TW593209B - Porous silicon nitride ceramics and method for producing the same - Google Patents
Porous silicon nitride ceramics and method for producing the same Download PDFInfo
- Publication number
- TW593209B TW593209B TW91103295A TW91103295A TW593209B TW 593209 B TW593209 B TW 593209B TW 91103295 A TW91103295 A TW 91103295A TW 91103295 A TW91103295 A TW 91103295A TW 593209 B TW593209 B TW 593209B
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- silicon nitride
- metal
- powder
- porous silicon
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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A7 ________ Β7 五、發明説明( ) 發明之技術領域 、X月係有關使用在各種配線電路基板、絕緣部材或電 波透過材等之介電材料,或輕質有耐吸濕性結構材料之多 孔質氮化矽陶瓷及其製造方法。 先前技術 陶瓷疋做為各種結構材料或電子零組件材料使用之材 料仁近年心切要求質輕且高強度,或是改善電氣特性等 提尚此等特性者。例%,在做為料體製造裝置零組件所 使用之晶片搬送置物台或描畫用置物台等,為了高精度' 回速度驅動之置物台材質的更為輕質化要求,又,在電子 機中所用之電路基板或絕緣材料等,隨著近曰之高頻率 化,強烈要求更為低介電率、低介電損失之材料。 -為此,認為將陶瓷做成多孔質來使用應會有效,例如陶 瓷之相對雄度降低50%的話,此重量就可以降低,又 因空氣顯示出之介電率約為〗,介電損失為0之優異電氣絕 緣性,所以多孔質陶瓷是可望求得低介電率、低介電損失 之材料。 然而,單單控制陶瓷燒結體之燒結步驟,很難獲得均勻 分散微細氣孔之多孔質燒結體。通常之情形,是藉由粗大 氣孔之發生會產生強度下降或特性不均勻之問題。又,所 得多孔質燒結體之氣孔因幾乎是開氣孔之故,會損害陶瓷 本來之耐濕性,由於水分之電氣特性(介電率、介電損失)顯 著惡化,或各種特性之偏差等,而有得不到實用上期望之 特性問題產生。 000317 本紙張尺度適用中國國家標準(CNS) A4規格(210X297公釐) 593209 A7
593209 A7 -—__B7 五、發明説明(Q ) 花更多功夫的問題。 特開平1 1-1 16333號公報中,是揭示熱處理硼矽酸 玻璃而分相化,溶出可溶性相,粉碎後,只在表面以火炎 溶融’藉由使閉氣孔化’能調整擁有奈米級之閉氣孔多孔 質玻璃m玻璃結晶化熱處理所得之多孔f骨材,調 整玻璃/骨材/樹脂球之混合物,⑽μ制法製作陶竟電路 基板之方法。在此方法所得陶:£電路基板之比介電率在2以 下,熱膨脹係數在13〜17 ppm/t:。在此方法中,以熱處理 分相化,限定溶出可溶性相之材料。χ,不僅製程複雜, 在異相中有必要使用複合化之故,得不到本來之機械的、 電氣的特性’再者,一旦開氣孔被包圍,就因吸著水分等 而會有困難完全解離、控制之問題產生。 形成上述般閉氣孔之以往技術,因有必要添加由起泡劑 或熔融物或是與熱膨脹係數不同相等之基材相所成之相異 第2相,由於第2相或第2相之殘渣,而會有大幅度降低電氣 的、機械的特性問題產生。又,氣孔率過大時,不能形成 基材骨格,變成不能控制氣孔徑等,所形成之氣孔率、氣 孔徑會受到限制。 發明所欲解決之課題 本發明是提供解決上述問題點者,即,本發明是有均勻 且微細之閉氣孔的多孔質氮化矽陶瓷及其製造方法。 本發明之多孔質氮化矽陶瓷,是相對密度為不滿70〇/〇 , 全氣孔中之閉氣孔比率為5 0%以上,更佳者,相對密度為 不足5 0%,全氣孔中閉氣孔之比率為90%以上。
