KR101010321B1 - 데이터 저장 장치 및 데이터 저장 장치 제조 프로세스 - Google Patents
데이터 저장 장치 및 데이터 저장 장치 제조 프로세스 Download PDFInfo
- Publication number
- KR101010321B1 KR101010321B1 KR1020030015743A KR20030015743A KR101010321B1 KR 101010321 B1 KR101010321 B1 KR 101010321B1 KR 1020030015743 A KR1020030015743 A KR 1020030015743A KR 20030015743 A KR20030015743 A KR 20030015743A KR 101010321 B1 KR101010321 B1 KR 101010321B1
- Authority
- KR
- South Korea
- Prior art keywords
- memory cell
- memory
- plane
- array plane
- word line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1657—Word-line or row circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1659—Cell access
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10B61/10—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having two electrodes, e.g. diodes or MIM elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/098,903 | 2002-03-14 | ||
| US10/098,903 US6778421B2 (en) | 2002-03-14 | 2002-03-14 | Memory device array having a pair of magnetic bits sharing a common conductor line |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20030074423A KR20030074423A (ko) | 2003-09-19 |
| KR101010321B1 true KR101010321B1 (ko) | 2011-01-25 |
Family
ID=27765436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020030015743A Expired - Fee Related KR101010321B1 (ko) | 2002-03-14 | 2003-03-13 | 데이터 저장 장치 및 데이터 저장 장치 제조 프로세스 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6778421B2 (enExample) |
| EP (1) | EP1345232A3 (enExample) |
| JP (1) | JP4700259B2 (enExample) |
| KR (1) | KR101010321B1 (enExample) |
| CN (1) | CN100481551C (enExample) |
| TW (1) | TW200304142A (enExample) |
Families Citing this family (105)
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| US7800933B2 (en) * | 2005-09-28 | 2010-09-21 | Sandisk 3D Llc | Method for using a memory cell comprising switchable semiconductor memory element with trimmable resistance |
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| US20070164388A1 (en) * | 2002-12-19 | 2007-07-19 | Sandisk 3D Llc | Memory cell comprising a diode fabricated in a low resistivity, programmed state |
| US7618850B2 (en) * | 2002-12-19 | 2009-11-17 | Sandisk 3D Llc | Method of making a diode read/write memory cell in a programmed state |
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| KR100688540B1 (ko) * | 2005-03-24 | 2007-03-02 | 삼성전자주식회사 | 메모리 셀의 집적도를 향상시킨 반도체 메모리 장치 |
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| US9390790B2 (en) * | 2005-04-05 | 2016-07-12 | Nantero Inc. | Carbon based nonvolatile cross point memory incorporating carbon based diode select devices and MOSFET select devices for memory and logic applications |
| KR100699848B1 (ko) * | 2005-06-21 | 2007-03-27 | 삼성전자주식회사 | 코어 구조가 개선된 상 변화 메모리 장치 |
| KR100688553B1 (ko) * | 2005-06-22 | 2007-03-02 | 삼성전자주식회사 | 코어 사이즈를 감소시킨 반도체 메모리 장치 |
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2002
- 2002-03-14 US US10/098,903 patent/US6778421B2/en not_active Expired - Lifetime
- 2002-11-25 TW TW091134207A patent/TW200304142A/zh unknown
-
2003
- 2003-03-06 EP EP03251342A patent/EP1345232A3/en not_active Withdrawn
- 2003-03-13 KR KR1020030015743A patent/KR101010321B1/ko not_active Expired - Fee Related
- 2003-03-14 CN CNB031199720A patent/CN100481551C/zh not_active Expired - Lifetime
- 2003-03-14 JP JP2003069239A patent/JP4700259B2/ja not_active Expired - Fee Related
- 2003-10-24 US US10/692,617 patent/US6879508B2/en not_active Expired - Lifetime
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US6034882A (en) | 1998-11-16 | 2000-03-07 | Matrix Semiconductor, Inc. | Vertically stacked field programmable nonvolatile memory and method of fabrication |
| WO2000057423A1 (de) * | 1999-03-19 | 2000-09-28 | Infineon Technologies Ag | Speicherzellenanordnung und verfahren zu deren herstellung |
Also Published As
| Publication number | Publication date |
|---|---|
| US6778421B2 (en) | 2004-08-17 |
| EP1345232A3 (en) | 2004-07-28 |
| US6879508B2 (en) | 2005-04-12 |
| US20040090809A1 (en) | 2004-05-13 |
| CN1445782A (zh) | 2003-10-01 |
| US20030174530A1 (en) | 2003-09-18 |
| TW200304142A (en) | 2003-09-16 |
| JP4700259B2 (ja) | 2011-06-15 |
| EP1345232A2 (en) | 2003-09-17 |
| JP2004031914A (ja) | 2004-01-29 |
| KR20030074423A (ko) | 2003-09-19 |
| CN100481551C (zh) | 2009-04-22 |
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