KR102656451B1 - 전자부품 테스트용 핸들러 - Google Patents

전자부품 테스트용 핸들러 Download PDF

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Publication number
KR102656451B1
KR102656451B1 KR1020160033011A KR20160033011A KR102656451B1 KR 102656451 B1 KR102656451 B1 KR 102656451B1 KR 1020160033011 A KR1020160033011 A KR 1020160033011A KR 20160033011 A KR20160033011 A KR 20160033011A KR 102656451 B1 KR102656451 B1 KR 102656451B1
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KR
South Korea
Prior art keywords
electronic components
loading
unloading
test
buffer
Prior art date
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KR1020160033011A
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English (en)
Korean (ko)
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KR20170108703A (ko
Inventor
노종기
윤광희
이두길
Original Assignee
(주)테크윙
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Priority to KR1020160033011A priority Critical patent/KR102656451B1/ko
Application filed by (주)테크윙 filed Critical (주)테크윙
Priority to CN201710102266.0A priority patent/CN107199183B/zh
Priority to CN201910926484.5A priority patent/CN110653174B/zh
Priority to CN201910925100.8A priority patent/CN110653173B/zh
Priority to CN201910446858.3A priority patent/CN110252685B/zh
Priority to TW106107197A priority patent/TWI611195B/zh
Publication of KR20170108703A publication Critical patent/KR20170108703A/ko
Priority to KR1020230040722A priority patent/KR20230047989A/ko
Priority to KR1020230040724A priority patent/KR20230046290A/ko
Priority to KR1020230040717A priority patent/KR20230045002A/ko
Priority to KR1020240027529A priority patent/KR20240031993A/ko
Application granted granted Critical
Publication of KR102656451B1 publication Critical patent/KR102656451B1/ko

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/3412Sorting according to other particular properties according to a code applied to the object which indicates a property of the object, e.g. quality class, contents or incorrect indication
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2855Environmental, reliability or burn-in testing
    • G01R31/286External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867Handlers or transport devices, e.g. loaders, carriers, trays
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02Measures preceding sorting, e.g. arranging articles in a stream orientating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36Sorting apparatus characterised by the means used for distribution
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/06009Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking
    • G06K19/06018Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking one-dimensional coding
    • G06K19/06028Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code with optically detectable marking one-dimensional coding using bar codes
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/10Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
    • G06K7/10009Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06KGRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/10Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
    • G06K2007/10485Arrangement of optical elements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • General Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR1020160033011A 2016-03-18 2016-03-18 전자부품 테스트용 핸들러 KR102656451B1 (ko)

Priority Applications (10)

Application Number Priority Date Filing Date Title
KR1020160033011A KR102656451B1 (ko) 2016-03-18 2016-03-18 전자부품 테스트용 핸들러
CN201910926484.5A CN110653174B (zh) 2016-03-18 2017-02-24 电子部件测试用分选机
CN201910925100.8A CN110653173B (zh) 2016-03-18 2017-02-24 电子部件测试用分选机
CN201910446858.3A CN110252685B (zh) 2016-03-18 2017-02-24 电子部件测试用分选机
CN201710102266.0A CN107199183B (zh) 2016-03-18 2017-02-24 电子部件测试用分选机
TW106107197A TWI611195B (zh) 2016-03-18 2017-03-06 電子部件測試用分選機
KR1020230040722A KR20230047989A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040724A KR20230046290A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040717A KR20230045002A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020240027529A KR20240031993A (ko) 2016-03-18 2024-02-26 전자부품 테스트용 핸들러

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160033011A KR102656451B1 (ko) 2016-03-18 2016-03-18 전자부품 테스트용 핸들러

Related Child Applications (3)

Application Number Title Priority Date Filing Date
KR1020230040722A Division KR20230047989A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040717A Division KR20230045002A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040724A Division KR20230046290A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러

Publications (2)

Publication Number Publication Date
KR20170108703A KR20170108703A (ko) 2017-09-27
KR102656451B1 true KR102656451B1 (ko) 2024-04-12

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Family Applications (5)

