RU2008106464A - Огнеупорная разливочная труба с пористой вставкой - Google Patents
Огнеупорная разливочная труба с пористой вставкой Download PDFInfo
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- RU2008106464A RU2008106464A RU2008106464/02A RU2008106464A RU2008106464A RU 2008106464 A RU2008106464 A RU 2008106464A RU 2008106464/02 A RU2008106464/02 A RU 2008106464/02A RU 2008106464 A RU2008106464 A RU 2008106464A RU 2008106464 A RU2008106464 A RU 2008106464A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/412—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8221—Three dimensional integrated circuits stacked in different levels
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/12—Static random access memory [SRAM] devices comprising a MOSFET load element
- H10B10/125—Static random access memory [SRAM] devices comprising a MOSFET load element the MOSFET being a thin film transistor [TFT]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/18—Peripheral circuit regions
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Rigid Pipes And Flexible Pipes (AREA)
- Thin Film Transistor (AREA)
- Continuous Casting (AREA)
Abstract
1. Огнеупорная разливочная труба, включающая в себя первый конец (16) с первой плоской контактной поверхностью (18), перпендикулярной продольной оси (А) трубы, и разливочный канал (14), простирающийся от первой плоской контактной поверхности (18) до второго конца трубы, причем разливочный канал (14) заканчивается по меньшей мере одним выходным отверстием во втором конце трубы, при этом первый конец (16) трубы снабжен по меньшей мере одним газопроницаемым элементом (20), расположенным таким образом, что одна из его поверхностей (20s) образует часть первой плоской контактной поверхности (18), а в него самого может подаваться газ. ! 2. Разливочная труба по п.1, в которой газопроницаемый элемент (20) имеет кольцеобразную форму. ! 3. Разливочная труба по п.1, в которой газопроницаемый элемент (20) является самостоятельной деталью, размещенной внутри первого конца (16) трубы. ! 4. Разливочная труба по п.1, в которой газопроницаемый элемент (20) формуется в процессе изготовления трубы. ! 5. Разливочная труба по п.1, в которой первый конец (16) дополнительно снабжен по меньшей мере одним газовым каналом (36), простирающимся от по меньшей мере одной поверхности газопроницаемого элемента (20), иной, чем образующая часть первой плоской контактной поверхности (18) поверхность (20s), до по меньшей мере одной удаленной внешней поверхности первого конца (16)трубы. ! 6. Разливочная труба по п.5, в которой газовый канал (36) простирается до первой плоской контактной поверхности (18). ! 7. Разливочная труба по п.5, в которой газовый канал (36) простирается до кольцевой области трубы. ! 8. Разливочная труба по п.5, в которой газораспределительная камера (34) расположена между газопроницаем
Claims (12)
1. Огнеупорная разливочная труба, включающая в себя первый конец (16) с первой плоской контактной поверхностью (18), перпендикулярной продольной оси (А) трубы, и разливочный канал (14), простирающийся от первой плоской контактной поверхности (18) до второго конца трубы, причем разливочный канал (14) заканчивается по меньшей мере одним выходным отверстием во втором конце трубы, при этом первый конец (16) трубы снабжен по меньшей мере одним газопроницаемым элементом (20), расположенным таким образом, что одна из его поверхностей (20s) образует часть первой плоской контактной поверхности (18), а в него самого может подаваться газ.
2. Разливочная труба по п.1, в которой газопроницаемый элемент (20) имеет кольцеобразную форму.
3. Разливочная труба по п.1, в которой газопроницаемый элемент (20) является самостоятельной деталью, размещенной внутри первого конца (16) трубы.
4. Разливочная труба по п.1, в которой газопроницаемый элемент (20) формуется в процессе изготовления трубы.
5. Разливочная труба по п.1, в которой первый конец (16) дополнительно снабжен по меньшей мере одним газовым каналом (36), простирающимся от по меньшей мере одной поверхности газопроницаемого элемента (20), иной, чем образующая часть первой плоской контактной поверхности (18) поверхность (20s), до по меньшей мере одной удаленной внешней поверхности первого конца (16)трубы.
6. Разливочная труба по п.5, в которой газовый канал (36) простирается до первой плоской контактной поверхности (18).
