needs to be heated (preheated), a heating means such as a heater is attached to the plate member 210 of the loading buffer portion 200.

載入緩衝部200及卸載緩衝部400的板部件210、410的裝載槽211、411,可以對應測試部300的測試插口310的間隔來進行排列,或對應托盤2的收容槽2a的間隔來進行排列。The loading grooves 211 and 411 of the plate members 210 and 410 of the loading buffer unit 200 and the unloading buffer unit 400 may be arranged in accordance with the interval of the test sockets 310 of the test unit 300 or may be arranged corresponding to the interval between the storage slots 2a of the tray 2. arrangement.

例如,托盤2的收容槽2a的間隔與載入緩衝部200及卸載緩衝部400的板部件210、410的裝載槽211、411的間隔相同,且測試部300 的測試插口310的檢測會以托盤2之收容槽2a的間隔的n倍,例如,2倍來形成。For example, the interval between the accommodation grooves 2a of the tray 2 is the same as the interval between the loading grooves 211, 411 of the plate members 210, 410 of the loading buffer portion 200 and the unloading buffer portion 400, and the test portion 300 The detection of the test socket 310 is formed by n times, for example, twice the interval of the housing groove 2a of the tray 2.

板部件210、410作為用於臨時裝載元件1以與測試部300進行元件交替的結構,可以在元件檢測裝置的內部以固定的狀態進行設置或可移動地進行設置等多種結構。The plate members 210 and 410 are configured to temporarily load the components 1 to alternate elements with the test portion 300, and may be provided in a fixed state or movably provided inside the component detecting device.

如第1圖所示,測試部300用於對從載入緩衝部200傳達的元件1進行測試,根據測試的種類可以為多種結構。測試部300上設置有被元件1加壓的多個測試插口310。例如,多個測試插口310具備有與電源連接的端子,通過元件1加壓到端子的過程,執行對元件1的通電測試。As shown in FIG. 1, the test unit 300 is for testing the component 1 transmitted from the load buffer unit 200, and may have various configurations depending on the type of test. The test unit 300 is provided with a plurality of test sockets 310 that are pressurized by the element 1. For example, the plurality of test sockets 310 are provided with terminals that are connected to a power source, and the power-on test of the components 1 is performed by the process of pressing the components 1 to the terminals.

測試插口310可以以8×2、8×4等多種行列來進行安置。測試插口310作為連接元件1與端子之間進行元件1的測試結構,可以為多種結構。這種測試插口310,可以根據元件的種類、測試種類等進行替換。The test socket 310 can be placed in various rows and columns such as 8×2, 8×4, and the like. The test socket 310 serves as a test structure for the component 1 between the connection member 1 and the terminal, and can have various structures. Such a test socket 310 can be replaced according to the type of component, the type of test, and the like.

另一方面,測試部300可以為測試插口310與剩下的結構模組化的獨立結構,作為簡單的結構可以由設置測試插口310的PCB板實現。特別是,測試部300由設置測試插口310的PCB板實現時,可以將測試插口310按照各個測試來進行特性化,從而可以顯著地縮減相對昂貴的測試部300的結構費用。On the other hand, the test portion 300 can be a separate structure that is modularized with the test socket 310 and the remaining structure. As a simple structure, it can be realized by a PCB board on which the test socket 310 is disposed. In particular, when the test portion 300 is implemented by a PCB board on which the test socket 310 is disposed, the test socket 310 can be characterized in accordance with each test, so that the structural cost of the relatively expensive test portion 300 can be significantly reduced.

另一方面,在測試部300可以執行多種測試。更佳者為,測試部300構成為可以在室溫以上的溫度下對元件1進行測試的結構。On the other hand, various tests can be performed at the test section 300. More preferably, the test unit 300 is configured to be capable of testing the element 1 at a temperature of room temperature or higher.

測試部300在進行高溫測試等與溫度相關的測試時,可以在其周邊設置室部件,以包裹包括測試插口310的一部分區域,來最小化溫度變化。The test portion 300 may be provided with chamber components around its periphery to perform a temperature-related test such as a high temperature test to wrap a portion of the area including the test socket 310 to minimize temperature variations.

另一方面,測試部300與載入緩衝部200之間或測試部300與卸載緩衝部400之間的元件交換,相比於直接進行,是通過接送部610、620,將從載入緩衝部200傳達的元件1移送到測試部300側,再將從測試部300傳達的元件1移動到卸載緩衝部400側。接送部610、620是用於進行測試部300與載入緩衝部200之間的元件交換或測試部300與卸載緩衝部400之間的元件交換的結構,可以為多種結構。On the other hand, the component exchange between the test unit 300 and the load buffer unit 200 or between the test unit 300 and the unload buffer unit 400 is performed directly by the pick-up unit 610, 620, and will be loaded from the load buffer unit. The element 1 transmitted by 200 is transferred to the side of the test unit 300, and the element 1 transmitted from the test unit 300 is moved to the side of the unloading buffer unit 400. The shuttle units 610 and 620 are configured to perform component exchange between the test unit 300 and the load buffer unit 200 or exchange elements between the test unit 300 and the unload buffer unit 400, and may have various configurations.

例如,如第1圖及第3圖所示,接送部610、620可以包括:第一接送部610,在用於接收載入部100傳達的元件1的第一元件傳達位置、用於與測試部300進行元件1交換的元件交換位置,及用於向卸載部 500傳達元件1的第二元件傳達位置之間進行移動;第二接送部620,在用於接收載入部100傳達的元件1的第一元件傳達位置、用於與測試部300進行元件1交換的元件交換位置,及用於向卸載部500傳達元件1的第二元件傳達位置之間進行移動。此處,第一元件傳達位置、元件交換位置及第二元件傳達位置,根據裝置的結構可以進行多種多樣的安置,並且可以沿直線依次安置。For example, as shown in FIGS. 1 and 3, the pick-up unit 610, 620 may include a first pick-up unit 610 for receiving the first component communication position of the component 1 conveyed by the loading unit 100, for testing and testing. The part 300 performs the component exchange position of the component 1 exchange, and is used for the unloading section The second component transfer position of the 500 communication component 1 is moved; the second shuttle component 620 is used to receive the first component communication position of the component 1 conveyed by the loading section 100, and is used for component 1 exchange with the test section 300. The component exchange position and the second component communication position for conveying the component 1 to the unloading unit 500 are moved. Here, the first component transfer position, the component exchange position, and the second component transfer position can be variously arranged according to the structure of the device, and can be sequentially arranged in a straight line.

第一接送部610及第二接送部620,是在測試部300的測試 插口310之間,安置於測試插口310的兩側。第一接送部610及第二接送部620可以包括:導軌611、621,以測試部300為中心對向地進行設置;裝載元件1的一個以上的接送板612、622,沿導軌611、621進行水平移動,從而交替地移動於用於接收載入緩衝部200傳達的元件1的第一元件傳達位置、與測試部300的元件交換位置,及用於向卸載緩衝部400傳達元件1的第二元件傳達位置之間;板固定部613、623,可裝卸地結合有接送板612、622,並設置為可沿導軌611、621進行移動。The first pick-up unit 610 and the second pick-up unit 620 are tested in the test unit 300. Between the sockets 310, they are disposed on both sides of the test socket 310. The first pick-up unit 610 and the second pick-up unit 620 may include: guide rails 611 and 621 disposed opposite to the test unit 300; and one or more transfer boards 612 and 622 of the loading unit 1 are disposed along the guide rails 611 and 621. Moving horizontally to alternately move the first component communication position for receiving the component 1 conveyed by the loading buffer 200, the component exchange position with the test portion 300, and the second for transmitting the component 1 to the unloading buffer 400 Between the component transfer positions, the plate fixing portions 613, 623 detachably couple the shuttle plates 612, 622 and are arranged to be movable along the guide rails 611, 621.

導軌611、621,作為用於引導接送板612、622移動的結構,可以為多種結構。The guide rails 611, 621, as a structure for guiding the movement of the transfer plates 612, 622, may have various configurations.

接送板612、622形成有一個以上的安置元件1的元件安置槽,用於進行測試部300與載入緩衝部200之間的元件交換,或測試部300與卸載緩衝部400之間的元件交換。The transfer plates 612, 622 are formed with more than one component placement groove for the placement member 1, for performing component exchange between the test portion 300 and the load buffer portion 200, or for component exchange between the test portion 300 and the unloading buffer portion 400. .

板固定部613、623,是為了接送板612、622的交替便利而設置的結構,可以為多種結構,且可以具備用於加熱元件1的加熱器等。接送板612、622可裝卸地設置於板固定部613、623,因此在作為檢測對象的元件1種類,特別是,元件1的大小不同時,可以交替安置元件1的接送板612、622。The plate fixing portions 613 and 623 are provided in order to facilitate the exchange of the transfer plates 612 and 622, and may have various configurations and may be provided with a heater or the like for the heating element 1. The shuttle plates 612 and 622 are detachably provided to the plate fixing portions 613 and 623. Therefore, when the types of the components 1 to be detected, in particular, the sizes of the components 1 are different, the transfer plates 612 and 622 of the components 1 can be alternately placed.

板固定部613、623具備有板裝卸部614、624,將接送板612、622可裝卸地固定於板固定部613、623。板裝卸部614、624,是作為用於在板固定部613、623裝卸接送板612、622的結構,可以為多種結構,可以構成為通過簡單的手工作業來進行接送板612、622的裝卸。The plate fixing portions 613 and 623 are provided with plate attaching and detaching portions 614 and 624, and the transfer plates 612 and 622 are detachably fixed to the plate fixing portions 613 and 623. The plate attaching and detaching portions 614 and 624 are configured to attach and detach the transfer plates 612 and 622 to the plate fixing portions 613 and 623, and may have various configurations, and may be configured to attach and detach the transfer plates 612 and 622 by a simple manual operation.

例如,如第4圖至第6圖所示,板裝卸部614、624可以包括:支持體614a、624a,固定於板固定部613、623;固定體614b、624b,通過設置於支持體614a、624a的第一鉸鏈軸614c、624c可旋轉地進行連接,並 根據旋轉選擇地固定接送板612,622;彈性體614d、624d,將固定體614b、624b彈性支持於第一鉸鏈軸614c、624c;加壓體614i、624i,與固定體614b、624b接觸,並且與固定體614b、624b的加壓面形成為曲面以對固定體614b、624b加壓;移動體614e、624e,與加壓體614i、624i連接,在支持體614a、624a的內部設置為可沿上下方向(Z軸方向)進行移動;手柄614g、624g,可旋轉地連接於設置在移動體614e、624e的第二鉸鏈軸614f、624f;固定掛鈎614h、624h,設置於支持體614a、624a,掛於手柄614g、624g的端部並固定。For example, as shown in FIGS. 4 to 6 , the plate attaching and detaching portions 614 and 624 may include support bodies 614 a and 624 a fixed to the plate fixing portions 613 and 623 , and fixing bodies 614 b and 624 b configured to be disposed on the support body 614 a. The first hinge shafts 614c, 624c of 624a are rotatably connected, and The shuttle plates 612, 622 are selectively fixed according to the rotation; the elastic bodies 614d, 624d elastically support the fixing bodies 614b, 624b to the first hinge shafts 614c, 624c; the pressing bodies 614i, 624i are in contact with the fixed bodies 614b, 624b, and The pressing faces of the fixed bodies 614b and 624b are formed into a curved surface to pressurize the fixed bodies 614b and 624b; the moving bodies 614e and 624e are connected to the pressurizing bodies 614i and 624i, and are disposed along the inside of the supporting bodies 614a and 624a. The upper and lower directions (Z-axis direction) are moved; the handles 614g and 624g are rotatably connected to the second hinge shafts 614f and 624f provided on the movable bodies 614e and 624e, and the fixed hooks 614h and 624h are provided on the support bodies 614a and 624a. Hanged at the ends of the handles 614g, 624g and fixed.

固定體614b、624b形成為大概以英文字母“L”字型彎曲的形 狀,通過彎曲的部分接觸於接送板612、622的轉角以使接送板612、622固定於板固定部613、623。The fixed bodies 614b, 624b are formed in a shape that is roughly curved in the letter "L" In the shape, the curved portions are in contact with the corners of the transfer plates 612, 622 to fix the transfer plates 612, 622 to the plate fixing portions 613, 623.

彈性體614d、624d可以例舉使用扭力彈簧。The elastic bodies 614d, 624d can be exemplified by the use of a torsion spring.

掛鈎614h、624h較佳是形成為,根據作業者轉動的手柄614g、624g,來掛於手柄614g、624g的端部並固定或解除掛於手柄614g、624g的端部的狀態的程度。The hooks 614h and 624h are preferably formed so as to be hooked to the ends of the handles 614g and 624g in accordance with the handles 614g and 624g rotated by the operator, and to be fixed or released from the ends of the handles 614g and 624g.

根據這種結構,根據手柄614g、624g的位置變化而沿上下方向移動的移動體614e、624e,加壓體614i、624i會沿上下方向移動,由此,固定體614b、624b的姿態會沿與固定體614b、624b接觸的加壓體614i、624i的加壓面的曲面形狀變化。固定體614b、624b的姿態變更時,由於彈性體614d、624d的彈性力,固定體614b、624b的姿態可以保持一定。According to this configuration, the moving bodies 614e and 624e that move in the vertical direction in accordance with the change in the positions of the handles 614g and 624g move the pressing bodies 614i and 624i in the vertical direction, whereby the postures of the fixed bodies 614b and 624b follow The curved surfaces of the pressurizing surfaces of the pressurizing bodies 614i and 624i that the fixed bodies 614b and 624b are in contact with each other change. When the postures of the fixed bodies 614b and 624b are changed, the postures of the fixed bodies 614b and 624b can be kept constant due to the elastic forces of the elastic bodies 614d and 624d.

此外,移動體614e、624e的沿上下方向的移動,可以根據以第二鉸鏈軸614f、624f為中心轉動的手柄614g、624g來執行。另一方面,手柄614g、624g掛於固定掛鈎614h、624h時,手柄614g、624g的轉動會受限,由此,移動體614e、624e及加壓體614i、624i的沿上下方向的移動會受限,由此可以防止固定體614b、624b的姿態的任意變更。Further, the movement of the moving bodies 614e and 624e in the vertical direction can be performed in accordance with the handles 614g and 624g that are rotated about the second hinge shafts 614f and 624f. On the other hand, when the handles 614g, 624g are hung on the fixing hooks 614h, 624h, the rotation of the handles 614g, 624g is limited, whereby the movement of the moving bodies 614e, 624e and the pressing bodies 614i, 624i in the up and down direction is subject to Therefore, it is possible to prevent an arbitrary change in the posture of the fixed bodies 614b and 624b.

如第5圖所示,在接送板612、622根據固定體614b、624b固定的狀態下,將手柄614g、624g以第二鉸鏈軸614f、624f為中心向脫離固定掛鈎614h、624h的方向(第5圖中的順時針方向)轉動時,彈性體614d、624d的彈性力會作用於加壓體614i、624i及移動體614e、624e,從而使加壓體614i、624i及移動體614e、624e向下側方向移動,並使接觸於固定體614b、624b的加壓體614i、624i的加壓面的位置變更,由此,固定體614b、 624b會根據彈性體614d、624d的彈性力,以第一鉸鏈軸614c、624c為中心向從接送板612、622脫離的方向(第5圖中的順時針方向)旋轉,從而如第6圖所示,來解除接送板612、622的固定。As shown in FIG. 5, in a state in which the transfer plates 612 and 622 are fixed according to the fixed bodies 614b and 624b, the handles 614g and 624g are separated from the fixed hooks 614h and 624h by the second hinge shafts 614f and 624f. When the clockwise direction in the figure is rotated, the elastic forces of the elastic bodies 614d and 624d act on the pressurizing bodies 614i and 624i and the moving bodies 614e and 624e, so that the pressurizing bodies 614i and 624i and the moving bodies 614e and 624e are directed toward each other. The lower side is moved, and the position of the pressing surface of the pressurizing bodies 614i and 624i that are in contact with the fixed bodies 614b and 624b is changed, whereby the fixed body 614b, 624b rotates in a direction away from the shuttle plates 612, 622 (clockwise in FIG. 5) around the first hinge shafts 614c, 624c according to the elastic force of the elastic bodies 614d, 624d, so as shown in Fig. 6. It is shown that the fixing of the transfer boards 612, 622 is released.

