WO2003022780A1 - Ceramiques poreuses en nitrure de silicium et leur procede de production - Google Patents
Ceramiques poreuses en nitrure de silicium et leur procede de production Download PDFInfo
- Publication number
- WO2003022780A1 WO2003022780A1 PCT/JP2002/002809 JP0202809W WO03022780A1 WO 2003022780 A1 WO2003022780 A1 WO 2003022780A1 JP 0202809 W JP0202809 W JP 0202809W WO 03022780 A1 WO03022780 A1 WO 03022780A1
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- WIPO (PCT)
- Prior art keywords
- silicon nitride
- metal
- powder
- porous silicon
- ceramic
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- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
- Y10T428/249971—Preformed hollow element-containing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
- Y10T428/249971—Preformed hollow element-containing
- Y10T428/249974—Metal- or silicon-containing element
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
- Y10T428/249976—Voids specified as closed
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/25—Web or sheet containing structurally defined element or component and including a second component containing structurally defined particles
- Y10T428/252—Glass or ceramic [i.e., fired or glazed clay, cement, etc.] [porcelain, quartz, etc.]
Definitions
- the present invention relates to a dielectric material used for various printed circuit boards, insulating members or radio wave transmitting materials, a porous silicon nitride ceramic which is a lightweight and moisture-resistant structural material, and a method for producing the same.
- Ceramics are materials used as various structural materials and electronic component materials.
- improved properties such as lighter weight, higher strength, and improved electrical characteristics.
- wafer transport stages and drawing stages used as parts for semiconductor manufacturing equipment require further weight reduction of stage materials for high-precision and high-speed driving.
- materials with lower dielectric constant and lower dielectric loss have been strongly required with the recent increase in frequency.
- porous ceramics it is considered effective to use porous ceramics. For example, if the relative density of ceramics is reduced to 50%, the weight can be reduced by 0.50%. In addition, since air has a dielectric constant of about 1 and a dielectric loss of 0, indicating excellent electrical insulation, porous ceramics can obtain desirable characteristics as a material requiring a low dielectric constant and a low dielectric loss.
- Hei 3-177372 discloses that a volume ratio when the total number of closed pores is 0.07 by adding phases having different thermal expansion coefficients for the purpose of improving toughness.
- a SiC-based porous sintered body having a content of about 27.5% is disclosed.
- this method there is a problem that, if an attempt is made to obtain a SiC-based porous sintered body having closed pores of 27.5% or more, oxidation resistance decreases and the pore diameter increases. .
- Japanese Patent Application Laid-Open No. 5-310469 discloses a high-purity sintered lucia having a diameter of 2 to 10 m and a closed porosity of 5 to 15%.
- This sintered body is obtained by mixing a foaming agent such as phenol aldehyde or a flammable fine powder such as carbon black in a slurry of calcium carbonate and water, followed by firing.
- a foaming agent such as phenol aldehyde or a flammable fine powder such as carbon black in a slurry of calcium carbonate and water
- Japanese Patent Application Laid-Open No. 6-1577-157 discloses a lightweight and high-strength ceramic having closed pores formed by balancing the pressure of the closed pores inside the ceramic and the pressure in the firing furnace. Have been. However, this method has a problem that it is difficult to control the pore diameter and it is difficult to obtain a high porosity.
- Japanese Patent Publication No. 7-872226 discloses a method of obtaining ceramics having fine closed pores by mixing ceramics and a granular resin and firing the mixture.
- the granular resin sublimates and burns to form closed pores.However, the granular resin remains in the ceramics, and the combustion gas of the granular resin is adsorbed on the inner surface of the closed pores. A drop occurs.
- Japanese Patent Application Laid-Open No. H11-116163 also discloses that borosilicate glass is phase-separated by heat treatment, a soluble phase is eluted, and after pulverization, only the surface is melted with a flame to form closed pores.
- a porous glass having closed pores on the order of nanometers can be prepared.
