SG103296A1 - Thin film transistors and semiconductor device - Google Patents
Thin film transistors and semiconductor deviceInfo
- Publication number
- SG103296A1 SG103296A1 SG200103453A SG200103453A SG103296A1 SG 103296 A1 SG103296 A1 SG 103296A1 SG 200103453 A SG200103453 A SG 200103453A SG 200103453 A SG200103453 A SG 200103453A SG 103296 A1 SG103296 A1 SG 103296A1
- Authority
- SG
- Singapore
- Prior art keywords
- thin film
- semiconductor device
- film transistors
- transistors
- semiconductor
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66757—Lateral single gate single channel transistors with non-inverted structure, i.e. the channel layer is formed before the gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78684—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising semiconductor materials of Group IV not being silicon, or alloys including an element of the group IV, e.g. Ge, SiN alloys, SiC alloys
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000176188 | 2000-06-12 | ||
JP2000176173 | 2000-06-12 | ||
JP2000177652 | 2000-06-13 | ||
JP2000177641 | 2000-06-13 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG103296A1 true SG103296A1 (en) | 2004-04-29 |
Family
ID=27481357
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200407844-0A SG152040A1 (en) | 2000-06-12 | 2001-06-11 | Thin film transistors and semiconductor device |
SG200103453A SG103296A1 (en) | 2000-06-12 | 2001-06-11 | Thin film transistors and semiconductor device |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200407844-0A SG152040A1 (en) | 2000-06-12 | 2001-06-11 | Thin film transistors and semiconductor device |
Country Status (7)
Country | Link |
---|---|
US (2) | US6690068B2 (ko) |
EP (1) | EP1164635A3 (ko) |
KR (1) | KR100820248B1 (ko) |
CN (1) | CN1346152A (ko) |
MY (1) | MY124509A (ko) |
SG (2) | SG152040A1 (ko) |
TW (1) | TWI263336B (ko) |
Families Citing this family (46)
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JP4056571B2 (ja) * | 1995-08-02 | 2008-03-05 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US6335445B1 (en) * | 1997-03-24 | 2002-01-01 | Societe De Conseils De Recherches Et D'applications Scientifiques (S.C.R.A.S.) | Derivatives of 2-(iminomethyl)amino-phenyl, their preparation, their use as medicaments and the pharmaceutical compositions containing them |
TWI263336B (en) | 2000-06-12 | 2006-10-01 | Semiconductor Energy Lab | Thin film transistors and semiconductor device |
US6828587B2 (en) * | 2000-06-19 | 2004-12-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP2002083974A (ja) | 2000-06-19 | 2002-03-22 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
US7503975B2 (en) * | 2000-06-27 | 2009-03-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method therefor |
US6703265B2 (en) * | 2000-08-02 | 2004-03-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
US7045444B2 (en) * | 2000-12-19 | 2006-05-16 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device that includes selectively adding a noble gas element |
JP4993810B2 (ja) * | 2001-02-16 | 2012-08-08 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP4718700B2 (ja) * | 2001-03-16 | 2011-07-06 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US7052943B2 (en) * | 2001-03-16 | 2006-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
US6855584B2 (en) * | 2001-03-29 | 2005-02-15 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
JP4854866B2 (ja) * | 2001-04-27 | 2012-01-18 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US6479313B1 (en) * | 2001-05-25 | 2002-11-12 | Kopin Corporation | Method of manufacturing GaN-based p-type compound semiconductors and light emitting diodes |