另一方面,如第6圖所示,在接送板612、622的固定解除的狀態下,手柄614g、624g以第二鉸鏈軸614f、624f為中心向掛於固定掛鈎614h、624h的方向(第6圖中的逆時針方向)轉動來固定於固定掛鈎614h、624h的過程中,加壓體614i、624i及移動體614e、624e會向上側方向移動,接觸於固定體614b、624b的加壓體614i、624i的加壓面的位置會改變,從而使固定體614b、624b會以第一鉸鏈軸614c、624c為中心向接觸接送板612、622的方向(第6圖中的逆時針方向)轉動,由此,如第5圖所示,接送板612、622可以根據固定體614b、624b進行固定。此外,接送板612、622根據固定體614b、624b固定的狀態下,彈性體614d、624d的彈性力會作用於固定體614b、624b,由此可以防止固定體614b、624b的任意轉動。On the other hand, as shown in Fig. 6, in a state where the fixing of the transfer plates 612 and 622 is released, the handles 614g and 624g are hung in the direction of the fixed hooks 614h and 624h around the second hinge axes 614f and 624f (the first) 6 (counterclockwise in the figure) is rotated to fix the fixing hooks 614h, 624h, and the pressing bodies 614i, 624i and the moving bodies 614e, 624e are moved in the upward direction to contact the pressing bodies of the fixing bodies 614b, 624b. The positions of the pressing faces of the 614i, 624i are changed so that the fixed bodies 614b, 624b are rotated in the direction of contacting the shuttle plates 612, 622 (counterclockwise in Fig. 6) centering on the first hinge axes 614c, 624c. Thus, as shown in Fig. 5, the shuttle plates 612, 622 can be fixed according to the fixed bodies 614b, 624b. Further, in a state in which the transfer plates 612 and 622 are fixed in accordance with the fixed bodies 614b and 624b, the elastic forces of the elastic bodies 614d and 624d act on the fixed bodies 614b and 624b, whereby the arbitrary rotation of the fixed bodies 614b and 624b can be prevented.

如上所述,根據本發明的實施例,將接送板612、622可裝卸地固定於板固定部613、623的板裝卸部614、624構成為,通過轉動手柄614g、624g簡單的動作來執行接送板612、622的固定及解除固定的結構,由此可以具有可以非常簡單且容易地執行612、622的固定及解除固定的動作效果。As described above, according to the embodiment of the present invention, the board attaching and detaching portions 614 and 624 that detachably fix the pick-up boards 612 and 622 to the board fixing portions 613 and 623 are configured to perform the pick-up by simply rotating the handles 614g and 624g. The fixing and unfixing of the plates 612 and 622 can thereby achieve the effect of fixing and releasing the fixing of the 612 and 622 very easily and easily.

另一方面,測試部300,有可能會因為測試插口310中流入異物等導致發生無法進行測試的狀況,這種情況下,以往存在著需要停止元件檢測裝置,並通過手工作業來去除異物後再啟動元件檢測裝置的繁雜的工序。On the other hand, in the test unit 300, there is a possibility that a test cannot be performed due to a foreign matter flowing into the test socket 310. In this case, there is a case where it is necessary to stop the component detecting device and remove the foreign matter by manual work. A complicated process of starting the component detecting device.

因此,較佳為具備清潔部700,設置於測試部300的一側,用於通過移動來在覆蓋測試插口310的狀態下噴射空氣以去除測試插口310中的異物等。Therefore, it is preferable to include the cleaning unit 700 provided on one side of the test unit 300 for ejecting air in a state of covering the test socket 310 by movement to remove foreign matter or the like in the test socket 310.

清潔部700可以具有多種結構。例如,如第7圖及第8圖所示,清潔部700,可以包括:本體710,覆蓋測試插口310並在測試插口310的上部形成清潔空間;驅動部720,用於使本體710在測試部300的一側及測試插口310的上部之間進行移動。The cleaning portion 700 can have a variety of structures. For example, as shown in FIG. 7 and FIG. 8, the cleaning portion 700 may include a body 710 covering the test socket 310 and forming a cleaning space at an upper portion of the test socket 310, and a driving portion 720 for the body 710 in the testing portion. The side of the 300 and the upper portion of the test socket 310 are moved.

本體710作為覆蓋測試插口310並在測試插口310的上部形成清潔空間的結構,可以為多種結構,可以具有碗形狀等多種形狀來形成 密閉的清潔空間,並且可以設置有空氣流路711,與空氣供給裝置(未圖示)連接以向各個測試插口310噴射空氣;及一個以上的噴嘴712,從空氣流路711接收傳達的空氣以向測試插口310噴射空氣。The body 710 is configured to cover the test socket 310 and form a cleaning space on the upper portion of the test socket 310. The structure may be a plurality of structures, and may have various shapes such as a bowl shape. a closed cleaning space, and an air flow path 711 may be provided, connected to an air supply device (not shown) to inject air to each test socket 310, and one or more nozzles 712 to receive the air conveyed from the air flow path 711. Air is injected to the test socket 310.

與此同時,本體710可以與排出管713連接,以使通過噴嘴712噴射的空氣與異物一同從清潔空間向外部排出。At the same time, the body 710 may be coupled to the discharge pipe 713 such that the air sprayed through the nozzle 712 is discharged together with the foreign matter from the cleaning space to the outside.

驅動部720作為用於在測試部300的一側及測試插口310之間移動本體710的結構,可以為液壓缸、氣壓缸等多種結構。The drive unit 720 has a configuration for moving the body 710 between one side of the test unit 300 and the test socket 310, and may be of various configurations such as a hydraulic cylinder or a pneumatic cylinder.

此處,第一接送部610及第二接送部620上設置導軌611、621時,清潔部700可以設置於第一接送部610及第二接送部620,驅動部720構成為使本體710沿與導軌611、621平行的方向進行線性移動的結構。Here, when the guide rails 611 and 621 are provided on the first pick-up unit 610 and the second pick-up unit 620, the cleaning unit 700 may be disposed in the first pick-up unit 610 and the second pick-up unit 620, and the drive unit 720 is configured to cause the body 710 to follow The guide rails 611 and 621 are linearly moved in a direction parallel to each other.

另一方面,可以設置有一個以上的載入移送工具810、814,在載入部100與接送部610、620的之間進行移動並從載入部100選取元件1來傳達到接送部610、620。如上所述的情況下,可以構成為,一個以上的載入移送工具810、814在載入部100與接送部610、620之間進行移動以從載入部100選取元件1而傳達到接送部610、620的結構。此外,如上所述,設置有載入緩衝部200的情況下,載入移送工具810、814可以包括:第一載入移送工具810,從載入部100選取元件1以傳達到載入緩衝部200;第二載入移送工具814,從載入緩衝部200選取元件1以傳達到接送部610、620。On the other hand, one or more load transfer tools 810 and 814 may be provided to move between the loading unit 100 and the pick-up units 610 and 620, and the component 1 is selected from the loading unit 100 to be transmitted to the pick-up unit 610. 620. In the case described above, one or more load transfer tools 810 and 814 may be moved between the loading unit 100 and the pick-up units 610 and 620 to select the component 1 from the loading unit 100 and transmit it to the pick-up unit. The structure of 610, 620. Further, as described above, in the case where the load buffer unit 200 is provided, the load transfer tool 810, 814 may include a first load transfer tool 810, and the component 1 is selected from the load unit 100 to be transmitted to the load buffer unit. 200; a second load transfer tool 814, which selects the component 1 from the load buffer unit 200 to be transmitted to the pick-up unit 610, 620.

此外,可以設置有一個以上的卸載移送工具820、824,在接送部610、620與卸載部500之間進行移動並從接送部610、620選取元件1以傳達到卸載部500。如上所述的情況下,可以構成為,一個以上的卸載移送工具820、824在接送部610、620與卸載部500之間進行移動來從接送部610、620選取元件1來傳達到卸載部500的結構。此外,如上所述,設置有卸載緩衝部400的情況下,卸載移送工具820、824可以包括:第一卸載移送工具820,從卸載緩衝部400選取元件1以傳達到卸載部500;第二卸載移送工具824,從接送部610、620選取元件1以傳達到卸載緩衝部400。Further, one or more unloading transfer tools 820, 824 may be provided, moving between the pick-up portions 610, 620 and the unloading portion 500, and the component 1 is selected from the pick-up portions 610, 620 to be communicated to the unloading portion 500. In the case as described above, one or more unloading transfer tools 820 and 824 may be moved between the pick-up units 610 and 620 and the unloading unit 500 to select the component 1 from the pick-up units 610 and 620 to be transmitted to the unloading unit 500. Structure. Further, as described above, in the case where the unloading buffer portion 400 is provided, the unloading transfer tool 820, 824 may include: a first unloading transfer tool 820, the component 1 is selected from the unloading buffer portion 400 to be conveyed to the unloading portion 500; The transfer tool 824 picks up the component 1 from the pick-up unit 610, 620 to communicate to the unloading buffer unit 400.

載入移送工具810、814及卸載移送工具820、824可以構成為相互相同或類似的結構。載入移送工具810、814及卸載移送工具820、824分別作為移送元件1的結構,可以包括:多個選取器,用於選取元件1;及驅動裝置,用於沿上下方向(Z方向)及水平方向(X-Y方向)等方向移 動多個選取器。The load transfer tools 810, 814 and the unload transfer tools 820, 824 may be configured to be identical or similar to each other. The loading transfer tools 810, 814 and the unloading transfer tools 820, 824 are respectively configured as the transfer component 1, and may include: a plurality of selectors for selecting the component 1; and a driving device for the up and down direction (Z direction) and Directional shift in the horizontal direction (XY direction) Move multiple pickers.

選取器作為用於選取元件1來移送到指定位置的結構,可以為多種結構,可以由在元件1的上面形成真空壓的吸附板及向吸附板傳達氣壓的氣缸構成。The picker is a structure for picking up the component 1 and transporting it to a specified position, and may have various structures, and may be composed of an adsorption plate that forms a vacuum pressure on the upper surface of the element 1 and a cylinder that transmits air pressure to the adsorption plate.

選取器,考慮到載入部100及卸載部500的托盤2的收容槽2a的間隔及載入緩衝部200與卸載緩衝部400的板部件210、410的裝載槽211、411的間隔相互不同的情況,可以構成為可調節橫豎間隔的結構,也可以固定橫豎間隔來可以使更多數量的半導體元件1進行移送。The selector takes into consideration that the interval between the storage grooves 2a of the trays 2 of the loading unit 100 and the unloading unit 500 and the intervals between the loading buffers 200 and the loading grooves 211 and 411 of the plate members 210 and 410 of the unloading buffer unit 400 are different from each other. In this case, it is possible to configure the structure in which the horizontal and vertical intervals can be adjusted, or to fix the horizontal and vertical intervals so that a larger number of semiconductor elements 1 can be transferred.

移動多個選取器的驅動裝置,根據選取器的驅動方案可以為多種結構,其結構可以包括:上下移動裝置,用於上下移動選取器;及左右移動裝置,用於左右移動選取器。上下移動裝置可以為使所有選取器共同地進行上下移動的結構,或與各個選取器個別地進行連接以使各個選取器獨立地進行上下移動。左右移動裝置,根據選取器的移動方案,可以為多種結構,可以為沿X方向或Y方向的單一方向移動的結構或可沿X-Y方向移動的結構。The driving device for moving the plurality of pickers may be of various structures according to the driving scheme of the picker, and the structure thereof may include: an up and down moving device for moving the picker up and down; and a left and right moving device for moving the picker left and right. The up and down moving means may be a structure for causing all of the pickers to move up and down in common, or individually connected to the respective pickers to cause the respective pickers to move up and down independently. The left and right moving devices may be of various structures according to the moving scheme of the picker, and may be a structure moving in a single direction in the X direction or the Y direction or a structure movable in the X-Y direction.

另一方面,可以設置有元件加壓工具830、840,在測試部300與接送部610、620之間進行移動,並從接送部610、620選取元件1以加壓測試插口310,並將在測試插口310進行加壓完成測試的元件傳達至接送部610、620。元件加壓工具830、840,作為用於在測試部300與第一接送部610之間,及測試部300與第二接送部620之間移送元件的結構,根據元件1的移送方案,可以為多種結構。元件加壓工具830、840可以包括:第一元件加壓工具830,在第一接送部610與測試部300之間進行移動,以從第一接送部610選取元件並加壓測試插口310,並將在測試插口310進行加壓完成測試的元件傳達至第一接送部;第二元件加壓工具840,在第二接送部620與測試部300之間進行移動以從第二接送部620選取元件1並加壓測試插口310,並將在測試插口310進行加壓完成測試的元件傳達至第二接送部620。如上所述,在元件加壓工具830、840構成為一對時,為了元件交換的便利,一對元件加壓工具830、840可以相互聯動地進行移動。On the other hand, the component pressurizing tools 830, 840 may be provided to move between the test portion 300 and the pick-up portions 610, 620, and the component 1 is selected from the pick-up portions 610, 620 to pressurize the test socket 310, and will be The components of the test socket 310 that perform the pressurization completion test are communicated to the pick-up and drop parts 610, 620. The component pressurizing tools 830 and 840 are configured to transfer components between the test unit 300 and the first pick-up unit 610 and between the test unit 300 and the second pick-up unit 620, and may be configured according to the transfer scheme of the component 1. A variety of structures. The component pressurizing tools 830, 840 may include: a first component pressurizing tool 830 that moves between the first pick-up portion 610 and the test portion 300 to pick up components from the first pick-up portion 610 and pressurize the test socket 310, and The component that performs the pressurization completion test at the test socket 310 is transmitted to the first pick-up portion; the second component pressurizing tool 840 moves between the second pick-up portion 620 and the test portion 300 to select components from the second pick-up portion 620 1 and the test socket 310 is pressurized, and the component that is pressurized at the test socket 310 to complete the test is transmitted to the second pick-up unit 620. As described above, when the component pressurizing tools 830 and 840 are configured in a pair, the pair of component pressurizing tools 830 and 840 can move in conjunction with each other for the convenience of component exchange.

例如,如第9圖至第15圖所示,元件加壓工具830、840可以具有與載入移送工具810、814及卸載移送工具820、824相互相同或類似的結構。元件加壓工具830、840可以包括選取元件1的多個選取器831、 841。For example, as shown in FIGS. 9 through 15, the component press tools 830, 840 may have the same or similar structure as the load transfer tools 810, 814 and the unload transfer tools 820, 824. The component press tools 830, 840 may include a plurality of pickers 831 that select the component 1, 841.

另一方面,為了容易執行板部件210、410與測試部300之間的元件交換,板部件210、410的裝載槽211、411之間的間隔可以形成為元件加壓工具830、840的選取器831、841的間隔的1/n,例如形成為1/2。此處,n為2以上的自然數。On the other hand, in order to easily perform the component exchange between the plate members 210, 410 and the test portion 300, the interval between the loading grooves 211, 411 of the plate members 210, 410 may be formed as a selector of the component press tools 830, 840. 1/n of the interval between 831 and 841 is formed, for example, to 1/2. Here, n is a natural number of 2 or more.

特別是,卸載緩衝部400的板部件210、410的裝載槽211、411安置為16×8,測試部300的測試插口310安置為8×4時,元件加壓工具830、840會包括以對應於測試部300的測試插口310的間隔安置為8×4的選取器831、841,從而可以一次性移送8×4的元件1。特別是,為了可以移送更多數量的半導體元件1,第一載入移送工具810的選取器安置為8×4(8×2)時,元件加壓工具830、840的選取器831、841可以安置為8×4(8×2)。Specifically, when the loading grooves 211, 411 of the plate members 210, 410 of the unloading buffer portion 400 are disposed at 16 × 8 and the test sockets 310 of the test portion 300 are disposed at 8 × 4, the component pressing tools 830, 840 are included to correspond. The intervals of the test sockets 310 of the test portion 300 are arranged as 8x4 pickers 831, 841 so that the 8x4 elements 1 can be transferred at once. In particular, in order to be able to transfer a larger number of semiconductor elements 1, when the picker of the first load transfer tool 810 is placed at 8x4 (8x2), the pickers 831, 841 of the component press tools 830, 840 can Placed at 8×4 (8×2).

此外,元件加壓工具830、840,通過在卸載緩衝部400的板部件210、410的裝載槽211、411中,使元件1間隔一格地進行導出或裝載,從而無需進行選取器831、841間的間隔調節,從而可以使元件移送更加快捷。Further, the component press tools 830, 840 are caused to be ejected or loaded one by one in the loading grooves 211, 411 of the plate members 210, 410 of the unloading buffer portion 400, thereby eliminating the need for the selectors 831, 841. The spacing between the two is adjusted so that component transfer can be made faster.

另一方面,元件加壓工具830、840有必要根據元件1的種類、大小等來進行選取器831、841的替換。On the other hand, it is necessary for the component pressing tools 830 and 840 to replace the selectors 831 and 841 in accordance with the type, size, and the like of the components 1.