本纸張尺度適用中國國家標準(CNS) Α4規格(210 X 297公釐) 593209 A7 B7
五、發明説明(4 通常多孔質陶瓷的情形,相對於如圖2模式般所示粒子間 變為氣孔者,本發明之多孔質氮化矽陶瓷,是如圖丨模式所 示般粒子變成中空狀之結構,緻密質部分(骨幹部)為網狀連 續之結構,且因不含粗大之空孔,有比一向之多孔質陶瓷 更優之機械強度與電氣特性,尤其,因粒子成中空化之 故’均勻徑之空孔有分散結構的多孔質陶瓷中,在多孔質 陶瓷之任意斷面中,相鄰接之2個空孔半徑rl、^與陶曼部 之寬度b間,可以有(1^ + r2)/b〉i之關係,較佳者為 + r2)/b > 2。 又,本發明之多孔質氮化矽陶瓷,是含有RE4Si2N2〇7或 RE1GN2(Si〇4)6所示之氧氮化物或氧氮化矽化合物結晶相。 又’至少有一部分絕緣層為上述多孔質陶瓷材料所成,以 此為特徵之陶瓷電路基板。 又’本發明之多孔質氮化矽陶瓷,是將金屬以粉與含有 Yb、Sm或Er中至少!種,相當於以粉有〇 2〜2 5莫爾者, 製作成形體後,在含有氮氣之包圍氣中,藉由熱處理製造 方法來製得。再者,上述成形體藉由微波或毫波照射下熱 處理’由中空化之氮化矽陶瓷粒子可得多孔質氮化矽陶 瓷。 圖式說明(元件符號說明) 圖1是本申請發明之多孔質陶瓷的斷面組織模式圖。 圖2是一向之多孔質陶瓷之斷面組織模式圖。 圖3表示在本申請發明多孔質陶瓷之燒結過程,是成形 狀態’(b)是燒結初期狀態,(c)是燒結完了狀態。 Γ Ρ ο ο ο η 本紙張尺度適用中國國家標準(CNS) A4規格(210 x 297公釐)
線 593209 A7 ___B7 五、發明説明(5 ) 圖4表示在本申請發明多孔質陶瓷之燒結過程中,丨個金 屬粒子之變化模式說明圖,(a)是燒結前之狀態,(b)是燒結 初期狀態,(c)是燒結進行狀態,是燒結完了狀態。 發明之實施形態: 有關本發明之多孔質氮化矽陶瓷,其製造方法用以下交 差式詳述。本發明之多孔質氮化矽陶瓷,是藉由含有由金 屬石夕粉末與燒結助劑粉末之準備步驟、將此等粉末混合做 成混合粉末之步驟、將該混合粉末成形成形體之步驟、與 將該成形體在氮氣存在包圍氣氛下燒結,做成金屬氮化物 燒結體之步驟的方法所製得。閉氣孔是將金屬矽粉末中空 化而得,相對密度與全氣孔中之閉氣孔比率是可以由做為 出發原料之金屬矽粉末的粒度來控制,金屬矽粉末是可以 使用市售之高純度金屬粉末,然而,在金屬矽表面,藉由 自然氧化膜或之後的熱處理形成熱氧化膜,依此氧化膜量 中空化之程度,因有顯著變化之故,隨著在金屬矽粉末中 之氧量或該氧量來控制粒界相之組成是很重要的事實,氧 量,換算成金屬氧化物(Si〇2),是期望選擇在〇.2莫爾%以 上,1.0莫爾%以下之範圍者,再者,混合中之氧量增加雖 可藉由添加偶合劑等來控制,或很重要地可藉由添加苯酚 脂還原劑等來抑制氧量之增加。 金屬石夕粉末之平均粒徑是以0.1微米以上,不足15微米者 為且。不足0·1微米時,比表面積大,上述氧量控制變得很 困難。又,在15微米以上時,因完全中空化,所以反應時 間變長,而不經濟。 0C2321 _8- 本紙張尺度適用中國國家標準(CNS) Α4規格(210X297公釐) 593209