- a method is disclosed in which a mixture of glass aggregate / resin balls is prepared using a porous aggregate obtained by subjecting this glass to crystallization heat treatment, and a ceramic circuit board is produced by a green sheet laminating method. Dielectric constant of ceramic circuit board obtained by this method Is less than or equal to 2 and the coefficient of heat is 13 to 17 p ⁇ ⁇ ⁇ .
- the material is phase-separated by heat treatment and limited to materials that elute the soluble phase. Moreover, not only is the process complicated, but it is also necessary to use the compound in different phases, so that the original mechanical and electrical properties cannot be obtained. Furthermore, once the open pores are exposed to the atmosphere and moisture is absorbed, it is difficult to completely dissociate and control the moisture.
- the conventional technology for forming closed pores as described above requires the addition of a foaming agent, a melt, or a second phase different from the matrix phase such as a phase having a different thermal expansion coefficient. There is a problem that electrical and mechanical properties are greatly reduced due to two-phase residues. Also, increasing the porosity limits the porosity and pore size that can be formed, such as the inability to form a matrix skeleton and uncontrollable pore size. Disclosure of the invention
- the present invention has been made to solve the above problems. That is, the present invention provides a porous silicon nitride ceramic having uniform and fine closed pores and a method for producing the same.
- the relative density is less than 70%, and the ratio of closed pores in all pores is 50% or more. More preferably, the relative density is less than 50%, and the proportion of closed pores in all the pores is 90% or more.
- porous silicon nitride ceramics of the present invention have particles as schematically shown in FIG. Has a hollow structure, so that the dense part (skeleton) is continuous in a network. Since it does not contain coarse pores, it has better mechanical strength and electrical properties than conventional porous ceramics.
- the radius r1, r2 of two adjacent pores in an arbitrary cross section of the porous ceramic is determined. The width b and the force of the ceramic part (r 1 + r 2) Z b> 1 can be satisfied.
- porous nitride Kei-containing ceramics of the present invention RE 4 S i 2 N 2 0 7 or REi Q N 2 (S i 0 4) oxynitride represented by 6 or oxynitride Kei containing compound crystal phase contains. Further, there is provided a ceramic circuit board, wherein at least a part of the insulating layer is made of the porous ceramic material.
- the porous silicon nitride ceramics of the present invention is a molded article comprising: a metal Si powder and at least one of Yb, Sm or Er with respect to the metal Si powder in an amount of 0.2 to 2.5 mol%. , And then heat-treated in an atmosphere containing nitrogen. Further, by heat-treating the compact under microwave or millimeter-wave irradiation, a porous silicon nitride ceramic comprising hollow silicon nitride ceramic particles can be obtained.
- FIG. 1 is a schematic diagram of a cross-sectional structure of the porous ceramics of the present invention.
- FIG. 2 is a schematic diagram of a cross-sectional structure of a conventional porous ceramics.
- FIG. 3 shows the sintering process of the porous ceramic of the present invention.
- A shows a formed state
- (b) shows an initial state of sintering
- (c) shows a state of completed sintering.
- FIG. 4 is a diagram schematically illustrating a change of one metal particle in a sintering process of the porous ceramic of the present invention, wherein (a) shows a state before sintering, and (b) shows an initial state of sintering.
- C shows the state where sintering has progressed, and (d) shows the state where sintering has been completed.
- the porous silicon nitride ceramics of the present invention will be described in detail below, including the manufacturing method.
- the porous silicon nitride ceramics of the present invention comprises: a step of preparing a metal Si powder and a sintering aid powder; a step of mixing these powders to form a mixed powder; And a step of sintering the molded body in an atmosphere containing nitrogen to form a sintered body of a metal nitride.
- the closed pores are obtained by hollowing the metal Si powder.
- the relative density and the ratio of closed pores in the total pores can be controlled by the particle size of the starting metal Si powder.
- As the metal Si powder a commercially available high-purity metal powder can be used.