因此,如第9圖至第15圖所示,元件加壓工具830、840可以包括:支持部833、843,可移動地設置在元件檢測裝置的內部;一個以上的選取模組834、844,可裝卸地結合於支持部833、843,並結合有一個以上的選取器831、841。Therefore, as shown in FIGS. 9 to 15, the component pressing tools 830, 840 may include: support portions 833, 843 movably disposed inside the component detecting device; and one or more selection modules 834, 844, Removably coupled to the support portions 833, 843 and incorporating more than one selector 831, 841.

支持部833、843只要是可以支持選取模組834、844的結構,可以為任何結構。支持部833、843上可以具備有下側面為平面的第一支持板833a、843b,以使選取模組834、844可裝卸地進行固定。The support units 833 and 843 may have any structure as long as they can support the selection modules 834 and 844. The support portions 833 and 843 may be provided with first support plates 833a and 843b having a flat lower surface so that the selection modules 834 and 844 are detachably fixed.

選取模組834、844可以包括:第二支持板835、845,具有上側面,密著於第一支持板833a、843b的下側面;阻尼器839、849,結合於第二支持板835、845;加熱模組838、848,結合於阻尼器839、849;選取器支持模組836、846,結合於加熱模組838、848;選取器831、841,固定於選取器支持模組836、846。The selection modules 834, 844 may include: second support plates 835, 845 having upper sides adhered to the lower sides of the first support plates 833a, 843b; dampers 839, 849 coupled to the second support plates 835, 845 The heating modules 838, 848 are coupled to the dampers 839, 849; the selector support modules 836, 846 are coupled to the heating modules 838, 848; the selectors 831, 841 are fixed to the selector support modules 836, 846 .

如第10圖所示,選取器831、841可以由固定於選取器支持 模組836、846的中空的結合部件891與可裝卸地結合於結合部件891的端部的中空的吸附板892構成。吸附板892可以形成比結合部件891的外周面更凸出的凸出部892a。結合部件891,可以通過引導部件893可裝卸地固定於選取器支持模組836、846。這種選取器831、841,在結合部件891與吸附板892結合的狀態下設置於選取模組834、844。吸附板892通過結合部件891以與吸入流路899連接。吸附板892可以由橡膠、合成樹脂等的柔韌性材質構成。As shown in FIG. 10, the pickers 831, 841 can be supported by the picker. The hollow coupling member 891 of the modules 836, 846 is constructed with a hollow suction plate 892 that is detachably coupled to the end of the coupling member 891. The suction plate 892 can form a projection 892a that is more convex than the outer circumferential surface of the coupling member 891. The coupling member 891 can be detachably fixed to the picker support modules 836, 846 by the guiding member 893. The selectors 831, 841 are disposed in the selection modules 834, 844 in a state where the coupling member 891 is coupled to the suction plate 892. The suction plate 892 is coupled to the suction flow path 899 by a coupling member 891. The adsorption plate 892 can be made of a flexible material such as rubber or synthetic resin.

阻尼器839、849,在元件1加壓測試插口310的過程中,產 生調節元件1對測試插口310的接觸力作用的同時,也產生緩衝向選取模組834、844施加力的作用。例如,阻尼器839、849可以包括:室839d、849d,內部形成一定的空間,並形成有與空間聯通的氣壓通路839c、849c;彈性膜839a、849a,安置於室839d、849d的內部;加壓部件839b、849b,通過加熱模組838、848與選取器831、841連接,以對彈性膜839a、849a加壓。根據這種結構,通過氣壓通路839c、849c向室839d、849d的內部空間作用氣壓時,彈性膜839a、849a會彈性變形以對加壓部件839b、849b作用規定的壓力。由此,根據作用於室839d、849d的內部的氣壓與彈性膜839a、849a的彈性而使元件1加壓測試插口310時,決定元件1對於測試插口310的接觸力。此外,根據作用於室839d、849d的內部的氣壓與彈性膜839a、849a的彈性,在通過作用於加壓部件839b、849b的壓力而使元件1加壓測試插口310過程中,對施加到選取模組834、844力進行緩衝。Dampers 839, 849, during the process of component 1 pressurizing test socket 310 While the adjustment element 1 acts on the contact force of the test socket 310, it also acts to apply a force to the selection modules 834, 844. For example, the dampers 839, 849 may include: chambers 839d, 849d, a certain space is formed inside, and air pressure passages 839c, 849c communicating with the space are formed; elastic films 839a, 849a are disposed inside the chambers 839d, 849d; The pressing members 839b, 849b are connected to the pickers 831, 841 through the heating modules 838, 848 to pressurize the elastic films 839a, 849a. According to this configuration, when the air pressure is applied to the internal spaces of the chambers 839d and 849d by the air pressure passages 839c and 849c, the elastic films 839a and 849a are elastically deformed to apply a predetermined pressure to the pressurizing members 839b and 849b. Thereby, when the element 1 pressurizes the test socket 310 in accordance with the air pressure acting on the inside of the chambers 839d, 849d and the elasticity of the elastic films 839a, 849a, the contact force of the element 1 with respect to the test socket 310 is determined. Further, according to the air pressure acting on the inside of the chambers 839d, 849d and the elasticity of the elastic films 839a, 849a, in the process of pressurizing the test socket 310 by the pressure acting on the pressing members 839b, 849b, the pair is applied to the selection. Modules 834, 844 force buffering.

另一方面,在元件加壓工具830、840上設置多個選取模組834、844時,作用於室839d、849d的內部空間的氣壓,可以根據多個選取模組834、844來調節為相互不同。即,利用多個選取模組834、844以將多個元件1加壓多個測試插口310的過程中,多數個元件1需要以均勻的接觸力加壓到多個測試插口310,才能同時對多個元件1執行均勻的測試。但是,多個選取模組834、844的規格,例如,選取器831、841的位置、彈性膜839a、849a的彈性力、組裝公差、部件的老化程度等無法肯定一致,因此多個元件1有可能會不均勻地加壓測試插口310。因此,根據多個選取模組834、844以對作用於室839d、849d的內部空間的氣壓進行個別性地調節,由此可以使多個元件1以均勻的接觸力加壓到多個測試插口310。On the other hand, when a plurality of selection modules 834, 844 are provided on the component pressing tools 830, 840, the air pressure acting on the internal spaces of the chambers 839d, 849d can be adjusted to each other according to the plurality of selection modules 834, 844. different. That is, in the process of using a plurality of selection modules 834, 844 to press a plurality of components 1 into a plurality of test sockets 310, a plurality of components 1 need to be pressurized to a plurality of test sockets 310 with a uniform contact force. A plurality of components 1 perform a uniform test. However, the specifications of the plurality of selection modules 834, 844, for example, the positions of the pickers 831, 841, the elastic force of the elastic films 839a, 849a, the assembly tolerances, the degree of aging of the components, etc., cannot be surely consistent, and thus the plurality of components 1 have The test socket 310 may be unevenly pressurized. Therefore, the air pressures acting on the internal spaces of the chambers 839d, 849d are individually adjusted according to the plurality of selection modules 834, 844, whereby the plurality of components 1 can be pressurized to the plurality of test sockets with a uniform contact force. 310.

另一方面,考慮到選取模組834、844上設置通過氣壓而運行 的阻尼器839、849,支持部833、843及選取模組834、844上可以形成有氣壓連接通路833b、843b、835b、845b,與阻尼器839、849的氣壓通路839c、849c連接。這種氣壓通路833b、843b、835b、845b可以包括:第一氣壓通路833b、843b,形成於支持部833、843的第一支持板833a、843a,與外部的氣壓發生源(未圖示)連接;第二氣壓通路835b、845b,形成於選取模組834、844的第二支持板835、845,以使第一氣壓通路833b、843b與阻尼器839、849的氣壓通路839c、849c聯通。由此,無需使氣壓發生源與阻尼器839、849的氣壓通路839c、849c連接的額外作業即可通過選取模組834、844結合於支持部833、843,使阻尼器839、849的氣壓通路839c、849c自動連接。On the other hand, considering that the selection modules 834, 844 are set to operate by air pressure The dampers 839 and 849, the support portions 833 and 843, and the selection modules 834 and 844 may be formed with air pressure connection passages 833b, 843b, 835b, and 845b, and are connected to the air pressure passages 839c and 849c of the dampers 839 and 849. The air pressure passages 833b, 843b, 835b, and 845b may include first air pressure passages 833b and 843b, and first support plates 833a and 843a formed on the support portions 833 and 843, and connected to an external air pressure generating source (not shown). The second air pressure passages 835b, 845b are formed on the second support plates 835, 845 of the selection modules 834, 844 such that the first air pressure passages 833b, 843b communicate with the air pressure passages 839c, 849c of the dampers 839, 849. Thus, the additional operation of connecting the air pressure generating source to the air pressure passages 839c, 849c of the dampers 839, 849 can be performed by the selection modules 834, 844 being coupled to the support portions 833, 843 to make the air pressure passages of the dampers 839, 849 839c, 849c are automatically connected.

選取器支持模組836、846作為支持選取器831、841的部分,可以形成有吸入流路899,以與選取器831、841的吸附板892聯通。The selector support modules 836 and 846 are provided as portions supporting the selectors 831 and 841, and a suction flow path 899 may be formed to communicate with the adsorption plates 892 of the selectors 831 and 841.

吸入流路899與真空壓發生源(未圖示)連接以產生吸入空氣的通路的功能,根據通過吸入流路899吸入空氣,吸附板892上可以形成有負壓,通過這種負壓,元件1會吸附於吸附板892。這種吸入流路899可以形成於選取模組834、844的內部,但是本發明並不限定於此,吸入流路899可以由與吸附板892連接的獨立的管來構成。The suction flow path 899 is connected to a vacuum pressure generating source (not shown) to generate a function of a passage for sucking air. According to the suction air through the suction flow path 899, a negative pressure can be formed on the adsorption plate 892, and the negative pressure is caused by the negative pressure. 1 will adsorb to the adsorption plate 892. Such a suction flow path 899 may be formed inside the selection modules 834, 844, but the present invention is not limited thereto, and the suction flow path 899 may be constituted by a separate tube connected to the adsorption plate 892.

另一方面,考慮到選取模組834、844上設置有選取器支持模組836、846,具有與吸附板892聯通的吸入流路899,支持部833、843及選取模組834、844上可以形成有真空壓連接通路833c、843c、835c、845c,通過吸入流路899與管等進行連接。這種真空壓連接通路833c、843c、835c、845c可以包括:第一真空壓連接通路833c、843c,形成於支持部833、843的第一支持板833a、843a,與外部的真空壓發生源(未圖示)連接;第二真空壓連接通路835c、845c,形成於選取模組834、844的第二支持板835、845,以與第一真空壓連接通路833c、843c聯通。由此,無需使真空壓發生源與吸入流路899連接的額外作業即可通過選取模組834、844結合於支持部833、843,使真空壓發生源與吸入流路899自動連接。On the other hand, considering that the selection modules 834, 844 are provided with the selector support modules 836, 846, the suction flow path 899 is connected to the adsorption plate 892, and the support portions 833, 843 and the selection modules 834, 844 can be Vacuum pressure connection passages 833c, 843c, 835c, and 845c are formed, and are connected to a pipe or the like through the suction flow path 899. The vacuum pressure connection passages 833c, 843c, 835c, and 845c may include first vacuum pressure connection passages 833c, 843c, first support plates 833a, 843a formed on the support portions 833, 843, and external vacuum pressure generation sources ( The second vacuum pressure connection passages 835c and 845c are formed in the second support plates 835 and 845 of the selection modules 834 and 844 to communicate with the first vacuum pressure connection passages 833c and 843c. Thereby, the vacuum pressure generating source and the suction flow path 899 can be automatically connected by the selection modules 834 and 844 to the support portions 833 and 843 without additional work for connecting the vacuum pressure generating source to the suction flow path 899.

阻尼器839、849與選取器支持模組836、846之間可以設置作為用於加熱元件1的加熱部的加熱模組838、848,從而使測試部300在一定溫度下對元件1執行測試。加熱模組838、848上可以設置有加熱器838a、848a。A heating module 838, 848 as a heating portion for the heating element 1 may be disposed between the dampers 839, 849 and the picker support modules 836, 846, thereby causing the test portion 300 to perform testing on the component 1 at a certain temperature. Heaters 838, 848 may be provided with heaters 838a, 848a.

元件加壓工具830、840上設置多個選取模組834、844時, 多個加熱器838a、848a可以分別設置於多個選取模組834、844。如上所述的情況下,多個加熱器838a、848a可以根據多個選取模組834、844進行獨立的控制。When a plurality of selection modules 834 and 844 are disposed on the component pressing tools 830 and 840, The plurality of heaters 838a, 848a may be disposed in the plurality of selection modules 834, 844, respectively. In the case described above, the plurality of heaters 838a, 848a can be independently controlled in accordance with the plurality of selection modules 834, 844.

如上所述,選取模組834、844上還可以具備溫度感測器838b、848b,與加熱器838a、848a連接以直接感應加熱器838a、848a的溫度,或與連接在加熱器838a、848a的其他物體連接以間接感應加熱器838a、848a的溫度。多個加熱器838a、848a分別設置於多個選取模組834、844時,多個溫度感測器838b、848b可以分別設置於多個選取模組834、844。多個溫度感測器838b、848b感應多個加熱器838a、848a的溫度,根據通過多個溫度感測器838b、848b感應的結果,來控制多個加熱器838a、848a的溫度。As noted above, the selection modules 834, 844 may also be provided with temperature sensors 838b, 848b coupled to the heaters 838a, 848a to directly sense the temperature of the heaters 838a, 848a, or to the heaters 838a, 848a. Other objects are connected to indirectly sense the temperature of the heaters 838a, 848a. When the plurality of heaters 838a, 848a are respectively disposed in the plurality of selection modules 834, 844, the plurality of temperature sensors 838b, 848b may be respectively disposed in the plurality of selection modules 834, 844. The plurality of temperature sensors 838b, 848b sense the temperatures of the plurality of heaters 838a, 848a, and control the temperatures of the plurality of heaters 838a, 848a based on the results sensed by the plurality of temperature sensors 838b, 848b.

如上所述,各個選取模組834、844都具備有加熱器838a、848a及溫度感測器838b、848b,根據通過多個溫度感測器838b、848b感應的結果,可以獨立地控制加熱器838a、848a的溫度,由此可以根據由元件加壓工具830、840選取的多個元件1的特性,獨立調節溫度以更加準確地執行對於元件1的測試。As described above, each of the selection modules 834, 844 is provided with heaters 838a, 848a and temperature sensors 838b, 848b. According to the results of sensing by the plurality of temperature sensors 838b, 848b, the heater 838a can be independently controlled. The temperature of 848a, whereby the temperature can be independently adjusted according to the characteristics of the plurality of elements 1 selected by the element pressing tools 830, 840 to perform the test for the element 1 more accurately.

此時,考慮到選取模組834、844上會設置有加熱器838a、848a或溫度感測器838b、848b,支持部833、843的第一支持板833a、843a及選取模組834、844的第二支持板835、845可以由隔熱材質構成。此外,加熱模組838、848與阻尼器839、849之間,及阻尼器839、849與第二支持板835、845之間可以設置有隔熱部件(未圖示)。此外,選取模組834、844上可以設置有一個以上的第一連接器91,用於對加熱器838a、848a或溫度感測器838b、848b供給電源或傳達信號。At this time, it is considered that the selection modules 834, 844 are provided with heaters 838a, 848a or temperature sensors 838b, 848b, first support plates 833a, 843a of the support portions 833, 843 and selection modules 834, 844 The second support plates 835, 845 may be constructed of a heat insulating material. Further, a heat insulating member (not shown) may be disposed between the heating modules 838, 848 and the dampers 839, 849, and between the dampers 839, 849 and the second support plates 835, 845. In addition, one or more first connectors 91 may be provided on the selection modules 834, 844 for supplying power or signaling signals to the heaters 838a, 848a or the temperature sensors 838b, 848b.

此外,在支持部833、843上可以設置第二連接器92,與選取模組834、844結合時,通過與第一連接器91結合以對加熱器838a、848a或溫度感測器838b、848b供給電源及傳達信號。In addition, a second connector 92 can be disposed on the support portions 833, 843. When combined with the selection modules 834, 844, by combining with the first connector 91 to the heaters 838a, 848a or the temperature sensors 838b, 848b Supply power and communicate signals.