在上述金屬石夕粉末中做為燒結助劑者,是添加几、^或 Er至少-種之氧化物、氧氮化物切化物等之化合物較 佳者是Yb或Sm之氧化物,添加量是相當金屬矽粉之"莫 爾%以上’ 2.5莫爾%以下者為宜,不足〇 2莫爾%時不能 促進金屬矽之擴散,矽粒子之中空化不能充分進行,又在 2.5莫爾%以上時’全氣孔率變得容易下降—向已知之 金屬矽氮化促進劑有三氧化二鐵或三氧化二鋁等,在本發 明之情形,中空化不能充分進行,並不好。 又,添加之燒結助劑的平均粒徑是以〇1微米以上,1微 米以下為宜,在不足Oj微米時,因易產生凝集等,所以變 得很困難處理,又在1微米以上時,變得不易進行金屬粉末 之氮化反應,又,金屬粉末之表面氧化膜會妨害反應之情 形,加入上述燒結助劑,較佳者是將鹼金屬或鹼土類金屬 或此等金屬之氧化物做為第2燒結助劑來添加,第2燒結助 劑之添加量以在0 · 1莫爾%以上,1 5莫爾%以下為宜,此平 均粒徑是以在0.1微米以上,2微米以下為宜。 金屬矽粉末與燒結助劑及添加必要之對應有機粘著劑, 藉由即存之球磨或超音波混合等方法來混合。混合後,使 其乾燥。之後,成形所定之形狀,可得成形體,成形通常 可以選擇使用乾式加壓成形法、押出成形法、刮刀成形法 及射出成形法等公知成形法,在所期望之形狀上配合品質 上、生產上最為期望之成形方法,其中在成形上將預先混 合之混合粉末以顆粒狀造粒,可以預先提高膨鬆密度,提 高成形性。上述有機粘著劑是在再提高成形性之情形下添 %;C2322 -9 - 本紙張尺度適用中國國家標準(CNS) A4規格(210 x 297公釐)
裝 訂
k 593209 A7 B7 五、發明説明 加0 將上述成形體藉由含氮氣體包圍氣雰下熱處理,形成特 定之粒界層後,在進行金屬矽之氮化反應時,在每個金屬 矽粉末中空化之同時,反應之鄰接金屬矽粉末氮化物成一 體化,可以得到有微細之閉氣孔多孔質氮化矽陶瓷,熱處 理是為了形成特定粒界相而進行前處理與氮化反應之中空 化反應處理之2階段。 前處理是可以在碳加熱爐中進行,將上述成形體在800°C 以上,不滿1〇〇〇。(:之溫度中,進行1小時以上之熱處理,熱 處理時包圍氣體是含有20體積%以上之惰性氣體的包圍氣 體。在此前處理中,將Yb、Sm或Er以RE來表示,有必要 形成RE1()N2(Si〇4)6或RE4Si2N207所示粒界相,在不形成 如此粒界相之情形中,於下步驟之反應處理中不會促進矽 粒子之中空化,本發明之多孔質氮化矽陶瓷變成很困難製 得,因此,為了形成如此之粒界相,調整燒結助劑之組成 或原料粉末之氧量或熱處理條件,前處理之溫度不足8〇〇。〇 時,不會形成上述粒界相。又在1000°C以上之溫度時,因 在上述粒界相形成不充分下,開始金屬矽的氮化反應,很 難得到目的之多孔質氮化矽陶瓷,尤其粒界相是以 RE10N2(SiO4)6 為佳。 第2階段熱處理之反應處理,是在1000它以上之含氮氣或 是氨氣包圍氣雾中進行,在包圍氣雾中,在氮氣或是氨氣 中也可以加入氦氣,加熱雖然也可以用碳加熱爐等,但為 了金屬石夕粉末之擴散’促進中空化,抑制粒子成長中空構 10- r. η n η ο ^ 本紙張尺度適用中國國家標準(CNS) Α4規格(210 X 297公釐) 593209 A7 B7 五、發明説明 造之消失,以使用微波或毫米波熱處理較佳,尤其以2〇 GHz以上之頻率微波照射加熱時,在金屬矽粉末之外殼所 形成之金屬氮化物(ShN4)可以促進金屬之擴散,金屬粉末 之中空化因而變得容易,所以較佳。 反應處理溫度是以1000°c以上較佳,不滿i〇〇〇t時,金 屬粉末之氮化反應進行變慢,沒有經濟性,又以碳加熱爐 加熱以在1500°C之下,微波加熱在175(rc以下之溫度較 佳,在此以上之溫度因會產生金屬氮化物之變態相或粒子 成長之故,中空化結構生變後,很難得到本發明之多孔質 陶瓷。 又,上幵到最兩溫度之昇溫是以分成2階段以上之階段昇 溫較佳,在此,金屬之氮化反應因是發熱反應之故,一下 子昇溫到最終燒結溫度時,因本身之發熱溫度會超過金屬 之融點,會造成金屬之熔融,金屬熔融時,會變成末反應 之熔融塊,因會造成粗大之空孔,或自成形體熔出會引起 多孔質陶瓷之機械的、電氣的特性劣化。 同時,通常之情形,金屬矽變成完全氮化矽,到金屬矽 消失為止’約需進行2小時以上之熱處理,但依目的,可望 縮短熱處理之時間,藉由殘留金屬矽,可得到較高閉氣孔 率的氮化矽陶瓷。 在反應處理中,如圖3、4所示模式般,首先氮化金屬石夕 粉末之表面,進行反應處理時,氮化反應之際,有金屬向 外周之氮化物擴散、進行氮化反應、中空化之模樣,為 此’最終在有金屬矽粉末部分變成空孔,如此對金屬矽的 本紙張尺度適用中國國家標準(CNS) A4規格(2l〇x 297公釐)
