TWI373835B - Wiring board and semiconductor device - Google Patents

Wiring board and semiconductor device Download PDF

Info

Publication number
TWI373835B
TWI373835B TW097100158A TW97100158A TWI373835B TW I373835 B TWI373835 B TW I373835B TW 097100158 A TW097100158 A TW 097100158A TW 97100158 A TW97100158 A TW 97100158A TW I373835 B TWI373835 B TW I373835B
Authority
TW
Taiwan
Prior art keywords
wiring board
crucible
semiconductor
semiconductor component
configuration
Prior art date
Application number
TW097100158A
Other languages
English (en)
Chinese (zh)
Other versions
TW200834853A (en
Inventor
Takao Nishimura
Kazuyuki Aiba
Original Assignee
Fujitsu Semiconductor Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Semiconductor Ltd filed Critical Fujitsu Semiconductor Ltd
Publication of TW200834853A publication Critical patent/TW200834853A/zh
Application granted granted Critical
Publication of TWI373835B publication Critical patent/TWI373835B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/012Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/15Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/013Manufacture or treatment of die-attach connectors
    • H10W72/01308Manufacture or treatment of die-attach connectors using permanent auxiliary members, e.g. using alignment marks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/0711Apparatus therefor
    • H10W72/07178Means for aligning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07231Techniques
    • H10W72/07232Compression bonding, e.g. thermocompression bonding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07231Techniques
    • H10W72/07236Soldering or alloying
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • H10W72/07311Treating the bonding area before connecting, e.g. by applying flux or cleaning
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/30Die-attach connectors
    • H10W72/381Auxiliary members
    • H10W72/387Flow barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/536Shapes of wire connectors the connected ends being ball-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/5363Shapes of wire connectors the connected ends being wedge-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5434Dispositions of bond wires the connected ends being on auxiliary connecting means on bond pads, e.g. on other bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/853On the same surface
    • H10W72/856Bump connectors and die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/884Die-attach connectors and bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/921Structures or relative sizes of bond pads
    • H10W72/923Bond pads having multiple stacked layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/9415Dispositions of bond pads relative to the surface, e.g. recessed, protruding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/941Dispositions of bond pads
    • H10W72/942Dispositions of bond pads relative to underlying supporting features, e.g. bond pads, RDLs or vias
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/90Bond pads, in general
    • H10W72/951Materials of bond pads
    • H10W72/952Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/722Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/732Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Wire Bonding (AREA)
TW097100158A 2007-01-30 2008-01-03 Wiring board and semiconductor device TWI373835B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007020081A JP5211493B2 (ja) 2007-01-30 2007-01-30 配線基板及び半導体装置

Publications (2)

Publication Number Publication Date
TW200834853A TW200834853A (en) 2008-08-16
TWI373835B true TWI373835B (en) 2012-10-01

Family

ID=39667027

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097100158A TWI373835B (en) 2007-01-30 2008-01-03 Wiring board and semiconductor device

Country Status (5)

Country Link
US (1) US7880276B2 (https=)
JP (1) JP5211493B2 (https=)
KR (1) KR100938408B1 (https=)
CN (1) CN101236946B (https=)
TW (1) TWI373835B (https=)

