KR20040068595A - 고순도 니켈 또는 니켈 합금 타겟트 및 그 제조방법 - Google Patents
고순도 니켈 또는 니켈 합금 타겟트 및 그 제조방법 Download PDFInfo
- Publication number
- KR20040068595A KR20040068595A KR10-2004-7009389A KR20047009389A KR20040068595A KR 20040068595 A KR20040068595 A KR 20040068595A KR 20047009389 A KR20047009389 A KR 20047009389A KR 20040068595 A KR20040068595 A KR 20040068595A
- Authority
- KR
- South Korea
- Prior art keywords
- nickel
- target
- nickel alloy
- uniformity
- film
- Prior art date
Links
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 title claims abstract description 121
- 229910052759 nickel Inorganic materials 0.000 title claims abstract description 64
- 229910000990 Ni alloy Inorganic materials 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title description 21
- 238000001755 magnetron sputter deposition Methods 0.000 claims abstract description 34
- 238000004519 manufacturing process Methods 0.000 claims abstract description 21
- 230000035699 permeability Effects 0.000 claims abstract description 19
- 238000005242 forging Methods 0.000 claims description 17
- 238000005096 rolling process Methods 0.000 claims description 16
- 238000005097 cold rolling Methods 0.000 claims description 9
- 238000010438 heat treatment Methods 0.000 claims description 4
- 238000000137 annealing Methods 0.000 claims description 2
- 230000005291 magnetic effect Effects 0.000 abstract description 20
- 239000010408 film Substances 0.000 description 59
- 239000000523 sample Substances 0.000 description 21
- 239000012528 membrane Substances 0.000 description 17
- 238000004544 sputter deposition Methods 0.000 description 15
- 238000005259 measurement Methods 0.000 description 11
- 239000002994 raw material Substances 0.000 description 10
- 230000000052 comparative effect Effects 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 238000010894 electron beam technology Methods 0.000 description 8
- 239000000463 material Substances 0.000 description 7
- 230000008018 melting Effects 0.000 description 7
- 238000002844 melting Methods 0.000 description 7
- 150000002815 nickel Chemical class 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 230000002159 abnormal effect Effects 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- 238000005336 cracking Methods 0.000 description 5
- 239000013078 crystal Substances 0.000 description 5
- 230000002349 favourable effect Effects 0.000 description 5
- 230000003647 oxidation Effects 0.000 description 5
- 238000007254 oxidation reaction Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000006698 induction Effects 0.000 description 4
- 229910052748 manganese Inorganic materials 0.000 description 4
- 239000011572 manganese Substances 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 239000003302 ferromagnetic material Substances 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 229910001000 nickel titanium Inorganic materials 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000002459 sustained effect Effects 0.000 description 3
- 229910000914 Mn alloy Inorganic materials 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- ZAUUZASCMSWKGX-UHFFFAOYSA-N manganese nickel Chemical compound [Mn].[Ni] ZAUUZASCMSWKGX-UHFFFAOYSA-N 0.000 description 2
