KR100734062B1 - 영구자석박막 및 그 제조방법 - Google Patents
영구자석박막 및 그 제조방법 Download PDFInfo
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- KR100734062B1 KR100734062B1 KR1020017013400A KR20017013400A KR100734062B1 KR 100734062 B1 KR100734062 B1 KR 100734062B1 KR 1020017013400 A KR1020017013400 A KR 1020017013400A KR 20017013400 A KR20017013400 A KR 20017013400A KR 100734062 B1 KR100734062 B1 KR 100734062B1
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- 238000000034 method Methods 0.000 title claims description 23
- 229910045601 alloy Inorganic materials 0.000 claims abstract description 89
- 239000000956 alloy Substances 0.000 claims abstract description 89
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 66
- 150000002910 rare earth metals Chemical class 0.000 claims abstract description 66
- 239000010409 thin film Substances 0.000 claims abstract description 65
- 239000000758 substrate Substances 0.000 claims abstract description 62
- 229910052751 metal Inorganic materials 0.000 claims abstract description 45
- 239000002184 metal Substances 0.000 claims abstract description 45
- 238000002844 melting Methods 0.000 claims abstract description 41
- 230000008018 melting Effects 0.000 claims abstract description 41
- 239000000463 material Substances 0.000 claims abstract description 28
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 16
- 229910052726 zirconium Inorganic materials 0.000 claims abstract description 16
- 229910052804 chromium Inorganic materials 0.000 claims abstract description 14
- 229910052735 hafnium Inorganic materials 0.000 claims abstract description 14
- 229910052750 molybdenum Inorganic materials 0.000 claims abstract description 14
- 229910052758 niobium Inorganic materials 0.000 claims abstract description 14
- 229910052715 tantalum Inorganic materials 0.000 claims abstract description 14
- 229910052721 tungsten Inorganic materials 0.000 claims abstract description 14
- 229910052720 vanadium Inorganic materials 0.000 claims abstract description 14
- 239000010410 layer Substances 0.000 claims description 164
- 230000004907 flux Effects 0.000 claims description 22
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 229910052779 Neodymium Inorganic materials 0.000 claims description 4
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 4
- 239000011241 protective layer Substances 0.000 claims description 4
- 229910001172 neodymium magnet Inorganic materials 0.000 description 32
- 230000005415 magnetization Effects 0.000 description 18
- 230000000052 comparative effect Effects 0.000 description 17
- 150000001875 compounds Chemical class 0.000 description 17
- 239000010408 film Substances 0.000 description 15
- 239000013078 crystal Substances 0.000 description 13
- 238000000151 deposition Methods 0.000 description 11
- 230000008021 deposition Effects 0.000 description 11
- 239000012528 membrane Substances 0.000 description 11
- 238000010438 heat treatment Methods 0.000 description 9
- 229910000521 B alloy Inorganic materials 0.000 description 8
- 238000012545 processing Methods 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000000696 magnetic material Substances 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 238000007736 thin film deposition technique Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 238000004663 powder metallurgy Methods 0.000 description 3
- 238000005137 deposition process Methods 0.000 description 2
- IXSZQYVWNJNRAL-UHFFFAOYSA-N etoxazole Chemical compound CCOC1=CC(C(C)(C)C)=CC=C1C1N=C(C=2C(=CC=CC=2F)F)OC1 IXSZQYVWNJNRAL-UHFFFAOYSA-N 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 230000005389 magnetism Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910000976 Electrical steel Inorganic materials 0.000 description 1
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 229910018104 Ni-P Inorganic materials 0.000 description 1
- 229910018536 Ni—P Inorganic materials 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 229910001004 magnetic alloy Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910000889 permalloy Inorganic materials 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 229910000938 samarium–cobalt magnet Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