7. Разливочная труба по п.5, в которой газовый канал (36) простирается до кольцевой области трубы.
8. Разливочная труба по п.5, в которой газораспределительная камера (34) расположена между газопроницаемым элементом (20) и газовым каналом (36).
9. Разливочная труба по п.1, в которой газопроницаемый элемент (20) расположена вдоль внешней поверхности по периметру (12р) первой плоской контактной поверхности (18).
10. Узел, состоящий из разливочной трубы по одному из пп.1-9 и второго огнеупорного компонента (10), имеющего вторую плоскую контактную поверхность (28) и второй разливочный канал (14), предназначенный для стыковки первой плоской контактной поверхности (18) первой трубы с вышеуказанной второй плоской контактной поверхностью (28), образуя тем самым непрерывно функционирующий разливочный канал (14) в переходной области между первым и вторым разливочными каналами (14), в котором второй огнеупорный компонент (10) включает в себя по меньшей мере один канал подачи газа (38), выходной конец которого выходит на вторую плоскую контактную поверхность (28), тогда как его входной конец (40) выполнен с возможностью присоединения к средствам подачи газа.
11. Узел разливочной трубы по п.10, в котором канал подачи газа (38) имеет выходной конец с увеличенной площадью поперечного сечения.
12. Узел разливочной трубы по п.10, в котором в собранном положении узла канал подачи газа (38) выходит в по меньшей мере один газовый канал (36) трубы.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040061527A KR100653699B1 (ko) | 2004-08-04 | 2004-08-04 | 반도체 메모리 장치 및 이 장치의 배치방법 |
KR1020050038621A KR100689830B1 (ko) | 2005-05-09 | 2005-05-09 | 반도체 집적 회로들 및 그 제조방법들 |
EP05016656A EP1624487A3 (en) | 2004-08-04 | 2005-08-01 | Semiconductor device having vertically stacked field effect transistors and methods of manufacturing the same |
EP05016656.8 | 2005-08-27 | ||
EP05018656.8 | 2005-08-27 |
Publications (2)
Publication Number | Publication Date |
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RU2008106464A true RU2008106464A (ru) | 2009-10-10 |
RU2384389C2 RU2384389C2 (ru) | 2010-03-20 |
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RU2008106464/02A RU2384389C2 (ru) | 2004-08-04 | 2006-07-08 | Огнеупорная разливочная труба с пористой вставкой |
Country Status (4)
Country | Link |
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US (4) | US7315466B2 (ru) |
EP (1) | EP1624487A3 (ru) |
JP (1) | JP2006049914A (ru) |
RU (1) | RU2384389C2 (ru) |
Families Citing this family (52)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4683833B2 (ja) * | 2003-10-31 | 2011-05-18 | 株式会社半導体エネルギー研究所 | 機能回路及びその設計方法 |
US7315466B2 (en) * | 2004-08-04 | 2008-01-01 | Samsung Electronics Co., Ltd. | Semiconductor memory device and method for arranging and manufacturing the same |
KR100702012B1 (ko) * | 2005-03-22 | 2007-03-30 | 삼성전자주식회사 | 매립막 패턴들을 갖는 에스. 램들 및 그 형성방법들 |
KR100663360B1 (ko) * | 2005-04-20 | 2007-01-02 | 삼성전자주식회사 | 박막 트랜지스터를 갖는 반도체 소자들 및 그 제조방법들 |
US7978561B2 (en) * | 2005-07-28 | 2011-07-12 | Samsung Electronics Co., Ltd. | Semiconductor memory devices having vertically-stacked transistors therein |