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9147665B2 (en) * 2007-11-06 2015-09-29 Fairchild Semiconductor Corporation High bond line thickness for semiconductor devices
JP4693852B2 (ja) * 2008-02-22 2011-06-01 パナソニック株式会社 半導体装置および半導体装置の製造方法
TW200943505A (en) * 2008-04-02 2009-10-16 Advanced Semiconductor Eng Reinforced package carrier and method for manufacturing the same as well as method for manufacturing semiconductor packages
JP4589428B2 (ja) * 2008-08-19 2010-12-01 アルプス電気株式会社 半導体チップモジュール
JP5058929B2 (ja) * 2008-09-29 2012-10-24 京セラSlcテクノロジー株式会社 配線基板およびその製造方法
JP2010135347A (ja) * 2008-10-28 2010-06-17 Kyocer Slc Technologies Corp 配線基板およびその製造方法
US8441123B1 (en) * 2009-08-13 2013-05-14 Amkor Technology, Inc. Semiconductor device with metal dam and fabricating method
US8426959B2 (en) 2009-08-19 2013-04-23 Samsung Electronics Co., Ltd. Semiconductor package and method of manufacturing the same
JP5625340B2 (ja) * 2009-12-07 2014-11-19 富士通セミコンダクター株式会社 半導体装置とその製造方法
KR101046713B1 (ko) * 2009-12-17 2011-07-06 삼성전기주식회사 패키지 기판 및 패키지 기판의 제조방법
CN102332440A (zh) * 2010-07-12 2012-01-25 无锡华润安盛科技有限公司 一种倒装引线框及其封装结构
JP5587123B2 (ja) * 2010-09-30 2014-09-10 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
KR101197846B1 (ko) 2010-11-30 2012-11-05 삼성전기주식회사 인쇄회로기판 어레이 및 이를 이용한 인쇄회로기판 플립칩 제조방법
FR2974234A1 (fr) * 2011-04-14 2012-10-19 St Microelectronics Grenoble 2 Assemblage de dispositifs a composants semiconducteurs empiles
KR101930689B1 (ko) 2012-05-25 2018-12-19 삼성전자주식회사 반도체 장치
JP6184061B2 (ja) * 2012-05-29 2017-08-23 キヤノン株式会社 積層型半導体装置及び電子機器
US9263377B2 (en) * 2012-11-08 2016-02-16 Taiwan Semiconductor Manufacturing Company, Ltd. POP structures with dams encircling air gaps and methods for forming the same
US9312193B2 (en) 2012-11-09 2016-04-12 Taiwan Semiconductor Manufacturing Company, Ltd. Stress relief structures in package assemblies
US9497861B2 (en) * 2012-12-06 2016-11-15 Taiwan Semiconductor Manufacturing Company, Ltd. Methods and apparatus for package with interposers
CN203026500U (zh) * 2012-12-25 2013-06-26 华为终端有限公司 堆叠封装器件
JP6203503B2 (ja) * 2013-02-18 2017-09-27 スタンレー電気株式会社 半導体発光装置
US9627229B2 (en) * 2013-06-27 2017-04-18 STATS ChipPAC Pte. Ltd. Semiconductor device and method of forming trench and disposing semiconductor die over substrate to control outward flow of underfill material
US10192810B2 (en) 2013-06-28 2019-01-29 Intel Corporation Underfill material flow control for reduced die-to-die spacing in semiconductor packages
US9659891B2 (en) * 2013-09-09 2017-05-23 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device having a boundary structure, a package on package structure, and a method of making
WO2015056430A1 (ja) * 2013-10-16 2015-04-23 パナソニック株式会社 半導体装置
US9503622B2 (en) * 2014-03-10 2016-11-22 Apple Inc. Preventing artifacts due to underfill in flip chip imager assembly
KR20160022603A (ko) * 2014-08-20 2016-03-02 삼성전기주식회사 플립칩 패키지 및 그 제조 방법
US9607959B2 (en) * 2014-08-27 2017-03-28 Taiwan Semiconductor Manufacturing Company, Ltd. Packaging device having plural microstructures disposed proximate to die mounting region
CN105448852A (zh) * 2014-08-27 2016-03-30 群创光电股份有限公司 曲面电子装置
US9466632B2 (en) 2015-01-09 2016-10-11 Samsung Electronics Co., Ltd. Image sensor package and an image sensor module having the same
JP6407042B2 (ja) * 2015-01-22 2018-10-17 エイブリック株式会社 半導体装置及びその製造方法
KR102412611B1 (ko) 2015-08-03 2022-06-23 삼성전자주식회사 인쇄회로기판(pcb)과 그 제조방법, 및 그 pcb를 이용한 반도체 패키지 제조방법
JP2017175000A (ja) * 2016-03-24 2017-09-28 ローム株式会社 電子部品およびその製造方法、ならびに、インターポーザ
CN105704938B (zh) * 2016-03-28 2018-07-06 上海美维电子有限公司 线路板的加工方法
JP6770331B2 (ja) * 2016-05-02 2020-10-14 ローム株式会社 電子部品およびその製造方法
WO2018126542A1 (zh) * 2017-01-04 2018-07-12 华为技术有限公司 一种堆叠封装结构及终端
JP2018113414A (ja) * 2017-01-13 2018-07-19 新光電気工業株式会社 半導体装置とその製造方法
JP2018147974A (ja) * 2017-03-03 2018-09-20 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子、電子機器、および半導体装置
US9978707B1 (en) * 2017-03-23 2018-05-22 Delphi Technologies, Inc. Electrical-device adhesive barrier
US10879194B2 (en) * 2017-05-25 2020-12-29 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor device package and method of manufacturing the same
