KR100905685B1 - 프린트 배선판 - Google Patents
프린트 배선판 Download PDFInfo
- Publication number
- KR100905685B1 KR100905685B1 KR1020077025325A KR20077025325A KR100905685B1 KR 100905685 B1 KR100905685 B1 KR 100905685B1 KR 1020077025325 A KR1020077025325 A KR 1020077025325A KR 20077025325 A KR20077025325 A KR 20077025325A KR 100905685 B1 KR100905685 B1 KR 100905685B1
- Authority
- KR
- South Korea
- Prior art keywords
- solder
- diameter
- opening
- wiring board
- printed wiring
- Prior art date
Links
- 229910000679 solder Inorganic materials 0.000 claims abstract description 409
- 239000004020 conductor Substances 0.000 claims abstract description 101
- 238000005476 soldering Methods 0.000 claims abstract description 36
- 239000010410 layer Substances 0.000 claims description 147
- 238000000034 method Methods 0.000 claims description 34
- 239000011347 resin Substances 0.000 claims description 22
- 229920005989 resin Polymers 0.000 claims description 22
- 230000003746 surface roughness Effects 0.000 claims description 19
- 239000011229 interlayer Substances 0.000 claims description 18
- 238000007747 plating Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 238000007788 roughening Methods 0.000 claims description 7
- 238000007789 sealing Methods 0.000 claims 1
- 238000009413 insulation Methods 0.000 abstract description 13
- 239000011295 pitch Substances 0.000 description 34
- 238000012360 testing method Methods 0.000 description 12
- 239000007921 spray Substances 0.000 description 11
- 229910052751 metal Inorganic materials 0.000 description 10
- 230000015572 biosynthetic process Effects 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 238000007639 printing Methods 0.000 description 9
- 239000000758 substrate Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 230000008859 change Effects 0.000 description 7
- 230000004907 flux Effects 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000005452 bending Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 239000011800 void material Substances 0.000 description 3
- 239000012141 concentrate Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 238000004439 roughness measurement Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 description 2
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000012286 potassium permanganate Substances 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000009958 sewing Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3478—Applying solder preforms; Transferring prefabricated solder patterns
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/06—Solder feeding devices; Solder melting pans
- B23K3/0607—Solder feeding devices
- B23K3/0623—Solder feeding devices for shaped solder piece feeding, e.g. preforms, bumps, balls, pellets, droplets
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
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- H01L2224/11334—Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps
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- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
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- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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Abstract
Description
Claims (15)
- 도체 회로와 층간 수지 절연층이 상호 적층되어 이루어짐과 함께, 상이한 층에 위치하는 도체 회로들이 비아홀을 개재하여 전기적으로 접속되어 이루어지는 빌드업 배선층을 갖고, 최외층의 층간 수지 절연막과 최외층의 도체 회로 상에는 솔더 레지스트층이 형성되고, 그 솔더 레지스트층에 형성한 개구부로부터 노출되는 도체 회로의 일부를, 전자 부품을 실장하기 위한 도체 패드로서 형성하고, 그 도체 패드 상에 땜납 범프를 형성하여 이루어지는 프린트 배선판에 있어서,상기 도체 패드는 0㎛ 초과 200㎛ 이하의 피치로 배치되고,상기 땜납 범프 직경 (W) 과 상기 솔더 레지스트층에 형성한 개구부의 개구 직경 (D) 의 비 (W/D) 가 1.05 ∼ 1.26 의 범위이고,상기 개구부는, 그 상면에 있어서의 개구 직경 (D1) 이 저면에 있어서의 개구 직경 (D2) 보다 큰 테이퍼 형상으로 형성되어 있는 것을 특징으로 하는 프린트 배선판.
- 도체 회로와 층간 수지 절연층이 상호 적층되어 이루어짐과 함께, 상이한 층에 위치하는 도체 회로들이 비아홀을 개재하여 전기적으로 접속되어 이루어지는 빌드업 배선층을 갖고, 최외층의 층간 수지 절연막과 최외층의 도체 회로 상에는 솔더 레지스트층이 형성되고, 그 솔더 레지스트층에 형성한 개구부로부터 노출되는 상기 도체 회로의 일부를, 전자 부품을 실장하기 위한 도체 패드로서 형성하고, 그 도체 패드 상에 땜납 범프를 형성하여, 그 땜납 범프를 사이에 두고 전자 부품을 실장하며, 그 전자 부품과 솔더 레지스트층 사이를 언더필에 의해서 수지 봉지하여 이루어지는 프린트 배선판에 있어서,상기 도체 패드는 0㎛ 초과 200㎛ 이하의 피치로 배치되고,상기 땜납 범프 직경 (W) 과 상기 솔더 레지스트층에 형성한 개구부의 개구 직경 (D) 의 비 (W/D) 가 1.05 ∼ 1.26 의 범위이고,상기 개구부는, 그 상면에 있어서의 개구 직경 (D1) 이 저면에 있어서의 개구 직경 (D2) 보다 큰 테이퍼 형상으로 형성되어 있는 것을 특징으로 하는 프린트 배선판.
- 삭제
- 삭제
- 제 1 항 또는 제 2 항에 있어서,상기 개구부에 있어서, D1 - D2 = 5 ∼ 20㎛ 인 것을 특징으로 하는 프린트 배선판.
- 제 1 항 또는 제 2 항에 있어서,상기 솔더 레지스트층의 표면은, 적어도 전자 부품 실장 영역에 있어서 평탄화 처리가 실시되어 이루어지는 것을 특징으로 하는 프린트 배선판.
