TW462097B - Semiconductor device and its wiring method - Google Patents
Semiconductor device and its wiring method Download PDFInfo
- Publication number
- TW462097B TW462097B TW089121084A TW89121084A TW462097B TW 462097 B TW462097 B TW 462097B TW 089121084 A TW089121084 A TW 089121084A TW 89121084 A TW89121084 A TW 89121084A TW 462097 B TW462097 B TW 462097B
- Authority
- TW
- Taiwan
- Prior art keywords
- electrode
- semiconductor
- semiconductor wafer
- solder joint
- circuit board
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01223—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in liquid form, e.g. by dispensing droplets or by screen printing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07554—Controlling the environment, e.g. atmosphere composition or temperature changes in dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5445—Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/547—Dispositions of multiple bond wires
- H10W72/5473—Dispositions of multiple bond wires multiple bond wires connected to a common bond pad
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/936—Multiple bond pads having different shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/752—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/753—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000007923A JP2001196529A (ja) | 2000-01-17 | 2000-01-17 | 半導体装置及びその配線方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW462097B true TW462097B (en) | 2001-11-01 |
Family
ID=18536276
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW089121084A TW462097B (en) | 2000-01-17 | 2000-10-09 | Semiconductor device and its wiring method |
Country Status (4)
| Country | Link |
|---|---|
| US (4) | US7071574B1 (https=) |
| JP (1) | JP2001196529A (https=) |
| KR (1) | KR100386995B1 (https=) |
| TW (1) | TW462097B (https=) |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001196529A (ja) * | 2000-01-17 | 2001-07-19 | Mitsubishi Electric Corp | 半導体装置及びその配線方法 |
| JP3631120B2 (ja) | 2000-09-28 | 2005-03-23 | 沖電気工業株式会社 | 半導体装置 |
| JP4189154B2 (ja) | 2001-04-02 | 2008-12-03 | 本田技研工業株式会社 | 自動二輪車の盗難対策装置設置構造 |
| US6979894B1 (en) * | 2001-09-27 | 2005-12-27 | Marvell International Ltd. | Integrated chip package having intermediate substrate |
| DE10251527B4 (de) * | 2002-11-04 | 2007-01-25 | Infineon Technologies Ag | Verfahren zur Herstellung einer Stapelanordnung eines Speichermoduls |
| EP1434264A3 (en) * | 2002-12-27 | 2017-01-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method using the transfer technique |
| JP2005123542A (ja) | 2003-10-20 | 2005-05-12 | Genusion:Kk | 半導体装置のパッケージ構造およびパッケージ化方法 |
| JP3880572B2 (ja) | 2003-10-31 | 2007-02-14 | 沖電気工業株式会社 | 半導体チップ及び半導体装置 |
| JP4103796B2 (ja) | 2003-12-25 | 2008-06-18 | 沖電気工業株式会社 | 半導体チップパッケージ及びマルチチップパッケージ |
| JP2006032871A (ja) * | 2004-07-22 | 2006-02-02 | Toshiba Corp | 半導体装置 |
| US20060202317A1 (en) * | 2005-03-14 | 2006-09-14 | Farid Barakat | Method for MCP packaging for balanced performance |
| US7535110B2 (en) | 2006-06-15 | 2009-05-19 | Marvell World Trade Ltd. | Stack die packages |
| US7420206B2 (en) | 2006-07-12 | 2008-09-02 | Genusion Inc. | Interposer, semiconductor chip mounted sub-board, and semiconductor package |
| TWI352416B (en) * | 2006-09-12 | 2011-11-11 | Chipmos Technologies Inc | Stacked chip package structure with unbalanced lea |
| US7750450B2 (en) * | 2006-12-20 | 2010-07-06 | Intel Corporation | Stacked die package with stud spacers |
| JP5191688B2 (ja) * | 2007-05-18 | 2013-05-08 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| CN101467251A (zh) * | 2007-06-01 | 2009-06-24 | 松下电器产业株式会社 | 半导体器件 |
| JP5126002B2 (ja) | 2008-11-11 | 2013-01-23 | セイコーエプソン株式会社 | 半導体装置及び半導体装置の製造方法 |
| KR20100117977A (ko) | 2009-04-27 | 2010-11-04 | 삼성전자주식회사 | 반도체 패키지 |
| US20110084374A1 (en) * | 2009-10-08 | 2011-04-14 | Jen-Chung Chen | Semiconductor package with sectioned bonding wire scheme |
| US8536716B1 (en) * | 2009-12-31 | 2013-09-17 | Micron Technology, Inc. | Supply voltage or ground connections for integrated circuit device |
| US8531849B1 (en) | 2010-03-31 | 2013-09-10 | Micron Technology, Inc. | Supply voltage or ground connections including bond pad interconnects for integrated circuit device |
