KR100521824B1 - 반도체 장치, 불휘발성 반도체 기억 장치, 반도체 장치또는 불휘발성 반도체 기억 장치를 복수 포함하는 시스템,반도체 장치 또는 불휘발성 반도체 기억 장치를 포함하는전자 카드, 이 전자 카드의 사용이 가능한 전자 장치 - Google Patents

반도체 장치, 불휘발성 반도체 기억 장치, 반도체 장치또는 불휘발성 반도체 기억 장치를 복수 포함하는 시스템,반도체 장치 또는 불휘발성 반도체 기억 장치를 포함하는전자 카드, 이 전자 카드의 사용이 가능한 전자 장치 Download PDF

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Publication number
KR100521824B1
KR100521824B1 KR10-2002-0081428A KR20020081428A KR100521824B1 KR 100521824 B1 KR100521824 B1 KR 100521824B1 KR 20020081428 A KR20020081428 A KR 20020081428A KR 100521824 B1 KR100521824 B1 KR 100521824B1
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KR
South Korea
Prior art keywords
command
semiconductor memory
electronic device
circuit
status
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Expired - Lifetime
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KR10-2002-0081428A
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English (en)
Korean (ko)
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KR20030051407A (ko
Inventor
간다가즈시게
가와이고이찌
나까무라히로시
이마미야겐이찌
Original Assignee
가부시끼가이샤 도시바
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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1063—Control signal output circuits, e.g. status or busy flags, feedback command signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/20—Initialising; Data preset; Chip identification
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/20—Memory cell initialisation circuits, e.g. when powering up or down, memory clear, latent image memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits

Landscapes

  • Read Only Memory (AREA)
  • Electronic Switches (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
KR10-2002-0081428A 2001-12-19 2002-12-18 반도체 장치, 불휘발성 반도체 기억 장치, 반도체 장치또는 불휘발성 반도체 기억 장치를 복수 포함하는 시스템,반도체 장치 또는 불휘발성 반도체 기억 장치를 포함하는전자 카드, 이 전자 카드의 사용이 가능한 전자 장치 Expired - Lifetime KR100521824B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2001-00386222 2001-12-19
JP2001386222A JP2003187593A (ja) 2001-12-19 2001-12-19 半導体装置及び不揮発性半導体記憶装置

Publications (2)

Publication Number Publication Date
KR20030051407A KR20030051407A (ko) 2003-06-25
KR100521824B1 true KR100521824B1 (ko) 2005-10-17

Family

ID=19187921

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2002-0081428A Expired - Lifetime KR100521824B1 (ko) 2001-12-19 2002-12-18 반도체 장치, 불휘발성 반도체 기억 장치, 반도체 장치또는 불휘발성 반도체 기억 장치를 복수 포함하는 시스템,반도체 장치 또는 불휘발성 반도체 기억 장치를 포함하는전자 카드, 이 전자 카드의 사용이 가능한 전자 장치

Country Status (3)

Country Link
US (4) US6870786B2 (enExample)
JP (1) JP2003187593A (enExample)
KR (1) KR100521824B1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW561491B (en) * 2001-06-29 2003-11-11 Toshiba Corp Semiconductor memory device
JP4351819B2 (ja) * 2001-12-19 2009-10-28 株式会社東芝 半導体装置及び不揮発性半導体記憶装置
JP4287235B2 (ja) * 2003-10-09 2009-07-01 株式会社東芝 不揮発性半導体記憶装置
JP4175991B2 (ja) * 2003-10-15 2008-11-05 株式会社東芝 不揮発性半導体記憶装置
GB0401578D0 (en) * 2004-01-24 2004-02-25 Koninkl Philips Electronics Nv Phototransistor
JP2006024886A (ja) * 2004-06-07 2006-01-26 Renesas Technology Corp 半導体集積回路装置
JP2006031871A (ja) * 2004-07-20 2006-02-02 Toshiba Corp 半導体記憶装置
JP4346526B2 (ja) * 2004-08-31 2009-10-21 株式会社東芝 半導体集積回路装置
US20060227524A1 (en) * 2005-04-06 2006-10-12 Sheng-Chih Hsu Double capacity memory card package
FR2899715A1 (fr) * 2006-04-07 2007-10-12 St Microelectronics Sa Procede d'initialisation d'une memoire
KR100909358B1 (ko) 2007-04-16 2009-07-24 삼성전자주식회사 신뢰성 높은 초기화 데이터를 제공하는 플래시 메모리 장치및 그것의 초기화 방법
KR101471554B1 (ko) * 2007-07-23 2014-12-11 삼성전자주식회사 파워 업시 피크 전류를 줄이는 멀티칩 패키지
JP5347649B2 (ja) * 2009-03-30 2013-11-20 凸版印刷株式会社 不揮発性半導体メモリ装置
JP2012128769A (ja) * 2010-12-17 2012-07-05 Toshiba Corp メモリシステム
JP2014149669A (ja) * 2013-01-31 2014-08-21 Toshiba Corp 半導体記憶装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0823788B2 (ja) 1987-09-18 1996-03-06 富士通株式会社 リセット制御装置
JPH01205321A (ja) 1988-02-12 1989-08-17 Toshiba Corp プリンタ装置および同装置を含む接続プリンタ装置の種別判別方法
US5663901A (en) * 1991-04-11 1997-09-02 Sandisk Corporation Computer memory cards using flash EEPROM integrated circuit chips and memory-controller systems
US5664231A (en) * 1994-04-29 1997-09-02 Tps Electronics PCMCIA interface card for coupling input devices such as barcode scanning engines to personal digital assistants and palmtop computers
JPH0877066A (ja) * 1994-08-31 1996-03-22 Tdk Corp フラッシュメモリコントローラ
KR100404650B1 (ko) * 1995-06-14 2004-02-11 히다치초엘에스아이 엔지니어링가부시키가이샤 반도체메모리,메모리디바이스및메모리카드
JP3355879B2 (ja) * 1995-08-01 2002-12-09 株式会社デンソー 制御回路
TW419828B (en) * 1997-02-26 2001-01-21 Toshiba Corp Semiconductor integrated circuit
JP2001052495A (ja) * 1999-06-03 2001-02-23 Toshiba Corp 半導体メモリ
US6462985B2 (en) * 1999-12-10 2002-10-08 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory for storing initially-setting data
US20010047473A1 (en) 2000-02-03 2001-11-29 Realtime Data, Llc Systems and methods for computer initialization
JP2002150789A (ja) * 2000-11-09 2002-05-24 Hitachi Ltd 不揮発性半導体記憶装置
JP3816788B2 (ja) * 2001-11-22 2006-08-30 株式会社東芝 不揮発性半導体記憶装置

Also Published As

Publication number Publication date
US20050146970A1 (en) 2005-07-07
US20070008803A1 (en) 2007-01-11
US20060120168A1 (en) 2006-06-08
US7123526B2 (en) 2006-10-17
US7016241B2 (en) 2006-03-21
US7372761B2 (en) 2008-05-13
KR20030051407A (ko) 2003-06-25
US6870786B2 (en) 2005-03-22
US20030133338A1 (en) 2003-07-17
JP2003187593A (ja) 2003-07-04

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