KR100483640B1 - 반도체 기억 장치 - Google Patents

반도체 기억 장치 Download PDF

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Publication number
KR100483640B1
KR100483640B1 KR10-2001-0067359A KR20010067359A KR100483640B1 KR 100483640 B1 KR100483640 B1 KR 100483640B1 KR 20010067359 A KR20010067359 A KR 20010067359A KR 100483640 B1 KR100483640 B1 KR 100483640B1
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KR
South Korea
Prior art keywords
current
mos transistor
circuit
current path
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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KR10-2001-0067359A
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English (en)
Korean (ko)
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KR20020042750A (ko
Inventor
호소노고지
이께하시다미오
다나까도모하루
이마미야겐이찌
나까무라히로시
다께우찌겐
Original Assignee
가부시끼가이샤 도시바
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Publication of KR20020042750A publication Critical patent/KR20020042750A/ko
Application granted granted Critical
Publication of KR100483640B1 publication Critical patent/KR100483640B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells

Landscapes

  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
KR10-2001-0067359A 2000-11-01 2001-10-31 반도체 기억 장치 Expired - Lifetime KR100483640B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000335180A JP4250325B2 (ja) 2000-11-01 2000-11-01 半導体記憶装置
JPJP-P-2000-00335180 2000-11-01

Publications (2)

Publication Number Publication Date
KR20020042750A KR20020042750A (ko) 2002-06-07
KR100483640B1 true KR100483640B1 (ko) 2005-04-18

Family

ID=18810978

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2001-0067359A Expired - Lifetime KR100483640B1 (ko) 2000-11-01 2001-10-31 반도체 기억 장치

Country Status (3)

Country Link
US (3) US6507518B2 (enExample)
JP (1) JP4250325B2 (enExample)
KR (1) KR100483640B1 (enExample)