US20090224330A1 (en) * | 2005-07-28 | 2009-09-10 | Hong Chang Min | Semiconductor Memory Device and Method for Arranging and Manufacturing the Same |
KR100634459B1 (ko) * | 2005-08-12 | 2006-10-16 | 삼성전자주식회사 | 다층 트랜지스터 구조를 가지는 반도체 장치 및 그제조방법 |
KR100665853B1 (ko) * | 2005-12-26 | 2007-01-09 | 삼성전자주식회사 | 고집적 스태이틱 랜덤 억세스 메모리에 채용하기 적합한적층 메모리 셀 |
JP4782573B2 (ja) * | 2006-01-31 | 2011-09-28 | パナソニック株式会社 | データ保持回路、スキャンチェーン回路、半導体集積回路およびそのプロセスばらつき判別方法 |
US7601998B2 (en) | 2006-09-14 | 2009-10-13 | Samsung Electronics Co., Ltd. | Semiconductor memory device having metallization comprising select lines, bit lines and word lines |
JP4768557B2 (ja) * | 2006-09-15 | 2011-09-07 | 株式会社東芝 | 不揮発性半導体記憶装置及びその製造方法 |
KR101059062B1 (ko) * | 2006-09-28 | 2011-08-24 | 인텔 코포레이션 | 메모리 셀 및 프로세서 기반 시스템 |
JP5130596B2 (ja) * | 2007-05-30 | 2013-01-30 | 国立大学法人東北大学 | 半導体装置 |
KR101275758B1 (ko) * | 2007-07-20 | 2013-06-14 | 삼성전자주식회사 | 복수개의 적층된 트랜지스터들을 구비하는 반도체 소자 및그 제조방법 |
US20090065841A1 (en) * | 2007-09-06 | 2009-03-12 | Assaf Shappir | SILICON OXY-NITRIDE (SiON) LINER, SUCH AS OPTIONALLY FOR NON-VOLATILE MEMORY CELLS |
US7829410B2 (en) | 2007-11-26 | 2010-11-09 | Micron Technology, Inc. | Methods of forming capacitors, and methods of forming DRAM arrays |
KR100960451B1 (ko) | 2008-02-29 | 2010-05-28 | 주식회사 하이닉스반도체 | 반도체 소자 및 그 제조 방법 |
US8546876B2 (en) | 2008-03-20 | 2013-10-01 | Micron Technology, Inc. | Systems and devices including multi-transistor cells and methods of using, making, and operating the same |
US7969776B2 (en) * | 2008-04-03 | 2011-06-28 | Micron Technology, Inc. | Data cells with drivers and methods of making and operating the same |
KR100971532B1 (ko) * | 2008-05-27 | 2010-07-21 | 삼성전자주식회사 | 구동 트랜지스터를 포함하는 반도체 소자 |
KR101398634B1 (ko) * | 2008-07-11 | 2014-05-22 | 삼성전자주식회사 | 배선 구조체 및 이를 채택하는 전자 소자 |
US8004042B2 (en) * | 2009-03-20 | 2011-08-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Static random access memory (SRAM) cell and method for forming same |
US8054673B2 (en) * | 2009-04-16 | 2011-11-08 | Seagate Technology Llc | Three dimensionally stacked non volatile memory units |
MY164205A (en) | 2009-10-29 | 2017-11-30 | Semiconductor Energy Lab | Semiconductor device |
KR101650018B1 (ko) * | 2009-11-03 | 2016-08-23 | 삼성전자주식회사 | 매립 배선을 구비하는 기판 구조체, 이의 제조 방법, 이를 포함하는 반도체 장치 및 그 제조 방법 |
US8786009B2 (en) * | 2009-11-03 | 2014-07-22 | Samsung Electronics Co., Ltd. | Substrate structures including buried wiring, semiconductor devices including substrate structures, and method of fabricating the same |
CN104867984B (zh) * | 2009-12-28 | 2018-11-06 | 株式会社半导体能源研究所 | 制造半导体装置的方法 |
US8228705B2 (en) * | 2010-04-22 | 2012-07-24 | Himax Technologies Limited | Memory cell and an associated memory device |
JP2012146861A (ja) * | 2011-01-13 | 2012-08-02 | Toshiba Corp | 半導体記憶装置 |
US8841675B2 (en) | 2011-09-23 | 2014-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Minute transistor |
GB2505429A (en) | 2012-08-29 | 2014-03-05 | Ibm | Semiconductor stack comprising plurality of phase-change memory (PCM) cells and performing a logic operation |