第一連接器91的端子與第二連接器92的端子,可以通過相互插入的方式等進行相互電氣連接等,可以為多種結構。The terminal of the first connector 91 and the terminal of the second connector 92 can be electrically connected to each other by being inserted into each other or the like, and can have various configurations.

根據如上所述的第一連接器91及第二連接器92的結構,可以無需額外的連接作業,即可通過選取模組834、844及支持部833、843 的結合來以加熱器838a、848a或溫度感測器838b、848b供給電源及傳達信號。即,第一連接器91及第二連接器92,在選取模組834、844及支持部833、843的結合時,設置於相互接觸的部分,從而在選取模組834、844及支持部833、843相互結合時自動連接。According to the structures of the first connector 91 and the second connector 92 as described above, the modules 834, 844 and the support portions 833, 843 can be selected without additional connection work. The combination provides power to the heaters 838a, 848a or temperature sensors 838b, 848b and signals. That is, the first connector 91 and the second connector 92 are disposed at portions that are in contact with each other when the combination of the selection modules 834, 844 and the support portions 833, 843, so that the selection modules 834, 844 and the support portion 833 When 843 is combined with each other, it is automatically connected.

另一方面,用於加熱元件1的加熱部的其他例子,如第14圖 及第15圖所示,元件加壓工具830、840上,可以設置加熱氣體噴射單元,向選取到選取器831、841上的元件1噴射加熱氣體。通過加熱氣體噴射單元,元件1可以由向元件1噴射加熱氣體以進行加熱,由此,可以對元件1執行高溫測試。在元件加壓工具830、840上設置多個選取模組834、844時,多個加熱氣體噴射單元可以分別設置於多個選取模組834、844。如上所述的情況下,通過多個加熱氣體噴射單元噴射的加熱氣體的溫度,可以根據多個選取模組834、844進行獨立的控制。On the other hand, another example of the heating portion for the heating element 1 is as shown in Fig. 14. As shown in Fig. 15, on the component pressurizing tools 830, 840, a heated gas ejecting unit may be provided to eject the heating gas to the element 1 selected on the pickers 831, 841. By heating the gas ejecting unit, the element 1 can be heated by injecting a heating gas to the element 1, whereby the high temperature test can be performed on the element 1. When a plurality of selection modules 834, 844 are provided on the component pressing tools 830, 840, a plurality of heating gas spraying units may be respectively disposed in the plurality of selection modules 834, 844. In the case as described above, the temperature of the heating gas injected by the plurality of heated gas injection units can be independently controlled according to the plurality of selection modules 834, 844.

加熱氣體噴射單元可以包括:引導部件893,安置於吸附板 892的外周,與吸附板892一同形成有噴射加熱氣體的噴射口894;加熱氣體流路895,與加熱氣體供給器896連接,所述加熱氣體供給器與噴射口894聯通以供給加熱氣體。加熱氣體流路895可以形成於加熱模組838、848的內部。加熱噴射口894的形狀可以形成為,將通過噴射口894噴射的加熱氣體向吸附於吸附板892的元件1噴射的多種形狀。吸附板892的外周為了形成噴射口894,引導部件893在沿吸附板892的外周面相隔一定間隔的狀態下,結合於選取器支持模組836、846以包裹吸附板892的外周。噴射口894通過加熱氣體流路895以與加熱氣體供給器896連接。加熱氣體流路895可以形成於選取模組834、844的內部,但是本發明並不限定於此,加熱氣體流路895可以由與吸附板892連接的獨立的管構成。The heating gas spraying unit may include: a guiding member 893 disposed on the adsorption plate An outer periphery of the 892 is formed with an injection port 894 for injecting a heated gas together with a suction plate 892; a heating gas flow path 895 is connected to the heating gas supplier 896, and the heating gas supplier is connected to the injection port 894 to supply the heating gas. The heating gas flow path 895 may be formed inside the heating modules 838, 848. The shape of the heating injection port 894 may be formed in various shapes in which the heating gas injected through the injection port 894 is ejected toward the element 1 adsorbed to the adsorption plate 892. In order to form the injection port 894, the guide member 893 is coupled to the picker support modules 836, 846 to wrap the outer periphery of the suction plate 892 with a certain interval along the outer peripheral surface of the suction plate 892. The injection port 894 is connected to the heating gas supplier 896 by a heating gas flow path 895. The heating gas flow path 895 may be formed inside the selection modules 834, 844, but the present invention is not limited thereto, and the heating gas flow path 895 may be constituted by a separate tube connected to the adsorption plate 892.

根據如上所述的結構,元件加壓工具830、840的選取器831、 841的吸附板892在吸附元件1的狀態下,根據加熱氣體供給器896的運行,從形成於吸附板892的外周的噴射口894噴射加熱氣體,噴射的加熱氣體衝撞向吸附於吸附板892的元件1上以使元件1加熱。如上所述,元件1的加熱是通過加熱氣體來直接執行,因此與在選取模組834、844上利用加熱器838a、848a來對元件1加熱的情況相比,用於加熱元件1的熱傳達效率增加,從而不僅可以迅速地加熱元件1,而且可以使元件1的溫度下降最小化,由此可以使元件1在已設定的溫度下執行準確的檢測。According to the structure as described above, the selector 831 of the component pressurizing tools 830, 840, In the state of the adsorption element 1, the adsorption plate 892 of the 841 ejects the heating gas from the injection port 894 formed on the outer periphery of the adsorption plate 892 in accordance with the operation of the heating gas supplier 896, and the injected heating gas collides against the adsorption plate 892. Element 1 is used to heat element 1. As described above, the heating of the element 1 is directly performed by heating the gas, so that the heat transfer for the heating element 1 is compared with the case where the heaters 838a, 848a are used to heat the element 1 on the selection modules 834, 844. The efficiency is increased so that not only the element 1 can be heated quickly, but also the temperature drop of the element 1 can be minimized, whereby the element 1 can be subjected to accurate detection at a set temperature.

形成有從吸附板892的外周噴射加熱氣體的噴射口894時, 選取模組834、844可以不設置有加熱器838a、848a,由此,可以解除用於在選取模組834、844設置加熱器838a、848a而導致的設計的複雜性及組裝的困難性。當然,選取模組834、844上可以同時設置有加熱器838a、848a及加熱氣體噴射單元。When the injection port 894 that ejects the heating gas from the outer periphery of the adsorption plate 892 is formed, The selection modules 834, 844 may not be provided with heaters 838a, 848a, thereby eliminating the complexity of the design and the difficulty of assembly caused by the heaters 838a, 848a being provided in the selection modules 834, 844. Of course, the selection modules 834, 844 can be provided with heaters 838a, 848a and a heated gas injection unit at the same time.

此外,元件加壓工具830、840在將元件1加壓測試插口310 的過程中,可以從噴射口894噴射加熱氣體,噴射的加熱氣體衝撞測試插口310以使測試插口310加熱。如上所述,測試插口310的加熱是直接通過加熱氣體來執行,因此與測試插口310上設置加熱器並利用其來對測試插口310加熱的情況相比,可以解除用於在測試插口310上設置加熱器而導致的設計複雜性及組裝困難性。In addition, the component press tools 830, 840 pressurize the component 1 to test the socket 310. During the process, the heated gas may be injected from the injection port 894, and the injected heated gas collides with the test socket 310 to heat the test socket 310. As described above, the heating of the test socket 310 is performed directly by heating the gas, and thus can be released for setting on the test socket 310 as compared with the case where the heater is set on the test socket 310 and used to heat the test socket 310. Design complexity and assembly difficulties caused by heaters.

另一方面,選取模組834、844上可以設置有用於感應加熱氣 體溫度的溫度感測器838b、848b。由此,可以根據通過多個溫度感測器838b、848b感應的結果,控制向元件1噴射的加熱氣體的溫度。在多個加熱氣體噴射單元分別設置於多個選取模組834、844的情況下,多個溫度感測器838b、848b可以分別設置於多個選取模組834、844。多個溫度感測器838b、848b感應向各個選取模組834、844選取的元件1噴射的加熱氣體的溫度,根據通過多個溫度感測器838b、848b感應的結果,可以控制加熱氣體的溫度。On the other hand, the selection modules 834, 844 can be provided with induction heating gas. Body temperature temperature sensors 838b, 848b. Thereby, the temperature of the heating gas injected to the element 1 can be controlled based on the result of induction by the plurality of temperature sensors 838b, 848b. In the case where the plurality of heating gas spraying units are respectively disposed in the plurality of selection modules 834, 844, the plurality of temperature sensors 838b, 848b may be respectively disposed in the plurality of selection modules 834, 844. The plurality of temperature sensors 838b, 848b sense the temperature of the heated gas ejected by the component 1 selected by each of the selection modules 834, 844, and the temperature of the heated gas can be controlled based on the results of the sensing by the plurality of temperature sensors 838b, 848b. .

如上所述,因為各個選取模組834、844都分別設置有加熱氣 體噴射單元及溫度感測器838b、848b,並且根據通過多個溫度感測器838b、848b感應的結果,獨立控制向元件1噴射的加熱氣體的溫度,由此可以根據由元件加壓工具830、840選取的多個元件1的特性,獨立調節溫度以更加準確地執行對於元件1的測試。As described above, since each of the selection modules 834 and 844 are respectively provided with heating gas The body ejection unit and the temperature sensors 838b, 848b, and independently control the temperature of the heating gas injected to the element 1 based on the result of being induced by the plurality of temperature sensors 838b, 848b, whereby the pressing device 830 can be pressed according to the element The characteristics of the plurality of components 1 selected by 840 are independently adjusted to perform the test for the component 1 more accurately.

支持部833、843及選取模組834、844的一側可以設置有緊 固支持部833、843及選取模組834、844的緊固單元850,以使選取模組834、844可裝卸地結合於支持部833、843,支持部833、843及選取模組834、844的另一側可以設置有使選取模組834、844支持於支持部833、843的第一支持單元860。根據如上所述的結構,支持部833、843及選取模組834、844可以在通過第一支持單元860相互支持的狀態下,通過緊固單元850進行相互緊固。One side of the support portions 833, 843 and the selection modules 834, 844 can be set tightly The fastening portions 833 and 843 and the fastening units 850 of the selection modules 834 and 844 are configured to detachably couple the selection modules 834 and 844 to the support portions 833 and 843, the support portions 833 and 843, and the selection modules 834 and 844. The other side may be provided with a first support unit 860 that enables the selection modules 834, 844 to be supported by the support portions 833, 843. According to the configuration as described above, the support portions 833, 843 and the selection modules 834, 844 can be fastened to each other by the fastening unit 850 in a state of being mutually supported by the first support unit 860.

緊固單元850可以包括:環851,設置於選取模組834、844 的一側;環移動部件852使掛鈎沿上下方向進行移動;環掛鈎部件853設置於支持部833、843的一側以使環851掛於環掛鈎部件853。根據如上所述的結構,將環851掛於環掛鈎部件853,並通過利用環移動部件852以向下拉動環851,而使支持部833、843及選取模組834、844相互緊固。The fastening unit 850 can include a ring 851 disposed on the selection module 834, 844 One side; the ring moving member 852 moves the hook in the up and down direction; the ring hook member 853 is disposed on one side of the support portions 833, 843 to hook the ring 851 to the ring hook member 853. According to the above configuration, the ring 851 is hung on the ring hook member 853, and the support portions 833, 843 and the selection modules 834, 844 are fastened to each other by pulling the ring 851 downward by the ring moving member 852.

第一支持單元860可以包括:凸出片861,在選取模組834、 844的另一側以一定長度凸出;凸出片固定部862設置於選取模組834、844的另一側來使凸出片861插入並固定。凸出片固定部862可以由第一支持部件863設在支持部833、843的下側面,即,在第一支持板833a、843a的下側面以一定長度凸出,從而提供插入凸出片861的空間;第二支持部件864被第一支持部件863支持,並從支持部833、843的下側面相隔一定間隔地進行安置。第二支持部件864較佳的選擇為,與凸出片861接觸的面形成為曲面,以使凸出片861容易插入到支持部833、843的下側面與第二支持部件864之間的空間。此外,凸出片固定部862可以包括:彈性部件865,彈性支持第二支持部件864;固定部件866將彈性部件865固定於支持部833、843。因為第二支持部件864通過彈性部件865來彈性支持,因此凸出片861容易插入到支持部833、843的下側面與第二支持部件864之間的空間。此外,在凸出片861插入到支持部833、843的下側面與第二支持部件864之間的空間後,彈性部件865會對第二支持部件864加壓,以使凸出片861堅固地固定,從而不從支持部833、843的下側面與第二支持部件864之間的空間脫離。The first support unit 860 can include: a protruding piece 861, in the selection module 834, The other side of the 844 is protruded by a certain length; the protruding piece fixing portion 862 is disposed on the other side of the selection modules 834, 844 to insert and fix the protruding piece 861. The protruding piece fixing portion 862 may be provided on the lower side of the supporting portions 833, 843 by the first supporting member 863, that is, protruded at a length on the lower side of the first supporting plates 833a, 843a, thereby providing the insertion protruding piece 861. The second support member 864 is supported by the first support member 863 and disposed at a certain interval from the lower side of the support portions 833, 843. The second supporting member 864 is preferably selected such that the surface in contact with the protruding piece 861 is formed into a curved surface so that the protruding piece 861 can be easily inserted into the space between the lower side of the supporting portions 833, 843 and the second supporting member 864. . Further, the protruding piece fixing portion 862 may include an elastic member 865 that elastically supports the second supporting member 864, and the fixing member 866 fixes the elastic member 865 to the supporting portions 833, 843. Since the second support member 864 is elastically supported by the elastic member 865, the protruding piece 861 is easily inserted into the space between the lower side of the support portions 833, 843 and the second support member 864. Further, after the protruding piece 861 is inserted into the space between the lower side of the supporting portions 833, 843 and the second supporting member 864, the elastic member 865 pressurizes the second supporting member 864 so that the protruding piece 861 is firmly It is fixed so as not to be separated from the space between the lower side of the support portions 833, 843 and the second support member 864.

根據如上所述的結構,在凸出片861插入到支持部833、843 的下側面與第二支持部件864之間的空間並進行固定的狀態下,環851掛於環掛鈎部件853,並通過利用環移動部件852向下拉動環851的簡單的動作,可以使支持部833、843及選取模組834、844相互結合。According to the structure as described above, the protruding piece 861 is inserted into the support portions 833, 843 In a state in which the space between the lower side surface and the second support member 864 is fixed, the ring 851 is hung on the ring hook member 853, and the support portion can be pulled by the simple action of pulling the ring 851 by the ring moving member 852. 833, 843 and selection modules 834, 844 are combined with each other.

另一方面,支持部833、843及選取模組834、844上的較佳 選擇為具備有第二支持單元870,引導支持部833、843的下側面與選取模組834、844的上側面,即,第二支持板835、845的上側面相互密著,由此來使支持部833、843及選取模組834、844的相互結合動作更加容易執行。On the other hand, the support portions 833, 843 and the selection modules 834, 844 are preferably The second supporting unit 870 is selected to have the lower side of the guiding support portions 833 and 843 and the upper side surfaces of the selection modules 834 and 844, that is, the upper sides of the second supporting plates 835 and 845 are adhered to each other, thereby The combined action of the support units 833, 843 and the selection modules 834, 844 is easier to perform.

第二支持單元870可以包括:凸出條871,從選取模組834、 844的上側面凸出,在上部形成具有端坎部的頭部875;頭部收容部872,在支持部833、843的下側面內陷,來收容凸出條871的頭部875;及掛板873,形成有插入頭部875的頭部插入孔874。根據如上所述的結構,在支持部833、843及選取模組834、844相互結合的過程中,頭部875通過頭部插入孔874收容於頭部收容部872的內部,通過對於支持部833、843的選取模組834、844的相對水平移動,頭部875的端坎部掛於掛板873,由此使選取模組834、844支持於支持部833、843。The second supporting unit 870 can include: a protruding strip 871, from the selection module 834, a top surface of the 844 is protruded, and a head portion 875 having an end ridge portion is formed at an upper portion; the head receiving portion 872 is recessed at a lower side surface of the support portions 833, 843 to receive the head portion 875 of the protruding strip 871; The plate 873 is formed with a head insertion hole 874 into which the head 875 is inserted. According to the above configuration, in the process in which the support portions 833, 843 and the selection modules 834, 844 are coupled to each other, the head portion 875 is received in the inside of the head housing portion 872 through the head insertion hole 874, and passes through the support portion 833. The relative modules of the selection modules 834 and 844 move horizontally, and the end ridges of the head 875 are hung on the hanging plate 873, thereby enabling the selection modules 834, 844 to be supported by the support portions 833, 843.