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- G—PHYSICS
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- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/64—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent
- G11B5/66—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent the record carriers consisting of several layers
- G11B5/672—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent the record carriers consisting of several layers having different compositions in a plurality of magnetic layers, e.g. layer compositions having differing elemental components or differing proportions of elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
- H01F10/14—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys containing iron or nickel
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/7368—Non-polymeric layer under the lowermost magnetic recording layer
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/8404—Processes or apparatus specially adapted for manufacturing record carriers manufacturing base layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
- H01F1/032—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials
- H01F1/04—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials metals or alloys
- H01F1/047—Alloys characterised by their composition
- H01F1/053—Alloys characterised by their composition containing rare earth metals
- H01F1/055—Alloys characterised by their composition containing rare earth metals and magnetic transition metals, e.g. SmCo5
- H01F1/057—Alloys characterised by their composition containing rare earth metals and magnetic transition metals, e.g. SmCo5 and IIIa elements, e.g. Nd2Fe14B
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- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
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- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
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- H01F41/30—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE]
- H01F41/302—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices
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Abstract
Description
시료 No. | 적층구조 | 막면내 | 막면내수직방향 | |||
Br1 (T) | HCJ (kA/m) | Br2 (T) | HcJ (kA/m) | |||
1 | 비교예 | 기판/Nd-Fe-B(1000㎚) | 0.20 | 263 | 0.61 | 509 |
2 | 실시예 | 기판/ [Ti(20㎚)/Nd-Fe-B(200㎚)]×5 | 0.25 | 422 | 0.89 | 844 |
3 | 실시예 | 기판/ [Ta(20㎚)/Nd-Fe-B(200㎚)]×5 | 0.11 | 422 | 0.88 | >1194 |
4 | 실시예 | 기판/ [Zr(20㎚)/Nd-Fe-B(200㎚)]×5 | 0.13 | 382 | 0.83 | 700 |
5 | 실시예 | 기판/ [Nb(20㎚)/Nd-Fe-B(200㎚)]×5 | 0.08 | 287 | 0.81 | 828 |
6 | 실시예 | 기판/ [Ta(5㎚)/Nd-Fe-B(200㎚)]×5 | 0.15 | 247 | 0.86 | 939 |
7 | 실시예 | 기판/ [Ta(10㎚)/Nd-Fe-B(200㎚)]×5 | 0.16 | 247 | 0.81 | >1194 |
8 | 실시예 | 기판/ [Ta(50㎚)/Nd-Fe-B(200㎚)]×5 | 0.26 | 517 | 0.89 | 812 |
9 | 비교예 | 기판/ [Ta(3㎚)/Nd-Fe-B(200㎚)]×5 | 0.16 | 247 | 0.73 | 732 |
10 | 비교예 | 기판/ [Ta(100㎚)/Nd-Fe-B(200㎚)]×5 | 0.24 | 509 | 0.76 | 708 |
11 | 비교예 | 기판/ [Ta(50㎚)/Nd-Fe-B(1000㎚) | 0.24 | 342 | 0.72 | 700 |
12 | 비교예 | 기판/ [Ta(50㎚)/Nd-Fe-B(1000㎚)/Ta(50㎚) | 0.26 | 446 | 0.75 | 708 |
13 | 비교예 | 기판/Nd-Fe-B(1000㎚)/Ta(50㎚) | 0.21 | 271 | 0.62 | 867 |
시료No. | 적층구조 | 막면내 | 막면내수직방향 | |||
Br1 (T) | HcJ (kA/m) | Br2 (T) | HcJ (kA/m) | |||
14 | 비교예 | 기판/Pr-Fe-B(1000㎚) | 0.21 | 231 | 0.65 | 485 |
15 | 실시예 | 기판/ [Ta(20㎚)/Pr-Fe-B(200㎚)]×5 | 0.16 | 478 | 0.83 | >1194 |
시료No. | 적층구조 | 열처리조건 | |
16 | 비교예 | 기판/Nd-Fe-B(1000㎚) | 600℃, 1시간 |
17 | 실시예 | 기판/[Ta(20㎚)/Nb-Fe-B(200㎚)]×5 | 600℃, 1시간 |
시료 No. | 막면내 | 막면내수직방향 | |||
Br1 (T) | HcJ (kA/m) | Br2 (T) | HcJ (kA/m) | ||
16 | 비교예 | 0.20 | 167 | 0.76 | 342 |
17 | 실시예 | 0.12 | 358 | 0.96 | 1019 |
Claims (15)
- 고융점금속층과 희토류합금자성층이 교호로 적층된 4층 이상의 적층구조를 구비한 영구자석박막에 있어서,상기 고융점금속층은, Ti, V, Cr, Zr, Nb, Mo, Hf, Ta 및 W로 되는 군에서 선택되는 적어도 1종의 재료로 형성되어, 5㎚이상 50㎚이하의 두께를 구비하고,상기 희토류합금자성층은 주된 구성상이 정방정 R2Fe14B(R은 Nd 및 Pr 중의 적어도 어느 하나)인 50㎚이상 500㎚이하의 두께를 구비하는 것을 특징으로 하는 영구자석박막.
