RU2008106464A - Огнеупорная разливочная труба с пористой вставкой - Google Patents

Огнеупорная разливочная труба с пористой вставкой Download PDF

Info

Publication number
RU2008106464A
RU2008106464A RU2008106464/02A RU2008106464A RU2008106464A RU 2008106464 A RU2008106464 A RU 2008106464A RU 2008106464/02 A RU2008106464/02 A RU 2008106464/02A RU 2008106464 A RU2008106464 A RU 2008106464A RU 2008106464 A RU2008106464 A RU 2008106464A
Authority
RU
Russia
Prior art keywords
gas
pipe
channel
contact surface
flat contact
Prior art date
Application number
RU2008106464/02A
Other languages
English (en)
Other versions
RU2384389C2 (ru
Inventor
Стивен ЛИ (GB)
Стивен Ли
Айан ПРОУДФУТ (GB)
Айан ПРОУДФУТ
Дейвид БЛУМФИЛД (GB)
Дейвид БЛУМФИЛД
Original Assignee
Рифрэктори Интеллектуал Проперти Гмбх Унд Ко. Кг (At)
Рифрэктори Интеллектуал Проперти Гмбх Унд Ко. Кг
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020040061527A external-priority patent/KR100653699B1/ko
Priority claimed from KR1020050038621A external-priority patent/KR100689830B1/ko
Application filed by Рифрэктори Интеллектуал Проперти Гмбх Унд Ко. Кг (At), Рифрэктори Интеллектуал Проперти Гмбх Унд Ко. Кг filed Critical Рифрэктори Интеллектуал Проперти Гмбх Унд Ко. Кг (At)
Publication of RU2008106464A publication Critical patent/RU2008106464A/ru
Application granted granted Critical
Publication of RU2384389C2 publication Critical patent/RU2384389C2/ru

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8221Three dimensional integrated circuits stacked in different levels
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0688Integrated circuits having a three-dimensional layout
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/105Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B10/00Static random access memory [SRAM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B10/00Static random access memory [SRAM] devices
    • H10B10/12Static random access memory [SRAM] devices comprising a MOSFET load element
    • H10B10/125Static random access memory [SRAM] devices comprising a MOSFET load element the MOSFET being a thin film transistor [TFT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B10/00Static random access memory [SRAM] devices
    • H10B10/18Peripheral circuit regions

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Rigid Pipes And Flexible Pipes (AREA)
  • Thin Film Transistor (AREA)
  • Continuous Casting (AREA)

Abstract

1. Огнеупорная разливочная труба, включающая в себя первый конец (16) с первой плоской контактной поверхностью (18), перпендикулярной продольной оси (А) трубы, и разливочный канал (14), простирающийся от первой плоской контактной поверхности (18) до второго конца трубы, причем разливочный канал (14) заканчивается по меньшей мере одним выходным отверстием во втором конце трубы, при этом первый конец (16) трубы снабжен по меньшей мере одним газопроницаемым элементом (20), расположенным таким образом, что одна из его поверхностей (20s) образует часть первой плоской контактной поверхности (18), а в него самого может подаваться газ. ! 2. Разливочная труба по п.1, в которой газопроницаемый элемент (20) имеет кольцеобразную форму. ! 3. Разливочная труба по п.1, в которой газопроницаемый элемент (20) является самостоятельной деталью, размещенной внутри первого конца (16) трубы. ! 4. Разливочная труба по п.1, в которой газопроницаемый элемент (20) формуется в процессе изготовления трубы. ! 5. Разливочная труба по п.1, в которой первый конец (16) дополнительно снабжен по меньшей мере одним газовым каналом (36), простирающимся от по меньшей мере одной поверхности газопроницаемого элемента (20), иной, чем образующая часть первой плоской контактной поверхности (18) поверхность (20s), до по меньшей мере одной удаленной внешней поверхности первого конца (16)трубы. ! 6. Разливочная труба по п.5, в которой газовый канал (36) простирается до первой плоской контактной поверхности (18). ! 7. Разливочная труба по п.5, в которой газовый канал (36) простирается до кольцевой области трубы. ! 8. Разливочная труба по п.5, в которой газораспределительная камера (34) расположена между газопроницаем

Claims (12)

