KR900000500A - 기판에 절연체를 코팅하기 위한장치 - Google Patents
기판에 절연체를 코팅하기 위한장치 Download PDFInfo
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- KR900000500A KR900000500A KR1019890008711A KR890008711A KR900000500A KR 900000500 A KR900000500 A KR 900000500A KR 1019890008711 A KR1019890008711 A KR 1019890008711A KR 890008711 A KR890008711 A KR 890008711A KR 900000500 A KR900000500 A KR 900000500A
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0042—Controlling partial pressure or flow rate of reactive or inert gases with feedback of measurements
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0068—Reactive sputtering characterised by means for confinement of gases or sputtered material, e.g. screens, baffles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
- C23C14/0652—Silicon nitride
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Fluid Mechanics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Insulating Bodies (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제 1도는 본 발명에 의한 장치의 기본도,
제 2도는 공지된 dc전류 마그네트론 스퍼터링 장치에서 7 ×10-3mbar의 압력하에서 음극전압의 함수로서 음극전류 뿐만 아니라 스퍼터링 출력에 대한 스퍼터링 속도를 나타내는 도표, 제3도는 7 ×10-3mbar의 아르곤 압력, 6.7SCCM/min의 일정한 O2흐름과 Al표적에서 dc전류 음극전압의 함수로서 음극전류 뿐만 아니라 O2부분 압력을 나타내는 도표.
Claims (17)
- 스퍼트되는 표적에 접속된 전극과 접속되는 dc전류 소오스가 구비되고, 환상자계가 표적을 투과하여 그 필드선이 자극영역에서 표적의 표면으로부터 나옴에 따라 표적의 스퍼트된 입자가 기판위에 부착되는 유도물질에 의해 화합물을 형성하는 기판에 절연체를 코팅하는 장치에 있어서, ac전류 소오스(30)가 구비되어 그 출력전압이 dc전류 소오스(10)의 dc전압과 중첩되고, 전극(5)에 공급되는 ac전류 소오스(30)의 전기출력은 dc전류 소오스(10)에 의해서 전극(5)에 제공된 출력의 5% 내지 25%에 대응하는 것을 특징으로 하는 기판에 절연체를 코팅하기 위한 장치.
- 제1항에 있어서, ac전류 소오스(30)은 HF전류 소오스인 것을 특징으로 하는 장치.
- 제1항과 2항에 있어서, HF출력은 dc전류 출력의 10%인 것을 특징으로 하는 장치.
- 제1항에 있어서, dc전류 소오스(10)은 두 인덕터(11,12)을 경유하여 전극(5)에 결합되는 것을 특징으로 하는 장치.
- 제1항에 있어서, ac전류 소오스(30)은 커패시터(33,34)을 경유하여 전극(5)에 결합되는 것을 특징으로 하는 장치.
- 제4항에 있어서, dc전류 소오스(10)은 제1인덕터(11)사이와 접지전위 사이에 커패시터(29)가 있는 것을 특징으로 하는 장치.
- 제4항에 있어서, 제1인덕터(11)과, 제2인덕터(12)사이와 접지전위 사이에, 커패시터(32)가 위치되어 있는 것을 특징으로 하는 장치.
- 제1항에 있어서, 도표(26)을 정의하는, 개구를 갖는 제2용기(24)에 제1용기(25)가 구비되고 코팅되는 기판(1)이 제2용기(24)의 개구를 통하여 표적(3)에 대응하고 일이상의 기체가 제1용기와 제2용기(25,24)사이의 공간속으로 들어가도록 하는 것을 특징으로 하는 장치.
- 제1항에 있어서, ac전류 소오스(30)은 13.56MHz의 ac전압을 공급하는 것을 특징으로 하는 장치.
- 제1항에 있어서, 표적(3)은 알루미늄으로 구성되고 기판위에 형성되는 층은 Al2O3으로 구성되는 것을 특징으로 하는 장치.
- 제1항에 있어서, 표적(3)은 도우핑된, 전도성 실리콘으로 구성되고, 기판위에 형성된 층은 SiO2로 구성되는 것을 특징으로 하는 장치.
- 제1항에 있어서, 표적(3)은 알루미늄으로 구성되고 기판위에 형성된 층은 AIN으로 구성되는 것을 특징으로 하는 장치.
- 제1항에 있어서, 표적(3)은 도우핑된 전도성 실리콘으로 구성되고 기판위에 형성된 층은 Si3N4으로 구성되는 것을 특징으로 하는 장치.