- metal On the surface of the Si powder a natural oxide film and a thermal oxide film are formed by a subsequent heat treatment. Since the degree of hollowing changes remarkably depending on the amount of these oxide films, it is important to control the composition of the grain boundary phase depending on the amount of oxygen in the metal Si powder / the amount of oxygen. It is desirable to select an oxygen content in the range of 0.2 mol% or more and 1. Omo 1% or less in terms of metal oxide (Si 2 ). Further, it is important to suppress an increase in the amount of oxygen during mixing by adding a coupling agent or the like, or to suppress an increase in the amount of oxygen by adding a reducing agent such as a phenol resin.
- the average particle diameter of the metal Si powder is preferably 0.1 ⁇ or more and less than 15 ⁇ .
- the specific surface area is large, so that it is difficult to control the amount of oxygen.
- it is more than 15 / im the reaction time for completely hollowing out becomes long, so it is not economical.
- At least one compound such as an oxide, oxynitride or silicate of Yb, Sm or Er is added as a sintering aid to the metal Si powder. More preferably, it is an oxide of Yb or Sm.
- the amount of addition is preferably 0.2 mol 1% or more and 2.5 mol 1% or less based on the metal Si powder. ⁇ . If less than 2 mo 1%, diffusion of metal Si is not promoted and hollowing of Si particles is not sufficiently performed. When the content is 2.5 mo 1% or more, the total porosity tends to decrease.
- F e 2 0 3 and A 1 2 0 3 is known as nitriding accelerator metals S i, in the present case, since the hollowness is not performed enough not preferable.
- the average particle size of the sintering aid to be added is preferably 0.1 m or more and 1 ⁇ m or less. If it is less than 0.1 im, agglomeration or the like is likely to occur, so that handling becomes difficult. If it is more than ⁇ , the nitriding reaction of the metal powder becomes difficult to proceed. When the oxide film on the surface of the metal powder hinders the reaction, an alkali metal or an alkaline earth metal or an oxide of such a metal may be used as a second sintering aid in addition to the above sintering aid. It is preferably added.
- the addition amount of the second sintering aid is preferably 0.111110% or more and 1.5 mol% or less, and the average particle size is preferably 0.1 Aim or more and 2 ⁇ um or less.
- the metal Si powder, the sintering aid and, if necessary, the organic binder are added and mixed by an existing method such as a ball mill or ultrasonic mixing. After mixing, dry. Then, it is molded into a predetermined shape to obtain a molded body. Molding is usually dry press molding A known molding method such as an extrusion method, an extrusion molding method, a doctor blade molding method and an injection molding method can be used, and the most desirable molding method in terms of quality and production may be selected according to a desired shape.
- the mixed powder after mixing can be granulated into granules prior to molding, and the bulk density can be increased in advance to improve the moldability.
- the organic binder is added when the moldability is further improved.
- the nitridation reaction of the metal Si proceeds, whereby the individual metal Si powder becomes hollow.
- the nitrides of the reacting adjacent metal Si powders are integrated, and a porous silicon nitride ceramic having fine closed pores can be obtained.
- the heat treatment is performed in two stages: a pretreatment for forming a specific grain boundary phase and a reaction treatment in which the nitridation reaction proceeds to form a hollow.
- the pretreatment can be performed in a carbon heater furnace or the like.
- the molded body is heat-treated at a temperature of 800 ° C. or more and less than 1000 ° C. for 1 hour or more.
- the atmosphere during the heat treatment is a nitrogen atmosphere containing 20 V o 1% or more of an inert gas.
- Y b, the Sm or E r is indicated as RE, the grain boundary phase represented by RE 1 0 N 2 (S I_ ⁇ 4) 6 or RE 4 S i 2 N 2 0 7 a It is necessary to form. If such a grain boundary phase is not formed, hollowing out of Si particles is not promoted in the subsequent reaction treatment, and it is difficult to obtain the porous silicon nitride ceramics of the present invention.