- 229910021332 silicide Inorganic materials 0.000 description 2
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 2
- 238000005477 sputtering target Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229920013633 Fortron Polymers 0.000 description 1
- 239000004738 Fortron® Substances 0.000 description 1
- 229910017709 Ni Co Inorganic materials 0.000 description 1
- 229910003267 Ni-Co Inorganic materials 0.000 description 1
- 229910003286 Ni-Mn Inorganic materials 0.000 description 1
- 229910003262 Ni‐Co Inorganic materials 0.000 description 1
- 229910018487 Ni—Cr Inorganic materials 0.000 description 1
- 229910018559 Ni—Nb Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000005275 alloying Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000015271 coagulation Effects 0.000 description 1
- 238000005345 coagulation Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 239000002902 ferrimagnetic material Substances 0.000 description 1
- 230000005294 ferromagnetic effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- KHYBPSFKEHXSLX-UHFFFAOYSA-N iminotitanium Chemical compound [Ti]=N KHYBPSFKEHXSLX-UHFFFAOYSA-N 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007779 soft material Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C19/00—Alloys based on nickel or cobalt
- C22C19/03—Alloys based on nickel or cobalt based on nickel
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/10—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of nickel or cobalt or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/851—Coating a support with a magnetic layer by sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/18—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
- H01F41/183—Sputtering targets therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Power Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Thermal Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
Claims (7)
- 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트로서, 이 타겟트의 투자율이 100 이상인 것을 특징으로 하는 스퍼터 막의 유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트
- 제1항에 있어서, 평균 결정 입경의 5배 이상으로 입성장한 조대 결정립을 포함하지 않는 것을 특징으로 하는 스퍼터 막의 유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트
- 순도가 4N5(99.995 중량%) 이상인 고순도 니켈 또는 니켈 합금을 열간 단조한 후, 30% 이상의 압연율로 냉간 압연하고, 이것을 다시 300℃ 이상의 온도에서 재결정시킨 열처리 공정으로 이루어지며, 상기 냉간 압연과 열처리를 적어도 2회 이상 반복하는 것을 특징으로 하는 타겟트의 투자율이 100 이상이며, 스퍼터 막의 유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트의 제조방법
- 제3항에 있어서, 순도가 5N(99.999 중량%) 이상인 것을 특징으로 하는 스퍼터 막의유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트의 제조방법
- 제3항 또는 제4항에 있어서, 고순도 니켈 또는 니켈 합금의 열간 단조 시에, 반죽 단조하는 것을 특징으로 하는 스퍼터 막의 유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트의 제조방법
- 제3항 내지 제5항 중 어느 한 항에 있어서, 평균 결정 입경의 5배 이상으로 입성장한 조대 결정립을 포함하지 않는 것을 특징으로 하는 스퍼터 막의 유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트의 제조방법
- 제3항 내지 제6항 중 어느 한 항에 있어서, 최종적으로 300℃ 이상 600℃ 미만의 온도에서 풀 아니링 하는 것을 특징으로 하는 스퍼터 막의 유니포미티가 우수한 마그네트론 스퍼터링용 고순도 니켈 또는 니켈 합금 타겟트의 제조방법
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002009981A JP4376487B2 (ja) | 2002-01-18 | 2002-01-18 | 高純度ニッケル合金ターゲットの製造方法 |
JPJP-P-2002-00009981 | 2002-01-18 | ||