裝 訂
593209
外周部氮化物之擴散’在於形成上述特定粒界層之情形變 得特別顯著。中空化程度是依含在出發原料之金屬矽粉末 中的氧量,或燒結助劑之種類或熱處理方法而異,每個閉 氣孔的大小,在基本上,因是依出發原料之金屬矽粉末粒 度來決定大小,金屬矽粉末的粒徑若均勻的話,閉氣孔的 大小就變得均勻,不會含有粗大之閉氣孔。同時,熱處理 時包圍氣體之壓力並無限定,但以在1氣壓(1〇lkPa)以上, 5氣壓(507 kPa)以下為佳。 裝 訂
線 如以上所得本發明之多孔質陶瓷,是金屬矽粉末之每個 粒子藉由中空化,而成為均勻徑之空孔分散組織。為此, 其為耐吸濕性優、低介電率、低介電損失之多孔質氮化矽 陶瓷,相對密度不足70%,全氣孔中之閉氣孔比率變為 50%以上。再者,選擇原料金屬矽粉末之平均粒徑、表面 氧量、燒結助劑之種類、燒結條件,可以做成相對密度不 足5 0%,全氣孔中之閉氣孔比率變為9〇%以上。 本發明之多孔質氮化矽陶瓷之任意剖面中,如圖1所示 般,相鄰接空孔之半徑分別定為^、r2,陶瓷部之厚度定 為b,可以變成(rl + r2)/b>1之關係,總之可以選擇原料 金屬矽粉末之平均粒徑、表面氧量、燒結助劑之種類、燒 結條件,空孔之徑為與陶瓷之厚度相等以上,較佳為(^ + r2)/b > 2。如此之組織,介電損失可以更為降低。 又,做為本發明多孔質氮化矽陶瓷,所期望形態之介電 損失是在1〇-4程度以下。做為機械的特性,3點彎曲之抗折 強度是在200MPa以上,為有優異之電氣的、機械特性2多
593209
孔質氮化矽陶瓷。 實施例1 準備平均粒徑為1 // 功n 之夕粉末與燒結助劑,平均粒徑為 0.8//m之Er203,相當於々 '矽粉末之0.8莫爾%。任一種粉末 都是市售品’又,準備石夕令、士 w y务末之表面氧量是,惰性氣體融 解以、.工外線;^出法測定,換算成训2預先確認有〇7莫爾 %者。將準備之各粉末溶解到乙醇中,以球混機混合24小 時’此時’做為氧化抑制劑者為添加4 Wt%之辛基三乙氧基 石夕院’混合後,自然乾燥,制乾式加壓,成形直徑 23mm、高度3mm與縱4.5mm、橫7賴、高度4 5舰大小 之成形體。 將此成形體在含有大氣壓3〇 v〇1%氬的氮氣包圍氣體中 (30 vol% Ar - 70 v〇l〇/。NO藉由頻率28GHz之微波加熱, 在95 C保持1小時。之後,將包圍氣體做成大氣壓之氮包圍 氣體後’以表1之條件進行反應處理,在此,12〇〇*3 + 1400*3者是表示在1200°C保持3小時後,昇溫到1400°C保 持3小時之意思,2階段昇溫的理由是聚矽酮之氮化反應, 在1400°(:中因是發熱反應(3丨+ 2/3 1^2=1/3 51以4 + 641^) 之故,一下子就昇溫到1400 °C時,由於本身發熱,溫度變 成在1400°C以上,矽等就會發生熔融。自然冷卻後,使用 直徑20mm、高度1mm以及縱3mm、橫4mm、高度40mm大 小之外周研削盤與平面研削盤進行最後加工,用最後加工 之燒結體,進行如其次般來測定各特性。同時,燒結體藉 由X線折射,確認得知金屬矽不殘留,全部變成Si3N4。
裝 訂
λ
G
-13- 本紙張尺度適用中國國家標準(CNS) Α4規格(210 X 297公釐) 593209 五、發明説明( A7 B7
