KR101195678B1 - 회로 기판의 검사 방법 및 검사 장치 - Google Patents

회로 기판의 검사 방법 및 검사 장치 Download PDF

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Publication number
KR101195678B1
KR101195678B1 KR1020110018835A KR20110018835A KR101195678B1 KR 101195678 B1 KR101195678 B1 KR 101195678B1 KR 1020110018835 A KR1020110018835 A KR 1020110018835A KR 20110018835 A KR20110018835 A KR 20110018835A KR 101195678 B1 KR101195678 B1 KR 101195678B1
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KR
South Korea
Prior art keywords
inspection
probe
test
terminal
contact position
Prior art date
Application number
KR1020110018835A
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English (en)
Korean (ko)
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KR20110102179A (ko
Inventor
겐고 츠찌다
게이이찌로 사사미네
Original Assignee
야마하 파인 테크 가부시키가이샤
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Application filed by 야마하 파인 테크 가부시키가이샤 filed Critical 야마하 파인 테크 가부시키가이샤
Publication of KR20110102179A publication Critical patent/KR20110102179A/ko
Application granted granted Critical
Publication of KR101195678B1 publication Critical patent/KR101195678B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020110018835A 2010-03-08 2011-03-03 회로 기판의 검사 방법 및 검사 장치 KR101195678B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010050432A JP2011185702A (ja) 2010-03-08 2010-03-08 回路基板の電気検査方法及び電気検査装置
JPJP-P-2010-050432 2010-03-08

Publications (2)

Publication Number Publication Date
KR20110102179A KR20110102179A (ko) 2011-09-16
KR101195678B1 true KR101195678B1 (ko) 2012-10-30

Family

ID=44601496

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110018835A KR101195678B1 (ko) 2010-03-08 2011-03-03 회로 기판의 검사 방법 및 검사 장치

Country Status (4)

Country Link
JP (1) JP2011185702A (zh)
KR (1) KR101195678B1 (zh)
CN (1) CN102193061B (zh)
TW (1) TWI436078B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5991034B2 (ja) * 2012-06-08 2016-09-14 日本電産リード株式会社 電気特性検出方法及び検出装置
JP5727976B2 (ja) * 2012-07-31 2015-06-03 ヤマハファインテック株式会社 プリント基板の絶縁検査装置及び絶縁検査方法
JP5797240B2 (ja) * 2013-08-12 2015-10-21 太洋工業株式会社 プリント基板検査装置
WO2018101234A1 (ja) * 2016-12-01 2018-06-07 日本電産リード株式会社 抵抗測定装置及び抵抗測定方法
CN111726942B (zh) * 2019-03-22 2024-01-12 维亚机械株式会社 钻孔加工装置及钻孔加工方法
JP7371885B2 (ja) * 2019-07-08 2023-10-31 ヤマハファインテック株式会社 電気検査装置及び保持ユニット
US11255877B2 (en) * 2020-07-17 2022-02-22 Acculogic Corporation Method and apparatus for testing printed circuit boards
CN113701637B (zh) * 2021-09-29 2024-01-30 牧德科技股份有限公司 电测治具扎针位置估算方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008261678A (ja) 2007-04-11 2008-10-30 Hioki Ee Corp 検査プローブ接触検知機構および回路基板検査装置
JP2010038691A (ja) 2008-08-04 2010-02-18 Sumitomo Electric Ind Ltd 回路基板、その製造方法、電気検査ジグ、および電気検査装置
JP2010048681A (ja) 2008-08-22 2010-03-04 Hioki Ee Corp 回路基板検査装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2718754B2 (ja) * 1989-04-17 1998-02-25 株式会社日立製作所 基板の検査方法と検査装置
JPH07212100A (ja) * 1994-01-24 1995-08-11 Okano Denki Kk プローブ装置
JP2001101637A (ja) * 1999-09-29 2001-04-13 Nitto Denko Corp 磁気ヘッドサスペンションの製造方法
JP4462732B2 (ja) * 2000-07-31 2010-05-12 富士通株式会社 プローブヘッド
JP2003172746A (ja) * 2001-12-05 2003-06-20 Micro Craft Kk プリント配線基板の検査端ユニット
JP3625813B2 (ja) * 2002-08-05 2005-03-02 マイクロクラフト株式会社 配線基板検査用の検査プローブ接触測定方法及びその装置
JP2004228332A (ja) * 2003-01-23 2004-08-12 Yamaha Fine Technologies Co Ltd 電気検査装置
DE10320925B4 (de) * 2003-05-09 2007-07-05 Atg Test Systems Gmbh & Co.Kg Verfahren zum Testen von unbestückten Leiterplatten
JP4212489B2 (ja) * 2004-02-19 2009-01-21 日置電機株式会社 回路基板検査用プロービング装置および回路基板検査装置
JP2005326371A (ja) * 2004-05-17 2005-11-24 Nidec-Read Corp 基板検査装置、基板検査方法及び検査用接触子の移動制御プログラム
JP2007121183A (ja) * 2005-10-31 2007-05-17 Hioki Ee Corp 回路基板検査装置
JP2009019907A (ja) * 2007-07-10 2009-01-29 Hioki Ee Corp 検査装置
CN101493497B (zh) * 2008-01-24 2011-04-20 中芯国际集成电路制造(上海)有限公司 一种可提高测试效率的应力迁移测试方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008261678A (ja) 2007-04-11 2008-10-30 Hioki Ee Corp 検査プローブ接触検知機構および回路基板検査装置
JP2010038691A (ja) 2008-08-04 2010-02-18 Sumitomo Electric Ind Ltd 回路基板、その製造方法、電気検査ジグ、および電気検査装置
JP2010048681A (ja) 2008-08-22 2010-03-04 Hioki Ee Corp 回路基板検査装置

Also Published As

Publication number Publication date
TWI436078B (zh) 2014-05-01
CN102193061B (zh) 2014-02-26
CN102193061A (zh) 2011-09-21
TW201142325A (en) 2011-12-01
KR20110102179A (ko) 2011-09-16
JP2011185702A (ja) 2011-09-22

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