1. Огнеупорная разливочная труба, включающая в себя первый конец (16) с первой плоской контактной поверхностью (18), перпендикулярной продольной оси (А) трубы, и разливочный канал (14), простирающийся от первой плоской контактной поверхности (18) до второго конца трубы, причем разливочный канал (14) заканчивается по меньшей мере одним выходным отверстием во втором конце трубы, при этом первый конец (16) трубы снабжен по меньшей мере одним газопроницаемым элементом (20), расположенным таким образом, что одна из его поверхностей (20s) образует часть первой плоской контактной поверхности (18), а в него самого может подаваться газ.
2. Разливочная труба по п.1, в которой газопроницаемый элемент (20) имеет кольцеобразную форму.
3. Разливочная труба по п.1, в которой газопроницаемый элемент (20) является самостоятельной деталью, размещенной внутри первого конца (16) трубы.
4. Разливочная труба по п.1, в которой газопроницаемый элемент (20) формуется в процессе изготовления трубы.
5. Разливочная труба по п.1, в которой первый конец (16) дополнительно снабжен по меньшей мере одним газовым каналом (36), простирающимся от по меньшей мере одной поверхности газопроницаемого элемента (20), иной, чем образующая часть первой плоской контактной поверхности (18) поверхность (20s), до по меньшей мере одной удаленной внешней поверхности первого конца (16)трубы.
6. Разливочная труба по п.5, в которой газовый канал (36) простирается до первой плоской контактной поверхности (18).
7. Разливочная труба по п.5, в которой газовый канал (36) простирается до кольцевой области трубы.
8. Разливочная труба по п.5, в которой газораспределительная камера (34) расположена между газопроницаемым элементом (20) и газовым каналом (36).
9. Разливочная труба по п.1, в которой газопроницаемый элемент (20) расположена вдоль внешней поверхности по периметру (12р) первой плоской контактной поверхности (18).
10. Узел, состоящий из разливочной трубы по одному из пп.1-9 и второго огнеупорного компонента (10), имеющего вторую плоскую контактную поверхность (28) и второй разливочный канал (14), предназначенный для стыковки первой плоской контактной поверхности (18) первой трубы с вышеуказанной второй плоской контактной поверхностью (28), образуя тем самым непрерывно функционирующий разливочный канал (14) в переходной области между первым и вторым разливочными каналами (14), в котором второй огнеупорный компонент (10) включает в себя по меньшей мере один канал подачи газа (38), выходной конец которого выходит на вторую плоскую контактную поверхность (28), тогда как его входной конец (40) выполнен с возможностью присоединения к средствам подачи газа.
11. Узел разливочной трубы по п.10, в котором канал подачи газа (38) имеет выходной конец с увеличенной площадью поперечного сечения.
12. Узел разливочной трубы по п.10, в котором в собранном положении узла канал подачи газа (38) выходит в по меньшей мере один газовый канал (36) трубы.
RU2008106464/02A 2004-08-04 2006-07-08 Огнеупорная разливочная труба с пористой вставкой RU2384389C2 (ru)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
KR1020040061527A KR100653699B1 (ko) 2004-08-04 2004-08-04 반도체 메모리 장치 및 이 장치의 배치방법
KR1020050038621A KR100689830B1 (ko) 2005-05-09 2005-05-09 반도체 집적 회로들 및 그 제조방법들
EP05016656A EP1624487A3 (en) 2004-08-04 2005-08-01 Semiconductor device having vertically stacked field effect transistors and methods of manufacturing the same
EP05016656.8 2005-08-27
EP05018656.8 2005-08-27

Publications (2)

Publication Number Publication Date
RU2008106464A true RU2008106464A (ru) 2009-10-10
RU2384389C2 RU2384389C2 (ru) 2010-03-20

Family

ID=35427519

Family Applications (1)

Application Number Title Priority Date Filing Date
RU2008106464/02A RU2384389C2 (ru) 2004-08-04 2006-07-08 Огнеупорная разливочная труба с пористой вставкой

Country Status (4)

Country Link
US (4) US7315466B2 (ru)
EP (1) EP1624487A3 (ru)
JP (1) JP2006049914A (ru)
RU (1) RU2384389C2 (ru)