- 제1항에 있어서, 표적물질의 종류에 따라 dc전류 소오스(10)가 작동되어, 전류전압 또는 출력전압에 대하여 제어하는 것을 특징으로 하는 장치.
- 제1항에 있어서, Al, Si 또는 Sn의 표적이 사용될때, dc전류 소오스(10)가 전압에 대하여 우선적으로 제어되는 것을 특징으로 하는 장치.
- 제1항에 있어서, 아르곤/산소 분위기내에서 Al,Si,Sn,In/Sn의 표적을 스퍼터링 할떼 dc전류 소오스(10)가 전압에 대하여 제어되어 작동하는 것을 특징으로 하는 장치.
- 제1항에 있어서, 아르곤/질소 분위기내에서 Al,Si의 표적(3)이 스퍼트될때 dc전류 소오스(10)가 전압에 대해서 제어되어 작동하는 것을 특징으로 하는 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3821207A DE3821207A1 (de) | 1988-06-23 | 1988-06-23 | Anordnung zum beschichten eines substrats mit dielektrika |
DEP3821207.2 | 1988-06-23 |
Publications (1)
Publication Number | Publication Date |
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KR900000500A true KR900000500A (ko) | 1990-01-30 |
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ID=6357087
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890008711A KR900000500A (ko) | 1988-06-23 | 1989-06-23 | 기판에 절연체를 코팅하기 위한장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US4931169A (ko) |
EP (1) | EP0347567A3 (ko) |
JP (1) | JPH0254764A (ko) |
KR (1) | KR900000500A (ko) |
DE (1) | DE3821207A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100368200B1 (ko) * | 1999-07-27 | 2003-01-24 | 마츠시다 덴코 가부시키가이샤 | 플라즈마 생성용 전극, 그 전극을 사용하는 플라즈마 처리장치, 및 그 장치로 플라즈마 처리하는 방법 |
Families Citing this family (71)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3929695C2 (de) * | 1989-09-07 | 1996-12-19 | Leybold Ag | Vorrichtung zum Beschichten eines Substrats |
JP2934711B2 (ja) * | 1989-12-07 | 1999-08-16 | カシオ計算機株式会社 | スパッタ装置 |
DE4010495C2 (de) * | 1990-03-31 | 1997-07-31 | Leybold Ag | Vorrichtung zum Beschichten eines Substrats mit Werkstoffen, beispielweise mit Metallen |
US5427665A (en) * | 1990-07-11 | 1995-06-27 | Leybold Aktiengesellschaft | Process and apparatus for reactive coating of a substrate |
US5407548A (en) * | 1990-10-26 | 1995-04-18 | Leybold Aktiengesellschaft | Method for coating a substrate of low resistance to corrosion |
JP3076367B2 (ja) * | 1990-11-29 | 2000-08-14 | キヤノン株式会社 | プラズマ処理装置 |
DE4042289A1 (de) * | 1990-12-31 | 1992-07-02 | Leybold Ag | Verfahren und vorrichtung zum reaktiven beschichten eines substrats |
DE4042287C2 (de) * | 1990-12-31 | 1999-10-28 | Leybold Ag | Vorrichtung zum reaktiven Aufstäuben von elektrisch isolierendem Werkstoff |
DE4042288A1 (de) * | 1990-12-31 | 1992-07-02 | Leybold Ag | Verfahren und vorrichtung zum reaktiven beschichten eines substrats |
DE4109018C2 (de) * | 1991-03-20 | 2002-02-28 | Unaxis Deutschland Holding | Vorrichtung zum Beschichten eines Substrats |
EP0508359B1 (de) * | 1991-04-12 | 1996-10-09 | Balzers Aktiengesellschaft | Verfahren und Anlage zur Beschichtung mindestens eines Gegenstandes |
US5656138A (en) * | 1991-06-18 | 1997-08-12 | The Optical Corporation Of America | Very high vacuum magnetron sputtering method and apparatus for precision optical coatings |
DE4140862A1 (de) * | 1991-12-11 | 1993-06-17 | Leybold Ag | Kathodenzerstaeubungsanlage |
CH689767A5 (de) * | 1992-03-24 | 1999-10-15 | Balzers Hochvakuum | Verfahren zur Werkstueckbehandlung in einer Vakuumatmosphaere und Vakuumbehandlungsanlage. |
US5922176A (en) * | 1992-06-12 | 1999-07-13 | Donnelly Corporation | Spark eliminating sputtering target and method for using and making same |
JP2905342B2 (ja) * | 1992-09-07 | 1999-06-14 | 財団法人国際超電導産業技術研究センター | YBa2Cu3Ox超電導薄膜の製造方法 |
WO1994008067A1 (en) * | 1992-09-30 | 1994-04-14 | Advanced Energy Industries, Inc. | Topographically precise thin film coating system |