如上所述的第二支持單元870一同執行使支持部833、843及選取模組834、844相互固定的作用,因此,可以在第一支持單元860與第二支持單元870中只具備任意一個結構即可。The second supporting unit 870 as described above performs the function of fixing the supporting portions 833 and 843 and the selecting modules 834 and 844 to each other. Therefore, only one of the first supporting unit 860 and the second supporting unit 870 can be provided. Just fine.

另一方面,支持部833、843及選取模組834、844之間,較佳的選擇為具備位置決定單元880,決定支持部833、843及選取模組834、844之間的結合位置。On the other hand, between the support portions 833 and 843 and the selection modules 834 and 844, it is preferable to include the position determining unit 880 to determine the bonding position between the support portions 833 and 843 and the selection modules 834 and 844.

例如,位置決定單元880可以包括:凸出棒881,從選取模組834、844的上側面凸出;凸出棒插入槽882,從支持部833、843的下側面內陷。根據如上所述的結構,在支持部833、843及選取模組834、844相互結合的過程中,凸出棒881插入到凸出棒插入槽882,以決定支持部833、843及選取模組834、844的結合位置。For example, the position determining unit 880 may include a protruding bar 881 protruding from the upper side of the selection modules 834, 844, and a protruding bar insertion slot 882 that is recessed from the lower side of the support portions 833, 843. According to the structure as described above, in the process in which the supporting portions 833, 843 and the selection modules 834, 844 are coupled to each other, the protruding rod 881 is inserted into the protruding rod insertion groove 882 to determine the supporting portions 833, 843 and the selection module. The combined position of 834 and 844.

另一方面,在支持部833、843及選取模組834、844相互結合的狀態下,支持部833、843的下側面及選取模組834、844的上側面相互密著。因此支持部833、843及選取模組834、844上較佳的選擇為具備感應感測器889,以感應支持部833、843的下側面及選取模組834、844的上側面的相互密著。圖中,雖然公開了感應感測器889安置於支持部833、843的下側面的結構,但是本發明並不限定於此,感應感測器889可以設置於選取模組834、844的上側面。感應感測器889可以由感應面接觸的壓力感測器構成。利用這種感應感測器889可以感應支持部833、843的下側面及選取模組834、844的上側面的相互密著與否,根據其感應結果可以判斷支持部833、843及選取模組834、844是否相互結合。On the other hand, in a state in which the support portions 833 and 843 and the selection modules 834 and 844 are coupled to each other, the lower side surfaces of the support portions 833 and 843 and the upper side surfaces of the selection modules 834 and 844 are closely adhered to each other. Therefore, the support portions 833 and 843 and the selection modules 834 and 844 are preferably selected to have an inductive sensor 889 to sense the lower sides of the support portions 833 and 843 and the upper sides of the selection modules 834 and 844. . In the figure, although the structure in which the inductive sensor 889 is disposed on the lower side of the supporting portions 833 and 843 is disclosed, the present invention is not limited thereto, and the inductive sensor 889 may be disposed on the upper side of the selecting modules 834 and 844. . The inductive sensor 889 can be constructed of a pressure sensor that is in contact with the sensing surface. The inductive sensor 889 can sense the closeness of the lower side of the support portions 833 and 843 and the upper sides of the selection modules 834 and 844, and can determine the support portions 833, 843 and the selection module according to the sensing result. Whether 834, 844 are combined with each other.

元件加壓工具830、840沿水平方向(Y軸方向)及垂直方向(X軸方向)進行移動,以將裝載於第一接送部610及第二接送部620的元件1移動至測試部的測試插口310,並將完成測試的元件1從測試插口 310移動至第一接送部610及第二接送部620。The component pressurizing tools 830 and 840 are moved in the horizontal direction (Y-axis direction) and the vertical direction (X-axis direction) to move the components 1 loaded on the first pick-up unit 610 and the second pick-up unit 620 to the test portion. Socket 310, and the component 1 that has completed testing from the test socket 310 moves to the first pick-up unit 610 and the second pick-up unit 620.

例如,如第16圖至第19圖所示,具備水平移動裝置801,分別與元件加壓工具830、840連接,以使元件加壓工具830、840分別沿水平方向(Y軸方向)移動;具備第一垂直移動裝置802,分別與元件加壓工具830、840連接,以使元件加壓工具830、840分別沿垂直方向(Z軸方向)移動。For example, as shown in FIGS. 16 to 19, a horizontal moving device 801 is provided, which is respectively connected to the component pressing tools 830 and 840 to move the component pressing tools 830 and 840 in the horizontal direction (Y-axis direction), respectively; The first vertical moving means 802 is provided, and is connected to the element pressing tools 830, 840, respectively, so that the element pressing tools 830, 840 are respectively moved in the vertical direction (Z-axis direction).

水平移動裝置801可以包括:連接部件830b、840b,連接成為限制從元件加壓工具830、840沿垂直方向延長的支持軸830a、840a水平方向上的移動且使其可在垂直方向進行移動。水平驅動部803,沿水平方向移動連接部件830b、840b。The horizontal moving device 801 may include connecting members 830b, 840b that are connected to restrict movement in the horizontal direction of the support shafts 830a, 840a extending from the element pressing tools 830, 840 in the vertical direction and to be movable in the vertical direction. The horizontal drive unit 803 moves the connecting members 830b and 840b in the horizontal direction.

連接部件830b、840b上可以形成有貫通孔830c、840c,沿垂直方向貫通來使支持軸830a、840a插入,從而使支持軸830a、840a在垂直方向上的移動被約束且可沿水平方向移動地連接於連接部件830b、840b。隨著支持軸830a、840a插入到連接部件830b、840b的貫通孔830c、840c,支持軸830a、840a的水平方向上的移動會通過連接部件830b、840b被約束,但是支持軸830a、840a的垂直方向的移動不會被約束。貫通孔830c、840c同時產生了引導支持軸830a、840a在垂直方向上的移動的作用。The connecting members 830b and 840b may be formed with through holes 830c and 840c penetrating in the vertical direction to insert the support shafts 830a and 840a, so that the movement of the support shafts 830a and 840a in the vertical direction is restricted and movable in the horizontal direction. Connected to the connecting members 830b, 840b. As the support shafts 830a, 840a are inserted into the through holes 830c, 840c of the connecting members 830b, 840b, the movement of the support shafts 830a, 840a in the horizontal direction is restricted by the connecting members 830b, 840b, but the vertical of the support shafts 830a, 840a The movement of the direction is not constrained. The through holes 830c and 840c simultaneously function to guide the movement of the support shafts 830a and 840a in the vertical direction.

水平驅動部803可以包括:例如,帶803a,與連接部件830b、840b連接;皮帶輪803b,捲取帶803a;旋轉電動機(未圖示),與皮帶輪803b連接。根據如上所述的結構,皮帶輪803b根據旋轉電動機(未圖示)的旋轉力進行旋轉,根據皮帶輪803b的旋轉,帶803a及與帶803a連接的連接部件830b、840b會沿水平方向移動,由此連接於連接部件830b、840b的支持軸830a、840a及元件加壓工具830、840可以沿水平方向移動。另一方面,根據本發明的實施例公開了設置帶803a與皮帶輪803b作為水平驅動部803的結構,但是本發明並不限定於此,作為水平驅動部803,可以使用通過液壓或氣壓運轉的執行器、直線電動機或滾珠螺杆裝置等多種水平移送器具。The horizontal drive unit 803 may include, for example, a belt 803a connected to the connecting members 830b and 840b, a pulley 803b, a take-up belt 803a, and a rotary motor (not shown) connected to the pulley 803b. According to the configuration described above, the pulley 803b is rotated in accordance with the rotational force of the rotary motor (not shown), and the belt 803a and the connecting members 830b and 840b connected to the belt 803a are moved in the horizontal direction in accordance with the rotation of the pulley 803b. The support shafts 830a, 840a and the component press tools 830, 840 connected to the connecting members 830b, 840b are movable in the horizontal direction. On the other hand, according to the embodiment of the present invention, the configuration in which the belt 803a and the pulley 803b are provided as the horizontal driving portion 803 is disclosed, but the present invention is not limited thereto, and as the horizontal driving portion 803, execution by hydraulic or pneumatic operation may be used. A variety of horizontal transfer devices such as a linear motor or a ball screw device.

第一垂直移動裝置802可以包括:移動塊830d、840d,分別連接成為限制從元件加壓工具830、840沿垂直方向延長的支持軸830a、840a在水平方向上的移動且使其可在垂直方向進行移動;凸輪從動節830e、840e連接於移動塊830d、840d;凸輪部件830g、840g形成有插入凸輪從動節 830e、840e的凸輪槽830f、840f;升降導軌830h、840h,與移動塊830d、840d連接,來引導移動塊830d、840d在垂直方向上的移動。The first vertical moving device 802 may include moving blocks 830d, 840d respectively connected to restrict the movement of the support shafts 830a, 840a extending from the element pressing tools 830, 840 in the vertical direction in the horizontal direction and making them movable in the vertical direction Moving; cam followers 830e, 840e are coupled to moving blocks 830d, 840d; cam members 830g, 840g are formed with inserted cam followers The cam grooves 830f, 840f of 830e, 840e; and the lifting rails 830h, 840h are connected to the moving blocks 830d, 840d to guide the movement of the moving blocks 830d, 840d in the vertical direction.

移動塊830d、840d上可以設置有引導導軌830i、840i,與支持軸830a、840a的端部連接並沿水平方向延長來引導支持軸830a、840a在水平方向上的移動。由此,支持軸830a、840a可沿引導導軌830i、840i進行水平方向的移動。The moving blocks 830d, 840d may be provided with guide rails 830i, 840i connected to the ends of the support shafts 830a, 840a and extended in the horizontal direction to guide the movement of the support shafts 830a, 840a in the horizontal direction. Thereby, the support shafts 830a, 840a can be moved in the horizontal direction along the guide rails 830i, 840i.

凸輪部件830g、840g上分別連接有驅動電動機830j、840j,由此,通過驅動電動機830j、840j的驅動使凸輪部件830g、840g進行旋轉。這種凸輪部件830g、840g可以分別與一對元件加壓工具830、840連接來構成一對。The drive motors 830j and 840j are connected to the cam members 830g and 840g, respectively, whereby the cam members 830g and 840g are rotated by the drive of the drive motors 830j and 840j. Such cam members 830g, 840g may be connected to a pair of element pressing tools 830, 840, respectively, to form a pair.

凸輪槽830f、840f可以形成為包括:具有一定半徑的第一半徑區間及第二半徑區間;連接第一半徑區間及第二半徑區間的可變區間。凸輪槽830f、840f具有如上所述結構時,凸輪從動節830e、840e位於小半徑的第一半徑區間時,元件加壓工具830、840會處於位於上側的狀態;凸輪從動節830e、840e位於可變區間時,元件加壓工具830、840會向上側移動或向下側移動;凸輪從動節830e、840e位於半徑大於第一半徑區間的第二半徑區間時,元件加壓工具830、840會維持位於下側的狀態。The cam grooves 830f and 840f may be formed to include a first radius section and a second radius section having a certain radius, and a variable section connecting the first radius section and the second radius section. When the cam grooves 830f, 840f have the above configuration, when the cam followers 830e, 840e are located in the first radius section of the small radius, the component press tools 830, 840 are in the upper side; the cam followers 830e, 840e When the variable section is located, the component pressing tools 830, 840 move to the upper side or move to the lower side; when the cam follower 830e, 840e is located in the second radius section of the radius larger than the first radius section, the component pressing tool 830, The 840 will remain in the lower side.

移動塊830d、840d通過凸輪從動節830e、840e插入凸輪槽830f、840f以與凸輪部件830g、840g連接。此外,移動塊830d、840d可以連接於升降導軌830h、840h來沿上下方向進行升降。由此,在凸輪部件830g、840g旋轉時,凸輪從動節830e、840e會沿凸輪槽830f、840f的形狀來沿垂直方向移動,由此,與凸輪從動節830e、840e連接的移動塊830d、840d可以沿垂直方向移動,通過支持軸830a、840a與移動塊830d、840d連接的元件加壓工具830、840可以沿垂直方向移動。The moving blocks 830d, 840d are inserted into the cam grooves 830f, 840f through the cam followers 830e, 840e to be coupled to the cam members 830g, 840g. Further, the moving blocks 830d and 840d may be connected to the elevation rails 830h and 840h to be raised and lowered in the vertical direction. Thereby, when the cam members 830g, 840g rotate, the cam followers 830e, 840e move in the vertical direction along the shape of the cam grooves 830f, 840f, whereby the moving block 830d connected to the cam followers 830e, 840e 840d can be moved in the vertical direction, and the component press tools 830, 840 connected to the moving blocks 830d, 840d by the support shafts 830a, 840a can be moved in the vertical direction.

升降導軌830h、840h可以固定於移動塊830d、840d的上部具備的固定物804上。但是,本發明並不限定於此,只要是可以引導移動塊830d、840d的升降,升降導軌830h、840h可以使用多種結構。The lifting rails 830h and 840h may be fixed to the fixture 804 provided on the upper portion of the moving blocks 830d and 840d. However, the present invention is not limited thereto, and as long as the lifting and lowering of the moving blocks 830d and 840d can be guided, the lifting rails 830h and 840h can have various configurations.

根據如上所述的結構,元件加壓工具830、840通過水平移動裝置801來沿水平方向進行移動,由此,元件加壓工具830、840可以在第一接送部610與測試插口310之間,及第二接送部620與測試插口310之間沿水平方向進行移動。此外,元件加壓工具830、840可以通過第一垂直 移動裝置802,在第一接送部610的上部、第二接送部620的上部及測試插口310的上部沿垂直方向進行移動,並選取元件1或裝載元件1。這種元件加壓工具830、840在測試插口310的上部沿垂直方向進行移動,是為了使元件1堅固地結合於測試插口310,同時可以執行通過一定的力以將元件1加壓測試插口310。According to the configuration as described above, the component pressurizing tools 830, 840 are moved in the horizontal direction by the horizontal moving means 801, whereby the component pressurizing tools 830, 840 can be between the first pick-up portion 610 and the test socket 310, And moving between the second pick-up unit 620 and the test socket 310 in the horizontal direction. In addition, the component press tools 830, 840 can pass the first vertical The mobile device 802 moves in the vertical direction at the upper portion of the first pick-up portion 610, the upper portion of the second pick-up portion 620, and the upper portion of the test socket 310, and selects the component 1 or the loading member 1. The component pressurizing tools 830, 840 are moved in the vertical direction at the upper portion of the test socket 310 in order to allow the component 1 to be firmly coupled to the test socket 310 while performing a certain force to press the component 1 into the test socket 310. .

如上所述,元件加壓工具830、840根據凸輪部件830g、840g的旋轉以沿垂直方向進行移動,由此可以準確地設定元件加壓工具830、840在垂直方向上的移動位置。As described above, the component pressing tools 830, 840 are moved in the vertical direction in accordance with the rotation of the cam members 830g, 840g, whereby the moving position of the component pressing tools 830, 840 in the vertical direction can be accurately set.

此外,在元件1加壓測試插口310以進行測試的過程中,對測試插口310的元件1的加壓狀態維持一定時間。為此,不利用凸輪部件830g、840g,而僅僅是利用滾珠螺杆裝置的旋轉電動機或如直線電動機的直線移動用電動機時,需要持續向直線移動用電動機施加用於元件1加壓的較大電壓,以一直向元件1施加恒定的力,但是利用凸輪部件830g、840g時,測試插口310對元件1的加壓狀態與驅動電動機830j、840j上施加的電壓的變化無關,而是根據凸輪部件830g、840g的第二半徑區間的形狀來維持。因此,在用於使元件加壓工具830、840沿垂直方向移動的第一垂直移動裝置802,其結構包括凸輪部件830g、840g時,與不利用凸輪部件830g、840g而僅僅利用直線移動用電動機的情況相比,具有縮減能量的效果。Further, during the process in which the component 1 pressurizes the test socket 310 for testing, the pressurized state of the component 1 of the test socket 310 is maintained for a certain period of time. For this reason, when the cam members 830g and 840g are not used, and only the rotary motor using the ball screw device or the linear motion motor such as a linear motor is used, it is necessary to continuously apply a large voltage for the element 1 to the linear motion motor. A constant force is applied to the element 1 all the time, but when the cam members 830g, 840g are utilized, the pressurization state of the element 1 by the test socket 310 is independent of the change of the voltage applied to the drive motors 830j, 840j, but according to the cam member 830g. The shape of the second radius section of 840 g is maintained. Therefore, when the first vertical moving means 802 for moving the element pressing tools 830, 840 in the vertical direction has the structure including the cam members 830g, 840g, and only the linear moving motor is used without using the cam members 830g, 840g Compared with the case, it has the effect of reducing energy.