TWI736780B (zh) * 2017-10-31 2021-08-21 台灣積體電路製造股份有限公司 晶片封裝及其形成方法
US11217460B2 (en) * 2018-05-09 2022-01-04 Texas Instruments Incorporated Multiple underfills for flip chip packages
JP7262743B2 (ja) * 2018-12-20 2023-04-24 三安ジャパンテクノロジー株式会社 弾性波デバイスを含むモジュール
KR20210022911A (ko) * 2019-08-21 2021-03-04 삼성전기주식회사 반도체 패키지
US11211263B2 (en) * 2019-11-19 2021-12-28 Qualcomm Incorporated Structure for arrayed partial molding of packages
JP2021103713A (ja) * 2019-12-25 2021-07-15 株式会社村田製作所 高周波モジュール及び通信装置
JP7603022B2 (ja) * 2020-01-14 2024-12-19 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子および電子機器
CN111508910B (zh) * 2020-04-21 2022-09-20 颀中科技(苏州)有限公司 一种覆晶封装结构及封装方法
CN113506781A (zh) * 2021-06-08 2021-10-15 日月光半导体制造股份有限公司 半导体结构及其制造方法
JP7750458B2 (ja) * 2021-06-30 2025-10-07 新光電気工業株式会社 半導体装置
CN113241338B (zh) * 2021-07-09 2021-10-19 东莞市春瑞电子科技有限公司 一种无引线预塑封半导体封装支架制备方法
US20230038411A1 (en) * 2021-08-03 2023-02-09 Texas Instruments Incorporated Semiconductor package with raised dam on clip or leadframe
KR20230060092A (ko) * 2021-10-27 2023-05-04 삼성전자주식회사 패키지 기판 및 이를 포함하는 반도체 패키지
JP7708643B2 (ja) * 2021-10-29 2025-07-15 新光電気工業株式会社 配線基板、半導体装置及び配線基板の製造方法
US20250016912A1 (en) * 2021-11-30 2025-01-09 Kyocera Corporation Wiring board
CN115241179A (zh) * 2022-08-03 2022-10-25 麦斯塔微电子(深圳)有限公司 芯片封装结构
CN115206902B (zh) * 2022-09-16 2023-01-31 江苏长电科技股份有限公司 芯片封装结构及其制作方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5120678A (en) * 1990-11-05 1992-06-09 Motorola Inc. Electrical component package comprising polymer-reinforced solder bump interconnection
JP3541300B2 (ja) 1994-09-21 2004-07-07 イビデン株式会社 電子部品搭載装置
US5855821A (en) * 1995-12-22 1999-01-05 Johnson Matthey, Inc. Materials for semiconductor device assemblies
JP2973940B2 (ja) * 1996-09-20 1999-11-08 日本電気株式会社 素子の樹脂封止構造
US6020221A (en) * 1996-12-12 2000-02-01 Lsi Logic Corporation Process for manufacturing a semiconductor device having a stiffener member
US5942798A (en) * 1997-11-24 1999-08-24 Stmicroelectronics, Inc. Apparatus and method for automating the underfill of flip-chip devices
JP3367886B2 (ja) * 1998-01-20 2003-01-20 株式会社村田製作所 電子回路装置
JPH11354554A (ja) 1998-06-09 1999-12-24 Tokin Corp Icチップの封止方法およびicカードの製造方法
US6048656A (en) * 1999-05-11 2000-04-11 Micron Technology, Inc. Void-free underfill of surface mounted chips
JP4362165B2 (ja) 1999-05-28 2009-11-11 イビデン株式会社 電子部品搭載装置
US6424033B1 (en) * 1999-08-31 2002-07-23 Micron Technology, Inc. Chip package with grease heat sink and method of making
US6498054B1 (en) * 2000-06-02 2002-12-24 Siliconware Precision Industries Co., Ltd. Method of underfilling a flip-chip semiconductor device
US6291264B1 (en) * 2000-07-31 2001-09-18 Siliconware Precision Industries Co., Ltd. Flip-chip package structure and method of fabricating the same
US6537482B1 (en) * 2000-08-08 2003-03-25 Micron Technology, Inc. Underfill and encapsulation of carrier substrate-mounted flip-chip components using stereolithography
JP2002093831A (ja) * 2000-09-14 2002-03-29 Shinko Electric Ind Co Ltd 半導体装置およびその製造方法
US6545869B2 (en) * 2001-01-17 2003-04-08 International Business Machines Corporation Adjusting fillet geometry to couple a heat spreader to a chip carrier
US6459144B1 (en) * 2001-03-02 2002-10-01 Siliconware Precision Industries Co., Ltd. Flip chip semiconductor package
JP4963148B2 (ja) * 2001-09-18 2012-06-27 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
US6762509B2 (en) * 2001-12-11 2004-07-13 Celerity Research Pte. Ltd. Flip-chip packaging method that treats an interconnect substrate to control stress created at edges of fill material
JP2004179576A (ja) * 2002-11-29 2004-06-24 Ngk Spark Plug Co Ltd 配線基板及びその製造方法
JP3997903B2 (ja) * 2002-11-29 2007-10-24 富士通株式会社 回路基板および半導体装置
JP2005175113A (ja) 2003-12-10 2005-06-30 Fdk Corp フリップチップ実装用プリント配線基板
US7015592B2 (en) * 2004-03-19 2006-03-21 Intel Corporation Marking on underfill
JP4415717B2 (ja) 2004-03-23 2010-02-17 ソニー株式会社 半導体装置及びその製造方法
JP2006140327A (ja) 2004-11-12 2006-06-01 Matsushita Electric Ind Co Ltd 配線基板およびこれを用いた電子部品の実装方法
JP4535969B2 (ja) * 2005-08-24 2010-09-01 新光電気工業株式会社 半導体装置