- 제1항에 있어서,상기 희토류합금자성층이 자기이방성을 구비하고 있는 것을 특징으로 하는 영구자석박막.
- 제2항에 있어서,상기 희토류합금자성층의 면내 방향의 잔류자속밀도(Br1)에 대하여 상기 면내방향에 수직한 방향의 잔류자속밀도(Br2)의 비(Br2/Br1)가 2이상인 것을 특징으로 하는 영구자석박막.
- 제1항 내지 제3항 중 어느 한 항에 있어서,상기 퇴층구조에 포함된 상기 희토류합금자성층의 수가 3이상인 것을 특징으로 하는 영구자석박막.
- 제1항 내지 제3항 중 어느 한 항에 있어서,상기 퇴층구조에 포함된 상기 희토류합금자성층의 합한 두께(tm)에 대하여 상기 고융점합금층의 합한 두께(tn)의 비율(tn/tm)이 0.01≤tn/tm≤0.3을 만족하는 것을 특징으로 하는 영구자석박막.
- 제1항 내지 제3항 중 어느 한 항에 있어서,상기 퇴층구조를 지지하는 기판과 상기 퇴층구조와의 사이에 완충층이 형성되는 것을 특징으로 하는 영구자석박막.
- 제6항에 있어서,상기 완충층은 Ti, V, Cr, Zr, Nb, Mo, Hf, Ta 및 W로 되는 군에서 선택되는 적어도 한 종류의 재료로 형성되는 것을 특징으로 하는 영구자석박막.
- 제1항 내지 제3항 중 어느 한 항에 있어서,상기 퇴층구조의 최상층에 보호층이 형성되는 것을 특징으로 하는 영구자석박막.
- 제8항에 있어서,상기 보호층은 Ti, V, Cr, Zr, Nb, Mo, Hf, Ta 및 W로 되는 군에서 선택되는 적어도 한 종류의 재료로 형성되는 것을 특징으로 하는 영구자석박막.
- 300℃이상의 융점을 구비한 재료에서 형성된 기판을 준비하는 공정과,Ti, V, Cr, Zr, Nb, Mo, Hf, Ta 및 W로 되는 군에서 선택되는 적어도 1종의 재료로 형성되고, 5㎚이상 50㎚이하의 두께를 함유한 고융점금속층과, 주된 구성상이 정방정 R2Fe14B(R은 Nd 및 Pr 중의 적어도 어느 하나)이고, 50㎚이상 500㎚이하의 두께를 함유한 희토류합금자성층이 교호로 적층된 4층 이상의 적층구조를 상기 기판상에 형성하는 공정을 포함하는 것을 특징으로 하는 영구자석박막의 제조방법.
- 제10항에 있어서,상기 적층구조를 상기 기판상에 형성하는 공정에서는, 상기 기판의 온도를 300℃이상 800℃ 이하의 범위로 조정하면서 상기 희토류합금자성층을 형성하는 것을 특징으로 하는 영구자석박막의 제조방법.
- 제10항에 있어서,상기 적층구조를 상기 기판상에 형성하는 공정에서는, 상기 기판의 온도를 300℃ 미만으로 조정하면서 상기 희토류합금자성층을 형성하고,상기 적층구조를 상기 기판상에 형성한 후, 상기 적층구조를 400℃ 이상 800℃ 이하의 온도에서 가열하는 것을 특징으로 하는 영구자석박막의 제조방법.