另一方面,根據需要測試的元件1的種類或測試插口310的種類,可以變更元件加壓工具830、840的選取器831、841需要的加壓位置,從而使元件1準確地加壓到測試插口310以準確地執行對元件1的測試。此外,有必要對元件加壓工具830、840是否準確地下降以使元件1加壓到測試插口310進行確認及檢驗。On the other hand, depending on the type of the component 1 to be tested or the type of the test socket 310, the pressing positions required by the selectors 831, 841 of the component pressing tools 830, 840 can be changed, so that the component 1 is accurately pressurized to the test. The socket 310 performs the test of the component 1 accurately. In addition, it is necessary to accurately lower the component pressing tools 830, 840 to press the component 1 to the test socket 310 for confirmation and inspection.

因此,為了變更或確認元件加壓工具830、840的加壓位置,首先對於元件加壓工具830、840連接的水平移動裝置801及第一垂直移動裝置802沿上下方向升降後,旋轉凸輪部件830g、840g並判斷元件加壓工具830、840的加壓位置是否與需要設定的加壓位置一致,即,基準位置一致。Therefore, in order to change or confirm the pressing position of the component pressing tools 830 and 840, first, the horizontal moving device 801 and the first vertical moving device 802 connected to the component pressing tools 830 and 840 are vertically moved up and down, and then the rotating cam member 830g is rotated. 840g and determine whether the pressing position of the component pressing tools 830, 840 coincides with the pressing position to be set, that is, the reference position is the same.

為此,如第20圖及第21圖所示,根據本發明實施例的元件檢測裝置,可以包括:第二垂直移動裝置805,與由元件加壓工具830、840、 水平移動裝置801及第一垂直移動裝置802構成的元件加壓部連接,以使元件加壓部沿垂直方向線性移動;控制部807,通過第二垂直移動裝置805以使元件加壓工具830、840與測試部300接觸時,檢測通過第二垂直移動裝置805施加到測試部300的負載,並將檢測到的負載達到已設定的基準負載時的所述元件加壓工具830、840的位置設定為加壓位置。To this end, as shown in FIG. 20 and FIG. 21, the component detecting apparatus according to the embodiment of the present invention may include: a second vertical moving device 805, and the component pressing tools 830, 840, The component pressing portion of the horizontal moving device 801 and the first vertical moving device 802 are connected to linearly move the component pressing portion in the vertical direction; the control portion 807 passes the second vertical moving device 805 to cause the component pressing tool 830, When the 840 is in contact with the test portion 300, the load applied to the test portion 300 by the second vertical moving device 805 is detected, and the position of the component pressurizing tools 830, 840 when the detected load reaches the set reference load is detected. It is a pressurized position.

第二垂直移動裝置805可與第一垂直移動裝置802及水平移 動裝置801連接,如上所述的情況下,第一垂直移動裝置802及水平移動裝置801可以一同通過第二垂直移動裝置805進行升降,從而使元件加壓工具830、840進行升降。The second vertical moving device 805 can be horizontally shifted from the first vertical moving device 802 The moving device 801 is connected. As described above, the first vertical moving device 802 and the horizontal moving device 801 can be lifted and lowered together by the second vertical moving device 805, thereby causing the component pressing tools 830, 840 to ascend and descend.

元件加壓工具830、840中接觸於測試部300的部分,可以為 位於選取器831、841的周圍的選取模組834、844的下側面,即,可以為選取器支持模組836、846的下側面。為此,選取器支持模組836、846的下側面中,與測試部300接觸的部分,可以由如鋁的金屬構成。The portion of the component pressurizing tools 830, 840 that is in contact with the test portion 300 may be The undersides of the selection modules 834, 844 located around the pickers 831, 841, that is, the lower sides of the picker support modules 836, 846. To this end, the portion of the lower side of the picker support modules 836, 846 that is in contact with the test portion 300 may be constructed of a metal such as aluminum.

又,測試部300中與元件加壓工具830、840接觸的部分,可 以為支持測試插口310的支持框架312的上側面。為此,支持框架312的上側面中與元件加壓工具830、840接觸的部分可以是由例如鋁的金屬所構成。在將元件1加壓到測試插口310執行測試的過程中,選取模組834、844的下側面接觸於支持框架312的上側面,來限制元件加壓工具830、840的下降以決定對於測試插口310的元件1的加壓位置。Moreover, the portion of the test portion 300 that is in contact with the component pressurizing tools 830 and 840 may be The upper side of the support frame 312 of the test socket 310 is considered to be supported. To this end, the portion of the upper side of the support frame 312 that is in contact with the component pressurizing tools 830, 840 may be made of a metal such as aluminum. During the process of pressurizing the component 1 to the test socket 310 to perform the test, the lower sides of the selection modules 834, 844 are in contact with the upper side of the support frame 312 to limit the drop of the component press tools 830, 840 to determine the test socket. The pressurized position of element 1 of 310.

因此,隨著元件1的種類、測試插口310的種類或測試插口 310的內部設置的端子311的種類等的變更,而使支持框架312的高度改變時,通過判斷元件加壓工具830、840的下側面是否接觸於支持框架312的上側面,來判斷元件1是否位於加壓位置。Therefore, with the type of component 1, the type of test socket 310, or the test socket When the height of the support frame 312 is changed by changing the type of the terminal 311 provided in the 310, etc., it is judged whether or not the component 1 is judged by whether or not the lower side surface of the component press tools 830 and 840 is in contact with the upper side surface of the support frame 312. Located in a pressurized position.

為此,可以考慮設置感測器的方案,來感應元件加壓工具830 的下側面是否接觸於支持框架312的上側面,如上所述的情況下,隨著感測器的設置會存在費用增加的缺點,考慮感測器的設置位置等時,會存在元件加壓工具830、840及測試插口310的結構變得複雜的問題。To this end, a sensor arrangement can be considered to sense the component pressurization tool 830. Whether the lower side of the support is in contact with the upper side of the support frame 312. As described above, there is a disadvantage that the cost increases as the sensor is disposed. When the position of the sensor is set, etc., there is a component pressurizing tool. The structure of 830, 840 and test socket 310 becomes complicated.

因此,配備有控制部807,在元件加壓工具830、840與測試 部300接觸時,感應第二垂直移動裝置805的負載變化量,並利用負載的變化量來檢測測試部300上施加的負載,將檢測到的負載到達已設定的基準負載時的所述元件加壓工具830、840的位置設定為加壓位置。Therefore, it is equipped with a control unit 807, and the component pressurizing tools 830, 840 and the test When the portion 300 is in contact, the amount of load change of the second vertical moving device 805 is sensed, and the load applied to the test portion 300 is detected by the amount of change in the load, and the component when the detected load reaches the set reference load is added. The position of the pressing tools 830, 840 is set to the pressing position.

如第20圖所示,控制部807在第二垂直移動裝置805為包括 電動機806的滾珠螺杆裝置,或通過電動機806與皮帶輪連接的帶移送器具時,可以與電動機806連接來感應如電動機806扭矩的負載。根據如上所述的結構,元件加壓工具830、840在不接觸測試部300的狀態下,通過第二垂直移動裝置805來使元件加壓工具830、840下降時,在控制部807感應的電動機806的負載的變化量不大,或元件加壓工具830、840接觸於測試部300時,控制部807中感應的負載會增加。由此,控制部807會感應電動機806的負載,並利用感應的負載,在元件加壓工具830、840與測試部300接觸時,檢測通過第二垂直移動裝置805施加到測試部300的負載,並將檢測到的負載到達已設定的基準負載時的元件加壓工具830、840的位置設定為加壓位置。As shown in FIG. 20, the control unit 807 is included in the second vertical moving device 805. When the ball screw device of the motor 806 or the belt transfer device connected to the pulley by the motor 806 is connected to the motor 806, a load such as the torque of the motor 806 can be sensed. According to the configuration as described above, when the component pressurizing tools 830, 840 are lowered by the second vertical moving means 805 in the state where the component pressing tools 830, 840 are not in contact with the test portion 300, the motor sensed at the control portion 807 When the amount of change in the load of 806 is not large, or when the component pressurizing tools 830 and 840 are in contact with the test unit 300, the load induced in the control unit 807 is increased. Thereby, the control unit 807 senses the load of the motor 806, and detects the load applied to the test unit 300 by the second vertical moving device 805 when the component press tools 830 and 840 come into contact with the test unit 300 by the induced load. The position of the component pressurizing tools 830 and 840 when the detected load reaches the set reference load is set as the pressurizing position.

作為另一例,第二垂直移動裝置805為利用永久磁鐵與電磁 鐵間的電磁相互作用來運轉的直線電動機時,控制部807構成為感應直線電動機的負載。As another example, the second vertical moving device 805 utilizes a permanent magnet and an electromagnetic When a linear motor that operates by electromagnetic interaction between irons is used, the control unit 807 is configured to sense the load of the linear motor.

下面,對利用如上所述的結構,設定元件加壓工具830、840 的加壓位置的方法進行說明。Next, the component pressurizing tools 830, 840 are set by using the structure as described above. The method of pressing the position will be described.

首先,元件加壓工具830、840中,使第一元件加壓工具830 位於具有已設定的高度的測試部300的上部,即,位於支持框架312的上部後,旋轉與第一元件加壓工具830連接的凸輪部件830g,使第一元件加壓工具830位於通過凸輪部件830g的旋轉而使第一元件加壓工具830可下降的最低位置。First, in the component pressurizing tools 830, 840, the first component pressurizing tool 830 is caused After the upper portion of the test portion 300 having the set height, that is, after the upper portion of the support frame 312, the cam member 830g connected to the first component pressurizing tool 830 is rotated, so that the first component pressurizing tool 830 is positioned to pass the cam member. The rotation of 830g causes the first component pressing tool 830 to lower the lowest position.

運轉第二垂直移動裝置805,徐徐地下降元件加壓部,來執 行使第一元件加壓工具830徐徐下降的過程。與此同時,控制部807通過感應第二移動裝置805的負載來執行感應第一元件加壓工具830對測試部300施加的負載的過程。Running the second vertical moving device 805, slowly lowering the component pressing portion to perform The process of slowly lowering the first component pressing tool 830 is performed. At the same time, the control section 807 performs a process of sensing the load applied to the test section 300 by the first component pressurizing tool 830 by sensing the load of the second moving device 805.

如第20圖及第21圖所示,隨著通過第二垂直移動裝置805 而使第一元件加壓工具830下降,第一元件加壓工具830會接觸於測試部300,由此,第一元件加壓工具830施加到測試部300的負載會變化。此時,控制部807在第一元件加壓工具830對測試部300施加的負載達到基準負載時,判斷第一元件加壓工具830的位置與已設定的加壓位置一致,從而終止第二垂直移動裝置805的運轉。As shown in FIGS. 20 and 21, as the second vertical moving device 805 passes When the first component pressing tool 830 is lowered, the first component pressing tool 830 comes into contact with the testing portion 300, whereby the load applied to the testing portion 300 by the first component pressing tool 830 changes. At this time, when the load applied to the test unit 300 by the first component pressurizing tool 830 reaches the reference load, the control unit 807 determines that the position of the first component pressurizing tool 830 coincides with the set pressurization position, thereby terminating the second vertical. The operation of the mobile device 805.

如上所述,完成設定第一元件加壓工具830的加壓位置的過 程後,藉由與設定第一元件加壓工具830的加壓位置的相同過程,來執行設定第二元件加壓工具840的加壓位置的過程。As described above, the setting of the pressing position of the first component pressing tool 830 is completed. After the process, the process of setting the pressing position of the second component pressing tool 840 is performed by the same process as setting the pressing position of the first component pressing tool 830.

利用如上所述的過程,設定元件加壓工具830、840的加壓位 置時,通過元件加壓工具830、840選取元件1,執行對加壓測試插口310的元件1的測試過程。The pressing position of the component pressing tools 830, 840 is set by the process as described above. At the time, the component 1 is selected by the component pressurizing tools 830, 840, and the test process of the component 1 of the pressurization test socket 310 is performed.

如上所述,根據本發明實施例的元件檢測裝置,有必要根據 元件1的種類或測試插口310的種類調節元件加壓工具830、840的加壓位置時,或者,有必要確認及檢驗元件加壓工具830、840是否準確地下降到該加壓位置來使元件1加壓到測試插口310時,藉由感應運轉第二垂直移動裝置805而使元件加壓工具830、840下降來接觸於測試部300的同時感應第二垂直移動裝置805的負載,利用感應的負載來檢測施加到測試部300的負載,在檢測到的負載到達已設定的基準負載時,將元件加壓工具830、840的位置設定為加壓位置,從而可以容易且準確地設定元件加壓工具830、840的加壓位置。As described above, the component detecting device according to the embodiment of the present invention is necessary to When the type of the component 1 or the type of the test socket 310 adjusts the pressing position of the component pressing tools 830, 840, or it is necessary to confirm and verify whether the component pressing tools 830, 840 are accurately lowered to the pressing position to make the component 1 When the test socket 310 is pressurized, the component pressurizing tools 830, 840 are lowered by inductively operating the second vertical moving device 805 to contact the test portion 300 while sensing the load of the second vertical moving device 805, using the induction The load is applied to detect the load applied to the test portion 300, and when the detected load reaches the set reference load, the position of the component press tools 830, 840 is set to the pressurizing position, so that the component pressurization can be easily and accurately set. The pressurized position of the tools 830, 840.

另一方面,如第10圖所示,用於移送元件1的載入移送工具 810、814、卸載移送工具820、824或元件加壓工具830、840的選取器,在其結合部件891末端結合有具有橡膠等材質的吸附板892,來使元件1的吸附容易,在元件1變更時、由於磨損而產生吸附不良時、經過維護保養等時,需要交替更換吸附板892。On the other hand, as shown in Fig. 10, the loading transfer tool for the transfer member 1 810, 814, the unloading transfer tool 820, 824 or the selector of the component pressing tools 830, 840, and an adsorption plate 892 having a material such as rubber is bonded to the end of the coupling member 891 to facilitate the adsorption of the component 1 in the component 1 When the change is caused by abrasion, when the suction is poor, or when maintenance is performed, the adsorption plate 892 needs to be alternately replaced.

但是,在以往,吸附板892的替換是由手工作業構成,需要 分離選取器891以進行一一地替換等,存在非常不便利的問題。However, in the past, the replacement of the adsorption plate 892 was composed of manual work, and was required. Separating the picker 891 to perform one-to-one replacement or the like has a problem of being extremely inconvenient.

為此,本發明還可以包括:吸附板替換部900,自動替換分 別結合於載入移送工具810、814、卸載移送工具820、824或元件加壓工具830、840中至少一個選取器上的吸附板892。此處,選取器可以為設置在載入移送工具810、814及卸載移送工具820、824上的選取器,及設置在元件加壓工具830、840上的選取器831、841。To this end, the present invention may further include: an adsorption plate replacement portion 900, which automatically replaces the points The slabs 892 on at least one of the load transfer tools 810, 814, the unload transfer tool 820, 824, or the component press tools 830, 840 are not incorporated. Here, the picker may be a picker disposed on the load transfer tools 810, 814 and the unload transfer tools 820, 824, and pickers 831, 841 disposed on the component press tools 830, 840.

如第22圖至第27圖所示,吸附板替換部900通過考慮載入 移送工具810、814、卸載移送工具820、824或元件加壓工具830、840的移動路徑來安置於適當的位置,可以包括:吸附板收容部910,形成有使選取器的吸附板892插入的多個吸附板收容空間911;吸附板選取部920,設 置於吸附板收容部910中的至少一部分上,來選取收容於吸附板收容空間911中的吸附板。As shown in Figs. 22 to 27, the adsorption plate replacement portion 900 is loaded by consideration. The moving paths of the transfer tools 810, 814, the unloading transfer tools 820, 824 or the component press tools 830, 840 are disposed at appropriate positions, and may include: an adsorption plate receiving portion 910 formed with the insertion plate 892 of the picker inserted a plurality of adsorption plate accommodating spaces 911; an adsorption plate selection portion 920, The adsorption plate accommodated in the adsorption plate accommodating space 911 is selected on at least a part of the adsorption plate accommodating portion 910.