Application Number Title Priority Date Filing Date
KR1020160033011A KR102656451B1 (ko) 2016-03-18 2016-03-18 전자부품 테스트용 핸들러
KR1020230040717A KR20230045002A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040724A KR20230046290A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040722A KR20230047989A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020240027529A KR20240031993A (ko) 2016-03-18 2024-02-26 전자부품 테스트용 핸들러

Family Applications After (4)

Application Number Title Priority Date Filing Date
KR1020230040717A KR20230045002A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040724A KR20230046290A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020230040722A KR20230047989A (ko) 2016-03-18 2023-03-28 전자부품 테스트용 핸들러
KR1020240027529A KR20240031993A (ko) 2016-03-18 2024-02-26 전자부품 테스트용 핸들러

Country Status (3)

Country Link
KR (5) KR102656451B1 (zh)
CN (4) CN110653174B (zh)
TW (1) TWI611195B (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102432981B1 (ko) * 2017-11-03 2022-08-18 (주)테크윙 전자부품의 테스트를 지원하는 핸들러용 픽킹장치
EP3502020B1 (en) * 2017-12-19 2020-06-10 Fives Intralogistics S.p.A. Con Socio Unico Sorting machine
KR102549942B1 (ko) * 2018-04-09 2023-07-03 (주)테크윙 전자부품 처리용 핸들러의 바코드 인식장치
KR20190124132A (ko) * 2018-04-25 2019-11-04 (주)테크윙 전자부품 테스트용 핸들러
KR102581147B1 (ko) * 2018-07-12 2023-09-25 (주)테크윙 전자부품 재배치장치
KR102631908B1 (ko) * 2018-08-21 2024-01-31 (주)테크윙 핸들러 및 이를 포함하는 오토메이션 시스템
KR102663462B1 (ko) * 2018-11-07 2024-05-09 (주)테크윙 핸들러
KR20200071357A (ko) * 2018-12-11 2020-06-19 (주)테크윙 전자부품 테스트용 핸들러
KR102249304B1 (ko) 2019-04-15 2021-05-07 주식회사 아테코 플라잉 스캔 기능을 갖는 전자부품 테스트 핸들러
KR20200144385A (ko) * 2019-06-18 2020-12-29 (주)제이티 소자핸들러 및 그에 사용되는 디지털코드 인식 시스템
CN112642752B (zh) * 2019-10-10 2024-05-24 泰克元有限公司 电子部件处理用分选机
CN111220892A (zh) * 2020-03-04 2020-06-02 长江存储科技有限责任公司 组件测试方法及其结构
KR20210156053A (ko) * 2020-06-17 2021-12-24 (주)테크윙 전자부품 테스트용 핸들링시스템
JP2022021241A (ja) * 2020-07-21 2022-02-02 株式会社アドバンテスト 電子部品ハンドリング装置及び電子部品試験装置
CN114472191A (zh) * 2020-11-12 2022-05-13 泰克元有限公司 电子部件处理用分选机及确认插入件是否存在缺陷的方法
KR20220113097A (ko) * 2021-02-05 2022-08-12 (주)테크윙 전자부품 테스트용 핸들러
KR102670188B1 (ko) * 2021-06-11 2024-05-29 주식회사 케이아이 Pba 자동 검사 장치

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100876292B1 (ko) 2007-08-23 2008-12-31 에버테크노 주식회사 에스에스디(ssd) 테스트 핸들러
JP2014020985A (ja) * 2012-07-20 2014-02-03 Seiko Epson Corp 電子部品搬送装置および電子部品検査装置
KR101391704B1 (ko) * 2012-10-24 2014-05-30 한미반도체 주식회사 반도체 패키지 핸들러 및 그 운용방법