全氣孔率是自燒結體之尺寸與重量算出外表密度,又理 論密度則是由燒結助劑之添加量混合法則來計算,依下式 求得, (卜外表密度/理論密度)X 100(%) 閉氣孔比率是由水銀孔度計,測定開氣孔容積,由下式 計算出。(全氣孔容積-開氣孔容積)/全氣孔容積X i 〇〇 (%) 相鄰之空孔半徑Γ1、Γ2及陶瓷部厚度b是,將燒結體切 斷,將斷面研磨後,以SEM觀察。由此SEM照片,用2次元 破疋空孔之中心點的重心位置點’如圖1所示般,連結任意 鄰接空孔中心點,測定空孔之半徑rl、r2及陶瓷部厚度b, 測定50個點之結果平均值在表1表示。 做為電氣特性,在30GHz之介電率及介電損失(tan5)依 JIS R 1627規定測定方法測定,此結果在表1表示。 表1
裝 訂
No 燒結條件 全氣孔率 (%) 閉氣孔 比率(%) (rl + r2) /b 介電率 tan δ (ΧΙΟ·5) 1 1200 * 3 + 1400 * 3 80 92 2.43 2.1 12 2 1300 * 3 + 1500 * 3 80 90 2.40 2.1 7 3 1300 *3 + 1600 * 3 75 88 2.01 2.9 9 4 1300 * 3 + 1650 * 3 31 Ί 70 2.0 5 35 5* 1300 * 3 + 1700 * 3 28 51 1.4 6.8 90 6* 1300 * 3 + 1800 * 3 29 35 1.20 7.5 100 -14-
0C032? ________ 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 593209 五、發明説明(12 *表示比較例 自表丨可知,本發明多孔質氮化梦是,氣孔率為3〇%以 上,即相對密度不滿70% ’閉氣孔之比率在5〇%以上,如 此做得之多孔質氮切m關定為電⑽性,尤其 介電損失特性優之n,又,燒結溫度為18G(rc之情形, 依粒子成長與相變態,中空化之結構為有變化、細緻^。 燒結溫度為1200t〜1650°C ’(rl +r2)/b之值在2以上,介 電損失是在12 X 1〇_5以下的優秀品。 實施例2 準備平均粒徑1/zm之矽粉末與做為燒結助劑,平均粒徑 〇.8//m之表2所述稀土類氧化物,相當於矽粉末之〇 8莫^ γ者。任一種粉末都是市售品,又,準備矽粉末表面氧量 是,惰性氣體融解,以紅外線檢出法測定,換算成以〇2預 先確認有0·7莫爾%者。將準備之各粉末以與實施例丨相同之 方法,進行混合、成形、熱處理。 之後,將包圍氣體做成大氣壓之氮包圍氣體後,昇溫到 1000°C保持3小時後,昇溫到^⑽它保持3小時,自然冷卻 後,與實施例1相同進行最後加工,各燒結體之全氣孔率、 閉氣孔率、”電率及介電損失以與實施例1相同方法進行測 定。又,做為機械特性者以JIS Rl601規定做成強度試驗片 形狀,3點彎曲強度以同規定為基準測定,此等測定結果在 表2中表示,同時,各燒結體是由χ線折射確認得知金屬矽 不殘留’全部變成Si3N4。 本紙張尺度適用中國國家標準(CNS) A4規格(21〇x 297公釐) 593209 A7 B7 五、發明説明( 表2
No 燒結助 劑種類 全氣孔 率(%) 閉氣孔 比率(%) (rl + r2)/b tan 5 (x 10'5) 介電率 抗折強 度(MPa) 7* La)〇i 58 10 0 120 4.5 40 8* Nd,〇i 59 20 0.54 110 4.2 TV/ 50 9 Sin^O^ 88 98 2.2 5 1.8_ 300 10 Er20^ 80 90 1.8 20 3.0 200 11* Gd20^ 65 45 1.2 70 4.1 190 12 Yl>2〇3 78 99 2.61 6 2.5 300 13* A120^ 28 2 0 320 6.8 60 14* Fe2〇3 38 <1 0 400 6.5 50 表示比較例 自表2可知,本發明添加燒結助劑所得燒結體是,氣孔率 為70%以上,即相對密度在30%以下,閉氣孔之比率在 5 0%以上,又介電損失與一向之多孔質陶瓷相比,低到2 X 1〇4,抗折強度為200MPa以上,有優異之電氣的、機械的 特性。 