- the composition of the sintering aid, the oxygen content of the raw material powder, and the heat treatment conditions are adjusted. If the pretreatment temperature is lower than 800 ° C, the grain boundary phase is not formed. Further, when the temperature is set to 1000 ° C. or more, the nitriding reaction of the metal Si is started while the formation of the grain boundary phase is insufficient, so that it is difficult to obtain a target porous silicon nitride ceramic.
- the grain boundary phase is. N 2 (Si 4 ) 6 is particularly preferred.
- the reaction treatment which is the second heat treatment, is performed in an atmosphere containing N 2 or NH 3 at a temperature of 1000 ° C. or higher.
- the atmosphere may include H 2 and He in addition to N 2 or NH 3 .
- Heating may be carried out using a carbon furnace or the like.However, in order to promote the diffusion and hollowing of the metal Si powder and to suppress the loss of the hollow structure due to grain growth, heat treatment using microwaves or millimeter waves is required. preferable. In particular, frequencies above 20 GHz Heating by irradiating microwaves can further promote the diffusion of the metal into the metal nitride (Si 3 N 4 ) formed on the outer shell of the metal Si powder. This is preferable because it becomes easier.
- the reaction temperature is preferably 100 ° C. or higher. If the temperature is lower than 1000 ° C., the progress of the nitriding reaction of the metal powder becomes slow, which is not economical. Further, the temperature is preferably 150 ° C. or less for heating with a carbon heater and 170 ° C. or less for microwave heating. At a temperature higher than this, phase transformation and grain growth of the metal nitride occur, so that the hollow structure changes and it becomes difficult to obtain the porous ceramic of the present invention.
- the temperature it is preferable to raise the temperature to the maximum temperature in two or more steps and to raise the temperature stepwise. This is because the nitridation reaction of a metal is an exothermic reaction, and if the temperature is raised to the final sintering temperature at once, the temperature of the metal exceeds the melting point of the metal due to its own heat generation, causing the metal to melt. When the metal is melted, it becomes an unreacted molten mass, and coarse pores are generated or eluted from the molded body, thereby deteriorating the mechanical and electrical properties of the porous ceramic. '
- heat treatment is performed for 2 hours or more until the metal Si completely changes to silicon nitride and the metal Si disappears, but depending on the purpose, the heat treatment time is intentionally shortened. However, by leaving the metal Si, a silicon nitride ceramic having a higher closed porosity can be obtained.
- the surface of the metal Si powder is first nitrided, as schematically shown in FIGS.
- the metal diffuses to the nitride side of the outer periphery during the nitridation reaction, and the nitridation reaction proceeds to form a hollow.
- the portion that was finally the metal Si powder becomes voids.
- Such diffusion of the metal Si into the nitride at the outer peripheral portion becomes particularly remarkable when the specific grain boundary layer is formed.
- the degree of hollowing differs depending on the amount of oxygen contained in the starting material, metal Si powder, the type of sintering aid, or the heat treatment method.
- each closed pore basically depends on the particle size of the metal Si powder as the starting material, if the particle size of the metal Si powder is uniform, the size of the closed pore Are uniform and do not contain coarse closed pores.
- the atmosphere pressure during the heat treatment is not limited, but is preferably 1 atm (101 kPa) or more and 5 atm (507 kPa) or less.
- the porous ceramic of the present invention obtained as described above has a structure in which pores having a uniform diameter are dispersed by hollowing out individual particles of the metal Si powder. For this reason, it is a porous silicon nitride ceramic which has excellent moisture absorption resistance, low dielectric constant and low dielectric loss.
- the relative density is less than 70%, and the percentage of closed pores in all the pores is 50% or more. Furthermore, if the average particle size of the raw metal Si powder, the amount of oxygen on the surface, the type of sintering aid, and the sintering conditions are selected, the relative density is less than 50% and the proportion of closed pores in all the pores is 9%. It can be 0% or more.
- the radii of adjacent holes are r 1 and r 2, and the thickness of the ceramic portion is b, and (r 1 + r 2) Z b> 1 is created.
