TW200710567A - Resist compound and resist composition - Google Patents

Resist compound and resist composition

Info

Publication number
TW200710567A
TW200710567A TW095119850A TW95119850A TW200710567A TW 200710567 A TW200710567 A TW 200710567A TW 095119850 A TW095119850 A TW 095119850A TW 95119850 A TW95119850 A TW 95119850A TW 200710567 A TW200710567 A TW 200710567A
Authority
TW
Taiwan
Prior art keywords
group
resist
molecule
compound
resist composition
Prior art date
Application number
TW095119850A
Other languages
English (en)
Chinese (zh)
Inventor
Masatoshi Echigo
Dai Oguro
Original Assignee
Mitsubishi Gas Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Gas Chemical Co filed Critical Mitsubishi Gas Chemical Co
Publication of TW200710567A publication Critical patent/TW200710567A/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C43/00Ethers; Compounds having groups, groups or groups
    • C07C43/02Ethers
    • C07C43/20Ethers having an ether-oxygen atom bound to a carbon atom of a six-membered aromatic ring
    • C07C43/225Ethers having an ether-oxygen atom bound to a carbon atom of a six-membered aromatic ring containing halogen
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07DHETEROCYCLIC COMPOUNDS
    • C07D303/00Compounds containing three-membered rings having one oxygen atom as the only ring hetero atom
    • C07D303/02Compounds containing oxirane rings
    • C07D303/12Compounds containing oxirane rings with hydrocarbon radicals, substituted by singly or doubly bound oxygen atoms
    • C07D303/18Compounds containing oxirane rings with hydrocarbon radicals, substituted by singly or doubly bound oxygen atoms by etherified hydroxyl radicals
    • C07D303/20Ethers with hydroxy compounds containing no oxirane rings
    • C07D303/22Ethers with hydroxy compounds containing no oxirane rings with monohydroxy compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/091Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Materials For Photolithography (AREA)
  • Epoxy Compounds (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
TW095119850A 2005-06-06 2006-06-05 Resist compound and resist composition TW200710567A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005165470 2005-06-06

Publications (1)

Publication Number Publication Date
TW200710567A true TW200710567A (en) 2007-03-16

Family

ID=37498339

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119850A TW200710567A (en) 2005-06-06 2006-06-05 Resist compound and resist composition

Country Status (3)

Country Link
JP (4) JP4998261B2 (ja)
TW (1) TW200710567A (ja)
WO (1) WO2006132139A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103415541A (zh) * 2011-03-08 2013-11-27 Dic株式会社 自由基固化性化合物及其固化物、以及该化合物的制造方法
CN104822715A (zh) * 2012-11-28 2015-08-05 Dic株式会社 含酚羟基的化合物、含酚羟基的组合物、含(甲基)丙烯酰基的树脂、固化性组合物、其固化物、及抗蚀剂材料
TWI602805B (zh) * 2013-02-08 2017-10-21 三菱瓦斯化學股份有限公司 新穎烯丙化合物及其製造方法
CN107438596A (zh) * 2016-04-12 2017-12-05 株式会社Lg化学 化合物及包含其的有机电子元件
CN107848946A (zh) * 2015-07-23 2018-03-27 三菱瓦斯化学株式会社 新型(甲基)丙烯酰基化合物及其制造方法
TWI693211B (zh) * 2013-09-30 2020-05-11 日商東京應化工業股份有限公司 含乙烯基之化合物的製造方法

