KR910019269A - 반도체 수광소자 - Google Patents
반도체 수광소자 Download PDFInfo
- Publication number
- KR910019269A KR910019269A KR1019910005702A KR910005702A KR910019269A KR 910019269 A KR910019269 A KR 910019269A KR 1019910005702 A KR1019910005702 A KR 1019910005702A KR 910005702 A KR910005702 A KR 910005702A KR 910019269 A KR910019269 A KR 910019269A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor layer
- semiconductor
- light receiving
- receiving element
- semiconductor light
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 12
- 239000012535 impurity Substances 0.000 claims 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
- H01L31/1075—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes in which the active layers, e.g. absorption or multiplication layers, form an heterostructure, e.g. SAM structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035272—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
- H01L31/035281—Shape of the body
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1 도는 본 발명에 따른 반도체 수광소자의 실시예의 단면도.
Claims (1)
- 증배층인 1 도전형의 제 1 반도체층(25,55)과, 이 제 1 반도체층의 주면상에 직접 또는 중간층(57)을 매개하여 형성되는 윈도우층인 1도 전형의 제 2 반도체층(26,46,56), 이 제 2 반도체층의 주표면으로부터 제 1 반도체층을 향하여 구부러진 @부(36), 이@부의 표면으로 부터 불순물을 도우프하여 형성되고 또한 제 1 반도체층에 도달하는 반대도전형의 제 3 반도체층(27), 1도 전형의 제 1 및 제 2 반도체층과 반대도전형의 제 3 반도체층에 의해 형성되는 PN접합(35)의 곡률을 갖는 부분을 포함하는 반대도전형의 가이드 링(28)을 구비하여 구성된 것을 특징으로 하는 반도체 수광소자.※ 참고사항 : 최초출원내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2-95470 | 1990-04-11 | ||
JP2095470A JP2970815B2 (ja) | 1990-04-11 | 1990-04-11 | 半導体受光素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910019269A true KR910019269A (ko) | 1991-11-30 |
KR940011103B1 KR940011103B1 (ko) | 1994-11-23 |
Family
ID=14138534
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910005702A KR940011103B1 (ko) | 1990-04-11 | 1991-04-10 | 반도체 수광소자 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5157473A (ko) |
EP (1) | EP0451852B1 (ko) |
JP (1) | JP2970815B2 (ko) |
KR (1) | KR940011103B1 (ko) |
DE (1) | DE69127574T2 (ko) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8817886D0 (en) * | 1988-07-27 | 1988-09-01 | British Telecomm | Avalanche photodiode structure |
US5365087A (en) * | 1992-07-15 | 1994-11-15 | Sumitomo Electric Industries, Ltd. | Photodetector and opto-electronic integrated circuit with guard ring |
JPH06314813A (ja) * | 1993-03-04 | 1994-11-08 | Sumitomo Electric Ind Ltd | pin型受光素子、その製造方法及び光電子集積回路 |
US5610416A (en) * | 1995-02-16 | 1997-03-11 | Hewlett-Packard Company | Avalanche photodiode with epitaxially regrown guard rings |
JP3826366B2 (ja) * | 1996-02-22 | 2006-09-27 | モレックス インコーポレーテッド | 電気コネクタ |
JP3016371B2 (ja) * | 1997-03-26 | 2000-03-06 | 日本電気株式会社 | 光検出器の製造方法 |
US5866936A (en) * | 1997-04-01 | 1999-02-02 | Hewlett-Packard Company | Mesa-structure avalanche photodiode having a buried epitaxial junction |
US5757057A (en) * | 1997-06-25 | 1998-05-26 | Advanced Photonix, Inc. | Large area avalanche photodiode array |
US5831322A (en) * | 1997-06-25 | 1998-11-03 | Advanced Photonix, Inc. | Active large area avalanche photodiode array |
US6730979B2 (en) * | 2002-09-12 | 2004-05-04 | The Boeing Company | Recessed p-type region cap layer avalanche photodiode |
KR100532281B1 (ko) * | 2003-05-26 | 2005-11-29 | 삼성전자주식회사 | 면굴절 입사형 수광소자 및 그 제조방법 |
US20060121683A1 (en) * | 2004-12-08 | 2006-06-08 | Finisar Corporation | Point source diffusion for avalanche photodiodes |
US7233051B2 (en) * | 2005-06-28 | 2007-06-19 | Intel Corporation | Germanium/silicon avalanche photodetector with separate absorption and multiplication regions |
US7741657B2 (en) * | 2006-07-17 | 2010-06-22 | Intel Corporation | Inverted planar avalanche photodiode |
US7683397B2 (en) * | 2006-07-20 | 2010-03-23 | Intel Corporation | Semi-planar avalanche photodiode |