- the diameter of the pores can be equal to or greater than the thickness of the ceramic. More preferably, (rl + r2) Zb> 2. With such a structure, dielectric loss can be further reduced.
- the dielectric loss as a desirable form of a porous nitride Kei-containing ceramics of the present invention will become more than about 1 0 4.
- the flexural strength due to three-point bending is 200 MPa or more, and it is a porous silicon nitride ceramic having excellent electrical and mechanical properties.
- Si powder having an average particle size of 1 ⁇ m and Er 2 O 3 having an average particle size of 0.8 ⁇ m as a sintering aid 0.8 mol% of the Si powder was prepared.
- Each powder is commercially available.
- the prepared powders were mixed in a ball mill for 24 hours using ethyl alcohol as a solvent. At this time, 4 wt% of otatyltriethoxysilane was added as an antioxidant. After mixing, the mixture was air-dried and formed into a size of 23 mm in diameter, 3 mm in height, 4.5 mm in length, 7 mm in width, and 4.5 mm in height using a dry press.
- This compact is placed in a nitrogen atmosphere containing 30 V o 1% r at atmospheric pressure (30 V o 1% It was kept at 950 ° C. for 1 hour by microwave heating at a frequency of 28 GHz with Ar-70 vo 1% N 2 ). After that, the atmosphere was changed to an atmospheric nitrogen atmosphere, and the reaction was performed under the conditions shown in Table 1.
- “1200 * 3 + 1400 * 3” means that after maintaining at 1200 ° C. for 3 hours, the temperature was raised to 1400 ° C. and maintained for 3 hours.
- the temperature was raised to 1400 ° C, the temperature increased to 1400 ° C or more due to its own heat, and melting of Si occurred.
- each characteristic was measured as follows. It should be noted that the sintered body was confirmed by X-ray diffraction to have no metal Si remaining and to be all Si 3 N 4 .
- the total porosity was obtained by calculating the apparent density from the dimensions and weight of the sintered body, and calculating the theoretical density from the amount of sintering additive added by the mixing rule, and using the following formula. (1—apparent density Z theoretical density) X 100 (%).
- the closed pore ratio was calculated by the following equation by measuring the open pore volume with a mercury porosimeter. (Total pore volume / open pore volume) Total pore volume X 100 (%)
- the radius r1, r2 of the adjacent hole and the thickness b of the ceramic part were measured by SEM after cutting the sintered body and polishing the cross section. From the SEM photograph, the center point of the hole is defined as the point of the center of gravity in two dimensions, and as shown in Fig. 1, the center points of any adjacent holes are connected, and the radii r1, r2 of the hole And the thickness b of the ceramic part were measured. Table 1 shows the average value of the results of measurement at 50 locations.
- the porous silicon nitride of the present invention has a porosity of 30% or more, that is, a relative density of less than 70%, and a ratio of closed pores of 50% or more. is there. It can be seen that the use of such porous silicon nitride ceramics results in ceramics having excellent electrical characteristics, particularly dielectric loss characteristics. Also, when the sintering temperature is 1800, it can be seen that the hollow structure changes due to the grain growth and phase transformation, and the powder is densified. Sintering temperature, in 1 200 ° C ⁇ 1 650 ° C , (r 1 + r 2) value of Zb is on 2 or more, dielectric loss, to be excellent and 1 2 xl 0- 5 below Understand.
- Example 2 Example 2
- Table 2 with an average particle size of 0.8 / m 0.8 mo 1% of rare earth oxide was prepared with respect to Si powder. Each powder is commercially available. The amount of oxygen on the surface of the Si powder was measured by melting with an inert gas and using an infrared ray detection method, and it was confirmed that the amount was 0.7 mol% in terms of SiO 2 in advance. The prepared powders were mixed, molded, and heat-treated in the same manner as in Example 1.
- Example 2 shows the measurement results. In each sintered body, it was confirmed by X-ray diffraction that the metal Si did not remain and that all of the sintered bodies were Si 3 N 4 .