US8952431B2 (en) | 2013-05-09 | 2015-02-10 | International Business Machines Corporation | Stacked carbon-based FETs |
US9455703B2 (en) * | 2013-11-15 | 2016-09-27 | Eaglepicher Technologies, Llc | FET array bypass module |
US9716100B2 (en) * | 2014-03-14 | 2017-07-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for driving semiconductor device, and electronic device |
KR20160000512A (ko) | 2014-06-24 | 2016-01-05 | 삼성전자주식회사 | 메모리 장치 |
WO2017171842A1 (en) | 2016-04-01 | 2017-10-05 | Intel Corporation | Transistor cells including a deep via lined with a dielectric material |
JP7046049B2 (ja) * | 2016-07-19 | 2022-04-01 | 東京エレクトロン株式会社 | 三次元半導体デバイス及び製造方法 |
JP7048182B2 (ja) | 2016-08-26 | 2022-04-05 | インテル・コーポレーション | 集積回路のデバイス構造及び両面製造技術 |
KR102565380B1 (ko) | 2016-12-07 | 2023-08-10 | 삼성디스플레이 주식회사 | 박막 트랜지스터 기판 |
WO2019132863A1 (en) | 2017-12-26 | 2019-07-04 | Intel Corporation | Stacked transistors with contact last |
US11430814B2 (en) | 2018-03-05 | 2022-08-30 | Intel Corporation | Metallization structures for stacked device connectivity and their methods of fabrication |
CN111492478A (zh) | 2018-03-28 | 2020-08-04 | 英特尔公司 | 用于低温堆叠晶体管接触部的顶部nmos晶体管中的iii-v源极/漏极 |
WO2019190505A1 (en) * | 2018-03-28 | 2019-10-03 | Intel Corporation | Stacked transistors with si pmos and high mobility thin film transistor nmos |
US11616053B2 (en) | 2018-09-05 | 2023-03-28 | Tokyo Electron Limited | Method to vertically route a logic cell incorporating stacked transistors in a three dimensional logic device |
US10950545B2 (en) | 2019-03-08 | 2021-03-16 | International Business Machines Corporation | Circuit wiring techniques for stacked transistor structures |
US11688780B2 (en) | 2019-03-22 | 2023-06-27 | Intel Corporation | Deep source and drain for transistor structures with back-side contact metallization |
US11374003B2 (en) | 2019-04-12 | 2022-06-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Integrated circuit |
WO2020217479A1 (ja) * | 2019-04-26 | 2020-10-29 | シャープ株式会社 | 表示装置 |
US11081561B2 (en) | 2019-05-07 | 2021-08-03 | Globalfoundries U.S. Inc. | Field-effect transistors with vertically-serpentine gates |
US10818763B1 (en) | 2019-05-07 | 2020-10-27 | Globalfoundries Inc. | Field-effect transistors with laterally-serpentine gates |
US11158368B2 (en) * | 2019-09-06 | 2021-10-26 | Coventor, Inc. | Static random-access memory cell design |
US11538814B2 (en) | 2021-01-29 | 2022-12-27 | Samsung Electronics Co., Ltd. | Static random access memory of 3D stacked devices |
Family Cites Families (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4680609A (en) | 1984-09-24 | 1987-07-14 | Northern Telecom Limited | Structure and fabrication of vertically integrated CMOS logic gates |
JPH0612799B2 (ja) | 1986-03-03 | 1994-02-16 | 三菱電機株式会社 | 積層型半導体装置およびその製造方法 |
US5006913A (en) * | 1988-11-05 | 1991-04-09 | Mitsubishi Denki Kabushiki Kaisha | Stacked type semiconductor device |
US5200921A (en) * | 1990-09-20 | 1993-04-06 | Fujitsu Limited | Semiconductor integrated circuit including P-channel MOS transistors having different threshold voltages |
JPH0732200B2 (ja) * | 1990-11-15 | 1995-04-10 | 株式会社東芝 | スタティック型メモリセル |