- 제10항 내지 제12항 중 어느 한 항에 있어서,상기 적층구조의 형성중 또는 형성후에, 상기 적층구조에 대하여 자계를 인가하는 공정을 포함하고 있는 것을 특징으로 하는 영구자석박막의 제조방법.
- 제1항 내지 제3항 중 어느 한 항에 기재된 상기 영구자석박막을 구비하는 회전기.
- 제1항 내지 제3항 중 어느 한 항에 기재된 상기 영구자석박막을 구비하는 자기기록매체.
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US20040062659A1 (en) * | 2002-07-12 | 2004-04-01 | Sinha Mahadeva P. | Ion pump with combined housing and cathode |
JP5063855B2 (ja) * | 2004-03-30 | 2012-10-31 | パナソニック株式会社 | 異方性希土類−鉄系磁石膜の製造方法および超小型モータ |
EP1744328B1 (en) * | 2005-06-10 | 2012-07-25 | Nissan Motor Co., Ltd. | Rare earth magnet having high strength and high electrical resistance |
SE529789C8 (sv) * | 2006-03-10 | 2007-12-27 | Abb Ab | Mätanordning omfattande ett skikt av en magnetoelastisk legering och förfarande för tillverkning av mätanordningen |
JP5434004B2 (ja) * | 2008-07-29 | 2014-03-05 | 日立金属株式会社 | 電磁駆動型アクチュエータ及び電磁駆動型アクチュエータの製造方法 |
EP2444985B1 (en) * | 2010-10-25 | 2018-07-11 | Toyota Jidosha Kabushiki Kaisha | Production method of rare earth magnet |
US9818520B2 (en) * | 2012-01-04 | 2017-11-14 | Toyota Jidosha Kabushiki Kaisha | Rare-earth nanocomposite magnet |
US20140083115A1 (en) * | 2012-09-27 | 2014-03-27 | United Technologies Corporation | Article with dielectric mirror coating system |
JP6175889B2 (ja) * | 2013-05-15 | 2017-08-09 | 株式会社豊田中央研究所 | 永久磁石およびその製造方法 |
JP2015198203A (ja) * | 2014-04-02 | 2015-11-09 | 株式会社豊田中央研究所 | 高保磁力化永久磁石 |
JP6803523B2 (ja) * | 2015-03-31 | 2020-12-23 | パナソニックIpマネジメント株式会社 | 薄膜磁石および薄膜磁石の製造方法 |
US11072842B2 (en) * | 2016-04-15 | 2021-07-27 | Jx Nippon Mining & Metals Corporation | Rare earth thin film magnet and method for producing same |
CN109585106B (zh) * | 2018-12-18 | 2021-04-06 | 宁波铄腾新材料有限公司 | 一种超大块稀土永磁体及其制备方法 |
US11362554B2 (en) | 2019-06-12 | 2022-06-14 | Ford Global Technologies, Llc | Permanent magnets with soft material layers |
CN113415780B (zh) * | 2021-06-18 | 2024-01-30 | 合肥工业大学 | 一种一维有序结构的金属氧化物纳米纤维薄膜材料及其制备方法 |
CN115020099B (zh) * | 2022-05-26 | 2023-11-03 | 中国科学院金属研究所 | 一种增强NdFeB基永磁厚膜垂直磁各向异性的方法 |
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EP1187148A1 (en) | 2002-03-13 |
DE60136253D1 (de) | 2008-12-04 |
US20020192502A1 (en) | 2002-12-19 |
WO2001063628A1 (fr) | 2001-08-30 |
CN1249737C (zh) | 2006-04-05 |
ATE412245T1 (de) | 2008-11-15 |
JP2001237119A (ja) | 2001-08-31 |
US6805980B2 (en) | 2004-10-19 |
KR20020033610A (ko) | 2002-05-07 |
EP1187148A4 (en) | 2006-03-15 |
JP4337209B2 (ja) | 2009-09-30 |
CN1363101A (zh) | 2002-08-07 |
AU3411301A (en) | 2001-09-03 |
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