Families Citing this family (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4683833B2 (ja) * 2003-10-31 2011-05-18 株式会社半導体エネルギー研究所 機能回路及びその設計方法
US7315466B2 (en) * 2004-08-04 2008-01-01 Samsung Electronics Co., Ltd. Semiconductor memory device and method for arranging and manufacturing the same
KR100702012B1 (ko) * 2005-03-22 2007-03-30 삼성전자주식회사 매립막 패턴들을 갖는 에스. 램들 및 그 형성방법들
KR100663360B1 (ko) * 2005-04-20 2007-01-02 삼성전자주식회사 박막 트랜지스터를 갖는 반도체 소자들 및 그 제조방법들
US7978561B2 (en) * 2005-07-28 2011-07-12 Samsung Electronics Co., Ltd. Semiconductor memory devices having vertically-stacked transistors therein
US20090224330A1 (en) * 2005-07-28 2009-09-10 Hong Chang Min Semiconductor Memory Device and Method for Arranging and Manufacturing the Same
KR100634459B1 (ko) * 2005-08-12 2006-10-16 삼성전자주식회사 다층 트랜지스터 구조를 가지는 반도체 장치 및 그제조방법
KR100665853B1 (ko) * 2005-12-26 2007-01-09 삼성전자주식회사 고집적 스태이틱 랜덤 억세스 메모리에 채용하기 적합한적층 메모리 셀
JP4782573B2 (ja) * 2006-01-31 2011-09-28 パナソニック株式会社 データ保持回路、スキャンチェーン回路、半導体集積回路およびそのプロセスばらつき判別方法
US7601998B2 (en) 2006-09-14 2009-10-13 Samsung Electronics Co., Ltd. Semiconductor memory device having metallization comprising select lines, bit lines and word lines
JP4768557B2 (ja) * 2006-09-15 2011-09-07 株式会社東芝 不揮発性半導体記憶装置及びその製造方法
KR101059062B1 (ko) * 2006-09-28 2011-08-24 인텔 코포레이션 메모리 셀 및 프로세서 기반 시스템
JP5130596B2 (ja) * 2007-05-30 2013-01-30 国立大学法人東北大学 半導体装置
KR101275758B1 (ko) * 2007-07-20 2013-06-14 삼성전자주식회사 복수개의 적층된 트랜지스터들을 구비하는 반도체 소자 및그 제조방법
US20090065841A1 (en) * 2007-09-06 2009-03-12 Assaf Shappir SILICON OXY-NITRIDE (SiON) LINER, SUCH AS OPTIONALLY FOR NON-VOLATILE MEMORY CELLS
US7829410B2 (en) 2007-11-26 2010-11-09 Micron Technology, Inc. Methods of forming capacitors, and methods of forming DRAM arrays
KR100960451B1 (ko) 2008-02-29 2010-05-28 주식회사 하이닉스반도체 반도체 소자 및 그 제조 방법
US8546876B2 (en) 2008-03-20 2013-10-01 Micron Technology, Inc. Systems and devices including multi-transistor cells and methods of using, making, and operating the same
US7969776B2 (en) * 2008-04-03 2011-06-28 Micron Technology, Inc. Data cells with drivers and methods of making and operating the same
KR100971532B1 (ko) * 2008-05-27 2010-07-21 삼성전자주식회사 구동 트랜지스터를 포함하는 반도체 소자
KR101398634B1 (ko) * 2008-07-11 2014-05-22 삼성전자주식회사 배선 구조체 및 이를 채택하는 전자 소자
US8004042B2 (en) * 2009-03-20 2011-08-23 Taiwan Semiconductor Manufacturing Company, Ltd. Static random access memory (SRAM) cell and method for forming same
US8054673B2 (en) * 2009-04-16 2011-11-08 Seagate Technology Llc Three dimensionally stacked non volatile memory units
MY164205A (en) 2009-10-29 2017-11-30 Semiconductor Energy Lab Semiconductor device
KR101650018B1 (ko) * 2009-11-03 2016-08-23 삼성전자주식회사 매립 배선을 구비하는 기판 구조체, 이의 제조 방법, 이를 포함하는 반도체 장치 및 그 제조 방법
US8786009B2 (en) * 2009-11-03 2014-07-22 Samsung Electronics Co., Ltd. Substrate structures including buried wiring, semiconductor devices including substrate structures, and method of fabricating the same