- 제 6 항에 있어서,상기 솔더 레지스트층의 평탄화된 표면은, 추가로 조화 (粗化) 처리가 실시 되어 이루어지는 것을 특징으로 하는 프린트 배선판.
- 제 6 항에 있어서,상기 솔더 레지스트층의 평탄화된 표면은, 최대 표면 거칠기가 0.8 ∼ 3.0㎛ 인 것을 특징으로 하는 프린트 배선판.
- 제 8 항에 있어서,상기 솔더 레지스트층의 조화된 표면은, 그 표면 거칠기가 상기 평탄화된 표면의 최대 표면 거칠기보다 작고, 또한 산술 평균 거칠기 (Ra) 로 0.2 ∼ 0.5㎛ 인 것을 특징으로 하는 프린트 배선판.
- 제 1 항 또는 제 2 항에 있어서,상기 도체 패드는, 최외층에 위치하는 층간 수지 절연층에 형성한 개구 내에 도금 도체를 충전 (充塡) 하여 이루어지는 필드 비아의 형태로 형성되고, 상기 층간 수지 절연층 표면에서 노출되는 필드 비아 표면의 요철량은, 층간 수지 절연층 상에 형성되는 도체 회로의 두께에 대하여 -5㎛ ∼ +5㎛ 인 것을 특징으로 하는 프린트 배선판.
- 제 1 항 또는 제 2 항에 있어서,상기 땜납 범프는, 상기 솔더 레지스트층의 개구부의 벽면에 접하고 있는 것을 특징으로 하는 프린트 배선판.
- 제 1 항 또는 제 2 항에 있어서,상기 땜납 범프는, 상기 도체 패드 상에 땜납볼을 탑재함으로써 형성되는 것을 특징으로 하는 프린트 배선판.
- 제 1 항 또는 제 2 항에 있어서,상기 도체 패드와 내층의 도체 회로를 접속하는 비어홀은, 최외층의 층간 수지 절연층에 형성한 개구부 내에 도금이 충전되어 이루어지는 것을 특징으로 하는 프린트 배선판.
- 도체 회로와 층간 수지 절연층이 서로 적층되어 이루어짐과 함께, 상이한 층에 위치하는 도체 회로들이 비아홀을 개재하여 전기적으로 접속되어 이루어지는 빌드업 배선층을 갖고, 최외층의 층간 수지 절연막과 최외층의 도체 회로 상에는 솔더 레지스트층이 형성되고, 그 솔더 레지스트층에 형성한 개구부로부터 노출되는 상기 도체 회로의 일부를 전자 부품을 실장하기 위한 도체 패드로서 형성하고, 그 도체 패드 상에 땜납 범프를 형성하여 이루어지는 프린트 배선판을 제조하는 방법에 있어서,상기 도체 패드를 0㎛ 초과 200㎛ 이하의 피치로 배치하는 공정과,상기 솔더 레지스트층에 형성한 개구부를 그 상면에 있어서의 개구 직경 (D1) 이 저면에 있어서의 개구 직경 (D2) 보다 큰 테이퍼 형상으로 형성하는 공정과,상기 솔더 레지스트층의 개구부를 개재하여 상기 도체 패턴 상에 땜납볼을 탑재하는 공정과,상기 땜납 범프 직경 (W) 과 상기 솔더 레지스트층의 개구부의 개구 직경 (D) 의 비 (W/D) 가 1.05 ∼ 1.26 이도록 상기 땜납 범프를 형성하는 공정을 포함하는 프린트 배선판의 제조 방법.
- 제 14 항에 있어서,상기 땜납볼을 탑재하는 공정은,볼 정렬용 마스크의 상방에, 그 볼 정렬용 마스크에 대향하는 개구를 구비하는 통부재를 위치시키고, 그 통부재에서 공기를 흡인함으로써 통부재 바로 아래의 볼 정렬용 마스크 상에 땜납볼을 집합시키는 공정과,상기 통부재를 수평 방향으로 이동시킴으로써, 상기 볼 정렬용 마스크의 개구를 개재하여 상기 도체 패드 상에 땜납볼을 낙하시키는 공정을 포함하는 것을 특징으로 하는 프린트 배선판의 제조 방법.
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- 2006-06-28 JP JP2007524084A patent/JP5021473B2/ja active Active
- 2006-06-28 WO PCT/JP2006/313343 patent/WO2007004658A1/ja active Application Filing
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Also Published As
Publication number | Publication date |
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KR20070116967A (ko) | 2007-12-11 |
US20110214915A1 (en) | 2011-09-08 |
US8017875B2 (en) | 2011-09-13 |
JPWO2007004658A1 (ja) | 2009-01-29 |
CN101854771A (zh) | 2010-10-06 |
EP1887846A1 (en) | 2008-02-13 |
TW200718298A (en) | 2007-05-01 |
CN101171895B (zh) | 2010-06-23 |
WO2007004658A1 (ja) | 2007-01-11 |
US8624132B2 (en) | 2014-01-07 |
TWI323624B (ko) | 2010-04-11 |
CN101171895A (zh) | 2008-04-30 |
EP1887846A4 (en) | 2010-08-11 |
US20070086147A1 (en) | 2007-04-19 |
US20100065323A1 (en) | 2010-03-18 |
US8022314B2 (en) | 2011-09-20 |
JP5021473B2 (ja) | 2012-09-05 |
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