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI495632B (zh) * 2004-12-24 2015-08-11 Mitsubishi Gas Chemical Co 光阻用化合物
WO2006132139A1 (ja) * 2005-06-06 2006-12-14 Mitsubishi Gas Chemical Company, Inc. レジスト用化合物およびレジスト組成物
JP5465393B2 (ja) * 2008-02-28 2014-04-09 富士フイルム株式会社 フォトレジスト液、およびこれを用いるエッチング方法
JP5465392B2 (ja) * 2008-02-28 2014-04-09 富士フイルム株式会社 フォトレジスト液、およびこれを用いるエッチング方法
TW200906869A (en) * 2007-05-30 2009-02-16 Toagosei Co Ltd Active energy ray curable composition and optical material
JP2009234997A (ja) * 2008-03-27 2009-10-15 Osaka Gas Co Ltd フルオレン骨格を含有する化合物
WO2009143482A2 (en) * 2008-05-22 2009-11-26 Georgia Tech Research Corporation Negative tone molecular glass resists and methods of making and using same
JP4888473B2 (ja) 2008-11-20 2012-02-29 ソニー株式会社 実装基板
JP5846622B2 (ja) * 2010-12-16 2016-01-20 富士フイルム株式会社 感光性樹脂組成物、硬化膜、硬化膜の形成方法、有機el表示装置、及び、液晶表示装置
EP2878591B1 (en) * 2012-07-25 2020-09-16 DIC Corporation Radically curable compound, method for producing radically curable compound, radically curable composition, cured product thereof, and composition for resist material
ES2672197T3 (es) 2012-12-20 2018-06-13 Enplas Corporation Emisor de riego por goteo y dispositivo de riego por goteo dotado del mismo
EP2955575B1 (en) 2013-02-08 2020-07-29 Mitsubishi Gas Chemical Company, Inc. Resist composition, resist pattern formation method, and polyphenol derivative used in same
KR101820220B1 (ko) 2013-03-29 2018-01-18 도오꾜오까고오교 가부시끼가이샤 비닐에테르 화합물에서 유래하는 구조 단위를 포함하는 화합물
KR101840528B1 (ko) * 2013-03-29 2018-03-20 도오꾜오까고오교 가부시끼가이샤 비닐기 함유 플루오렌계 화합물
US9914687B2 (en) * 2013-03-29 2018-03-13 Tokyo Ohka Kogyo Co., Ltd. Composition containing vinyl-group-containing compound
JP6370093B2 (ja) * 2013-06-03 2018-08-08 東京応化工業株式会社 ビニル基含有化合物を含有する感光性組成物
JP5741669B2 (ja) * 2013-11-20 2015-07-01 Dic株式会社 アクリル重合体、硬化性組成物、その硬化物、及びレジスト材料用組成物
US10745372B2 (en) * 2014-12-25 2020-08-18 Mitsubishi Gas Chemical Company, Inc. Compound, resin, material for forming underlayer film for lithography, underlayer film for lithography, pattern forming method, and purification method
JP6766803B2 (ja) 2015-03-31 2020-10-14 三菱瓦斯化学株式会社 レジスト組成物、レジストパターン形成方法、及びそれに用いるポリフェノール化合物
CN107533291B (zh) 2015-03-31 2021-06-11 三菱瓦斯化学株式会社 化合物、抗蚀剂组合物及使用其的抗蚀图案形成方法
JP6861950B2 (ja) 2015-07-23 2021-04-21 三菱瓦斯化学株式会社 新規化合物及びその製造方法
CN107924131B (zh) 2015-08-31 2020-12-25 三菱瓦斯化学株式会社 光刻用下层膜形成材料及其组合物用于形成光刻用下层膜的用途、以及抗蚀图案形成方法
US11143962B2 (en) 2015-08-31 2021-10-12 Mitsubishi Gas Chemical Company, Inc. Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, pattern forming method, resin, and purification method
JP6848869B2 (ja) 2015-09-10 2021-03-24 三菱瓦斯化学株式会社 化合物、樹脂、レジスト組成物又は感放射線性組成物、レジストパターン形成方法、アモルファス膜の製造方法、リソグラフィー用下層膜形成材料、リソグラフィー用下層膜形成用組成物、回路パターンの形成方法、及び、精製方法
WO2018099835A1 (en) 2016-11-30 2018-06-07 Az Electronic Materials (Luxembourg) S.A.R.L. Carbon-comprising underlayer-forming composition and methods for manufacturing carbon-comprising underlayer and device using the same
JP6190557B1 (ja) * 2017-05-01 2017-08-30 株式会社和光精機 部品組付装置
JP2019086545A (ja) 2017-11-01 2019-06-06 メルク、パテント、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングMerck Patent GmbH アリルオキシ誘導体、これを用いたレジスト下層膜形成組成物、ならびにこれを用いたレジスト下層膜および半導体デバイスの製造方法
US11022882B2 (en) * 2018-06-20 2021-06-01 Shin-Etsu Chemical Co., Ltd. Compound and composition for forming organic film
KR102233421B1 (ko) * 2018-07-06 2021-03-29 주식회사 엘지화학 신규한 화합물 및 이를 이용한 유기 발광 소자
WO2020009554A1 (ko) * 2018-07-06 2020-01-09 주식회사 엘지화학 신규한 화합물 및 이를 이용한 유기 발광 소자
CN115028808A (zh) * 2021-03-05 2022-09-09 华为技术有限公司 聚合物材料及其制备方法、组合物、光学部件和设备
KR102632885B1 (ko) * 2021-08-19 2024-02-05 이근수 플루오렌계 유기 화합물, 이를 포함하는 유기막 및 응용