US5427669A (en) * | 1992-12-30 | 1995-06-27 | Advanced Energy Industries, Inc. | Thin film DC plasma processing system |
FR2699934B1 (fr) * | 1992-12-30 | 1995-03-17 | Lorraine Inst Nat Polytech | Procédé de contrôle de la concentration en métalloïde d'un dépôt réalisés par voie physique en phase vapeur réactive à l'aide d'un plasma froid de pulvérisation. |
US6217717B1 (en) | 1992-12-30 | 2001-04-17 | Advanced Energy Industries, Inc. | Periodically clearing thin film plasma processing system |
US5718813A (en) * | 1992-12-30 | 1998-02-17 | Advanced Energy Industries, Inc. | Enhanced reactive DC sputtering system |
DE4301188C2 (de) * | 1993-01-19 | 2001-05-31 | Leybold Ag | Vorrichtung zum Beschichten oder Ätzen von Substraten |
DE4301189C2 (de) * | 1993-01-19 | 2000-12-14 | Leybold Ag | Vorrichtung zum Beschichten von Substraten |
CH687258A5 (de) * | 1993-04-22 | 1996-10-31 | Balzers Hochvakuum | Gaseinlassanordnung. |
DE4315136A1 (de) * | 1993-05-07 | 1994-11-17 | Voralp Ets | Vorrichtung für die Maskierung von zu bearbeitenden Substraten |
JPH0715051A (ja) * | 1993-06-24 | 1995-01-17 | Mitsubishi Electric Corp | Ybco超電導薄膜の製造方法 |
US6605198B1 (en) * | 1993-07-22 | 2003-08-12 | Sputtered Films, Inc. | Apparatus for, and method of, depositing a film on a substrate |
DE4325011A1 (de) * | 1993-07-28 | 1995-03-02 | Herlitz Michael | Erweiterung von Entspiegelung wie bei Brillengläsern üblich auf Autoglasscheiben sowie weitere Kraftfahrzeuge und Verkehrsmittel, sowie alle anderen Silikat- und Kunststoffscheiben |
DE4413378A1 (de) * | 1994-04-19 | 1995-10-26 | Leybold Ag | Einrichtung zum Beschichten eines Substrats |
US5693197A (en) * | 1994-10-06 | 1997-12-02 | Hmt Technology Corporation | DC magnetron sputtering method and apparatus |
DE4441206C2 (de) * | 1994-11-19 | 1996-09-26 | Leybold Ag | Einrichtung für die Unterdrückung von Überschlägen in Kathoden-Zerstäubungseinrichtungen |
US6346176B1 (en) * | 1995-01-27 | 2002-02-12 | Gentex Optics, Inc. | Method of depositing thin films |
WO1996031899A1 (en) | 1995-04-07 | 1996-10-10 | Advanced Energy Industries, Inc. | Adjustable energy quantum thin film plasma processing system |
US5576939A (en) * | 1995-05-05 | 1996-11-19 | Drummond; Geoffrey N. | Enhanced thin film DC plasma power supply |
KR100226366B1 (ko) * | 1995-08-23 | 1999-10-15 | 아끼구사 나오유끼 | 플라즈마장치 및 플라즈마 처리방법 |
DE19605314C2 (de) * | 1996-02-14 | 2002-01-31 | Fraunhofer Ges Forschung | Verfahren zum Bearbeiten von Substraten in einem bipolaren Niederdruck-Glimmprozeß |
DE19610012B4 (de) * | 1996-03-14 | 2005-02-10 | Unaxis Deutschland Holding Gmbh | Verfahren zur Stabilisierung eines Arbeitspunkts beim reaktiven Zerstäuben in einer Sauerstoff enthaltenden Atmosphäre |
US5882492A (en) * | 1996-06-21 | 1999-03-16 | Sierra Applied Sciences, Inc. | A.C. plasma processing system |
US5682067A (en) * | 1996-06-21 | 1997-10-28 | Sierra Applied Sciences, Inc. | Circuit for reversing polarity on electrodes |
JPH1079483A (ja) * | 1996-09-04 | 1998-03-24 | Oki Electric Ind Co Ltd | 半導体素子の製造方法 |
US6475353B1 (en) * | 1997-05-22 | 2002-11-05 | Sony Corporation | Apparatus and method for sputter depositing dielectric films on a substrate |
US5993613A (en) * | 1997-11-07 | 1999-11-30 | Sierra Applied Sciences, Inc. | Method and apparatus for periodic polarity reversal during an active state |