US5308782A (en) | 1992-03-02 | 1994-05-03 | Motorola | Semiconductor memory device and method of formation |
JPH0697366A (ja) * | 1992-09-10 | 1994-04-08 | Hitachi Ltd | 高信頼度コンピュータチップ |
US5532957A (en) * | 1995-01-31 | 1996-07-02 | Texas Instruments Incorporated | Field reconfigurable logic/memory array |
US5731945A (en) | 1995-02-22 | 1998-03-24 | International Business Machines Corporation | Multichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodes |
JPH08250673A (ja) * | 1995-03-15 | 1996-09-27 | Nec Corp | 半導体装置 |
US5675185A (en) * | 1995-09-29 | 1997-10-07 | International Business Machines Corporation | Semiconductor structure incorporating thin film transistors with undoped cap oxide layers |
US5973369A (en) * | 1997-03-11 | 1999-10-26 | Nec Corporation | SRAM having P-channel TFT as load element with less series-connected high resistance |
KR0161809B1 (ko) | 1995-11-07 | 1998-12-01 | 김광호 | 적층형 박막 트랜지스터를 가진 반도체 메모리장치 |
KR0179553B1 (ko) | 1995-12-29 | 1999-04-15 | 김주용 | 로오 디코더 및 컬럼 디코더 회로 |
JP4103968B2 (ja) * | 1996-09-18 | 2008-06-18 | 株式会社半導体エネルギー研究所 | 絶縁ゲイト型半導体装置 |
US5714394A (en) | 1996-11-07 | 1998-02-03 | Advanced Micro Devices, Inc. | Method of making an ultra high density NAND gate using a stacked transistor arrangement |
US5872029A (en) * | 1996-11-07 | 1999-02-16 | Advanced Micro Devices, Inc. | Method for forming an ultra high density inverter using a stacked transistor arrangement |
JP2923912B2 (ja) | 1996-12-25 | 1999-07-26 | 日本電気株式会社 | 半導体装置 |
JP3501916B2 (ja) * | 1997-02-28 | 2004-03-02 | シャープ株式会社 | 半導体記憶装置およびその一括消去ベリファイ方法 |
JPH10270634A (ja) | 1997-03-24 | 1998-10-09 | Mitsubishi Electric Corp | メモリモジュール |
US5915167A (en) | 1997-04-04 | 1999-06-22 | Elm Technology Corporation | Three dimensional structure memory |
US5888872A (en) | 1997-06-20 | 1999-03-30 | Advanced Micro Devices, Inc. | Method for forming source drain junction areas self-aligned between a sidewall spacer and an etched lateral sidewall |
US5925913A (en) * | 1997-08-25 | 1999-07-20 | Advanced Micro Devices, Inc. | System for enhancing the performance of a circuit by reducing the channel length of one or more transistors |
US6271542B1 (en) * | 1997-12-08 | 2001-08-07 | International Business Machines Corporation | Merged logic and memory combining thin film and bulk Si transistors |
US6009023A (en) * | 1998-05-26 | 1999-12-28 | Etron Technology, Inc. | High performance DRAM structure employing multiple thickness gate oxide |
US6081458A (en) * | 1998-08-26 | 2000-06-27 | International Business Machines Corp. | Memory system having a unidirectional bus and method for communicating therewith |
JP3410976B2 (ja) * | 1998-12-08 | 2003-05-26 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 薄膜及びバルク・シリコン・トランジスタを組み合わせる併合化論理及びメモリ集積回路チップとその形成方法 |
JP3414662B2 (ja) * | 1999-01-19 | 2003-06-09 | 株式会社半導体エネルギー研究所 | Sramセル及びその製造方法 |
US6576510B2 (en) * | 1999-06-17 | 2003-06-10 | Hitachi Ltd | Method of producing a semiconductor memory device using a self-alignment process |
JP2002026283A (ja) | 2000-06-30 | 2002-01-25 | Seiko Epson Corp | 多層構造のメモリ装置及びその製造方法 |