- the sintered body obtained by adding the sintering aid of the present invention has a porosity of 70% or more, that is, a relative density of 30% or less, and the ratio of closed pores is 5%. 0% or more.
- the dielectric loss is lower than conventional porous ceramics, less than 2 x 10-4, and the transverse rupture strength is more than 2 oMPa, indicating excellent electrical and mechanical properties. .
- the value of (r 1 + r 2) / b is 1 or more.
- a sintering aid is selected, a porous material having a diameter of 2 or more, that is, a pore having a diameter of 2 times or more the thickness of the ceramic part, It is a silicon nitride ceramic.
- the diameter of the pores was, for example, 0.9 ⁇ m in the sample of No 9.
- Yb 2 O 3 having an average particle diameter of 0.8 ⁇ m was prepared in the ratio shown in Table 3 with respect to the Si powder.
- Each powder is commercially available.
- the amount of oxygen on the surface of the Si powder was measured in the same manner as in Example 1, and a sample which had been confirmed in advance to be 0.7 mo 1% by Sio 2 conversion was prepared.
- Mixing, molding, sintering, and finishing were performed in the same manner as in Example 2.
- Table 3 shows the results of measuring the total porosity, closed porosity, and dielectric loss of the obtained sintered body in the same manner as in Example 1.
- each S i powder and sintering aid having an average particle diameter of 0. 8 ⁇ 1 0 m, the average particle diameter 0. 8 ⁇ m Sm 2 0 3 of the prepared 1% 0. 8m o to S i powder .
- Each powder is commercially available. Using these powders, mixing, molding, sintering, and finishing were performed in the same manner as in Example 2. However, in the case of the sample of No.22, the oxidation inhibitor was not added at the time of mixing with the ball mill.
- Table 4 shows the results of measuring the total porosity and closed porosity of each sintered body in the same manner as in Example 1. Table 4 also shows the grain boundary phases identified by X-ray diffraction.
- the mark * indicates a comparative example.
- the oxygen content of the metal Si powder after ball mill mixing was increased to 1.7 mol%.
- Table 4 and Table 4 when the oxygen content of the metal Si powder is less than 0.2 mol / l or more than 1 mol / ° / 0 , the composition of the grain boundary phase becomes the object of the present invention. Since the composition is different from the composition of the grain boundary phase, the total porosity is low and the closed porosity is low. This is presumably because the composition of the grain boundary phase is different and the reaction morphology is different, and hollowing of the metal Si is not promoted.
- Example 5
- Example 1 Was prepared in the same manner S i powders and E r 2 0 3 powder as in Example 1. Using these powders, mixing and molding were performed in the same manner as in Example 1. After holding at 950 ° C. for 1 hour in the same manner as in Example 1, the molded body was sintered under a nitrogen atmosphere at atmospheric pressure by heating with a carbon heater under the conditions shown in Table 5. The sintering conditions are the same as in Example 1. Finishing of the sintered body was performed in the same manner as in Example 1. Table 5 shows the results of measuring the total porosity, the closed porosity, the value of (r 1 + r 2) / b, and the dielectric loss of each sintered body in the same manner as in Example 1. The value of (rl + r2) Zb is the average of the results of measuring 50 points.
- the porous silicon nitride ceramics of the present invention has a high ratio of closed pores and excellent electrical and mechanical properties, it is required to have moisture absorption resistance, a low dielectric constant, a low dielectric loss, and a high mechanical strength. When used for necessary electronic circuit boards, etc., it exhibits excellent characteristics.