US5910886A (en) * | 1997-11-07 | 1999-06-08 | Sierra Applied Sciences, Inc. | Phase-shift power supply |
US5889391A (en) * | 1997-11-07 | 1999-03-30 | Sierra Applied Sciences, Inc. | Power supply having combined regulator and pulsing circuits |
US6011704A (en) * | 1997-11-07 | 2000-01-04 | Sierra Applied Sciences, Inc. | Auto-ranging power supply |
US5990668A (en) * | 1997-11-07 | 1999-11-23 | Sierra Applied Sciences, Inc. | A.C. power supply having combined regulator and pulsing circuits |
DE19834733C1 (de) * | 1998-07-31 | 2000-04-27 | Fraunhofer Ges Forschung | Vorrichtung und Verfahren zur Beschichtung und/oder Oberflächenmodifizierung von Gegenständen im Vakuum mittels eines Plasmas |
JP4097893B2 (ja) * | 2000-12-05 | 2008-06-11 | 株式会社エフ・ティ・エスコーポレーション | 対向ターゲット式スパッタ方法及び導電性膜の形成方法 |
SE525231C2 (sv) * | 2001-06-14 | 2005-01-11 | Chemfilt R & D Ab | Förfarande och anordning för att alstra plasma |
US7247221B2 (en) * | 2002-05-17 | 2007-07-24 | Applied Films Corporation | System and apparatus for control of sputter deposition process |
US7993773B2 (en) | 2002-08-09 | 2011-08-09 | Infinite Power Solutions, Inc. | Electrochemical apparatus with barrier layer protected substrate |
US20070264564A1 (en) | 2006-03-16 | 2007-11-15 | Infinite Power Solutions, Inc. | Thin film battery on an integrated circuit or circuit board and method thereof |
DE10347521A1 (de) * | 2002-12-04 | 2004-06-24 | Leybold Optics Gmbh | Verfahren zur Herstellung Multilayerschicht und Vorrichtung zur Durchführung des Verfahrens |
SE0303136D0 (sv) * | 2003-11-24 | 2003-11-24 | Chemfilt R & D Ab | Method and apparatus for reactive soilid-gas-plasma deposition |
US7095179B2 (en) * | 2004-02-22 | 2006-08-22 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
US7663319B2 (en) * | 2004-02-22 | 2010-02-16 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
US9123508B2 (en) * | 2004-02-22 | 2015-09-01 | Zond, Llc | Apparatus and method for sputtering hard coatings |
US20060278524A1 (en) * | 2005-06-14 | 2006-12-14 | Stowell Michael W | System and method for modulating power signals to control sputtering |
US7842355B2 (en) | 2005-11-01 | 2010-11-30 | Applied Materials, Inc. | System and method for modulation of power and power related functions of PECVD discharge sources to achieve new film properties |
US20070095281A1 (en) * | 2005-11-01 | 2007-05-03 | Stowell Michael W | System and method for power function ramping of microwave liner discharge sources |
DE102006020290B4 (de) * | 2006-04-27 | 2010-04-15 | Ipt Ionen- Und Plasmatechnik Gmbh | Plasmaquelle |
JP5178832B2 (ja) * | 2007-07-25 | 2013-04-10 | ジーエス ナノテク カンパニー リミテッド | 非電導性ターゲットを使用するスパッタリングによるセラミック薄膜の成膜方法 |
US8518581B2 (en) | 2008-01-11 | 2013-08-27 | Inifinite Power Solutions, Inc. | Thin film encapsulation for thin film batteries and other devices |
JP5193232B2 (ja) * | 2008-01-24 | 2013-05-08 | 株式会社アルバック | 液晶表示装置の製造方法 |
US9856558B2 (en) * | 2008-03-14 | 2018-01-02 | Applied Materials, Inc. | Physical vapor deposition method with a source of isotropic ion velocity distribution at the wafer surface |
WO2010127845A1 (en) * | 2009-05-07 | 2010-11-11 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for the production of oxide and nitride coatings and its use |
DE102009053756B4 (de) * | 2009-06-26 | 2011-07-21 | VON ARDENNE Anlagentechnik GmbH, 01324 | Verfahren zur Beschichtung eines Substrates in einer Vakuumkammer mit mindestens einem rotierenden Magnetron |