KR100381962B1 (ko) * | 2000-08-07 | 2003-05-01 | 삼성전자주식회사 | 비휘발성 메모리 장치의 로우 디코더 |
IT1316269B1 (it) * | 2000-12-28 | 2003-04-03 | Micron Technology Inc | Riduzione di rumore di alimentazione nella selezione di colonna indispositivi di memoria. |
US6887753B2 (en) | 2001-02-28 | 2005-05-03 | Micron Technology, Inc. | Methods of forming semiconductor circuitry, and semiconductor circuit constructions |
KR100418089B1 (ko) * | 2001-06-21 | 2004-02-11 | 주식회사 하이닉스반도체 | 반도체 소자의 박막 트랜지스터 제조 방법 |
KR20010088672A (ko) | 2001-08-20 | 2001-09-28 | 심재택 | 반도체 적층 구조 및 이를 이용한 반도체 |
JP2003142661A (ja) | 2001-11-05 | 2003-05-16 | Sony Corp | 強誘電体型不揮発性半導体メモリ |
US6906361B2 (en) | 2002-04-08 | 2005-06-14 | Guobiao Zhang | Peripheral circuits of electrically programmable three-dimensional memory |
US6678184B2 (en) * | 2002-06-05 | 2004-01-13 | Stmicroelectronics, Inc. | CAM cell having compare circuit formed over two active regions |
JP2004039690A (ja) * | 2002-06-28 | 2004-02-05 | Seiko Epson Corp | 半導体素子 |
US6882010B2 (en) * | 2002-10-03 | 2005-04-19 | Micron Technology, Inc. | High performance three-dimensional TFT-based CMOS inverters, and computer systems utilizing such novel CMOS inverters |
KR100468780B1 (ko) | 2002-12-18 | 2005-01-29 | 삼성전자주식회사 | 더블 포트 반도체 메모리 장치 |
US7009911B2 (en) | 2004-07-09 | 2006-03-07 | Micron Technology, Inc. | Memory array decoder |
US7315466B2 (en) * | 2004-08-04 | 2008-01-01 | Samsung Electronics Co., Ltd. | Semiconductor memory device and method for arranging and manufacturing the same |
KR100689830B1 (ko) | 2005-05-09 | 2007-03-08 | 삼성전자주식회사 | 반도체 집적 회로들 및 그 제조방법들 |
KR100593450B1 (ko) | 2004-10-08 | 2006-06-28 | 삼성전자주식회사 | 수직하게 차례로 위치된 복수 개의 활성 영역들을 갖는피이. 램들 및 그 형성방법들. |
US6972478B1 (en) * | 2005-03-07 | 2005-12-06 | Advanced Micro Devices, Inc. | Integrated circuit and method for its manufacture |
KR100702012B1 (ko) | 2005-03-22 | 2007-03-30 | 삼성전자주식회사 | 매립막 패턴들을 갖는 에스. 램들 및 그 형성방법들 |
KR100577603B1 (ko) | 2005-05-20 | 2006-05-08 | 삼성전자주식회사 | 적층형 반도체 장치 및 그 제조 방법 |
KR100634459B1 (ko) | 2005-08-12 | 2006-10-16 | 삼성전자주식회사 | 다층 트랜지스터 구조를 가지는 반도체 장치 및 그제조방법 |
KR100866749B1 (ko) | 2005-12-30 | 2008-11-03 | 주식회사 하이닉스반도체 | 비휘발성 반도체 메모리 장치 |
-
2005
- 2005-07-28 US US11/191,496 patent/US7315466B2/en active Active
- 2005-08-01 EP EP05016656A patent/EP1624487A3/en not_active Withdrawn
- 2005-08-04 JP JP2005226926A patent/JP2006049914A/ja active Pending
-
2006
- 2006-07-08 RU RU2008106464/02A patent/RU2384389C2/ru not_active IP Right Cessation
-
2007
- 2007-12-10 US US11/953,289 patent/US7589992B2/en active Active
-
2009
- 2009-08-07 US US12/537,521 patent/US7982221B2/en active Active
-
2011
- 2011-07-18 US US13/185,184 patent/US20110266623A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
RU2384389C2 (ru) | 2010-03-20 |
US7315466B2 (en) | 2008-01-01 |
US20080089163A1 (en) | 2008-04-17 |
EP1624487A3 (en) | 2007-10-03 |
US7982221B2 (en) | 2011-07-19 |
US7589992B2 (en) | 2009-09-15 |
US20110266623A1 (en) | 2011-11-03 |
US20090294863A1 (en) | 2009-12-03 |
JP2006049914A (ja) | 2006-02-16 |
US20060028861A1 (en) | 2006-02-09 |
EP1624487A2 (en) | 2006-02-08 |
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