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Description
Claims
Priority Applications (4)
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EP20020705461 EP1424317A1 (en) | 2001-09-04 | 2002-03-22 | Porous silicon nitride ceramics and method for producing the same |
KR10-2003-7006741A KR20030090607A (ko) | 2001-09-04 | 2002-03-22 | 다공질 질화규소 세라믹스 및 그 제조 방법 |
US10/415,823 US7041366B2 (en) | 2001-09-04 | 2002-03-22 | Porous silicon nitride ceramics and method for producing the same |
HK04102276A HK1059432A1 (en) | 2001-09-04 | 2004-03-29 | Porous silicon nitride ceramics and method for producing the same. |
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JP2002006821A JP2003160384A (ja) | 2001-09-04 | 2002-01-16 | 多孔質窒化ケイ素セラミックスおよびその製造方法 |
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EP (1) | EP1424317A1 (ja) |
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CN (1) | CN1197830C (ja) |
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CN1331812C (zh) * | 2006-02-24 | 2007-08-15 | 中国科学院上海硅酸盐研究所 | 高强度、低介电常数的二氧化硅结合的氮化硅多孔陶瓷及制备方法 |
US7749931B2 (en) * | 2006-02-13 | 2010-07-06 | Fujifilm Corporation | Ceramic optical parts and production methods thereof |
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JP4498732B2 (ja) * | 2003-12-25 | 2010-07-07 | 積水化学工業株式会社 | 多孔質体およびその製造方法 |
CN100358799C (zh) * | 2005-11-25 | 2008-01-02 | 长沙隆泰科技有限公司 | 一种氮化硅铁的微波合成方法 |
CN100354230C (zh) * | 2006-01-17 | 2007-12-12 | 武汉理工大学 | 一种磷酸作为添加剂的氮化硅多孔陶瓷材料的制备方法 |
JP4904465B2 (ja) * | 2006-02-13 | 2012-03-28 | 独立行政法人産業技術総合研究所 | セラミックス光学部品及びその製造方法 |
US8283707B2 (en) | 2006-03-10 | 2012-10-09 | Stmicroelectronics S.A. | Reduction of threshold voltage instabilities in a MOS transistor |
US9447503B2 (en) * | 2007-05-30 | 2016-09-20 | United Technologies Corporation | Closed pore ceramic composite article |
EP2025658A1 (en) | 2007-08-08 | 2009-02-18 | Imerys Ceramics France | Porous ceramic bodies and process for their preparation |
KR101130716B1 (ko) * | 2009-03-30 | 2012-03-28 | 서울대학교산학협력단 | 나노 질화규소계 세라믹스의 제조방법 |
CN101531538B (zh) * | 2009-04-02 | 2011-12-28 | 哈尔滨工业大学 | 多孔氮化硅/氧氮化硅陶瓷复合材料的近净尺寸制备方法 |
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EP4219428A1 (en) | 2017-04-17 | 2023-08-02 | Kabushiki Kaisha Toshiba, Inc. | A substrate, a circuit board, and method for manufacturing the substrate |
CN108585917B (zh) * | 2018-05-08 | 2020-06-26 | 中国人民解放军国防科技大学 | 氮化硅-碳化硅复相多孔陶瓷的制备方法 |
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- 2002-03-22 US US10/415,823 patent/US7041366B2/en not_active Expired - Fee Related
- 2002-03-22 EP EP20020705461 patent/EP1424317A1/en not_active Withdrawn
- 2002-03-22 KR KR10-2003-7006741A patent/KR20030090607A/ko not_active Application Discontinuation
- 2002-03-22 CN CNB028028767A patent/CN1197830C/zh not_active Expired - Fee Related
- 2002-03-22 WO PCT/JP2002/002809 patent/WO2003022780A1/ja not_active Application Discontinuation
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Also Published As
Publication number | Publication date |
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HK1059432A1 (en) | 2004-07-02 |
TW593209B (en) | 2004-06-21 |
CN1197830C (zh) | 2005-04-20 |
JP2003160384A (ja) | 2003-06-03 |
EP1424317A1 (en) | 2004-06-02 |
US7041366B2 (en) | 2006-05-09 |
KR20030090607A (ko) | 2003-11-28 |
CN1473140A (zh) | 2004-02-04 |
US20040013861A1 (en) | 2004-01-22 |
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