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02160242A (ja) * 1988-12-14 1990-06-20 Hitachi Chem Co Ltd 感光性樹脂組成物
JPH02252724A (ja) * 1989-03-28 1990-10-11 Dainippon Ink & Chem Inc 新規エポキシ樹脂組成物
JPH05309943A (ja) * 1992-05-11 1993-11-22 Nippon Kayaku Co Ltd 感熱記録材料
JPH06107769A (ja) * 1992-10-01 1994-04-19 Sumitomo Chem Co Ltd エポキシ樹脂、その組成物および樹脂封止型半導体装置
JP2801494B2 (ja) * 1993-04-01 1998-09-21 帝人株式会社 ジアリル化合物および該化合物を用いた架橋重合体の製造方法
JPH08310985A (ja) * 1995-05-12 1996-11-26 Nippon Kayaku Co Ltd ポリフェノール類、エポキシ樹脂、エポキシ樹脂組成物及びその硬化物
KR20010043904A (ko) * 1998-05-29 2001-05-25 그래햄 이. 테일러 아릴 알릴 에테르의 에폭시화 방법
JP2002047335A (ja) * 2000-08-03 2002-02-12 Osaka Gas Co Ltd フルオレン系光重合性樹脂組成物、その硬化物および製造方法
JP4646439B2 (ja) * 2001-05-23 2011-03-09 大阪瓦斯株式会社 光重合性樹脂組成物、その硬化物および製造方法
JP2003082061A (ja) * 2001-09-10 2003-03-19 Asahi Denka Kogyo Kk 硬化性組成物
JP2004137200A (ja) * 2002-10-17 2004-05-13 Jfe Chemical Corp フルオレニリデンジアリルフェノールの製造方法
WO2005093516A1 (ja) * 2004-03-25 2005-10-06 Mitsubishi Gas Chemical Company, Inc. レジスト組成物
EP1739485B1 (en) * 2004-04-15 2016-08-31 Mitsubishi Gas Chemical Company, Inc. Resist composition
WO2005114331A1 (ja) * 2004-05-21 2005-12-01 Mitsubishi Gas Chemical Company, Inc. レジスト化合物およびレジスト組成物
WO2006132139A1 (ja) * 2005-06-06 2006-12-14 Mitsubishi Gas Chemical Company, Inc. レジスト用化合物およびレジスト組成物

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103415541A (zh) * 2011-03-08 2013-11-27 Dic株式会社 自由基固化性化合物及其固化物、以及该化合物的制造方法
CN104822715A (zh) * 2012-11-28 2015-08-05 Dic株式会社 含酚羟基的化合物、含酚羟基的组合物、含(甲基)丙烯酰基的树脂、固化性组合物、其固化物、及抗蚀剂材料
TWI602805B (zh) * 2013-02-08 2017-10-21 三菱瓦斯化學股份有限公司 新穎烯丙化合物及其製造方法
TWI693211B (zh) * 2013-09-30 2020-05-11 日商東京應化工業股份有限公司 含乙烯基之化合物的製造方法
CN107848946A (zh) * 2015-07-23 2018-03-27 三菱瓦斯化学株式会社 新型(甲基)丙烯酰基化合物及其制造方法
CN107438596A (zh) * 2016-04-12 2017-12-05 株式会社Lg化学 化合物及包含其的有机电子元件
CN107438596B (zh) * 2016-04-12 2020-05-22 株式会社Lg化学 化合物及包含其的有机电子元件

Also Published As

Publication number Publication date
JP5110210B2 (ja) 2012-12-26
WO2006132139A1 (ja) 2006-12-14
JP4998261B2 (ja) 2012-08-15
JP2012093784A (ja) 2012-05-17
JP5182411B2 (ja) 2013-04-17
JPWO2006132139A1 (ja) 2009-01-08
JP2012118551A (ja) 2012-06-21
JP5218682B2 (ja) 2013-06-26
JP2012068652A (ja) 2012-04-05

Similar Documents

Publication Publication Date Title
TW200710567A (en) Resist compound and resist composition
EP3537217A3 (en) Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition
TWI303013B (en) Anti-reflective compositions comprising triazine compounds
TW200516349A (en) Photosensitive composition and pattern forming method using the same
ATE544094T1 (de) Verbindung zur verwendung in einer lichtempfindlichen zusammensetzung
TW200715058A (en) Positive resist composition and pattern-forming method using the same
TW200710576A (en) Positive resist composition and method of pattern formation with the same
TW200725181A (en) Positive resist composition and pattern forming method using the same
EP1767991A3 (en) Positive resist composition and pattern forming method using the same
EP1739483A3 (en) Positive photosensitive composition and pattern forming method using the same
DE602004005225D1 (de) Verfahren und vorrichtung zur herstellung von extrem-ultraviolettstrahlung oder weicher röntgenstrahlung
TW200732866A (en) Binary sinusoidal sub-wavelength gratings as alignment marks
TW200517788A (en) Lithographic apparatus
EP1734032A4 (en) CALIX RESININCINAR COMPOUNDS, PHOTORESIST BASE MATERIALS AND COMPOSITIONS THEREOF
JP2004004557A5 (ja)
WO2001042855A3 (fr) Dispositif de lithographie utilisant une source de rayonnement dans le domaine extreme ultraviolet et des miroirs multicouches a large bande spectrale dans ce domaine
TW200611080A (en) Method for forming pattern
EP2270596A3 (en) Positive resist compostion and pattern forming process
BRPI0511138A (pt) derivados de pirimidina para o tratamento de desenvolvimento celular anormal
TW200632557A (en) Positive resist composition for immersion exposure and pattern-forming method using the same
TW200627087A (en) Methods and systems for lithographic beam generation
TW200801815A (en) Method for forming pattern and composition for forming organic thin film using therefor
TW200745010A (en) Compound having acid dissociable group and radiation sensitive composition containing the same
ATE418748T1 (de) Positive lichtempfindliche zusammensetzung und verfahren zur strukturformung damit
ATE331972T1 (de) Anordnung für die korrektur von von einer laserlichtquelle ausgehender laserstrahlung sowie verfahren zur herstellung der anordnung