KR102070289B1 - 전기적 접속장치 - Google Patents

전기적 접속장치 Download PDF

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Publication number
KR102070289B1
KR102070289B1 KR1020180109444A KR20180109444A KR102070289B1 KR 102070289 B1 KR102070289 B1 KR 102070289B1 KR 1020180109444 A KR1020180109444 A KR 1020180109444A KR 20180109444 A KR20180109444 A KR 20180109444A KR 102070289 B1 KR102070289 B1 KR 102070289B1
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KR
South Korea
Prior art keywords
guide
floating
opening
floating guide
housing
Prior art date
Application number
KR1020180109444A
Other languages
English (en)
Korean (ko)
Other versions
KR20190039851A (ko
Inventor
타카히로 후쿠시
Original Assignee
가부시키가이샤 니혼 마이크로닉스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 가부시키가이샤 니혼 마이크로닉스 filed Critical 가부시키가이샤 니혼 마이크로닉스
Publication of KR20190039851A publication Critical patent/KR20190039851A/ko
Application granted granted Critical
Publication of KR102070289B1 publication Critical patent/KR102070289B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/91—Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46—Bases; Cases
    • H01R13/502—Bases; Cases composed of different pieces
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H01R13/629—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
KR1020180109444A 2017-10-06 2018-09-13 전기적 접속장치 KR102070289B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017196276A JP2019070562A (ja) 2017-10-06 2017-10-06 電気的接続装置
JPJP-P-2017-196276 2017-10-06

Publications (2)

Publication Number Publication Date
KR20190039851A KR20190039851A (ko) 2019-04-16
KR102070289B1 true KR102070289B1 (ko) 2020-01-28

Family

ID=66066336

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020180109444A KR102070289B1 (ko) 2017-10-06 2018-09-13 전기적 접속장치

Country Status (4)

Country Link
JP (1) JP2019070562A (zh)
KR (1) KR102070289B1 (zh)
CN (1) CN109638499B (zh)
TW (1) TWI673924B (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021095259A1 (ja) * 2019-11-15 2021-05-20 株式会社エンプラス ソケット
WO2021095261A1 (ja) * 2019-11-15 2021-05-20 株式会社エンプラス ソケット
KR102193447B1 (ko) * 2019-12-09 2020-12-21 (주)티에스이 테스트 소켓
JP2021148700A (ja) * 2020-03-23 2021-09-27 株式会社ヨコオ プローブヘッド
KR200496932Y1 (ko) * 2020-08-25 2023-06-07 주식회사 한국가스기술공사 방폭등기구 테스트 장치
CN112701516B (zh) * 2020-12-16 2022-06-07 珩星电子（连云港）股份有限公司 一种采用镀镍镀金结构具有插孔的cy43电连接器
KR102388161B1 (ko) * 2021-07-26 2022-05-17 주식회사 디케이티 기판 검사장치 및 검사방법
CN118099108A (zh) * 2022-11-28 2024-05-28 安拓锐高新测试技术（苏州）有限公司 用于集成电路的插座组件的滑动浮动基座
CN117214713B (zh) * 2023-09-19 2024-03-19 泰州圣斯泰科汽车部件有限公司 一种汽车电池传感器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002267717A (ja) * 2001-03-12 2002-09-18 Daito:Kk Ｉｃハンドラーにおける予熱部材の調整機構
KR101780935B1 (ko) 2016-03-30 2017-09-27 리노공업주식회사 검사소켓유니트

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100260459B1 (ko) * 1998-03-02 2000-07-01 정문술 반도체 소자테스트용 테스트트레이의 캐리어 모듈
JP2006331666A (ja) 2005-05-23 2006-12-07 Nec Electronics Corp Ｉｃソケット
KR101032648B1 (ko) * 2011-02-10 2011-05-06 주식회사 아이에스시테크놀러지 테스트용 소켓
KR101703688B1 (ko) * 2012-05-02 2017-02-07 리노공업주식회사 테스트 소켓
KR101585182B1 (ko) * 2014-04-28 2016-01-14 황동원 반도체 소자 테스트용 소켓장치
CN106532303A (zh) * 2015-09-10 2017-03-22 贵州航天电器股份有限公司 浮动插合电连接器
CN108738355B (zh) * 2015-11-25 2020-11-06 佛姆法克特股份有限公司 用于测试插座的浮动嵌套
CN206059718U (zh) * 2016-08-30 2017-03-29 四川永贵科技有限公司 浮动式端面接触连接器

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002267717A (ja) * 2001-03-12 2002-09-18 Daito:Kk Ｉｃハンドラーにおける予熱部材の調整機構
KR101780935B1 (ko) 2016-03-30 2017-09-27 리노공업주식회사 검사소켓유니트

Also Published As

Publication number Publication date
JP2019070562A (ja) 2019-05-09
CN109638499B (zh) 2020-11-17
CN109638499A (zh) 2019-04-16
TWI673924B (zh) 2019-10-01
KR20190039851A (ko) 2019-04-16
TW201924165A (zh) 2019-06-16

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