US6849508B2 (en) * | 2001-06-07 | 2005-02-01 | Amberwave Systems Corporation | Method of forming multiple gate insulators on a strained semiconductor heterostructure |
TW550648B (en) * | 2001-07-02 | 2003-09-01 | Semiconductor Energy Lab | Semiconductor device and method of manufacturing the same |
JP4267266B2 (ja) * | 2001-07-10 | 2009-05-27 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US7238557B2 (en) * | 2001-11-14 | 2007-07-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating the same |
US6994083B2 (en) * | 2001-12-21 | 2006-02-07 | Trudell Medical International | Nebulizer apparatus and method |
KR100466964B1 (ko) * | 2001-12-27 | 2005-01-24 | 엘지.필립스 엘시디 주식회사 | 폴리실리콘 박막 제조방법 |
KR100864493B1 (ko) * | 2002-05-23 | 2008-10-20 | 삼성전자주식회사 | 규소층의 표면 처리 방법 및 이를 이용한 박막 트랜지스터기판의 제조 방법 |
DE10236738B9 (de) * | 2002-08-09 | 2010-07-15 | Carl Zeiss Nts Gmbh | Elektronenmikroskopiesystem und Elektronenmikroskopieverfahren |
US6861338B2 (en) * | 2002-08-22 | 2005-03-01 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor and method of manufacturing the same |
US20050236616A1 (en) * | 2004-04-26 | 2005-10-27 | Horng-Huei Tseng | Reliable semiconductor structure and method for fabricating |
DE102005047081B4 (de) * | 2005-09-30 | 2019-01-31 | Robert Bosch Gmbh | Verfahren zum plasmalosen Ätzen von Silizium mit dem Ätzgas ClF3 oder XeF2 |
EP2381745A1 (fr) * | 2006-09-07 | 2011-10-26 | Saint-Gobain Glass France | Substrat pour dispositif electroluminescent organique, utilisation et procede de fabrication de ce substrat, ainsi que dispositif electroluminescent organique |
JP5261397B2 (ja) * | 2006-11-17 | 2013-08-14 | サン−ゴバン グラス フランス | 有機発光素子用の電極、その酸エッチング、及び、それを組み込んだ有機発光素子 |
KR100883350B1 (ko) * | 2006-12-04 | 2009-02-11 | 한국전자통신연구원 | 쇼트키 장벽 박막 트랜지스터 제조방법 |
FR2913146B1 (fr) * | 2007-02-23 | 2009-05-01 | Saint Gobain | Electrode discontinue, dispositif electroluminescent organique l'incorporant, et leurs fabrications |
US7972943B2 (en) * | 2007-03-02 | 2011-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
KR100982395B1 (ko) * | 2007-04-25 | 2010-09-14 | 주식회사 엘지화학 | 박막 트랜지스터 및 이의 제조방법 |
FR2924274B1 (fr) * | 2007-11-22 | 2012-11-30 | Saint Gobain | Substrat porteur d'une electrode, dispositif electroluminescent organique l'incorporant, et sa fabrication |
US8030655B2 (en) | 2007-12-03 | 2011-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor, display device having thin film transistor |
FR2925981B1 (fr) * | 2007-12-27 | 2010-02-19 | Saint Gobain | Substrat porteur d'une electrode, dispositif electroluminescent organique l'incorporant. |
JP5527966B2 (ja) * | 2007-12-28 | 2014-06-25 | 株式会社半導体エネルギー研究所 | 薄膜トランジスタ |
KR101015847B1 (ko) * | 2008-01-18 | 2011-02-23 | 삼성모바일디스플레이주식회사 | 박막트랜지스터와 그 제조방법 및 이를 구비한유기전계발광표시장치 |
FR2936358B1 (fr) | 2008-09-24 | 2011-01-21 | Saint Gobain | Procede de fabrication d'un masque a ouvertures submillimetriques pour grille electroconductrice submillimetrique, masque a ouverture submillimetriques, grille electroconductrice submillimetrique. |
FR2936362B1 (fr) | 2008-09-25 | 2010-09-10 | Saint Gobain | Procede de fabrication d'une grille submillimetrique electroconductrice revetue d'une grille surgrille, grille submillimetrique electroconductrice revetue d'une surgrille |
US20100081251A1 (en) * | 2008-09-29 | 2010-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing soi substrate |
FR2944145B1 (fr) | 2009-04-02 | 2011-08-26 | Saint Gobain | Procede de fabrication d'une structure a surface texturee pour dispositif a diode electroluminescente organique et structure a surface texturee |
KR101592016B1 (ko) * | 2009-07-08 | 2016-02-05 | 삼성디스플레이 주식회사 | 편광판 및 이를 포함하는 액정 표시 장치 |
KR20210131462A (ko) * | 2009-07-10 | 2021-11-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치의 제작 방법 |