又,(rl +r2)/b之值雖在1以上,但選擇燒結助劑的話,2 以上即可變成空孔之直徑為陶瓷部厚度之2倍以上之多孔質 氮化矽陶瓷。空孔之直徑,例如在No 9之試料中,為 0 · 7 // m ’又’使用氦測定機,測定泄漏量時,泄漏量在n 〇 9之試料中,為8 X 1(T9 atm.cc/sec,No 10之試料,為7 X 1(T7、No 12之試料,為5 X 1(Τ9,判定有氣密封止效果。 CC0329 -16- 適用中國國家標準(CNS) Α4規格(210 X 297公釐y 五、發明説明(14 ) 實施例3 千m τ巧粒徑 0 8/ym^ VK η 物禾與做為燒結助劑,平均粒徑 之Yb2〇3相當於矽粉 市售品,X,準備石夕於古4 干饪種私末都疋 法測定,換算面之氧量是’如實施例1相同方 2相同之方法進Λ認有G.7莫爾%者。以與實施例 A 法進仃混合、成形、熱處理,最後加工。所得 粍結體之全氣孔率、閉氣 方法進行測定,結果如表3所^;^失以與實施例1相同 表3
自表3可知’燒結助劑之添加量為不滿〇2则1%,若超過 2·5ϊΠ〇1%時’可判定為閉氣孔之比率變低,介電損失變 大。總之’燒結助劑之添加量少時,梦粒子之中空化不能 充分進行,多時因粒子成長,閉氣孔之比率變少。 實施例4 準備平均粒徑0.8H’之各石夕粉末與做為燒結助劑平 均粒徑0.8鋒之Sm2〇3 ’相當於碎粉末〇為以者。各石夕 粉末表面之氧量是以如實施#u所述相同方法測定,結果
-17- 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐) 五、發明説明(15 ) (換异成31〇2)如表4所示,各粉末任—種都是市售品,使用 此等粉末1與實_2相同之方法,進行⑤合、成形熱 後加工。但N°22試料,在球磨混合時,添加氧化 P、、·…:各燒結體之全氣孔率、閉氣孔率以與實施W相同 方法進仃測疋’結果如表4所示。又,由X線折射來同定粒 界相也如表4所示。 表4
No 粒徑 (/m) 表面氧量 (mol%) 全氣孔率 (%) 閉氣孔比 率(%) 粒界相 19* 10 --—^ 一 0.17 65 —---- 21 SmSiN02 20 4 0.5 82 92 SminN^CSiOA 21 1 0.9 72 99 SiruSi9N,〇7 22* 1 0.9 52 45 Sm2Si3N40^ 23* 0.8 3.0 40 10 Sm^Si^N^O^ * ^ i-U A* / . 表示比較例 比較使用相同原料之碎粉末Ng 21與Ng 22之試料時,No 22者因有添加氧化抑制劑之故’在ball miu(球磨)混合後 之金屬矽粉末的氧量增加到1.7mol%。此事由表4可以判 定’金屬發粉末之氧量為不足〇.2mol%或超過l.Omol% 時粒界相之組成與本發明目的之粒界相組成,因有不同 之組成’全氣孔率變少,閉氣孔比率變低,此等被認為是 因為粒界相組成不同,所以反應形態變得不同,不會促進 金屬石夕之中空化α CC9331 -18_ 本紙張尺度適财a s $:橾準(CNS) Α4規格(21Q χ 297公董) 593209 A7 B7 五、發明説明(16 ) 實施例5 準備與實施例1相同之矽粉末與Εγ2〇3粉末,使用此等粉 末,以與實施例1相同之方法,進行混合、成形。與實施例 1相同在950°C保持1小時後,成形體在大氣壓之氮氣包圍氣 雾下,以碳加熱器加熱,以表5條件燒結,同時,燒結條件 與實施例1所述相同,燒結體如實施例1進行最後裝飾加 工,各燒結體之全氣孔率、閉氣孔率、(rl +r2)/b之值及介 電損失以與實施例1相同方法進行測定,結果如表5所示。 又,(r 1 +r2)/b之值是測定50個地方之平均值。