KR101073557B1 (ko) * | 2009-11-24 | 2011-10-14 | 삼성모바일디스플레이주식회사 | 스퍼터링 장치 |
CN102947976B (zh) | 2010-06-07 | 2018-03-16 | 萨普拉斯特研究有限责任公司 | 可充电、高密度的电化学设备 |
US10699885B2 (en) | 2014-08-29 | 2020-06-30 | Bühler AG | Dual power feed rotary sputtering cathode |
US10468238B2 (en) * | 2015-08-21 | 2019-11-05 | Applied Materials, Inc. | Methods and apparatus for co-sputtering multiple targets |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3461054A (en) * | 1966-03-24 | 1969-08-12 | Bell Telephone Labor Inc | Cathodic sputtering from a cathodically biased target electrode having an rf potential superimposed on the cathodic bias |
US3617459A (en) * | 1967-09-15 | 1971-11-02 | Ibm | Rf sputtering method and apparatus for producing insulating films of varied physical properties |
US3630881A (en) * | 1970-01-22 | 1971-12-28 | Ibm | Cathode-target assembly for rf sputtering apparatus |
US3679571A (en) * | 1970-10-12 | 1972-07-25 | Bendix Corp | R-f sputtering apparatus |
US3767551A (en) * | 1971-11-01 | 1973-10-23 | Varian Associates | Radio frequency sputter apparatus and method |
US4166783A (en) * | 1978-04-17 | 1979-09-04 | Varian Associates, Inc. | Deposition rate regulation by computer control of sputtering systems |
DE2909804A1 (de) * | 1979-03-13 | 1980-09-18 | Siemens Ag | Verfahren zum herstellen duenner, dotierter metallschichten durch reaktives aufstaeuben |
DE3140675A1 (de) * | 1980-10-14 | 1982-06-16 | Branson International Plasma Corp., 94544 Hayward, Calif. | Verfahren und gasgemisch zum aetzen von aluminium |
US4424101A (en) * | 1980-11-06 | 1984-01-03 | The Perkin-Elmer Corp. | Method of depositing doped refractory metal silicides using DC magnetron/RF diode mode co-sputtering techniques |
DE3331707A1 (de) * | 1983-09-02 | 1985-03-21 | Leybold-Heraeus GmbH, 5000 Köln | Verfahren und vorrichtung zum reaktiven aufstaeuben von verbindungen von metallen und halbleitern |
JPS6127462A (ja) * | 1984-07-16 | 1986-02-06 | 松下電器産業株式会社 | ヒ−トポンプ式空気調和機の日射遮蔽装置 |
DE3511141A1 (de) * | 1985-03-27 | 1986-10-23 | Siemens AG, 1000 Berlin und 8000 München | Ionenstrahl-materialbearbeitungsanlage mit neutralisationseinrichtung |
JPS62287071A (ja) * | 1986-06-06 | 1987-12-12 | Tadahiro Omi | 薄膜の形成装置および形成方法 |
JPS6342367A (ja) * | 1986-08-07 | 1988-02-23 | Fujitsu Ltd | スパツタリング方法 |
US4719154A (en) * | 1986-09-17 | 1988-01-12 | Eastman Kodak Company | Magneto-optic recording element with amorphous aluminum-nitrogen alloy layer |
JPS63140077A (ja) * | 1986-12-03 | 1988-06-11 | Sanyo Shinku Kogyo Kk | 誘電体薄膜の製造方法とその装置 |
-
1988
- 1988-06-23 DE DE3821207A patent/DE3821207A1/de not_active Withdrawn
- 1988-09-28 US US07/250,381 patent/US4931169A/en not_active Expired - Fee Related
-
1989
- 1989-05-05 EP EP19890108113 patent/EP0347567A3/de not_active Withdrawn
- 1989-06-22 JP JP1158479A patent/JPH0254764A/ja active Pending
- 1989-06-23 KR KR1019890008711A patent/KR900000500A/ko not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100368200B1 (ko) * | 1999-07-27 | 2003-01-24 | 마츠시다 덴코 가부시키가이샤 | 플라즈마 생성용 전극, 그 전극을 사용하는 플라즈마 처리장치, 및 그 장치로 플라즈마 처리하는 방법 |
Also Published As
Publication number | Publication date |
---|---|
EP0347567A2 (de) | 1989-12-27 |
DE3821207A1 (de) | 1989-12-28 |
JPH0254764A (ja) | 1990-02-23 |
US4931169A (en) | 1990-06-05 |
EP0347567A3 (de) | 1991-07-17 |
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