KR101410921B1 - 기판 프로세싱 챔버를 위한 링 조립체 - Google Patents
기판 프로세싱 챔버를 위한 링 조립체 Download PDFInfo
- Publication number
- KR101410921B1 KR101410921B1 KR1020060106775A KR20060106775A KR101410921B1 KR 101410921 B1 KR101410921 B1 KR 101410921B1 KR 1020060106775 A KR1020060106775 A KR 1020060106775A KR 20060106775 A KR20060106775 A KR 20060106775A KR 101410921 B1 KR101410921 B1 KR 101410921B1
- Authority
- KR
- South Korea
- Prior art keywords
- ring
- substrate support
- substrate
- processing chamber
- ring assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32642—Focus rings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7611—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Plasma Technology (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/444,175 | 2006-05-30 | ||
| US11/444,175 US20070283884A1 (en) | 2006-05-30 | 2006-05-30 | Ring assembly for substrate processing chamber |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20070115564A KR20070115564A (ko) | 2007-12-06 |
| KR101410921B1 true KR101410921B1 (ko) | 2014-07-02 |
Family
ID=38820589
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060106775A Active KR101410921B1 (ko) | 2006-05-30 | 2006-10-31 | 기판 프로세싱 챔버를 위한 링 조립체 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US20070283884A1 (https=) |
| JP (1) | JP2007321244A (https=) |
| KR (1) | KR101410921B1 (https=) |
| CN (2) | CN102157425B (https=) |
| TW (1) | TWI383075B (https=) |
Families Citing this family (89)
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| KR101841236B1 (ko) * | 2009-04-03 | 2018-03-22 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 rf-dc 스퍼터링과 이 프로세스의 단차 도포성 및 막 균일성을 개선하기 위한 방법 |
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| CN111584396B (zh) * | 2013-11-06 | 2023-09-01 | 应用材料公司 | 溶胶凝胶涂布的支撑环 |
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- 2006-10-31 JP JP2006296375A patent/JP2007321244A/ja active Pending
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2007
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Also Published As
| Publication number | Publication date |
|---|---|
| CN101083223B (zh) | 2011-03-30 |
| TW200743683A (en) | 2007-12-01 |
| CN101083223A (zh) | 2007-12-05 |
| US20070283884A1 (en) | 2007-12-13 |
| JP2007321244A (ja) | 2007-12-13 |
| KR20070115564A (ko) | 2007-12-06 |
| CN102157425B (zh) | 2013-06-26 |
| US20100065216A1 (en) | 2010-03-18 |
| TWI383075B (zh) | 2013-01-21 |
| CN102157425A (zh) | 2011-08-17 |
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