裝 表5 No 燒結條件 全氣孔率 (%) 閉氣孔比率 (%) (rl +r2)/b tan δ (χ ίο-5) 24 1300 * 3 + 1500 * 3 50 65 1.2 100 25 1000 * 3 + 1200 * 3 55 70 1.8 80 26* 1300 * 3 + 1800 * 3 15 30 0.54 160 *表示比較例 訂
線 由表5可知,燒結溫度在1800°C之情形,由於粒成長與相 變態,中空化之結構起變化而緻密,又,表1與表5比較 時,可知由微波加熱的一方,閉氣孔比率變高,介電損失 變低。在此,微波之一方為效率佳,因可以加熱之故,被 認為對金屬矽之外殼(氮化矽)因藉由擴散反應而得以促進進 行。 發明之效果 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 593209 A7 B7 五、發明説明(17 ) 依本發明的話,與其他之材料相比,又與一向之方法相 比,可得閉氣孔比率高、且閉氣孔均勻分散之多孔質氮化 矽陶瓷,本發明的多孔質氮化矽陶瓷因閉氣孔比率高、電 氣的、機械的特性優,所以可以對應需要求耐濕性、低介 電率與低介電損失,又機械強度也有必要之電子電路基板 等使用,能發揮優異之特性。 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐)
Claims (1)
- 593209 第091103295號專利申請案92. 12.-藏 中文申請專利範圍替換本(92年月益 申請專利範圍 1. 一種多孔質氮化矽陶瓷,其特徵為: 相對密度不足70%,全氣孔中閉氣孔之比率為5〇%以上; 其任意斷面中,相鄰之2個空孔半徑rl、r2與陶瓷部之寬 度b之間,具有(rl + r2)/b〉丨之關係;且 含有REJizN^7或REiGN2(Si〇4)所示之氧氮化物或氧氮 化矽化合物結晶相,其中尺£為丫13、Sm*Er。 2· —種氮化矽陶瓷電路基板,其特徵為至少一部分之絕緣層 係包含如申請專利範圍第丨項所述之多孔質氮化矽陶瓷材 料。 3·種多孔質氮化矽陶瓷之製法,其特徵為將金屬矽粉末與 含有相當於金屬矽粉末0 2〜2 5 mol%之Yb、Sm或Er中 至少一種之化合物粉末,製作為成形體後,在含有氮氣之 包圍氣雾中進行熱處理。 4·如申請專利範圍第3項之多孔質氮化矽陶瓷之製法,其中 藉由以微波或毫米波照射下對上述成形體熱處理,而得包 含中空化氮化石夕陶瓷粒子之多孔質氮化矽陶瓷。
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KR20180081642A (ko) * | 2017-01-06 | 2018-07-17 | 국방과학연구소 | 반응결합 질화규소의 제조방법 |
EP4219428A1 (en) | 2017-04-17 | 2023-08-02 | Kabushiki Kaisha Toshiba, Inc. | A substrate, a circuit board, and method for manufacturing the substrate |
CN108585917B (zh) * | 2018-05-08 | 2020-06-26 | 中国人民解放军国防科技大学 | 氮化硅-碳化硅复相多孔陶瓷的制备方法 |
CN109734456A (zh) * | 2019-03-11 | 2019-05-10 | 中国科学院理化技术研究所 | 一种多孔氮化硅陶瓷的制备方法 |
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CN115872784B (zh) * | 2022-11-28 | 2024-01-26 | 航天特种材料及工艺技术研究所 | 一种多孔氮化硅陶瓷材料及其去除残碳的方法 |