此處,設置有吸附板選取部920的吸附板收容部910中至少 有一部分,空出了吸附板收容空間911,從而通過吸附板選取部920來從結合部件891中分離吸附板892以進行收容,吸附板選取部920中至少有一部分的吸附板收容部892,向去除了吸附板892的結合部件891上插入新的吸附板892。Here, at least the adsorption plate housing portion 910 provided with the adsorption plate selecting portion 920 is at least In some cases, the suction plate accommodating space 911 is vacated, and the adsorption plate 892 is separated from the coupling member 891 by the adsorption plate selecting portion 920 for storage, and at least a part of the adsorption plate accommodating portion 892 of the adsorption plate selecting portion 920 is directed to A new suction plate 892 is inserted into the coupling member 891 from which the suction plate 892 is removed.

吸附板收容部910形成有多個吸附板892,其構成為,通過 吸附板選取部920從結合部件891分離吸附板892來收容或向去除了吸附板892的結合部件891上插入新的吸附板892結構,可以為多種結構。The adsorption plate accommodating portion 910 is formed with a plurality of adsorption plates 892 configured to pass The adsorption plate selecting portion 920 separates the adsorption plate 892 from the coupling member 891 to accommodate or insert a new adsorption plate 892 structure to the coupling member 891 from which the adsorption plate 892 is removed, and can have various structures.

作為一例,吸附板收容部910可以包括形成有多個吸附板收 容空間911的收容部本體912。As an example, the adsorption plate accommodating portion 910 may include a plurality of adsorption plates formed The housing portion 912 of the housing 911.

收容部本體912,作為形成吸附板收容空間911的結構,可 以為多種結構。The accommodating portion body 912 has a structure in which the adsorption plate accommodating space 911 is formed, and Thought a variety of structures.

吸附板收容空間911,作為收納從選取器分離的吸附板892 或收納要結合於去除了吸附板892的選取器上的新的吸附板892的結構,只要是收容吸附板892,可以為槽等多種結構。The adsorption plate accommodating space 911 serves as an adsorption plate 892 that is separated from the picker. Alternatively, the structure of the new adsorption plate 892 to be attached to the picker from which the adsorption plate 892 is removed may be a plurality of structures such as grooves as long as the adsorption plate 892 is housed.

吸附板選取部920,作為通過吸附板選取部920從選取器分 離吸附板892的結構,可以為設置於收容部本體912上,並在吸附板892結合於結合部件891的狀態來插入吸附板收容空間911後,選取吸附板的結構等多種結構。The adsorption plate selecting portion 920 is divided from the picker by the adsorption plate selecting portion 920. The structure of the suction plate 892 may be provided on the accommodating portion main body 912, and after the suction plate 892 is coupled to the coupling member 891, the suction plate accommodating space 911 may be inserted, and various structures such as the structure of the suction plate may be selected.

例如,所述吸附板選取部920可以利用掛鈎及解除掛鈎的選 取/解除選取、利用環形態等的夾持器,及通過接觸夾持的選取/解除選取等選取方式,可以為多種結構。For example, the adsorption plate selection unit 920 can utilize the hook and the selection of the release hook. The selection/deselection, the use of the ring shape and the like, and the selection/deselection of the contact grip can be various structures.

作為又另一例,吸附板選取部920,可以包括:移動部件921, 覆蓋收容部本體912的上面的同時,可沿與上面平行的方向,即,水平方向移動地進行設置。As still another example, the adsorption plate selecting portion 920 may include: a moving member 921, The upper surface of the accommodating portion body 912 is covered, and is disposed to be movable in a direction parallel to the upper surface, that is, in a horizontal direction.

此時,移動部件921,作為通過水平移動來用於掛鈎及解除 掛鈎的選取/解除選取的結構,可以為多種結構,例如,如第22圖至第27圖所示,包括:多個貫通部分922,在吸附板892結合於選取器的狀態來貫通,從而形成為可沿吸附板收容空間911進行移動;多個掛鈎部分923,分 別連接於貫通部分922,在吸附板892結合於選取器的狀態下從吸附板收容空間911移動時,鈎住吸附板892,僅使選取器可以移動。At this time, the moving member 921 is used for hooking and releasing as a horizontal movement. The structure of the selection/deselection of the hooks may be of various structures. For example, as shown in FIGS. 22 to 27, the plurality of through portions 922 are formed to penetrate through the state in which the adsorption plate 892 is coupled to the picker, thereby forming To be movable along the adsorption plate accommodating space 911; a plurality of hook portions 923, When it is moved from the adsorption plate accommodating space 911 in a state where the adsorption plate 892 is coupled to the picker, the suction plate 892 is hooked, and only the picker can be moved.

特別是,為了提高移動部件921的掛鈎效果,吸附板892可 以形成有凸出部892a,比所述選取器891的外周面更加凸出,此時,掛鈎部分923形成為大於結合部件891的外周面且小於凸出部892a的外周面,從而在選取器的上側方向移動時,鉤住吸附板892。In particular, in order to improve the hooking effect of the moving member 921, the suction plate 892 can The protrusion 892a is formed to protrude more than the outer peripheral surface of the picker 891. At this time, the hook portion 923 is formed to be larger than the outer peripheral surface of the joint member 891 and smaller than the outer peripheral surface of the projection 892a, thereby being in the picker When moving in the upper direction, the suction plate 892 is hooked.

吸附板選取部920的移動部件921考慮到吸附板892及結合 有吸附板892的選取器中半徑的大小不同,利用具有大於吸附板892的最大半徑的貫通部分922與吸附板892的至少一部分半徑小的掛鈎部923,使得在吸附板892插入吸附板收容空間911時,讓貫通部分922位於吸附板收容空間911上;在從選取器分離吸附板892時,則位於掛鈎部分923。The moving member 921 of the adsorption plate selecting portion 920 takes into consideration the adsorption plate 892 and the combination The size of the radius of the picker having the suction plate 892 is different, and the through portion 922 having a larger radius than the maximum diameter of the adsorption plate 892 and the hook portion 923 having a radius of at least a portion of the suction plate 892 are used to insert the adsorption plate 892 into the suction plate accommodating space. At 911, the through portion 922 is placed on the suction plate accommodating space 911; when the suction plate 892 is separated from the picker, it is located at the hook portion 923.

另一方面,吸附板選取部920的移動部件921,其特徵在於, 移動到吸附板892的掛鈎及解除掛鈎的位置,雖未圖示,但是可以通過線性移動裝置進行線性移動,通過多種驅動源來驅動其移動。On the other hand, the moving member 921 of the suction plate selecting portion 920 is characterized in that The position of the hook that has moved to the suction plate 892 and the position where the hook is released is not shown, but can be linearly moved by the linear motion device, and the movement is driven by a plurality of driving sources.

另一方面,在從載入移送工具810、814、卸載移送工具820、 824或元件加壓工具830、840的選取器中替換吸附板892時,吸附板替換部900的位置,首先移動到結合有吸附板選取部920的吸附板收容部910來分離吸附板892之後(第23圖至第25圖),移動到收容新的吸附板892的吸附板收容部910來結合新的吸附板892(第24圖及第25圖),結束吸附板892替換後執行元件1移送作業。On the other hand, in the load transfer tool 810, 814, the unloading transfer tool 820, When the suction plate 892 is replaced by the picker 892 or the picker of the component pressurizing tools 830, 840, the position of the suction plate replacing portion 900 is first moved to the adsorption plate receiving portion 910 to which the adsorption plate selecting portion 920 is bonded to separate the adsorption plate 892 ( 23 to 25), moving to the adsorption plate accommodating portion 910 accommodating the new adsorption plate 892 to bond the new adsorption plate 892 (Figs. 24 and 25), and ending the transfer of the actuator 1 after the adsorption plate 892 is replaced. operation.

另一方面,用於移送如上所述的元件1的載入移送工具810、 814、卸載移送工具820、824或元件加壓工具830、840的結構,除了作為元件檢測裝置以外,還可以根據已執行的檢測結果執行元件的分類工序,或執行檢測元件及根據其檢測來分類元件,當然也可以適用於將元件裝載於托盤來進行載入,並通過一個以上的移送工具來進行移送元件的處理程序。On the other hand, a load transfer tool 810 for transferring the component 1 as described above, 814. The structure of the unloading transfer tool 820, 824 or the component pressurizing tools 830, 840, in addition to being the component detecting device, may perform the sorting process of the component according to the executed detection result, or perform the detecting component and classify according to the detection thereof. The component can of course also be adapted to load the component onto the tray for loading, and the processing of the transfer component is performed by one or more transfer tools.

以上,對本發明的較佳實施例進行了例示性地說明,但是本 發明的範圍並不限定於如上所述的特定實施例,可以在技術範圍內進行適當的變更。The preferred embodiments of the present invention have been exemplarily described above, but The scope of the invention is not limited to the specific embodiments described above, and may be appropriately modified within the technical scope.

1‧‧‧元件1‧‧‧ components

100‧‧‧載入部100‧‧‧Loading Department

2‧‧‧托盤2‧‧‧Tray

2a‧‧‧收容槽2a‧‧‧storage trough

200‧‧‧載入緩衝部200‧‧‧Load buffer

300‧‧‧測試部300‧‧‧Test Department

310‧‧‧測試插口310‧‧‧ test socket

400‧‧‧卸載緩衝部400‧‧‧Unloading buffer

500‧‧‧卸載部500‧‧‧Unloading Department

610、620‧‧‧接送部610, 620‧‧‧ pick-up department

611、621‧‧‧導軌611, 621‧‧ ‧ rail

612、622‧‧‧接送板612, 622‧‧‧ pick-up board

613、623‧‧‧板固定部613, 623‧‧ ‧ plate fixing department

614、624‧‧‧板裝卸部614, 624‧‧‧ board loading and unloading department

700‧‧‧清潔部700‧‧‧Clean Department

710‧‧‧本體710‧‧‧ Ontology

713‧‧‧排出管713‧‧‧Draining tube

720‧‧‧驅動部720‧‧‧ Drive Department

810、814‧‧‧載入移送工具810, 814‧‧‧Loading transfer tool

820、824‧‧‧卸載移送工具820, 824‧‧‧ Unloading Transfer Tool

830、840‧‧‧元件加壓工具830, 840‧‧‧ component press tools

900‧‧‧吸附板替換部900‧‧‧Adsorption plate replacement unit

Claims (25)