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JP4250325B2 (ja) * 2000-11-01 2009-04-08 株式会社東芝 半導体記憶装置
US6480419B2 (en) * 2001-02-22 2002-11-12 Samsung Electronics Co., Ltd. Bit line setup and discharge circuit for programming non-volatile memory
KR100437461B1 (ko) * 2002-01-12 2004-06-23 삼성전자주식회사 낸드 플래시 메모리 장치 및 그것의 소거, 프로그램,그리고 카피백 프로그램 방법
KR100512178B1 (ko) * 2003-05-28 2005-09-02 삼성전자주식회사 플렉서블한 열 리던던시 스킴을 갖는 반도체 메모리 장치
JP2005056394A (ja) * 2003-07-18 2005-03-03 Toshiba Corp 記憶装置及びメモリカード
JP4424952B2 (ja) * 2003-09-16 2010-03-03 株式会社ルネサステクノロジ 不揮発性半導体記憶装置
KR100568107B1 (ko) * 2003-10-24 2006-04-05 삼성전자주식회사 고속 및 저전력 전압 레벨 변환 회로
KR100528483B1 (ko) * 2004-01-02 2005-11-15 삼성전자주식회사 패스/페일 점검이 가능한 불휘발성 반도체 메모리장치
JP2005353242A (ja) 2004-06-14 2005-12-22 Toshiba Corp 不揮発性半導体記憶装置及びそのデータ書き込み方法
JP2006012367A (ja) 2004-06-29 2006-01-12 Toshiba Corp 不揮発性半導体記憶装置
EP1617438B1 (en) * 2004-07-14 2006-10-25 STMicroelectronics S.r.l. Redundancy based NAND flash memory
JP4703148B2 (ja) * 2004-09-08 2011-06-15 株式会社東芝 不揮発性半導体記憶装置
FR2875352B1 (fr) * 2004-09-10 2007-05-11 St Microelectronics Sa Procede de detection et de correction d'erreurs pour une memoire et circuit integre correspondant
JP4261461B2 (ja) 2004-11-05 2009-04-30 株式会社東芝 半導体集積回路装置、及びそれを用いた不揮発性メモリシステム
JP4261462B2 (ja) * 2004-11-05 2009-04-30 株式会社東芝 不揮発性メモリシステム
KR100648277B1 (ko) * 2004-12-30 2006-11-23 삼성전자주식회사 프로그램 시간을 줄일 수 있는 플래시 메모리 장치
KR100666172B1 (ko) 2005-01-04 2007-01-09 삼성전자주식회사 로드 공급 와이어드 오어 구조를 가지는 불휘발성 반도체메모리 장치와, 이에 대한 구동방법
KR100567158B1 (ko) * 2005-01-10 2006-04-03 삼성전자주식회사 캐쉬기능을 가지는 와이어드 오어 타입의 페이지 버퍼 및이를 포함하는 불휘발성 반도체 메모리 장치, 그리고,이를 이용한 프로그램 방법
KR100666171B1 (ko) * 2005-01-10 2007-01-09 삼성전자주식회사 로드 프리 타입의 와이어드 오어 구조를 가지는 불휘발성반도체 메모리 장치와, 이에 대한 구동방법
KR100666170B1 (ko) * 2005-01-17 2007-01-09 삼성전자주식회사 결함 페이지 버퍼로부터의 데이터 전송이 차단되는와이어드 오어 구조의 불휘발성 반도체 메모리 장치
JP4664804B2 (ja) * 2005-04-28 2011-04-06 株式会社東芝 不揮発性半導体記憶装置
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JP2007102848A (ja) * 2005-09-30 2007-04-19 Toshiba Corp 半導体集積回路装置
JP4761910B2 (ja) 2005-10-05 2011-08-31 株式会社東芝 不揮発性半導体記憶装置及びそれを用いた不揮発性メモリシステム
JP4864006B2 (ja) * 2006-04-06 2012-01-25 株式会社アドバンテスト 試験装置および試験方法
JP4874721B2 (ja) * 2006-06-23 2012-02-15 株式会社東芝 半導体記憶装置
US7355892B2 (en) * 2006-06-30 2008-04-08 Sandisk Corporation Partial page fail bit detection in flash memory devices
US20080072119A1 (en) * 2006-08-31 2008-03-20 Rodney Rozman Allowable bit errors per sector in memory devices
JP2008077766A (ja) 2006-09-21 2008-04-03 Renesas Technology Corp 半導体装置
DE602007009277D1 (de) * 2006-11-27 2010-10-28 Sandisk Corp Segmentierte bit-abtastung zur programmierungsprüfung
DE102006061060B4 (de) * 2006-12-22 2012-12-20 Bauerfeind Ag Kniegelenkbandage
WO2008078529A1 (ja) 2006-12-26 2008-07-03 Advantest Corporation 試験装置および試験方法
US7577030B2 (en) 2007-01-17 2009-08-18 Kabushiki Kaisha Toshiba Semiconductor storage device
JP5032155B2 (ja) 2007-03-02 2012-09-26 株式会社東芝 不揮発性半導体記憶装置、及び不揮発性半導体記憶システム
US7738296B2 (en) * 2007-12-13 2010-06-15 Macronix International Co., Ltd. Method for reading nonvolatile memory at power-on stage
US7864578B2 (en) 2008-06-30 2011-01-04 Kabushiki Kaisha Toshiba Semiconductor memory repairing a defective bit and semiconductor memory system
JP2010020843A (ja) * 2008-07-10 2010-01-28 Toshiba Corp 半導体記憶装置
JP5172555B2 (ja) * 2008-09-08 2013-03-27 株式会社東芝 半導体記憶装置
JP5284737B2 (ja) * 2008-09-19 2013-09-11 力晶科技股▲ふん▼有限公司 不揮発性半導体記憶装置とそのフェイルビット数計数方法
JP2010244668A (ja) * 2009-03-18 2010-10-28 Toshiba Corp 不揮発性半導体記憶装置
JP5039079B2 (ja) * 2009-03-23 2012-10-03 株式会社東芝 不揮発性半導体記憶装置
JP2011170927A (ja) * 2010-02-19 2011-09-01 Toshiba Corp 半導体記憶装置
JP2011198414A (ja) * 2010-03-19 2011-10-06 Toshiba Corp 半導体記憶装置
US8208314B2 (en) * 2010-06-01 2012-06-26 Aptina Imaging Corporation Sequential access memory elements
JP5330425B2 (ja) 2011-02-09 2013-10-30 株式会社東芝 不揮発性半導体メモリ
JP2012203965A (ja) * 2011-03-25 2012-10-22 Toshiba Corp 半導体記憶装置
JP5259765B2 (ja) * 2011-03-29 2013-08-07 株式会社東芝 不揮発性半導体メモリ
JP5542737B2 (ja) 2011-05-12 2014-07-09 株式会社東芝 不揮発性半導体記憶装置
TWI476775B (zh) * 2012-07-27 2015-03-11 Eon Silicon Solution Inc Acquisition Method of Damaged Bit Line in Nonvolatile Memory Device
JP2014053060A (ja) 2012-09-07 2014-03-20 Toshiba Corp 半導体記憶装置及びその制御方法
JP2014063551A (ja) 2012-09-21 2014-04-10 Toshiba Corp 半導体記憶装置
KR102342849B1 (ko) * 2015-03-04 2021-12-23 삼성전자주식회사 비휘발성 메모리 장치, 메모리 시스템, 상기 비휘발성 메모리 장치의 동작 방법 및 상기 메모리 시스템의 동작 방법
KR20170091925A (ko) * 2016-02-02 2017-08-10 에스케이하이닉스 주식회사 전류 센싱 회로 및 이를 포함하는 메모리 장치
JP6371423B2 (ja) * 2017-01-17 2018-08-08 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置
JP6757447B1 (ja) 2019-06-12 2020-09-16 力晶積成電子製造股▲ふん▼有限公司Ｐｏｗｅｒｃｈｉｐ Ｓｅｍｉｃｏｎｄｕｃｔｏｒ Ｍａｎｕｆａｃｔｕｒｉｎｇ Ｃｏｒｐｏｒａｔｉｏｎ フェイルビット数計数回路及び不揮発性半導体記憶装置
CN111445943B (zh) * 2020-04-15 2022-02-11 武汉金汤信安科技有限公司 一种片上一次可编程电路

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Also Published As

Publication number Publication date
KR20020042750A (ko) 2002-06-07
US20030081459A1 (en) 2003-05-01
US20040062099A1 (en) 2004-04-01
JP2002140899A (ja) 2002-05-17
US6859401B2 (en) 2005-02-22
US6507518B2 (en) 2003-01-14
US6657896B2 (en) 2003-12-02
US20020051385A1 (en) 2002-05-02
JP4250325B2 (ja) 2009-04-08

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