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JPH0787226B2 (ja) * | 1987-02-25 | 1995-09-20 | 株式会社村田製作所 | 低誘電率絶縁体基板 |
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JPH06157157A (ja) | 1992-11-18 | 1994-06-03 | Inax Corp | 閉気孔性セラミックスの製造方法 |
US6197243B1 (en) * | 1993-04-16 | 2001-03-06 | Ut Battelle, Llc | Heat distribution ceramic processing method |
JP3287922B2 (ja) | 1993-09-10 | 2002-06-04 | 株式会社日立国際電気 | データ送信方法及び装置 |
JPH08228105A (ja) * | 1995-02-21 | 1996-09-03 | Sumitomo Electric Ind Ltd | マイクロストリップ基板 |
JPH08295576A (ja) * | 1995-04-24 | 1996-11-12 | Eagle Ind Co Ltd | 独立球形気孔を有するセラミックス部材およびその製造方法 |
GB9515242D0 (en) * | 1995-07-25 | 1995-09-20 | Ecc Int Ltd | Porous mineral granules |
JP3228198B2 (ja) | 1997-10-17 | 2001-11-12 | 住友金属工業株式会社 | セラミックス材料と回路基板およびその製造方法 |
JPH11322438A (ja) * | 1998-03-12 | 1999-11-24 | Sumitomo Electric Ind Ltd | 高熱伝導性窒化ケイ素質焼結体及びその製造方法 |
JP4719965B2 (ja) * | 1999-10-08 | 2011-07-06 | 東レ株式会社 | セラミックス |
US6800360B2 (en) * | 2001-02-08 | 2004-10-05 | Sumitomo Electric Industries, Ltd. | Porous ceramics and method of preparing the same as well as microstrip substrate |
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- 2002-03-22 KR KR10-2003-7006741A patent/KR20030090607A/ko not_active Application Discontinuation
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CN1197830C (zh) | 2005-04-20 |
JP2003160384A (ja) | 2003-06-03 |
WO2003022780A1 (fr) | 2003-03-20 |
EP1424317A1 (en) | 2004-06-02 |
US7041366B2 (en) | 2006-05-09 |
KR20030090607A (ko) | 2003-11-28 |
CN1473140A (zh) | 2004-02-04 |
US20040013861A1 (en) | 2004-01-22 |
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