FR2955575B1 (fr) | 2010-01-22 | 2012-02-24 | Saint Gobain | Substrat verrier revetu d'une couche haut indice sous un revetement electrode et dispositif electroluminescent organique comportant un tel substrat. |
JP5595054B2 (ja) * | 2010-01-29 | 2014-09-24 | 株式会社日立ハイテクサイエンス | 電子顕微鏡及び試料分析方法 |
KR101926646B1 (ko) | 2010-04-16 | 2018-12-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 축전 장치용 전극 및 그 제작 방법 |
US11255606B2 (en) * | 2015-12-30 | 2022-02-22 | Mattson Technology, Inc. | Gas flow control for millisecond anneal system |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19825081A1 (de) * | 1997-06-06 | 1998-12-10 | Semiconductor Energy Lab | Halbleiterdünnfilm und Halbleitervorrichtung |
DE19833237A1 (de) * | 1997-07-23 | 1999-01-28 | Semiconductor Energy Lab | Halbleiterdünnfilm und Halbleitergerät |
JPH11354443A (ja) * | 1997-06-10 | 1999-12-24 | Semiconductor Energy Lab Co Ltd | 半導体薄膜および半導体装置 |
US6452211B1 (en) * | 1997-06-10 | 2002-09-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor thin film and semiconductor device |
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TW251379B (en) | 1994-01-28 | 1995-07-11 | Nat Science Committee | Process of polysilicon, Ge or Si-Ge thin film transistor |
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TWI263336B (en) | 2000-06-12 | 2006-10-01 | Semiconductor Energy Lab | Thin film transistors and semiconductor device |
US6828587B2 (en) | 2000-06-19 | 2004-12-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP2002083974A (ja) * | 2000-06-19 | 2002-03-22 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
US6703265B2 (en) | 2000-08-02 | 2004-03-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
JP2002176180A (ja) * | 2000-12-06 | 2002-06-21 | Hitachi Ltd | 薄膜半導体素子及びその製造方法 |
-
2001
- 2001-05-31 TW TW090113144A patent/TWI263336B/zh not_active IP Right Cessation
- 2001-06-06 US US09/874,204 patent/US6690068B2/en not_active Expired - Lifetime
- 2001-06-11 SG SG200407844-0A patent/SG152040A1/en unknown
- 2001-06-11 KR KR1020010032440A patent/KR100820248B1/ko not_active IP Right Cessation
- 2001-06-11 SG SG200103453A patent/SG103296A1/en unknown
- 2001-06-11 MY MYPI20012712 patent/MY124509A/en unknown
- 2001-06-12 CN CN01124907A patent/CN1346152A/zh active Pending
- 2001-06-12 EP EP01114265A patent/EP1164635A3/en not_active Ceased
-
2003
- 2003-12-05 US US10/727,651 patent/US7307282B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19825081A1 (de) * | 1997-06-06 | 1998-12-10 | Semiconductor Energy Lab | Halbleiterdünnfilm und Halbleitervorrichtung |
US6307214B1 (en) * | 1997-06-06 | 2001-10-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor thin film and semiconductor device |
JPH11354443A (ja) * | 1997-06-10 | 1999-12-24 | Semiconductor Energy Lab Co Ltd | 半導体薄膜および半導体装置 |
US6452211B1 (en) * | 1997-06-10 | 2002-09-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor thin film and semiconductor device |
DE19833237A1 (de) * | 1997-07-23 | 1999-01-28 | Semiconductor Energy Lab | Halbleiterdünnfilm und Halbleitergerät |
US6087679A (en) * | 1997-07-23 | 2000-07-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor thin film and semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
US7307282B2 (en) | 2007-12-11 |
MY124509A (en) | 2006-06-30 |
SG152040A1 (en) | 2009-05-29 |
KR100820248B1 (ko) | 2008-04-08 |
CN1346152A (zh) | 2002-04-24 |
US20040108576A1 (en) | 2004-06-10 |
US6690068B2 (en) | 2004-02-10 |
EP1164635A3 (en) | 2004-09-29 |
EP1164635A2 (en) | 2001-12-19 |
KR20010112599A (ko) | 2001-12-20 |
US20020008286A1 (en) | 2002-01-24 |
TWI263336B (en) | 2006-10-01 |
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