KR900001652B1 - 반도체 장치 및 그 제조방법 - Google Patents

반도체 장치 및 그 제조방법 Download PDF

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Publication number
KR900001652B1
KR900001652B1 KR1019860006335A KR860006335A KR900001652B1 KR 900001652 B1 KR900001652 B1 KR 900001652B1 KR 1019860006335 A KR1019860006335 A KR 1019860006335A KR 860006335 A KR860006335 A KR 860006335A KR 900001652 B1 KR900001652 B1 KR 900001652B1
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KR
South Korea
Prior art keywords
metal layer
semiconductor device
aluminum
layer
manufacturing
Prior art date
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Expired
Application number
KR1019860006335A
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English (en)
Korean (ko)
Other versions
KR870004504A (ko
Inventor
요시히로 히라다
레이지 다마기
다께시 노구찌
큥 이찌 아리마
겡지 사이또오
시게루 하라다
Original Assignee
미쓰비시 뎅기 가부시끼가이샤
시기 모리야
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 미쓰비시 뎅기 가부시끼가이샤, 시기 모리야 filed Critical 미쓰비시 뎅기 가부시끼가이샤
Publication of KR870004504A publication Critical patent/KR870004504A/ko
Application granted granted Critical
Publication of KR900001652B1 publication Critical patent/KR900001652B1/ko
Expired legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/53204—Conductive materials
    • H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
    • H01L23/53214—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being aluminium
    • H01L23/53223—Additional layers associated with aluminium layers, e.g. adhesion, barrier, cladding layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
    • H01L23/5329—Insulating materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
KR1019860006335A 1985-10-08 1986-07-31 반도체 장치 및 그 제조방법 Expired KR900001652B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP60-224284 1985-10-08
JP60224284A JPH0611076B2 (ja) 1985-10-08 1985-10-08 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
KR870004504A KR870004504A (ko) 1987-05-09
KR900001652B1 true KR900001652B1 (ko) 1990-03-17

Family

ID=16811357

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860006335A Expired KR900001652B1 (ko) 1985-10-08 1986-07-31 반도체 장치 및 그 제조방법

Country Status (5)

Country Link
US (1) US4896204A (enExample)
JP (1) JPH0611076B2 (enExample)
KR (1) KR900001652B1 (enExample)
DE (1) DE3634168A1 (enExample)
GB (1) GB2181893B (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2624304B1 (fr) * 1987-12-04 1990-05-04 Philips Nv Procede pour etablir une structure d'interconnexion electrique sur un dispositif semiconducteur au silicium
DE3815512C2 (de) * 1988-05-06 1994-07-28 Deutsche Aerospace Solarzelle und Verfahren zu ihrer Herstellung
KR940008936B1 (ko) * 1990-02-15 1994-09-28 가부시끼가이샤 도시바 고순도 금속재와 그 성질을 이용한 반도체 장치 및 그 제조방법
US5126283A (en) * 1990-05-21 1992-06-30 Motorola, Inc. Process for the selective encapsulation of an electrically conductive structure in a semiconductor device
JPH07123101B2 (ja) * 1990-09-14 1995-12-25 株式会社東芝 半導体装置
US5175125A (en) * 1991-04-03 1992-12-29 Chartered Semiconductor Manufacturing Ltd. Pte Method for making electrical contacts
US5679982A (en) * 1993-02-24 1997-10-21 Intel Corporation Barrier against metal diffusion
US5382447A (en) * 1993-12-02 1995-01-17 International Business Machines Corporation Process for fabricating improved multilayer interconnect systems
US5913146A (en) * 1997-03-18 1999-06-15 Lucent Technologies Inc. Semiconductor device having aluminum contacts or vias and method of manufacture therefor
US6906421B1 (en) * 1998-01-14 2005-06-14 Cypress Semiconductor Corporation Method of forming a low resistivity Ti-containing interconnect and semiconductor device comprising the same
EP1101837B1 (en) * 1999-11-22 2008-01-09 STMicroelectronics S.r.l. Moisture corrosion inhibitor layer for Al-alloy metallization layers for electronic devices and corresponding manufacturing method
JP6191587B2 (ja) * 2014-12-08 2017-09-06 トヨタ自動車株式会社 半導体装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3866311A (en) * 1971-06-14 1975-02-18 Nat Semiconductor Corp Method of providing electrically isolated overlapping metallic conductors
JPS52147988A (en) * 1976-06-03 1977-12-08 Toshiba Corp Manufacture of semiconductor device
US4433004A (en) * 1979-07-11 1984-02-21 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor device and a method for manufacturing the same
JPS56105660A (en) * 1980-01-28 1981-08-22 Nec Corp Semiconductor device
US4471376A (en) * 1981-01-14 1984-09-11 Harris Corporation Amorphous devices and interconnect system and method of fabrication
DE3140669A1 (de) * 1981-10-13 1983-04-28 Siemens AG, 1000 Berlin und 8000 München Verfahren zum herstellen von halbleitervorrichtungen
JPS58103168A (ja) * 1981-12-16 1983-06-20 Fujitsu Ltd 半導体装置
JPS58137231A (ja) * 1982-02-09 1983-08-15 Nec Corp 集積回路装置
JPS58201367A (ja) * 1982-05-20 1983-11-24 Nec Corp Ｍｏｓ型半導体装置の製造方法
JPS59501845A (ja) * 1982-09-30 1984-11-01 アドバンスト・マイクロ・ディバイシズ・インコ−ポレ−テッド 集積回路のためのアルミニウム−金属シリサイドの相互接続構造及びその製造方法
DE3244461A1 (de) * 1982-12-01 1984-06-07 Siemens AG, 1000 Berlin und 8000 München Integrierte halbleiterschaltung mit einer aus einer aluminium/silizium-legierung bestehenden kontaktleiterbahnebene
JPS60136337A (ja) * 1983-12-22 1985-07-19 モノリシツク・メモリ−ズ・インコ−ポレイテツド ２重層処理においてヒロツク抑制層を形成する方法及びその構造物

Also Published As

Publication number Publication date
JPH0611076B2 (ja) 1994-02-09
GB2181893A (en) 1987-04-29
JPS6284534A (ja) 1987-04-18
US4896204A (en) 1990-01-23
KR870004504A (ko) 1987-05-09
GB8623528D0 (en) 1986-11-05
GB2181893B (en) 1989-03-30
DE3634168A1 (de) 1987-04-16
DE3634168C2 (enExample) 1991-12-05

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