一種元件檢測裝置,包括:載入部,載入裝載多個元件的一個以上的托盤;測試部,包括多個測試插口,用於接收從所述載入部傳達的元件以對各個元件進行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,所述移送工具包括多個選取器,分別在末端結合有吸附板,所述移送工具中至少有一個移送工具上還包括吸附板替換部,自動替換分別結合在所述選取器上的所述吸附板;載入緩衝部,通過載入移送工具接收從所述載入部的托盤傳達的元件並進行臨時裝載;以及卸載緩衝部,以所述測試部為中心,設置於與所述載入緩衝部對向的位置,以接收通過所述測試部完成測試的元件。 A component detecting device includes: a loading portion that loads one or more trays loaded with a plurality of components; and a testing portion that includes a plurality of test sockets for receiving components transmitted from the loading portion to test the respective components And an unloading unit that classifies and loads the components that complete the test according to the test result of the testing unit; and one or more transfer tools, and transfers the component between the loading unit, the testing unit, and the unloading unit. The transfer tool includes a plurality of pickers respectively coupled to the adsorption plate at the end, and at least one of the transfer tools further includes an adsorption plate replacement portion for automatically replacing the adsorption plate respectively coupled to the picker a loading buffer portion that receives an element transmitted from the tray of the loading portion by a loading transfer tool and performs temporary loading; and an unloading buffer portion that is disposed at the loading buffer center centering on the testing portion The opposite position to receive the component that completed the test through the test section. 一種元件檢測裝置,包括:載入部,載入裝載多個元件的一個以上的托盤;測試部,接收從一載入緩衝部傳達的元件來進行測試;卸載部,根據所述測試部的測試結果,通過卸載移送工具對裝載於所述卸載緩衝部的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,所述移送工具包括多個選取器,分別在末端結合有吸附板,所述移送工具中至少有一個移送工具上還包括吸附板替換部,自動替換分別結合在所述選取器上的所述吸附板;所述吸附板替換部包括:兩個以上的吸附板收容部,形成有使所述選取器的吸附板插入的多個吸附板收容空間;吸附板選取部,設置於所述吸附板收容部中的至少一部 分上,以選取收容於所述吸附板收容空間中的吸附板,設置有所述吸附板選取部的所述吸附板收容部中至少有一部分,空出了所述吸附板收容空間,從而通過所述吸附板選取部來從所述選取器中分離所述吸附板以進行收容,所述吸附板收容部中至少有一部分的吸附板收容部,插入要替換的吸附板以使所述吸附板結合於去除的選取器上。 A component detecting device comprising: a loading portion that loads one or more trays loaded with a plurality of components; a testing portion that receives components transmitted from a loading buffer portion for testing; and an unloading portion that tests according to the testing portion As a result, the components loaded in the unloading buffer are sorted and loaded by the unloading transfer tool; one or more transfer tools transfer the components between the loading section, the testing section, and the unloading section, the transfer The tool includes a plurality of pickers respectively coupled to the adsorption plate at the end, and at least one of the transfer tools further includes an adsorption plate replacement portion for automatically replacing the adsorption plate respectively coupled to the picker; The adsorption plate replacing portion includes: two or more adsorption plate accommodating portions, and a plurality of adsorption plate accommodating spaces for inserting the adsorption plates of the selector; and an adsorption plate selection portion disposed in the adsorption plate accommodating portion At least one Separatingly, the adsorption plate accommodated in the accommodating space of the adsorption plate is selected, and at least a part of the adsorption plate accommodating portion of the suction plate selection portion is provided, and the accommodating plate accommodating space is vacated, thereby passing The adsorption plate selecting portion separates the adsorption plate from the picker for receiving, and at least a part of the adsorption plate receiving portion of the adsorption plate receiving portion is inserted into the adsorption plate to be replaced to make the adsorption plate Combined with the removed picker. 根據申請專利範圍第2項所述的元件檢測裝置,其中,所述吸附板收容部包括:收容部本體,形成有所述多個吸附板收容空間,所述吸附板選取部,設置於所述收容部本體,所述吸附板結合於所述選取器的狀態下插入到所述吸附板收容空間後,選取所述吸附板。 The component detecting device according to the second aspect of the invention, wherein the absorbing plate accommodating portion includes: a accommodating portion main body, wherein the plurality of absorbing plate accommodating spaces are formed, and the absorbing plate selecting portion is disposed in the The body of the accommodating portion is inserted into the accommodating space of the absorbing plate in a state where the absorbing plate is coupled to the picker, and the absorbing plate is selected. 根據申請專利範圍第3項所述的元件檢測裝置,其中,所述吸附板選取部包括:移動部件,覆蓋所述收容部本體上面,且設置為可沿與上面平行的方向進行移動,所述移動部件包括:多個貫通部分,在所述吸附板結合於所述選取器的狀態下進行貫通,從而形成為可向所述吸附板收容空間進行移動;多個掛鈎部分,形成為分別與所述貫通部分連接以在所述吸附板結合於所述選取器的狀態下向所述吸附板收容空間移動時,鈎住所述吸附板,僅使所述選取器進行移動。 The component detecting device according to claim 3, wherein the adsorption plate selecting portion includes: a moving member covering the upper surface of the receiving portion body and configured to be movable in a direction parallel to the upper surface, The moving member includes: a plurality of penetrating portions that are penetrated in a state in which the suction plate is coupled to the picker, and are formed to be movable to the suction plate accommodating space; and the plurality of hook portions are formed to be respectively The through portion is connected to hook the adsorption plate when the adsorption plate is moved to the adsorption plate accommodating space in a state where the adsorption plate is coupled to the picker, and only the picker is moved. 根據申請專利範圍第4項所述的元件檢測裝置,其中,所述吸附板形成有凸出部,比所述選取器的外周面更加凸出,所述掛鈎部分,形成為大於所述選取器的外周面且小於所述凸出部的外周面,從而在所述選取器的上側方向移動時,鈎住所述吸附板。 The component detecting device according to claim 4, wherein the adsorption plate is formed with a convex portion that is more convex than an outer peripheral surface of the picker, and the hook portion is formed to be larger than the picker The outer peripheral surface is smaller than the outer peripheral surface of the projection so as to hook the suction plate when moving in the upper direction of the picker. 根據申請專利範圍第2項至第5項中任一項所述的元件檢測裝置,其中,還包括:載入緩衝部,通過載入移送工具接收從所述載入部的托盤傳達的元件並進行臨時裝載;卸載緩衝部,以所述測試部為中心,設置於與所述載入緩衝部對向的位置,以接收通過所述測試部完成測試的元件。 The component detecting device according to any one of claims 2 to 5, further comprising: a loading buffer portion that receives an element transmitted from the tray of the loading portion by a loading transfer tool and Temporary loading is performed; the unloading buffer portion is disposed at a position opposed to the loading buffer portion around the test portion to receive an element that is tested by the testing portion. 根據申請專利範圍第2或6項所述的元件檢測裝置,其中,包括:第一接送部及第二接送部,通過所述一個以上的移送工具,將從所述載入緩衝部接收的元件傳達到所述測試部,或將從所述測試部接收的元件傳達到所述卸載緩衝部。 The component detecting device according to claim 2, further comprising: a first pick-up unit and a second pick-up unit, the component to be received from the loading buffer by the one or more transfer tools Communicating to the test portion or communicating an element received from the test portion to the unloading buffer. 根據申請專利範圍第7項所述的元件檢測裝置,其中,所述第一接送部及第二接送部是以所述測試部作為中心進行對向設置,所述第一接送部及第二接送部各自包括:導軌;及一個以上的接送板,沿所述導軌進行移動,用於從所述載入緩衝部接收傳達的元件的第一元件傳達位置、與所述測試部的元件替換位置,向所述卸載緩衝部傳達元件的第二元件傳達位置上進行交替移動。 The component detecting device according to claim 7, wherein the first pick-up unit and the second pick-up unit are oppositely disposed with the test unit as a center, and the first pick-up unit and the second pick-up unit Each of the sections includes: a guide rail; and one or more shuttle plates that are moved along the guide rail for receiving a first component communication position of the communicated component from the loading buffer, and a component replacement position of the test section, The second component transfer position of the unloading buffer communication element is alternately moved. 根據申請專利範圍第7項所述的元件檢測裝置,其中,所述移送工具包括:一對元件加壓工具,將元件從所述載入部傳達到所述測試部,或將元件從所述測試部傳達到所述卸載部,所述一對元件加壓工具分別在所述第一接送部與所述測試部之間,及所述第二接送部與所述測試部之間進行移動,從而將從所述接送板裝載的元件傳達到測試部,或將元件從所述測試部傳達到所述接送板。 The component detecting device according to claim 7, wherein the transfer tool comprises: a pair of component pressing tools, the component is transmitted from the loading portion to the testing portion, or the component is The test unit is communicated to the unloading unit, and the pair of component pressurizing tools are respectively moved between the first pick-up unit and the test unit, and between the second pick-up unit and the test unit, Thereby, the components loaded from the shuttle board are communicated to the test section or the components are communicated from the test section to the shuttle board. 一種元件檢測裝置,包括:載入部,載入裝載多個元件的一個以上的托盤;測試部,包括多個測試插口,用於接收從所述載入部傳達的元件以對各個元件進行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,還包括清潔部,設置於所述測試部的一側,用於通過移動來在覆蓋所述測試插口的狀態下噴射空氣以去除所述測試插口中的異物;載入緩衝部,通過載入移送工具接收從所述載入部的托盤傳達的元件 並進行臨時裝載;以及卸載緩衝部,以所述測試部為中心,設置於與所述載入緩衝部對向的位置,以接收通過所述測試部完成測試的元件。 A component detecting device includes: a loading portion that loads one or more trays loaded with a plurality of components; and a testing portion that includes a plurality of test sockets for receiving components transmitted from the loading portion to test the respective components And an unloading unit that classifies and loads the components that complete the test according to the test result of the testing unit; and one or more transfer tools that transfer the components between the loading unit, the testing unit, and the unloading unit, and a cleaning portion disposed on one side of the test portion for injecting air in a state of covering the test socket by movement to remove foreign matter in the test socket; loading a buffer portion by loading a transfer tool Receiving components communicated from the tray of the loading portion And performing temporary loading; and unloading the buffer portion, centered on the test portion, at a position opposite to the loading buffer portion to receive an element that is tested by the test portion. 一種元件檢測裝置,包括:載入部,載入裝載多個元件的一個以上的托盤;測試部,包括多個測試插口,用於接收從所述載入部傳達的元件來對各個元件進行測試;卸載部,根據所述測試部的測試結果,對完成測試的元件進行分類裝載;一個以上的移送工具,在所述載入部、所述測試部及所述卸載部之間移送元件,以及還包括清潔部,設置於所述測試部的一側,用於通過移動來在覆蓋所述測試插口的狀態下噴射空氣來去除所述測試插口中的異物;所述清潔部包括:本體,覆蓋所述測試插口並在所述測試插口的上部形成清潔空間;及驅動部,用於在所述測試部的一側及所述測試插口的上部之間驅動本體。 A component detecting device includes: a loading portion that loads one or more trays loaded with a plurality of components; and a testing portion that includes a plurality of test sockets for receiving components transmitted from the loading portion to test the respective components And an unloading unit that performs classified loading on the components that complete the test according to the test result of the testing unit; one or more transfer tools that transfer the components between the loading portion, the testing portion, and the unloading portion, and Further including a cleaning portion disposed on one side of the test portion for removing foreign matter in the test socket by spraying air in a state of covering the test socket; the cleaning portion includes: a body covering The test socket forms a cleaning space at an upper portion of the test socket; and a driving portion for driving the body between one side of the test portion and an upper portion of the test socket. 根據申請專利範圍第11項所述的元件檢測裝置,其中,所述本體設置有空氣流路,與空氣供給裝置連接以向所述各個測試插口噴射空氣;及一個以上的噴嘴,從所述空氣流路接收傳達的空氣以向所述測試插口噴射空氣。 The component detecting device according to claim 11, wherein the body is provided with an air flow path connected to the air supply device to inject air to the respective test sockets; and one or more nozzles from the air The flow path receives the communicated air to inject air into the test socket. 根據申請專利範圍第11項所述的元件檢測裝置,其中,所述本體形成為維持所述清潔空間密閉的狀態,所述本體與排出管連接來將通過所述噴嘴噴射的空氣與異物一起從所述清潔空間向外部排出。 The component detecting device according to claim 11, wherein the body is formed to maintain a state in which the cleaning space is sealed, and the body is connected to a discharge pipe to discharge air blown through the nozzle together with foreign matter. The cleaning space is discharged to the outside. 根據申請專利範圍第11項至第13項中任一項所述的元件檢測裝置,其中,還包括:載入緩衝部,通過載入移送工具接收從所述載入部的托盤傳達的元件 並進行臨時裝載;卸載緩衝部,以所述測試部為中心,設置於與所述載入緩衝部對向的位置,以接收通過所述測試部完成測試的元件。 The component detecting device according to any one of claims 11 to 13, further comprising: a loading buffer portion that receives a component conveyed from the tray of the loading portion by a loading transfer tool And temporarily loading; the unloading buffer portion is disposed at a position opposite to the loading buffer portion around the test portion to receive an element that is tested by the testing portion. 根據申請專利範圍第10或14項所述的元件檢測裝置,其中包括:第一接送部及第二接送部,通過所述一個以上的移送工具,將從所述載入緩衝部接收的元件傳達到所述測試部,或將從所述測試部接收的元件傳達到所述卸載緩衝部。 The component detecting device according to claim 10 or 14, further comprising: a first pick-up unit and a second pick-up unit, wherein the components received from the loading buffer are transmitted by the one or more transfer tools To the test section, or to transmit an element received from the test section to the unloading buffer. 根據申請專利範圍第15項所述的元件檢測裝置,其中,所述第一接送部及第二接送部是以所述測試部作為中心來進行對向設置,所述第一接送部及第二接送部各自包括:導軌;及一個以上的接送板,沿所述導軌進行移動,用於從所述載入緩衝部接收傳達的元件的第一元件傳達位置、與所述測試部的元件替換位置向所述卸載緩衝部傳達元件的第二元件傳達位置上進行交替移動。 The component detecting device according to claim 15, wherein the first pick-up unit and the second pick-up unit are disposed opposite to each other by the test unit, the first pick-up unit and the second The pick-up portions each include: a guide rail; and one or more transfer plates that move along the guide rail for receiving a first component transfer position of the communicated component from the load buffer portion and a component replacement position of the test portion The second component transfer position of the unloading buffer communication element is alternately moved. 根據申請專利範圍第15項所述的元件檢測裝置,其中,所述清潔部,設置於所述第一接送部及所述第二接送部之間。 The component detecting device according to claim 15, wherein the cleaning unit is provided between the first pick-up unit and the second pick-up unit. 根據申請專利範圍第15項所述的元件檢測裝置,其中,所述移送工具包括:一對元件加壓工具,分別在所述第一接送部與所述測試部之間、以及所述第二接送部與所述測試部之間進行移動,以將所述接送板裝載的元件傳達到所述測試部,或將元件從所述測試部傳達到所述接送板。 The component detecting device according to claim 15, wherein the transfer tool comprises: a pair of component pressing tools between the first pick-up portion and the test portion, and the second Movement between the pick-up portion and the test portion to communicate the components loaded on the shuttle board to the test portion or to communicate components from the test portion to the shuttle board. 一種元件檢測裝置,包括:載入部,載入多個元件;測試部,具備用於將從所述載入部移送過來的元件執行測試的多個測試插口;卸載部,根據測試結果來對在所述測試部完成測試的元件進行分類; 以及一個以上的接送部,將從所述載入部傳達的元件移送到所述測試部側,並將從所述測試部傳達的元件移送到所述卸載部側,所述接送部包括:接送板,用於搭載所述元件;板固定部,所述接送板可裝卸地結合於此;板裝卸部,設置於所述板固定部,以將所述接送板固定於所述板固定部;所述接送部具備有導軌,可使所述板固定部水平移動地進行連接。 A component detecting device comprising: a loading portion for loading a plurality of components; a testing portion having a plurality of test sockets for performing tests for transferring components from the loading portion; and an unloading portion, according to the test result Classifying the components that have been tested in the test section; And one or more pick-up units that transfer components transmitted from the loading unit to the test portion side, and transfer components transmitted from the test portion to the unloading portion side, the pick-up portion including: pick-up a plate for mounting the component; a plate fixing portion, the transfer plate is detachably coupled thereto; a plate loading and unloading portion is disposed at the plate fixing portion to fix the transfer plate to the plate fixing portion; The pick-up unit is provided with a guide rail, and the board fixing portion can be connected to move horizontally. 一種元件檢測裝置,包括:載入部,載入多個元件;測試部,具備用於將從所述載入部移送過來的元件進行測試的多個測試插口;卸載部,根據測試結果來對在所述測試部完成測試的元件進行分類;以及一個以上的接送部,將從所述載入部傳達的元件移送到所述測試部側,並將從所述測試部傳達的元件移送到所述載入部側,所述接送部包括:接送板,用於搭載所述元件;板固定部,所述接送板可裝卸地結合於此;以及板裝卸部,設置於所述板固定部,來將所述接送板固定於所述板固定部;所述板裝卸部包括:支持體,固定於所述板固定部;固定體,通過具備於所述支持體的第一鉸鏈軸,可旋轉地進行連接來選擇性地固定所述接送板;彈性體,將所述固定體彈性連接於所述第一鉸鏈軸;加壓體,與所述固定體接觸的加壓面形成為曲面以對所述固定體加壓;移動體,與所述加壓體連接,設置為可沿上下方向進行移動;手柄,使設置於所述移動體的第二鉸鏈軸可旋轉地進行連接;以及固定掛鈎,設置於所述支持體,掛於所述手柄的端部並固定。 A component detecting device includes: a loading portion that loads a plurality of components; a testing portion that includes a plurality of test sockets for testing components that are transferred from the loading portion; and an unloading portion that is based on the test result Sorting the components that have been tested in the test portion; and one or more pick-up portions, transferring the components transmitted from the loading portion to the test portion side, and transferring the components transmitted from the test portion to the The loading and unloading unit includes: a pick-up plate for carrying the component; a board fixing portion, the pick-up board is detachably coupled thereto; and a board loading and unloading portion disposed at the board fixing portion, Fixing the shuttle board to the board fixing portion; the board loading and unloading portion includes: a support body fixed to the board fixing portion; and a fixing body rotatable by a first hinge shaft provided on the support body Connecting to selectively fix the shuttle plate; an elastic body elastically connecting the fixing body to the first hinge shaft; and a pressing body, the pressing surface contacting the fixing body is formed into a curved surface to The fixed body a moving body coupled to the pressing body and configured to be movable in an up and down direction; a handle to rotatably connect the second hinge shaft disposed on the moving body; and a fixing hook disposed on the The support body is hung on the end of the handle and fixed. 根據申請專利範圍第20項所述的元件檢測裝置,其中,所述接送部具備有導軌,可使所述板固定部水平移動地進行連接。 The component detecting device according to claim 20, wherein the pick-up portion is provided with a guide rail, and the plate fixing portion can be connected to be horizontally moved. 一種元件檢測裝置,包括:載入部,載入多個元件;測試部,具備用於將從所述載入部移送過來的元件進行測試的多個測試插口;卸載部,根據測試結果來對在所述測試部完成測試的元件進行分類;以及一個以上的接送部,將從所述載入部傳達的元件移送到所述測試部側,並將從所述測試部傳達的元件移送到所述載入部側,所述接送部包括:接送板,用於搭載所述元件;板固定部,所述接送板可裝卸地結合於此;以及板裝卸部,設置於所述板固定部,來將所述接送板固定於所述板固定部;所述板固定部具備有加熱器,用於加熱所述元件。 A component detecting device includes: a loading portion that loads a plurality of components; a testing portion that includes a plurality of test sockets for testing components that are transferred from the loading portion; and an unloading portion that is based on the test result Sorting the components that have been tested in the test portion; and one or more pick-up portions, transferring the components transmitted from the loading portion to the test portion side, and transferring the components transmitted from the test portion to the The loading and unloading unit includes: a pick-up plate for carrying the component; a board fixing portion, the pick-up board is detachably coupled thereto; and a board loading and unloading portion disposed at the board fixing portion, The transfer board is fixed to the board fixing portion; the board fixing portion is provided with a heater for heating the element. 一種元件檢測裝置,包括:載入部,載入多個元件;測試部,具備用於將從所述載入部移送過來的元件進行測試的多個測試插口;卸載部,根據測試結果來對在所述測試部完成測試的元件進行分類;一個以上的接送部,將從所述載入部傳達的元件移送到所述測試部側,並將從所述測試部傳達的元件移送到所述載入部側,所述接送部包括:接送板,用於搭載所述元件;板固定部,所述接送板可裝卸地結合於此;以及板裝卸部,設置於所述板固定部,來將所述接送板固定於所述板固定部;以及一個以上的元件加壓工具,從所述接送部的接送板選取元件以加壓所 述測試插口,並將在所述測試插口進行加壓完成測試的元件傳達至所述接送部的接送板。 A component detecting device includes: a loading portion that loads a plurality of components; a testing portion that includes a plurality of test sockets for testing components that are transferred from the loading portion; and an unloading portion that is based on the test result Sorting the components that have been tested in the test section; one or more pick-up sections, transferring the components transmitted from the loading section to the test section side, and transferring the components transmitted from the test section to the a loading and unloading portion, the pick-up portion includes: a pick-up plate for carrying the component; a board fixing portion, the pick-up board is detachably coupled thereto; and a board loading and unloading portion disposed at the board fixing portion Fixing the transfer plate to the plate fixing portion; and one or more component pressing tools, selecting components from the pick-up plate of the pick-up portion to pressurize the The test socket is described, and the component that is pressurized at the test socket to complete the test is transmitted to the shuttle board of the pick-up section. 根據申請專利範圍第23項所述的元件檢測裝置,其中,所述接送部包括:第一接送部及第二接送部,安置於所述測試部的測試插口的兩側。 The component detecting device according to claim 23, wherein the pick-up unit comprises: a first pick-up unit and a second pick-up unit disposed on both sides of the test socket of the test portion. 根據申請專利範圍第24項所述的元件檢測裝置,其中,所述元件加壓工具包括:第一元件加壓工具,在所述第一接送部的接送板上選取元件以加壓所述測試插口,並將在所述測試插口進行加壓完成測試的元件傳達至所述第一接送部的接送板;及第二元件加壓工具,在所述第二接送部的接送板上選取元件以加壓所述測試插口,並將在所述測試插口進行加壓完成測試的元件傳達至所述第二接送部的接送板。The component detecting device according to claim 24, wherein the component pressing tool comprises: a first component pressing tool, and selecting a component on the shuttle board of the first pick-up section to pressurize the test a socket, and transmitting an element for performing the test on the test socket to the transfer board of the first pick-up unit; and a second component press tool for selecting a component on the transfer board of the second pick-up unit The test socket is pressurized, and the component that is pressurized at the test socket to complete the test is transmitted to the transfer board of the second pick-up unit.
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