Also Published As

Publication number Publication date
US20080179738A1 (en) 2008-07-31
TW200834853A (en) 2008-08-16
CN101236946A (zh) 2008-08-06
US7880276B2 (en) 2011-02-01
JP2008187054A (ja) 2008-08-14
KR100938408B1 (ko) 2010-01-22
JP5211493B2 (ja) 2013-06-12
KR20080071497A (ko) 2008-08-04
CN101236946B (zh) 2011-12-07

Similar Documents

Publication Publication Date Title
TWI373835B (en) Wiring board and semiconductor device
CN100495694C (zh) 半导体器件
TWI470707B (zh) 佈線板及電子元件之安裝結構
US20100323498A1 (en) Circuit Device and Method of Manufacturing Thereof
US20140295620A1 (en) Method of manufacturing semiconductor device having plural semiconductor chips stacked one another
US11798885B2 (en) Method of fabricating copper pillar bump structure with solder supporting barrier
TWI527186B (zh) 半導體封裝及其製造方法
US20100007015A1 (en) Integrated circuit device with improved underfill coverage
CN101114630A (zh) 半导体器件及其制造方法
JP6242231B2 (ja) 半導体装置及びその製造方法
CN111199946A (zh) 铜柱凸点结构及其制造方法
CN110085560A (zh) 迹线上凸块封装结构及其形成方法
CN106463427B (zh) 半导体装置及其制造方法
JP3687610B2 (ja) 半導体装置、回路基板及び電子機器
TWI579937B (zh) 基板結構及其製法暨導電結構
US6956293B2 (en) Semiconductor device
JPH11214448A (ja) 半導体装置および半導体装置の製造方法
JP2012190939A (ja) 半導体装置およびその製造方法
JPH11168116A (ja) 半導体チップ用電極バンプ
JP2012023409A (ja) 回路装置およびその製造方法
JP2007150346A (ja) 半導体装置及びその製造方法、回路基板並びに電子機器
JP4454454B2 (ja) 半導体素子及びこの半導体素子を実装した半導体素子実装基板
JP2003017655A (ja) 半導体実装体およびそれを用いた半導体装置
TWI284969B (en) Apparatus to reduce occurrences of delamination between flip-chip underfill and UBM structure
CN110767622A (zh) 具有应力调节件的互连基板、其覆晶组件及其制作方法