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5845002A (en) * 1994-11-03 1998-12-01 Sunkist Growers, Inc. Method and apparatus for detecting surface features of translucent objects
US7161175B2 (en) * 1997-09-30 2007-01-09 Jeng-Jye Shau Inter-dice signal transfer methods for integrated circuits
JP2000329809A (ja) * 1999-05-17 2000-11-30 Advantest Corp 電子部品基板の試験装置および試験方法
KR100487066B1 (ko) * 2000-10-20 2005-05-03 미래산업 주식회사 핸들러용 트레이 다중 적재장치
CN1954202A (zh) * 2004-06-08 2007-04-25 株式会社爱德万测试 图像传感器用试验装置
KR100560729B1 (ko) * 2005-03-22 2006-03-14 미래산업 주식회사 반도체 소자 테스트용 핸들러
US7700891B2 (en) * 2005-03-30 2010-04-20 Delta Design, Inc. Process for handling semiconductor devices and transport media in automated sorting equipment
WO2007007406A1 (ja) * 2005-07-13 2007-01-18 Advantest Corporation 電子部品試験装置
US7973259B2 (en) * 2007-05-25 2011-07-05 Asm Assembly Automation Ltd System for testing and sorting electronic components
KR100914219B1 (ko) * 2007-09-19 2009-08-27 세크론 주식회사 테스트 핸들러
KR101327455B1 (ko) * 2007-09-19 2013-11-11 세메스 주식회사 테스트 핸들러 및 그 반도체 소자 공급 배출 방법
KR101133188B1 (ko) * 2009-03-27 2012-04-09 (주)제이티 소자소팅장치 및 그 방법
JP5278122B2 (ja) * 2009-04-06 2013-09-04 ソニー株式会社 トレイ供給装置
CN102189082B (zh) * 2010-03-10 2013-06-26 鸿劲科技股份有限公司 电子元件测试分类机
KR101169406B1 (ko) * 2010-04-12 2012-08-03 (주)제이티 반도체소자 검사장치 및 반도체소자 검사방법
CN102240644A (zh) * 2010-05-11 2011-11-16 中山天贸电池有限公司 电池产品测试分选机和测试分选机的分选方法
JP2012039001A (ja) * 2010-08-10 2012-02-23 Renesas Electronics Corp 半導体装置
KR20120027580A (ko) * 2010-09-13 2012-03-22 삼성전자주식회사 반도체 장치용 테스트 핸들러 및 이를 이용한 반도체 장치 테스트 방법
JP2014508944A (ja) * 2011-03-21 2014-04-10 ユニバーシティ・オブ・ウィンザー 電子部品を自動試験/検証するための装置
KR101205950B1 (ko) * 2011-04-29 2012-11-28 미래산업 주식회사 메모리카드용 테스트 핸들러
KR101333426B1 (ko) * 2011-12-28 2013-12-02 세메스 주식회사 반도체 패키지 분류 장치
WO2014049767A1 (ja) * 2012-09-27 2014-04-03 富士機械製造株式会社 部品供給装置
TWI456213B (zh) * 2013-01-18 2014-10-11 Hon Tech Inc 電子元件作業單元、作業方法及其應用之作業設備
KR20140119243A (ko) * 2013-03-27 2014-10-10 (주)제이티 소자검사장치
KR101999623B1 (ko) * 2013-05-10 2019-07-16 (주)테크윙 반도체소자 테스트용 핸들러의 트레이 적재장치
KR102043633B1 (ko) * 2014-01-21 2019-11-13 (주)테크윙 반도체소자 테스트용 핸들러
KR101811662B1 (ko) * 2014-03-07 2017-12-26 (주)테크윙 반도체소자 테스트용 핸들러 및 반도체소자 테스트용 핸들러에서의 테스트 지원 방법

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100876292B1 (ko) 2007-08-23 2008-12-31 에버테크노 주식회사 에스에스디(ssd) 테스트 핸들러
JP2014020985A (ja) * 2012-07-20 2014-02-03 Seiko Epson Corp 電子部品搬送装置および電子部品検査装置
KR101391704B1 (ko) * 2012-10-24 2014-05-30 한미반도체 주식회사 반도체 패키지 핸들러 및 그 운용방법

Also Published As

Publication number Publication date
KR20230047989A (ko) 2023-04-10
KR20240031993A (ko) 2024-03-08
KR20170108703A (ko) 2017-09-27
CN110653174A (zh) 2020-01-07
CN110653173B (zh) 2022-04-19
CN107199183B (zh) 2019-12-10
CN110653173A (zh) 2020-01-07
CN110653174B (zh) 2022-04-12
CN110252685B (zh) 2021-09-28
KR20230045002A (ko) 2023-04-04
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