PCT/JP2002/012438 WO2003062487A1 (fr) | 2002-01-18 | 2002-11-28 | Cible en nickel ou alliage de nickel haute purete et son procede de production |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040068595A true KR20040068595A (ko) | 2004-07-31 |
KR100600974B1 KR100600974B1 (ko) | 2006-07-13 |
Family
ID=27605983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020047009389A KR100600974B1 (ko) | 2002-01-18 | 2002-11-28 | 고순도 니켈 또는 니켈 합금 타겟트 및 그 제조방법 |
Country Status (8)
Country | Link |
---|---|
US (2) | US7740718B2 (ko) |
EP (1) | EP1467000B1 (ko) |
JP (1) | JP4376487B2 (ko) |
KR (1) | KR100600974B1 (ko) |
CN (1) | CN1314832C (ko) |
DE (1) | DE60235838D1 (ko) |
TW (1) | TW583328B (ko) |
WO (1) | WO2003062487A1 (ko) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7435325B2 (en) * | 2001-08-01 | 2008-10-14 | Nippon Mining & Metals Co., Ltd | Method for producing high purity nickle, high purity nickle, sputtering target comprising the high purity nickel, and thin film formed by using said spattering target |
CN100396812C (zh) * | 2001-12-19 | 2008-06-25 | 日矿金属株式会社 | 连接磁性靶和背衬板的方法以及磁性靶 |
JP4376487B2 (ja) * | 2002-01-18 | 2009-12-02 | 日鉱金属株式会社 | 高純度ニッケル合金ターゲットの製造方法 |
JP4466902B2 (ja) * | 2003-01-10 | 2010-05-26 | 日鉱金属株式会社 | ニッケル合金スパッタリングターゲット |
KR100773238B1 (ko) * | 2003-10-07 | 2007-11-02 | 닛코킨조쿠 가부시키가이샤 | 고순도 Ni―V 합금, 동Ni―V 합금으로 이루어진타겟트 및 동Ni―V 합금 박막과 고순도 Ni―V 합금의제조방법 |
JP4271684B2 (ja) * | 2003-10-24 | 2009-06-03 | 日鉱金属株式会社 | ニッケル合金スパッタリングターゲット及びニッケル合金薄膜 |
US20050236076A1 (en) * | 2003-12-22 | 2005-10-27 | Michaluk Christopher A | High integrity sputtering target material and method for producing bulk quantities of same |
KR101021488B1 (ko) * | 2004-03-01 | 2011-03-16 | Jx닛코 닛세끼 킨조쿠 가부시키가이샤 | 니켈-플라티늄 합금 및 동(同) 합금 타겟트 |
EP1813694B1 (en) * | 2004-11-15 | 2018-06-20 | JX Nippon Mining & Metals Corporation | Sputtering target for production of metallic glass film and process for producing the same |
CN100551503C (zh) * | 2004-11-15 | 2009-10-21 | 日矿金属株式会社 | 氢分离膜、氢分离膜形成用溅射靶及其制造方法 |
AT506547B1 (de) | 2006-03-07 | 2013-02-15 | Cabot Corp | Verfahren zur erzeugung verformter metallgegenstände |
US20090028744A1 (en) * | 2007-07-23 | 2009-01-29 | Heraeus, Inc. | Ultra-high purity NiPt alloys and sputtering targets comprising same |
JP2009167530A (ja) * | 2009-02-10 | 2009-07-30 | Nippon Mining & Metals Co Ltd | ニッケル合金スパッタリングターゲット及びニッケルシリサイド膜 |
US9051645B2 (en) * | 2009-04-17 | 2015-06-09 | Jx Nippon Mining & Metals Corporation | Barrier film for semiconductor wiring, sintered compact sputtering target and method of producing the sputtering target |
US9249497B2 (en) | 2010-03-19 | 2016-02-02 | Jx Nippon Mining & Metals Corporation | Ni alloy sputtering target, Ni alloy thin film and Ni silicide film |
JP5951599B2 (ja) * | 2011-04-18 | 2016-07-13 | 株式会社東芝 | 高純度Niスパッタリングターゲットおよびその製造方法 |
CN102864421A (zh) * | 2011-07-05 | 2013-01-09 | 北京有色金属研究总院 | 一种细晶高纯镍靶材制造方法 |
CN102400073A (zh) * | 2011-11-18 | 2012-04-04 | 宁波江丰电子材料有限公司 | 镍靶坯及靶材的制造方法 |
CN102418058A (zh) * | 2011-12-02 | 2012-04-18 | 宁波江丰电子材料有限公司 | 镍靶坯及靶材的制造方法 |
WO2014007151A1 (ja) * | 2012-07-04 | 2014-01-09 | Jx日鉱日石金属株式会社 | スパッタリングターゲット |
JP5958183B2 (ja) * | 2012-08-27 | 2016-07-27 | 三菱マテリアル株式会社 | Ni又はNi合金スパッタリングターゲット及びその製造方法 |
CN104726829A (zh) * | 2013-12-18 | 2015-06-24 | 有研亿金新材料股份有限公司 | 一种高纯NiPt合金靶材及其制备方法 |
EP3106540B1 (en) | 2014-03-27 | 2018-04-25 | JX Nippon Mining & Metals Corp. | Method of producing a ni-p alloy or a ni-pt-p alloy sputtering target |
CN104190885B (zh) * | 2014-08-28 | 2016-06-01 | 云南钛业股份有限公司 | 一种四枪电子束冷床炉生产巨型高纯镍锭方坯的方法 |
JP6459601B2 (ja) * | 2015-02-17 | 2019-01-30 | 三菱マテリアル株式会社 | Niスパッタリングターゲット |
CN105861999B (zh) * | 2016-04-05 | 2018-08-07 | 基迈克材料科技(苏州)有限公司 | 高纯细晶金属镍热挤压旋转靶材 |
CN105734507B (zh) * | 2016-04-05 | 2018-06-19 | 基迈克材料科技(苏州)有限公司 | 成膜均匀的细晶镍合金旋转靶材及其热挤压优化制备方法 |
CN114657345B (zh) * | 2022-03-31 | 2024-04-09 | 先导薄膜材料(广东)有限公司 | 铁靶材、铁镍合金靶材以及靶材的晶粒细化方法 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61113759A (ja) * | 1984-11-09 | 1986-05-31 | Matsushita Electric Ind Co Ltd | スパツタリング用タ−ゲツト |
DE3712271A1 (de) * | 1987-04-10 | 1988-10-27 | Vacuumschmelze Gmbh | Nickelbasis-lot fuer hochtemperatur-loetverbindungen |
KR950013191B1 (ko) * | 1990-06-29 | 1995-10-25 | 가부시키가이샤 도시바 | Fe-Ni계 합금 |
JPH06104120A (ja) * | 1992-08-03 | 1994-04-15 | Hitachi Metals Ltd | 磁気記録媒体用スパッタリングターゲットおよびその製造方法 |
TW271490B (ko) * | 1993-05-05 | 1996-03-01 | Varian Associates | |
JPH07145451A (ja) * | 1993-11-24 | 1995-06-06 | Daido Steel Co Ltd | リードフレーム用Fe−Ni合金及びリードフレーム用薄板 |
JPH08311642A (ja) * | 1995-03-10 | 1996-11-26 | Toshiba Corp | マグネトロンスパッタリング法及びスパッタリングターゲット |
JPH09157843A (ja) * | 1995-11-30 | 1997-06-17 | Matsushita Electric Ind Co Ltd | スパッタリング装置 |
US5964966A (en) * | 1997-09-19 | 1999-10-12 | Lockheed Martin Energy Research Corporation | Method of forming biaxially textured alloy substrates and devices thereon |
US6086725A (en) * | 1998-04-02 | 2000-07-11 | Applied Materials, Inc. | Target for use in magnetron sputtering of nickel for forming metallization films having consistent uniformity through life |
JPH11335821A (ja) * | 1998-05-20 | 1999-12-07 | Japan Energy Corp | 磁性薄膜形成用Ni−Fe合金スパッタリングターゲット、磁性薄膜および磁性薄膜形成用Ni−Fe合金スパッタリングターゲットの製造方法 |
US6342114B1 (en) * | 1999-03-31 | 2002-01-29 | Praxair S.T. Technology, Inc. | Nickel/vanadium sputtering target with ultra-low alpha emission |
IE20000425A1 (en) * | 1999-08-19 | 2001-03-07 | Praxair Technology Inc | Low permeability non-planar ferromagnetic sputter targets |
JP2001099060A (ja) * | 1999-10-04 | 2001-04-10 | Fuji Koki Corp | 可変容量型圧縮機用制御弁 |
US6190516B1 (en) * | 1999-10-06 | 2001-02-20 | Praxair S.T. Technology, Inc. | High magnetic flux sputter targets with varied magnetic permeability in selected regions |
WO2001094660A2 (en) | 2000-06-02 | 2001-12-13 | Honeywell International Inc. | Sputtering target |
US7435325B2 (en) * | 2001-08-01 | 2008-10-14 | Nippon Mining & Metals Co., Ltd | Method for producing high purity nickle, high purity nickle, sputtering target comprising the high purity nickel, and thin film formed by using said spattering target |
JP4376487B2 (ja) * | 2002-01-18 | 2009-12-02 | 日鉱金属株式会社 | 高純度ニッケル合金ターゲットの製造方法 |
JP4466902B2 (ja) * | 2003-01-10 | 2010-05-26 | 日鉱金属株式会社 | ニッケル合金スパッタリングターゲット |
KR100773238B1 (ko) * | 2003-10-07 | 2007-11-02 | 닛코킨조쿠 가부시키가이샤 | 고순도 Ni―V 합금, 동Ni―V 합금으로 이루어진타겟트 및 동Ni―V 합금 박막과 고순도 Ni―V 합금의제조방법 |
JP4271684B2 (ja) * | 2003-10-24 | 2009-06-03 | 日鉱金属株式会社 | ニッケル合金スパッタリングターゲット及びニッケル合金薄膜 |
KR101021488B1 (ko) * | 2004-03-01 | 2011-03-16 | Jx닛코 닛세끼 킨조쿠 가부시키가이샤 | 니켈-플라티늄 합금 및 동(同) 합금 타겟트 |
-
2002
- 2002-01-18 JP JP2002009981A patent/JP4376487B2/ja not_active Expired - Lifetime
- 2002-11-28 EP EP02788679A patent/EP1467000B1/en not_active Expired - Lifetime
- 2002-11-28 WO PCT/JP2002/012438 patent/WO2003062487A1/ja active Application Filing
- 2002-11-28 US US10/498,147 patent/US7740718B2/en not_active Expired - Lifetime
- 2002-11-28 DE DE60235838T patent/DE60235838D1/de not_active Expired - Lifetime
- 2002-11-28 KR KR1020047009389A patent/KR100600974B1/ko active IP Right Grant
- 2002-11-28 CN CNB028271947A patent/CN1314832C/zh not_active Expired - Lifetime
- 2002-12-05 TW TW091135263A patent/TW583328B/zh not_active IP Right Cessation
-
2006
- 2006-01-13 US US11/332,045 patent/US7618505B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CN1314832C (zh) | 2007-05-09 |
DE60235838D1 (de) | 2010-05-12 |
US7618505B2 (en) | 2009-11-17 |
JP4376487B2 (ja) | 2009-12-02 |
KR100600974B1 (ko) | 2006-07-13 |
TW200302289A (en) | 2003-08-01 |
US7740718B2 (en) | 2010-06-22 |
US20040256035A1 (en) | 2004-12-23 |
JP2003213406A (ja) | 2003-07-30 |
EP1467000A4 (en) | 2008-05-21 |
EP1467000A1 (en) | 2004-10-13 |
CN1615374A (zh) | 2005-05-11 |
TW583328B (en) | 2004-04-11 |
EP1467000B1 (en) | 2010-03-31 |
US20060137782A1 (en) | 2006-06-29 |
WO2003062487A1 (fr) | 2003-07-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100600974B1 (ko) | 고순도 니켈 또는 니켈 합금 타겟트 및 그 제조방법 | |
US6176944B1 (en) | Method of making low magnetic permeability cobalt sputter targets | |
TW200523376A (en) | Tantalum sputtering target | |
EP1034316B1 (en) | High purity cobalt sputter target and process of manufacturing the same | |
JP2003003256A (ja) | マンガン合金スパッタリングターゲット及びその製造方法 | |
CN104018128A (zh) | 一种镍铂合金溅射靶材及其制备方法 | |
KR20150114584A (ko) | 스퍼터링용 티탄 타깃 | |
JP4006620B2 (ja) | 高純度ニッケルターゲットの製造方法及び高純度ニッケルターゲット | |
US20020003009A1 (en) | Wrought processing of brittle target alloy for sputtering applications | |
JP4582465B2 (ja) | 高純度ニッケル又はニッケル合金ターゲット及びその製造方法 | |
JP2003213405A (ja) | 高純度ニッケル又はニッケル合金ターゲット及びその製造方法 | |
JP5113100B2 (ja) | 高純度ニッケル合金ターゲット | |
JP5958183B2 (ja) | Ni又はNi合金スパッタリングターゲット及びその製造方法 | |
JP4698779B2 (ja) | 磁性体スパッタリングターゲット及びその製造方法 | |
JP6384523B2 (ja) | Ni又はNi合金スパッタリングターゲット | |
JP2002069626A (ja) | スパッタリングターゲットおよびその製造方法 | |
JP6791313B1 (ja) | ニッケル合金スパッタリングターゲット | |
WO2022102765A1 (ja) | 白金系スパッタリングターゲット及びその製造方法 | |
KR20010034218A (ko) | 코발트 - 티타늄 합금 스팟터링 타겟트 및 그 제조방법 | |
TWI665325B (zh) | Tantalum sputtering target | |
TW200940447A (en) | Sintered silicon wafer | |
US20060118407A1 (en) | Methods for making low silicon content ni-si sputtering targets and targets made thereby | |
JP2000160330A (ja) | Co−Ni合金スパッタリングターゲット及びその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130621 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20140626 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20150618 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20160616 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20170616 Year of fee payment: 12 |
|
FPAY | Annual fee payment |
Payment date: 20190617 Year of fee payment: 14 |