CN104867984B (zh) * 2009-12-28 2018-11-06 株式会社半导体能源研究所 制造半导体装置的方法
US8228705B2 (en) * 2010-04-22 2012-07-24 Himax Technologies Limited Memory cell and an associated memory device
JP2012146861A (ja) * 2011-01-13 2012-08-02 Toshiba Corp 半導体記憶装置
US8841675B2 (en) 2011-09-23 2014-09-23 Semiconductor Energy Laboratory Co., Ltd. Minute transistor
GB2505429A (en) 2012-08-29 2014-03-05 Ibm Semiconductor stack comprising plurality of phase-change memory (PCM) cells and performing a logic operation
US8952431B2 (en) 2013-05-09 2015-02-10 International Business Machines Corporation Stacked carbon-based FETs
US9455703B2 (en) * 2013-11-15 2016-09-27 Eaglepicher Technologies, Llc FET array bypass module
US9716100B2 (en) * 2014-03-14 2017-07-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for driving semiconductor device, and electronic device
KR20160000512A (ko) 2014-06-24 2016-01-05 삼성전자주식회사 메모리 장치
WO2017171842A1 (en) 2016-04-01 2017-10-05 Intel Corporation Transistor cells including a deep via lined with a dielectric material
JP7046049B2 (ja) * 2016-07-19 2022-04-01 東京エレクトロン株式会社 三次元半導体デバイス及び製造方法
JP7048182B2 (ja) 2016-08-26 2022-04-05 インテル・コーポレーション 集積回路のデバイス構造及び両面製造技術
KR102565380B1 (ko) 2016-12-07 2023-08-10 삼성디스플레이 주식회사 박막 트랜지스터 기판
WO2019132863A1 (en) 2017-12-26 2019-07-04 Intel Corporation Stacked transistors with contact last
US11430814B2 (en) 2018-03-05 2022-08-30 Intel Corporation Metallization structures for stacked device connectivity and their methods of fabrication
CN111492478A (zh) 2018-03-28 2020-08-04 英特尔公司 用于低温堆叠晶体管接触部的顶部nmos晶体管中的iii-v源极/漏极
WO2019190505A1 (en) * 2018-03-28 2019-10-03 Intel Corporation Stacked transistors with si pmos and high mobility thin film transistor nmos
US11616053B2 (en) 2018-09-05 2023-03-28 Tokyo Electron Limited Method to vertically route a logic cell incorporating stacked transistors in a three dimensional logic device
US10950545B2 (en) 2019-03-08 2021-03-16 International Business Machines Corporation Circuit wiring techniques for stacked transistor structures
US11688780B2 (en) 2019-03-22 2023-06-27 Intel Corporation Deep source and drain for transistor structures with back-side contact metallization
US11374003B2 (en) 2019-04-12 2022-06-28 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated circuit
WO2020217479A1 (ja) * 2019-04-26 2020-10-29 シャープ株式会社 表示装置
US11081561B2 (en) 2019-05-07 2021-08-03 Globalfoundries U.S. Inc. Field-effect transistors with vertically-serpentine gates
US10818763B1 (en) 2019-05-07 2020-10-27 Globalfoundries Inc. Field-effect transistors with laterally-serpentine gates
US11158368B2 (en) * 2019-09-06 2021-10-26 Coventor, Inc. Static random-access memory cell design
US11538814B2 (en) 2021-01-29 2022-12-27 Samsung Electronics Co., Ltd. Static random access memory of 3D stacked devices

Family Cites Families (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4680609A (en) 1984-09-24 1987-07-14 Northern Telecom Limited Structure and fabrication of vertically integrated CMOS logic gates
JPH0612799B2 (ja) 1986-03-03 1994-02-16 三菱電機株式会社 積層型半導体装置およびその製造方法
US5006913A (en) * 1988-11-05 1991-04-09 Mitsubishi Denki Kabushiki Kaisha Stacked type semiconductor device
US5200921A (en) * 1990-09-20 1993-04-06 Fujitsu Limited Semiconductor integrated circuit including P-channel MOS transistors having different threshold voltages
JPH0732200B2 (ja) * 1990-11-15 1995-04-10 株式会社東芝 スタティック型メモリセル
US5308782A (en) 1992-03-02 1994-05-03 Motorola Semiconductor memory device and method of formation
JPH0697366A (ja) * 1992-09-10 1994-04-08 Hitachi Ltd 高信頼度コンピュータチップ
US5532957A (en) * 1995-01-31 1996-07-02 Texas Instruments Incorporated Field reconfigurable logic/memory array
US5731945A (en) 1995-02-22 1998-03-24 International Business Machines Corporation Multichip semiconductor structures with consolidated circuitry and programmable ESD protection for input/output nodes
JPH08250673A (ja) * 1995-03-15 1996-09-27 Nec Corp 半導体装置
US5675185A (en) * 1995-09-29 1997-10-07 International Business Machines Corporation Semiconductor structure incorporating thin film transistors with undoped cap oxide layers
US5973369A (en) * 1997-03-11 1999-10-26 Nec Corporation SRAM having P-channel TFT as load element with less series-connected high resistance
KR0161809B1 (ko) 1995-11-07 1998-12-01 김광호 적층형 박막 트랜지스터를 가진 반도체 메모리장치
KR0179553B1 (ko) 1995-12-29 1999-04-15 김주용 로오 디코더 및 컬럼 디코더 회로
JP4103968B2 (ja) * 1996-09-18 2008-06-18 株式会社半導体エネルギー研究所 絶縁ゲイト型半導体装置
US5714394A (en) 1996-11-07 1998-02-03 Advanced Micro Devices, Inc. Method of making an ultra high density NAND gate using a stacked transistor arrangement
US5872029A (en) * 1996-11-07 1999-02-16 Advanced Micro Devices, Inc. Method for forming an ultra high density inverter using a stacked transistor arrangement
JP2923912B2 (ja) 1996-12-25 1999-07-26 日本電気株式会社 半導体装置
JP3501916B2 (ja) * 1997-02-28 2004-03-02 シャープ株式会社 半導体記憶装置およびその一括消去ベリファイ方法
JPH10270634A (ja) 1997-03-24 1998-10-09 Mitsubishi Electric Corp メモリモジュール
US5915167A (en) 1997-04-04 1999-06-22 Elm Technology Corporation Three dimensional structure memory
US5888872A (en) 1997-06-20 1999-03-30 Advanced Micro Devices, Inc. Method for forming source drain junction areas self-aligned between a sidewall spacer and an etched lateral sidewall
US5925913A (en) * 1997-08-25 1999-07-20 Advanced Micro Devices, Inc. System for enhancing the performance of a circuit by reducing the channel length of one or more transistors
US6271542B1 (en) * 1997-12-08 2001-08-07 International Business Machines Corporation Merged logic and memory combining thin film and bulk Si transistors
US6009023A (en) * 1998-05-26 1999-12-28 Etron Technology, Inc. High performance DRAM structure employing multiple thickness gate oxide
US6081458A (en) * 1998-08-26 2000-06-27 International Business Machines Corp. Memory system having a unidirectional bus and method for communicating therewith
JP3410976B2 (ja) * 1998-12-08 2003-05-26 インターナショナル・ビジネス・マシーンズ・コーポレーション 薄膜及びバルク・シリコン・トランジスタを組み合わせる併合化論理及びメモリ集積回路チップとその形成方法
JP3414662B2 (ja) * 1999-01-19 2003-06-09 株式会社半導体エネルギー研究所 Sramセル及びその製造方法
US6576510B2 (en) * 1999-06-17 2003-06-10 Hitachi Ltd Method of producing a semiconductor memory device using a self-alignment process
JP2002026283A (ja) 2000-06-30 2002-01-25 Seiko Epson Corp 多層構造のメモリ装置及びその製造方法
KR100381962B1 (ko) * 2000-08-07 2003-05-01 삼성전자주식회사 비휘발성 메모리 장치의 로우 디코더
IT1316269B1 (it) * 2000-12-28 2003-04-03 Micron Technology Inc Riduzione di rumore di alimentazione nella selezione di colonna indispositivi di memoria.
US6887753B2 (en) 2001-02-28 2005-05-03 Micron Technology, Inc. Methods of forming semiconductor circuitry, and semiconductor circuit constructions
KR100418089B1 (ko) * 2001-06-21 2004-02-11 주식회사 하이닉스반도체 반도체 소자의 박막 트랜지스터 제조 방법
KR20010088672A (ko) 2001-08-20 2001-09-28 심재택 반도체 적층 구조 및 이를 이용한 반도체
JP2003142661A (ja) 2001-11-05 2003-05-16 Sony Corp 強誘電体型不揮発性半導体メモリ
US6906361B2 (en) 2002-04-08 2005-06-14 Guobiao Zhang Peripheral circuits of electrically programmable three-dimensional memory
US6678184B2 (en) * 2002-06-05 2004-01-13 Stmicroelectronics, Inc. CAM cell having compare circuit formed over two active regions
JP2004039690A (ja) * 2002-06-28 2004-02-05 Seiko Epson Corp 半導体素子
US6882010B2 (en) * 2002-10-03 2005-04-19 Micron Technology, Inc. High performance three-dimensional TFT-based CMOS inverters, and computer systems utilizing such novel CMOS inverters
KR100468780B1 (ko) 2002-12-18 2005-01-29 삼성전자주식회사 더블 포트 반도체 메모리 장치
US7009911B2 (en) 2004-07-09 2006-03-07 Micron Technology, Inc. Memory array decoder
US7315466B2 (en) * 2004-08-04 2008-01-01 Samsung Electronics Co., Ltd. Semiconductor memory device and method for arranging and manufacturing the same
KR100689830B1 (ko) 2005-05-09 2007-03-08 삼성전자주식회사 반도체 집적 회로들 및 그 제조방법들
KR100593450B1 (ko) 2004-10-08 2006-06-28 삼성전자주식회사 수직하게 차례로 위치된 복수 개의 활성 영역들을 갖는피이. 램들 및 그 형성방법들.
US6972478B1 (en) * 2005-03-07 2005-12-06 Advanced Micro Devices, Inc. Integrated circuit and method for its manufacture
KR100702012B1 (ko) 2005-03-22 2007-03-30 삼성전자주식회사 매립막 패턴들을 갖는 에스. 램들 및 그 형성방법들
KR100577603B1 (ko) 2005-05-20 2006-05-08 삼성전자주식회사 적층형 반도체 장치 및 그 제조 방법
KR100634459B1 (ko) 2005-08-12 2006-10-16 삼성전자주식회사 다층 트랜지스터 구조를 가지는 반도체 장치 및 그제조방법
KR100866749B1 (ko) 2005-12-30 2008-11-03 주식회사 하이닉스반도체 비휘발성 반도체 메모리 장치

Also Published As

Publication number Publication date
RU2384389C2 (ru) 2010-03-20
US7315466B2 (en) 2008-01-01
US20080089163A1 (en) 2008-04-17
EP1624487A3 (en) 2007-10-03
US7982221B2 (en) 2011-07-19
US7589992B2 (en) 2009-09-15
US20110266623A1 (en) 2011-11-03
US20090294863A1 (en) 2009-12-03
JP2006049914A (ja) 2006-02-16
US20060028861A1 (en) 2006-02-09
EP1624487A2 (en) 2006-02-08

Similar Documents

Publication Publication Date Title
RU2008106464A (ru) Огнеупорная разливочная труба с пористой вставкой
ATE535702T1 (de) Ansaugschalldämpfer
WO2006130711A3 (en) Ceramic wall flow filter manufacture
TW200706754A (en) Holding seal member for exhaust gas purifier, exhaust gas purification apparatus employing the same, jig for chamfering holding seal member, and method for manufacturing holding seal member
DE502006007811D1 (de) Brenner zur vormischartigen Verbrennung
ATE483232T1 (de) Quadratrohr für gehäuse von abgebrannten brennstoff, korb und behälter für gehäuse von abgebrannten brennstoff
DE69937271D1 (de) Einlassventil mit Kammer zur Einstellung der Öffnungszeit
ATE529701T1 (de) Gasbrenner
PL1760406T3 (pl) Rozdzielacz rurowy do instalacji grzejnej lub chłodniczej
KR900005515B1 (ko) 가스 유통체 및 그 제조방법
KR200409519Y1 (ko) 호스연결구의 캡 고정구조
JP2003121314A (ja) 溶融物用試料採取器
CN209533970U (zh) 一种壁炉用实心圆球生产模具
RU2008129430A (ru) Керамическая дуговая камера, содержащая фасонные концы
KR20220035567A (ko) 농차다관 제조 방법 및 그 제조 방법으로 제조된 농차다관
ES2121401T3 (es) Modulo de lavado de gases en forma de un lavador de ranura.
IT1251560B (it) Bruciatore perfezionato, particolarmente adatto per caldaie murali
EA200100690A1 (ru) Охлаждающий элемент пирометаллургического реактора и его изготовление
ATE360119T1 (de) Einhebelmischarmatur mit horizontaler mischpatrone
SU679302A1 (ru) Опока дл лить по выплавл емым модел м
BR0308960A (pt) Tubo cerâmico para disjuntor a vácuo
KR200238162Y1 (ko) 부탄가스용 토오치 램프의 연소관과 연결캡의 결합구조
JP2018520470A (ja) 燃料電池装置
JP2007335691A (ja) 内燃機関用点火コイル
JPS5540263A (en) Totally-enclosed motor compressor

Legal Events

Date Code Title Description
MM4A The patent is invalid due to non-payment of fees

Effective date: 20120709