US8008688B2 (en) * | 2008-04-01 | 2011-08-30 | Jds Uniphase Corporation | Photodiode and method of fabrication |
US8198650B2 (en) * | 2008-12-08 | 2012-06-12 | General Electric Company | Semiconductor devices and systems |
US7968963B2 (en) * | 2009-04-08 | 2011-06-28 | Sumitomo Electric Industries, Ltd. | Photodiode array and image pickup device using the same |
TWI438917B (zh) * | 2009-11-12 | 2014-05-21 | Maxchip Electronics Corp | 結合紅外線感測之環境光源感測器及其製造方法 |
US9136301B2 (en) | 2009-11-12 | 2015-09-15 | Maxchip Electronics Corp. | Multi-wave band light sensor combined with function of IR sensing and method of fabricating the same |
US20110304758A1 (en) * | 2010-06-12 | 2011-12-15 | Munir Eldesouki | High speed imaging through in-pixel storage |
US9052497B2 (en) | 2011-03-10 | 2015-06-09 | King Abdulaziz City For Science And Technology | Computing imaging data using intensity correlation interferometry |
US9099214B2 (en) | 2011-04-19 | 2015-08-04 | King Abdulaziz City For Science And Technology | Controlling microparticles through a light field having controllable intensity and periodicity of maxima thereof |
JP2016122716A (ja) * | 2014-12-24 | 2016-07-07 | 株式会社東芝 | 光検出装置およびこの光検出装置を備えたct装置 |
KR102017125B1 (ko) * | 2018-03-28 | 2019-09-03 | 주식회사 포셈 | 포토다이오드의 제조방법 |
CN111653637A (zh) * | 2020-03-26 | 2020-09-11 | 厦门市三安集成电路有限公司 | 一种宽光谱响应的雪崩光电二极管及其制作方法 |
CN112968071B (zh) * | 2021-04-15 | 2022-09-06 | 长春工业大学 | 一种雪崩二极管及其制备方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5572084A (en) * | 1978-11-27 | 1980-05-30 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor photo-detector |
US4556494A (en) * | 1980-12-04 | 1985-12-03 | Kamyr Aktiebolag | Method of diffusion washing or thickening of pulp |
CA1228661A (en) * | 1984-04-10 | 1987-10-27 | Rca Inc. | Avalanche photodetector |
CA1228663A (en) * | 1984-04-10 | 1987-10-27 | Paul P. Webb | Photodetector with isolated avalanche region |
JPS611064A (ja) * | 1984-05-31 | 1986-01-07 | Fujitsu Ltd | 半導体受光装置 |
JPS61172381A (ja) * | 1984-12-22 | 1986-08-04 | Fujitsu Ltd | InP系化合物半導体装置 |
JPS61156777A (ja) * | 1984-12-28 | 1986-07-16 | Fujitsu Ltd | 半導体受光素子 |
JPS61191082A (ja) * | 1985-02-20 | 1986-08-25 | Fujitsu Ltd | 半導体受光素子 |
JPS61256771A (ja) * | 1985-05-10 | 1986-11-14 | Fujitsu Ltd | 半導体受光装置の製造方法 |
JPS6233482A (ja) * | 1985-08-07 | 1987-02-13 | Mitsubishi Electric Corp | アバランシエホトダイオ−ド |
JPS6248079A (ja) * | 1985-08-28 | 1987-03-02 | Fujitsu Ltd | 半導体受光素子 |
JPH07118548B2 (ja) * | 1986-04-28 | 1995-12-18 | 住友電気工業株式会社 | ▲iii▼−v族多元化合物半導体pinフオトダイオ−ド |
JPS63128679A (ja) * | 1986-11-18 | 1988-06-01 | Fujitsu Ltd | 半導体受光装置 |
US5053837A (en) * | 1987-09-16 | 1991-10-01 | Sumitomo Electric Industries, Ltd. | Ingaas/inp type pin photodiodes |
JPH01296676A (ja) * | 1988-05-24 | 1989-11-30 | Nec Corp | 半導体受光装置 |
JPH02159775A (ja) * | 1988-12-14 | 1990-06-19 | Toshiba Corp | 半導体受光素子及びその製造方法 |
-
1990
- 1990-04-11 JP JP2095470A patent/JP2970815B2/ja not_active Expired - Fee Related
-
1991
- 1991-04-05 US US07/680,858 patent/US5157473A/en not_active Expired - Lifetime
- 1991-04-10 KR KR1019910005702A patent/KR940011103B1/ko not_active IP Right Cessation
- 1991-04-11 EP EP91105809A patent/EP0451852B1/en not_active Expired - Lifetime
- 1991-04-11 DE DE69127574T patent/DE69127574T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0451852A1 (en) | 1991-10-16 |
US5157473A (en) | 1992-10-20 |
DE69127574T2 (de) | 1998-02-19 |
EP0451852B1 (en) | 1997-09-10 |
KR940011103B1 (ko) | 1994-11-23 |
DE69127574D1 (de) | 1997-10-16 |
JP2970815B2 (ja) | 1999-11-02 |
JPH03293780A (ja) | 1991-12-25 |
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Date | Code | Title | Description |
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A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20051031 Year of fee payment: 12 |
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LAPS | Lapse due to unpaid annual fee |