| KR20120024099A (ko) * | 2010-09-06 | 2012-03-14 | 삼성전자주식회사 | 멀티-칩 패키지 및 그의 제조 방법 |
| US20120133381A1 (en) * | 2010-11-30 | 2012-05-31 | Electro Scientific Industries, Inc. | Stackable semiconductor chip with edge features and methods of fabricating and processing same |
| KR20130019290A (ko) * | 2011-08-16 | 2013-02-26 | 삼성전자주식회사 | 유니버설 인쇄 회로 기판 및 그것을 포함하는 메모리 카드 |
| WO2014017514A1 (ja) * | 2012-07-26 | 2014-01-30 | 株式会社村田製作所 | 複合電子部品及びそれを備える電子装置 |
| KR102037866B1 (ko) * | 2013-02-05 | 2019-10-29 | 삼성전자주식회사 | 전자장치 |
| JP2015002308A (ja) * | 2013-06-18 | 2015-01-05 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置及びその製造方法 |
| KR102108325B1 (ko) * | 2013-10-14 | 2020-05-08 | 삼성전자주식회사 | 반도체 패키지 |
| WO2016046339A1 (en) * | 2014-09-24 | 2016-03-31 | Koninklijke Philips N.V. | Printed circuit board and printed circuit board arrangement |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57103322A (en) | 1980-12-18 | 1982-06-26 | Nec Corp | Sealing case for semiconductor device |
| JP2809945B2 (ja) * | 1992-11-05 | 1998-10-15 | 株式会社東芝 | 半導体装置 |
| US5528083A (en) * | 1994-10-04 | 1996-06-18 | Sun Microsystems, Inc. | Thin film chip capacitor for electrical noise reduction in integrated circuits |
| US5665996A (en) * | 1994-12-30 | 1997-09-09 | Siliconix Incorporated | Vertical power mosfet having thick metal layer to reduce distributed resistance |
| KR0156334B1 (ko) * | 1995-10-14 | 1998-10-15 | 김광호 | 차폐 본딩 와이어를 구비하는 고주파, 고밀도용 반도체 칩 패키지 |
| KR100438256B1 (ko) * | 1995-12-18 | 2004-08-25 | 마츠시타 덴끼 산교 가부시키가이샤 | 반도체장치 및 그 제조방법 |
| JPH09186289A (ja) | 1995-12-28 | 1997-07-15 | Lucent Technol Inc | 多層積層化集積回路チップ組立体 |
| US5696031A (en) * | 1996-11-20 | 1997-12-09 | Micron Technology, Inc. | Device and method for stacking wire-bonded integrated circuit dice on flip-chip bonded integrated circuit dice |
| JPH1070153A (ja) * | 1996-08-26 | 1998-03-10 | Hitachi Ltd | 電子部品の接続方法 |
| US5847445A (en) * | 1996-11-04 | 1998-12-08 | Micron Technology, Inc. | Die assemblies using suspended bond wires, carrier substrates and dice having wire suspension structures, and methods of fabricating same |
| EP0890989A4 (en) * | 1997-01-24 | 2006-11-02 | Rohm Co Ltd | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD |
| US6271598B1 (en) * | 1997-07-29 | 2001-08-07 | Cubic Memory, Inc. | Conductive epoxy flip-chip on chip |
| US5898223A (en) * | 1997-10-08 | 1999-04-27 | Lucent Technologies Inc. | Chip-on-chip IC packages |
| JP3481444B2 (ja) * | 1998-01-14 | 2003-12-22 | シャープ株式会社 | 半導体装置及びその製造方法 |
| US6159765A (en) * | 1998-03-06 | 2000-12-12 | Microchip Technology, Incorporated | Integrated circuit package having interchip bonding and method therefor |
| US5977640A (en) * | 1998-06-26 | 1999-11-02 | International Business Machines Corporation | Highly integrated chip-on-chip packaging |
| US6376914B2 (en) * | 1999-12-09 | 2002-04-23 | Atmel Corporation | Dual-die integrated circuit package |
| JP2001196529A (ja) * | 2000-01-17 | 2001-07-19 | Mitsubishi Electric Corp | 半導体装置及びその配線方法 |
| US6252305B1 (en) * | 2000-02-29 | 2001-06-26 | Advanced Semiconductor Engineering, Inc. | Multichip module having a stacked chip arrangement |
| JP4454181B2 (ja) * | 2001-05-15 | 2010-04-21 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置 |
-
2000
- 2000-01-17 JP JP2000007923A patent/JP2001196529A/ja active Pending
- 2000-09-05 US US09/654,875 patent/US7071574B1/en not_active Expired - Fee Related
- 2000-10-07 KR KR10-2000-0059073A patent/KR100386995B1/ko not_active Expired - Fee Related
- 2000-10-09 TW TW089121084A patent/TW462097B/zh not_active IP Right Cessation
-
2006
- 2006-04-13 US US11/402,944 patent/US7288837B2/en not_active Expired - Fee Related
-
2007
- 2007-09-26 US US11/902,827 patent/US20080023848A1/en not_active Abandoned
- 2007-09-26 US US11/902,826 patent/US7547963B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20080023848A1 (en) | 2008-01-31 |
| US7547963B2 (en) | 2009-06-16 |
| US7071574B1 (en) | 2006-07-04 |
| KR20010076213A (ko) | 2001-08-11 |
| KR100386995B1 (ko) | 2003-06-12 |
| US20080023847A1 (en) | 2008-01-31 |
| US7288837B2 (en) | 2007-10-30 |
| US20060186526A1 (en) | 2006-08-24 |
| JP2001196529A (ja) | 2001-07-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |